CN111316089A - 微流控芯片管道的检测装置、方法及系统 - Google Patents

微流控芯片管道的检测装置、方法及系统 Download PDF

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Publication number
CN111316089A
CN111316089A CN201880067256.0A CN201880067256A CN111316089A CN 111316089 A CN111316089 A CN 111316089A CN 201880067256 A CN201880067256 A CN 201880067256A CN 111316089 A CN111316089 A CN 111316089A
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defect
microfluidic chip
interference color
color image
polarized light
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王星泽
闫静
舒远
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Heren Technology Shenzhen Co ltd
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Heren Technology Shenzhen Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • Biochemistry (AREA)
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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

一种微流控芯片(106)管道检测装置(100)，包括：光发生器(101)、起偏器(102)、检偏器(103)、感光芯片(104)和处理器(105)；其中，光发生器(101)产生的白色光经过起偏器(102)得到偏振光；并将该偏振光照射到微流控芯片(106)上；检偏器(103)检验从微流控芯片(106)透射过来的是否为偏振光；感光芯片(104)采集经过检偏器(103)的偏振光产生的干涉色图像，并将该干涉色图像传输至处理器(105)；处理器(105)根据干涉色图像确定微流控芯片(106)管道的缺陷类型。采用上述技术方案解决了现有技术对微流控芯片(106)管道缺陷无法进行检测的问题。

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PCT国内申请，说明书已公开。

Claims (10)

  1. PCT国内申请，权利要求书已公开。
CN201880067256.0A 2018-10-19 2018-10-19 微流控芯片管道的检测装置、方法及系统 Pending CN111316089A (zh)

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JP2010121935A (ja) * 2007-11-05 2010-06-03 Nippon Sheet Glass Co Ltd 偏光画像撮像装置および画像処理装置
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CN204116189U (zh) * 2014-03-13 2015-01-21 严媚 智能光微流成像及检测系统
WO2017203572A1 (ja) * 2016-05-23 2017-11-30 株式会社日立ハイテクノロジーズ 欠陥画像分類装置および欠陥画像分類方法
CN107884414A (zh) * 2017-11-03 2018-04-06 电子科技大学 一种剔除灰尘影响的镜面物体表面缺陷检测系统及方法
CN107966447A (zh) * 2017-11-14 2018-04-27 浙江大学 一种基于卷积神经网络的工件表面缺陷检测方法

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US20090233810A1 (en) * 2008-03-12 2009-09-17 The Mitre Corporation Multi-Modal surface plasmon polariton-raman scattering based bio-detection
US8729502B1 (en) * 2010-10-28 2014-05-20 The Research Foundation For The State University Of New York Simultaneous, single-detector fluorescence detection of multiple analytes with frequency-specific lock-in detection
CN103148785B (zh) * 2013-01-10 2016-08-17 广东工业大学 一种光学干涉谱域相位对照b扫描仪及其测量方法
CN106442538A (zh) * 2016-08-22 2017-02-22 中国电子科技集团公司第四十研究所 一种基于偏振成像的光学元件损伤检测装置及方法
CN106803090A (zh) * 2016-12-05 2017-06-06 中国银联股份有限公司 一种图像识别方法和装置
CN206848158U (zh) * 2017-07-12 2018-01-05 武汉东湖学院 一种透射式样本损伤检测装置

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040038426A1 (en) * 2002-08-22 2004-02-26 Scott Manalis Measurement of concentrations and binding energetics
JP2004354251A (ja) * 2003-05-29 2004-12-16 Nidek Co Ltd 欠陥検査装置
CN2795850Y (zh) * 2005-05-19 2006-07-12 中山大学 便携式激光水晶鉴别器
CN1731180A (zh) * 2005-09-02 2006-02-08 清华大学 蛋白质芯片的传感方法及其检测系统
EP1970121A1 (en) * 2006-12-15 2008-09-17 Universiteit Leiden A microfluidic chip design comprising capillaries
JP2010121935A (ja) * 2007-11-05 2010-06-03 Nippon Sheet Glass Co Ltd 偏光画像撮像装置および画像処理装置
CN101672803A (zh) * 2008-09-08 2010-03-17 中国建筑材料科学研究总院 一种检测钢化玻璃幕墙杂质和缺陷的方法与装置
CN102226771A (zh) * 2011-03-25 2011-10-26 宁波大学 一种红外玻璃内部缺陷和残余应力检测装置及检测方法
CN204116189U (zh) * 2014-03-13 2015-01-21 严媚 智能光微流成像及检测系统
WO2017203572A1 (ja) * 2016-05-23 2017-11-30 株式会社日立ハイテクノロジーズ 欠陥画像分類装置および欠陥画像分類方法
CN107884414A (zh) * 2017-11-03 2018-04-06 电子科技大学 一种剔除灰尘影响的镜面物体表面缺陷检测系统及方法
CN107966447A (zh) * 2017-11-14 2018-04-27 浙江大学 一种基于卷积神经网络的工件表面缺陷检测方法

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