CN111313986B - Test circuit structure and antenna test method - Google Patents
Test circuit structure and antenna test method Download PDFInfo
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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Abstract
The application discloses test circuit structure, test circuit structure includes: the antenna testing device comprises a radio frequency module, a plurality of antenna units, a plurality of antenna matching circuits and an impedance matching circuit, wherein the radio frequency module is electrically connected with the antenna units through the antenna matching circuits; through the test circuit structure that this application embodiment provided, can be under the condition that needs have a plurality of antennas to the terminal, debug the circumstances of testing to one of them antenna in a plurality of antennas, through increasing a set of impedance matching circuit between the antenna that need not to detect and the radio frequency module, through the impedance matching circuit that this application embodiment provided with impedance directly to ground, error when can reducing the debugging to promote the precision of a plurality of antennas at the debugging test.
Description
Technical Field
The embodiment of the application relates to the technical field of communication, in particular to a test circuit structure and an antenna test method.
Background
With the development of technology, mobile terminals such as mobile phones and tablets become indispensable electronic devices in life and work increasingly. For both mobile phones and tablet phones, these mobile terminal devices are provided with multiple antennas, such as WIFI, GPS, a main antenna, a diversity antenna, etc., and there is mutual interference between multiple antennas with close frequencies, which results in inaccurate debugging and testing of the antennas.
In the research and practice process of the prior art, the inventor of the embodiment of the present application finds that, at present, when an engineer in the industry debugs a test antenna, a 50 Ω load is usually externally connected, and for example, when a test prototype is provided for a certification authority to test, a coaxial line needs to be welded. For example, when an engineer debugs a mobile phone having a main antenna and a diversity antenna, a 50 Ω load is added to the diversity antenna when the main antenna is debugged, so that the debugged main antenna is accurate, however, the external 50 Ω load is connected, and a coaxial line is also added, so that if the coaxial line is bent, an error factor is brought to debugging, thereby affecting the debugging performance of the antenna and causing low debugging and testing accuracy.
Disclosure of Invention
The embodiment of the application provides a test circuit structure and an antenna test method, which can test a circuit by accessing an impedance matching circuit, and can reduce errors in debugging, thereby improving the accuracy of a plurality of antennas in debugging and testing.
In a first aspect, an embodiment of the present application provides a test circuit structure, where the test circuit structure includes: the antenna comprises a radio frequency module, a plurality of antenna units, a plurality of antenna matching circuits and an impedance matching circuit, wherein the radio frequency module is electrically connected with the antenna units through the antenna matching circuit, and the impedance matching circuit is electrically connected with the antenna matching circuit and the antenna units.
In some embodiments, the impedance matching circuit comprises an impedance resistor and an impedance capacitor, and the GND pin of the impedance matching circuit is grounded.
In some embodiments, the antenna elements include first and second antenna elements, and the antenna matching circuit includes first and second antenna matching circuits; the first antenna unit is electrically connected with the radio frequency module through the first antenna matching circuit, and the second antenna unit is electrically connected with the radio frequency module through the second antenna matching circuit; the impedance matching circuit is connected in series between the antenna unit and the antenna matching circuit.
In some embodiments, the test circuit structure further includes a main board electrically connected to the rf module, wherein an impedance value of the impedance matching circuit is equal to an input impedance value of the main board circuit.
In a second aspect, an embodiment of the present application provides an antenna testing method, which is applied to the testing circuit structure of the first aspect, and the antenna testing method includes:
the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to the debugging object and the connection rule to generate a test circuit;
and debugging the antenna unit.
In some embodiments, the debug object includes a first debug object and a second debug object, the first debug object is the first antenna unit, and the second debug object is the second antenna unit.
In some embodiments, the impedance matching circuit is electrically connected to a plurality of antenna matching circuits and a plurality of antenna elements according to a debug object and a connection rule, and generates a test circuit, including:
the debugging object is a first debugging object, and the impedance matching circuit is electrically connected with the antenna matching circuits and the antenna units according to a first connection rule to generate a first test circuit.
In some embodiments, the first connection rule is: the first antenna unit is electrically connected with the radio frequency module through the first antenna matching circuit; the second antenna unit is electrically connected with the impedance matching circuit, and the impedance matching circuit is electrically connected with the radio frequency module through the second antenna matching circuit.
In some embodiments, the impedance matching circuit is electrically connected to a plurality of antenna matching circuits and a plurality of antenna elements according to a debug object and a connection rule, and generates a test circuit, including:
the debugging object is a second debugging object, and the impedance matching circuit is electrically connected with the antenna matching circuits and the antenna units according to a second connection rule to generate a first test circuit.
In some embodiments, the second connection rule is: the second antenna unit is electrically connected with the radio frequency module through the second antenna matching circuit; the first antenna unit is electrically connected with the impedance matching circuit, and the impedance matching circuit is electrically connected with the radio frequency module through the first antenna matching circuit.
The embodiment of the application provides a test circuit structure and an antenna test method, and the test circuit structure provided by the embodiment of the application comprises: radio frequency module, a plurality of antenna unit, a plurality of antenna matching circuit and impedance matching circuit, radio frequency module passes through antenna matching circuit with the antenna unit electricity is connected, impedance matching circuit with antenna matching circuit the antenna unit electricity is connected, through the test circuit structure that this application embodiment provided, can be in the condition that needs exist a plurality of antennas to the terminal, to one of them antenna among a plurality of antennas under the condition of debugging the test, through increasing a set of impedance matching circuit between the antenna that need not to detect and radio frequency module, through the impedance matching circuit that this application embodiment provided with impedance directly to ground, error when can reduce the debugging to promote the precision of a plurality of antennas at the debugging test.
Drawings
The technical solutions and other advantages of the present application will become apparent from the following detailed description of specific embodiments of the present application when taken in conjunction with the accompanying drawings.
Fig. 1 is a schematic structural diagram of a test circuit structure according to an embodiment of the present disclosure.
Fig. 2 is a schematic structural diagram of another test circuit structure provided in the embodiment of the present application.
Fig. 3 is a schematic structural diagram of another test circuit structure provided in the embodiment of the present application.
Fig. 4 is a schematic flowchart of an antenna testing method according to an embodiment of the present application.
Fig. 5 is a schematic application diagram of an antenna testing method according to an embodiment of the present application.
Fig. 6 is a schematic diagram of another application of the antenna testing method according to the embodiment of the present application.
Fig. 7 is a block diagram of a terminal according to an embodiment of the present disclosure.
Detailed Description
The terms "first," "second," and the like in the description and in the claims of the embodiments of the application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments described herein are capable of operation in other sequences than illustrated or otherwise described herein. The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the application provides a test circuit structure and an antenna test method. The test circuit structure and the antenna test method can be suitable for the antenna structure of a terminal, such as a mobile phone, a tablet computer, a notebook computer or a personal computer. The test circuit structure and the antenna test method are explained in detail below. It should be noted that the following description of the embodiments is not intended to limit the preferred order of the embodiments.
As shown in fig. 1, an embodiment of the present application provides a test circuit structure 1, where the test circuit structure 1 includes: the antenna comprises a radio frequency module 11, a plurality of antenna units 13, a plurality of antenna matching circuits 12 and an impedance matching circuit 14, wherein the radio frequency module 11 is electrically connected with the antenna units 13 through the antenna matching circuits 12, the impedance matching circuit 14 is electrically connected with the antenna matching circuits 12 and the antenna units 13, the number of the antenna units 13 is equal to that of the antenna matching circuits 12, and the number of the antenna matching circuits 12 is determined according to the number of the antenna units 13.
As shown in fig. 2, in the embodiment of the present application, the test circuit structure 1 includes the plurality of antenna units 13 including a first antenna unit 23 and a second antenna unit 26, and the antenna matching circuit 12 includes a first antenna matching circuit 22 and a second antenna matching circuit 25; the first antenna unit 23 is electrically connected to the radio frequency module 21 through the first antenna matching circuit 22, the second antenna unit 26 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25, and the impedance matching circuit 24 is connected in series between the antenna unit 13 and the antenna matching circuit 12, the number of the antenna units 13 provided in the embodiment of the present application does not limit the number of the antenna units 13 in the whole scheme, and the number of the antenna matching circuits 12 provided in the embodiment of the present application does not limit the number of the antenna matching circuits 12 in the whole scheme, which is only used for illustration in the embodiment of the present application.
As shown in fig. 3, optionally, in the test circuit structure 1 provided in this embodiment of the present application, the plurality of antenna elements 13 includes a first antenna element 23 and a second antenna element 26, the antenna matching circuit 12 includes a first antenna matching circuit 22 and a second antenna matching circuit 25, and the first antenna matching circuit 22 includes R11, R12, R13, R14, where R11 and R12 of the first antenna matching circuit 22 may be a resistor, a capacitor, or an inductor, and the positions of R11 and R12 cannot be null because the first antenna matching circuit 22 cannot be an open circuit, and the positions of R13 and R14 of the first antenna matching circuit 22 may be a capacitor, an inductor, or a null, and the positions of R13 and R14 cannot be a resistor because the first antenna matching circuit 22 cannot be a short circuit; the second antenna matching circuit 25 includes R21, R22, R23, R24; wherein, the positions R21 and R22 of the second antenna matching circuit 25 may be resistors, capacitors or inductors, the positions R21 and R22 cannot be null because the second antenna matching circuit 25 cannot be an open circuit, the positions R23 and R24 of the second antenna matching circuit 25 may be capacitors, inductors or nulls, and the positions R23 and R24 cannot be resistors because the second antenna matching circuit 25 cannot be a short circuit; the impedance matching circuit 24 comprises R31 and R32, the impedance matching circuit 24 comprises an impedance resistor and an impedance capacitor, the impedance resistor is arranged at the position R31 of the impedance matching circuit 24, the impedance capacitor is arranged at the position R32 of the impedance matching circuit 24, and the GND pin of the impedance matching circuit 24 is grounded.
Optionally, the test circuit structure further includes a main board electrically connected to the radio frequency module, wherein an impedance value of the impedance matching circuit is equal to an input impedance value of the main board circuit.
To sum up, the embodiment of the present application provides a test circuit structure, which includes: radio frequency module, a plurality of antenna unit, a plurality of antenna matching circuit and impedance matching circuit, radio frequency module passes through antenna matching circuit with the antenna unit electricity is connected, impedance matching circuit with antenna matching circuit antenna unit electricity is connected, and this structure can be under the condition that needs debug the test to one of them antenna in a plurality of antennas, through increasing a set of impedance matching circuit between the antenna that need not to detect and radio frequency module, through the impedance matching circuit that this application embodiment provided with impedance directly to ground, error when can reducing the debugging to promote the precision of a plurality of antennas at the debugging test.
As shown in fig. 4, in particular, an embodiment of the present application provides an antenna testing method, which can be applied to the above-mentioned test circuit structure, where the method includes:
401. the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to the debugging object and the connection rule to generate a test circuit;
specifically, in the embodiment of the present application, the test circuit structure 1 includes the plurality of antenna elements 13 including a first antenna element 23 and a second antenna element 26, and the antenna matching circuit 12 includes a first antenna matching circuit 22 and a second antenna matching circuit 25; the first antenna unit 23 is electrically connected to the radio frequency module 21 through the first antenna matching circuit 22, the second antenna unit 26 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25, and the impedance matching circuit 24 is connected in series between the antenna unit 13 and the antenna matching circuit 12, the number of the antenna units 13 in the present embodiment is not limited to the number of the antenna units 13 in the entire scheme, and the number of the antenna matching circuits 12 in the present embodiment is not limited to the number of the antenna matching circuits 12 in the entire scheme, which is only used for illustration in the present embodiment.
Optionally, in this embodiment of the present application, the debug object includes a first debug object and a second debug object, where the first debug object is the first antenna unit 23, and the second debug object is the second antenna unit 26.
Optionally, in this embodiment of the present application, the connection rule includes the first connection rule and the second connection rule, where the first connection rule is: the first antenna unit 23 is electrically connected with the radio frequency module 21 through the first antenna matching circuit 22; the second antenna element 26 is electrically connected to the impedance matching circuit 24, and the impedance matching circuit 24 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25. The second connection rule is as follows: the second antenna unit 26 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25; the first antenna element 23 is electrically connected to the impedance matching circuit 24, and the impedance matching circuit 24 is electrically connected to the radio frequency module 21 through the first antenna matching circuit 22.
Specifically, in the embodiment of the present application, the impedance matching circuit 24 is electrically connected to the plurality of antenna matching circuits 12 and the plurality of antenna units 13 according to the debug target and the connection rule to generate the test circuit, and specifically there are two cases as follows, and the two cases of generating the test circuit are described below:
1. the first debugging object is the first antenna unit, and the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to a first connection rule to generate a test circuit;
as shown in fig. 5, in the embodiment of the present application, when the debugging object is a first debugging object, the impedance matching circuit is electrically connected to a plurality of antenna matching circuits and a plurality of antenna units according to a first connection rule, and the first antenna unit 23 is electrically connected to the radio frequency module 21 through the first antenna matching circuit 22; the impedance matching circuit 24 is connected in series between the second antenna unit 26 and the second antenna matching circuit 25, the second antenna unit 26 is electrically connected to the impedance matching circuit 24, and the impedance matching circuit 24 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25, thereby generating a first test circuit.
2. The second debugging object is the second antenna unit, and the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to a second connection rule to generate a test circuit;
as shown in fig. 6, in the embodiment of the present application, when the debug object is a second debug object, the impedance matching circuit 24 is electrically connected to the plurality of antenna matching circuits 12 and the plurality of antenna units 13 according to a first connection rule, and the second antenna unit 26 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25; the impedance matching circuit 24 is connected in series between the first antenna element 23 and the first antenna matching circuit 22, the first antenna element 23 is electrically connected to the impedance matching circuit 24, and the impedance matching circuit 24 is electrically connected to the radio frequency module 21 through the first antenna matching circuit 22, thereby creating a second test circuit.
402. And debugging the antenna unit.
Specifically, in the embodiment of the present application, a test circuit is generated according to a debugging object and a connection rule, and an antenna unit to be debugged is debugged according to the test circuit, specifically, there are the following two cases, and the following two cases of debugging the antenna unit are described below:
1. when the generated test circuit is a first test circuit:
in this embodiment, the impedance matching circuit 24 is connected in series between the second antenna unit 26 and the second antenna matching circuit 25, the second antenna unit 26 is electrically connected to the impedance matching circuit 24, the impedance matching circuit 24 is electrically connected to the radio frequency module 21 through the second antenna matching circuit 25, a first test circuit is generated, the first antenna unit 23 is connected to a network analyzer to debug the first antenna unit 23, and the passive S parameter of the first antenna unit 23 is debugged. The network analyzer is a comprehensive microwave measuring instrument capable of scanning and measuring in a wide frequency band to determine network parameters. The microwave network analyzer is fully called as a microwave network analyzer. The network analyzer is a new type of instrument for measuring network parameters, and can directly measure complex scattering parameters of active or passive, reversible or irreversible double-port and single-port networks, and give out amplitude and phase frequency characteristics of each scattering parameter in a frequency scanning mode. The automatic network analyzer can correct errors of measurement results point by point and convert the measurement results into other dozens of network parameters, such as input reflection coefficients, output reflection coefficients, voltage standing wave ratios, impedance (or admittance), attenuation (or gain), phase shift, group delay and other transmission parameters, isolation, orientation and the like.
2. When the generated test circuit is a second test circuit:
in this embodiment, the impedance matching circuit 24 is connected in series between the first antenna unit 23 and the first antenna matching circuit 22, the first antenna unit 23 is electrically connected to the impedance matching circuit 24, the impedance matching circuit 24 is electrically connected to the radio frequency module 21 through the first antenna matching circuit 22, a second test circuit is generated, the second antenna unit 26 is connected to a network analyzer to debug the second antenna unit 26, and the passive S parameter of the second antenna unit 26 is debugged.
To sum up, an embodiment of the present application provides an antenna testing method, where the antenna testing method includes: the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to the debugging object and the connection rule to generate a test circuit; and debugging the antenna unit. According to the antenna test method, under the condition that a plurality of antennas are needed to be arranged on a terminal and one of the antennas is debugged and tested, a group of impedance matching circuits are additionally arranged between the antenna which does not need to be detected and a radio frequency module, the impedance matching circuits are used for directly connecting the impedance to the ground, errors during debugging can be reduced, and therefore the accuracy of the antennas in debugging and testing is improved.
The above is specifically described from the perspective of a test circuit structure and an antenna test method, and the like, and the following is described from the perspective of a terminal device to which the antenna unit, the antenna matching unit, and the radio frequency module provided in the embodiment of the present application can be applied. An embodiment of the present application further provides a terminal, as shown in fig. 7, which shows a schematic structural diagram of a terminal according to an embodiment of the present application, where the terminal may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, and the like, and specifically:
as shown in fig. 7, the terminal may include Radio Frequency (RF) circuitry 501, memory 502 including one or more computer-readable storage media, an input unit 503, a display unit 504, a sensor 505, audio circuitry 506, a Wireless Fidelity (Wi-Fi) module 507, a processor 508 including one or more processing cores, and a power supply 509. Those skilled in the art will appreciate that the terminal structure shown in fig. 7 is not intended to be limiting and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components. Wherein:
the RF circuit 501 may be used for receiving and transmitting signals during information transmission and reception or during a call, and in particular, for receiving downlink information of a base station and then sending the received downlink information to the one or more processors 508 for processing; in addition, data relating to uplink is transmitted to the base station. In general, RF circuit 501 includes, but is not limited to, an antenna, at least one Amplifier, a tuner, one or more oscillators, a Subscriber Identity Module (SIM) card, a transceiver, a coupler, a Low Noise Amplifier (LNA), a duplexer, and the like. In addition, the RF circuitry 501 may also communicate with networks and other devices via wireless communications. The wireless communication may use any communication standard or protocol, including but not limited to Global System for Mobile communication (GSM), general Packet Radio Service (GPRS), code Division Multiple Access (CDMA), wideband Code Division Multiple Access (WCDMA), long Term Evolution (LTE), email, short Messaging Service (SMS), and the like. The antenna unit, the antenna matching unit and the radio frequency module provided by the embodiment of the application can be used for receiving and sending information or signals in a communication process so as to achieve the operation required by a user.
The memory 502 may be used to store software programs and modules, and the processor 508 executes various functional applications and data processing by operating the software programs and modules stored in the memory 502. The memory 502 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required by at least one function (such as a sound playing function, an image playing function, etc.), and the like; the storage data area may store data (such as audio data, a phonebook, etc.) created according to the use of the terminal, etc. Further, the memory 502 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid state storage device. Accordingly, the memory 502 may also include a memory controller to provide the processor 508 and the input unit 503 access to the memory 502.
The input unit 503 may be used to receive input numeric or character information and generate keyboard, mouse, joystick, optical or trackball signal inputs related to user settings and function control. In particular, in one particular embodiment, the input unit 503 may include a touch-sensitive surface as well as other input devices. The touch-sensitive surface, also referred to as a touch display screen or a touch pad, may collect touch operations by a user (such as operations by the user on or near the touch-sensitive surface using a finger, a stylus, or any other suitable object or attachment) thereon or nearby, and drive the corresponding connection device according to a predetermined program. Alternatively, the touch sensitive surface may comprise two parts, a touch detection means and a touch controller. The touch detection device detects the touch direction of a user, detects a signal brought by touch operation and transmits the signal to the touch controller; the touch controller receives touch information from the touch sensing device, converts the touch information into touch point coordinates, and sends the touch point coordinates to the processor 508, and can receive and execute commands sent from the processor 508. In addition, touch sensitive surfaces may be implemented using various types of resistive, capacitive, infrared, and surface acoustic waves. The input unit 503 may include other input devices in addition to the touch-sensitive surface. In particular, other input devices may include, but are not limited to, one or more of a physical keyboard, function keys (such as volume control keys, switch keys, etc.), a trackball, a mouse, a joystick, and the like.
The display unit 504 may be used to display information input by or provided to the user and various graphical user interfaces of the terminal, which may be made up of graphics, text, icons, video, and any combination thereof. The Display unit 504 may include a Display panel, and optionally, the Display panel may be configured in the form of a Liquid Crystal Display (LCD), an Organic Light-Emitting Diode (OLED), or the like. Further, the touch-sensitive surface may overlay the display panel, and when a touch operation is detected on or near the touch-sensitive surface, the touch operation is transmitted to the processor 508 to determine the type of touch event, and then the processor 508 provides a corresponding visual output on the display panel according to the type of touch event.
The terminal may also include at least one sensor 505, such as light sensors, motion sensors, and other sensors. Specifically, the light sensor may include an ambient light sensor that may adjust the brightness of the display panel according to the brightness of ambient light, and a proximity sensor that may turn off the display panel and/or the backlight when the terminal is moved to the ear. As one of the motion sensors, the gravity acceleration sensor can detect the magnitude of acceleration in each direction (generally, three axes), can detect the magnitude and direction of gravity when the mobile phone is stationary, and can be used for applications of recognizing the posture of the mobile phone (such as horizontal and vertical screen switching, related games, magnetometer posture calibration), vibration recognition related functions (such as pedometer and tapping), and the like; as for other sensors such as a gyroscope, a barometer, a hygrometer, a thermometer, and an infrared sensor, which can be configured in the terminal, detailed description is omitted here.
Wi-Fi belongs to the short-distance wireless transmission technology, and the terminal can help a user to receive and send e-mails, browse webpages, access streaming media and the like through the Wi-Fi module 507, and provides wireless broadband internet access for the user. Although fig. 7 shows the Wi-Fi module 507, it is understood that it does not belong to the essential constitution of the terminal, and may be omitted entirely as needed within the scope not changing the essence of the invention.
The processor 508 is a control center of the terminal, connects various parts of the entire mobile phone by using various interfaces and lines, and performs various functions of the terminal and processes data by operating or executing software programs and/or modules stored in the memory 502 and calling data stored in the memory 502, thereby integrally monitoring the mobile phone. Optionally, processor 508 may include one or more processing cores; preferably, the processor 508 may integrate an application processor, which mainly handles operating systems, user interfaces, application programs, etc., and a modem processor, which mainly handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into processor 508.
The terminal also includes a power supply 509 (e.g., a battery) for powering the various components, which may preferably be logically connected to the processor 508 via a power management system that may be used to manage charging, discharging, and power consumption. The power supply 509 may also include any component such as one or more dc or ac power sources, recharging systems, power failure detection circuitry, power converters or inverters, power status indicators, and the like.
Although not shown, the terminal may further include a camera, a bluetooth module, and the like, which will not be described herein. Specifically, in this embodiment, the processor 508 in the terminal loads the executable file corresponding to the process of one or more application programs into the memory 502 according to the following instructions, and the processor 508 runs the application programs stored in the memory 502, thereby implementing various functions.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments. The embodiments described above are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, such as circuits capable of debugging a plurality of antenna structures by adding an impedance matching circuit, which are mentioned in the embodiments of the present application, are obtained by those skilled in the art without making creative efforts based on the embodiments of the present application, and belong to the protection scope of the present application.
The above detailed description is given to a test circuit structure and an antenna test method provided in the embodiments of the present application, and specific examples are applied in the embodiments of the present application to explain the principles and embodiments of the present application, and the description of the above embodiments is only used to help understand the method and the core idea of the present application; meanwhile, for those skilled in the art, according to the idea of the present application, the specific implementation manner and the application scope may be changed, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (9)
1. A test circuit structure, comprising: the antenna comprises a radio frequency module, a plurality of antenna units, a plurality of antenna matching circuits and an impedance matching circuit, wherein the radio frequency module is electrically connected with the corresponding antenna units through the antenna matching circuit, the impedance matching circuit is connected in series between the antenna units and the antenna matching circuit, the setting position of the impedance matching circuit in the test circuit structure is determined by the antenna units debugged as required, the impedance matching circuit comprises an impedance resistor and an impedance capacitor, the GND pin of the impedance matching circuit is grounded, the impedance capacitor is connected in series with the GND pin, and the impedance resistor is connected in non-series with the GND pin.
2. The test circuit structure of claim 1, wherein the antenna elements comprise a first antenna element and a second antenna element, and the antenna matching circuit comprises a first antenna matching circuit and a second antenna matching circuit; the first antenna unit is electrically connected with the radio frequency module through the first antenna matching circuit, and the second antenna unit is electrically connected with the radio frequency module through the second antenna matching circuit.
3. The test circuit arrangement of claim 1, further comprising a motherboard electrically connected to the radio frequency module, wherein the impedance matching circuit has an impedance value equal to an input impedance value of the motherboard circuit.
4. An antenna test method applied to the test circuit structure of any one of claims 1 to 3, comprising:
the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to the debugging object and the connection rule to generate a test circuit;
and debugging the antenna unit.
5. The method of claim 4, wherein the debug object comprises a first debug object and a second debug object, the first debug object being a first antenna element, and the second debug object being a second antenna element.
6. The method of claim 5, wherein the impedance matching circuit is electrically connected to the plurality of antenna matching circuits and the plurality of antenna elements according to the debug object and the connection rule to generate a test circuit, comprising:
the debugging object is a first debugging object, and the impedance matching circuit is electrically connected with the antenna matching circuits and the antenna units according to a first connection rule to generate a first test circuit.
7. The method of claim 6, wherein the first connection rule is: the first antenna unit is electrically connected with the radio frequency module through a first antenna matching circuit; the second antenna unit is electrically connected with the impedance matching circuit, and the impedance matching circuit is electrically connected with the radio frequency module through the second antenna matching circuit.
8. The method of claim 5, wherein the impedance matching circuit is electrically connected to the plurality of antenna matching circuits and the plurality of antenna elements according to the debug object and the connection rule to generate a test circuit, comprising:
the debugging object is a second debugging object, and the impedance matching circuit is electrically connected with the plurality of antenna matching circuits and the plurality of antenna units according to a second connection rule to generate a first test circuit.
9. The method of claim 8, wherein the second connection rule is: the second antenna unit is electrically connected with the radio frequency module through a second antenna matching circuit; the first antenna unit is electrically connected with the impedance matching circuit, and the impedance matching circuit is electrically connected with the radio frequency module through the first antenna matching circuit.
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| CN117424658B (en) * | 2023-12-18 | 2024-06-21 | 云南云电信息通信股份有限公司 | Phased array antenna fault detection system |
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