CN111312172B - Image processing method - Google Patents

Image processing method Download PDF

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CN111312172B
CN111312172B CN202010178002.5A CN202010178002A CN111312172B CN 111312172 B CN111312172 B CN 111312172B CN 202010178002 A CN202010178002 A CN 202010178002A CN 111312172 B CN111312172 B CN 111312172B
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matrix
data
area
mura
sub
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CN111312172A (en
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陈伟
徐海侠
韩东旭
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BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/0233—Improving the luminance or brightness uniformity across the screen

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  • Computer Hardware Design (AREA)
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  • Crystallography & Structural Chemistry (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

The application provides an image processing method, relates to the technical field of image processing, and can improve the uniformity of display brightness of a display image. The image processing method comprises the following steps: acquiring a mura area of a display image, and a first area and a second area which are positioned on two sides of the mura area; the mura area includes N × M mura sub-units. Obtaining an initial matrix A0(ii) a Initial matrix A0The compensation data voltage of the driving transistor in each mura subunit in the mura area is included, and the compensation data voltage of the driving transistor is used for compensating the threshold voltage of the driving transistor. And acquiring a first compensation value of the first area and a second compensation value of the second area. Generating a first matrix A according to the first compensation value, the second compensation value and the position of the mura subunit1. Obtain a second matrix A2；A2＝A0‑A1. For the second matrix A2Correcting to obtain a third matrix A3. Obtaining a correction matrix B0，B0＝A1+A3(ii) a Will correct the matrix B0Each data in (1) is written to the driving transistor in the mura subcell matched to the each data.

Description

Image processing method
Technical Field
The invention relates to the technical field of image processing, in particular to an image processing method.
Background
When the existing display device displays images, because the brightness of each sub-pixel is different and the manufacturing process of the thin film transistor and the light emitting device in each sub-pixel is different, compensation measures need to be taken, common compensation measures include external compensation, the external compensation obtains compensation data voltage of the driving transistor in the sub-pixel through sensing line measurement, and the compensation data voltage compensates the influence of the threshold voltage of the driving transistor on the brightness of the light, so that the display effect of the display device is improved.
Disclosure of Invention
The embodiment of the invention provides an image processing method, which is used for solving the problem of uneven display brightness when a display device displays an image.
In order to achieve the above purpose, the embodiment of the invention adopts the following technical scheme:
in one aspect, an image processing method is provided for processing a display image; the method comprises the following steps:
acquiring at least one mura area of the display image, and a first area and a second area which are positioned on two sides of the mura area; the mura area comprises N multiplied by M mura subunits; wherein N is more than or equal to 1, and M is more than or equal to 1; n, M is an integer.
Obtaining an initial matrix A0(ii) a The initial matrix A0And compensating data voltages of driving transistors in each mura subunit in the mura area are included, and the compensating data voltages of the driving transistors are used for compensating threshold voltages of the driving transistors.
Acquiring a first compensation value of the first area; the first compensation value is an average value of compensation data voltages of the driving transistors in the first region.
Acquiring a second compensation value of the second area; the second compensation value is an average value of the compensation data voltage of the driving transistor in the second region.
Generating a first matrix A according to the first compensation value, the second compensation value and the position of the mura subunit1(ii) a Wherein, theThe first matrix A1The M data in the first row of (1) are the first compensation values; the first matrix A1The M data in the nth row of (a) are the second compensation values.
According to the first matrix A1And the initial matrix A0Obtain a second matrix A2；A2＝A0-A1。
According to the second matrix A2And the second matrix A2To the second matrix A2Correcting to obtain a third matrix A3。
According to the third matrix A3And the first matrix A1To obtain a correction matrix B0，B0＝A1+A3(ii) a Will correct the matrix B0Each data in (1) is written to the driving transistor in the mura subcell matched to the each data.
Optionally, the first compensation value is equal to the second compensation value, and the first matrix a1All data in (a) are equal.
Optionally, the first compensation value is different from the second compensation value in the first matrix a1In the row direction of the data, each row of data is equal; along the column direction of the data, each column of data is distributed in an arithmetic progression.
Optionally, according to the second matrix A2And the second matrix A2To the second matrix A2Correcting to obtain a third matrix A3The method comprises the following steps: if the second matrix A2Is greater than or equal to the set value, the second matrix A is processed2The data in (1) is subjected to zero-returning correction to obtain the third matrix A3The third matrix A3＝A2×0。
Optionally, according to the second matrix A2And the second matrix A2To the second matrix A2Correcting to obtain a third matrix A3The method comprises the following steps: if the second matrix A2Is smaller than the set value,for the second matrix A2The data in (2) is subjected to wavelet function correction to obtain the third matrix A3Said third matrix
Figure BDA0002411453140000021
Wherein
Figure BDA0002411453140000022
As wavelet functions, wavelet functions
Figure BDA0002411453140000023
Including variable x and a plurality of intervals.
According to the second matrix A2The variable x is obtained by the ratio of any one of the data b and the average value of the first compensation value and the second compensation value.
Correcting the data b according to the interval of the variable x; wherein the modifying the data b comprises: reserving the data b and correcting the data b into-b; and correcting the data b to be 0.
Optionally, the compensation data voltage of the driving transistor in the mura sub-unit is equal to an average value of the compensation data voltages of all the driving transistors in the mura sub-unit.
Optionally, the first area includes a plurality of first subunits; the first sub-unit includes a plurality of sub-pixels.
Acquiring a first compensation value of the first region comprises:
calculating an average value of the compensated data voltages of the driving transistors of the respective sub-pixels in each of the first sub-units to obtain first data.
And calculating the average value of the first data of each first subunit in the first area to obtain the first compensation value.
Optionally, the second area includes a plurality of second subunits; the second sub-unit includes a plurality of sub-pixels.
Acquiring a second compensation value of the second area comprises:
and calculating the average value of the compensation data voltage of the driving transistor of each sub-pixel in each second sub-unit to obtain second data.
And calculating the average value of the second data of each second subunit in the second area to obtain the second compensation value.
Optionally, in a case that the first area includes a plurality of first subunits, and the second area includes a second subunit: the number of the mura subunits, the first subunits and the second subunits is equal.
Optionally, the area of the mura subunit, the area of the first subunit, and the area of the second subunit are equal.
The application provides an image processing method, which obtains an initial matrix A by obtaining compensation data voltage of a driving transistor in each mura subunit in a mura area0Then passes through the first matrix A1For the initial matrix A0Processing will result in an initial matrix A0The data of the data exception are all concentrated in the second matrix A2To the second matrix A2The data in (1) are corrected to obtain a third matrix A3Finally according to a third matrix A3And a first matrix A1Obtaining a correction matrix B0Will correct the matrix B0The data in the mura area is used as a compensation data voltage of the driving transistor in each mura subunit in the mura area so as to improve the display brightness of each mura subunit, reduce the brightness difference between the mura area and a normal brightness display area (a first area and a second area), improve the uniformity of the display brightness of a display image, eliminate the mura phenomenon and improve the display effect of the display device.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram illustrating the distribution of mura areas and normal display areas in a monochrome image displayed by a display device according to the related art;
fig. 2 is a schematic flowchart of an image processing method according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating the distribution of a first sub-unit, a second sub-unit and a mura sub-unit in a monochrome picture according to an embodiment of the present invention;
FIG. 4a is a schematic diagram illustrating the distribution of a first sub-unit, a second sub-unit and a mura sub-unit in another monochrome picture according to an embodiment of the present invention;
FIG. 4b is a schematic diagram illustrating the distribution of the first sub-unit, the second sub-unit and the mura sub-unit in another monochrome picture according to an embodiment of the present invention;
fig. 5 is a flowchart illustrating another image processing method according to an embodiment of the present invention.
Reference numerals: 1-monochrome picture; 10-mura area; 100-mura subunits; 11-a first region; 110-a first subunit; 12-a second region; 120-second subunit.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The present application provides a display device, such as an LCD (Liquid crystal display) and an OLED (Organic Light-Emitting Diode display). The display device includes a display panel, for example, including a plurality of sub-pixels arranged in an array. In each sub-pixel, a pixel driving circuit is provided for controlling the sub-pixel to emit light. The pixel driving circuit includes a plurality of Thin Film Transistors (TFTs) and at least one capacitor, and one of the plurality of TFTs serves as a driving Transistor for controlling light emission luminance of the sub-pixel. The display panel also comprises a plurality of data lines and a plurality of grid lines; the pixel driving circuits in the same row are electrically connected with the same grid line, and the pixel driving circuits in the same column are electrically connected with the same data line; the data lines are used for transmitting data voltage signals to the pixel driving circuit, and the gate lines are used for transmitting gate driving signals to the pixel driving circuit. The gate driving signal transmitted by the gate line is used for controlling the thin film transistor in the pixel driving circuit to be turned on, and then the data voltage signal transmitted by the data line is transmitted to the gate of the driving transistor. Because the threshold voltages of the driving transistors in each pixel driving circuit actually have a certain difference due to the influence of the thin film transistor manufacturing process (e.g., evaporation process), and are not completely the same, in order to avoid the influence of the threshold voltages of the driving transistors on the display luminance of the sub-pixels, the pixel driving circuits are externally compensated, and the external compensation is mainly realized through sense (sensing line) lines. The sense line is electrically connected with the pixel driving circuit, the size of the compensation data voltage can be detected through the sense line by a time sequence controller in the display device, under an ideal state, the size of the compensation data voltage is equal to the size of the threshold voltage of the driving transistor, then the compensation data voltage is compensated into a data voltage signal provided by the data line, and finally the compensated data voltage signal is written into the grid electrode of the driving transistor, so that the threshold voltage of the driving transistor has no influence on the display brightness of the sub-pixel.
In the related art, when a display device displays an image, a display luminance abnormal region, which is generally referred to as a mura region, tends to occur. As shown in fig. 1, the display device displays, for example, a single-color screen 1, and the single-color screen 1 is, for example, any one of the single-color screens 1 such as red, green, blue, white, and black. In the monochrome picture 1 as shown in fig. 1, a first area 11, a mura area 10, and a second area 12 are included; wherein the first area 11 and the second area 12 are normal display brightness areas, the display brightness of the first area 11 and the display brightness of the second area 12 may be the same or different, but even if the difference between the two areas is very small, the difference is not easily recognized by human eyes in a monochrome picture, so the first area 11 and the second area 12 are normal display brightness areas; the display luminance of the mura area 10 is different from the display luminance of the first area 11 and the second area 12, and such a difference can be recognized by human eyes; illustratively, the display luminance of the mura area 10 is greater than the display luminance of the first area 11 and the second area 12, or the display luminance of the mura area 10 is less than the display luminance of the first area 11 and the second area 12, so the mura area 10 is an area with abnormal display luminance. The existence of the mura area 10 greatly affects the display effect of the display device, and particularly, the display effect of the monochrome screen 1 is seriously affected, so that improvement is urgently needed.
In each sub-pixel, due to the influence of the TFT manufacturing process, the threshold voltages of the TFTs have certain difference, so that the compensation data voltages in each pixel driving circuit are different, and the compensation data voltages of each TFT can be ensured to be equal to the threshold voltage. However, the inventors of the present application have found that the mura region 10 is caused by the abnormal compensation data voltage measured by the sense line, which may cause the abnormal compensation data voltage and the threshold voltage of the driving transistor not to be normally offset, so that when the monochrome image 1 is displayed, the actual display luminance of the sub-pixel is different from the expected display luminance, that is, the mura region 10 appears. In order to reduce the influence of abnormal compensation voltage data obtained by sense measurement on a display image, the application provides an image processing method for processing the display image so as to solve the mura problem of the display device when the display device displays the image.
Based on the above, as shown in fig. 2, the image processing method proposed by the present application includes:
s1, as shown in fig. 3, acquiring at least one mura area 10 of the display image, and a first area 11 and a second area 12 located at both sides of the mura area 10; the mura area 10 includes N × M mura subunits 100; wherein N is more than or equal to 1, and M is more than or equal to 1; n, M is an integer.
The display image includes the display of the monochromatic screen 1 and the display of the multicolor screen, and the mura area 10 is easily observed during the display of the monochromatic screen 1, so the drawings of the application are illustrated by taking the monochromatic screen 1 as an example.
For example, during the display of the monochrome screen 1, there may be one or more mura areas 10. When there are a plurality of mura areas 10, there are a plurality of first areas 11 and a plurality of second areas 12, and when the first area 11 and the second area 12 are determined, the determination needs to be performed according to one mura area 10, and the first area 11 and the second area 12 are respectively located on two sides of the mura area 10, that is, the monochrome screen 1 shown in fig. 3. Therefore, one first area 11, one second area 12, and one mura area 10 may be regarded as a set of areas, and the image processing method provided in the present application is applicable to the processing of each set of areas.
The mura area 10 includes N × M mura subunits 100; illustratively, as shown in FIG. 3, the mura area 10 includes 4 × 1 mura sub-units 100.
S2, obtaining an initial matrix A0(ii) a Initial matrix A0Including the compensated data voltages of the driving transistors in the respective mura sub-cells 100 in the mura area 10, which are used to compensate the threshold voltages of the driving transistors.
Initial matrix A0Is located in a one-to-one correspondence with the location of one mura subunit 100, for example, the mura subunit 100 is in the first row and the third column, and then the initial matrix a is0The data corresponding to the mura sub-unit 100 is located in the initial matrix A0The first row and the third column of the data column of (1). Since the mura area includes N × M mura sub-units, the initial matrix A0Is an N × M array matrix, where N is the number of rows and M is the number of columns, which are all positive integers.
Illustratively, the mura area 10 includes 4 mura subunits 100 distributed in a row; then the initial matrix a0Is a 1 x 4 array matrix.
Illustratively, the initial matrix A0＝[a011、a012、a013、a014]Wherein a is011、a012、a013、a014For example, to drive the crystal in each mura sub-unit 100 in the left-to-right directionThe compensation data voltage of the transistor, i.e. the compensation data voltage of the driving transistor in the first mura sub-unit 100, is a011The compensation data voltage of the driving transistor in the second mura sub-unit 100 is a012The compensation data voltage of the driving transistor in the third mura sub-unit 100 is a013The compensation data voltage of the driving transistor in the fourth mura sub-unit 100 is a014。
Illustratively, the mura sub-unit 100 includes t sub-pixels, 1 ≦ t, and is an integer; the compensated data voltage of the driving transistor in the mura sub-unit 100 is equal to the average value of the compensated data voltages of the driving transistors of the t sub-pixels.
S3, acquiring a first compensation value of the first area 11; the first compensation value is an average value of the compensation data voltages of the driving transistors in the first region 11.
Illustratively, the sum of the compensated data voltages of all the driving transistors in the first region 11 is obtained and then averaged to obtain the first compensation value dav1。
S4, acquiring a second compensation value of the second area 12; the second compensation value is an average value of the compensated data voltages of the driving transistors in the second region 12.
Illustratively, the sum of the compensated data voltages of all the driving transistors in the second region 12 is obtained and then averaged to obtain the second compensation value dav2。
S5, according to the first compensation value dav1A second compensation value dav2And the location of the mura subunit 100, a first matrix A is generated1(ii) a Wherein the first matrix A1The M data in the first row of (1) are all first compensation values; a first matrix A1The M data in the nth row of (a) are all the second compensation values.
A first matrix A1Can be expressed in the following form:
Figure BDA0002411453140000071
a first matrix A1Data column structure and initial matrix A of0Has the same data column structure, i.e. the first matrix A1And is also an N × M array matrix, where N is the number of rows and M is the number of columns, which are all positive integers.
A first matrix A1All the first row data in (1) are dav1And the last row (Nth row) of data are dav2(ii) a Any data a between the first row data and the last row dataijCan be calculated using equation (1):
Figure BDA0002411453140000081
in the formula (1), i is any row, i is less than or equal to N and is a positive integer; j is any column, j is less than or equal to M and is a positive integer.
As can be seen from the formula (1), aijIs independent of the number of columns M, so that the initial matrix a0A plurality of data included in any one line of data in (b) is equal.
According to formula (1), at dav1And dav2In case of equality, the initial matrix A0All data in (1) are equal to dav1。
At dav1And dav2In case of inequality, dav1、a21、a31……aij、dav2Presenting an arithmetic progression.
As an example, when i is 2,
Figure BDA0002411453140000082
initial matrix A0The size of the second row of data is equal to a21(ii) a When the value of i is 3, the value of i,
Figure BDA0002411453140000083
by analogy, it can be known that dav1、a21、a31……aij、dav2Are distributed in an arithmetic progression.
According to equation (1), at the initial matrix A0In the case of including only one line of data, the size of the one line of data is equal to dav1(ii) a At the initial matrix A0In the case of data comprising two rows, the size of the first row of data is equal to dav1(ii) a The size of the second row of data is equal to dav2。
S6, according to the first matrix A1And an initial matrix A0Obtain a second matrix A2；A2＝A0-A1。
It will be understood by those skilled in the art that the number of rows and columns of each matrix is the same when the matrices are subtracted, and thus, the initial matrix A is0A first matrix A1And a second matrix A2Are all N M array matrixes.
Initial matrix A0Is abnormal, so that the mura area 10 is caused to appear, and the first matrix a1All the data in (1) are regularly arranged, especially when the first matrix A1When the data of any column is distributed in an equal difference, the brightness difference between the mura area 10 and the first and second areas 11 and 12 can be made smaller, so that the brightness difference is smaller according to the initial matrix A0And a first matrix A1Obtaining a second matrix A2Then, the initial matrix A is resulted0The data of the data exception are all concentrated in the second matrix A2In (1). Thus, the first matrix A1Can play the role of data screening and data transition, wherein the data screening refers to leading to the initial matrix A0The data of the data anomaly passes through the first matrix A1All concentrate on the second matrix A after screening2Performing the following steps; the data transition refers to the first matrix A1The first row data in (1) and the first compensation value d of the first area 11av1Equal, last row data and second compensation value d of second area 12av2And therefore, the data in the first region 11, the mura region 10 and the second region 12 are gradually transited, the difference between the data is small, and the mura region 10 becomes a transition region, so that the uniformity and the uniformity of the display brightness of the display image are improved.
S7, according to the second matrix A2And a second matrix A2To the second matrix A2Correcting to obtain a third matrix A3。
Resulting in an initial matrix A0In which data anomalous data is concentrated in a second matrix a2Therefore, a second matrix A is required2The data in (1) is corrected.
Illustratively, may be based on the second matrix A2The relationship between the standard deviation of (A) and the preset standard deviation (set value), selecting different correction methods, and correcting the second matrix A2To obtain a corrected matrix, i.e. a third matrix A3。
For example, the preset standard deviation is an empirical value, and the empirical value needs to be calculated according to parameters in a specific display device.
S8, according to the third matrix A3And a first matrix A1To obtain a correction matrix B0，B0＝A1+A3(ii) a Will correct the matrix B0Each data in (1) is written to the driving transistor in the mura sub-unit 100 matched with the each data.
Correction matrix B0Number of rows and columns and initial matrix A0Same, correction matrix B0One to one with one mura subunit 100, and the correction matrix B is applied0Each data in (a) is written to the drive transistor in the matched mura sub-unit 100, i.e. with the correction matrix B0The data in (1) is used as the compensation data voltage of the driving transistor in the mura sub-unit 100, so that the compensation data voltage of the driving transistor is closer to or equal to the threshold voltage thereof, thereby improving the display brightness of the sub-pixel and improving the display effect.
The present application provides an image processing method, which obtains an initial matrix A by obtaining the compensation data voltage of the driving transistor in each mura subunit 100 in the mura area 100Then passes through the first matrix A1For the initial matrix A0Processing will result in an initial matrix A0The data of the data exception are all concentrated in the second matrix A2To the second matrix A2The data in (1) are corrected to obtain a third matrix A3Finally according to a third matrix A3And a first matrix A1Obtaining a correction matrixB0Will correct the matrix B0The data in (1) is used as a compensation data voltage of a driving transistor in each mura subunit 100 in the mura area 10 to improve the display brightness of each mura subunit 100, reduce the brightness difference between the mura area 10 and a normal brightness display area (the first area 11 and the second area 12), improve the uniformity of the display brightness of a display image, eliminate the mura phenomenon and improve the display effect of the display device.
Optionally, the first compensation value dav1Is equal to the second compensation value dav2First matrix A1All data in (a) are equal.
First compensation value dav1Is equal to the second compensation value dav2That is, in displaying an image, the average value of the compensated data voltages of the driving transistors in the first area 11 and the average value of the compensated data voltages in the second area 12 are equal, so the average value of the compensated data voltages of the driving transistors in the mura area 10, which is a transition area, and the first compensation value dav1A second compensation value dav2When equal, the brightness difference between the mura area 10 and the first and second areas 11 and 12 will be close to 0, and the display effect of the displayed image is best, and therefore, the first matrix a1All the data in (1) are equal, and the mura phenomenon can be eliminated to the maximum extent.
Optionally, the first compensation value dav1And a second compensation value dav2In contrast, in the first matrix A1In the row direction of the data, each row of data is equal; along the column direction of the data, each column of data is distributed in an arithmetic progression.
Each column of data is distributed in an arithmetic progression column, namely, the data of the ith-1 row and the jth column, the data of the ith row and the jth column and the data of the (i + 1) th row and the jth column are distributed in an arithmetic progression column in sequence.
According to equation (1), the first matrix A can be made1Any one column of data is distributed in an arithmetic series, and a first matrix A1The medium data are distributed in an arithmetic progression, so that the brightness displayed by a partial area of the mura area 10 close to the first area 11 is close to the brightness displayed by the first area 11, and the brightness displayed by a partial area of the mura area 10 close to the second area 1 is also close to the first area 112 is closer to the display brightness of the second area 12, so that the mura area 10 completes the transition from the display brightness of the first area 11 to the display brightness of the second area 12, reduces the brightness difference among the areas, and improves the uniformity of the display brightness of the display image.
Optionally according to a second matrix A2And a second matrix A2To the second matrix A2Correcting to obtain a third matrix A3The method comprises the following steps: if the second matrix A2Is greater than or equal to the set value sigma', the second matrix A is subjected to2The data in (1) is subjected to zero-return correction to obtain a third matrix A3The third matrix A3＝A2×0。
Third matrix A3＝A2X 0, then the third matrix A3The data in (1) are all 0.
At this time, the matrix B is corrected0＝A1Second matrix A2The middle exception data is cleared entirely.
Causes of the abnormality of the compensated data voltage of the driving transistor in the mura area 10 include: the process for fabricating the thin film transistor in the pixel driving circuit affects noise, such as interference signal noise, air noise, etc., generated by other components in the display device. If the second matrix A2The standard deviation sigma 'is larger than or equal to the set value sigma', it is considered that the compensation data voltage is abnormal due to noise interference, and the compensation data voltage generated by the noise interference generally deviates from the normal value greatly, so the second matrix A2The data in (1) is subjected to zero-resetting correction, and the data causing the abnormal voltage of the compensation data is completely eliminated, so that the display brightness of the mura area 10 can be corrected.
Optionally according to a second matrix A2And a second matrix A2To the second matrix A2Correcting to obtain a third matrix A3The method comprises the following steps: if the second matrix A2Is less than the set value sigma', the second matrix A is2The data in (1) is subjected to wavelet function correction to obtain a third momentArray A3Third matrix
Figure BDA0002411453140000111
Wherein
Figure BDA0002411453140000112
In order to be a function of the wavelet,
Figure BDA0002411453140000113
comprises [0, 0.5]]、(0.5，1]Four intervals of (-infinity, 0) and (1, ∞), wavelet function
Figure BDA0002411453140000114
Including variable x and a plurality of intervals.
Wavelet function
Figure BDA0002411453140000115
As Haar wavelet function, wavelet function
Figure BDA0002411453140000116
Can be expressed as the following formula (2).
Figure BDA0002411453140000117
According to a second matrix A2Any data b and the first compensation value dav1A second compensation value dav2The variable x is obtained as the ratio between the mean values of
Figure BDA0002411453140000118
If the variable x belongs to [0, 0.5]]B × 1, i.e. data b is retained. The variable x belongs to [0, 0.5]]Interval of (2), description of initial matrix A0The data corresponding to the position of the data b deviates from the first compensation value dav1And a second compensation value dav2The magnitude of the mean between is small and the data can be retained for use.
For example, if the third matrix A3Any one of the data b' and the second matrix A2If any data b in the matrix is corresponding, the third matrix A is3Any data b' ═ b.
Therefore, the variable x belongs to the interval of [0, 0.5], which means that the data has smaller deviation from the normal value and can be reserved without correction.
If the variable x belongs to the interval of (0.5, 1), the data b is corrected by b × (-1), i.e., the data b is corrected to-b.
For example, if the third matrix A3Any one of the data b' and the second matrix A2If any data b in the matrix is corresponding, the third matrix A is3Any data b' ═ b.
If x belongs to (0.5, 1)]The interval of (b) is to perform inverse correction on the data, namely correcting the data b to be-b; after the data b is inverted, the initial matrix A can be formed0The data originally corresponding to the position of the data b is closer to the first compensation value d after being correctedav1And a second compensation value dav2Average value in between.
If the second matrix A2If any of the data b in (1) or (infinity, 0) is included, the data b is corrected to 0.
If the variable x belongs to (- ∞, 0), it means that the data deviates too much from the normal value, so the data b is discarded and modified by bx 0, i.e. b is modified to 0.
Similarly, if the variable x belongs to the (1, ∞) interval, the data b is discarded and b is corrected to 0, because the data b deviates too much from the normal value.
For example, if the third matrix A3Any one of the data b' and the second matrix A2If any data b in the matrix is corresponding, the third matrix A is3Any data b' is 0.
As will be appreciated by those skilled in the art, wavelet functions
Figure BDA0002411453140000121
The data model is a data model, wherein each interval of the variable x needs to be specifically limited according to the data to be processed, and is not limited to the 4 intervals listed in the application.
In this applicationIf the second matrix A2Is less than the set value sigma', it is considered that the process causes the compensation data voltage abnormity, and part of the data in the compensation data voltage abnormity caused by the process can be used, so that the wavelet function is used
Figure BDA0002411453140000122
Class pair second matrix A2Each data in (a) is corrected. In which wavelet function
Figure BDA0002411453140000131
Comprises four sections, the coverage is comprehensive, and the coverage is according to the second matrix A2Any data b and the first compensation value dav1A second compensation value dav2The data b is corrected in the interval where the ratio x between the average values is located, the data correction is fine, and the improvement effect of the displayed image is better.
In the present application, the second matrix A is determined2The standard deviation sigma of (a) and its set value sigma', classifying the second matrix A2Is corrected if the second matrix a is used2If the standard deviation sigma is larger than or equal to the set value sigma', the compensation data voltage is considered to be abnormal due to noise, and the compensation data voltage is subjected to zeroing treatment; if the second matrix A2Is less than the set value sigma', it is considered that the process causes the compensation data voltage abnormity, and the wavelet function is carried out on the compensation data voltage abnormity
Figure BDA0002411453140000133
Processing; the classification process may be applied to the second matrix A according to different situations2The data in the image processing system are corrected more accurately, and the display effect of the display image is improved to the maximum extent.
Alternatively, the compensated data voltage of the driving transistors in the mura sub-unit 100 is equal to the average value of the compensated data voltages of all the driving transistors in the mura sub-unit 100.
Illustratively, any mura sub-unit 100 includes q sub-pixels, 1 ≦ q, and is an integer; each sub-pixel comprises a driving transistor, and compensation of q driving transistorsThe data voltage is q in turn1、q2、q3……qq. The drive transistor in the mura subcell 100
Figure BDA0002411453140000132
Optionally, the mura sub-unit 100 includes a sub-pixel, and the compensated data voltage of the driving transistor in the mura sub-unit 100 is equal to the compensated data voltage of the driving transistor in the sub-pixel.
The compensation data voltage of the driving transistor in the mura subunit 100 is simple to calculate.
Alternatively, as shown in fig. 3, the first area 11 includes a plurality of first sub-units 110; the first sub-unit 110 includes a plurality of sub-pixels.
Illustratively, the first area 11 includes 3 first subunits 110.
Acquiring the first compensation value of the first region 11 includes:
s30, calculating an average value of the compensated data voltages of the driving transistors of the respective sub-pixels in each of the first sub-units 110 to obtain first data.
Illustratively, each first sub-unit 110 includes r sub-pixels, 1 ≦ r, and is an integer; calculating the average value of the compensation data voltages of the driving transistors in the r sub-pixels to obtain a first data, such as d1。
Illustratively, the first data d of 3 first subunits 110 are calculated respectively1The 3 first data are, for example, d11、d12、d13。
S31, calculating an average value of the first data of each first sub-unit 110 in the first area 11 to obtain a first compensation value dav1。
Illustratively, 3 first data d are calculated11、d12And d13To obtain a first compensation value dav1。
By dividing the first area 11 into a plurality of first sub-units 110 and then calculating the first data d of the first sub-units 110 respectively1Then according to a plurality ofA first data d1Calculating a first compensation value dav1Errors in data calculation can be reduced.
Optionally, each first sub-unit 110 includes 1 sub-pixel, and the first data d is then obtained1Equal to the compensated data voltage of the drive transistor in that subpixel.
The first compensation value d can be obtained by directly averaging the compensation data voltages of the driving transistors of all the sub-pixels in the first region 11av1The calculation process is simpler.
Optionally, as shown in fig. 3, the second area 12 includes a plurality of second subunits 120; the second sub-unit 120 includes a plurality of sub-pixels.
Illustratively, the second area 12 includes 2 second subunits 120.
Acquiring the second compensation value of the second area 12 includes:
s40, calculating an average value of the compensated data voltages of the driving transistors of the respective sub-pixels in each of the second sub-units 120 to obtain second data.
Illustratively, each second sub-unit 120 includes s sub-pixels, 1 ≦ s, and is an integer; calculating the average value of the compensated data voltages of the driving transistors in the s sub-pixels to obtain the second data, such as d2。
Illustratively, the second data d of 2 second subunits 120 are calculated respectively2The 2 second data are, for example, d21And d22。
S41, calculating an average value of the second data of each second sub-unit 120 in the second area 12 to obtain a second compensation value dav2。
Illustratively, 2 second data d are calculated21And d22To obtain a second compensation value dav2。
By dividing the second area 12 into a plurality of second sub-units 120 and then calculating the second data d of the second sub-units 120, respectively2According to a plurality of second data d2Calculating a second compensation value dav2Errors in data calculation can be reduced.
Optionally, each second sub-unit 120 includes 1 sub-pixel, and then the second data d2Equal to the compensated data voltage of the drive transistor in that subpixel.
The second compensation value d can be obtained by directly averaging the compensation data voltages of the driving transistors of all the sub-pixels in the second region 12av2The calculation process is simpler.
Alternatively, as shown in fig. 4a, in the case that the first area 11 includes a plurality of first sub-units 110, and the second area 12 includes a second sub-unit 120: the number of mura subunits 100, first subunits 110 and second subunits 120 is equal.
Illustratively, as shown in FIG. 4a, the number of mura sub-units 100, first sub-units 110, and second sub-units 120 is 4.
The number of the mura subunits 100, the first subunits 110 and the second subunits 120 is equal, so that the mura subunits 100, the first subunits 110 and the second subunits 120 can be conveniently divided, and the calculation of the first compensation value d by the subunits is further facilitatedav1And a second compensation value dav2And the difference between data calculations can be reduced, thereby reducing errors.
Alternatively, as shown in FIG. 4b, the area of the mura sub-unit 100, the area of the first sub-unit 110, and the area of the second sub-unit 120 are equal.
When the area of the mura sub-unit 100, the area of the first sub-unit 110 and the area of the second sub-unit 120 are equal, the number of sub-pixels included in the mura sub-unit 100, the first sub-unit 110 and the second sub-unit 120 is equal, which is convenient for calculating the compensation data voltage and the first compensation value d of the driving crystal in the mura sub-unit 100av1And a second compensation value dav2And the difference between data calculations can be reduced, thereby reducing errors.
Therefore, when the area of the mura sub-unit 100, the area of the first sub-unit 110, and the area of the second sub-unit 120 are equal, the calculation of various data is facilitated, and the error can be reduced.
The following describes an overall and exemplary image processing method in the present application.
As shown in fig. 5, the image processing method provided by the present application includes:
s100, acquiring data, wherein the acquiring of the data comprises acquiring an initial matrix A according to the compensation data voltage of the driving transistor in the mura subunit 100 in the mura area 100(ii) a Obtaining a first compensation value d according to the first data of the first subunit 110 in the first area 11av1(ii) a And obtaining a second compensation value d according to the second data of the second subunit 120 in the second area 12av2。
S200, acquiring a second matrix A2，A2＝A0-A1(ii) a Wherein according to the first compensation value dav1A second compensation value dav2And the location of the mura subunit 100, a first matrix A is generated1。
S300, correcting the second matrix A2The data of (1).
S400, judging a second matrix A2Whether the standard deviation sigma is larger than or equal to a set value sigma' or not; if yes, executing S500; if not, S600 is executed.
S500, for the second matrix A2The data in (1) is subjected to zero-returning correction to obtain a third matrix A3，A3＝A2×0。
S600, for the second matrix A2Performing wavelet function on the data in (1)
Figure BDA0002411453140000161
Correcting to obtain a third matrix A3，
Figure BDA0002411453140000162
。
S700, obtaining a correction matrix B0，B0＝A1+A3。
And S800, displaying the image. The display image is, for example, a monochrome screen 1.
The above steps S100 and S200 are mainly performed by data acquisition and decomposition to obtain the second matrix a containing abnormal data2(ii) a The steps S300 and S400 are mainly to perform data detection to determine the second matrix A by detection2The next step ofHow to correct; steps S500, S600 and S700 are mainly data correction and fusion, which is to apply the second matrix A2The data in (1) is corrected to obtain a third matrix A3Then the third matrix A3And a first matrix A1After the fusion, a correction matrix B is obtained0(ii) a S800 is mainly used for displaying data and is based on a correction matrix B0The data in (1) is displayed.
The image processing method is used for detecting the display effect of the display device before the display device leaves a factory, and when the display effect of the display device is detected, if the mura area 10 appears in the display image of the display device, the display device can be debugged through the image processing method in the application so as to improve the display effect of the display device.
Those of ordinary skill in the art will understand that: all or part of the steps for implementing the method embodiments may be implemented by hardware related to program instructions, and the program may be stored in a computer readable storage medium, and when executed, the program performs the steps including the method embodiments; and the aforementioned storage medium includes: various media that can store program codes, such as ROM, RAM, magnetic or optical disks.
The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.

Claims (8)

1. An image processing method for processing a display image; the method comprises the following steps:
acquiring at least one mura area of the display image, and a first area and a second area which are positioned on two sides of the mura area; the mura area comprises N multiplied by M mura subunits; wherein N is more than or equal to 1, and M is more than or equal to 1; n, M is an integer;
obtaining an initial matrix A0(ii) a The initial matrixA0The compensation data voltage of the driving transistor in each mura subunit in the mura area is included, and the compensation data voltage of the driving transistor is used for compensating the threshold voltage of the driving transistor;
acquiring a first compensation value of the first area; the first compensation value is the average value of the compensation data voltage of the driving transistor in the first area;
acquiring a second compensation value of the second area; the second compensation value is an average value of compensation data voltages of the driving transistors in the second area;
generating a first matrix A according to the first compensation value, the second compensation value and the position of the mura subunit1(ii) a Wherein the first matrix A1The M data in the first row of (1) are the first compensation values; the first matrix A1The M data in the Nth row of (1) are the second compensation values;
according to the first matrix A1And the initial matrix A0Obtain a second matrix A2；A2＝A0-A1；
According to the second matrix A2And the second matrix A2To the second matrix A2Correcting to obtain a third matrix A3；
According to the third matrix A3And the first matrix A1To obtain a correction matrix B0，B0＝A1+A3(ii) a Will correct the matrix B0Each data in (1) is written to the driving transistor in the mura subcell matched with the each data;
wherein, according to the standard deviation of the second matrix a2 and the second matrix a2, modifying the second matrix a2 to obtain a third matrix A3 comprises:
if the standard deviation of the second matrix A2 is less than a set value, performing wavelet function correction on the data in the second matrix A2 to obtain a third matrix A3, wherein the third matrix is
Figure FDA0002931286790000011
Figure FDA0002931286790000012
Wherein
Figure FDA0002931286790000013
As wavelet functions, wavelet functions
Figure FDA0002931286790000014
Comprising a variable x and a plurality of intervals;
obtaining a variable x according to the ratio of any data b in the second matrix A2 to the average value of the first compensation value and the second compensation value;
correcting the data b according to the interval of the variable x; wherein the modifying the data b comprises: reserving the data b and correcting the data b into-b; correcting the data b to be 0;
if the standard deviation of the second matrix a2 is greater than or equal to a set value, zero-setting correction is performed on the data in the second matrix a2 to obtain the third matrix A3, where the third matrix A3 is a2 × 0.
2. The image processing method according to claim 1, wherein the first compensation value is equal to the second compensation value, and wherein the first matrix A is a1All data in (a) are equal.
3. The image processing method according to claim 1, wherein the first compensation value is different from the second compensation value in the first matrix a1In the row direction of the data, each row of data is equal; along the column direction of the data, each column of data is distributed in an arithmetic progression.
4. The method according to claim 1, wherein the compensated data voltage of the driving transistors in the mura sub-cells is equal to an average of the compensated data voltages of all the driving transistors in the mura sub-cells.
5. The image processing method according to claim 1, wherein the first region includes a plurality of first subunits; the first sub-unit comprises a plurality of sub-pixels;
acquiring a first compensation value of the first region comprises:
calculating an average value of the compensated data voltages of the driving transistors of the respective sub-pixels in each of the first sub-units to obtain first data;
and calculating the average value of the first data of each first subunit in the first area to obtain the first compensation value.
6. The image processing method according to claim 1 or 5, wherein the second region includes a plurality of second subunits; the second subunit comprises a plurality of sub-pixels;
acquiring a second compensation value of the second area comprises:
calculating an average value of the compensated data voltages of the driving transistors of the respective sub-pixels in each of the second sub-units to obtain second data;
and calculating the average value of the second data of each second subunit in the second area to obtain the second compensation value.
7. The image processing method according to claim 6, wherein in a case where the first region includes a plurality of first subunits and the second region includes a second subunit:
the number of the mura subunits, the first subunits and the second subunits is equal.
8. The image processing method of claim 7, wherein the area of the mura sub-unit, the area of the first sub-unit, and the area of the second sub-unit are equal.
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