CN111308603A - Oblique optical axis phase difference film - Google Patents
Oblique optical axis phase difference film Download PDFInfo
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- CN111308603A CN111308603A CN202010276068.8A CN202010276068A CN111308603A CN 111308603 A CN111308603 A CN 111308603A CN 202010276068 A CN202010276068 A CN 202010276068A CN 111308603 A CN111308603 A CN 111308603A
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3083—Birefringent or phase retarding elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
- G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
Abstract
The invention discloses an oblique optical axis phase difference film, and belongs to the technical field of optical films for liquid crystal display. The oblique optical axis phase difference film comprises a polarizer layer, a first phase difference layer and a second phase difference layer which are sequentially overlapped from top to bottom, wherein the phase difference value R0(550) of the first phase difference layer is 180 nm-300 nm, and the phase difference value R0(550) of the second phase difference layer is 80nm-175 nm. The first phase difference layer and the second phase difference layer of the oblique optical axis have oblique optical axes, can be directly attached to the polarizer layer in a roll-to-roll mode, do not need to be cut or rotated, and can greatly improve the material utilization rate and the production efficiency. The antireflection film prepared by the invention can reduce the reflectivity of a visible light wave band (400nm-780nm) from 80% to below 10%.
Description
Technical Field
The invention relates to the technical field of optical films for liquid crystal display, in particular to an oblique optical axis phase difference film.
Background
The antireflection film for OLED flexible display is formed by laminating a plurality of layers of phase difference layers with different optical axis angles, improves contrast by preventing reflected light of metal electrodes inside the OLED from entering human eyes, reduces interference of ambient light to display, and achieves the purpose of improving display effect.
The optical axis of the existing phase difference layer is transverse or longitudinal along the film, and needs to be cut and then rotated by an angle to be attached to the polarizer layer, so that the material utilization rate can be reduced during cutting, and meanwhile, the cutting procedure is increased, so that the processing procedure is complex, and the improvement of the production efficiency is not facilitated.
Disclosure of Invention
The invention aims to provide an oblique optical axis phase difference film which is used for solving the problem that the uniformity of an angle and a phase difference of an oblique optical axis is difficult to control in the production process in the prior art. The first phase difference layer and the second phase difference layer of the oblique optical axis have oblique optical axes, can be directly attached to the polarizer layer in a roll-to-roll mode, do not need to be cut or rotated, and can greatly improve the material utilization rate and the production efficiency.
In order to achieve the purpose, the invention adopts the following technical scheme:
a retardation film having an oblique optical axis comprises a polarizer layer, a first retardation layer and a second retardation layer stacked in this order from top to bottom, wherein a retardation value R0(550) of the first retardation layer is 180nm to 300nm, where R0(550) represents an in-plane retardation value of the first retardation layer measured under light having a wavelength of 550nm, and a retardation value R0(550) of the second retardation layer is 80nm to 175 nm. Here, R0(550) represents an in-plane phase difference value of the second retardation layer measured under light having a wavelength of 550 nm.
More preferably, the included angle between the slow axis angle of the first retardation layer and the absorption axis of the polarizer layer is theta1The included angle between the slow axis angle of the second phase difference layer and the absorption axis of the polarizer layer is theta2。
More preferably, θ is2＝2θ1+45°，θ1>0 degree; or theta2＝2θ1-45°，θ1<0°。
More preferably, the retardation value R0(550) of the first retardation layer is 240nm to 265 nm.
More preferably, the retardation value R0(550) of the first retardation layer is 245 nm.
More preferably, the retardation value R0(550) of the second retardation layer is 120nm to 145 nm.
More preferably, the retardation value R0(550) of the second retardation layer is 125 nm.
More preferably, θ is110-20 ° (or 70-90 °), corresponding to θ2The value of θ is preferably 70 ° to 90 ° (or 10 ° to 20 °), and θ is more preferably115 ° (or ± 75 °), corresponding to θ2The angle is preferably ± 75 ° (or ± 15 °).
The working principle of the invention is as follows: through the combination, natural light entering the antireflection film with the structure can be converted into linearly polarized light after passing through the surface polarizer layer, and the polarization direction of the linearly polarized light is perpendicular to the absorption axis of the polarizer layer. After the linearly polarized light passes through the first phase difference layer, the electric vector and the magnetic vector of the linearly polarized light can generate a phase difference of pi, but the linearly polarized light still has the polarization direction rotated by 180 degrees. After the linearly polarized light passes through the second layer phase difference layer, an electric vector and a magnetic vector of the linearly polarized light generate a pi/2 phase difference, the linearly polarized light is converted into rightly (or leftwards) circularly polarized light, the rightly (or leftwards) circularly polarized light is converted into leftwards (or rightwards) circularly polarized light after being reflected by the mirror surface of the OLED metal electrode, the leftwards (or rightwards) circularly polarized light is converted into linearly polarized light after passing through the second layer phase difference layer again, the electric vector and the magnetic vector of the leftwards (or leftwards) circularly polarized light generate the pi/2 phase difference, and the leftwards polarized light is just parallel to the direction of the absorption axis of the polarizer layer and is absorbed by the absorption axis of the polarizer layer, so that the reflected light is prevented from entering human eyes, the reflection effect of the OLED metal electrode is reduced, and the effect of improving the contrast.
Compared with the prior art, the invention has the beneficial effects that:
1. the first phase difference layer and the second phase difference layer of the oblique optical axis have oblique optical axes, can be directly attached to the polarizer layer in a roll-to-roll mode, do not need to be cut or rotated, and can greatly improve the material utilization rate and the production efficiency.
2. The antireflection film prepared by the invention can reduce the reflectivity of a visible light wave band (400nm-780nm) from 80% to below 10%.
Drawings
FIG. 1 is a cross-sectional view of an oblique-axis retardation film according to the present invention;
FIG. 2 is a top view of an oblique-axis retardation film according to the present invention; the long side direction in fig. 2 is the absorption axis direction of the polarizer layer, where:
θ1the included angle between the optical axis (slow axis) direction of the first phase difference layer and the absorption axis direction of the polaroid;
θ2the included angle between the optical axis (slow axis) direction of the second phase difference layer and the absorption axis direction of the polaroid;
the labels in the figure are: 100-polarizer layer, 110-first retardation layer, 120-second retardation layer.
Detailed Description
The present invention will be further described with reference to the following examples, which are intended to illustrate only some, but not all, of the embodiments of the present invention. Based on the embodiments of the present invention, other embodiments used by those skilled in the art without any creative effort belong to the protection scope of the present invention.
The first embodiment is as follows:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny — nz, the optical axis angle (slow axis) of which is 15 ° to the polycarbonate film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The angle of the optical axis (slow axis) is measured by using an Axoscan phase difference measuring instrumentThe angle of the optical axis (slow axis) measured is the angle with the longitudinal direction (MD direction) of the first retardation layer.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the second retardation layer0(550) At 125nm, it showed nx>ny — nz, the optical axis angle (slow axis) of which is 75 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter. In this example, the measurement results of the reflectance of the antireflection film, i.e., the oblique-axis retardation film, are shown in table 1.
Example two:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny is the refractive index characteristic of nz, the optical axis angle (slow axis) of which is 20 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, the optical axis angle (slow axis) is 85 ° from the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter. In this embodiment of the present invention,the measurement results of the reflectance of the antireflection film, i.e., the oblique-axis retardation film, are shown in table 1.
Example three:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny — nz, the optical axis angle (slow axis) is 25 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, the optical axis angle (slow axis) is 95 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Example four:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny — nz, the optical axis angle (slow axis) is 30 ° to the film machine direction (MD direction). R0(550) The in-plane retardation value obtained for measurement at a wavelength of 550nm using an Axoscan retardation meterThe fluctuation range is within the range of +/-5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the antireflection film produced in this example are shown in table 1.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, with the optical axis angle (slow axis) being 105 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Example five:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-15 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-75 ° to the film machine direction (MD direction). R0(550) In-plane phase for measurement at a wavelength of 550nm using an Axoscan phase difference meterThe difference value. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Example six:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-20 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-85 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Example seven:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>Refractive index characteristic of ny (nz), optical axisThe angle (slow axis) is-25 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-95 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Example eight:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 245nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-30 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 125nm, it showed nx>ny — nz, with the optical axis angle (slow axis) at-105 ° to the film machine direction (MD direction). R0(550) Is composed ofThe in-plane retardation values were obtained by measurement using an Axoscan retardation meter at a wavelength of 550 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Comparative example one:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer is obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification are adjusted so that the retardation R of the first retardation layer is adjusted0(550) At 260nm, nx is shown>ny — nz, the optical axis angle (slow axis) being 15 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 140nm, it showed nx>ny — nz, the optical axis angle (slow axis) is 75 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Comparative example two:
the surface polarizer layer can adopt any polarizer.
As shown in fig. 1 and 2, the first retardation layer was obliquely stretched using a polycarbonate film (PC) using a stretching device, and the stretching temperature and magnification were adjusted so that the retardation of the first retardation layer was adjustedR0(550) 215nm, showing nx>ny — nz, the optical axis angle (slow axis) is 25 ° to the film machine direction (MD direction). R0(550) The in-plane phase difference value obtained for measurement using an Axoscan phase difference meter at a wavelength of 550nm was within a fluctuation range of + -5 nm. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation meter.
The second retardation layer is obliquely stretched by using a polycarbonate film (PC) and stretching equipment, and the stretching temperature and the magnification are adjusted to ensure that the retardation R of the first retardation layer0(550) At 110nm, it showed nx>ny — nz, the optical axis angle (slow axis) is 75 ° to the film machine direction (MD direction). R0(550) The in-plane retardation values were obtained for measurement at a wavelength of 550nm using an Axoscan retardation meter. The optical axis angle (slow axis) is an angle between the slow axis and the longitudinal direction (MD direction) of the first retardation film measured by using an Axoscan retardation gauge, and the measurement results of the reflectance of the anti-reflection film produced in this example, i.e., the oblique optical axis retardation film, are shown in table 1.
Table 1.
As can be seen from the above table, the antireflection film manufactured by the invention can reduce the reflectivity of the visible light wave band (400nm-780nm) from 80% to below 10%.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (8)
1. A skew optical axis retardation film is characterized by comprising a polarizer layer, a first retardation layer and a second retardation layer which are sequentially stacked from top to bottom, wherein the retardation value R0(550) of the first retardation layer is 180 nm-300 nm, and the retardation value R0(550) of the second retardation layer is 80nm-175 nm.
2. The film according to claim 1, wherein the slow axis angle of the first retardation layer and the absorption axis of the polarizer layer form an angle θ1The included angle between the slow axis angle of the second phase difference layer and the absorption axis of the polarizer layer is theta2。
3. The retardation film as claimed in claim 2, wherein θ is the number of θ2＝2θ1+45 °, where θ1>0 degree; or theta2＝2θ1-45 °, wherein θ1<0°。
4. The retardation film as claimed in claim 1, wherein the retardation layer R0(550) has a retardation value of 240nm to 265 nm.
5. The film of claim 1, wherein the retardation value R0(550) of the first retardation layer is 245 nm.
6. The retardation film as claimed in claim 1, wherein the retardation value R0(550) of the second retardation layer is 120nm to 145 nm.
7. The retardation film as claimed in claim 1, wherein the retardation value R0(550) of the second retardation layer is 125 nm.
8. The retardation film as claimed in claim 2, wherein θ is the number of θ110-20 ° or θ170-90 deg. and theta270-90 ° or θ2＝10°～20°。
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| CN113061273A (en) * | 2021-03-10 | 2021-07-02 | 西南科技大学 | Preparation method of high-performance polaroid |
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| CN111448496A (en) * | 2017-12-20 | 2020-07-24 | 日本瑞翁株式会社 | Circularly polarizing plate, long-sized wide-band lambda/4 wave plate, organic electroluminescent display device, and liquid crystal display device |
| CN112105970A (en) * | 2018-04-27 | 2020-12-18 | 日本瑞翁株式会社 | Broadband wavelength film, method for producing same, and method for producing circularly polarizing film |
| CN209373164U (en) * | 2018-11-30 | 2019-09-10 | 深圳市盛波光电科技有限公司 | A kind of flexibility OLED polaroid |
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| CN113061273A (en) * | 2021-03-10 | 2021-07-02 | 西南科技大学 | Preparation method of high-performance polaroid |
| CN113061273B (en) * | 2021-03-10 | 2022-05-17 | 西南科技大学 | Preparation method of high-performance polaroid |
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