CN111307676A - Device and method for monitoring concentration of laser front scattering particulate matter - Google Patents
Device and method for monitoring concentration of laser front scattering particulate matter Download PDFInfo
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- 239000013618 particulate matter Substances 0.000 title claims abstract description 37
- 238000000034 method Methods 0.000 title claims description 56
- 238000012544 monitoring process Methods 0.000 title claims description 34
- 238000012806 monitoring device Methods 0.000 claims abstract description 98
- 238000004140 cleaning Methods 0.000 claims description 45
- 238000002834 transmittance Methods 0.000 claims description 39
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- 239000002245 particle Substances 0.000 claims description 35
- 238000012423 maintenance Methods 0.000 description 18
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Abstract
The application relates to a laser front scattering particulate matter concentration monitoring devices includes: a scattering region; an incident light path coupled to the scattering region for passing incident light; a scattered light path coupled to the scattering region for passing scattered light, the scattered light being formed by scattering the incident light by a gas in the scattering region; and the calibration light path is used for passing calibration light, and the calibration light is residual incident light after passing through the gas in the scattering area.
Description
Technical Field
The application belongs to the field of environmental monitoring, and particularly relates to a laser front scattering particle concentration monitoring device, a calibration method of the laser front scattering particle concentration monitoring device, a method for measuring the particle concentration of a sample gas by using the laser front scattering particle concentration monitoring device, and a light transmittance measuring method of the laser front scattering particle concentration monitoring device.
Background
With the strictness of environmental laws and regulations and the progress and development of dust removal technology, the emission concentration of particulate matters of organized pollution sources is lower and lower. There are many new on-line coal-fired boilers, pelletsThe average concentration of the discharged concentration is even lower than 3mg/m3And has the characteristics of high temperature and high humidity. This puts higher demands on the detection limit, sensitivity, repeatability, stray light suppression, etc. of the instrument.
Because the smoke has the characteristics of high temperature and high humidity, water mist is easily formed on the lens, and dust is adsorbed. When dust and water mist are attached to the lens, the transmittance of the lens is reduced, and the normal work of the instrument is influenced. Therefore, besides accurately and reliably measuring the smoke particles, the instrument also has to have the function of periodically testing the pollution degree of the optical system, especially evaluating the pollution degree of the optical element in the particle measuring chamber.
In order to solve the problems, the conventional equipment generally adopts a motion device to carry out self-detection on the equipment. However, the inventors of the present application have found that the motion device reduces the vibration resistance of the apparatus, and reduces the dust resistance rating of the apparatus.
Disclosure of Invention
The invention aims to provide a laser front scattering particle concentration monitoring device, a calibration method of the laser front scattering particle concentration monitoring device, a method for measuring the particle concentration of a sample gas by using the laser front scattering particle concentration monitoring device and a light transmittance measuring method of the laser front scattering particle concentration monitoring device.
An embodiment of the present application provides a laser front scattering particulate matter concentration monitoring device, including: a scattering region; an incident light path coupled to the scattering region for passing incident light; a scattered light path coupled to the scattering region for passing scattered light, the scattered light being formed by scattering the incident light by a gas in the scattering region; a calibration light path coupled to the scattering region for passing calibration light, the calibration light being residual incident light traversing the scattering region.
Another embodiment of the present application further provides a calibration method of a laser front scattering particulate matter concentration monitoring apparatus, including: injecting a cleaning gas into the monitoring device; emitting incident light toward the cleaning gas; collecting an intensity of a calibration light as a calibration coefficient, wherein the calibration light is a residual incident light after passing through the cleaning gas in the scattering region; and/or collecting the intensity of scattered light formed after the incident light is scattered by the cleaning gas, and using the intensity as a calibration zero point.
Another embodiment of the present application further provides a method for measuring a particle concentration of a sample gas by using a laser front scattering particle concentration monitoring device, including: injecting a sample gas into the monitoring device; emitting incident light to the sample gas; collecting the intensity of scattered light formed after the incident light is scattered by the sample gas; and calculating the particulate matter concentration of the sample gas according to the intensity of the scattered light and the calibration parameters and/or calibration zero points obtained by the calibration method.
Another embodiment of the present application further provides a method for measuring light transmittance of a device for monitoring concentration of laser front scattering particles, including: injecting a first cleaning gas into the monitoring device; emitting a first incident light to the first cleaning gas; collecting an intensity of first calibration light, wherein the first calibration light is residual first incident light after passing through the first cleaning gas in the scattering region; and obtaining the light transmittance according to the intensity of the first calibration light.
The device for monitoring the concentration of the laser front scattering particles, the calibration method, the particle concentration measurement method and the device light transmittance measurement method are utilized. The intensity of the calibration light can be collected by introducing the calibration light receiving module and utilizing the calibration light receiving module, wherein the calibration light is a residual incident light beam after the incident light passes through the scattering area. The measurement result of the particulate matter concentration can be corrected using the intensity of the calibration light as a calibration parameter, so that the measurement result is more accurate. Meanwhile, the light transmittance of the device can be determined by utilizing the intensity of the calibration light, and the maintenance time of the device can be determined according to the light transmittance.
By using the device and the method for monitoring the concentration of the laser front scattering particulate matter, the concentration of the particulate matter can be measured with higher precision when the light path of the detection device is polluted to a certain degree. Meanwhile, the monitoring result can be corrected by software by using the monitoring device and the method. Therefore, the lens and the light path do not need to be cleaned frequently, the maintenance process can be simplified, and the maintenance cost can be reduced.
Moreover, the light transmittance of the device can be detected by the device, so that the reasonable maintenance time of the device can be determined according to the light transmittance. And further, the maintenance period of the device is more reasonable, and the maintenance cost is lower.
Furthermore, the device is relatively simple in construction, as no moving parts can be introduced. The device can be smaller in size. And because the device can not introduce the moving part, can avoid the work of the moving part to influence the optical component in the device. And then can make the work of the device can be stable, measure can be more accurate, the anti-seismic performance and the sealing performance of the device also can be better.
Under the high temperature and high humidity environment, dust fog in the sample gas can be condensed inside the monitoring device at any time and is attached to the inner wall of the monitoring device and the lens. And further pollute the light path of monitoring devices, cause adverse effect to particulate matter monitoring result. The monitoring device and the monitoring method provided by the application can well solve the problems, so that the monitoring device and the monitoring method provided by the application are suitable for a high-temperature and high-humidity working environment.
Drawings
Fig. 1A shows a schematic structural diagram of a laser front scattering particle concentration monitoring device according to an embodiment of the present application.
Fig. 1B shows a schematic view of the scattering structure of the monitoring device shown in fig. 1A.
FIG. 1C shows a schematic diagram of the structure of the light source of the monitoring device shown in FIG. 1A.
Fig. 1D is a schematic structural diagram of a scattered light receiving module of the monitoring device shown in fig. 1A.
Fig. 2 shows a schematic flow chart of a calibration method of a laser front scattering particulate matter concentration monitoring device according to another embodiment of the present application.
Fig. 3 shows a schematic flow chart of a method for measuring the particle concentration of a sample gas using a laser front scattering particle concentration monitoring device according to another embodiment of the present application.
Fig. 4A is a schematic flow chart illustrating a light transmittance measurement method of a laser front scattering particulate matter concentration monitoring device according to another embodiment of the present application.
FIG. 4B shows a calibration light reference intensity acquisition flow diagram for the method of FIG. 4A.
Detailed Description
The following is a description of the embodiments of the present disclosure relating to a laser front scattering particle concentration monitoring device and method, and those skilled in the art will understand the advantages and effects of the present disclosure from the disclosure of the present disclosure. The invention is capable of other and different embodiments and its several details are capable of modification in various other respects, all without departing from the spirit and scope of the present invention. The drawings of the present invention are for illustrative purposes only and are not intended to be drawn to scale. The following embodiments will further explain the related art of the present invention in detail, but the disclosure is not intended to limit the scope of the present invention.
An embodiment of the present application provides a laser front scattering particulate matter concentration monitoring device, including: a scattering region; an incident light path coupled to the scattering region for passing incident light; a scattered light path coupled to the scattering region for passing scattered light, the scattered light being formed by scattering the incident light by a gas in the scattering region; a calibration light path coupled to the scattering region for passing calibration light, the calibration light being residual incident light traversing the scattering region.
Another embodiment of the present application further provides a calibration method of a laser front scattering particulate matter concentration monitoring apparatus, including: injecting a cleaning gas into the monitoring device; emitting incident light toward the cleaning gas; collecting an intensity of a calibration light as a calibration coefficient, wherein the calibration light is a residual incident light after passing through the cleaning gas in the scattering region; and/or collecting the intensity of scattered light formed after the incident light is scattered by the cleaning gas, and using the intensity as a calibration zero point.
Another embodiment of the present application further provides a method for measuring a particle concentration of a sample gas by using a laser front scattering particle concentration monitoring device, including: injecting a sample gas into the monitoring device; emitting incident light to the sample gas; collecting the intensity of scattered light formed after the incident light is scattered by the sample gas; and calculating the particulate matter concentration of the sample gas according to the intensity of the scattered light and the calibration parameters and/or calibration zero points obtained by the calibration method. Another embodiment of the present application further provides a method for measuring light transmittance of a device for monitoring concentration of laser front scattering particles, including: injecting a first cleaning gas into the monitoring device; emitting a first incident light to the first cleaning gas; collecting an intensity of first calibration light, wherein the first calibration light is residual first incident light after passing through the first cleaning gas in the scattering region; and obtaining the light transmittance according to the intensity of the first calibration light.
The device for monitoring the concentration of the laser front scattering particles, the calibration method, the particle concentration measurement method and the device light transmittance measurement method are utilized. The intensity of the calibration light can be collected by introducing the calibration light receiving module and utilizing the calibration light receiving module, wherein the calibration light is a residual incident light beam after the incident light passes through the scattering area. The measurement result of the particulate matter concentration can be corrected using the intensity of the calibration light as a calibration parameter, so that the measurement result is more accurate. Meanwhile, the light transmittance of the device can be determined by utilizing the intensity of the calibration light, and the maintenance time of the device can be determined according to the light transmittance.
By using the device and the method for monitoring the concentration of the laser front scattering particulate matter, the concentration of the particulate matter can be measured with higher precision when the light path of the detection device is polluted to a certain degree. Meanwhile, the monitoring result can be corrected by software by using the monitoring device and the method. Therefore, the lens and the light path do not need to be cleaned frequently, the maintenance process can be simplified, and the maintenance cost can be reduced.
Moreover, the light transmittance of the device can be detected by the device, so that the reasonable maintenance time of the device can be determined according to the light transmittance. And further, the maintenance period of the device is more reasonable, and the maintenance cost is lower.
Furthermore, the device is relatively simple in construction, as no moving parts can be introduced. And because the device can not introduce the moving part, can avoid the work of the moving part to influence the optical component in the device. And then can make the work of the device can be stable, measure can be more accurate, the anti-seismic performance and the sealing performance of the device also can be better.
Under the high temperature and high humidity environment, dust fog in the sample gas can be condensed inside the monitoring device at any time and is attached to the inner wall of the monitoring device and the lens. And further pollute the light path of monitoring devices, cause adverse effect to particulate matter monitoring result. The monitoring device and the monitoring method provided by the application can well solve the problems, so that the monitoring device and the monitoring method provided by the application are suitable for a high-temperature and high-humidity working environment.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be understood that the terms "first," "second," "third," and "fourth," etc. in the claims, description, and drawings of the present application are used for distinguishing between different objects and not for describing a particular order. The terms "comprises" and "comprising," when used in the specification and claims of this application, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the present application herein is for the purpose of describing particular embodiments only, and is not intended to be limiting of the application. As used in the specification and claims of this application, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should be further understood that the term "and/or" as used in the specification and claims of this application refers to any and all possible combinations of one or more of the associated listed items and includes such combinations.
Fig. 1A shows a schematic structural diagram of a laser front scattering particle concentration monitoring device according to an embodiment of the present application. Fig. 1B shows a schematic view of the scattering structure of the monitoring device shown in fig. 1A. FIG. 1C shows a schematic diagram of the structure of the light source of the monitoring device shown in FIG. 1A. Fig. 1D is a schematic structural diagram of a scattered light receiving module of the monitoring device shown in fig. 1A.
As shown in fig. 1A, the apparatus 1000 may include: scattering region 141, incident light path 151, scattered light path 152, and collimated light path 153. Wherein the content of the first and second substances,
as shown in fig. 1A, the scattering region 141 is a cavity. A gas may pass through the scattering region 141. The gas may be a sample gas or a cleaning gas.
As shown in FIG. 1A, the incident light path 151 may be a pipe cavity. The incident light path 151 may provide an optical path for the incident light 161. One end of the incident light path 151 may be optically connected to the diffusion region 141 so that the incident light 161 may be irradiated to the gas within the diffusion region 141.
As shown in FIG. 1A, the scattered light path 152 may be a tunnel cavity. One end of the scattered light path 152 may be optically connected to the scattering region 141 to provide an optical path for scattered light 162 from the scattering region 141. Incident light 161 is scattered as it passes through the gas in the scattering region 141, and forms scattered light over a range of angles. The scattered light 162 may be one of the beams of scattered light over the range of angles. Optionally, a preset included angle exists between the scattered light path 152 and the incident light path 151. When the sample gas passes through the scattering region 141, the intensity of the scattered light 162 obtained by scattering the sample gas can be used to calculate the concentration of the particulate matter in the sample gas.
As shown in FIG. 1A, the collimated light path 153 may be a pipe cavity. One end of the calibration light path 153 may be optically connected to the scattering region 141 to provide an optical path for the calibration light 163 from the scattering region 141. Incident light 161 is attenuated as it traverses the gas within the scattering region 141. The collimated light 163 may be attenuated residual incident light. Alternatively, the section of the incident light path 151 directly connected to the scattering region 141 and the section of the collimated light path 152 directly connected to the scattering region 141 are in the same direction. The calibration light 163 obtained through the cleaning gas as it passes within the scattering region 141 can be used to determine the light transmittance of the device 1000, as well as to calibrate the device 1000 and correct the monitoring results of the device 1000.
As shown in fig. 1A, optionally, the apparatus 1000 may further include: a light source 11, a scattered light receiving module 12 and a collimated light receiving module 13. Wherein the content of the first and second substances,
as shown in fig. 1A, the light source 11 may be disposed at one end of the incident light path 151 and coupled to the incident light path 151. The light source 11 may be used to emit incident light 161. The incident light 161 may be a parallel laser beam. Incident light 161 emitted from the light source 11 can enter the scattering region 141 connected to the other end of the incident light path 151 along the incident light path 151.
As shown in fig. 1A, the scattered light receiving optical module 12 may be disposed at one end of the scattered light path 152 and coupled to the scattered light path 152. The scattered light collection module 12 may be used to collect the intensity of the scattered light 162.
As shown in fig. 1A, the calibration light receiving module 13 may be disposed at one end of the calibration light path 153 and coupled to the calibration light path 153. The calibration light receiving module 13 is used for collecting the intensity of the calibration light 163.
When the device 1000 performs particle monitoring, substances (e.g., water vapor, suspended solids) in the sample gas may contaminate the optical path of the device 1000. For example, moisture in the sample gas may condense in the apparatus 1000 and may be adsorbed on the surfaces of the optical components (including the light source 11, the scattered light receiving module 12, the collimating light receiving module 13, and the plane mirrors 142, 143) of the apparatus 1000, or the condensed moisture may be adsorbed on the inner walls of the optical paths (e.g., the scattering region 141, the incident light path 151, the scattered light path 152, and the collimating light path 153) of the apparatus 1000. Solid suspensions in the sample gas may also adhere to the surfaces of the optical components of the apparatus 1000 or the inner walls of the optical path due to moisture, static electricity, or the like. Lens aging and the like may also occur with the optical components of the device 1000.
The above-mentioned problems of optical path contamination and lens aging may cause the incident light 161 and the scattered light 162 to be attenuated during transmission in the apparatus 1000, so that the intensity of the scattered light 162 deviates from the corresponding relationship of the concentration of the particulate matter in the sample gas, and further the monitoring result of the apparatus 1000 may deviate or even be incorrect.
As shown in fig. 1A, the above problem is solved in the present application by introducing a collimating optical path 163 and a collimating optical receiving module 13. Generally, the diffusion of the sample gas in the device 1000 in all directions is relatively uniform. Therefore, it is considered that the contamination of the optical path from the light source 11 to the scattered light receiving module 12 is equivalent to the contamination of the optical path from the light source 11 to the collimating light receiving module 13. That is, the degree of attenuation of the scattered light 162 due to the optical path contamination is equivalent to the degree of attenuation of the calibration light 163 due to the optical path contamination. Likewise, the degree of attenuation of the scattered light 162 and the collimated light 163 due to lens aging problems is also generally comparable.
Therefore, the intensity of the calibration light 163 can be collected by the calibration light receiving module 13 by introducing the calibration light path 163. And using the intensity of the calibration light 163 to determine the light transmittance of the device 1000, calibrate the device 1000, and correct the monitoring of the particulate matter concentration by the device 1000.
As shown in fig. 1A, mirrors 142 and 143 may also be disposed on the incident light path 151. The plane mirrors 142 and 143 may be used to change the optical path structure of the incident light path 151. Alternatively, other numbers of plane mirrors may be disposed in the incident light path 151. Alternatively, no plane mirror may be provided on the incident light path 151. Optionally, at least one flat mirror may be disposed in the scattered light path 152 and/or the collimated light path 153.
The optical path structure of the apparatus 1000 can be changed by providing a flat mirror on at least one of the incident light path 151, the scattered light path 152, and the collimated light path 153. Further, the optical path structure of the apparatus 1000 may be changed by using at least one plane mirror, so that the light source 11, the scattered light receiving module 12 and the collimated light receiving module 13 are disposed on the same side of the apparatus 1000.
The optical path structure of the device 1000 can be changed from a traditional linear structure to a ring structure or a semi-ring structure in the above manner, so that the mechanical mechanism of the device 1000 is no longer a traditional long rod structure. The above changes may reduce the processing requirements of various components within the device, thereby reducing processing costs, and may also provide shock resistance for the device 1000. At the same time, the above measures also contribute to reducing the volume of the device 1000.
As shown in fig. 1A and 1B, the apparatus 1000 may optionally further comprise a scattering structure 14. The scattering region 141, the incident light path 151, the scattered light path 152, and the collimated light path 153 may all be inner cavities of the scattering structure 14.
The plane mirrors 142, 143 may be arranged within the scattering structure. Optionally, the apparatus 1000 may further include: a mirror fixing plate 1431, and an O-ring 1432. Among other things, the O-ring 1432 may be used for sealing and the mirror fixing plate 1431 may be used to fix the mirror 143 to the scattering structure 14. Accordingly, a mirror fixing plate (not shown) and an O-ring (not shown) may also be included adjacent to the mirror 142.
Alternatively, the scattering structure 14 may be an aluminum structure. Alternatively, the surface of the scattering structure 14 may be a black light absorbing material.
Alternatively, the scattered light path 152 and the calibration light path 153 may have approximately the same length.
As shown in fig. 1A and 1C, the light source 11 may alternatively include a laser 111, a laser holder 112, and a window plate 113. Wherein the laser 111 is arranged to emit parallel incident light 161. The laser holder 112 is used to hold the laser 111. Alternatively, the laser mount 112 may be an aluminum structure. Optionally, the surface of the laser seat 112 may also be a black light-absorbing material to reduce the generation of stray light. The window plate 113 is a lens that transmits light and is connected to the scattering structure 14. For passing incident light 161 and isolating the gas path from contamination of the laser 111.
As shown in fig. 1A and 1D, the scattered light collection module 12 may optionally include: convex lens 121, detector plate 122. Wherein the convex lens 121 may be used to pass and focus the scattered light 162. The detector plate 122 may be used to collect the intensity of the scattered light 162 passing through the convex lens 121. The intensity of the scattered light 162 can be used to determine the concentration of particulate matter in the sample gas.
Optionally, the scattered light collection module 12 may further include a collection lens holder 123 for fixing the convex lens 121 and the detector plate 122. Alternatively, the mirror mount 123 may be an aluminum structure. Optionally, the surface of the light-receiving lens base 123 may be made of a black light-absorbing material to reduce the generation of stray light and reduce the interference of the stray light on the monitoring result.
Optionally, the scattered light collection module 12 may further include a window sheet 124 (not shown) for passing the scattered light 162 and isolating the air path.
As shown in fig. 1A, the calibration light-receiving module 13 may further include: an attenuation sheet 131 and a detector plate 132. Therein, the attenuation sheet 131 may be used to attenuate the calibration light 163 to avoid the calibration light 163 burning the detector plate 132. The detector board 132 may be used to collect the intensity of the calibration light 163, which may be used for calibration of the apparatus 1000 and monitoring of the optical path throughput of the apparatus 1000.
The collimating optical receiving module 13 may further include an attenuating sheet mounting collar (not shown), an O-ring (not shown), and other mounting accessories. Wherein, the attenuation sheet mounting pressure ring can be an aluminum structure. Alternatively, the surface of the attenuation sheet mounting pressure ring may be a black light absorbing material. An O-ring may be used for sealing.
Alternatively, at least two of the light source 11, the scattered light receiving optical module 12, and the collimated light receiving optical module 13 may share the same window sheet.
Fig. 2 shows a schematic flow chart of a calibration method of a laser front scattering particulate matter concentration monitoring device according to another embodiment of the present application.
As shown in fig. 2, the calibration method 2000 may include: s210, S220 and S230.
In S210, a cleaning gas may be injected into the monitoring device such that a scattering region of the monitoring device is filled with the cleaning gas. Alternatively, the cleaning gas may be injected into the monitoring device by injecting a stream of cleaning gas such that the cleaning gas stream passes through a scattering region of the monitoring device.
In S220, a light source in the monitoring device may be used to emit incident light, which may be a parallel beam of laser light. The incident light irradiates the cleaning gas in the scattering area along a preset light path in the monitoring device and generates scattered light and calibration light.
In S230, the intensity of the scattered light may be collected as a calibration zero point E0The intensity of the calibration light can also be collected as the calibration coefficient Et. It is also possible to collect both the intensity of the scattered light as the calibration zero point E0And collecting the intensity of the calibration light as the calibration coefficient Et。
Fig. 3 shows a schematic flow chart of a method for measuring the particle concentration of a sample gas using a laser front scattering particle concentration monitoring device according to another embodiment of the present application.
As shown in fig. 3, method 3000 may include: s310, S320, S330 and S340.
In S310, a sample gas may be injected into a monitoring device such that a scattering region of the monitoring device is filled with the sample gas. Alternatively, the sample gas may be injected into the monitoring device by injecting a sample gas stream such that the sample gas stream passes through a scattering region in the monitoring device.
In S320, a light source may be used to emit incident light, which may be a parallel beam of laser light. The incident light irradiates a scattering area in the monitoring device along a preset light path of the monitoring device and generates scattered light.
In S330, the intensity E of the scattered light generated in step S320 may be collected.
In S340, the calibration zero E generated by the method 2000 can be utilized0And a calibration factor EtAnd the intensity E of the scattered light collected in S330 determines η the concentration of particulate matter in the sample gasThe concentration of particulate matter η in the sample gas can be determined according to the following equation.
η＝K(E-E0)/Et(1)
Where K is a constant.
Fig. 4A is a schematic flow chart illustrating a light transmittance measurement method of a laser front scattering particulate matter concentration monitoring device according to another embodiment of the present application. FIG. 4B shows a calibration light reference intensity acquisition flow diagram for the method of FIG. 4A.
As shown in fig. 4A, method 4000 includes: s410, S420, S430 and S440.
In S410, a first cleaning gas may be injected into the monitoring device such that a scattering region of the monitoring device is filled with the first cleaning gas. Alternatively, the first cleaning gas may be injected into the monitoring device by injecting a first cleaning gas stream such that the first cleaning gas stream passes through the scattering region of the monitoring device.
In S420, a light source in the monitoring device may be used to emit a first incident light, which may be a parallel beam of laser light. The first incident light irradiates the first cleaning gas in the scattering area along a preset light path in the monitoring device and generates first calibration light, wherein the first calibration light is the first incident light which is remained after penetrating through the scattering area.
In S430, the intensity of the first calibration light may be collected.
In S440, the intensity E of the first calibration light collected in S430 may be utilizedtAnd determining the light transmittance h of the monitoring device.
Further, in S440, the reference intensity E of the calibration light may be further determined according to the reference intensity E of the calibration lightt0And the first calibration light intensity E acquired in S430tAnd determining the light transmittance h of the monitoring device. Further, the light transmittance h of the monitoring device can be determined according to the following formula.
h＝Et/Et0(2)
Further, as shown in FIG. 4B, the reference intensity E of the light is calibratedt0May be obtained according to steps S401, S402 and S403.
In S401, a second cleaning gas may be injected into the monitoring device when the monitoring device is shipped from a factory or after the monitoring device is sufficiently cleaned, so that the scattering area of the monitoring device is filled with the second cleaning gas. Alternatively, the second cleaning gas may be injected into the monitoring device by injecting a stream of cleaning gas such that the second cleaning gas stream passes through the scattering region of the monitoring device.
In S402, a second incident light, which may be a parallel laser beam, may be emitted by a light source in the monitoring device. Wherein the intensity and the optical path of the second incident light are the same as those of the first incident light. The second incident light irradiates the second cleaning gas in the scattering area along a predetermined light path in the monitoring device, and generates a second calibration light, wherein the second calibration light is a residual second incident light after passing through the scattering area.
In S403, the intensity of the second calibration light may be collected as the calibration light reference intensity Et0。
Optionally, after S440, the method may further include: and judging whether the light transmittance h is lower than a threshold value, and if so, giving an alarm. And reminding a user to maintain the monitoring device, cleaning a light path or replacing components. For example, the threshold value may be set to 0.7.
Optionally, the light transmittance h can also be used as a calibration coefficient to correct the particle concentration monitoring data of the monitoring device.
The device for monitoring the concentration of the laser front scattering particles, the calibration method, the particle concentration measurement method and the device light transmittance measurement method are utilized. The intensity of the calibration light can be collected by introducing the calibration light receiving module and utilizing the calibration light receiving module, wherein the calibration light is a residual incident light beam after the incident light passes through the scattering area. The measurement result of the particulate matter concentration can be corrected using the intensity of the calibration light as a calibration parameter, so that the measurement result is more accurate. Meanwhile, the light transmittance of the device can be determined by utilizing the intensity of the calibration light, and the maintenance time of the device can be determined according to the light transmittance.
By using the device and the method for monitoring the concentration of the laser front scattering particulate matter, the concentration of the particulate matter can be measured with higher precision when the light path of the detection device is polluted to a certain degree. Meanwhile, the monitoring result can be corrected by software by using the monitoring device and the method. Therefore, the lens and the light path do not need to be cleaned frequently, the maintenance process can be simplified, and the maintenance cost can be reduced.
Moreover, the light transmittance of the device can be detected by the device, so that the reasonable maintenance time of the device can be determined according to the light transmittance. And further, the maintenance period of the device is more reasonable, and the maintenance cost is lower.
Furthermore, the device is relatively simple in construction, as no moving parts can be introduced. And because the device can not introduce the moving part, can avoid the work of the moving part to influence the optical component in the device. And then can make the work of the device can be stable, measure can be more accurate, the anti-seismic performance and the sealing performance of the device also can be better.
Under the high temperature and high humidity environment, dust fog in the sample gas can be condensed inside the monitoring device at any time and is attached to the inner wall of the monitoring device and the lens. And further pollute the light path of monitoring devices, cause adverse effect to particulate matter monitoring result. The monitoring device and the monitoring method provided by the application can well solve the problems, so that the monitoring device and the monitoring method provided by the application are suitable for a high-temperature and high-humidity working environment.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments. The technical features of the embodiments may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The foregoing detailed description of the embodiments of the present application has been presented to illustrate the principles and implementations of the present application, and the description of the embodiments is only intended to facilitate the understanding of the methods and their core concepts of the present application. Meanwhile, a person skilled in the art should, according to the idea of the present application, change or modify the embodiments and applications of the present application based on the scope of the present application. In view of the above, the description should not be taken as limiting the application.
Claims (13)
1. A laser front scattering particulate matter concentration monitoring device, comprising:
a scattering region;
an incident light path coupled to the scattering region for passing incident light;
the scattered light path is coupled with the scattering region and used for scattering light, and the scattered light is formed after the incident light is scattered by particles in the gas in the scattering region;
and the calibration light path is coupled with the scattering region and used for passing calibration light, and the calibration light is incident light passing through the scattering region.
2. The monitoring device of claim 1, further comprising:
a light source coupled to the incident light optical path for emitting the incident light;
the scattered light receiving module is coupled with the scattered light optical path and used for collecting the scattered light;
and the calibration light receiving module is coupled with the calibration light optical path and used for collecting the calibration light.
3. The monitoring device of claim 1, wherein:
at least one of the incident light path, the scattered light path, and the calibration light path comprises:
and the plane mirror ensures that the light source module, the scattered light receiving module and the calibration light receiving module are arranged on the same side of the monitoring device.
4. The monitoring device of claim 1, wherein the scattered light collection module comprises:
a convex lens that condenses the scattered light;
and the first detector plate is arranged behind the convex lens and used for collecting the scattered light converged by the convex lens.
5. The monitoring device of claim 1, wherein the collimating optical transceiver module comprises:
an attenuation sheet attenuating the calibration light;
and the second detector plate is arranged behind the optical filter and collects the calibration light passing through the attenuation sheet.
6. A calibration method of a laser front scattering particulate matter concentration monitoring device comprises the following steps:
injecting a cleaning gas into the monitoring device;
emitting incident light toward the cleaning gas;
collecting an intensity of a calibration light as a calibration coefficient, wherein the calibration light is a residual incident light after passing through the cleaning gas in the scattering region; and/or
And collecting the intensity of scattered light formed after the incident light is scattered by the cleaning gas, and taking the intensity as a calibration zero point.
7. A method of measuring a particulate concentration of a sample gas using a laser front scatter particulate concentration monitoring device, comprising:
injecting a sample gas into the monitoring device;
emitting incident light to the sample gas;
collecting the intensity of scattered light formed after the incident light is scattered by the sample gas;
calculating the particle concentration of the sample gas according to the intensity of the scattered light and the calibration parameters and/or calibration zero obtained by the method according to claim 6.
8. The method of claim 7, wherein the calculating the particulate matter concentration of the sample gas comprises:
the particulate matter concentration is calculated using the formula:
η＝K(E-E0)/Et
wherein η is the particulate matter concentration, E is the scattered light intensity, E is0To calibrate the zero point, EtAnd K is a monitoring coefficient of the monitoring equipment.
9. A light transmittance measuring method of a laser front scattering particulate matter concentration monitoring device comprises the following steps:
injecting a first cleaning gas into the monitoring device;
emitting a first incident light to the first cleaning gas;
collecting an intensity of first calibration light, wherein the first calibration light is residual first incident light after passing through the first cleaning gas in the scattering region;
and obtaining the light transmittance according to the intensity of the first calibration light.
10. The method of claim 9, wherein deriving the transmittance from the intensity of the first calibration light comprises:
and obtaining the light transmittance according to the intensity of the first calibration light and the reference intensity of the calibration light.
11. The method of claim 10, further comprising:
injecting a second cleaning gas into the monitoring device when the monitoring device leaves a factory or after the monitoring device is sufficiently cleaned;
emitting a second incident light to the second cleaning gas;
collecting an intensity of a second calibration light as the calibration light reference intensity, wherein the second calibration light is a residual second incident light after passing through the second cleaning gas in the scattering region.
12. The method of claim 10, wherein deriving the transmittance from the intensity of the first calibration light and the calibration light reference intensity comprises:
the light transmittance was calculated according to the following formula:
h＝Et/Et0
wherein h is the light transmittance, EtFor the intensity of the first calibration light, Et0To calibrate the light reference intensity.
13. The method of claim 9, further comprising:
and judging whether the light transmittance is lower than a threshold value, and if so, giving an alarm.
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| CN110220828A (en) * | 2019-06-25 | 2019-09-10 | 北京雪迪龙科技股份有限公司 | A kind of particle monitoring instrument |
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| CN106323826A (en) * | 2016-11-15 | 2017-01-11 | 上海理工大学 | Monitoring device and monitoring method for ultralow emission smoke |
| CN107831099A (en) * | 2017-11-23 | 2018-03-23 | 北京是卓科技有限公司 | The detection means and detection method of air particle |
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