CN111288900A - Edge positioning method for groove width fixed value - Google Patents
Edge positioning method for groove width fixed value Download PDFInfo
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- CN111288900A CN111288900A CN202010238600.7A CN202010238600A CN111288900A CN 111288900 A CN111288900 A CN 111288900A CN 202010238600 A CN202010238600 A CN 202010238600A CN 111288900 A CN111288900 A CN 111288900A
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- groove
- edge
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- normalized intensity
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- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000005259 measurement Methods 0.000 claims abstract description 17
- 238000009792 diffusion process Methods 0.000 claims abstract description 11
- 238000010226 confocal imaging Methods 0.000 claims abstract description 10
- 238000012545 processing Methods 0.000 claims abstract description 5
- 238000010606 normalization Methods 0.000 claims abstract description 4
- 238000001514 detection method Methods 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 8
- 238000003384 imaging method Methods 0.000 claims description 7
- 210000001747 pupil Anatomy 0.000 description 5
- 239000000243 solution Substances 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 1
- 238000004624 confocal microscopy Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202010238600.7A CN111288900B (en) | 2020-03-30 | 2020-03-30 | Edge positioning method for groove width fixed value |
Applications Claiming Priority (1)
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CN202010238600.7A CN111288900B (en) | 2020-03-30 | 2020-03-30 | Edge positioning method for groove width fixed value |
Publications (2)
Publication Number | Publication Date |
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CN111288900A true CN111288900A (en) | 2020-06-16 |
CN111288900B CN111288900B (en) | 2022-01-14 |
Family
ID=71027318
Family Applications (1)
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CN202010238600.7A Active CN111288900B (en) | 2020-03-30 | 2020-03-30 | Edge positioning method for groove width fixed value |
Country Status (1)
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CN (1) | CN111288900B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114383533A (en) * | 2022-01-12 | 2022-04-22 | 哈尔滨工业大学 | Dark field confocal microscopic width fixed value measuring method |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07128246A (en) * | 1993-10-29 | 1995-05-19 | Ratotsuku Syst Eng Kk | Method for detecting crystal defect by use of confocal optical system |
CN1606500A (en) * | 2001-11-28 | 2005-04-13 | 詹姆斯哈迪研究有限公司 | Trough-edge building panel and method of manufacture |
CN101131317A (en) * | 2007-09-20 | 2008-02-27 | 华中科技大学 | Method and device for measuring micro-nano deep groove structure |
CN101393015A (en) * | 2008-10-17 | 2009-03-25 | 华中科技大学 | On-line measurement method and device for micro/nano deep trench structure |
CN106441143A (en) * | 2016-10-12 | 2017-02-22 | 哈尔滨工业大学 | Method for measuring depth of groove sample by using optical microscopic mode |
CN108469224A (en) * | 2018-03-16 | 2018-08-31 | 河南东陆高科实业股份有限公司 | Pipeline engineering fluting dimension measurement method based on image recognition |
-
2020
- 2020-03-30 CN CN202010238600.7A patent/CN111288900B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07128246A (en) * | 1993-10-29 | 1995-05-19 | Ratotsuku Syst Eng Kk | Method for detecting crystal defect by use of confocal optical system |
CN1606500A (en) * | 2001-11-28 | 2005-04-13 | 詹姆斯哈迪研究有限公司 | Trough-edge building panel and method of manufacture |
CN101131317A (en) * | 2007-09-20 | 2008-02-27 | 华中科技大学 | Method and device for measuring micro-nano deep groove structure |
CN101393015A (en) * | 2008-10-17 | 2009-03-25 | 华中科技大学 | On-line measurement method and device for micro/nano deep trench structure |
CN106441143A (en) * | 2016-10-12 | 2017-02-22 | 哈尔滨工业大学 | Method for measuring depth of groove sample by using optical microscopic mode |
CN108469224A (en) * | 2018-03-16 | 2018-08-31 | 河南东陆高科实业股份有限公司 | Pipeline engineering fluting dimension measurement method based on image recognition |
Non-Patent Citations (2)
Title |
---|
PETER LEHMANN,ET AL.: "3-D Optical Interference Microscopy at the Lateral Resolution", 《INTERNATIONAL JOURNAL OF OPTOMECHATRONICS》 * |
刘俭等: "光学显微三维测量解耦合准则", 《红外激光工程》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114383533A (en) * | 2022-01-12 | 2022-04-22 | 哈尔滨工业大学 | Dark field confocal microscopic width fixed value measuring method |
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Publication number | Publication date |
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CN111288900B (en) | 2022-01-14 |
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Effective date of registration: 20231208 Address after: Room 1107, 11 / F, National University Science Park, Harbin Institute of technology, No. 434, youyou street, Nangang District, Harbin City, Heilongjiang Province, 150001 Patentee after: Liu Jian Patentee after: Zhao Yixuan Patentee after: Harbin Institute of Technology Asset Management Co.,Ltd. Address before: 150000 No. 92, West Da Zhi street, Nangang District, Harbin, Heilongjiang. Patentee before: HARBIN INSTITUTE OF TECHNOLOGY |
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Effective date of registration: 20240204 Address after: Room 304-2, Building 16, No. 1616, Chuangxin Road, Songbei District, Harbin, Heilongjiang Province, 150001 Patentee after: Rongyi Shangke photoelectric technology (Harbin) Co.,Ltd. Country or region after: China Address before: Room 1107, 11 / F, National University Science Park, Harbin Institute of technology, No. 434, youyou street, Nangang District, Harbin City, Heilongjiang Province, 150001 Patentee before: Liu Jian Country or region before: China Patentee before: Zhao Yixuan Patentee before: Harbin Institute of Technology Asset Management Co.,Ltd. |
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