CN111273201B - Test method for durability test of small fuse - Google Patents

Test method for durability test of small fuse Download PDF

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CN111273201B
CN111273201B CN201910294842.5A CN201910294842A CN111273201B CN 111273201 B CN111273201 B CN 111273201B CN 201910294842 A CN201910294842 A CN 201910294842A CN 111273201 B CN111273201 B CN 111273201B
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current
coil
contact
test
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CN111273201A (en
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黄杰
陈远国
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Aux Air Conditioning Co Ltd
Ningbo Aux Electric Co Ltd
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Aux Air Conditioning Co Ltd
Ningbo Aux Electric Co Ltd
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Abstract

The invention provides a test device and a test method for a durability test of a small fuse, wherein the test device comprises a control part and a test circuit part and is characterized in that the test circuit part comprises a current generator, a first branch and a second branch, the first branch is connected with the current generator in series, the second branch is connected with the current generator in series, and the first branch and the second branch are arranged in parallel; the first branch is provided with a first relay R1 and a small fuse F1 to be tested, the second branch is provided with a second relay R2, and the control part is respectively connected with the first relay R1 and the second relay R2; the testing device and the testing method for the durability test of the small fuse avoid the damage of the small fuse F1 to be tested caused by impact current when a circuit is connected, avoid the electrical safety hidden danger caused by large voltage and large load in the prior art, and simultaneously save energy.

Description

Test method for durability test of small fuse
Technical Field
The invention relates to the field of electrical equipment detection, in particular to a device and a method for testing durability of a small fuse.
Background
According to the technical parameters of fuses with different specifications and the test requirements specified by standards, durability of the fuses needs to be detected; specifically, in the process of performing the durability test of the small fuse, reference is often made to the national standard GB/T9364.1-2015 "definition of small fuse part 1 of small fuse and general requirements for small fuse link", wherein the durability test of the small fuse requires that the current specified by the relevant standard is applied for 1h, then the current is cut off for 15min, and the current is stabilized within ± 1% of the set value after 100 cycles.
When the durability of the small fuse is detected, the small fuse, a power supply, a load and a time relay are often required to be connected in series, then the power supply is started to electrify the small fuse, and the electrifying time is controlled through the time relay; for example, patent application No. 201710146636.0 discloses a fuse technical parameter detection device and a detection method thereof, which can detect the durability of a fuse; however, in the operation process of the prior art, high impact current is generated when the fuse is turned on again after the current is cut off, the requirement that the current error is within +/-1% of a set value is often not met, and if the impact current is too large, a small fuse can be burnt.
In the prior art, in order to avoid the fuse from being burnt by the impact current, the voltage and the load are increased together according to the proportion, and the larger the voltage and the load are, the higher the current stability is, so that the current stability is improved; however, this arrangement is associated with electrical safety hazards due to the use of large voltages and loads, and also wastes energy. Therefore, in order to solve the above-mentioned related problems, a small-sized fuse durability test apparatus is required.
Disclosure of Invention
In view of the above, the present invention is directed to a device and a method for testing durability of a small fuse, so as to solve the problems of potential safety hazards and energy waste caused by using a large voltage and a large load in the prior art.
In order to achieve the purpose, the technical scheme of the invention is realized as follows:
a test device for durability tests of small fuses comprises a control part and a test circuit part, wherein the test circuit part comprises a current generator, a first branch and a second branch, the first branch is connected with the current generator in series, the second branch is connected with the current generator in series, and the first branch and the second branch are connected in parallel; set up first relay R1, the small-size fuse F1 that awaits measuring on the first branch road, set up second relay R2 on the second branch road, the control part is connected with first relay R1, second relay R2 respectively.
Further, the first relay R1 includes a first coil C1 and a first contact K1, the first contact K1 and the small fuse F1 to be tested are arranged in series in a first branch, and the first coil C1 is connected to the control unit.
Further, the second relay R2 includes a second coil C2, a second contact K2, the second contact K2 being disposed in the second branch, and the second coil C2 being connected to the control unit.
Further, the current-withstanding capacity of the first contact point K1 is larger than the set current value of the current generator, and the current-withstanding capacity of the second contact point K2 is larger than the set current value of the current generator.
Further, the control unit includes a control module and a memory, the control module is connected to the memory, and the control module is connected to the first coil C1 and the second coil C2.
Further, the control module is a single chip microcomputer system, and the memory is an erasable storage medium.
A test method of a small fuse endurance test using the small fuse endurance test apparatus, the method comprising:
step one, zeroing a storage numerical value of a memory, and carrying out a first current stabilization process;
step two, after the first current stabilization process is finished, a second current stabilization process is carried out, and the stored value of the memory is added with 1;
step three, after the second current stabilization process is finished, a third current stabilization process is carried out;
step four, after the third current stabilization process is finished, a second current stabilization process is carried out, and the stored value of the memory is added with 1;
after the second current stabilization process is finished, the control module judges whether the storage numerical value of the memory reaches a preset value or not; if yes, carrying out the step six; if not, returning to the third step;
and step six, disconnecting all the first branch and the second branch, and ending the test.
Further, the first current stabilization process includes:
the control module controls the second coil C2 to be electrified, and the second contact K2 is attracted;
turning on a current generator and setting a preset current;
after the first preset time t1, the control module controls the first coil C1 to be electrified, and the first contact K1 is attracted;
after the second preset time period t2, the control module controls the second coil C2 to be powered off, and the second contact K2 is disconnected;
the testing apparatus maintains the third preset time period t 3.
Further, the second current stabilization process includes:
the control module controls the second coil C2 to be electrified, and the second contact K2 is attracted;
after a second preset time period t2, the control module controls the first coil C1 to be powered off, and the first contact K1 is disconnected;
the testing apparatus maintains the fourth preset time period t 4.
Further, the third current stabilization process includes:
the control module controls the first coil C1 to be electrified, and the first contact K1 is attracted;
after the second preset time period t2, the control module controls the second coil C2 to be powered off, and the second contact K2 is disconnected;
the testing apparatus maintains the third preset time period t 3.
Further, the first preset time period t1 is 5 minutes, the second preset time period t2 is 2 seconds, the third preset time period t3 is 1 hour, and the fourth preset time period t4 is 15 minutes.
Further, in step five, the preset value is 100.
Compared with the prior art, the device and the method for testing the durability of the small fuse have the following advantages:
according to the device and the method for testing the durability of the small fuse, in the testing process of the durability test of the small fuse, the first relay R1 and the second relay R2 are controlled through the control module, so that the first relay R1 and the second relay R2 are alternately connected and disconnected, the impact current generated when a circuit is connected is prevented from damaging the small fuse F1 to be tested, the condition that the voltage and the load are increased together according to the proportion in the prior art is avoided, the electrical safety hidden danger caused by large voltage and large load is avoided, and the energy is saved.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate an embodiment of the invention and, together with the description, serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic structural diagram of a testing apparatus for testing endurance of a small fuse according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a control structure of a testing apparatus for testing endurance of a small fuse according to an embodiment of the present invention;
fig. 3 is a schematic flow chart of a testing method of a testing apparatus for testing endurance of a small fuse according to an embodiment of the present invention.
Description of reference numerals:
1-a control module, 2-a memory, 3-a current generator, 4-a first branch and 5-a second branch.
Detailed Description
The inventive concepts of the present disclosure will be described hereinafter using terms commonly employed by those skilled in the art to convey the substance of their work to others skilled in the art. These inventive concepts may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. These embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of their inclusion to those skilled in the art. It should also be noted that these embodiments are not mutually exclusive. A component, step, or element from one embodiment may be assumed to be present or used in another embodiment. The particular embodiments shown and described may be substituted for a wide variety of alternate and/or equivalent implementations without departing from the scope of the embodiments of the present disclosure. This application is intended to cover any adaptations or variations of the embodiments discussed herein. It will be apparent to those skilled in the art that alternative embodiments may be practiced using only some of the described aspects. Specific numbers, materials, and configurations are set forth in the examples for the purpose of illustration, however, alternative examples may be practiced by those skilled in the art without these specific details. In other instances, well-known features may be omitted or simplified in order not to obscure the illustrative embodiments.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "provided", "mounted", "connected" and "connected" are to be interpreted broadly, e.g., as being either fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; the two components can be directly connected or indirectly connected through an intermediate medium, and the two components can be communicated with each other; the term "fixed" may be a bolted and/or screwed connection and/or a snap and/or a weld, which term is understood by a person skilled in the art as a matter of fact to have a special meaning in the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
In addition, the small fuses in the embodiments of the present invention are all small fuses in GB/T9364.1-2015, and specific definitions thereof can be referred to the national standard.
The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
Example 1
In order to solve the problems of potential safety hazards and energy waste caused by the use of large voltage and large load in the prior art, the embodiment provides a test device for durability test of a small fuse, as shown in fig. 1-2, the test device comprises a control part and a test circuit part, the test circuit part comprises a current generator 3, a first branch 4 and a second branch 5, the first branch 4 is connected with the current generator 3 in series, the second branch 5 is connected with the current generator 3 in series, and the first branch 4 and the second branch 5 are connected in parallel; set up first relay R1, the small-size fuse F1 that awaits measuring on the first branch road 4, set up second relay R2 on the second branch road 5, the control part is connected with first relay R1, second relay R2 respectively.
The first relay R1 and the second relay R2 are electromagnetic relays commonly used in the industry, belong to automatic switching elements, and are controlled by the control part through the first relay R1 and the second relay R2, so that the first branch circuit 4 and the second branch circuit 5 are in a disconnected or connected state; when the first branch 4 is in the off state, the small fuse F1 to be tested is in the off state, and when the first branch 4 is in the on state, the small fuse F1 to be tested is in the on state.
Therefore, in the embodiment, by setting the parallel relation between the first branch 4 and the second branch 5, the on-off state of the first relay R1 and the second relay R2 is controlled by the control part, and the first relay R1 and the second relay R2 are alternately in the closed state, that is, the first branch 4 and the second branch 5 are alternately in the communicated state, so that when the durability test is performed on the small fuse F1 to be tested, the situation that the small fuse F1 to be tested is damaged due to the fact that the current impact is caused by the instant load applied to the current generator 3 can be avoided.
Specifically, the first relay R1 includes a first coil C1 and a first contact K1, the first contact K1 and the small fuse F1 to be tested are arranged in the first branch 4 in series, and the first coil C1 is connected to the control unit, and is used for generating electromagnetic attraction force and controlling the opening or closing of the first contact K1, so as to realize the opening or the connection of the first branch 4; the current resistance of the first contact K1 is larger than the set current value of the current generator 3, so that the first contact K1 is prevented from being burnt due to excessive current in the test process.
The second relay R2 includes a second coil C2, a second contact K2, the second contact K2 is disposed in the second branch 5, the second coil C2 is connected to the control portion, and is used for generating electromagnetic attraction force to control the opening or closing of the second contact K2, so as to realize the opening or the connection of the second branch 5; the current-resistant capability of the second contact K2 is larger than the set current value of the current generator 3, so that the second contact K2 is ensured not to be burnt out due to overcurrent in the test process.
The current generator 3 is a constant current source for supplying the first relay R1, the second relay R2 and the small fuse F1 with the current required for the test.
The control part comprises a control module 1 and a memory 2, the control module 1 is connected with the memory 2, the control module 1 is respectively connected with a first coil C1 and a second coil C2 and is used for controlling the power-on or power-off state of the first coil C1 and the second coil C2 at regular time;
specifically, the control module 1 is preferably a conventional single chip microcomputer system, and for the control of the first coil C1, when the first coil C1 is controlled to be in an energized state, the first coil C1 generates electromagnetic attraction force, so that the first contact K1 is closed, and the communication of the first branch 4 is realized; when the first coil C1 is controlled to be in the power-off state, the first coil C1 has no electromagnetic attraction force, so that the first contact K1 is opened, and the first branch 4 is disconnected; for the control of the second coil C2, when the second coil C2 is controlled to be in the energized state, the second coil C2 generates electromagnetic attraction force, so that the second contact K2 is closed, and the communication of the second branch 5 is realized; when the second coil C2 is controlled to be in the power-off state, the second coil C2 has no electromagnetic attraction, so that the second contact K2 is opened, and the second branch 5 is disconnected.
The memory 2 is a rewritable storage medium, such as a removable hard disk, a flash memory card, a usb flash disk, and other conventional data storage media.
For the small fuse F1 to be tested, the small fuse F1 is the object to be tested by the invention; and the small-size fuse F1 that awaits measuring sets up on first branch 4 with the mode that can dismantle to when testing different small-size fuses, can need not to adjust or dismantle circuit structure, only need dismantle the small-size fuse that has accomplished the test from first branch 4, then install the small-size fuse that awaits measuring on first branch 4, can carry out subsequent test work, the tester of being convenient for operates, is favorable to improving detection efficiency.
Example 2
This example provides a method for testing the durability of a small fuse based on example 1, as shown in fig. 1-3, the method comprising:
step one, zeroing a storage numerical value of a memory 2, and carrying out a first current stabilization process;
wherein the first current stabilization process comprises:
the control module 1 controls the second coil C2 to be electrified, and the second contact K2 is attracted, namely the second branch 5 is communicated.
Turning on the current generator 3, setting a preset current; the preset current is set according to the requirements in the national standard GB/T9364.1-2015; at this point, current is output from the current generator 3 through the second contact K2 on the second branch 5 back to the current generator 3.
After the first preset time period t1, the control module 1 controls the first coil C1 to be electrified, the first contact K1 is attracted, and the first branch 4 is communicated; at this time, according to the characteristics of the parallel circuit, the current is output from the current generator 3, passes through the second contact K2 on the second branch 5, and also passes through the first contact K1 on the first branch 4, the small fuse F1 to be tested, and returns to the current generator 3. Preferably, the first preset time period t1 is 5 minutes.
After a second preset time period t2, the control module 1 controls the second coil C2 to be powered off, and the second contact K2 is disconnected; at this time, the current only passes through the first contact K1 on the first branch 4 and the small fuse F1 to be tested. Preferably, the second preset time period t2 is 2 seconds; during the second preset time period t2, the current generator 3 gradually disappears from the current trace change caused by the increase of the loads such as the first contact K1, the small fuse F1 to be tested and the like in the test circuit, and the current output by the current generator 3 can reach a stable state; in the process, the first relay R1 and the second relay R2 are alternately connected and disconnected, and the impact current when the circuit is connected is prevented from damaging the small fuse F1 to be tested.
The testing device maintains a third preset time period T3, and the third preset time period T3 is 1 hour according to the requirements of national standard GB/T9364.1-2015.
Step two, after the first current stabilization process is finished, a second current stabilization process is carried out, and the stored value of the memory 2 is added with 1;
wherein the second current stabilization process comprises:
the control module 1 controls the second coil C2 to be electrified, and the second contact K2 is attracted, namely the second branch 5 is communicated.
After a second preset time period t2, the control module 1 controls the first coil C1 to be powered off, and the first contact K1 is disconnected, that is, the first branch 4 is disconnected; preferably, the second preset time period t2 is 2 seconds.
The testing device maintains a fourth preset time period T4, and the fourth preset time period T4 is 15 minutes according to the requirements of national standard GB/T9364.1-2015.
Step three, after the second current stabilization process is finished, a third current stabilization process is carried out;
wherein the third current stabilization process comprises:
the control module 1 controls the first coil C1 to be electrified, the first contact K1 is attracted, namely the first branch 4 is communicated, and the current passes through the small fuse F1 to be tested.
After a second preset time period t2, the control module 1 controls the second coil C2 to be powered off, and the second contact K2 is disconnected; at this time, the current only passes through the first contact K1 on the first branch 4 and the small fuse F1 to be tested. Preferably, the second preset time period t2 is 2 seconds; during the second preset time period t2, the current generator 3 gradually disappears from the current trace change caused by the increase of the loads such as the first contact K1, the small fuse F1 to be tested and the like in the test circuit, and the current output by the current generator 3 can reach a stable state; in the process, the first relay R1 and the second relay R2 are alternately connected and disconnected, and the impact current when the circuit is connected is prevented from damaging the small fuse F1 to be tested.
The testing device maintains a third preset time period T3, and the third preset time period T3 is 1 hour according to the requirements of national standard GB/T9364.1-2015.
Step four, after the third current stabilization process is finished, a second current stabilization process is carried out, and the stored value of the memory 2 is added with 1;
the second current stabilizing process in the fourth step is the same as the second current stabilizing process in the second step, and is not described herein again.
After the second current stabilization process is finished, the control module 1 judges whether the storage numerical value of the storage 2 reaches a preset value; if yes, carrying out the step six; if not, returning to the third step;
preferably, the preset value is 100.
And step six, disconnecting all the first branch circuit 4 and the second branch circuit 5, and ending the test.
The control module 1 controls the first coil C1 and the second coil C2 to be powered off respectively, so that the first contact K1 and the second contact K2 are both open, that is, the first branch 4 and the second branch 5 are all open.
Therefore, on the basis of the device and the method for testing the durability of the small fuse, the first relay R1 and the second relay R2 are controlled by the control module 1 in the test process of the durability test of the small fuse, so that the first relay R1 and the second relay R2 are alternately connected and disconnected, the impact current generated when a circuit is connected is prevented from damaging the small fuse F1 to be tested, the condition that the voltage and the load are increased together according to the proportion in the prior art is avoided, the potential safety hazard caused by large voltage and large load is avoided, and the energy is saved.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims (9)

1. The test method of the durability test of the small fuse is characterized in that the test method uses a test device of the durability test of the small fuse, the test device comprises a control part and a test circuit part, the test circuit part comprises a current generator (3), a first branch (4) and a second branch (5), the first branch (4) is connected with the current generator (3) in series, the second branch (5) is connected with the current generator (3) in series, and the first branch (4) and the second branch (5) are arranged in parallel; the first branch circuit (4) is provided with a first relay R1 and a small fuse F1 to be tested, the second branch circuit (5) is provided with a second relay R2, and the control part is respectively connected with the first relay R1 and the second relay R2; the first relay R1 comprises a first coil C1 and a first contact K1, the first contact K1 and a small fuse F1 to be tested are arranged in a first branch (4) in series, and the first coil C1 is connected with a control part; the second relay R2 includes a second coil C2, a second contact K2, the second contact K2 being provided in the second branch (5), the second coil C2 being connected to the control section;
the method comprises the following steps:
step one, zeroing a storage numerical value of a memory (2), and carrying out a first current stabilization process;
step two, after the first current stabilization process is finished, a second current stabilization process is carried out, and the stored value of the memory (2) is added with 1;
step three, after the second current stabilization process is finished, a third current stabilization process is carried out;
step four, after the third current stabilization process is finished, a second current stabilization process is carried out, and the stored numerical value of the memory (2) is added with 1;
after the second current stabilization process is finished, the control module (1) judges whether the storage numerical value of the memory (2) reaches a preset value; if yes, carrying out the step six; if not, returning to the third step;
and step six, the first branch circuit (4) and the second branch circuit (5) are all disconnected, and the test is finished.
2. The method of claim 1, wherein the current endurance of the first contact K1 is greater than the set current value of the current generator (3), and the current endurance of the second contact K2 is greater than the set current value of the current generator (3).
3. The method for testing the endurance test of the miniature fuse in accordance with claim 1, wherein the control unit comprises a control module (1) and a memory (2), the control module (1) is connected to the memory (2), and the control module (1) is connected to the first coil C1 and the second coil C2, respectively.
4. The method for testing the endurance test of the miniature fuse as claimed in claim 3, wherein the control module (1) is a single chip microcomputer system, and the memory (2) is a rewritable storage medium.
5. The method as claimed in claim 1, wherein the first current stabilization process comprises:
the control module (1) controls the second coil C2 to be electrified, and the second contact K2 is attracted;
turning on a current generator (3) and setting a preset current;
after the first preset time t1, the control module (1) controls the first coil C1 to be electrified, and the first contact K1 is attracted;
after a second preset time period t2, the control module (1) controls the second coil C2 to be powered off, and the second contact K2 is disconnected;
the testing apparatus maintains the third preset time period t 3.
6. The method as claimed in claim 5, wherein the second current stabilization process comprises:
the control module (1) controls the second coil C2 to be electrified, and the second contact K2 is attracted;
after a second preset time period t2, the control module (1) controls the first coil C1 to be powered off, and the first contact K1 is disconnected;
the testing apparatus maintains the fourth preset time period t 4.
7. The method as claimed in claim 6, wherein the third current stabilization process comprises:
the control module (1) controls the first coil C1 to be electrified, and the first contact K1 is attracted;
after a second preset time period t2, the control module (1) controls the second coil C2 to be powered off, and the second contact K2 is disconnected;
the testing apparatus maintains the third preset time period t 3.
8. The method of claim 7, wherein the first predetermined time period t1 is 5 minutes, the second predetermined time period t2 is 2 seconds, the third predetermined time period t3 is 1 hour, and the fourth predetermined time period t4 is 15 minutes.
9. The method as claimed in claim 1, wherein the predetermined value is 100 in step five.
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CN109406980A (en) * 2018-10-12 2019-03-01 山东阅芯电子科技有限公司 Reverse-biased test specimen guard method and device

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