CN111244937B - A Method for Screening Serious Faults of Power System Transient Voltage Stability - Google Patents

A Method for Screening Serious Faults of Power System Transient Voltage Stability Download PDF

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CN111244937B
CN111244937B CN202010023361.3A CN202010023361A CN111244937B CN 111244937 B CN111244937 B CN 111244937B CN 202010023361 A CN202010023361 A CN 202010023361A CN 111244937 B CN111244937 B CN 111244937B
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郭庆来
孙宏斌
王彬
葛怀畅
林银鸿
齐子杰
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Tsinghua University
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Abstract

本发明涉及一种电力系统暂态电压稳定性严重故障筛选方法，属于电力系统暂态安全评估和控制领域。该方法首先构建预想故障集，对预想故障集中所有故障进行暂态仿真，得到预想故障集中各故障下的电压时序轨迹，计算得到各故障下每个220kV及以上电压等级的母线节点暂态电压稳定性指标；根据指标计算结果，获取严重故障组成严重故障集并建立严重故障集的余弦距离矩阵；对严重故障聚类获取每个聚类中的代表性故障，最终得到代表性故障集。本发明可以快速完成电力系统安全状况的评估，进行有效的故障预防，防止电力系统大规模问题的发生。The invention relates to a method for screening serious faults of power system transient voltage stability, belonging to the field of power system transient safety evaluation and control. The method firstly constructs an expected fault set, performs transient simulation on all faults in the expected fault set, obtains the voltage sequence traces under each fault in the expected fault set, and calculates the transient voltage stability of each bus node with a voltage level of 220kV and above under each fault. According to the calculation results of the indicators, the serious faults are obtained to form the serious fault set and the cosine distance matrix of the serious fault set is established; the representative faults in each cluster are obtained for the serious fault clustering, and finally the representative fault set is obtained. The present invention can quickly complete the evaluation of the safety status of the power system, carry out effective fault prevention, and prevent the occurrence of large-scale problems in the power system.

Description

Method for screening serious faults of transient voltage stability of power system
Technical Field
The invention belongs to the field of power system transient voltage safety assessment and control, and particularly relates to the field of power system transient voltage stability serious fault screening.
Background
In recent years, with the development of technologies such as high-voltage direct-current transmission and new energy power generation, dynamic reactive power reserves of a power system are increasingly insufficient, and the problem of transient voltage stability caused by faults is particularly prominent. However, since the expected number of faults is large, if the reactive power optimization is directly performed on all the faults, the optimization problem is too large in scale, and the solution is difficult. Therefore, there is a need to reduce the number of failures to be considered in an efficient manner.
The existing fault screening method mainly comprises a time domain simulation method, a transient energy function method, an artificial intelligence method and the like. The time domain simulation method has the defects of high calculation precision, long calculation time consumption, incapability of providing stability margin and the like; the energy function method can provide information such as stability margin and the like, the calculation speed is high, and the critical energy is difficult to obtain; the artificial intelligence method has the advantages that the online calculation time of the trained neural network is short, but the method has the common defects that the selection of characteristic variables is not comprehensive, samples do not cover the whole sample space enough, and the accuracy of screening cannot be guaranteed. Therefore, a more effective fault screening method needs to be researched.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a method for screening serious transient voltage stability faults of a power system. The invention can rapidly complete the evaluation of the safety condition of the power system, effectively prevent faults and prevent the large-scale problem of the power system.
The invention provides a method for screening serious faults of transient voltage stability of a power system, which is characterized by comprising the following steps of:
(1) constructing an expected fault set, and performing transient simulation on all faults in the expected fault set to obtain a voltage time sequence track under each fault in the expected fault set;
(2) calculating a transient voltage stability index TVSI of each bus node with voltage grade of 220kV or above in the power system under each fault in the expected fault set;
the transient voltage stability index of each bus node is calculated as follows:
Figure GDA0002769440130000021
TVSI2＝|Vs-V0|×(Ts-Tcut)
Figure GDA0002769440130000022
wherein, TVSI1A first component representing a bus node transient voltage stability index, v (t) representing the bus node voltage at time t, t0Indicates that V (t) falls to a safety threshold value V for the first timethThe following time, TendIndicates that V (t) is restored to the safety threshold value V for the first timethThe above time;
TVSI2a second component, V, representing a transient voltage stability indicator for the bus node0、VSRespectively representing the initial and steady-state values of the bus node voltage, Tcut、TsRespectively showing the fault clearing time and the time of entering a stable state after the fault; TVSIth1、TVSIth2Respectively representing the first componentAnd a safety threshold of the second component; k is a radical of1、k2The weight coefficient of the first component and the weight coefficient of the second component are respectively;
(3) finding out the maximum value of the TVSI of the bus node under each fault according to the result of the step (2), taking the fault with the maximum value of the TVSI of the bus node larger than 1 in all the faults as a serious fault, and forming all the serious faults into a serious fault set;
Figure GDA0002769440130000023
wherein S issFltIndicates a critical failure set, SBusBus node set, Bus, representing all 220kV and above voltage classes in an electrical power systemjDenotes SBusThe j-th element of (1), SFltIndicating a set of expected failures, FltiIndicating the ith element in the envisioned failure set,
Figure GDA0002769440130000024
indicating failure FltiBus node BusjTransient voltage stability indicator of (1);
(4) calculating the absolute value of the difference value of TVSI between every two faults in the serious fault set as the cosine distance between the two faults to form a cosine distance matrix of the serious fault set;
Figure GDA0002769440130000025
Figure GDA0002769440130000026
wherein M isdisCosine distance matrix representing the set of critical faults, dijIndicating failure FltiAnd FltjThe cosine distance between them, N represents the number of critical faults,
Figure GDA0002769440130000027
indicating failure FltiBus node BuskTransient voltage stability index of (1), NBusThe number of bus nodes representing 220kV and above voltage levels in the power system is shown;
(5) according to matrix MdisDetermining a final clustering scheme and a clustering number N by adopting a hierarchical clustering algorithm and an outline coefficient method; the method comprises the following specific steps:
(5-1) calculating a contour coefficient corresponding to each clustering scheme;
Figure GDA0002769440130000031
Figure GDA0002769440130000032
wherein, aiRepresenting the average distance from a fault i in any serious fault cluster to other faults in the cluster under the clustering scheme, biRepresents the minimum value, sc, of the mean distance from fault i in any one serious fault cluster to each of the other serious fault clustersiRepresenting the contour coefficient of the fault i, and SC representing the contour coefficient of the clustering scheme;
(5-2) selecting the maximum outline coefficient scheme as the final clustering scheme, and taking the outline coefficient corresponding to the scheme as the final clustering number Nc；
(6) And taking the fault corresponding to the maximum value of the TVSI of the bus node in each serious fault cluster as a representative fault corresponding to the cluster, wherein all the representative faults form a representative fault set, and finishing screening.
The invention has the characteristics and beneficial effects that:
1. the method adopts the parallel computing technology to realize the transient simulation of a plurality of expected faults simultaneously, and the simulation time is reduced as much as possible on the premise of ensuring the computing precision.
2. The method of the invention obtains the transient voltage stability margin information of each fault by calculating the transient voltage stability index of each node under each fault.
3. The method of the invention combines the clustering algorithm to further screen the serious fault set to obtain a representative fault set, thereby obviously reducing the number of serious faults to be considered.
Detailed Description
The invention provides a method for screening serious faults of transient voltage stability of a power system, which is further described in detail in the following by combining specific embodiments.
The invention provides a method for screening serious faults of transient voltage stability of a power system, which adopts a parallel computing technology to simultaneously carry out transient simulation on a plurality of faults, calculates a voltage stability index according to a simulation result and preliminarily screens a serious fault set according to the voltage stability index, then clusters the serious faults by adopting a hierarchical clustering algorithm, and finally selects a plurality of faults from each type of faults to form a typical representative fault set. The method comprises the following steps:
(1) selecting a plurality of faults to form an expected fault set (the number of the faults in the expected fault set has no special requirement); and calling a PSASP transient simulation program by using MATLAB programming, and simultaneously performing transient simulation calculation on all faults in the expected fault set through a parallel calculation function of the MATLAB to obtain a voltage time sequence track under each fault in the expected fault set.
(2) Calculating a transient voltage stability index TVSI of each bus node with voltage grade of 220kV or above in the power system under each fault in the expected fault set;
the transient voltage stability index of each bus node is calculated as follows:
Figure GDA0002769440130000041
TVSI2＝|Vs-V0|×(Ts-Tcut)
Figure GDA0002769440130000042
wherein, TVSI1The first component representing the bus node transient voltage stability indicator,
v (t) represents the bus node voltage at time t, t0Indicates that V (t) falls to a safety threshold value V for the first timethThe following time, TendIndicates that V (t) is restored to the safety threshold value V for the first timethAbove time (wherein the safety threshold V isthPer unit value 0.8).
TVSI2A second component, V, representing a transient voltage stability indicator for the bus node0、VSRespectively representing the initial and steady-state values of the bus node voltage, Tcut、TsRespectively, indicating the time of fault removal and the time of entering steady state after the fault. TVSIth1、TVSIth2Respectively representing a safety threshold of the first component and a safety threshold of the second component (all the safety thresholds take per unit values of 0.8);
the transient voltage stability index TVSI of each bus node is TVSI of two components of the bus node1And TVSI2Weighted sum of (a), k1、k2The weight coefficients are respectively corresponding (0.5 is respectively taken).
(3) According to the result of the step (2), finding out the maximum value of the TVSI of the bus node under each fault for measuring the transient voltage stability degree of the fault, taking the fault with the maximum value of the TVSI of the bus node larger than 1 in all the faults as a serious fault, and forming a serious fault set by all the serious faults: (ii) a
Figure GDA0002769440130000043
Wherein S issFltIndicates a critical failure set, SBusAnd BusjBus node set respectively representing all voltage classes of 220kV and above in power grid force system and jth element, S in bus node setFltAnd FltiRespectively representing the anticipated failure set and the ith element in the anticipated failure set,
Figure GDA0002769440130000044
indicating failure FltiBusjThe transient voltage stability index of (1).
(4) Calculating the absolute value of the difference value of TVSI between every two faults in the serious fault set as the cosine distance between the two faults to form a cosine distance matrix of the serious fault set;
Figure GDA0002769440130000045
Figure GDA0002769440130000046
wherein M isdisCosine distance matrix representing the set of critical faults, dijIndicating failure FltiAnd FltjThe cosine distance between them, N represents the number of critical faults,
Figure GDA0002769440130000051
indicating failure FltiBus node BuskTransient voltage stability index of (1), NBusThe number of bus nodes representing 220kV and above voltage levels in the power system is shown;
(5) according to matrix MdisClustering serious faults by adopting a hierarchical clustering algorithm, determining the number of clusters by adopting a contour coefficient, taking a maximum contour coefficient scheme as a final clustering scheme, and taking a contour coefficient corresponding to the scheme as a final clustering number Nc(ii) a The method comprises the following specific steps:
(5-1) calculating a contour coefficient corresponding to each clustering scheme;
Figure GDA0002769440130000052
Figure GDA0002769440130000053
wherein, aiRepresenting the average distance from a fault i in any serious fault cluster to other faults in the cluster under the clustering scheme, biRepresents the minimum value, sc, of the mean distance from fault i in any one serious fault cluster to each of the other serious fault clustersiAnd the contour coefficient of the fault i is shown, the SC is shown as the contour coefficient of the clustering scheme, and N is the number of serious faults.
(5-2) after calculating the corresponding outline coefficients of all the clustering schemes, selecting the maximum outline coefficient scheme as the final clustering scheme, and taking the outline coefficient corresponding to the scheme as the final clustering number Nc。
(6) Taking the fault corresponding to the maximum value of TVSI in each serious fault cluster as a representative fault corresponding to the cluster, forming a representative fault set by all representative faults, and finishing screening;
the specific method comprises the following steps: take out class a serious faults one by one
Figure GDA0002769440130000054
Each fault Flt iniFinding out the maximum value in TVSI corresponding to all bus nodes under the fault action
Figure GDA0002769440130000055
Compare all under the cluster of serious faults
Figure GDA0002769440130000056
Size, finding the maximum value
Figure GDA0002769440130000057
Then
Figure GDA0002769440130000058
Corresponding failure FltpNamely, the representative fault of the a-th serious fault is marked as psFlta. Finally, the representative faults in each serious fault cluster form a representative fault set SpsFltAnd finishing the screening.

Claims (1)

1.一种电力系统暂态电压稳定性严重故障筛选方法，其特征在于，包括以下步骤：1. a power system transient voltage stability critical fault screening method, is characterized in that, comprises the following steps: (1)构建预想故障集，对预想故障集中所有故障进行暂态仿真，得到预想故障集中各故障下的电压时序轨迹；(1) Construct an expected fault set, perform transient simulation on all faults in the expected fault set, and obtain the voltage sequence traces under each fault in the expected fault set; (2)计算预想故障集中各故障下电力系统中每个220kV及以上电压等级的母线节点暂态电压稳定性指标TVSI；(2) Calculate the transient voltage stability index TVSI of each bus node with a voltage level of 220kV and above in the power system under each fault in the expected fault concentration; 其中，每个母线节点的暂态电压稳定性指标的计算如下式：Among them, the calculation of the transient voltage stability index of each bus node is as follows:
Figure FDA0002361588940000011
Figure FDA0002361588940000011
 TVSI2＝|Vs-V0|×(Ts-Tcut)TVSI 2 =|V s -V 0 |×(T s -T cut )
Figure FDA0002361588940000012
Figure FDA0002361588940000012
 其中，TVSI1表示母线节点暂态电压稳定性指标的第一个分量，v(t)表示t时刻母线节点电压，t0表示v(t)第一次跌落到安全阈值Vth以下的时刻，Tend表示v(t)第一次恢复到安全阈值Vth以上的时刻；Among them, TVSI 1 represents the first component of the bus node transient voltage stability index, v(t) represents the bus node voltage at time t, and t 0 represents the moment when v(t) falls below the safety threshold V th for the first time, T end represents the moment when v(t) recovers above the safety threshold V th for the first time; TVSI2表示母线节点暂态电压稳定性指标的第二个分量，V0、VS分别表示母线节点电压的初始值以及稳态值，Tcut、Ts分别表示故障切除时刻以及故障后进入稳态的时刻；TVSIth1、TVSIth2分别表示第一个分量的安全阈值和第二个分量的安全阈值；k1、k2分别为第一个分量的权重系数和第二个分量的权重系数；TVSI 2 represents the second component of the bus node transient voltage stability index, V 0 and V S represent the initial value and steady-state value of the bus node voltage, respectively, T cut and T s represent the moment of fault clearing and the entry into stable state after the fault, respectively. The moment of state; TVSI th1 and TVSI th2 respectively represent the safety threshold of the first component and the safety threshold of the second component; k 1 and k 2 are the weight coefficient of the first component and the weight coefficient of the second component, respectively; (3)根据步骤(2)的结果，找出每个故障下母线节点TVSI最大值，将所有故障中存在母线节点TVSI最大值大于1的故障作为严重故障，将所有严重故障组成严重故障集；(3) According to the result of step (2), find out the maximum value of the TVSI of the bus node under each fault, take all the faults with the fault with the maximum value of the TVSI of the bus node greater than 1 as a serious fault, and form a serious fault set with all the serious faults;
Figure FDA0002361588940000013
Figure FDA0002361588940000013
 其中，SsFlt表示严重故障集，SBus表示电力系统中所有220kV及以上电压等级的母线节点集合，Busj表示SBus中的第j个元素，SFlt表示预想故障集，Flti表示预想故障集中的第i个元素，
Figure FDA0002361588940000014
表示故障Flti下母线节点Busj的暂态电压稳定性指标；Among them, S sFlt represents the severe fault set, S Bus represents the set of all bus nodes with voltage levels of 220kV and above in the power system, Bus j represents the jth element in S Bus , S Flt represents the expected fault set, and Flt i represents the expected fault the ith element in the set,
Figure FDA0002361588940000014
Indicates the transient voltage stability index of bus node Bus j under fault Flt i ; (4)计算严重故障集中所有故障两两之间TVSI的差值的绝对值作为该两个故障之间的余弦距离，构成严重故障集的余弦距离矩阵；(4) Calculate the absolute value of the TVSI difference between all the faults in the serious fault set as the cosine distance between the two faults to form the cosine distance matrix of the serious fault set;
Figure FDA0002361588940000015
Figure FDA0002361588940000015
Figure FDA0002361588940000021
Figure FDA0002361588940000021
 其中，Mdis表示严重故障集的余弦距离矩阵，dij表示故障Flti和Fltj之间的余弦距离，N代表严重故障数，
Figure FDA0002361588940000022
表示故障Flti下母线节点Busk的暂态电压稳定性指标，NBus表示电力系统中220kV及以上电压等级的母线节点数量；where M dis represents the cosine distance matrix of the critical fault set, d ij represents the cosine distance between faults Flt i and Flt j , N represents the number of critical faults,
Figure FDA0002361588940000022
Represents the transient voltage stability index of bus node Bus k under fault Flt i , N Bus represents the number of bus nodes with voltage levels of 220kV and above in the power system; (5)根据矩阵Mdis采用层次聚类算法，采用轮廓系数法确定最终的聚类方案以及聚类数量N；具体步骤如下：(5) Adopt the hierarchical clustering algorithm according to the matrix Mdis , and use the silhouette coefficient method to determine the final clustering scheme and the number of clusters N; the specific steps are as follows: (5-1)对每个聚类方案，计算该方案对应的轮廓系数；(5-1) For each clustering scheme, calculate the silhouette coefficient corresponding to the scheme;
Figure FDA0002361588940000023
Figure FDA0002361588940000023
Figure FDA0002361588940000024
Figure FDA0002361588940000024
 其中，ai表示该聚类方案下任一严重故障聚类中故障i到该聚类中其它故障的平均距离，bi表示任一严重故障聚类中故障i到各其它严重故障聚类的平均距离的最小值，sci表示故障i的轮廓系数，SC表示该聚类方案的轮廓系数；Among them, a i represents the average distance from fault i in any critical fault cluster under the clustering scheme to other faults in the cluster, and bi represents the distance from fault i in any critical fault cluster to other critical fault clusters. The minimum value of the average distance, sc i represents the silhouette coefficient of fault i, and SC represents the silhouette coefficient of the clustering scheme; (5-2)选取轮廓系数最大方案作为最终的聚类方案，将该方案对应的的轮廓系数作为最终的聚类数量Nc；(5-2) Select the maximum silhouette coefficient scheme as the final clustering scheme, and use the silhouette coefficient corresponding to the scheme as the final number of clusters N c ; (6)将每个严重故障聚类中母线节点TVSI最大值对应的故障作为该聚类对应的代表性故障，所有代表性故障构成代表性故障集，筛选完成。(6) The fault corresponding to the maximum value of the TVSI of the bus node in each severe fault cluster is taken as the representative fault corresponding to the cluster, and all the representative faults constitute a representative fault set, and the screening is completed.
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