CN111238765A - Semiconductor strain balance applied to pulse wind tunnel - Google Patents
Semiconductor strain balance applied to pulse wind tunnel Download PDFInfo
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- CN111238765A CN111238765A CN202010179479.5A CN202010179479A CN111238765A CN 111238765 A CN111238765 A CN 111238765A CN 202010179479 A CN202010179479 A CN 202010179479A CN 111238765 A CN111238765 A CN 111238765A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 36
- 238000012360 testing method Methods 0.000 claims description 24
- 238000005096 rolling process Methods 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 230000035945 sensitivity Effects 0.000 abstract description 6
- 238000005259 measurement Methods 0.000 description 8
- 230000004044 response Effects 0.000 description 5
- 238000011161 development Methods 0.000 description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M9/00—Aerodynamic testing; Arrangements in or on wind tunnels
- G01M9/06—Measuring arrangements specially adapted for aerodynamic testing
- G01M9/062—Wind tunnel balances; Holding devices combined with measuring arrangements
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Abstract
The invention discloses a semiconductor strain balance applied to a pulse wind tunnel. The balance sequentially comprises a model connecting section, a first combined measuring element, an axial force measuring element, a second combined measuring element, an accelerometer mounting section, a balance supporting rod and a supporting section from front to back. Aiming at the characteristic of short effective time of the pulse wind tunnel, the balance adopts a semiconductor strain balance form, and simultaneously, the balance and the supporting rod are designed into a whole, so that the number of intermediate parts is reduced, and the rigidity of the balance is enhanced. On the basis of the three-piece beam type combined measuring element, the balance divides the side piece beam into an upper piece beam and a lower piece beam which are respectively used for measuring lateral force, yaw moment and roll moment, and improves the sensitivity and the measuring precision of the roll moment.
Description
Technical Field
The invention belongs to the field of wind tunnel equipment, and particularly relates to a semiconductor strain balance applied to a pulse wind tunnel.
Background
With the rapid development of various aircrafts and weapons, the wind tunnel force measurement test has higher and higher requirements on the measurement accuracy of micro-aerodynamic loads such as small transverse lateral aerodynamic force, small rolling moment and the like of the aircrafts and weapons, a balance measuring element is required to have ideal decoupling, and meanwhile, for a pulse wind tunnel with the test time of only a few to dozens of milliseconds, the balance is also required to have high frequency response due to the short test time.
The conventional strain balance has advantages in the aspects of structural decoupling and performance stability, but because the sensitivity coefficient of the resistance strain gauge is very low and is only about 2, on the premise of ensuring sufficient signal output, the strain design of the strain balance cannot be too small, so that the rigidity, frequency response and the like of the strain balance cannot meet the requirements of a pulse wind tunnel with test time of only a few milliseconds to a few tens milliseconds. The piezoelectric sheet has high sensitivity coefficient, the rigidity and frequency response of the piezoelectric balance can meet the requirement of a pulse wind tunnel with test time of only a few milliseconds to a dozen milliseconds, but the piezoelectric sheet has poor stability over time, the performance of the piezoelectric sheet has certain fluctuation along with the change of time, the piezoelectric balance needs to be calibrated in each wind tunnel force measurement test, and the improvement of the test efficiency is not facilitated.
Along with the improvement of a semiconductor processing technology, the performance of the semiconductor strain gauge is greatly improved, the sensitivity of the semiconductor balance is far higher than that of a resistance balance (by 1-2 orders of magnitude), a foundation is provided for designing the balance with good decoupling and high frequency response, and for a pulse wind tunnel with test time of only a few to dozens of milliseconds, because the test time is very short, the change of the environment temperature of the balance in the test can be ignored, and the defect that the resistance temperature coefficient of the semiconductor strain gauge is large is well compensated.
By utilizing the advantages of the semiconductor strain gauge and the design of the balance structure, the semiconductor strain balance meets the requirement of a pulse wind tunnel force measurement test with the test time of only a few milliseconds to a dozens of milliseconds, and is one of the development directions of the pulse wind tunnel balance.
Currently, the development of a semiconductor strain balance special for a pulse wind tunnel is needed.
Disclosure of Invention
The invention aims to provide a semiconductor strain balance applied to a pulse wind tunnel.
The invention relates to a semiconductor strain balance applied to a pulse wind tunnel, which is characterized by sequentially comprising a model connecting section, a first combined measuring element, an axial force measuring element, a second combined measuring element, an accelerometer mounting section, a balance supporting rod and a supporting section from front to back;
the model connecting section is a conical section which expands from front to back and is matched and connected with the wind tunnel test model through a conical surface, a key groove is formed in the conical surface and used for installing and positioning the wind tunnel test model, and a threaded hole is formed in the front end of the model connecting section and used for compressing the wind tunnel test model;
the first combined measuring element is of a five-piece beam structure, and the five-piece beam structure equally divides two side pieces of beams of the three-piece beam structure into two beams which are symmetrical up and down to obtain five beams, namely a middle main beam, a side beam I positioned above the left side, a side beam II positioned below the left side, a side beam III positioned above the right side and a side beam IV positioned below the right side; each beam is adhered with a semiconductor strain gauge; the main beam is used for measuring a normal force and a pitching moment, the side beam I and the side beam III are used for measuring a lateral force and a yawing moment, and the side beam II and the side beam IV are used for measuring a rolling moment;
the axial force measuring element is of a T-shaped beam structure, the semiconductor strain gauges are adhered to two sides of a vertical beam of the T-shaped beam and used for measuring the axial force, supporting beams are symmetrically arranged on the front side and the rear side of the T-shaped beam, the axial force measuring element is divided into two parts by a chute penetrating in the inclined direction, and the two parts are connected into a whole through the T-shaped beam and the supporting beams; the axial force measuring element is also provided with a lead slot I for leading out a signal wire of the first combined measuring element;
the second combined measuring element is a five-piece beam structure which is symmetrical to the first combined measuring element, and each beam is adhered with a semiconductor strain gauge for measuring normal force, pitching moment, lateral force, yawing moment and rolling moment;
the accelerometer mounting section is a column section, and accelerometer mounting grooves are symmetrically arranged on the column section and used for mounting an accelerometer; the accelerometer mounting section is provided with a lead groove II for leading out signal wires of the first combination measuring element, the axial force measuring element and the second combination measuring element; the accelerometer mounting section is also provided with a wire inlet hole communicated with a threading pipeline of the balance axis;
the balance support rod is a conical section which expands from front to back and is used for extending the balance;
the support section be the column section, the upper portion cutting of column section has horizontal plane I, horizontal plane I is the gesture measuring surface, the lower part cutting of column section has horizontal plane II, it has the vertically through-hole to process between horizontal plane I and the horizontal plane II, it has the vertically cotter hole to process on the horizontal plane II, the tail end of column section has the wire hole that communicates with the threading pipeline of balance axis.
The semiconductor strain balance applied to the pulse wind tunnel is characterized in that two side plate beams are divided into two beams which are symmetrical up and down on the basis of a three-plate beam structure, and a five-plate beam structure is obtained. In the five-piece beam type structure, the axial force measuring element is arranged on the middle main beam of the balance measuring element, the first combined measuring element and the second combined measuring element are symmetrically arranged at two ends of the balance measuring element, and the first combined measuring element and the second combined measuring element are used for measuring five components except for the axial force, so that the interference of relatively large normal force and pitching moment on the axial force is reduced. The five-piece beam type structure increases the output signal of relatively small rolling torque, and improves the sensitivity and the measurement accuracy of the rolling torque.
According to the semiconductor strain balance applied to the pulse wind tunnel, the balance and the support rod are designed into a whole, so that the intermediate connection links are reduced, the rigidity of the balance is enhanced, and the frequency response of the balance is improved.
The semiconductor strain balance applied to the pulse wind tunnel adopts the semiconductor strain gauge, and the semiconductor strain gauge has high sensitivity and is beneficial to increasing the rigidity of the balance.
The semiconductor strain balance applied to the pulse wind tunnel overcomes the defects of the conventional strain balance and the application of the piezoelectric balance on the pulse wind tunnel, can well measure the aerodynamic load of the pulse wind tunnel force measurement test, and meets the requirements of various aircrafts and weapons on the accuracy of the measurement of the aerodynamic load of the wind tunnel.
Drawings
FIG. 1 is a perspective view of a semiconductor strain balance for use in a pulsed wind tunnel according to the present invention;
FIG. 2 is a schematic diagram of a measuring element of the semiconductor strain balance applied to a pulse wind tunnel according to the present invention;
FIG. 3 is a schematic sectional view taken along line A-A of FIG. 2;
FIG. 4 is a schematic cross-sectional view taken along line B-B of FIG. 2;
fig. 5 is a schematic diagram of a supporting section in the semiconductor strain balance applied to the pulse wind tunnel.
In the figure, 1, a model connecting section 2, a first combined measuring element 3, an axial force measuring element 4, a second combined measuring element 5, an accelerometer mounting section 6, a balance support rod 7 and a supporting section;
11. a key slot 12, a threaded hole;
21. the main beam 22, the side beam I23, the side beam II 24, the side beam III 25 and the side beam IV;
31, 'T' -shaped beam 32, supporting beam 33, inclined groove 34, lead groove I;
51. accelerometer mounting groove 52, lead groove II 53, wire inlet hole;
71. pin hole 72, through hole 73, attitude measurement plane 74, wire outlet hole.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings and examples.
Example 1
As shown in fig. 1, the semiconductor strain balance applied to the impulse wind tunnel of the present invention sequentially comprises a model connecting section 1, a first combined measuring element 2, an axial force measuring element 3, a second combined measuring element 4, an accelerometer mounting section 5, a balance support rod 6 and a support section 7 from front to back;
as shown in fig. 2, the model connecting section 1 is a conical section which expands from front to back and is connected with the wind tunnel test model in a matching manner through a conical surface, the conical surface is provided with a key groove 11 for mounting and positioning the wind tunnel test model, and the front end of the model connecting section 1 is provided with a threaded hole 12 for compressing the wind tunnel test model;
as shown in fig. 2 and 3, the first combined measuring element 2 is of a five-piece beam structure, which equally divides two side beams of a three-piece beam structure into two beams which are symmetrical up and down, and obtains five beams, namely a middle main beam 21, a side beam i 22 positioned above the left side, a side beam ii 23 positioned below the left side, a side beam iii 24 positioned above the right side and a side beam iv 25 positioned below the right side; each beam is adhered with a semiconductor strain gauge; the main beam 21 measures a normal force and a pitching moment, the side beam I22 and the side beam III 24 measure a lateral force and a yawing moment, and the side beam II 23 and the side beam IV 25 measure a rolling moment;
as shown in fig. 2 and 4, the axial force measuring element 3 is of a "T" beam structure, the semiconductor strain gauges are adhered to two sides of a vertical beam of the "T" beam 31 for measuring the axial force, support beams 32 are symmetrically arranged on the front side and the rear side of the "T" beam 31, the axial force measuring element 3 is divided into two parts by an inclined groove 33 which penetrates obliquely upwards, and the two parts are connected into a whole through the "T" beam 31 and the support beams 32; the axial force measuring element 3 is also provided with a lead groove I34 for leading out a signal wire of the first combined measuring element 2;
the second combined measuring element 4 is a five-piece beam structure which is symmetrical to the first combined measuring element 2, and each beam is adhered with a semiconductor strain gauge for measuring normal force, pitching moment, lateral force, yawing moment and rolling moment;
as shown in fig. 2, the accelerometer mounting section 5 is a column section, and accelerometer mounting grooves 51 are symmetrically arranged on the column section and used for mounting an accelerometer; the accelerometer mounting section 5 is provided with a lead groove II 52 for leading out signal wires of the first combination measuring element 2, the axial force measuring element 3 and the second combination measuring element 4; the accelerometer mounting section 5 is also provided with a wire inlet hole 53 communicated with a threading pipeline of the balance axis;
as shown in fig. 1, the balance strut 6 is a conical section expanding from front to back and used for extending the balance;
as shown in fig. 5, the support section 7 is a column section, a horizontal plane i is cut at the upper part of the column section, the horizontal plane i is a posture measuring plane 73, a horizontal plane ii is cut at the lower part of the column section, a vertical through hole 72 is processed between the horizontal plane i and the horizontal plane ii, a vertical pin hole 71 is processed on the horizontal plane ii, and a wire outlet 74 communicated with a threading pipe of the balance axis is arranged at the tail end of the column section.
At present, the semiconductor strain balance applied to the impulse wind tunnel successfully obtains the pneumatic load of the blunt cone mark die in the shock tunnel with the test time of 10 milliseconds, and the pneumatic load and the pneumatic data manual of the blunt cone mark die have good repeatability, so that the semiconductor strain balance applied to the impulse wind tunnel can be popularized and applied to model tests.
Claims (1)
1. The semiconductor strain balance applied to the pulse wind tunnel is characterized by sequentially comprising a model connecting section (1), a first combined measuring element (2), an axial force measuring element (3), a second combined measuring element (4), an accelerometer mounting section (5), a balance supporting rod (6) and a supporting section (7) from front to back;
the model connecting section (1) is a conical section which expands from front to back and is matched and connected with the wind tunnel test model through a conical surface, a key groove (11) is formed in the conical surface and used for installing and positioning the wind tunnel test model, and a threaded hole (12) is formed in the front end of the model connecting section (1) and used for compressing the wind tunnel test model;
the first combined measuring element (2) is of a five-piece beam structure, two side pieces of beams of the three-piece beam structure are equally divided into two beams which are symmetrical up and down by the five-piece beam structure, and five beams including a middle main beam (21), a side beam I (22) positioned above the left side, a side beam II (23) positioned below the left side, a side beam III (24) positioned above the right side and a side beam IV (25) positioned below the right side are obtained; each beam is adhered with a semiconductor strain gauge; the main beam (21) measures normal force and pitching moment, the side beam I (22) and the side beam III (24) measure lateral force and yawing moment, and the side beam II (23) and the side beam IV (25) measure rolling moment;
the axial force measuring element (3) is of a T-shaped beam structure, the semiconductor strain gauges are adhered to two sides of a vertical beam of the T-shaped beam (31) and used for measuring the axial force, supporting beams (32) are symmetrically arranged on the front side and the rear side of the T-shaped beam (31), the axial force measuring element (3) is divided into two parts by a chute (33) penetrating in the inclined direction, and the two parts are connected into a whole through the T-shaped beam (31) and the supporting beams (32); the axial force measuring element (3) is also provided with a lead groove I (34) for leading out a signal wire of the first combined measuring element (2);
the second combined measuring element (4) is of a five-piece beam structure which is symmetrical to the first combined measuring element (2), and each beam is adhered with a semiconductor strain gauge for measuring normal force, pitching moment, lateral force, yawing moment and rolling moment;
the accelerometer mounting section (5) is a column section, and accelerometer mounting grooves (51) are symmetrically arranged on the column section and used for mounting an accelerometer; the accelerometer mounting section (5) is provided with a lead groove II (52) for leading out signal wires of the first combined measuring element (2), the axial force measuring element (3) and the second combined measuring element (4); the accelerometer mounting section (5) is also provided with a wire inlet hole (53) communicated with a threading pipeline of the balance axis;
the balance support rod (6) is a conical section which expands from front to back and is used for extending the balance;
the support section (7) be the column section, the upper portion cutting of column section has horizontal plane I, horizontal plane I is gesture measuring surface (73), the lower part cutting of column section has horizontal plane II, processing between horizontal plane I and the horizontal plane II has perpendicular through-hole (72), processing has perpendicular pin hole (71) on the horizontal plane II, the tail end of column section has wire hole (74) with the threading pipeline intercommunication of balance axis.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010179479.5A CN111238765A (en) | 2020-03-16 | 2020-03-16 | Semiconductor strain balance applied to pulse wind tunnel |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112461494A (en) * | 2020-11-09 | 2021-03-09 | 中国空气动力研究与发展中心 | Pulse combustion wind tunnel model support-balance integrated force measuring device |
| CN112629811A (en) * | 2020-12-30 | 2021-04-09 | 中国航天空气动力技术研究院 | Multifunctional wind tunnel balance strain gauge tabletting device |
| CN113029509A (en) * | 2021-03-26 | 2021-06-25 | 中国空气动力研究与发展中心超高速空气动力研究所 | Shock tunnel thrust measurement test device |
| CN113267320A (en) * | 2021-07-19 | 2021-08-17 | 中国空气动力研究与发展中心超高速空气动力研究所 | Water cooling device for rod type balance of high-temperature wind tunnel |
| CN118032265A (en) * | 2024-04-11 | 2024-05-14 | 中国空气动力研究与发展中心高速空气动力研究所 | Balance strain heat engine decoupling method for temperature gradient field |
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| CN211347315U (en) * | 2020-03-16 | 2020-08-25 | 中国空气动力研究与发展中心超高速空气动力研究所 | Semiconductor strain balance applied to pulse wind tunnel |
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2020
- 2020-03-16 CN CN202010179479.5A patent/CN111238765A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN211347315U (en) * | 2020-03-16 | 2020-08-25 | 中国空气动力研究与发展中心超高速空气动力研究所 | Semiconductor strain balance applied to pulse wind tunnel |
Non-Patent Citations (1)
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| 黄军等: ""脉冲风洞中半导体应变天平应用关键技术研究"", 《中国力学大会-2019》, 31 December 2019 (2019-12-31), pages 1 - 9 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112461494A (en) * | 2020-11-09 | 2021-03-09 | 中国空气动力研究与发展中心 | Pulse combustion wind tunnel model support-balance integrated force measuring device |
| CN112629811A (en) * | 2020-12-30 | 2021-04-09 | 中国航天空气动力技术研究院 | Multifunctional wind tunnel balance strain gauge tabletting device |
| CN113029509A (en) * | 2021-03-26 | 2021-06-25 | 中国空气动力研究与发展中心超高速空气动力研究所 | Shock tunnel thrust measurement test device |
| CN113029509B (en) * | 2021-03-26 | 2022-04-12 | 中国空气动力研究与发展中心超高速空气动力研究所 | Shock tunnel thrust measurement test device |
| CN113267320A (en) * | 2021-07-19 | 2021-08-17 | 中国空气动力研究与发展中心超高速空气动力研究所 | Water cooling device for rod type balance of high-temperature wind tunnel |
| CN118032265A (en) * | 2024-04-11 | 2024-05-14 | 中国空气动力研究与发展中心高速空气动力研究所 | Balance strain heat engine decoupling method for temperature gradient field |
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