CN111175726A - Calibration device and method - Google Patents
Calibration device and method Download PDFInfo
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- CN111175726A CN111175726A CN201911340935.3A CN201911340935A CN111175726A CN 111175726 A CN111175726 A CN 111175726A CN 201911340935 A CN201911340935 A CN 201911340935A CN 111175726 A CN111175726 A CN 111175726A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
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Abstract
The invention provides a calibration device and a calibration method, wherein the device comprises the following steps: the time delay module comprises a semiconductor refrigerator, and the semiconductor refrigerator is used for controlling the temperature of the time delay module; the delay module is used for presetting delay time to delay a modulation clock signal of the ToF camera; the control and processing module is used for acquiring a second measured distance value of the calibration board preset at the first actual distance value according to the delayed modulation signal and acquiring a third actual distance value of the calibration board based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining a change relation of the real delay time along with the change of the preset delay time. The accuracy of the delay signal generated by the delay module is prevented from being influenced by the temperature of the device, and the calibration accuracy of the delay module is improved, so that the calibration accuracy of the ToF camera is improved.
Description
Technical Field
The invention relates to the technical field of calibration, in particular to a calibration device and method.
Background
The Time of Flight (ToF) technique is to calculate the distance of a target object by calculating the Time difference or phase difference of a light beam from being emitted to being received reflected by the target object to obtain depth data information of the target object. Depth cameras based on the ToF technology are gradually mature and have been applied in the fields of three-dimensional measurement, gesture control, robot navigation, security, monitoring and the like.
In the current prior art, calibration methods based on the ToF camera are a distance change calibration method, a cattre calibration method, and a delay circuit calibration method, respectively. The distance change calibration method has the main defects of complex equipment operation, large consumption, long time consumption and no contribution to actual calibration production; the main defects of the cattree calibration method are that differences exist among devices, and a chassis used for calibration has the problem that multipath effect and the like are difficult to solve; the main disadvantage of the calibration method of the delay circuit is that the accuracy of the delay circuit is affected by the temperature of the device, and if the temperature of the device is unstable, the generated delay signal is inaccurate, so that the calibration method of the ToF camera is meaningless.
Disclosure of Invention
The invention provides a calibration device and a calibration method for solving the existing problems.
In order to solve the above problems, the technical solution adopted by the present invention is as follows:
a calibration device, comprising: the time delay module comprises a semiconductor refrigerator, and the semiconductor refrigerator is used for controlling the temperature of the time delay module; the delay module is used for presetting delay time to delay a modulation clock signal of the ToF camera; the control and processing module is used for acquiring a second measured distance value of the calibration board preset at the first actual distance value according to the delayed modulation signal and acquiring a third actual distance value of the calibration board based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining a change relation of the real delay time along with the change of the preset delay time.
In an embodiment of the present invention, the control and processing module controls the preset delay time of the delay module to be 0ns, and monitors the distance value of the calibration board measured by the ToF camera in real time until the distance value is equal to the second measured distance value, and stops moving to obtain a third actual distance value of the calibration board. And the control and processing module controls the preset delay time of the delay module to be 0ns, the calibration plate is moved to monitor the distance value of the calibration plate measured by the ToF camera in real time, and the movement is stopped until the distance value is equal to the second measured distance value, so that a third actual distance value of the calibration plate is obtained.
In yet another embodiment of the present invention, the real delay time is calculated according to the following formula:
where D3 represents the third actual distance value, D1 represents the first actual distance value, and c represents the speed of light.
The invention also provides a calibration method, which comprises the following steps: s1: the control delay module is used for presetting delay time to delay a modulation clock signal of the ToF camera, and comprises a semiconductor refrigerator which is used for controlling the temperature of the delay module; s2: acquiring a second measured distance value of a calibration plate preset at a first actual distance value according to the delayed modulation signal, and acquiring a third actual distance value of the calibration plate based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining a change relation of the real delay time along with the change of the preset delay time.
In one embodiment of the present invention, controlling the delay module to delay the modulation clock signal of the ToF camera includes: and controlling the delay module to transmit the delayed modulation signal to the ToF camera. Controlling the delay module to delay the modulation clock signal of the ToF camera further comprises: and controlling the ToF camera to receive the delayed modulation signal and acquire a second measurement distance value of the calibration board. The method for acquiring the third actual distance value of the calibration plate comprises the following steps: and controlling the preset delay time of the delay module to be 0ns, monitoring the distance value of the calibration plate measured by the moving ToF camera in real time until the distance value is equal to the second measured distance value, and stopping moving to obtain a third actual distance value of the calibration plate. And controlling the preset delay time of the delay module to be 0ns, moving the calibration plate to monitor the distance value of the calibration plate measured by the ToF camera in real time, and stopping moving until the distance value is equal to the second measured distance value to obtain a third actual distance value of the calibration plate.
In yet another embodiment of the present invention, the real delay time is calculated according to the following formula:
where D3 represents the third actual distance value, D1 represents the first actual distance value, and c represents the speed of light.
The invention has the beneficial effects that: the calibration device and the calibration method have the advantages that the temperature of the delay module is controlled by arranging the delay module and the semiconductor refrigerator, the accuracy of the delay module for generating the delay signal is prevented from being influenced by the temperature of a device, the calibration accuracy of the delay module is improved, and therefore the calibration accuracy of the ToF camera is improved.
Furthermore, the device of the invention has simple structure and simple and easy method, and realizes the calibration of the delay module by obtaining the second measured distance value of the calibration board preset at the first actual distance value and obtaining the third actual distance value of the calibration board based on the second measured distance value so as to obtain the real delay time and the change relation of the real delay time along with the change of the preset delay time.
Drawings
Fig. 1 is a schematic structural diagram of a calibration device in an embodiment of the present invention.
Fig. 2 is a schematic diagram of a calibration method in an embodiment of the present invention.
The system comprises a calibration device 10, a delay module 11, a ToF camera 12 and a control and processing module 13.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the embodiments of the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and the embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element. In addition, the connection may be for either a fixing function or a circuit connection function.
It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship indicated in the drawings for convenience in describing the embodiments of the present invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be in any way limiting of the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, "a plurality" means two or more unless specifically limited otherwise.
Fig. 1 is a schematic structural diagram of a calibration apparatus 10 according to an embodiment of the present invention. The calibration device 10 comprises a delay module 11 and a control and processing module 13. The delay module 11 is configured to preset a delay time to delay a modulation clock signal of the ToF camera 12; the control and processing module 13 is configured to obtain a second measured distance value of the calibration board preset at the first actual distance value according to the delayed modulation signal, and obtain a third actual distance value of the calibration board based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining the change relation of the real delay time along with the change of the preset delay time.
In one embodiment, the delay module 11 further comprises a semiconductor cooler (TEC), which can be used to control the temperature of the delay module 11 so as to prevent the accuracy of the delay signal generated by the delay module from being affected by the device temperature.
In one embodiment, the control and processing module 13 controls the delay module 11 to preset a delay time to delay the modulation clock signal of the ToF camera 12; transmitting the delayed modulation signal to the ToF camera 12, and measuring a calibration plate preset at the first actual distance value after the ToF camera 12 receives the modulation signal to obtain a second measured distance value; the control and processing module 13 controls the delay module 11 to preset a delay time of 0ns, and monitors the distance value of the moving ToF camera 12 to measure the calibration plate in real time until the distance value is equal to the second measurement distance value. At this time, a third actual distance value from the ToF camera 12 to the calibration board is measured and transmitted to the control and processing module 13. The control and processing module 13 may calculate the real delay time of the delay module 11 according to the following formula:
where D3 represents the third actual distance value, D1 represents the first actual distance value, and c represents the speed of light.
It will be appreciated that the ToF camera 12, which is monitoring in real time, measures the distance value of the calibration plate, and stops moving until the distance value equals the second measured distance value; it is also possible to move the calibration plate and monitor the distance value of the calibration plate by the ToF camera 12 in real time, and stop the movement until the distance value is equal to the second measured distance value.
In one embodiment, assuming that the delay module 11 presets a delay time of 1ns, the ToF camera 12 is placed on the calibration board 400m (denoted as D1), the control and processing module 13 controls the delay module 11 to preset a delay time of 1ns, transmits the delayed modulation signal to the ToF camera 12, and controls the ToF camera 12 to measure a distance (denoted as D2) of the calibration board at this time. The control and processing module 13 controls the delay module 11 to preset a delay time of 0ns, monitors the distance value of the moving ToF camera to measure the calibration board in real time, stops moving until the measured value is equal to D2, measures the actual distance (denoted as D3) between the ToF camera and the calibration board at the moment, and the control and processing module 13 can calculate the real delay time t1 of the delay module 11 according to the formula (1).
Similarly, assuming that the delay module 11 presets a delay time of 2ns, the ToF camera 12 is placed on the calibration board 400m (denoted as D1), the control and processing module 13 controls the delay module 11 to preset a delay time of 2ns, transmits the delayed modulation signal to the ToF camera 12, and controls the ToF camera 12 to measure the distance (denoted as D2) of the calibration board at this time. The control and processing module 13 controls the delay module 11 to preset a delay time of 0ns, and monitors the distance value of the ToF camera 12 in real time to measure the calibration board until the measured value is equal to D2, and then stops moving, and measures the actual distance (marked as D3) between the ToF camera 12 and the calibration board. The true delay time t2 can be calculated according to equation (1).
It can be understood that different real delay times can be obtained according to different preset delay times, so that a series of relationships between the real delay times and the preset delay times can be obtained, that is, each real delay time calibration table corresponding to different preset delay times can be established.
It can be understood that the control and processing module 13 can calibrate the delay module 11 according to the calibration table of each real delay time corresponding to different preset delay times, and can be further used for calibrating the ToF camera.
Fig. 2 is a flowchart of a calibration method in an embodiment of the present application, including the following steps:
s1: the control delay module is used for presetting delay time to delay a modulation clock signal of the ToF camera, and comprises a semiconductor refrigerator which is used for controlling the temperature of the delay module;
specifically, the delay module 11 includes a TEC, which is used to control the temperature of the delay module 11 so as to prevent the accuracy of the delay signal generated by the delay module from being affected by the temperature of the device.
S2: acquiring a second measured distance value of a calibration plate preset at a first actual distance value according to the delayed modulation signal, and acquiring a third actual distance value of the calibration plate based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining a change relation of the real delay time along with the change of the preset delay time.
Specifically, the control and processing module 13 controls the ToF camera 12 to receive the delayed modulation signal to obtain a second measured distance value of the calibration board; and controlling the delay module 11 to preset the delay time of 0ns, monitoring the distance value of the moving ToF camera 12 to measure the calibration board in real time until the measured value is equal to the second measured distance value, measuring the actual distance between the ToF camera 12 and the calibration board to obtain a third actual distance value, and obtaining the real delay time according to the first actual distance value and the third actual distance value to obtain the change relation of the real delay time along with the change of the preset delay time.
The principle of the calibration method is the same as that of the calibration device, and is not described herein again.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several equivalent substitutions or obvious modifications can be made without departing from the spirit of the invention, and all the properties or uses are considered to be within the scope of the invention.
Claims (10)
1. A calibration device, comprising:
the time delay module comprises a semiconductor refrigerator, and the semiconductor refrigerator is used for controlling the temperature of the time delay module; the delay module is used for presetting delay time to delay a modulation clock signal of the ToF camera;
the control and processing module is used for acquiring a second measured distance value of the calibration board preset at the first actual distance value according to the delayed modulation signal and acquiring a third actual distance value of the calibration board based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining a change relation of the real delay time along with the change of the preset delay time.
2. The calibration apparatus according to claim 1, wherein the control and processing module controls the preset delay time of the delay module to be 0ns, and the ToF camera monitoring the movement in real time measures the distance value of the calibration board until the distance value equals to the second measured distance value, and stops moving to obtain a third actual distance value of the calibration board.
3. The calibration device according to claim 1, wherein the control and processing module controls the preset delay time of the delay module to be 0ns, and moves the calibration board to monitor the distance value of the calibration board measured by the ToF camera in real time, and stops moving until the distance value is equal to the second measured distance value, so as to obtain a third actual distance value of the calibration board.
4. The calibration arrangement as set forth in claim 1, wherein the true delay time is calculated according to the following formula:
where D3 represents the third actual distance value, D1 represents the first actual distance value, and c represents the speed of light.
5. A calibration method is characterized by comprising the following steps:
s1: the control delay module is used for presetting delay time to delay a modulation clock signal of the ToF camera, and comprises a semiconductor refrigerator which is used for controlling the temperature of the delay module;
s2: acquiring a second measured distance value of a calibration plate preset at a first actual distance value according to the delayed modulation signal, and acquiring a third actual distance value of the calibration plate based on the second measured distance value; and acquiring real delay time according to the first actual distance value and the third actual distance value, and obtaining a change relation of the real delay time along with the change of the preset delay time.
6. The calibration method of claim 5, wherein controlling the delay module to delay the modulation clock signal of the ToF camera comprises:
and controlling the delay module to transmit the delayed modulation signal to the ToF camera.
7. The calibration method of claim 6, wherein controlling the delay module to delay the modulation clock signal of the ToF camera further comprises:
and controlling the ToF camera to receive the delayed modulation signal and acquire a second measurement distance value of the calibration board.
8. The calibration method according to claim 5, wherein the method of obtaining the third actual distance value of the calibration plate comprises:
and controlling the preset delay time of the delay module to be 0ns, monitoring the distance value of the calibration plate measured by the moving ToF camera in real time until the distance value is equal to the second measured distance value, and stopping moving to obtain a third actual distance value of the calibration plate.
9. The calibration method according to claim 5, wherein the method of obtaining the third actual distance value of the calibration plate comprises:
and controlling the preset delay time of the delay module to be 0ns, moving the calibration plate to monitor the distance value of the calibration plate measured by the ToF camera in real time, and stopping moving until the distance value is equal to the second measured distance value to obtain a third actual distance value of the calibration plate.
10. A calibration method according to claim 5, wherein the true delay time is calculated according to the following formula:
where D3 represents the third actual distance value, D1 represents the first actual distance value, and c represents the speed of light.
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| EP3508874A1 (en) * | 2018-01-03 | 2019-07-10 | Espros Photonics AG | Calibrating device for a tof camera device |
| CN110187328A (en) * | 2019-06-05 | 2019-08-30 | 歌尔股份有限公司 | Calibration method, device, equipment and the computer readable storage medium of depth mould group |
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2019
- 2019-12-23 CN CN201911340935.3A patent/CN111175726B/en active Active
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| CN107820572A (en) * | 2015-06-15 | 2018-03-20 | 微软技术许可有限责任公司 | Flight time（TOF）System calibration |
| CN107450062A (en) * | 2017-07-07 | 2017-12-08 | 杭州申昊科技股份有限公司 | The method, apparatus and system of antenna delay calibration |
| EP3508874A1 (en) * | 2018-01-03 | 2019-07-10 | Espros Photonics AG | Calibrating device for a tof camera device |
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