CN111143396A

CN111143396A - High-voltage test data management method and system

Info

Publication number: CN111143396A
Application number: CN201911225271.6A
Authority: CN
Inventors: 倪欢
Original assignee: Shenzhen Zhiwei Intelligent Software Development Co Ltd
Current assignee: Shenzhen Zhiwei Intelligent Software Development Co Ltd
Priority date: 2019-12-04
Filing date: 2019-12-04
Publication date: 2020-05-12

Abstract

The present disclosure provides a high voltage test data management method and related products, the method comprising the steps of: the electronic equipment calls a management program corresponding to the high-voltage test source data, and generates a management subprogram corresponding to the subtest data of the source data in the editing process of the source data; the electronic equipment detects the state information of the subtest data through the management subprogram; and the electronic equipment manages all the subdata of the source data according to the source data and the state information of all the subdetection data of the source data. The technical scheme provided by the application has the advantage of improving the data accuracy.

Description

High-voltage test data management method and system

Technical Field

The invention relates to the technical field of information, in particular to a high-voltage test data management method and system.

Background

Steel nets (stents), namely SMT templates (SMT Stencil), are special SMT moulds. Its main function is to aid the deposition of solder paste; the goal is to transfer the exact amount of solder paste to the exact location on the empty PCB.

The existing high-voltage test data management cannot verify the authenticity of the data, so that the high-voltage test data is inaccurate.

Disclosure of Invention

The embodiment of the invention provides a high-voltage test data management method and a related product, and has the advantage of improving the accuracy of high-voltage test data.

In a first aspect, an embodiment of the present invention provides a method for managing high-voltage test data, where the method includes the following steps:

the electronic equipment calls a management program corresponding to the high-voltage test source data, and generates a management subprogram corresponding to the subtest data of the source data in the editing process of the source data;

the electronic equipment detects the state information of the subtest data through the management subprogram;

and the electronic equipment manages all the subdata of the source data according to the source data and the state information of all the subdetection data of the source data.

In a second aspect, there is provided a high voltage test data management system, the system comprising: a processor and an acquisition unit, wherein the processor is used for processing the data,

the acquisition unit is used for acquiring high-voltage test source data;

the processor is used for calling a management program corresponding to the high-voltage test source data and generating a management subprogram corresponding to the subtest data of the source data in the editing process of the source data; detecting state information of the subtest data through the management subprogram; and managing all subdata of the source data according to the source data and the state information of all the subdetection data of the source data.

In a third aspect, a computer-readable storage medium is provided, which stores a program for electronic data exchange, wherein the program causes a server to execute the method provided in the first aspect.

The embodiment of the invention has the following beneficial effects:

the technical scheme provided by the application calls the management program corresponding to the high-voltage test source data, and generates the management subprogram corresponding to the subtest data of the source data in the editing process of the source data; detecting state information of the subtest data through the management subprogram; and managing all subdata of the source data according to the source data and the state information of all the subdetection data of the source data. The management method can enable the data of the high-voltage test source to be more accurate, and improves the accuracy of data storage.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of an electronic device.

FIG. 2 is a flow chart of a high voltage test data management method.

Fig. 3 is a schematic structural diagram of a high voltage test data management system according to an embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The terms "first," "second," "third," and "fourth," etc. in the description and claims of the invention and in the accompanying drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, result, or characteristic described in connection with the embodiment can be included in at least one embodiment of the invention. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

The electronic device related to the embodiments of the present application may include various handheld devices, vehicle-mounted devices, wearable devices (smart watches, smart bracelets, wireless headsets, augmented reality/virtual reality devices, smart glasses), computing devices or other processing devices connected to wireless modems, and various forms of User Equipment (UE), Mobile Stations (MS), server devices (terminal device), and the like, which have wireless communication functions. For convenience of description, the above-mentioned devices are collectively referred to as electronic devices.

The following describes embodiments of the present application in detail.

Referring to fig. 1, fig. 1 is a schematic structural diagram of an electronic device disclosed in an embodiment of the present application, where the electronic device 100 includes a storage and processing circuit 110, and a sensor 170 connected to the storage and processing circuit 110, where:

the electronic device 100 may include control circuitry, which may include storage and processing circuitry 110. The storage and processing circuitry 110 may be a memory, such as a hard drive memory, a non-volatile memory (e.g., flash memory or other electronically programmable read-only memory used to form a solid state drive, etc.), a volatile memory (e.g., static or dynamic random access memory, etc.), etc., and the embodiments of the present application are not limited thereto. Processing circuitry in storage and processing circuitry 110 may be used to control the operation of electronic device 100. The processing circuitry may be implemented based on one or more microprocessors, microcontrollers, digital signal processors, baseband processors, power management units, audio codec chips, application specific integrated circuits, display driver integrated circuits, and the like.

The storage and processing circuitry 110 may be used to run software in the electronic device 100, such as an Internet browsing application, a Voice Over Internet Protocol (VOIP) telephone call application, an email application, a media playing application, operating system functions, and so forth. Such software may be used to perform control operations such as, for example, camera-based image capture, ambient light measurement based on an ambient light sensor, proximity sensor measurement based on a proximity sensor, information display functionality based on status indicators such as status indicator lights of light emitting diodes, touch event detection based on a touch sensor, functionality associated with displaying information on multiple (e.g., layered) display screens, operations associated with performing wireless communication functionality, operations associated with collecting and generating audio signals, control operations associated with collecting and processing button press event data, and other functions in the electronic device 100, to name a few.

The electronic device 100 may include input-output circuitry 150. The input-output circuit 150 may be used to enable the electronic device 100 to input and output data, i.e., to allow the electronic device 100 to receive data from an external device and also to allow the electronic device 100 to output data from the electronic device 100 to the external device. The input-output circuit 150 may further include a sensor 170. Sensor 170 may include the ultrasonic fingerprint identification module, may also include ambient light sensor, proximity sensor based on light and electric capacity, touch sensor (for example, based on light touch sensor and/or capacitanc touch sensor, wherein, touch sensor may be a part of touch display screen, also can regard as a touch sensor structure independent utility), acceleration sensor, and other sensors etc., the ultrasonic fingerprint identification module can be integrated in the screen below, or, the ultrasonic fingerprint identification module can set up in electronic equipment's side or back, do not do the restriction here, this ultrasonic fingerprint identification module can be used to gather the fingerprint image.

The sensor 170 may include an Infrared (IR) camera or an RGB camera, and when the IR camera takes a picture, the pupil reflects infrared light, so the IR camera takes a pupil image more accurately than the RGB camera; the RGB camera needs to perform more subsequent image processing, the calculation precision and accuracy are higher than those of the IR camera, the universality is better than that of the IR camera, and the calculation amount is large.

Input-output circuit 150 may also include one or more display screens, such as display screen 130. The display 130 may include one or a combination of liquid crystal display, organic light emitting diode display, electronic ink display, plasma display, display using other display technologies. The display screen 130 may include an array of touch sensors (i.e., the display screen 130 may be a touch display screen). The touch sensor may be a capacitive touch sensor formed by a transparent touch sensor electrode (e.g., an Indium Tin Oxide (ITO) electrode) array, or may be a touch sensor formed using other touch technologies, such as acoustic wave touch, pressure sensitive touch, resistive touch, optical touch, and the like, and the embodiments of the present application are not limited thereto.

The electronic device 100 may also include an audio component 140. The audio component 140 may be used to provide audio input and output functionality for the electronic device 100. The audio components 140 in the electronic device 100 may include a speaker, a microphone, a buzzer, a tone generator, and other components for generating and detecting sound.

The communication circuit 120 may be used to provide the electronic device 100 with the capability to communicate with external devices. The communication circuit 120 may include analog and digital input-output interface circuits, and wireless communication circuits based on radio frequency signals and/or optical signals. The wireless communication circuitry in communication circuitry 120 may include radio-frequency transceiver circuitry, power amplifier circuitry, low noise amplifiers, switches, filters, and antennas. For example, the wireless Communication circuitry in the Communication circuitry 120 may include circuitry to support Near Field Communication (NFC) by transmitting and receiving near field coupled electromagnetic signals. For example, the communication circuit 120 may include a near field communication antenna and a near field communication transceiver. The communications circuitry 120 may also include a cellular telephone transceiver and antenna, a wireless local area network transceiver circuitry and antenna, and so forth.

The electronic device 100 may further include a battery, power management circuitry, and other input-output units 160. The input-output unit 160 may include buttons, joysticks, click wheels, scroll wheels, touch pads, keypads, keyboards, cameras, light emitting diodes and other status indicators, and the like.

A user may input commands through input-output circuitry 150 to control the operation of electronic device 100, and may use output data of input-output circuitry 150 to enable receipt of status information and other outputs from electronic device 100.

High voltage testing is the most stringent, effective and straightforward method of identifying the dielectric strength of electrical equipment. The method can detect the concentrated defects with high risk, has a decisive role in judging whether the power equipment can continuously participate in operation, and is an important means for ensuring the insulation level of the equipment and avoiding insulation accidents.

The monitoring function: the high-voltage low-voltage current zero-position indication power supply indicates work and indicates timing and protection functions: overcurrent protection, zero start protection, audible and visual speech alarm reminding

Adopts a novel time relay, has wider timing range (1S-99H)

The novel current relay is adopted, so that the method is more accurate and reliable, and the personal and equipment safety is ensured

The high-voltage test transformer adopts novel insulation, is moisture-proof and impact-resistant, and has high insulation degree

Reasonable structure, small volume and light weight

MySQL is an open source relational database management system (RDBMS) that uses the most common database management language, Structured Query Language (SQL), for database management.

MySQL is open source code so anyone can download it with permission from General Public License and modify it according to personalized needs.

MySQL is of great interest because of its speed, reliability and adaptability. Most people believe MySQL is the best choice to manage content without requiring transactional processing.

Since MySQL is open source code, anyone can download it and modify it according to personalized needs under the permission of General Public License. MySQL is of great interest because of its speed, reliability and adaptability. Most people believe MySQL is the best choice to manage content without requiring transactional processing.

MySQL, the name, origin, is not well defined. One relatively influential statement is that the basic guidelines and a large number of libraries and tools have been with the prefix "My" for more than 10 years, and in any event, the daughter of MontyWidenous, one of the MySQLAB founders, is also called My. Which of these two gives MySQL is still a MySQL name so far, and is unknown, including developers.

MySQL's dolphin logo is named "sakila" and is selected by the originator of MySQLAB from a large list of names that users propose in the "Dolphin naming" contest. The winning name is provided by the open source software developer Ambrose tweeze from african whisland. According to Ambrose, Sakila comes from a Sweskilan dialect called SiSwati, also the name of a town of Arusha of tanzania in the neighborhood of Ambrose's hometown Wugan.

MySQL, while not necessarily powerful, is known to many people because of its open source, widespread dissemination. Its history is also rich in past curiosity.

Database optimization

Selecting InNODB as a storage engine

The database of large-scale products has high requirements on reliability and concurrency, and InnodB is a better choice compared with MyISAM as a default MySQL storage engine.

Optimizing database structures

The schema, tables and fields of the database are organized to reduce the overhead of I/O, related items are kept together and planned ahead of time so that as the amount of data grows, performance can be maintained at a higher level.

The design data sheet should minimize the space it occupies and the primary keys of the sheet should be as short as possible. For the InNODB table, the column where the primary key is located is reproducible in each secondary index entry, so a short primary key can save a lot of space if there are many secondary indexes.

Only the index that you need to improve query performance is created. The index facilitates retrieval, but increases the execution time of the insert and update operations.

ChangeBuffering property of InoDB

InNODB provides a configuration for changebuffering that reduces disk I/O required to maintain auxiliary indexes. Large databases may encounter a large number of table operations and a large number of I/os to ensure that the secondary index remains up to date. When the relevant page is not in the buffer pool, the InNODB changebuffer will change the cache to auxiliary index entry, thereby avoiding time-consuming I/O operations due to the inability to read the page from disk immediately. When a page is loaded into the buffer pool, the buffered changes will be merged and the updated page will then be flushed to disk. This improves performance and is applicable to MySQL5.5 and beyond.

InnodB page compression

InnodB supports page-level compression of tables. When a page of data is written, it is compressed by a particular compression algorithm. The compressed data will be written into the disk, and its punching mechanism will release the empty block at the end of the page. If compression fails, the data is written as is. Both the table and the index are compressed, since the index is usually a significant portion of the total size of the database, compression can significantly save memory, I/O or processing time, thus achieving the goal of improving performance and scalability. It may also reduce the amount of data transferred between memory and disk. MySQL5.1 and beyond supports this function.

Note that page compression does not support tables in a shared tablespace. The shared tablespaces include a system tablespace, a temporary tablespace, and a regular tablespace.

Using batch data import

The import of bulk data using the sorted data sources on the primary key may speed up the process of data insertion. Otherwise, rows may need to be inserted between other rows to maintain ordering, which may cause disk I/O to go high, which in turn affects performance, increasing page splits. Closing the auto-commit mode is also advantageous because it performs a log flush to disk for each insertion. Temporarily transferring unique keys and foreign key checks during bulk insertion can also significantly reduce disk I/O. For newly built tables, it is best to create foreign/unique key constraints after bulk import.

Once your data reaches a steady size, or a growing table is increased by tens or hundreds of megabytes, consideration should be given to reorganizing the table using the optimetric table statement and compacting wasted space. Fewer I/Os may be required to perform a full table scan on the reorganized table.

Optimizing InnodB disk I/O

Increasing the InNODB buffer pool size may allow queries to be accessed from the buffer pool instead of through disk I/O. The index of the flush buffer is adjusted to an optimal level by adjusting the system variable innodb flush method.

MySQL memory allocation

Before allocating enough memory for MySQL, please consider the memory requirements of different domains for MySQL. The key areas to consider are: concurrent connections-for a large number of concurrent connections, the ordering and temporary tables will require a large amount of memory. At the time of writing this text, 16GB to 32GB of RAM are sufficient for processing a 3000+ concurrently connected database.

Memory fragmentation can consume about 10% or more of memory. Caches and buffers such as Innodb _ buffer _ pool _ size, key _ buffer _ size, query _ cache _ size, etc. consume approximately 80% of the allocated memory.

Referring to fig. 2, fig. 2 provides a high voltage test data management method, which is shown in fig. 2 and is executed by the electronic device shown in fig. 1, and which includes the following steps:

step S201, the electronic equipment calls a management program corresponding to high-voltage test source data, and generates a management subprogram corresponding to the subtest data of the source data in the editing process of the source data;

step S202, the electronic equipment detects the state information of the subtest data through the management subprogram;

step S203, the electronic device manages all subdata of the source data according to the source data and the state information of all the subdetection data of the source data.

The technical scheme provided by the application calls a management program corresponding to high-voltage test source data, and generates a management subprogram corresponding to the subtest data of the source data in the editing process of the source data; detecting state information of the subtest data through the management subprogram; and managing all subdata of the source data according to the source data and the state information of all the subdetection data of the source data. The management method can enable the data of the high-voltage test source to be more accurate, and improves the accuracy of data storage.

Optionally, the implementation method of step S203 may specifically include:

when the source data are detected to be edited, backing up the source data to network side equipment, when the source data are detected to be edited, acquiring the edited source data and all the subtest data of the source data, calling a management subprogram to detect all the subtest data, if the test is passed, deleting the backup, if the test is not passed, and calling the backed up source data by the network side equipment.

Optionally, the managing all the sub-data of the source data specifically includes:

all the subdata of the source data is reserved, deleted or edited.

Optionally, the implementation method of step S202 may specifically include:

the electronic equipment inputs all the sub-test data into the corresponding management subprogram to execute inverse detection to obtain original data, and if the original data is consistent with the original data, all the sub-test data are determined to pass the detection.

Optionally, the method may further include:

and backing up the source data and all the subdata through a block chain.

Referring to fig. 3, fig. 3 provides a high voltage test data management system, the system comprising: a processor and an acquisition unit, wherein the processor is used for processing the data,

the acquisition unit is used for acquiring high-voltage test source data;

Optionally, the processor is specifically configured to backup the source data to a network side device when it is detected that the source data is edited, obtain the edited source data and all sub-test data of the source data when it is detected that the source data is edited, call a management subroutine to detect all sub-test data, if the test is passed, delete the backup, if the test is not passed, and call the backup source data by the network side device.

Optionally, the processor is specifically configured to reserve, delete, or edit all the sub-data of the source data.

Optionally, the processor is specifically configured to input all the sub-test data into the corresponding management subprogram, perform inverse detection to obtain original data, and determine that all the sub-test data passes detection if the original data is the same as the original data.

Optionally, the processor is specifically configured to backup the source data and all the sub data through a block chain.

Embodiments of the present invention also provide a computer storage medium, wherein the computer storage medium stores a computer program for electronic data exchange, and the computer program enables a computer to execute part or all of the steps of any one of the high voltage test data management methods described in the above method embodiments.

Embodiments of the present invention also provide a computer program product comprising a non-transitory computer readable storage medium storing a computer program operable to cause a computer to perform some or all of the steps of any one of the high voltage test data management methods as recited in the above method embodiments.

It should be noted that, for simplicity of description, the above-mentioned method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present invention is not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the invention. Further, those skilled in the art should also appreciate that the embodiments described in the specification are exemplary embodiments and that the acts and modules illustrated are not necessarily required to practice the invention.

In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one type of division of logical functions, and there may be other divisions when actually implementing, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of some interfaces, devices or units, and may be an electric or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may be implemented in the form of a software program module.

The integrated units, if implemented in the form of software program modules and sold or used as stand-alone products, may be stored in a computer readable memory. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a memory and includes several instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned memory comprises: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.

Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by associated hardware instructed by a program, which may be stored in a computer-readable memory, which may include: flash Memory disks, Read-Only memories (ROMs), Random Access Memories (RAMs), magnetic or optical disks, and the like.

The above embodiments of the present invention are described in detail, and the principle and the implementation of the present invention are explained by applying specific embodiments, and the above description of the embodiments is only used to help understanding the method of the present invention and the core idea thereof; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.

Claims

1. A high voltage test data management method, characterized in that the method comprises the following steps:

2. The method of claim 1, wherein the step of the electronic device managing all sub-data of the source data according to the source data and the state information of all sub-test data of the source data specifically comprises:

3. The method of claim 1, wherein the managing all the sub-data of the source data specifically comprises:

all the subdata of the source data is reserved, deleted or edited.

4. The method according to claim 3, wherein the step of the electronic device detecting the status information of the subtest data through the management subprogram specifically comprises:

5. The method of claim 1, further comprising:

and backing up the source data and all the subdata through a block chain.

6. A high voltage test data management system, the system comprising: a processor, an acquisition unit, characterized in that,

the acquisition unit is used for acquiring high-voltage test source data;

7. The system of claim 6,

the processor is specifically configured to backup the source data to a network-side device when it is detected that the source data is edited, obtain the edited source data and all sub-test data of the source data when it is detected that the source data is edited, call a management subroutine to detect all sub-test data, delete the backup if the test is passed, and call the backup source data by the network device if the test is not passed.

8. The system of claim 6,

the processor is specifically configured to reserve, delete, or edit all the sub-data of the source data.

9. The system of claim 8,

the processor is specifically configured to input all the sub-test data into the corresponding management subprogram, perform inverse detection to obtain original data, and determine that all the sub-test data passes detection if the original data is the same as the original data.

10. The system of claim 6,

the processor is specifically configured to backup the source data and all the sub-data through a blockchain.