CN111130647B - Quick scanning test system and method for ICR module - Google Patents
Quick scanning test system and method for ICR module Download PDFInfo
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- CN111130647B CN111130647B CN201911236316.XA CN201911236316A CN111130647B CN 111130647 B CN111130647 B CN 111130647B CN 201911236316 A CN201911236316 A CN 201911236316A CN 111130647 B CN111130647 B CN 111130647B
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- 238000012545 processing Methods 0.000 claims description 9
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- 230000035559 beat frequency Effects 0.000 description 2
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/60—Receivers
- H04B10/61—Coherent receivers
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/29—Performance testing
Abstract
The invention relates to the field of ICR module testing, in particular to a rapid scanning test system and a rapid scanning test method for an ICR module. The fast scan test system includes: the laser comprises a first tunable laser and a second tunable laser, wherein the output end of the second tunable laser is connected with a polarization rotator; the system comprises a plurality of radio frequency power meters, a plurality of radio frequency power meters and a plurality of control modules, wherein each radio frequency power meter is connected with one output channel of an ICR module and used for reading the intensity of a radio frequency signal output by the output channel; the control unit acquires the acquired data of the radio frequency power meter and processes the acquired data to obtain a test result based on the ICR module. By designing the rapid scanning test system and method for the ICR module, the ICR module can be rapidly tested, the cost is low (the cost is 1/3 to 1/4 of LCA test), but the test result is consistent with or similar to the LCA test, the 3dB bandwidth difference is within 0.2GHz, and the production test requirement is met.
Description
Technical Field
The invention relates to the field of ICR module testing, in particular to a rapid scanning test system and a rapid scanning test method for an ICR module.
Background
With the rapid development of optical communication, high-definition televisions, videos, games, internet of things and the like are brought into our lives, and meanwhile, the demand of people on communication capacity is promoted to be higher and higher, the traditional modulation mode amplitude modulation and frequency modulation are affected by optical fiber dispersion, and are difficult to meet the long-distance large-capacity transmission of 100Gbps,200Gbps and even higher capacity, the coherent modulation mode becomes the main technical stream of long-distance signal transmission, and the ICR is used as a core device for coherent modulation receiving.
ICR is a device based on the principle of coherence of light: two beams of linear polarized light with the same polarization and the frequencies of f1 and fn (assuming that f1< fn) are respectively input to two ends of signal (fn) and Local (f1) of an ICR, a difference frequency signal is generated inside the ICR, the frequency difference of the difference frequency signal is a set value, the frequency difference of the difference frequency signal is fn-f1, f1 and fn, is respectively input to two ends of signal (fn) and Local of the ICR, a difference frequency signal is generated inside the ICR, the frequency of the difference frequency signal is fn-f1, and the signal is received by a photoelectric detector inside the ICR, transmitted to a transimpedance amplification output inside the ICR and output to a data processor or a test device.
When the performance of the ICR product is evaluated or tested, the transmission characteristics (S21) of 4 pairs of rf differential outputs of the ICR product need to be tested to determine whether the transmission characteristics satisfy the high-bandwidth transmission characteristics of high speed. The most direct way is to use the light wave Component Analyzer (LCA) equipment plus some other auxiliary equipment to realize the test, but the test equipment is particularly expensive, one LCA cost of 67GHz is about 50 ten thousand dollars, and the other auxiliary equipment is more than 60 million dollars. The system needs a strong technical background when in use, an engineer is required to calibrate or maintain the system, common staff is difficult to train for operation, and due to low automation degree, human intervention is required in many places, so that the testing time is long. Since LCA systems are expensive, backup costs are high, and in case of failure, it takes a long time to repair or re-purchase. Moreover, the test application field of the LCA is very narrow, only radio frequency characteristic related tests can be performed, and the optical performance of the ICR and other optical devices cannot be tested, such as IQ angle, responsivity, polarization extinction ratio of a chip, beat frequency efficiency of the chip, direct current common mode rejection ratio and other optical parameters of the ICR, and other equipment is also needed to be used for testing the optical performance of the ICR. In addition, because the LCA is difficult to be applied to other projects, for the large-scale testing of the ICR, the LCA scheme has great limitation, and cannot flexibly face the change of the capacity, and once the capacity demand is reduced, the LCA scheme becomes idle equipment, which causes great waste of resources.
With the large-scale application of relevant modulation, the global demand for the number of ICRs currently reaches over hundreds of thousands, so that a fully automated, low-cost test method with equipment compatible with other products of a company becomes an urgent need.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide a system and a method for rapid scan test of an ICR module, aiming at the above-mentioned defects in the prior art, so as to solve the problem of many defects existing in the LCA test of the ICR module.
The technical scheme adopted by the invention for solving the technical problems is as follows: a fast scan test system for ICR modules is provided, the fast scan test system comprising:
the output end of the second tunable laser is connected with a polarization rotator, the polarization rotator rotates the polarization state of the second tunable laser, and the polarization state of the second tunable laser is the same as that of the first tunable laser and is input into the ICR module;
the system comprises a plurality of radio frequency power meters, a plurality of radio frequency power meters and a plurality of control modules, wherein each radio frequency power meter is connected with one output channel of an ICR module and used for reading the intensity of a radio frequency signal output by the output channel;
and the control unit is respectively connected with the first tunable laser, the second tunable laser, the ICR module and the radio frequency power meter, controls the first tunable laser to generate an optical signal and controls the second tunable laser to scan, controls the ICR module to be in a normal working state, acquires the acquired data of the radio frequency power meter, and processes the acquired data to acquire a test result based on the ICR module.
Wherein, the preferred scheme is: the rapid scanning test system also comprises a fixed platform for placing or fixing the ICR module.
Wherein, the preferred scheme is: the rapid scanning test system also comprises an ICR control panel which is respectively connected with the control unit and the ICR module, wherein the control unit provides bias voltage/working voltage of the transpodal amplifier for the ICR module through the ICR control panel and controls the ICR module to be in a normal working state.
Wherein, the preferred scheme is: the ICR control board further comprises a reading module, and the control unit reads the current signal of the ICR module through the reading module.
Wherein, the preferred scheme is: the first tunable laser is, and the second tunable laser is.
Wherein, the preferred scheme is: the polarizer comprises 4 to 6 polaroids, and linear polarization light with different polarization states can be generated by controlling the polaroids through voltage.
Wherein, the preferred scheme is: the ICR module comprises eight output channels, the rapid scanning test system comprises eight radio frequency power meters, and the intensity of radio frequency signals output by the corresponding output channels is read.
The technical scheme adopted by the invention for solving the technical problems is as follows: a fast scan test method of an ICR module is provided, which is applied to the scan test system, and comprises the following steps:
setting the frequency and the optical power of the first tunable laser;
setting the frequency and the optical power of a second tunable laser, and enabling the frequency of the second tunable laser to be the same as the frequency of the first tunable laser;
setting bias voltage/working voltage of an ICR module;
adjusting the polarization state of the second tunable laser to be the same as that of the first tunable laser through a polarization rotator;
controlling a first tunable laser to generate laser and a second tunable laser to perform laser scanning, and controlling a radio frequency power meter to read the intensity of a radio frequency signal output by the output channel;
obtaining a frequency f1To fnAnd processing the data to obtain a test result based on the ICR module.
Preferably, the fast scan test method further includes the steps of: acquiring data of frequency, and processing to obtain frequency f1To fnAs a result of the ICR module based test.
Compared with the prior art, the ICR module rapid scanning test system and the method thereof can rapidly realize the test of the ICR module, have low cost (the cost is 1/3 to 1/4 of LCA test), but the test result is consistent with or similar to the LCA test, the 3dB bandwidth difference is within 0.2GHz, and the production test requirement is met; furthermore, the automatic degree is high, the requirement of testing personnel is low, the maintenance and the correction are simple, the testing efficiency is high, the large-scale application is adapted, and a large amount of testing cost is saved.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic diagram of a fast scan test system according to the present invention;
FIG. 2 is a schematic structural diagram of a fast scan test system based on a fixed platform according to the present invention;
FIG. 3 is a schematic structural diagram of a rapid scan test system based on an ICR control board according to the present invention;
FIG. 4 is a flow chart of a fast scan test method of the present invention;
fig. 5 is a schematic diagram of the S21 curve after correlation normalization in accordance with the present invention.
Detailed Description
The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings.
As shown in FIG. 1, the present invention provides a preferred embodiment of a fast scan test system for an ICR module 200.
The rapid scanning test system comprises a first tunable laser 110, a second tunable laser 120, a deflector 130, a radio frequency power meter 140 and a control unit 150, wherein the first tunable laser 110 is communicated with the input end of the ICR module 200 to be tested, the second tunable laser 120 is communicated with the input end of the ICR module 200 to be tested through the deflector 130, a plurality of radio frequency power meters 140 are respectively communicated with a plurality of output channels of the ICR module 200 to be tested, and the control unit 150 is respectively connected with the first tunable laser 110, the second tunable laser 120, the ICR module 200 and the radio frequency power meter 140.
Specifically, the output end of the second tunable laser 120 is connected to a polarization rotator 130, and then connected to the input end of the ICR module 200 to be tested, and the polarization rotator 130 rotates the polarization state of the second tunable laser 120, and the polarization state is the same as the polarization state of the first tunable laser 110; each of the rf power meters 140 is connected to an output channel of the ICR module 200, and reads the rf signal strength output by the output channel; the control unit 150 controls the first tunable laser 110 to generate an optical signal and controls the second tunable laser 120 to scan, controls the ICR module 200 to be in a normal working state, obtains the collected data of the rf power meter 140, and processes the data to obtain a test result based on the ICR module 200.
More specifically, a test flow is provided, and parameter setting is performed, including setting of the first tunable laser 110, the second tunable laser 120, the radio frequency power meter 140, and the ICR module 200 to be tested, or the ICR module 200 to be tested is placed on a test position, and a state of being communicated with the first tunable laser 110, the second tunable laser 120, and the radio frequency power meter 140 is formed; the ICR module 200 to be tested is controlled to work and enter a normal state, the first tunable laser 110 and the second tunable laser 120 are controlled to generate optical signals and emit the optical signals into the ICR module 200, meanwhile, the radio frequency power meter 140 collects and reads the radio frequency signal intensity of each output channel of the ICR module 200, the radio frequency signal intensity is collected by the control unit 150, and data processing is carried out through preset processing steps/processing algorithms to obtain a required test result.
The polarizer consists of 4 to 6 polaroids, and the polaroids are controlled by voltage to generate linear polarization light with different polarization states; the signals at the rear ends are fed back to the polarization rotator, and automatic polarization state control is realized through software to obtain the polarization state required by people. Wherein the polarization state refers to the polarization angle of the line light.
In a more optimal mode, rapid detection of the ICR module 200 can be realized only by replacing the ICR module 200 through initial setting of parameters and parameter adjustment or stage adjustment and correction in the midway, so that the method is suitable for large-scale application and saves a large amount of test cost.
In this embodiment, the method for acquiring the data collected by the rf power meter and processing the test result obtained based on the ICR module includes: by triggering the second tunable laser 120, the rf power meter; the second tunable laser 120 scans the wavelength, and the rf frequency meter synchronously reads the rf power at different wavelengths; the frequency difference between the first tunable laser 110 and the second tunable laser 120 is plotted on the abscissa and the reading of the rf power meter is plotted on the ordinate to obtain the required ICR transmission characteristic curve (S21 curve).
In this embodiment, the control unit 150 is preferably a testing computer, which implements setting and adjustment of data parameters, collects, processes and analyzes data, displays test results, and determines and records the test results of each ICR module 200. Preferably, a test software is provided, and the test and control are performed through the test software.
In this embodiment, the second tunable laser 120 can generate an optical signal with a narrow line width, and has a fast scanning function, for example, the scanning step is 1pm, and the polarization state of the optical signal is changed by the polarizer 130 to be the same as the polarization state of the optical signal generated by the first tunable laser 110, so as to satisfy the beat frequency condition. Specifically, the first tunable laser 110 is configured to output an optical signal with a specific frequency, and the second tunable laser 120 scans from the frequency set by the first tunable laser 110 to the desired frequency (in the column of scanning 50 GHz).
In this embodiment, the ICR module 200 includes eight output channels, and the fast scan test system includes eight rf power meters 140 and reads the rf signal strength output by the corresponding output channels. The rf power meter 140 is a high performance portable uhf power meter designed for the measurement of various complex waveforms.
As shown in FIG. 2, the present invention provides a preferred embodiment of a mounting platform 300 for a rapid scan test system.
The rapid scanning test system further includes a fixed platform 300 for placing or fixing the ICR module 200, that is, the fixed platform 300 is used as a fixed position for the first tunable laser 110, the second tunable laser 120, the deflectometer 130 and the rf power meter 140, and the input channel or the output channel is disposed at the relevant position of the fixed platform 300, so that the next round of test can be directly performed as long as the ICR module 200 of the fixed platform 300 is replaced.
The fixing platform 300 is preferably a clamping plate to fix the ICR module 200, so that the ICR module 200 can be conveniently disassembled and assembled, and the testing efficiency is improved.
As shown in FIG. 3, the present invention provides a preferred embodiment of an ICR control board 160 for a fast scan test system.
The fast scan test system further comprises an ICR control board 160 respectively connected to the control unit 150 and the ICR module 200, wherein the control unit 150 provides bias voltage/working voltage across the foot amplifier for the ICR module 200 through the ICR control board 160, and controls the ICR module 200 to be in a normal working state.
Specifically, the ICR module 200 is in a normal working state by supplying a bias voltage to the photodetector of the ICR module 200 and a working voltage of the transimpedance amplifier, so as to simulate a practical application environment and improve the accuracy of the test.
Further, the ICR control board 160 further includes a reading module, and the control unit 150 reads the current signal of the ICR module 200 through the reading module to realize monitoring.
As shown in FIG. 4, the present invention provides a preferred embodiment of a method for fast scan testing of an ICR module 200.
A fast scan test method of an ICR module 200 is applied to the scan test system, and comprises the following steps:
step S10, setting the frequency and optical power of the first tunable laser 110;
step S20, setting the frequency and optical power of the second tunable laser 120, and making the frequency of the second tunable laser 120 the same as the frequency of the first tunable laser 110;
step S30, setting the bias voltage/operating voltage of the ICR module 200;
step S40, adjusting the polarization state of the second tunable laser 120 by the polarizer 130, and making the polarization state of the second tunable laser 120 the same as the polarization state of the first tunable laser 110;
step S50, controlling the first tunable laser 110 to generate laser and the second tunable laser 120 to perform laser scanning, and controlling the rf power meter 140 to read the rf signal strength output by the output channel;
step S60, acquiring frequency f1To fnAnd processing the data to obtain test results based on the ICR module 200.
The steps S10 to S60 may be performed sequentially or some steps may be performed simultaneously, and generally, the parameters are set, then the power is applied, then the test is performed, and then the data is acquired for processing. Wherein f is1Set frequency, f, of only the first tunable laser 110nRefers to the termination frequency (in columns of 50 GHz) of the scan plane of the second tunable laser 120.
Further, and with reference to FIG. 5, the frequency f is obtained1To fnThe frequency-to-frequency continuous curve is processed to be used as a test result based on the ICR module 200, and the specific test result is a correlation-normalized S21 curve. Wherein, the frequency f1To fnShould be greater than 50 GHz.
And, fig. 5 also includes the S21 curve after correlation normalization of the LCA system, meeting production test requirements when the 3dB bandwidth difference is within 0.2 Ghz. Wherein, the curve A is the S21 curve after the relevance normalization obtained by the scheme test adopted by the invention, and the curve B is the S21 curve after the relevance normalization obtained by the LCA system test. The S21 curve is the rf transmission characteristic curve of the device, and is a key parameter for determining the transmission characteristic of the device.
In the invention, not only the cost is reduced, but also the testing time is improved by 2-3 times and more, and the efficiency is incomparable to the LCA system test.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the present invention, but rather as embodying the invention in a wide variety of equivalent variations and modifications within the scope of the appended claims.
Claims (7)
1. A rapid scan test system for an ICR module, the rapid scan test system comprising:
the output end of the second tunable laser is connected with a polarization rotator, the polarization rotator rotates the polarization state of the second tunable laser, and the polarization state of the second tunable laser is the same as that of the first tunable laser and is input into the ICR module;
the system comprises a plurality of radio frequency power meters, a plurality of radio frequency power meters and a plurality of control modules, wherein each radio frequency power meter is connected with one output channel of an ICR module and used for reading the intensity of a radio frequency signal output by the output channel;
the control unit is respectively connected with the first tunable laser, the second tunable laser, the ICR module and the radio frequency power meter, controls the first tunable laser to generate an optical signal and controls the second tunable laser to scan, controls the ICR module to be in a normal working state, acquires the acquired data of the radio frequency power meter, and processes the acquired data to acquire a test result based on the ICR module;
the polarizer comprises 4 to 6 polarizers, the polarizers can be controlled through voltage to generate linear polarization light in different polarization states, the first tunable laser is used for fixedly outputting optical signals with specific frequency, the second tunable laser can generate optical signals with narrow line width and has a quick scanning function, and the control unit controls the first tunable laser to generate optical signals with specific frequency and controls the second tunable laser to start scanning from the specific frequency generated by the first tunable laser and scan to a target frequency.
2. The fast scan test system of claim 1, wherein: the rapid scanning test system also comprises a fixed platform for placing or fixing the ICR module.
3. The fast scan test system of claim 1, wherein: the rapid scanning test system also comprises an ICR control panel which is respectively connected with the control unit and the ICR module, wherein the control unit provides bias voltage/working voltage of the transpodal amplifier for the ICR module through the ICR control panel and controls the ICR module to be in a normal working state.
4. The fast scan test system of claim 3, wherein: the ICR control board further comprises a reading module, and the control unit reads the current signal of the ICR module through the reading module.
5. The fast scan test system of claim 1, wherein: the ICR module comprises eight output channels, the rapid scanning test system comprises eight radio frequency power meters, and the intensity of radio frequency signals output by the corresponding output channels is read.
6. A fast scan test method for an ICR module, applied to the scan test system according to any one of claims 1 to 5, the fast scan test method comprising the steps of:
setting the frequency and the optical power of the first tunable laser;
setting the frequency and the optical power of a second tunable laser, and enabling the frequency of the second tunable laser to be the same as the frequency of the first tunable laser;
setting bias voltage/working voltage of an ICR module;
adjusting the polarization state of the second tunable laser to be the same as that of the first tunable laser through a polarization rotator;
controlling a first tunable laser to generate laser and a second tunable laser to perform laser scanning, and controlling a radio frequency power meter to read the intensity of a radio frequency signal output by the output channel;
obtaining a frequency f1To fnAnd processing the data to obtain a test result based on the ICR module.
7. The fast scan test method of claim 6, further comprising the steps of: obtaining a frequency f1To fnIs processed to obtain a frequency f1To fnAs a result of the ICR module based test.
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Effective date of registration: 20240318 Address after: Room 601 and 701, North Block, Yuanxing Technology Building, No.1 Songpingshan Road, High tech Industrial Park (North District), Nanshan District, Shenzhen, Guangdong Province, 518057 Patentee after: Longmet Communication Technology (Shenzhen) Co.,Ltd. Country or region after: China Address before: 518000 xinfeitong optoelectronic building, No.8, South Keji South 12th Road, Nanshan District, Shenzhen City, Guangdong Province Patentee before: NEOPHOTONICS Corp. Country or region before: China |