CN111103245B - Quick detection method for corn mildew based on spectrum technology - Google Patents
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
Abstract
The invention discloses a method for rapidly detecting corn mildew based on a spectrum technology and a method thereof, wherein the method comprises the following steps: preparing mildewed corn and non-mildewed corn; respectively collecting spectrum data of mildewed corn and non-mildewed corn by using a ground object spectrometer, and carrying out characteristic analysis; respectively calculating corn mildew indexes of mildew corn and non-mildew corn according to spectral reflectivities corresponding to wave bands of 400nm and 700 nm; the variation range of mildew index values of the mildew corns and the intact corns is statistically analyzed, and the boundary value of the mildew corns and the non-mildew corns is determined according to actual conditions; and judging whether the corn to be tested is mildewed or not based on the mildew and non-mildew corn demarcation value. The rapid detection method for corn mildew based on the spectrum technology is simple, convenient to operate, capable of realizing rapid, nondestructive and real-time corn mildew detection, and provides basic technical support for improving corn storage quality.
Description
Technical Field
The invention relates to the technical field of corn mildew detection, in particular to a rapid detection method for corn mildew based on a spectrum technology.
Background
As an important grain crop in China, the safety of corn is closely related to the life of people. Fresh corn is easy to mildew under high-temperature and high-humidity conditions due to high water content and high bacterial load, wherein aflatoxin B1 and gibberellin are representative toxins produced in the corn mildew process, and liver cytopathy can be caused under the metabolism of peroxidases in a human body if the fresh corn is eaten by mistake. Therefore, rapid detection and evaluation of mildewed corn is necessary.
The method of identifying a substance and determining its chemical composition and relative content based on its spectrum is called spectroscopic analysis, and has the advantage of being sensitive and rapid. Spectroscopic techniques were first generated in the 60 s of the 20 th century and then developed into an emerging intersecting scientific technology. Research has found that spectra often characterize the intrinsic properties of ground objects to a large extent. The improved spectral resolution facilitates accurate identification and classification of features (Goetz, 1995, 2009; goetz et al, 1985). On the basis of the improvement of detector technology, the concept of imaging spectrum remote sensing which integrates image and spectrum detection into a whole is first developed in the United states. In the early 80 s of the 20 th century, tong Qingxi et al (2009) know the idea in the communication with the expert Anka of JPL in the United states and study the possibility of realizing the novel remote sensing technology with Mr. Xue Yongqi of Shanghai technology institute of technology of China academy of sciences, so that the resolution of the cooperative attack of research teams on the imaging spectrum technology and the application field is established, the research is the origin of developing hyperspectral remote sensing technology research in China, and the related research work lays an important foundation for the imaging spectrum technology research developed later in China. At present, the theory and application research of hyperspectral remote sensing technology is rapidly developed in China. The hyperspectral remote sensing image has very high spectral resolution, can provide richer information, and is greatly concerned and widely applied by students at home and abroad.
In recent years, with the increasing prominence of grain safety problems, mildew detection is one of the important problems of corn storage, which is a problem to be solved urgently, and is also an important measure for strengthening corn storage and management. At present, the quality detection of the mildewed corns is mostly carried out by adopting a manual sensory identification method, the efficiency is low, the workload is high, the quality detection cannot be standardized, and meanwhile, defects such as impurities, mildewing, insect corrosion and the like are sometimes difficult to judge by naked eyes; the traditional biological culture method needs to destroy a large number of samples, is unfavorable for large-population screening, and has too complex measurement procedures for timely analysis and the like. Therefore, development of a rapid detection method for corn mildew based on spectrum technology has important social significance.
Disclosure of Invention
The invention aims to provide a rapid detection method for corn mildew based on a spectrum technology, which is simple and convenient to operate, can realize rapid, nondestructive and real-time corn mildew detection, and provides basic technical support for improving corn storage quality.
In order to achieve the above object, the present invention provides the following solutions:
a rapid detection method for corn mildew based on a spectrum technology comprises the following steps:
s1, preparing mildewed corn and non-mildewed corn;
s2, respectively collecting spectral data of mildewed corn and non-mildewed corn by using a ground object spectrometer, and carrying out characteristic analysis;
s3, respectively calculating corn mildew indexes of mildew corn and non-mildew corn according to spectral reflectivities corresponding to wave bands of 400nm and 700 nm;
s4, statistically analyzing the variation range of mildew index values of the mildew corns and the intact corns, and determining the boundary value of the mildew corns and the non-mildew corns according to actual conditions;
s5, judging whether the corn to be tested is mildewed or not based on the mildew and non-mildew corn demarcation value.
Optionally, in step S2, corn mildew indexes of the mildewed corn and the non-mildewed corn are calculated according to spectral reflectances corresponding to the wave bands 400nm and 700nm, which specifically includes:
the corn mildew index calculation formula:
wherein: r is R 400 For reflectance values at the 400nm band of the corn spectrum, R 700 The reflectance values at the 700nm band position of the corn spectrum are respectively 400 and 700, and the unit is nm.
Optionally, in the step S3, the demarcation value of the mildewed and non-mildewed corn is: corn mildew index is 0.0015, more than 0.0015 is non-mildew corn, less than 0.0015 is mildew corn.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects: the rapid detection method for corn mildew based on the spectrum technology is convenient to detect, does not need to count the mold in corn traditionally, only needs to use a ground object spectrometer to collect spectrum information, does not damage a sample, is energy-saving and environment-friendly, does not need to prepare chemical reagents, does not generate toxic waste liquid, and reduces harm to human bodies and the environment; the detection cost is low, and expensive chemical reagents and various analysis instruments are not required to be purchased; the rapid, nondestructive and real-time corn mildew detection can be realized, and basic technical support can be provided for improving the storage quality of corn; the invention has higher detection precision, better robustness and universality.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the drawings that are needed in the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for rapid detection of corn mildew based on spectroscopic techniques in accordance with an embodiment of the present invention;
FIG. 2 is a schematic diagram of the structure of a ground object spectrometer according to an embodiment of the present invention;
FIG. 3 is a graph showing spectra of non-mildewed and mildewed corn according to the present invention;
FIG. 4 is a graph showing the mildew index profile of corn in the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention aims to provide a rapid detection method for corn mildew based on a spectrum technology, which is simple and convenient to operate, can realize rapid, nondestructive and real-time corn mildew detection, and provides basic technical support for improving corn storage quality.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
As shown in FIG. 1, the method for rapidly detecting corn mildew based on the spectrum technology provided by the invention comprises the following steps:
s1, preparing mildewed corn and non-mildewed corn;
s2, respectively collecting spectral data of mildewed corn and non-mildewed corn by using a ground object spectrometer, and carrying out characteristic analysis;
s3, respectively calculating corn mildew indexes of mildew corn and non-mildew corn according to spectral reflectivities corresponding to wave bands of 400nm and 700 nm;
s4, statistically analyzing the variation range of mildew index values of the mildew corns and the intact corns, and determining the boundary value of the mildew corns and the non-mildew corns according to actual conditions, namely an optimal segmentation threshold value;
s5, judging whether the corn to be tested is mildewed or not based on the mildew and non-mildew corn demarcation value.
In step S1, the mildewed corn and the non-mildewed corn are dried, the two types of corn are placed on black cloth, the spectra of the two types of corn samples are measured by using a ground object spectrometer, the spectrum measurement adopts an indoor spectrum measurement mode, the adopted ground object spectrometer is a field portable ground object spectrometer manufactured by ASD company in America, the band coverage range of the device is 350-2500 nm, the output spectrum resolution is 1nm, and a specific schematic diagram is shown in figure 2. The measuring method can effectively avoid the interference of external uncontrollable factors and improve the quality of spectrum data. 10 spectra were measured for each sample and their average was taken as the final spectrum. The spectrum digital signal collected by the light spot detection system of the ground object spectrometer mainly comprises a response signal of the detector to the ground object and system noise. The detector response signal to the ground object is a valuable signal, needs to be reserved and needs to be removed for system noise. In addition, background noise and spectrum noise in the ground object spectrum curve also need to be eliminated, and spectrum smoothing is adopted to eliminate noise.
Spectral smoothing: the spectrum digital signal collected by the photoelectric detection system of the ground object spectrometer is divided into two parts: the detector responds to the ground object response signal and system noise. The system noise is mainly generated by each component part of the detection system when in operation, and besides, the ground feature spectrum curve also comprises background noise and spectrum noise. The noise brings great interference to analysis, detection and discrimination of the ground object spectrum. To eliminate these disturbances, the necessary useful information is extracted from the spectra of the features, requiring a smoothing pre-treatment of many "glitch" noise present in the spectra. Common smoothing methods are: moving average, savitaky-Golay (SG) convolution smoothing, median filtering, gaussian (GS) filtering, low-pass filtering, and wavelet denoising.
The different methods have different effects, and the principle for evaluating the superiority and inferiority of the smoothing method is as follows: the spectrum curve is as smooth as possible under the principle of keeping the characteristic value of the spectrum to the greatest extent, and the prediction degree of the smoothed spectrum curve on corn mildew is better. After comparing several methods according to the concept and principle of spectral denoising, the invention adopts a Hamming window low-pass filter with the length of 9 to carry out smoothing treatment on the spectral data.
In S2, the mildew index is calculated by using the spectral data in S1, and the calculation formula is as follows:
wherein: r is R 400 For reflectance values at the 400nm band of the corn spectrum, R 700 The reflectance values at the 700nm band position of the corn spectrum are respectively 400 and 700, and the unit is nm.
Mold index construction principle: from the spectrum characteristics analysis of the non-mildew corn and the mildew corn in fig. 3, the spectrum of the non-mildew corn is approximately straight in the visible light region, the reflectance of the mildew spectrum is obviously lower than the reflectance of the spectrum corresponding to the non-mildew corn, and the average increment of the mildew spectrum in the visible light region is obviously higher than that of the non-mildew corn.
In S3, statistical analysis is performed on the mildew indexes of the non-mildew and mildew corn calculated in S2, as shown in fig. 4, the mildew index of the corn is 0.0015, and it is determined that more than 0.0015 is the non-mildew corn and less than 0.0015 is the mildew corn.
The rapid detection method for corn mildew based on the spectrum technology is convenient to detect, does not need to count the mold in corn traditionally, only needs to use a ground object spectrometer to collect spectrum information, does not damage a sample, is energy-saving and environment-friendly, does not need to prepare chemical reagents, does not generate toxic waste liquid, and reduces harm to human bodies and the environment; the detection cost is low, and expensive chemical reagents and various analysis instruments are not required to be purchased; the rapid, nondestructive and real-time corn mildew detection can be realized, and basic technical support can be provided for improving the storage quality of corn; the invention has higher detection precision, better robustness and universality.
The principles and embodiments of the present invention have been described herein with reference to specific examples, the description of which is intended only to assist in understanding the methods of the present invention and the core ideas thereof; also, it is within the scope of the present invention to be modified by those of ordinary skill in the art in light of the present teachings. In view of the foregoing, this description should not be construed as limiting the invention.
Claims (1)
1. A rapid detection method for corn mildew based on a spectrum technology is characterized by comprising the following steps:
s1, preparing mildewed corn and non-mildewed corn; the method comprises the steps that mildewed corns and non-mildewed corns are dried, two types of corns are placed on black cloth, spectra of two types of corn samples are measured by a ground object spectrometer, and an indoor spectrum measurement mode is adopted for spectrum measurement;
s2, respectively collecting spectral data of mildewed corn and non-mildewed corn by using a ground object spectrometer, and carrying out characteristic analysis;
s3, respectively calculating corn mildew indexes of mildew corn and non-mildew corn according to spectral reflectivities corresponding to wave bands of 400nm and 700 nm;
s4, statistically analyzing the variation range of mildew index values of the mildew corns and the intact corns, and determining the boundary value of the mildew corns and the non-mildew corns according to actual conditions;
s5, judging whether the corn to be tested is mildewed or not based on the mildew and non-mildew corn demarcation value;
in the step S2, corn mildew indexes of mildew corn and non-mildew corn are calculated according to spectral reflectivities corresponding to wave bands of 400nm and 700nm, and the method specifically comprises the following steps:
the corn mildew index calculation formula:
wherein, in the formula: r is R 700 Reflectance value, R, of corn spectrum at 700nm band position 400 The reflectance values of the corn spectrum at the 400nm wave band position are respectively the wavelength of 400 and 700, and the unit is nm;
in the step S3, the parting values of the mildewed and non-mildewed corn are as follows: corn mildew index is 0.0015, is more than 0.0015 is non-mildew corn, and is less than 0.0015 is mildew corn.
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