CN111092784A - MCU cluster automatic testing method and system based on B/S architecture - Google Patents

MCU cluster automatic testing method and system based on B/S architecture Download PDF

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Publication number
CN111092784A
CN111092784A CN201910977900.4A CN201910977900A CN111092784A CN 111092784 A CN111092784 A CN 111092784A CN 201910977900 A CN201910977900 A CN 201910977900A CN 111092784 A CN111092784 A CN 111092784A
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cluster
mcu
server
test
test server
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CN111092784B (en
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庄浩
张艺展
陈玉龙
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Fujian Star Net Wisdom Technology Co ltd
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Fujian Star Net Wisdom Technology Co ltd
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/50—Testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/14—Arrangements for monitoring or testing data switching networks using software, i.e. software packages
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L67/00—Network arrangements or protocols for supporting network services or applications
    • H04L67/01—Protocols
    • H04L67/02—Protocols based on web technology, e.g. hypertext transfer protocol [HTTP]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/14—Systems for two-way working
    • H04N7/15—Conference systems
    • H04N7/152—Multipoint control units therefor

Abstract

The invention provides an MCU cluster automatic test method based on a B/S framework, which comprises the following steps: 1. building a cluster test server; 2. the cluster test server is networked with the MCU equipment and the PC; 3. initiating a device scanning request through a browser, scanning the MCU device after the device scanning request is processed by a cluster test server, reporting device information by the MCU device, and feeding back a device scanning result to the browser; 4. the cluster test server generates configuration information and sends the configuration information to the MCU equipment, and the MCU equipment makes settings after receiving the configuration information and feeds back a configuration result to the browser; 5. the cluster test server sends an equipment self-checking instruction, the MCU equipment receives the instruction and then carries out self-checking on the equipment state, and a self-checking result is fed back to the browser; 6. and the cluster test server executes a test process on the MCU equipment and feeds back a test result to the browser. The invention also provides an MCU cluster automatic test system based on the B/S framework, which greatly improves the test efficiency.

Description

MCU cluster automatic testing method and system based on B/S architecture
Technical Field
The invention relates to a cluster testing method, in particular to an MCU cluster automatic testing method and system based on a B/S framework.
Background
The MCU is called a multi control unit in English, and is a multipoint control unit in a video conference system. In order to implement a multipoint conference television system, an MCU must be provided. The MCU is essentially a multimedia information switch, which performs multi-point calling and connection, implements functions of video broadcasting, video selection, audio mixing, data broadcasting, etc., and completes the tandem and switching of signals of each terminal. The MCU differs from the existing switches in that the switch performs point-to-point connection of signals, while the MCU performs multipoint-to-multipoint switching, tandem or broadcast.
In the production and use environment of MCU related products, a plurality of servers are often required to be subjected to function test and performance test, the deployment configuration and test verification of each MCU are influenced by the complexity of a software system, a large amount of time resources and human resources are consumed, and the test efficiency is difficult to improve even if the MCU related products are experienced technical support personnel.
Disclosure of Invention
One of the technical problems to be solved by the present invention is to provide an MCU cluster automated testing method based on a B/S architecture, which greatly improves the testing efficiency.
One of the problems of the present invention is realized by:
an MCU cluster automatic test method based on a B/S architecture comprises the following steps:
step 1, building a cluster test server, and deploying WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server; simultaneously, deploying a cluster communication script on each MCU device;
step 2, the cluster test server builds a local area network with a plurality of MCU devices and PC units of testers through DHCP service;
step 3, initiating an equipment scanning request to a cluster test server through a browser on the PC, processing the equipment scanning request by the cluster test server through a WEB service, scanning the MCU equipment, reporting equipment information of each MCU equipment to the cluster test server through a cluster communication script, and feeding back an equipment scanning result to the browser by the cluster test server through the WEB service;
step 4, the cluster test server respectively generates configuration information of each MCU device according to the device information and sends the configuration information to the corresponding MCU device, the MCU device makes corresponding settings for the self system after receiving the configuration information through the cluster communication script and returns the configuration result to the cluster test server, and the cluster test server feeds the configuration result back to the browser through WEB service for display;
step 5, the cluster test server sends an equipment self-checking instruction to the MCU equipment, after the MCU equipment receives the self-checking control instruction through the cluster communication script, the equipment state is self-checked, a self-checking result is returned to the cluster test server, and the cluster test server feeds back the self-checking result to the browser through WEB service for displaying;
and 6, the cluster test server executes conference test, audio and video test and performance test on the MCU equipment through the SIP registration service and the virtual terminal service based on an automatic test framework, and feeds back a test result to the browser for display through WEB service.
Further, in step 1, a WEB service, a DHCP service, an SIP registration service, and a virtual terminal service are deployed on the cluster test server, and the specific steps are as follows:
and packaging server software by using a Docker technology, installing the server software on a cluster test server and operating the server software, wherein the server software comprises WEB frame software, DHCP server software, SIP server software and virtual terminal software, and respectively realizing WEB service, DHCP service, SIP registration service and virtual terminal service according to the WEB frame software, the DHCP server software, the SIP server software and the virtual terminal software.
Further, the step 3 specifically includes:
the cluster test server in the local area network is used as a multicast source, a plurality of MCU devices form a multicast group, after the tester initiates a device scan request to the cluster test server through the browser on the PC, the cluster test server processes the device scan request through a WEB service, then actively sending multicast messages to a multicast address, the MCU device obtaining the multicast messages according to the multicast address through the cluster communication script and then obtaining the IP address of a multicast source through the multicast messages, at the moment, each MCU device establishes a many-to-one channel with a cluster test server through the cluster communication script, each MCU device reports the device information of itself to the cluster test server through the channel, and the cluster test server carries out identification arrangement on the equipment information, and finally feeds back the equipment scanning result to the browser for display through WEB service.
Further, the step 6 specifically includes:
the cluster test server calls a UI automatic test framework, sequentially executes conference system login, conference creation, virtual terminal invitation and conference control test, wherein the execution operation process of the conference is transferred through SIP registration service, then the virtual terminal is used as a conference member to receive audio and video streams issued by MCU equipment and execute audio and video quality test, finally the pressure of the MCU equipment is increased by gradually increasing the number of the conference members and the number of the conference, then the equipment states of the MCU equipment under different numbers of the conference members and the numbers of the conference are respectively recorded, comprehensive performance evaluation is formed, performance test is realized, and the test progress and the test result are fed back to a browser through WEB service by the cluster test server to be displayed.
Further, the step 6 is followed by:
step 7, the cluster test server sends an equipment restoring instruction to the MCU equipment, and after the MCU equipment receives the equipment restoring instruction through the cluster communication script, the current equipment state is restored to the equipment state before testing;
and 8, the cluster test server sends a log collection instruction to the MCU device, the MCU device reports the log information of the MCU device to the cluster test server after receiving the log collection instruction through the cluster communication script, the log information is processed through the WEB service, and the browser downloads and exports the log information from the cluster test server.
The second technical problem to be solved by the present invention is to provide an MCU cluster automatic test system based on a B/S architecture, which greatly improves the test efficiency.
The second problem of the present invention is realized by:
an MCU cluster automatic test system based on B/S architecture comprises:
the service deployment module is used for constructing a cluster test server and deploying WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server; simultaneously, deploying a cluster communication script on each MCU device;
the network establishing module is used for establishing a local area network by the cluster test server through a DHCP service respectively with the MCU equipment and the PC unit of a tester;
the device scanning module is used for initiating a device scanning request to the cluster test server through a browser on the PC, the cluster test server processes the device scanning request through WEB service and scans MCU devices, each MCU device reports own device information to the cluster test server through a cluster communication script, and the cluster test server feeds back a device scanning result to the browser through the WEB service;
the device configuration module is used for the cluster test server to respectively generate configuration information of each MCU device according to the device information and send the configuration information to the corresponding MCU device, the MCU device makes corresponding settings for the self system after receiving the configuration information through the cluster communication script and returns the configuration result to the cluster test server, and the cluster test server feeds the configuration result back to the browser through WEB service for display;
the device self-checking module is used for sending a device self-checking instruction to the MCU device by the cluster test server, carrying out self-checking on the state of the device after the MCU device receives the self-checking control instruction through the cluster communication script, returning a self-checking result to the cluster test server, and feeding the self-checking result back to the browser for displaying through WEB service by the cluster test server;
and the equipment testing module is used for executing conference testing, audio and video testing and performance testing on the MCU equipment by the cluster testing server through the SIP registration service and the virtual terminal service based on an automatic testing frame, and feeding back a testing result to the browser for displaying through WEB service by the cluster testing server.
Further, the service deployment module deploys a WEB service, a DHCP service, an SIP registration service, and a virtual terminal service on the cluster test server, specifically:
and packaging server software by using a Docker technology, installing the server software on a cluster test server and operating the server software, wherein the server software comprises WEB frame software, DHCP server software, SIP server software and virtual terminal software, and respectively realizing WEB service, DHCP service, SIP registration service and virtual terminal service according to the WEB frame software, the DHCP server software, the SIP server software and the virtual terminal software.
Further, the device scanning module specifically includes:
the cluster test server in the local area network is used as a multicast source, a plurality of MCU devices form a multicast group, after the tester initiates a device scan request to the cluster test server through the browser on the PC, the cluster test server processes the device scan request through a WEB service, then actively sending multicast messages to a multicast address, the MCU device obtaining the multicast messages according to the multicast address through the cluster communication script and then obtaining the IP address of a multicast source through the multicast messages, at the moment, each MCU device establishes a many-to-one channel with a cluster test server through the cluster communication script, each MCU device reports the device information of itself to the cluster test server through the channel, and the cluster test server carries out identification arrangement on the equipment information, and finally feeds back the equipment scanning result to the browser for display through WEB service.
Further, the device testing module specifically includes:
the cluster test server calls a UI automatic test framework, sequentially executes conference system login, conference creation, virtual terminal invitation and conference control test, wherein the execution operation process of the conference is transferred through SIP registration service, then the virtual terminal is used as a conference member to receive audio and video streams issued by MCU equipment and execute audio and video quality test, finally the pressure of the MCU equipment is increased by gradually increasing the number of the conference members and the number of the conference, then the equipment states of the MCU equipment under different numbers of the conference members and the numbers of the conference are respectively recorded, comprehensive performance evaluation is formed, performance test is realized, and the test progress and the test result are fed back to a browser through WEB service by the cluster test server to be displayed.
Further, the device testing module further comprises:
the device restoring module is used for sending a device restoring instruction to the MCU device by the cluster test server, and restoring the current device state to the device state before testing after the MCU device receives the device restoring instruction through the cluster communication script;
and the log collection module is used for sending a log collection instruction to the MCU equipment by the cluster test server, reporting the own log information to the cluster test server by the MCU equipment after receiving the log collection instruction through the cluster communication script, processing the log information through WEB service, and downloading and exporting the log information from the cluster test server by the browser.
The invention has the advantages that:
1. introducing an automatic cluster test concept, establishing a cluster test server, and centralizing tests of different numbers of MCU equipment in the cluster test server for processing, such as the realization of functions of equipment scanning, equipment configuration, distributed test, log collection and the like, thereby meeting the test requirements of large-scale MCU equipment and obviously improving the test efficiency;
2. on the basis of an automatic test framework, a plurality of test schemes are integrated, so that the functions and the performances of the MCU equipment can be comprehensively evaluated;
3. the system carries out human-computer interaction based on the B/S framework, is applied to MCU equipment testing, is simple and convenient to test and execute, has high automation degree, can complete testing only by operating a browser, is not influenced by a system, and reduces the professional requirement of testers;
4. the cluster test server deploys WEB service, DHCP service, SIP registration service and virtual terminal service by adopting a Docker technology, and the deployment efficiency of the test environment is improved.
Drawings
The invention will be further described with reference to the following examples with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of the overall architecture of the present invention.
FIG. 2 is a timing diagram of the test interaction of the present invention.
FIG. 3 is an execution flow chart of the MCU cluster automation test method based on the B/S architecture of the present invention.
FIG. 4 is a schematic structural diagram of an MCU cluster automatic test system based on a B/S architecture according to the present invention.
Detailed Description
In order that the invention may be more readily understood, a preferred embodiment thereof will now be described in detail with reference to the accompanying drawings.
The terms:
MCU (video conference server): the short-term control equipment of the video conference system provides connection services of group conferences and multiple groups of conferences for users, is also called a multipoint conference controller and is a core part of the multipoint video conference system;
B/S architecture: browser (Browser) and cluster test Server (Server) architectural modes;
and a DHCP server: i.e., dynamic host configuration protocol, which is a server-multi-client technique that allows DHCP servers to assign IP addresses to computers and other devices that are enabled as DHCP clients;
SIP Protocol (Session Initiation Protocol): a session initiation protocol, which is a text-based application-layer control protocol, for creating, modifying and releasing sessions of one or more participants;
docker: an open source application container engine that allows developers to package their applications and dependencies into a portable image and then distribute it to any popular Linux or Windows machine, as well as to implement virtualization.
The invention sets up a cluster test Server (Server), which has the functions of intranet equipment discovery, deployment configuration management, equipment state self-checking, conference system test and the like, a tester controls test execution through a Browser client (Browser), a test result is displayed on the Browser client, and test record export is supported, as shown in figure 1.
As shown in fig. 2 and fig. 3, the MCU cluster automatic test method based on B/S architecture of the present invention includes the following steps:
step 1, building a cluster test server, and deploying WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server; simultaneously, deploying a cluster communication script on each MCU device;
the method comprises the following steps that WEB service, DHCP service, SIP registration service and virtual terminal service are deployed on the cluster test server, and the method specifically comprises the following steps:
packaging server software by using a Docker technology, installing the server software on a cluster test server and operating the server software to achieve the purpose of efficient deployment, wherein the server software comprises WEB frame software, DHCP server software, SIP server software and virtual terminal software, and respectively realizing WEB service, DHCP service, SIP registration service and virtual terminal service according to the WEB frame software, the DHCP server software, the SIP server software and the virtual terminal software;
the cluster test server mainly covers the following services:
(1) WEB services: the self-customized web frame is deployed on the cluster test server and is responsible for receiving an access request of a user, executing corresponding operation according to the request, and then returning data to a client (browser) of the user, namely, a tester can access a client interface through the browser, control the start and the end of each test, observe the test progress and the test result in real time, provide a test triggering condition for the following test stage, and is a main support for man-machine interaction;
(2) and DHCP service: the method comprises the steps that DHCP server software is installed and configured, is one of TCP/IP protocol clusters, and is mainly used for dynamically allocating IP addresses to local area network clients (MCU equipment and PCs of testers) and providing a network environment for a later testing stage;
(3) SIP registration service: the proxy server based on the SIP protocol is realized, receives the registration requests of the MCU and the virtual terminal, is responsible for establishing, changing and terminating the SIP session in the network, and provides SIP server support for the test stage of the conference system;
(4) virtual terminal service: the virtual terminal developed based on the SIP protocol stack and the streaming media protocol stack has the functions of initiating a registration (de-registration) request, responding to a conference invitation (hang-up), sending (receiving) audio/video stream and the like, and provides terminal function support for a conference system test stage;
wherein, deploying a cluster communication script on each MCU device specifically comprises:
the method comprises the steps that a Socket programming technology is used, when an MCU receives an instruction of a cluster test server, the cluster communication script performs corresponding control operation on each instruction, and then an operation result is returned to the cluster test server, so that the flexible communication purpose between the MCU and the cluster test server is achieved, and functions of equipment information reporting, configuration response, system self-checking, log reporting and the like are achieved;
step 2, the cluster test server builds a local area network with a plurality of MCU devices and PC units of testers through DHCP service, and network connection among the cluster test server, the MCU devices and the browser is realized through networking;
step 3, initiating an equipment scanning request to a cluster test server through a browser on the PC, processing the equipment scanning request by the cluster test server through a WEB service, scanning the MCU equipment, reporting equipment information of each MCU equipment to the cluster test server through a cluster communication script, and feeding back an equipment scanning result to the browser by the cluster test server through the WEB service; the method comprises the following steps:
the cluster test server in the local area network is used as a multicast source, a plurality of MCU devices form a multicast group, after the tester initiates a device scan request to the cluster test server through the browser on the PC, the cluster test server processes the device scan request through a WEB service, then actively sending multicast messages to multicast addresses, the MCU devices obtaining multicast messages according to the multicast addresses through the cluster communication script and then obtaining the IP addresses of multicast sources through the multicast messages, at the moment, each MCU device establishes a many-to-one channel with the cluster test server through the cluster communication script, each MCU device reports own device information (MAC addresses, IP addresses, device models and the like) to the cluster test server through the channel, the cluster test server carries out identification arrangement on the equipment information, and finally feeds back an equipment scanning result to the browser for display through WEB service;
step 4, the cluster test server respectively generates configuration information (such as SIP registration address, SIP account, user account and the like) of each MCU device according to the device information, and transmits the configuration information to the corresponding MCU device, the MCU device makes corresponding settings for the system after receiving the configuration information through the cluster communication script, and returns the configuration result to the cluster test server, and the cluster test server feeds the configuration result back to the browser for display through WEB service;
step 5, the cluster test server sends an equipment self-checking instruction to the MCU equipment, after the MCU equipment receives the self-checking control instruction through the cluster communication script, the equipment state is self-checked, including whether the equipment is successfully registered in the SIP server, whether the conference system is normally started, whether a database is normally operated and the like, and a self-checking result is returned to the cluster test server, and then the cluster test server feeds back the self-checking result to a browser through WEB service for display;
step 6, the cluster test server executes conference test, audio and video test and performance test on the MCU equipment through SIP registration service and virtual terminal service under the automatic test frame, and feeds back the test result to the browser for display through WEB service; the method comprises the following steps:
the cluster test server calls an UI (user interface) automatic test framework aiming at different clients of the conference system, such as: selenium (suitable for web page client), Appium (suitable for mobile client), AutoIt (suitable for desktop client), and the like, compile automatic test cases, thereby sequentially executing conference system login, conference creation, virtual terminal invitation and conference control test on the conference system client, wherein the executing operation process of the conference (including the operations of conference creation, modification, ending and the like) is all transited through the SIP registration service, then the virtual terminal is used as a conference member to receive the audio and video stream issued by the MCU device, execute the audio and video quality test, finally increase the pressure of the MCU device by gradually increasing the number of the conference members and the number of the conferences, and respectively record the device states of the MCU device under different numbers of the conference members and the numbers of the conferences to form comprehensive performance evaluation and realize the performance test, feeding the test progress and the test result back to the browser for display through WEB service by the cluster test server;
step 7, the cluster test server sends an equipment restoring instruction to the MCU equipment, and after the MCU equipment receives the equipment restoring instruction through the cluster communication script, the current equipment state is restored to the equipment state before testing;
and 8, the cluster test server sends a log collection instruction to the MCU device, the MCU device reports the log information of the MCU device to the cluster test server after receiving the log collection instruction through the cluster communication script, the log information is processed through the WEB service, and the browser downloads and exports the log information from the cluster test server, so that a tester can analyze the problems found in the whole test process.
As shown in FIG. 4, the MCU cluster based on the B/S architecture of the present inventionAutomationA test system comprising, for example:
the service deployment module is used for constructing a cluster test server and deploying WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server; simultaneously, deploying a cluster communication script on each MCU device;
the method comprises the following steps that WEB service, DHCP service, SIP registration service and virtual terminal service are deployed on the cluster test server, and the method specifically comprises the following steps:
packaging server software by using a Docker technology, installing the server software on a cluster test server and operating the server software to achieve the purpose of efficient deployment, wherein the server software comprises WEB frame software, DHCP server software, SIP server software and virtual terminal software, and respectively realizing WEB service, DHCP service, SIP registration service and virtual terminal service according to the WEB frame software, the DHCP server software, the SIP server software and the virtual terminal software;
the cluster test server mainly covers the following services:
(1) WEB services: the self-customized web frame is deployed on the cluster test server and is responsible for receiving an access request of a user, executing corresponding operation according to the request, and then returning data to a client (browser) of the user, namely, a tester can access a client interface through the browser, control the start and the end of each test, observe the test progress and the test result in real time, provide a test triggering condition for the following test stage, and is a main support for man-machine interaction;
(2) and DHCP service: the method comprises the steps that DHCP server software is installed and configured, is one of TCP/IP protocol clusters, and is mainly used for dynamically allocating IP addresses to local area network clients (MCU equipment and PCs of testers) and providing a network environment for a later testing stage;
(3) SIP registration service: the proxy server based on the SIP protocol is realized, receives the registration requests of the MCU and the virtual terminal, is responsible for establishing, changing and terminating the SIP session in the network, and provides SIP server support for the test stage of the conference system;
(4) virtual terminal service: the virtual terminal developed based on the SIP protocol stack and the streaming media protocol stack has the functions of initiating a registration (de-registration) request, responding to a conference invitation (hang-up), sending (receiving) audio/video stream and the like, and provides terminal function support for a conference system test stage;
wherein, deploying a cluster communication script on each MCU device specifically comprises:
the method comprises the steps that a Socket programming technology is used, when an MCU receives an instruction of a cluster test server, the cluster communication script performs corresponding control operation on each instruction, and then an operation result is returned to the cluster test server, so that the flexible communication purpose between the MCU and the cluster test server is achieved, and functions of equipment information reporting, configuration response, system self-checking, log reporting and the like are achieved;
the network establishing module is used for establishing a local area network by the cluster test server through a DHCP service respectively with the MCU equipment and the PC unit of a tester, and realizing network connection among the cluster test server, the MCU equipment and the browser through networking;
the device scanning module is used for initiating a device scanning request to the cluster test server through a browser on the PC, the cluster test server processes the device scanning request through WEB service and scans MCU devices, each MCU device reports own device information to the cluster test server through a cluster communication script, and the cluster test server feeds back a device scanning result to the browser through the WEB service; the method comprises the following steps:
the cluster test server in the local area network is used as a multicast source, a plurality of MCU devices form a multicast group, after the tester initiates a device scan request to the cluster test server through the browser on the PC, the cluster test server processes the device scan request through a WEB service, then actively sending multicast messages to multicast addresses, the MCU devices obtaining multicast messages according to the multicast addresses through the cluster communication script and then obtaining the IP addresses of multicast sources through the multicast messages, at the moment, each MCU device establishes a many-to-one channel with the cluster test server through the cluster communication script, each MCU device reports own device information (MAC addresses, IP addresses, device models and the like) to the cluster test server through the channel, the cluster test server carries out identification arrangement on the equipment information, and finally feeds back an equipment scanning result to the browser for display through WEB service;
the device configuration module is used for the cluster test server to respectively generate configuration information (such as SIP registration address, SIP account, user account and the like) of each MCU device according to the device information and send the configuration information to the corresponding MCU device, the MCU device makes corresponding setting on the system after receiving the configuration information through the cluster communication script and returns the configuration result to the cluster test server, and the cluster test server feeds the configuration result back to the browser through WEB service for display;
the device self-checking module is used for sending a device self-checking instruction to the MCU device by the cluster test server, and after the MCU device receives the self-checking control instruction through the cluster communication script, the device state is self-checked, wherein the self-checking control instruction comprises whether the device is successfully registered in the SIP server, whether a conference system is normally started, whether a database is normally operated and the like, and a self-checking result is returned to the cluster test server and then is fed back to a browser through WEB service by the cluster test server for display;
the device testing module is used for the cluster testing server to execute conference testing, audio and video testing and performance testing on the MCU device through SIP registration service and virtual terminal service under the automatic testing framework, and feeding back the testing result to the browser for displaying through WEB service by the cluster testing server; the method comprises the following steps:
the cluster test server calls an UI (user interface) automatic test framework aiming at different clients of the conference system, such as: selenium (suitable for web page client), Appium (suitable for mobile client), AutoIt (suitable for desktop client), and the like, compile automatic test cases, thereby sequentially executing conference system login, conference creation, virtual terminal invitation and conference control test on the conference system client, wherein the executing operation process of the conference (including the operations of conference creation, modification, ending and the like) is all transited through the SIP registration service, then the virtual terminal is used as a conference member to receive the audio and video stream issued by the MCU device, execute the audio and video quality test, finally increase the pressure of the MCU device by gradually increasing the number of the conference members and the number of the conferences, and respectively record the device states of the MCU device under different numbers of the conference members and the numbers of the conferences to form comprehensive performance evaluation and realize the performance test, feeding the test progress and the test result back to the browser for display through WEB service by the cluster test server;
the device restoring module is used for sending a device restoring instruction to the MCU device by the cluster test server, and restoring the current device state to the device state before testing after the MCU device receives the device restoring instruction through the cluster communication script;
and the log collection module is used for sending a log collection instruction to the MCU equipment by the cluster test server, reporting the own log information to the cluster test server by the MCU equipment after receiving the log collection instruction through the cluster communication script, processing the log information through WEB service, downloading and exporting the log information from the cluster test server by the browser, and facilitating the analysis of the problems found in the whole test process by the tester.
The invention has the following advantages:
1. introducing an automatic cluster test concept, establishing a cluster test server, and centralizing tests of different numbers of MCU equipment in the cluster test server for processing, such as the realization of functions of equipment scanning, equipment configuration, distributed test, log collection and the like, thereby meeting the test requirements of large-scale MCU equipment and obviously improving the test efficiency;
2. on the basis of an automatic test framework, a plurality of test schemes are integrated, so that the functions and the performances of the MCU equipment can be comprehensively evaluated;
3. the system carries out human-computer interaction based on the B/S framework, is applied to MCU equipment testing, is simple and convenient to test and execute, has high automation degree, can complete testing only by operating a browser, is not influenced by a system, and reduces the professional requirement of testers;
4. the cluster test server deploys WEB service, DHCP service, SIP registration service and virtual terminal service by adopting a Docker technology, and the deployment efficiency of the test environment is improved.
Although specific embodiments of the invention have been described above, it will be understood by those skilled in the art that the specific embodiments described are illustrative only and are not limiting upon the scope of the invention, and that equivalent modifications and variations can be made by those skilled in the art without departing from the spirit of the invention, which is to be limited only by the appended claims.

Claims (10)

1. An MCU cluster automatic test method based on a B/S architecture is characterized in that: the method comprises the following steps:
step 1, building a cluster test server, and deploying WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server; simultaneously, deploying a cluster communication script on each MCU device;
step 2, the cluster test server builds a local area network with a plurality of MCU devices and PC units of testers through DHCP service;
step 3, initiating an equipment scanning request to a cluster test server through a browser on the PC, processing the equipment scanning request by the cluster test server through a WEB service, scanning the MCU equipment, reporting equipment information of each MCU equipment to the cluster test server through a cluster communication script, and feeding back an equipment scanning result to the browser by the cluster test server through the WEB service;
step 4, the cluster test server respectively generates configuration information of each MCU device according to the device information and sends the configuration information to the corresponding MCU device, the MCU device makes corresponding settings for the self system after receiving the configuration information through the cluster communication script and returns the configuration result to the cluster test server, and the cluster test server feeds the configuration result back to the browser through WEB service for display;
step 5, the cluster test server sends an equipment self-checking instruction to the MCU equipment, after the MCU equipment receives the self-checking control instruction through the cluster communication script, the equipment state is self-checked, a self-checking result is returned to the cluster test server, and the cluster test server feeds back the self-checking result to the browser through WEB service for displaying;
and 6, the cluster test server executes conference test, audio and video test and performance test on the MCU equipment through the SIP registration service and the virtual terminal service based on an automatic test framework, and feeds back a test result to the browser for display through WEB service.
2. The MCU cluster automation test method based on B/S architecture of claim 1, characterized in that: in step 1, a WEB service, a DHCP service, an SIP registration service, and a virtual terminal service are deployed on the cluster test server, and the specific steps are as follows:
and packaging server software by using a Docker technology, installing the server software on a cluster test server and operating the server software, wherein the server software comprises WEB frame software, DHCP server software, SIP server software and virtual terminal software, and respectively realizing WEB service, DHCP service, SIP registration service and virtual terminal service according to the WEB frame software, the DHCP server software, the SIP server software and the virtual terminal software.
3. The MCU cluster automation test method based on B/S architecture of claim 1, characterized in that: the step 3 specifically comprises the following steps:
the cluster test server in the local area network is used as a multicast source, a plurality of MCU devices form a multicast group, after the tester initiates a device scan request to the cluster test server through the browser on the PC, the cluster test server processes the device scan request through a WEB service, then actively sending multicast messages to a multicast address, the MCU device obtaining the multicast messages according to the multicast address through the cluster communication script and then obtaining the IP address of a multicast source through the multicast messages, at the moment, each MCU device establishes a many-to-one channel with a cluster test server through the cluster communication script, each MCU device reports the device information of itself to the cluster test server through the channel, and the cluster test server carries out identification arrangement on the equipment information, and finally feeds back the equipment scanning result to the browser for display through WEB service.
4. The MCU cluster automation test method based on B/S architecture of claim 1, characterized in that: the step 6 specifically comprises the following steps:
the cluster test server calls a UI automatic test framework, sequentially executes conference system login, conference creation, virtual terminal invitation and conference control test, wherein the execution operation process of the conference is transferred through SIP registration service, then the virtual terminal is used as a conference member to receive audio and video streams issued by MCU equipment and execute audio and video quality test, finally the pressure of the MCU equipment is increased by gradually increasing the number of the conference members and the number of the conference, then the equipment states of the MCU equipment under different numbers of the conference members and the numbers of the conference are respectively recorded, comprehensive performance evaluation is formed, performance test is realized, and the test progress and the test result are fed back to a browser through WEB service by the cluster test server to be displayed.
5. The MCU cluster automation test method based on B/S architecture of claim 1, characterized in that: the step 6 is followed by:
step 7, the cluster test server sends an equipment restoring instruction to the MCU equipment, and after the MCU equipment receives the equipment restoring instruction through the cluster communication script, the current equipment state is restored to the equipment state before testing;
and 8, the cluster test server sends a log collection instruction to the MCU device, the MCU device reports the log information of the MCU device to the cluster test server after receiving the log collection instruction through the cluster communication script, the log information is processed through the WEB service, and the browser downloads and exports the log information from the cluster test server.
6. The utility model provides a MCU cluster automated test system based on B/S framework which characterized in that: the method comprises the following steps:
the service deployment module is used for constructing a cluster test server and deploying WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server; simultaneously, deploying a cluster communication script on each MCU device;
the network establishing module is used for establishing a local area network by the cluster test server through a DHCP service respectively with the MCU equipment and the PC unit of a tester;
the device scanning module is used for initiating a device scanning request to the cluster test server through a browser on the PC, the cluster test server processes the device scanning request through WEB service and scans MCU devices, each MCU device reports own device information to the cluster test server through a cluster communication script, and the cluster test server feeds back a device scanning result to the browser through the WEB service;
the device configuration module is used for the cluster test server to respectively generate configuration information of each MCU device according to the device information and send the configuration information to the corresponding MCU device, the MCU device makes corresponding settings for the self system after receiving the configuration information through the cluster communication script and returns the configuration result to the cluster test server, and the cluster test server feeds the configuration result back to the browser through WEB service for display;
the device self-checking module is used for sending a device self-checking instruction to the MCU device by the cluster test server, carrying out self-checking on the state of the device after the MCU device receives the self-checking control instruction through the cluster communication script, returning a self-checking result to the cluster test server, and feeding the self-checking result back to the browser for displaying through WEB service by the cluster test server;
and the equipment testing module is used for executing conference testing, audio and video testing and performance testing on the MCU equipment by the cluster testing server through the SIP registration service and the virtual terminal service based on an automatic testing frame, and feeding back a testing result to the browser for displaying through WEB service by the cluster testing server.
7. The MCU cluster automation test system based on B/S architecture of claim 6, characterized in that: the service deployment module deploys WEB service, DHCP service, SIP registration service and virtual terminal service on the cluster test server, and specifically comprises the following steps:
and packaging server software by using a Docker technology, installing the server software on a cluster test server and operating the server software, wherein the server software comprises WEB frame software, DHCP server software, SIP server software and virtual terminal software, and respectively realizing WEB service, DHCP service, SIP registration service and virtual terminal service according to the WEB frame software, the DHCP server software, the SIP server software and the virtual terminal software.
8. The MCU cluster automation test system based on B/S architecture of claim 6, characterized in that: the equipment scanning module specifically comprises:
the cluster test server in the local area network is used as a multicast source, a plurality of MCU devices form a multicast group, after the tester initiates a device scan request to the cluster test server through the browser on the PC, the cluster test server processes the device scan request through a WEB service, then actively sending multicast messages to a multicast address, the MCU device obtaining the multicast messages according to the multicast address through the cluster communication script and then obtaining the IP address of a multicast source through the multicast messages, at the moment, each MCU device establishes a many-to-one channel with a cluster test server through the cluster communication script, each MCU device reports the device information of itself to the cluster test server through the channel, and the cluster test server carries out identification arrangement on the equipment information, and finally feeds back the equipment scanning result to the browser for display through WEB service.
9. The MCU cluster automation test system based on B/S architecture of claim 6, characterized in that: the equipment testing module specifically comprises:
the cluster test server calls a UI automatic test framework, sequentially executes conference system login, conference creation, virtual terminal invitation and conference control test, wherein the execution operation process of the conference is transferred through SIP registration service, then the virtual terminal is used as a conference member to receive audio and video streams issued by MCU equipment and execute audio and video quality test, finally the pressure of the MCU equipment is increased by gradually increasing the number of the conference members and the number of the conference, then the equipment states of the MCU equipment under different numbers of the conference members and the numbers of the conference are respectively recorded, comprehensive performance evaluation is formed, performance test is realized, and the test progress and the test result are fed back to a browser through WEB service by the cluster test server to be displayed.
10. The MCU cluster automation test system based on B/S architecture of claim 6, characterized in that: the device testing module further comprises:
the device restoring module is used for sending a device restoring instruction to the MCU device by the cluster test server, and restoring the current device state to the device state before testing after the MCU device receives the device restoring instruction through the cluster communication script;
and the log collection module is used for sending a log collection instruction to the MCU equipment by the cluster test server, reporting the own log information to the cluster test server by the MCU equipment after receiving the log collection instruction through the cluster communication script, processing the log information through WEB service, and downloading and exporting the log information from the cluster test server by the browser.
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