CN111062982A - Graph analysis method, system and storage medium - Google Patents
Graph analysis method, system and storage medium Download PDFInfo
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- CN111062982A CN111062982A CN201911256936.XA CN201911256936A CN111062982A CN 111062982 A CN111062982 A CN 111062982A CN 201911256936 A CN201911256936 A CN 201911256936A CN 111062982 A CN111062982 A CN 111062982A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/13—Edge detection
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
- G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
- G06T7/66—Analysis of geometric attributes of image moments or centre of gravity
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20048—Transform domain processing
- G06T2207/20056—Discrete and fast Fourier transform, [DFT, FFT]
Abstract
The application discloses a graph analysis method, a graph analysis system and a storage medium, wherein the method converts two-dimensional coordinate information of each first sampling point into complex coordinate information after sampling the two-dimensional coordinate information of the first sampling points, the complex coordinate information not only comprises distance information of the first sampling points from an original point, but also comprises angle information of the first sampling points relative to adjacent first sampling points, the complex coordinate information corresponding to the first sampling points forms a two-dimensional information matrix, and finally the two-dimensional information matrix is processed by utilizing complex Fourier transformation to obtain shape information of a contour graph. Because the distance information of all the first sampling points from the original point and the angle information of the first sampling points compared with the adjacent first sampling points are stored in the two-dimensional information matrix, the loss of the angle information of the plurality of first sampling points compared with the adjacent first sampling points in the graphic analysis process is avoided, and the accuracy of finally obtained shape information is improved.
Description
Technical Field
The present application relates to the field of graphics processing technologies, and in particular, to a method, a system, and a storage medium for graphics analysis.
Background
The two-dimensional graph analysis method has important applications in various fields, for example, in the field of industrial control, it is generally required to acquire and monitor a product process image to acquire a change condition of the process image; in the field of biology, for example, it is often necessary to acquire a contour pattern of a lesion tissue and monitor a change in the contour pattern of the lesion tissue.
In the prior art, after an outline of a two-dimensional figure is obtained, a square frame (tetragon) is used for configuration, and then the long/short sides of the configuration are used as the long/short axes of the outline of the oval shape, so as to characterize the ovality of the outline. However, in practical application, it is found that the process of analyzing the two-dimensional graph by the method loses the information of the outline graph, and the obtained shape information for representing the outline graph is inaccurate.
Disclosure of Invention
In order to solve the above technical problem, the present application provides a method, a system and a storage medium for analyzing a pattern, so as to achieve the purpose of improving the accuracy of the shape information of the acquired two-dimensional pattern.
In order to achieve the technical purpose, the embodiment of the application provides the following technical scheme:
a method of graph analysis, comprising:
acquiring a contour graph of a graph to be analyzed, and establishing a first coordinate system by taking one point in the contour graph as an origin;
sampling the contour pattern to obtain a plurality of first sampling points, and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
and processing the two-dimensional information matrix by using complex Fourier transform to acquire the shape information of the outline graph.
Optionally, the sampling the profile graph to obtain a plurality of first sampling points includes:
setting a plurality of rays with the origin as a starting point, wherein the angles between every two adjacent rays are equal;
and taking the intersection point of the ray and the outline graph as the first sampling point.
Optionally, the sampling the profile graph to obtain a plurality of first sampling points includes:
a plurality of sampling lines parallel to a first axis or a second axis of the first coordinate system are arranged, and the distance between every two adjacent sampling lines is the same;
and taking the intersection point of the sampling line and the outline pattern as the first sampling point.
Optionally, the number of the first sampling points obtained by sampling the outline pattern is a positive integer power of 2.
Optionally, the converting the two-dimensional coordinate information of each of the first sampling points into complex coordinate information includes:
and taking a horizontal axis coordinate value in the two-dimensional coordinate information of the first sampling point as a real number part, and taking a vertical axis coordinate value in the two-dimensional coordinate information of the first sampling point as an imaginary number part, so as to convert the two-dimensional coordinate information of each first sampling point into complex coordinate information.
Optionally, the processing the two-dimensional information matrix by using complex fourier transform to obtain the shape information of the outline pattern includes:
extracting different types of deformation information from the two-dimensional information matrix by using complex Fourier transform, wherein each type of deformation information corresponds to a Fourier series;
removing useless deformation information in the extracted deformation information to obtain information to be processed;
taking Fourier series corresponding to the reference contour in the information to be processed as the information of the reference contour to be processed;
processing the information to be processed by utilizing inverse Fourier transform to obtain a contour to be processed;
processing the to-be-processed reference contour information by utilizing inverse Fourier transform to establish the reference contour;
and analyzing the shape information of the contour graph according to the reference contour and the contour to be processed.
Optionally, the analyzing the shape information of the contour graph according to the reference contour and the contour to be processed includes:
establishing a second coordinate system by taking the circle center of the reference contour as an origin;
sampling the contour to be processed at preset intervals to obtain a plurality of second sampling points;
calculating the distance between the second sampling point and the origin of the second coordinate system by using a first preset formula;
taking the difference between the distance from the second sampling point to the origin of the second coordinate system and the radius of the reference contour as the excircle value of the second sampling point;
taking the product of the absolute value of the excircle value of the second sampling point and the preset sampling interval as the deformation area of the second sampling point;
taking the sum of the deformation areas of all the second sampling points as the deformation of the outline graph;
the first preset formula is as follows:
wherein x 'and y' represent the abscissa and ordinate of the second sample point in the second coordinate system, and R represents the distance of the second sample point from the origin of the second coordinate system.
A graphical analysis system comprising:
the image acquisition module is used for acquiring a contour image of an image to be analyzed and establishing a first coordinate system by taking one point in the contour image as an origin;
the first sampling module is used for sampling the outline graph to obtain a plurality of first sampling points and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
the information conversion module is used for converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
and the information processing module is used for processing the two-dimensional information matrix by using complex Fourier transform to acquire the shape information of the outline graph.
Optionally, the information processing module includes:
a first transformation unit for extracting different types of deformation information from the two-dimensional information matrix by using a complex Fourier transform, each type of deformation information corresponding to a Fourier series;
the information removing unit is used for removing useless deformation information in the extracted deformation information to obtain information to be processed;
the reference information unit is used for taking the Fourier series corresponding to the reference contour in the information to be processed as the reference contour to be processed;
the second transformation unit is used for processing the information to be processed by utilizing inverse Fourier transformation to obtain a contour to be processed;
the reference contour unit is used for processing the to-be-processed reference contour information by utilizing inverse Fourier transform and establishing the reference contour;
and the information acquisition unit is used for analyzing the shape information of the contour graph according to the reference contour and the contour to be processed.
A storage medium having a program stored therein, the program executing the graph analysis method according to any one of the above-described methods when triggered.
It can be seen from the foregoing technical solutions that, in the present application, after two-dimensional coordinate information of a plurality of first sampling points is sampled, the two-dimensional coordinate information of each first sampling point is converted into complex coordinate information, where the complex coordinate information includes not only distance information of the first sampling point from the origin, but also angle information of the first sampling point relative to an adjacent first sampling point, and the complex coordinate information corresponding to the plurality of first sampling points forms a two-dimensional information matrix, and finally the two-dimensional information matrix is processed by using a plurality of fourier transforms to obtain shape information of the contour graph. The distance information of all the first sampling points from the original point and the angle information of the first sampling points compared with the adjacent first sampling points are stored in the two-dimensional information matrix, so that the loss of the angle information of a plurality of first sampling points compared with the adjacent first sampling points in the graph analysis process is avoided, and the accuracy of the finally obtained shape information of the outline graph is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIGS. 1-3 are schematic diagrams illustrating a process of analyzing a contour graph of a two-dimensional graph in the prior art;
fig. 4 is a schematic flow chart diagram illustrating a method for analyzing a graph according to an embodiment of the present application;
FIG. 5 is a schematic diagram of a first coordinate system established in an outline graphic provided by an embodiment of the present application;
FIG. 6 is a schematic diagram illustrating a first sampling point in a profile according to an embodiment of the present application;
FIG. 7 is a schematic diagram illustrating a process of selecting a first sampling point in a profile according to an embodiment of the present application;
FIG. 8 is a schematic diagram illustrating a process of selecting a first sampling point in a profile according to another embodiment of the present application;
fig. 9 is a schematic flowchart of a graph analysis method according to another embodiment of the present application.
Detailed Description
Referring to fig. 1-3, the prior art process of analyzing a contour pattern of a two-dimensional pattern generally includes the following steps:
(1) firstly, finding the center of a contour graph based on a square frame;
(2) then measuring the diameters or radii of the profile pattern passing through different angles of the center;
(3) and finally, extracting the information of the outline graph by using real Fourier transform. Fig. 1 and 2 show schematic diagrams of configurations of different two-dimensional profile graphs by using a square frame, and fig. 3 shows a schematic diagram of extracting information of the profile graph by using real fourier transform, in the process, taking the example of measuring diameters of different angles of the profile graph passing through a center as an example, after the step (2), a diameter array of the profile graph passing through the center and different angles can only be obtained, as shown in a following matrix, and the matrix only contains the diameter information of the different angles of the profile graph and does not have any angle information, so that the information of the profile graph extracted by the matrix after the step (3) is inaccurate.
In view of this, an embodiment of the present application provides a graph analysis method, including:
acquiring a contour graph of a graph to be analyzed, and establishing a first coordinate system by taking one point in the contour graph as an origin;
sampling the contour pattern to obtain a plurality of first sampling points, and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
and processing the two-dimensional information matrix by using complex Fourier transform to acquire the shape information of the outline graph.
The graph analysis method comprises the steps of converting two-dimensional coordinate information of each first sampling point into complex coordinate information after sampling two-dimensional coordinate information of the first sampling points, wherein the complex coordinate information not only comprises distance information of the first sampling points from an original point, but also comprises angle information of the first sampling points compared with adjacent first sampling points, the complex coordinate information corresponding to the first sampling points forms a two-dimensional information matrix, and finally, the two-dimensional information matrix is processed by utilizing complex Fourier transformation to obtain shape information of the outline graph. The distance information of all the first sampling points from the original point and the angle information of the first sampling points compared with the adjacent first sampling points are stored in the two-dimensional information matrix, so that the loss of the angle information of a plurality of first sampling points compared with the adjacent first sampling points in the graph analysis process is avoided, and the accuracy of the finally obtained shape information of the outline graph is improved.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
An embodiment of the present application provides a graph analysis method, as shown in fig. 4, including:
s101: acquiring a contour graph of a graph to be analyzed, and establishing a first coordinate system by taking one point in the contour graph as an origin;
the graph to be analyzed refers to a graph to be analyzed, and may be, for example, a semi-finished product or a finished product graph in a semiconductor manufacturing process, a graph of a pathological change tissue in a biological analysis process, a process image in other industrial processes, and the like.
After the graph to be analyzed is obtained, the outline graph of the graph to be analyzed can be obtained by means of edge detection, outline extraction, outline tracking and the like, and the obtaining mode of the outline graph is not limited in the application.
Referring to fig. 5, after the outline pattern is acquired, the first coordinate system may be established with an arbitrary point inside the outline pattern as an origin, but it should be noted that the origin of the first coordinate system needs to be inside the outline pattern and cannot be a point on the outline pattern. In fig. 5, reference numeral LP denotes the outline pattern, O1 denotes an origin of the first coordinate system, and x and y denote the horizontal axis and the vertical axis of the first coordinate system, respectively. In fig. 5, the first coordinate system is an XY coordinate system, and in other embodiments of the present application, the first coordinate system may also be a two-dimensional coordinate system such as a polar coordinate system.
S102: sampling the contour pattern to obtain a plurality of first sampling points, and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
referring to fig. 6, fig. 6 is a schematic diagram of the contour graph and the first sampling point, sample in fig. 6 represents the first sampling point, the two-dimensional coordinate information is an abscissa and an ordinate of the first sampling point in the first coordinate system, and may be expressed as (x)1，y1)、(x2，y2)…(xn，yn) Etc.
S103: converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
optionally, the converting the two-dimensional coordinate information of each of the first sampling points into complex coordinate information includes:
and taking a horizontal axis coordinate value in the two-dimensional coordinate information of the first sampling point as a real number part, and taking a vertical axis coordinate value in the two-dimensional coordinate information of the first sampling point as an imaginary number part, so as to convert the two-dimensional coordinate information of each first sampling point into complex coordinate information.
Namely, when the two-dimensional coordinate information of the first sampling point is (x) respectively1，y1)、(x2，y2)…(xn，yn) When the coordinate information is converted into complex coordinate information, the representation mode can be x1+y1i. The two-dimensional information matrix may be represented in the form of
The two-dimensional information matrix can store the distance information of the first sampling point from the origin and also can store the angle information of the first sampling point compared with the adjacent first sampling point.
S104: the two-dimensional information matrix is processed using a Complex Fourier Transform (Complex Fourier Transform) to obtain shape information of the outline pattern.
In this embodiment, after sampling two-dimensional coordinate information of a plurality of first sampling points, the graph analysis method converts the two-dimensional coordinate information of each first sampling point into complex coordinate information, where the complex coordinate information includes not only distance information of the first sampling point from the origin, but also angle information of the first sampling point compared with the adjacent first sampling point, and the complex coordinate information corresponding to the plurality of first sampling points forms a two-dimensional information matrix, and finally processes the two-dimensional information matrix by using complex fourier transform to obtain shape information of the profile graph. The distance information of all the first sampling points from the original point and the angle information of the first sampling points compared with the adjacent first sampling points are stored in the two-dimensional information matrix, so that the loss of the angle information of a plurality of first sampling points compared with the adjacent first sampling points in the graph analysis process is avoided, and the accuracy of the finally obtained shape information of the outline graph is improved.
On the basis of the above embodiments, an embodiment of the present application provides two possible methods for sampling the profile pattern to obtain a plurality of first sampling points:
referring to fig. 7, the sampling the profile pattern to obtain a plurality of first sample points includes:
setting a plurality of rays with the origin as a starting point, wherein the angles between every two adjacent rays are equal;
and taking the intersection point of the ray and the outline graph as the first sampling point.
Referring to fig. 8, the sampling the profile pattern to obtain a plurality of first sample points includes:
a plurality of sampling lines parallel to a first axis or a second axis of the first coordinate system are arranged, and the distance between every two adjacent sampling lines is the same;
and taking the intersection point of the sampling line and the outline pattern as the first sampling point.
In fig. 7, the angles of the connecting lines between every two adjacent sampling points and the center of the first coordinate system are the same, and in fig. 8, the distances between every two adjacent sampling points and the vertical point of the horizontal axis or the vertical axis of the first coordinate system are the same. In fig. 7 and 8, a first coordinate system is taken as an XY coordinate system for illustration, and correspondingly, when the first coordinate system is the XY coordinate system, the first axis and the second axis are an X axis and a Y axis, respectively; in other embodiments of the present application, the first coordinate system may also be a polar coordinate system, and when the first coordinate system is the polar coordinate system, the first axis and the second axis may be an r axis and a θ axis, respectively, which is not limited in this application and is determined according to the actual situation.
Optionally, the number of the first sampling points obtained by sampling the outline graph is a positive integer power of 2, so as to simplify a subsequent calculation process (which is convenient for complex fourier transform calculation), reduce calculation time, and improve the analysis efficiency of the complex fourier transform on the two-dimensional information matrix.
On the basis of the foregoing embodiment, in another embodiment of the present application, as shown in fig. 9, the processing the two-dimensional information matrix by using a complex fourier transform to obtain shape information of the outline pattern includes:
s1041: extracting different types of deformation information from the two-dimensional information matrix by using complex Fourier transform, wherein each type of deformation information corresponds to a Fourier series;
s1042: removing useless deformation information in the extracted deformation information to obtain information to be processed;
optionally, the misused deformation information in the extracted deformation information may be 2-time deformation (2-time deformation) information.
S1043: taking Fourier series corresponding to the reference contour in the information to be processed as the information of the reference contour to be processed;
s1044: processing the information to be processed by utilizing Inverse Fourier Transform (Inverse Fourier Transform) to obtain a contour to be processed;
s1045: processing the to-be-processed reference contour information by utilizing inverse Fourier transform to establish the reference contour;
s1046: and analyzing the shape information of the contour graph according to the reference contour and the contour to be processed.
The reference contour is related to the shape of the graph to be analyzed, and when the graph to be analyzed is close to a circle, the reference contour is a reference circle; and when the graph to be analyzed is close to other shapes such as a triangle and the like, the reference outline is a standard graph close to the graph to be analyzed.
Optionally, analyzing the shape information of the contour graph according to the reference contour and the contour to be processed includes:
s10461: establishing a second coordinate system by taking the circle center of the reference contour as an origin;
s10462: sampling the contour to be processed at preset intervals to obtain a plurality of second sampling points;
s10463: calculating the distance between the second sampling point and the origin of the second coordinate system by using a first preset formula;
s10464: taking the difference between the distance from the second sampling point to the origin of the second coordinate system and the radius of the reference contour as the excircle value of the second sampling point;
s10465: taking the product of the absolute value of the excircle value of the second sampling point and the preset sampling interval as the deformation area of the second sampling point;
s10466: taking the sum of the deformation areas of all the second sampling points as the deformation of the outline graph;
the first preset formula is as follows:
wherein x 'and y' represent the abscissa and ordinate of the second sample point in the second coordinate system, and R represents the distance of the second sample point from the origin of the second coordinate system.
The preset interval is generally based on the minimum deformation degree of the pattern which can be recognized and can reach the expected resolution, and the pattern with the current common resolution can be represented basically by taking 32/64/128 and other values.
The following describes a graph analysis system provided in an embodiment of the present application, and the graph analysis system described below may be referred to in correspondence with the graph analysis method described above.
Correspondingly, the embodiment of the present application further provides a graph analysis system, including:
the image acquisition module is used for acquiring a contour image of an image to be analyzed and establishing a first coordinate system by taking one point in the contour image as an origin;
the first sampling module is used for sampling the outline graph to obtain a plurality of first sampling points and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
the information conversion module is used for converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
and the information processing module is used for processing the two-dimensional information matrix by using complex Fourier transform to acquire the shape information of the outline graph.
Optionally, the information processing module includes:
a first transformation unit for extracting different types of deformation information from the two-dimensional information matrix by using a complex Fourier transform, each type of deformation information corresponding to a Fourier series;
the information removing unit is used for removing useless deformation information in the extracted deformation information to obtain information to be processed;
the reference information unit is used for taking the Fourier series corresponding to the reference contour in the information to be processed as the reference contour to be processed;
the second transformation unit is used for processing the information to be processed by utilizing inverse Fourier transformation to obtain a contour to be processed;
the reference contour unit is used for processing the to-be-processed reference contour information by utilizing inverse Fourier transform and establishing the reference contour;
and the information acquisition unit is used for analyzing the shape information of the contour graph according to the reference contour and the contour to be processed.
Correspondingly, the embodiment of the present application further provides a storage medium, where a program is stored in the storage medium, and the program is triggered to execute the graph analysis method according to any one of the embodiments.
To sum up, the embodiment of the present application provides a graph analysis method, a graph analysis system and a storage medium, wherein, the graph analysis method is after sampling the two-dimensional coordinate information of a plurality of first sampling points, with every the two-dimensional coordinate information of first sampling point converts the coordinate information of plural form into, and the coordinate information of plural form not only includes first sampling point distance the distance information of original point still includes first sampling point is compared with adjacent the angle information of first sampling point, and the coordinate information of plural form that a plurality of first sampling point correspond has constituted the two-dimensional information matrix, and it is right to utilize complex Fourier transform at last the two-dimensional information matrix is handled, in order to obtain the shape information of profile graph. The distance information of all the first sampling points from the original point and the angle information of the first sampling points compared with the adjacent first sampling points are stored in the two-dimensional information matrix, so that the loss of the angle information of a plurality of first sampling points compared with the adjacent first sampling points in the graph analysis process is avoided, and the accuracy of the finally obtained shape information of the outline graph is improved.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A method of graph analysis, comprising:
acquiring a contour graph of a graph to be analyzed, and establishing a first coordinate system by taking one point in the contour graph as an origin;
sampling the contour pattern to obtain a plurality of first sampling points, and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
and processing the two-dimensional information matrix by using complex Fourier transform to acquire the shape information of the outline graph.
2. The method of claim 1, wherein sampling the profile pattern to obtain a plurality of first sample points comprises:
setting a plurality of rays with the origin as a starting point, wherein the angles between every two adjacent rays are equal;
and taking the intersection point of the ray and the outline graph as the first sampling point.
3. The method of claim 1, wherein sampling the profile pattern to obtain a plurality of first sample points comprises:
a plurality of sampling lines parallel to a first axis or a second axis of the first coordinate system are arranged, and the distance between every two adjacent sampling lines is the same;
and taking the intersection point of the sampling line and the outline pattern as the first sampling point.
4. A method according to any one of claims 1 to 3, wherein the number of first sample points obtained by sampling the profile is a positive integer power of 2.
5. The method of claim 1, wherein the converting the two-dimensional coordinate information of each of the first sample points into complex coordinate information comprises:
and taking a horizontal axis coordinate value in the two-dimensional coordinate information of the first sampling point as a real number part, and taking a vertical axis coordinate value in the two-dimensional coordinate information of the first sampling point as an imaginary number part, so as to convert the two-dimensional coordinate information of each first sampling point into complex coordinate information.
6. The method of claim 1, wherein the processing the two-dimensional information matrix using a complex fourier transform to obtain shape information of the outline shape comprises:
extracting different types of deformation information from the two-dimensional information matrix by using complex Fourier transform, wherein each type of deformation information corresponds to a Fourier series;
removing useless deformation information in the extracted deformation information to obtain information to be processed;
taking Fourier series corresponding to the reference contour in the information to be processed as the information of the reference contour to be processed;
processing the information to be processed by utilizing inverse Fourier transform to obtain a contour to be processed;
processing the to-be-processed reference contour information by utilizing inverse Fourier transform to establish the reference contour;
and analyzing the shape information of the contour graph according to the reference contour and the contour to be processed.
7. The method of claim 6, wherein analyzing the shape information of the contour graph according to the reference contour and the contour to be processed comprises:
establishing a second coordinate system by taking the circle center of the reference contour as an origin;
sampling the contour to be processed at preset intervals to obtain a plurality of second sampling points;
calculating the distance between the second sampling point and the origin of the second coordinate system by using a first preset formula;
taking the difference between the distance from the second sampling point to the origin of the second coordinate system and the radius of the reference contour as the excircle value of the second sampling point;
taking the product of the absolute value of the excircle value of the second sampling point and the preset sampling interval as the deformation area of the second sampling point;
taking the sum of the deformation areas of all the second sampling points as the deformation of the outline graph;
the first preset formula is as follows:
wherein x 'and y' represent the abscissa and ordinate of the second sample point in the second coordinate system, and R represents the distance of the second sample point from the origin of the second coordinate system.
8. A graphical analysis system, comprising:
the image acquisition module is used for acquiring a contour image of an image to be analyzed and establishing a first coordinate system by taking one point in the contour image as an origin;
the first sampling module is used for sampling the outline graph to obtain a plurality of first sampling points and recording two-dimensional coordinate information of the first sampling points in the first coordinate system;
the information conversion module is used for converting the two-dimensional coordinate information of each first sampling point into complex coordinate information to obtain a two-dimensional information matrix, wherein the complex coordinate information comprises distance information of the first sampling point from the origin and angle information of the first sampling point compared with the adjacent first sampling point;
and the information processing module is used for processing the two-dimensional information matrix by using complex Fourier transform to acquire the shape information of the outline graph.
9. The system of claim 8, wherein the information processing module comprises:
a first transformation unit for extracting different types of deformation information from the two-dimensional information matrix by using a complex Fourier transform, each type of deformation information corresponding to a Fourier series;
the information removing unit is used for removing useless deformation information in the extracted deformation information to obtain information to be processed;
the reference information unit is used for taking the Fourier series corresponding to the reference contour in the information to be processed as the reference contour to be processed;
the second transformation unit is used for processing the information to be processed by utilizing inverse Fourier transformation to obtain a contour to be processed;
the reference contour unit is used for processing the to-be-processed reference contour information by utilizing inverse Fourier transform and establishing the reference contour;
and the information acquisition unit is used for analyzing the shape information of the contour graph according to the reference contour and the contour to be processed.
10. A storage medium having a program stored therein, the program being triggered to execute the graph analysis method according to any one of claims 1 to 7.
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| CN202110417913.3A CN112884790B (en) | 2019-12-10 | 2019-12-10 | Graph analysis method, system and storage medium |
| CN201911256936.XA CN111062982B (en) | 2019-12-10 | 2019-12-10 | Graph analysis method, system and storage medium |
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