CN111023983B - Method for measuring thickness of luminescent layer and distance between luminescent molecule and electrode in solution based on electrochemiluminescence self-interference - Google Patents

Method for measuring thickness of luminescent layer and distance between luminescent molecule and electrode in solution based on electrochemiluminescence self-interference Download PDF

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CN111023983B
CN111023983B CN201911288921.1A CN201911288921A CN111023983B CN 111023983 B CN111023983 B CN 111023983B CN 201911288921 A CN201911288921 A CN 201911288921A CN 111023983 B CN111023983 B CN 111023983B
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苏彬
王亚锋
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    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
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    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
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    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
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    • G01MEASURING; TESTING
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    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/76Chemiluminescence; Bioluminescence
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Abstract

The invention discloses a method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemiluminescence self-interference, which comprises the following steps: (1) the electrolyte solution of the electrode system contains luminescent molecules or the surface of the working electrode is fixed with the luminescent molecules, the potential is applied to the electrode system, the luminescent molecules emit light to be used as a light source, and the working electrode generates interference light; (2) collecting interference light signals of the working electrode in a direction perpendicular to the working electrode by adopting a collimating mirror, an optical fiber and a slit in sequence, and recording the interference light signals by using an optical fiber spectrometer to obtain an electrochemiluminescence self-interference spectrum of the working electrode; (3) and analyzing and calculating the electrochemiluminescence self-interference spectrum by using a transmission matrix method and a two-beam interference method to obtain the thickness of the luminescent layer or the distance between the luminescent molecules and the electrode. The spatial resolution measured by the method reaches the nanometer level, and the method has important significance for researching the mechanism of electrochemical luminescence and improving the performance of the electrochemical luminescence.

Description

Method for measuring thickness of luminescent layer and distance between luminescent molecule and electrode in solution based on electrochemiluminescence self-interference
Technical Field
The invention belongs to the field of electrochemical analysis, and particularly relates to a method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemical luminescence self-interference.
Background
The electrochemiluminescence analysis is that a certain electrochemical signal (including voltage and current) is applied to a certain chemical system containing a chemiluminescent substance through an electrode to generate a certain new substance all the time, the substance can react with the chemical substance existing in the system or carry out self decomposition reaction, the reaction not only provides enough energy, but also can generate a proper luminophor and receive the released energy of the reaction to form an excited state luminophor, when an unstable excited state returns to a ground state, the luminophor emits light consistent with the property of the luminophor, and common optical means such as a photomultiplier and the like are used for measuring the luminescence spectrum or the luminescence intensity so as to carry out trace analysis on the substance.
Thus, electrochemiluminescence is the product of a combination of electrochemistry and chemiluminescence. The electrochemical reaction is used for generating optical signals, exciting light is not required to be added, and the electrochemical reaction method has the advantages of high analysis speed, strong space-time controllability, high detection sensitivity, wide linear range and the like. Nowadays, the electrochemiluminescence technology plays an important role in the fields of clinical diagnosis, food safety, environmental monitoring and the like. For example, chinese patent publication No. CN103439321A discloses an electrochemiluminescence sensor for cortical actin and a method for measuring cortical actin, which utilizes electrochemical reduction to prepare a gold electrode modified by nanogold and graphene, and self-assembles peptide connected with active group bipyridyl ruthenium on the modified electrode to form the electrochemiluminescence sensor. When the cortex actin of the target object exists, the cortex actin is combined with the peptide, so that the thermolysin is prevented from cutting the peptide, and a strong electrochemical luminescence signal is generated; on the contrary, in the absence of cortical actin, thermolysin cleaves peptides and the electrochemiluminescence signal is reduced. This phenomenon enabled the determination of cortical actin. The research on the mechanism of the electrochemiluminescence has important significance for improving the sensitivity, the accuracy and the like of the electrochemiluminescence in practical application.
In the electrochemical luminescence process, luminescent molecules are localized on the surface of the electrode to generate a luminescent layer with a thickness of several hundred nanometers to several micrometers. The study on the distance between the light-emitting molecules and the electrode or the change of the thickness of the light-emitting layer in the electrochemical luminescence process has important significance for explaining the reaction mechanism and improving the performance of the light-emitting layer.
Disclosure of Invention
The invention provides a method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemiluminescence self-interference. The spatial resolution measured by the method reaches the nanometer level, and the method has important significance for researching the mechanism of electrochemical luminescence and improving the performance of the electrochemical luminescence.
A method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemiluminescence self-interference, the method comprising:
(1) the electrolyte solution of the electrode system contains luminescent molecules or the surface of the working electrode is fixed with the luminescent molecules, the potential is applied to the electrode system, the luminescent molecules emit light to be used as a light source, and the working electrode generates interference light;
(2) collecting interference light signals of the working electrode in a direction perpendicular to the working electrode by adopting a collimating mirror, an optical fiber and a slit in sequence, and recording the interference light signals by using an optical fiber spectrometer to obtain an electrochemiluminescence self-interference spectrum of the working electrode;
(3) and analyzing and calculating the electrochemiluminescence self-interference spectrum by using a transmission matrix method and a two-beam interference method to obtain the thickness of the luminescent layer or the distance between the luminescent molecules and the electrode.
The electrochemical luminescence self-interference spectrum is analyzed and calculated by using a transmission matrix method and a two-beam interference method, and reference can be made to the following steps: IEEE J.Sel.Top.Quantum Electron.2003,9, 294-.
The principle of the method provided by the invention is as follows: the distance between the light-emitting molecules and the electrodes or the thickness of the light-emitting layer can change the electrochemical luminescence from the interference spectrum, and corresponding quantitative calculation can be carried out according to the change of the spectrum.
Preferably, in step (1), the luminescent molecule is tris (2,2' -bipyridyl) ruthenium (II) and derivatives thereof.
Preferably, in step (1), 3-mercaptopropionic acid or double-stranded DNA containing 50 base pairs is used to immobilize a luminescent molecule to the surface of a gold electrode; one end of the double-stranded DNA is connected with a sulfydryl, and the other end of the double-stranded DNA is a luminescent molecule.
In the step (1), the electrolyte solution comprises a co-reactant of luminescent molecules, and the co-reactant is 2-dibutylaminoethanol or tri-n-propylamine.
Preferably, in step (1), the working electrode is a gold electrode, an indium tin oxide electrode, or a platinum electrode. Preferably, in step (1), the gold electrode is prepared by electron beam evaporation deposition using a silicon dioxide/silicon wafer as a substrate. Preferably, the structure of the gold electrode sequentially comprises silicon, a silicon dioxide film, a titanium adhesion layer and a gold layer from bottom to top, the thickness of the silicon dioxide film is 6 microns, the thickness of the titanium adhesion layer is 3nm, the thickness of the gold layer is 10nm, and the surface roughness of the gold electrode is smaller than 1 nm. A silica film having a thickness of about 6 μm has good optical interference properties of the film.
Preferably, the electrode system is a three-electrode system, and a gold electrode, a platinum wire and a silver/silver chloride (saturated KCl) electrode are respectively used as a working electrode, a counter electrode and a reference electrode.
Preferably, the gold electrode is cleaned in fresh piranha water (a mixed solution of concentrated sulfuric acid and 30% hydrogen peroxide in a volume ratio of 7: 3) at 90 ℃ for 3min before modification or use, and then is rinsed with water and dried by nitrogen.
Preferably, in step (1), the potential is applied using cyclic voltammetry or chronoamperometry; when measuring the distance between the luminescent molecule and the electrode, the applied potential is 0.6V-1.2V, and the sweep rate is 0.05V/s; when measuring the thickness of the light-emitting layer in the solution, a voltage of +1.2V was applied using a chronoamperometry method.
Preferably, when measuring the distance between the light-emitting molecule and the electrode, the electrolyte solution is 0.2M phosphate buffer (pH 7.4) with 30mM 2-dibutylethanol as a co-reactant. Preferably, when the thickness of the light emitting layer in the solution is measured, the solution is 1. mu.M Ru (bpy)3 2+/60mM Trin-propylamine or 1mM Ru (bpy)3 2+30mM tri-n-propylamine. The electrolyte was 0.2M phosphate buffer (pH 7.4).
Preferably, when the distance between the light-emitting molecule and the electrode is measured, the spectral integration time is 0.5 s. Preferably, when the thickness of the light-emitting layer in the solution is measured, for a layer containing 1. mu.M Ru (bpy)3 2+And 1mM Ru (bpy)3 2+The spectral integration time of the solution (2) is 2s and 0.5 s.
Preferably, the electrochemiluminescence interference model is simplified by using a transmission matrix method (the transmission matrix method is that the propagation condition of the electromagnetic wave in the multilayer medium is described in a matrix form, and the propagation in each layer of medium meets Maxwell equation set), and the experimental spectrum is analyzed and calculated by using a two-beam interference method. The calculations were done by MATLAB software.
The transmission matrix method and the two-beam interference mainly use the following formulas:
Figure BDA0002315407410000051
whereinr=2πnrLr/λ,nr、LrThe refractive index and the film thickness of the r-th film, λ is the wavelength, nSIs the refractive index of the working electrode substrate. (e.g., for a gold electrode comprising silicon, a thin silicon dioxide film, a titanium adhesion layer, and a gold layer in that order from bottom to top for the structure in this application, n1、L1The refractive index and the film thickness of the first layer film are respectively, and the first layer film is a gold layer; n isSThe refractive index of the silicon substrate).
Matrix parameters B and C are calculated by formula (1), and the reflectivity of the working electrode is calculated by formula (2) and matrix parameters B and C.
Figure BDA0002315407410000052
R is the reflectivity of the working electrode, n0Is the refractive index of the electrolyte.
Figure BDA0002315407410000053
I (λ) is the intensity of the interfering light at a wavelength λ, I1(lambda) is the light intensity of the electrochemiluminescence light source,
Figure BDA0002315407410000054
is the phase difference between the two beams of light that interfere.
Figure BDA0002315407410000055
Figure BDA0002315407410000061
Is the phase difference caused by the reflection of light at the electrode interface.
Figure BDA0002315407410000062
Figure BDA0002315407410000063
Is the phase difference caused by the optical path difference between the two interfering lights, and l is the distance from the light-emitting molecule to the electrode.
Figure BDA0002315407410000064
Theoretical electrochemiluminescence self-interference spectra can be calculated by equations (1) - (6), and only the thickness of the light-emitting layer or the distance between the light-emitting molecule and the electrode in the solution is the only unknown variable in the equations. Other physical quantities can be measured by the instrument. Different electrochemiluminescence self-interference spectra can be obtained by changing the thickness of the luminescent layer or the distance between the luminescent molecule and the electrode substituted in the formula. Comparing the interference spectrum calculated theoretically with the spectrum measured experimentally, the value of the thickness of the luminescent layer or the distance between the luminescent molecule and the electrode used is the correct value when the difference between the theoretical and experimental spectra is minimal by means of the least squares method.
Compared with the prior art, the invention has the following beneficial effects: 1. the method provided by the invention has the advantages of rapid and convenient detection; 2. the method takes electrochemiluminescence as a light source and has very low luminous background; 3. the method is a brand new method for researching the electrochemical luminescence process and mechanism; 4. the method has extremely high spatial resolution; 5. the method has important significance for improving the performance of electrochemiluminescence and expanding the application field of the electrochemiluminescence.
Drawings
FIG. 1 is a cross-sectional view of a scanning electron microscope showing a silicon wafer covered with a silicon oxide film and a gold electrode in examples 1 and 2;
FIG. 2 is a schematic diagram of the structure of an electrode system, a collimating mirror, an optical fiber, a slit, and an interference spectrometer;
FIG. 3 shows gold electrodes of example 1 in each case at 1. mu.M Ru (bpy)3 2+/60mM Trin-propylamine and 1mM Ru (bpy)3 2+Electrochemiluminescence self-interference spectroscopy in a 30mM tri-n-propylamine solution;
FIG. 4 is a self-interference spectrum of electrochemiluminescence obtained in 0.2M phosphate buffer (pH 7.4) containing 30mM 2-dibutylethanol after the electrochemiluminescence molecules were modified on the surface of a gold electrode with 3-mercaptopropionic acid and 50 base pair-containing double-stranded DNA, respectively, in example 2.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the detailed description and specific examples, while indicating the scope of the invention, are intended for purposes of illustration only and are not intended to limit the scope of the invention.
Example 1
Procedure for measuring the thickness of the electrode surface luminescent layer in solution using electrochemiluminescence self-interference:
(1) a gold electrode with a silicon dioxide/silicon wafer as a substrate is used as a working electrode (as shown in fig. 1, the thickness of a silicon dioxide film is about 6 μm, the thickness of a gold layer is about 10nm, and the cross-sectional views of a scanning electron microscope of the silicon wafer covered with the silicon dioxide film and the gold electrode are respectively shown as a and b in fig. 1); a three-electrode system is adopted, and a gold electrode, a platinum wire and a silver/silver chloride (saturated KCl) electrode are used as a Working Electrode (WE), a Counter Electrode (CE) and a Reference Electrode (RE); applying a voltage of +1.2V by using a chronoamperometry; gold electrodes are respectively arranged at 1 mu M Ru (bpy)3 2+/60mM Trin-propylamine and 1mM Ru (bpy)3 2+Luminescence self-interference in 30mM Trin-propylamine.
(2) As shown in FIG. 2, the working electrode is placed horizontally, and the interference spectrum is collected in the direction perpendicular to the electrode using a collimator lens and an optical fiberAnd further filtering the received interference light signals which are not vertical to the surface of the electrode by using a slit with the size of 200 mu m, and recording by using a fiber spectrometer to obtain an electrochemiluminescence self-interference spectrogram. FIG. 3 shows the recording of the interferometric spectrometer with gold electrodes at 1 μ M Ru (bpy)3 2+/60mM Trin-propylamine and 1mM Ru (bpy)3 2+Electrochemiluminescence in/30 mM tri-n-propylamine is shown by self-interference spectrum diagrams as a and b in FIG. 3, respectively. The spectral integration times were 2s and 0.5s, respectively. Very distinct interference peaks can be seen in the spectrum.
(3) The spectrum is analyzed and calculated by a transmission matrix method and a double-beam interference method to obtain gold electrodes which are respectively arranged at 1 mu M Ru (bpy)3 2+/60mM Trin-propylamine and 1mM Ru (bpy)3 2+The thickness of the light-emitting layer in 30mM tri-n-propylamine is 350-450nm and 800-950nm respectively, which are consistent with the values reported in the literature (several hundred nanometers to several micrometers, J.Am.chem.Soc.2018,140, 14753-14760.). The feasibility of the method was demonstrated.
Example 2
Measuring the distance between the light-emitting molecule and the electrode using electrochemiluminescence self-interference:
(1) using the three-electrode system in step (1) of example 1, respectively modifying electrochemiluminescence molecules to the surface of a gold electrode by using 3-mercaptopropionic acid and double-stranded DNA containing 50 base pairs; the applied potential is 0.6V-1.2V, and the sweeping speed is 0.05V/s; gold electrodes were light-emitting self-interferentially in 0.2M phosphate buffer (pH 7.4) containing 30mM 2-dibutylethanol.
(2) As shown in fig. 2, the working electrode was placed horizontally, the interference spectrum was collected in the direction perpendicular to the electrode using a collimating mirror and fiber optics, and the received light, which was not perpendicular to the electrode surface, was further filtered out with a 200 μm slit. FIG. 4 is a graph of the electrochemiluminescence self-interference spectra recorded by an interference spectrometer for a gold electrode in which electrochemiluminescence molecules are modified on the surface of the gold electrode by using 3-mercaptopropionic acid and double-stranded DNA having 50 base pairs, respectively, as shown in a and b of FIG. 4. The spectral integration time was 0.5 s. Still, a very clear interference peak signal can be observed from the electrochemiluminescence self-interference spectrum in fig. 4.
(3) The distance between the luminous molecule and the surface of the electrode is 1.5nm and 8.7nm respectively by analyzing and calculating the spectrum by using a transmission matrix method and a two-beam interference method. The extremely high spatial resolution of the method is demonstrated. The length of the double-stranded DNA was about 17nm, and the inclination of the double-stranded DNA calculated therefrom was about 59.2 ° (angle with respect to the direction perpendicular to the electrodes). Therefore, the above embodiments have good optical interference performance by using the gold electrode based on the silicon dioxide thin film. When the electrode is taken as a working electrode for electrochemical luminescence, the thickness of a luminescent layer in a solution can be measured; if the luminescent molecule is attached to the surface of an electrode (the luminescent molecule is attached to the electrode using 3-mercaptopropionic acid or double-stranded DNA containing 50 base pairs), the distance between the luminescent molecule and the electrode can be measured. The electrochemical luminescence self-interference spectrum is analyzed and calculated by a transmission matrix method and a two-beam interference method.
The spatial resolution measured by the method provided by the invention reaches the nanometer level, and has important significance for researching the mechanism of electrochemical luminescence and improving the performance of the electrochemical luminescence. Meanwhile, the invention has important significance for expanding the application of electrochemiluminescence in the fields of clinical diagnosis, food safety, environmental monitoring and the like.
The above-mentioned embodiments are intended to illustrate the technical solutions and advantages of the present invention, and it should be understood that the above-mentioned embodiments are only the most preferred embodiments of the present invention, and are not intended to limit the present invention, and any modifications, additions, equivalents, etc. made within the scope of the principles of the present invention should be included in the scope of the present invention.

Claims (9)

1. A method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemiluminescence self-interference, which is characterized by comprising the following steps:
(1) the electrolyte solution of the electrode system contains luminescent molecules or the surface of the working electrode is fixed with the luminescent molecules, potential is applied to the electrode system, the luminescent molecules emit light after electrochemical reaction and serve as a light source, and interference occurs between light reflected on the interface of the working electrode to form a self-interference signal; the luminescent molecules contained in the electrolyte solution of the electrode system generate a luminescent layer with a certain thickness on the surface of the working electrode, and a certain distance exists between the luminescent molecules fixed on the surface of the working electrode and the working electrode;
(2) collecting self-interference optical signals in a direction perpendicular to the working electrode by sequentially adopting a collimating mirror, an optical fiber and a slit, and recording by using an optical fiber spectrometer to obtain an electrochemiluminescence self-interference spectrum;
(3) and analyzing and calculating the electrochemiluminescence self-interference spectrum by using a transmission matrix method and a two-beam interference method to obtain the thickness of the luminescent layer or the distance between the luminescent molecules and the electrode.
2. The method for self-interference measurement of thickness of luminescent layer and distance between luminescent molecule and electrode based on electrochemiluminescence as claimed in claim 1, wherein in step (1), the luminescent molecule is tris (2,2' -bipyridine) ruthenium (II) and its derivatives.
3. The method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in solution based on electrochemiluminescence self-interference as claimed in claim 2, wherein the luminescent molecule is fixed on the surface of the gold electrode by using 3-mercaptopropionic acid or double-stranded DNA containing 50 base pairs; one end of the double-stranded DNA is connected with a sulfydryl, and the other end of the double-stranded DNA is a luminescent molecule.
4. The method for self-interference measurement of thickness of luminescent layer and distance between luminescent molecule and electrode based on electrochemiluminescence as claimed in claim 1, wherein in step (1), co-reactant of luminescent molecule is included in the electrolyte solution, and the co-reactant is 2-dibutylaminoethanol or tri-n-propylamine.
5. The method for self-interference measurement of thickness of luminescent layer and distance between luminescent molecule and electrode based on electrochemiluminescence of claim 1, wherein in step (1), the working electrode is gold electrode, indium tin oxide electrode or platinum electrode.
6. The method for self-interference measurement of the thickness of the luminescent layer and the distance between the luminescent molecule and the electrode based on electrochemiluminescence of claim 5, wherein in the step (1), the gold electrode is prepared by electron beam evaporation deposition method with silicon dioxide/silicon wafer as the substrate.
7. The method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in solution based on electrochemiluminescence self-interference as claimed in claim 6, wherein the structure of the gold electrode sequentially comprises silicon, a silicon dioxide thin film, a titanium adhesion layer and a gold layer from bottom to top, the thickness of the silicon dioxide thin film is 6 μm, the thickness of the titanium adhesion layer is 3nm, the thickness of the gold layer is 10nm, and the surface roughness of the gold electrode is less than 1 nm.
8. The method for measuring the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode in a solution based on electrochemiluminescence self-interference as claimed in any one of claims 5 to 7, wherein the electrode system is a three-electrode system, and a gold electrode, a platinum wire, a silver/silver chloride (saturated KCl) electrode are respectively used as a working electrode, a counter electrode and a reference electrode.
9. The method for self-interference measurement of the thickness of a luminescent layer and the distance between a luminescent molecule and an electrode based on electrochemiluminescence according to claim 1, wherein in step (1), a potential is applied using cyclic voltammetry or chronoamperometry; when measuring the distance between the luminescent molecule and the electrode, the applied potential is 0.6V-1.2V, and the sweep rate is 0.05V/s; when measuring the thickness of the light-emitting layer in the solution, a voltage of +1.2V was applied using a chronoamperometry method.
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