CN110988662A - 一种基于fpga原型验证开发板的信号调试系统及方法 - Google Patents
一种基于fpga原型验证开发板的信号调试系统及方法 Download PDFInfo
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- CN110988662A CN110988662A CN201911247016.1A CN201911247016A CN110988662A CN 110988662 A CN110988662 A CN 110988662A CN 201911247016 A CN201911247016 A CN 201911247016A CN 110988662 A CN110988662 A CN 110988662A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
- G01R31/318519—Test of field programmable gate arrays [FPGA]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
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CN201911247016.1A CN110988662B (zh) | 2019-12-09 | 2019-12-09 | 一种基于fpga原型验证开发板的信号调试系统及方法 |
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CN110988662A true CN110988662A (zh) | 2020-04-10 |
CN110988662B CN110988662B (zh) | 2022-08-02 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112148617A (zh) * | 2020-10-09 | 2020-12-29 | 中国科学技术大学 | 一种用于远程实验平台的波形采样调试方法 |
CN113504463A (zh) * | 2021-07-02 | 2021-10-15 | 芯启源(上海)半导体科技有限公司 | 一种fpga原型验证中探针信号复用方法 |
Citations (7)
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KR20010093402A (ko) * | 2000-03-28 | 2001-10-29 | 김남도 | 내장형 시스템을 위한 신속 프로토타이핑 장치 및 이를이용한 디버깅 방법 |
US20040030999A1 (en) * | 2002-08-09 | 2004-02-12 | Chun Kit Ng | Method and system for debugging using replicated logic |
US20060041803A1 (en) * | 2004-04-26 | 2006-02-23 | Agilent Technologies, Inc. | Apparatus and method for dynamic in-circuit probing of field programmable gate arrays |
US20070168749A1 (en) * | 2005-12-19 | 2007-07-19 | Stewart James B Iii | Method and system for tracing program execution in field programmable gate arrays |
CN203260029U (zh) * | 2013-04-28 | 2013-10-30 | 杭州士兰微电子股份有限公司 | 基于fpga的系统芯片原型验证调试装置 |
CN107526614A (zh) * | 2017-08-30 | 2017-12-29 | 苏州思得普信息科技有限公司 | Fpga开发板及其通信方法 |
CN110032482A (zh) * | 2019-04-11 | 2019-07-19 | 盛科网络(苏州)有限公司 | 片上调试装置和方法 |
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2019
- 2019-12-09 CN CN201911247016.1A patent/CN110988662B/zh active Active
Patent Citations (7)
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KR20010093402A (ko) * | 2000-03-28 | 2001-10-29 | 김남도 | 내장형 시스템을 위한 신속 프로토타이핑 장치 및 이를이용한 디버깅 방법 |
US20040030999A1 (en) * | 2002-08-09 | 2004-02-12 | Chun Kit Ng | Method and system for debugging using replicated logic |
US20060041803A1 (en) * | 2004-04-26 | 2006-02-23 | Agilent Technologies, Inc. | Apparatus and method for dynamic in-circuit probing of field programmable gate arrays |
US20070168749A1 (en) * | 2005-12-19 | 2007-07-19 | Stewart James B Iii | Method and system for tracing program execution in field programmable gate arrays |
CN203260029U (zh) * | 2013-04-28 | 2013-10-30 | 杭州士兰微电子股份有限公司 | 基于fpga的系统芯片原型验证调试装置 |
CN107526614A (zh) * | 2017-08-30 | 2017-12-29 | 苏州思得普信息科技有限公司 | Fpga开发板及其通信方法 |
CN110032482A (zh) * | 2019-04-11 | 2019-07-19 | 盛科网络(苏州)有限公司 | 片上调试装置和方法 |
Non-Patent Citations (1)
Title |
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何勇 等: "一种低代价零开销SoC在线调试系统设计", 《微电子学与计算机》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112148617A (zh) * | 2020-10-09 | 2020-12-29 | 中国科学技术大学 | 一种用于远程实验平台的波形采样调试方法 |
CN113504463A (zh) * | 2021-07-02 | 2021-10-15 | 芯启源(上海)半导体科技有限公司 | 一种fpga原型验证中探针信号复用方法 |
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Address after: Room 660-12, building 2, 351 GuoShouJing Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 200120 Applicant after: Shanghai Guowei silcore Technology Co.,Ltd. Address before: Room 660-12, building 2, 351 GuoShouJing Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 200120 Applicant before: S2C, Inc. |
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Address after: Room 660-12, building 2, 351 GuoShouJing Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 200120 Patentee after: Shanghai Sierxin Technology Co.,Ltd. Address before: Room 660-12, building 2, 351 GuoShouJing Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 200120 Patentee before: Shanghai Guowei silcore Technology Co.,Ltd. |