CN110988531B - High-acceleration stress screening method of frequency converter - Google Patents
High-acceleration stress screening method of frequency converter Download PDFInfo
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- CN110988531B CN110988531B CN201911195466.0A CN201911195466A CN110988531B CN 110988531 B CN110988531 B CN 110988531B CN 201911195466 A CN201911195466 A CN 201911195466A CN 110988531 B CN110988531 B CN 110988531B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/02—Vibration-testing by means of a shake table
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
Abstract
A high-acceleration stress screening method of a frequency converter comprises the following steps: determining an initial high-acceleration stress screening profile of the frequency converter; a step of effectively verifying the initial high-acceleration stress screening section; and carrying out life damage verification on the high-acceleration stress screening section passing the effective verification. The invention can obtain the high-acceleration stress screening profile which can effectively expose the potential early failure defect of the frequency converter product and can not influence the service life of the frequency converter product.
Description
Technical Field
The invention relates to a frequency converter technology.
Background
The failure in the whole life cycle of the frequency converter product is mainly divided into three stages, namely early failure, random failure and fatigue aging failure. Early failure typically occurs within 1 year. The sources of early failure defects can be divided into two categories: one is intrinsic defects, which are defects that are inherently present in the product, such as defects in materials, purchased component defects, and design defects, etc.; another category is induced defects, which are process defects introduced during production and repair, such as poor connections, cold joints, etc. Some of the early failure defects are obvious defects which can be eliminated by the conventional detection means, but potential defects which cannot be found by the conventional detection means exist, and the potential defects are the root of early failure of products. The early failure of the product not only causes economic loss to enterprises, but also reduces the intimacy of consumers and has great negative influence on the brand image of the product.
Aiming at the potential early failure defect of the frequency converter, the screening method commonly used in the industry at present is to screen the frequency converter in a high-temperature aging mode, and the method has two defects: firstly, the screening efficiency is low, the defects can be effectively exposed in more than 72 hours generally, and secondly, the mechanical defects of the frequency converter cannot be exposed.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a high-acceleration stress screening method for a frequency converter, by adopting the method, a high-acceleration stress screening profile which can effectively expose the potential early failure defect of a frequency converter product and can not influence the service life of the frequency converter product can be obtained.
According to an embodiment of the invention, the method for screening the high acceleration stress of the frequency converter comprises the following steps:
a. determining an initial high-acceleration stress screening section of the frequency converter;
the initial high acceleration stress screening section comprises high-temperature stress, low-temperature stress, duration of the high-temperature stress, duration of the low-temperature stress, temperature change rate, maximum vibration stress, minimum vibration stress, duration of the maximum vibration stress, duration of the minimum vibration stress and a mode of an electrification test;
b. A step of effectively verifying the initial high-acceleration stress screening section;
the step b further comprises the following steps: b1, injecting various defects into the tested frequency converter; b2, fixing the frequency converter injected with various defects on a vibration table of the HASS test box, enabling the input end and the output end of the frequency converter to be electrically connected with a voltage-adjustable power supply and an inductive load respectively, and then adopting the initial high-acceleration stress screening profile to carry out a cyclic test; b3, if the high-acceleration stress screening test can not expose all the implanted defects, the initial high-acceleration stress screening profile determined in the step a is not proper, the initial high-acceleration stress screening profile is modified, the step b2 is repeatedly executed until all the implanted defects can be exposed, and the high-acceleration stress screening profile passing effective verification is obtained;
c. verifying the service life damage of the high-acceleration stress screening section passing the effective verification;
the step c further comprises: c1, fixing the frequency converter without injected defects on a vibration table of the HASS test box, enabling the input end and the output end of the frequency converter to be electrically connected with the adjustable voltage power supply and the inductive load respectively, and then carrying out high acceleration stress screening according to the high acceleration stress screening section passing effective verification, wherein the screening time is 10-30 times of the test time for effectively verifying the initial high acceleration stress screening section; c2, if the frequency converter fails, modifying one or more of the duration time of the high-temperature stress, the duration time of the low-temperature stress, the duration time of the maximum vibration stress and the duration time of the minimum vibration stress of the high-acceleration stress screening section which passes effective verification, and repeatedly executing the step c1 until the screened frequency converter fails, wherein the high-acceleration stress screening section adopted when the screened frequency converter fails is used as a final high-acceleration stress screening section.
The invention has at least the following advantages:
the high-acceleration stress screening method of the embodiment of the invention reasonably determines the initial high-acceleration stress screening section, effectively verifies the initial high-acceleration stress screening section, and also verifies the service life damage of the high-acceleration stress screening section which passes the effective verification, and the obtained final high-acceleration stress screening section not only can effectively expose the potential early failure defect of the frequency converter product, but also can not influence the design service life of the frequency converter product. Because the potential defects can be efficiently exposed in the early production stage of the product, the correction measures can be quickly made, the inherent reliability level of the product is improved, the maintenance cost can be reduced, and the benefit is improved.
Drawings
Fig. 1 shows a flow diagram of a method for screening frequency converters for high acceleration stress according to an embodiment of the present invention.
FIG. 2 shows a flow chart of steps for efficiently validating an initial high-acceleration stress screening profile, according to an embodiment of the invention.
Fig. 3 shows a schematic diagram of a test environment for high acceleration stress screening of a frequency converter according to an embodiment of the invention.
Figure 4 shows a schematic of a cycling test using an initial high acceleration stress screening profile.
FIG. 5 shows a flowchart of the steps for life damage verification of a high-acceleration stress screening profile that passes effective verification, according to an embodiment of the invention.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments.
Please refer to fig. 1. According to an embodiment of the invention, a High Acceleration Stress Screening (HASS) method of a frequency converter comprises the following steps:
a. determining an initial high-acceleration stress screening profile of the frequency converter;
the initial high acceleration stress screening section comprises high-temperature stress, low-temperature stress, duration of the high-temperature stress, duration of the low-temperature stress, temperature change rate, maximum vibration stress, minimum vibration stress, duration of the maximum vibration stress, duration of the minimum vibration stress and a mode of power-on test;
in the embodiment, the high temperature stress is 75-80% of the high temperature limit temperature of the frequency converter, the low temperature stress is 75-80% of the low temperature limit temperature of the frequency converter, the duration time of the high temperature stress is 7-9 min, the duration time of the low temperature stress is 7-9 min, the temperature change rate is 40-60 ℃/min, the maximum vibration stress is 45-50% of the damage limit of the frequency converter, the minimum vibration stress is 0-5% of the damage limit of the frequency converter, the duration time of the maximum vibration stress is 4-5 min, the duration time of the minimum vibration stress is 4-5 min, the electrifying test mode is a whole-course electrifying test, and the voltage input to the frequency converter is alternatively changed according to 90-95% of the frequency converter nominal working voltage, the frequency converter nominal working voltage and 105-110% of the frequency converter nominal working voltage, the power-on mode can effectively test the capability of the frequency converter product for resisting impulse voltage; optionally, the input voltage of the frequency converter is kept equal to the time of 90% -95% of the nominal working voltage of the frequency converter, the time of the nominal working voltage of the frequency converter and the time of 105% -110% of the nominal working voltage of the frequency converter;
b. A step of effectively verifying the initial high-acceleration stress screening section;
as shown in fig. 2 to fig. 4, step b further includes: b1, injecting various defects into the tested frequency converter; the selection of the defect type is related to the faults of the frequency converter product, including but not limited to board looseness, poor welding and the like; b2, fixing the frequency converter 9 injected with various defects on a vibration table 11 of the HASS test box 1 through a clamp, electrically connecting the input end and the output end of the frequency converter with the voltage-adjustable power supply 2 and the inductive load 3 respectively, and then carrying out a high-acceleration stress screening test by adopting an initial high-acceleration stress screening section; in the embodiment, the voltage-adjustable power supply 2 and the inductive load 3 are both arranged outside the HASS test box 1, the inductive load 3 can detect the current output capability of the frequency converter, and the inductive load can adopt a reactor; b3, if the high-acceleration stress screening can not expose all the implanted defects, the initial high-acceleration stress screening profile determined in the step a is not proper, the initial high-acceleration stress screening profile is modified, the step b2 is repeatedly executed until all the implanted defects can be exposed, and a high-acceleration stress screening profile passing effective verification is obtained;
Figure 4 shows a schematic of a cycling test using an initial high acceleration stress screening profile. In the example of fig. 4, the magnitude of the high temperature stress is 80 ℃, the magnitude of the low temperature stress is-40 ℃, the duration of the high temperature stress and the duration of the low temperature stress are both 8min, the temperature change rate is 50 ℃/min (the temperature rise rate and the temperature fall rate are equal), the magnitude of the maximum vibration stress is 40Grms, the magnitude of the minimum vibration stress is 0, the duration of the maximum vibration stress and the duration of the minimum vibration stress are both 5min, the test for effectively verifying the high acceleration stress screening profile comprises 3 cycles (4 times, 5 times and the like in other embodiments) of the high acceleration stress screening profile, and the time of each cycle is equal to 2 times of the sum of the duration of the maximum vibration stress and the duration of the minimum vibration stress, namely 20 min. In addition, in the whole test period, the voltage input to the frequency converter is alternatively changed according to 90% of the nominal working voltage of the frequency converter, the nominal working voltage of the frequency converter and 110% of the nominal working voltage of the frequency converter, and the input voltage is kept to be equal to the time of 90% of the nominal working voltage of the frequency converter, the time of 110% of the nominal working voltage of the frequency converter and the time of the nominal working voltage of the frequency converter, namely, the input voltage is kept for 1min respectively;
c. Verifying the service life damage of the high-acceleration stress screening section passing the effective verification;
referring to fig. 5, step c further includes: c1, fixing the frequency converter without injected defects on a vibration table 11 of the HASS test box 1, enabling the input end and the output end of the frequency converter to be electrically connected with the voltage-adjustable power supply 2 and the inductive load 3 respectively, then carrying out high-acceleration stress screening according to the high-acceleration stress screening section which passes effective verification, wherein the screening time is 10-30 times of the test time for effectively verifying the initial high-acceleration stress screening section (in the figure 4, the test time for effectively verifying the initial high-acceleration stress screening section is 60 min); c2, if the frequency converter fails, modifying one of the duration time of the high-temperature stress, the duration time of the low-temperature stress, the duration time of the maximum vibration stress and the duration time of the minimum vibration stress of the high-acceleration stress screening section which passes the effective verification, and repeatedly executing the step c1 until the screened frequency converter fails, wherein the high-acceleration stress screening section adopted when the screened frequency converter fails is used as the final high-acceleration stress screening section. If no fault occurs, the frequency converter product still has at least 90% of the effective life after being screened according to the HASS scheme.
After the final high-acceleration stress screening profile is determined, the final high-acceleration stress screening profile can be used for carrying out high-acceleration stress screening on the frequency converter product, and the product is continuously monitored in the screening process. Recording the information of the screened prototype, wherein the information to be recorded comprises: serial number of the sample, screening date, presence or absence of defect, description of defect, root cause of defect, follow-up control measures, and the like. In addition, the failure rate needs to be analyzed, 100% of samples are screened in the initial screening, and when the failure rate is reduced enough to meet the internal and external requirements, the sample amount is reduced to 50%, 25% and 12%, and finally reduced to 6%. If at any time the failure rate exceeds the selected maximum failure rate, the sample size is increased to 100% until corrective action is taken to bring the failure rate back to an acceptable level. Experiments show that the early failure rate of the product can be reduced to be within 0.5% by adopting high-acceleration stress screening.
Claims (7)
1. A high acceleration stress screening method of a frequency converter is characterized by comprising the following steps:
a. determining an initial high-acceleration stress screening profile of the frequency converter;
the initial high acceleration stress screening section comprises high-temperature stress, low-temperature stress, duration of the high-temperature stress, duration of the low-temperature stress, temperature change rate, maximum vibration stress, minimum vibration stress, duration of the maximum vibration stress, duration of the minimum vibration stress and a mode of power-on test; the power-on test mode is a full-course power-on test, and the voltage input to the frequency converter is alternatively changed according to 90-95% of the nominal working voltage of the frequency converter, 105-110% of the nominal working voltage of the frequency converter;
b. Carrying out effective verification on the initial high-acceleration stress screening section;
the step b further comprises the following steps: b1, injecting various defects into the tested frequency converter; b2, fixing the frequency converter injected with various defects on a vibration table of a HASS test box, enabling the input end and the output end of the frequency converter to be electrically connected with an adjustable voltage power supply and an inductive load respectively, and then adopting the initial high-acceleration stress screening profile to carry out a cycle test; b3, if the high-acceleration stress screening test can not expose all the injected defects, the initial high-acceleration stress screening profile determined in the step a is not proper, the initial high-acceleration stress screening profile is modified, the step b2 is repeatedly executed until all the injected defects can be exposed, and a high-acceleration stress screening profile passing effective verification is obtained;
c. carrying out life damage verification on the high-acceleration stress screening section which passes the effective verification;
the step c further comprises the following steps: c1, fixing the frequency converter without defect injection on a vibration table of the HASS test box, enabling the input end and the output end of the frequency converter to be electrically connected with the adjustable voltage power supply and the inductive load respectively, and then carrying out high acceleration stress screening according to the high acceleration stress screening section passing effective verification, wherein the screening time is 10-30 times of the test time of the test for carrying out effective verification on the initial high acceleration stress screening section; c2, if the frequency converter fails, modifying one or more of the duration time of the high-temperature stress, the duration time of the low-temperature stress, the duration time of the maximum vibration stress and the duration time of the minimum vibration stress of the high-acceleration stress screening section which pass the effective verification, and repeatedly executing the step c1 until the screened frequency converter fails, wherein the high-acceleration stress screening section adopted when the screened frequency converter fails is used as the final high-acceleration stress screening section.
2. The method for screening high accelerated stress of frequency converter according to claim 1, wherein the magnitude of the high temperature stress is 75 to 80% of the high temperature limit temperature of the frequency converter, the magnitude of the low temperature stress is 75 to 80% of the low temperature limit temperature of the frequency converter, the duration of the high temperature stress is 7 to 9min, the duration of the low temperature stress is 7 to 9min, the rate of temperature change is 40 to 60 ℃/min, the magnitude of the maximum vibration stress is 45 to 50% of the breakdown limit of the frequency converter, the magnitude of the minimum vibration stress is 0 to 5% of the breakdown limit of the frequency converter, the duration of the maximum vibration stress is 4 to 5min, and the duration of the minimum vibration stress is 4 to 5 min.
3. The method of claim 1, wherein the input voltage of the frequency converter is maintained at 90% -95% of the nominal operating voltage of the frequency converter, at 105% -110% of the nominal operating voltage of the frequency converter, for the same time.
4. 4-method for screening high acceleration stress of frequency converter according to claim 2 or 3, characterized in that in step b2, the test for effective verification of the high acceleration stress screening profile comprises 3-5 cycles of the high acceleration stress screening profile, each cycle having a time equal to 2 times the sum of the duration of the maximum vibrational stress and the duration of the minimum vibrational stress.
5. Method for high acceleration stress screening of frequency converters according to claim 4, characterized in that the duration of the maximum vibration stress is equal to the duration of the minimum vibration stress.
6. The method for high acceleration stress screening of frequency converters according to claim 1, characterized in that the adjustable voltage power supply and the inductive load are both arranged outside the HASS test chamber.
7. The method for screening high acceleration stress of frequency converter according to claim 1, characterized in that the inductive load is a reactor.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5767406A (en) * | 1996-09-30 | 1998-06-16 | Ford Motor Company | Method to specify random vibration tests for product durability validation |
| CN102193054A (en) * | 2010-03-03 | 2011-09-21 | 上海微电子装备有限公司 | Method for determining highly accelerated stress screening test condition |
| CN102426313A (en) * | 2011-10-20 | 2012-04-25 | 西安航空制动科技有限公司 | Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft |
| CN109657319A (en) * | 2018-12-11 | 2019-04-19 | 上海航天精密机械研究所 | A kind of HASS test validity verification method based on emulation implantation defect |
| CN109783850A (en) * | 2018-12-08 | 2019-05-21 | 西安电子科技大学 | The residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5767406A (en) * | 1996-09-30 | 1998-06-16 | Ford Motor Company | Method to specify random vibration tests for product durability validation |
| CN102193054A (en) * | 2010-03-03 | 2011-09-21 | 上海微电子装备有限公司 | Method for determining highly accelerated stress screening test condition |
| CN102426313A (en) * | 2011-10-20 | 2012-04-25 | 西安航空制动科技有限公司 | Highly-accelerated stress screening (HASS) method of anti-skidding brake control box of aircraft |
| CN109783850A (en) * | 2018-12-08 | 2019-05-21 | 西安电子科技大学 | The residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest |
| CN109657319A (en) * | 2018-12-11 | 2019-04-19 | 上海航天精密机械研究所 | A kind of HASS test validity verification method based on emulation implantation defect |
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