CN110988500A - Material microwave reflection characteristic measurement method based on time domain ultra-narrow pulse signal - Google Patents
Material microwave reflection characteristic measurement method based on time domain ultra-narrow pulse signal Download PDFInfo
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Abstract
The invention belongs to the technical field of microwave materials, and discloses a material microwave reflection characteristic measuring method based on time domain ultra-narrow pulse signals, which adopts ultra-short pulses as a signal source, separates external signals, walls, ceilings and leakage signals through a rapid synchronous signal sampling technology and a time window clutter filtering technology, and obtains a test main signal with high resolution in a large dynamic range through repeated measurement and analysis processing of digital filtering; and finally presenting the measurement result after the software analysis processing. The invention adopts the ultra-narrow pulse signal generator and the high-speed sampling receiver, the tested piece is directly scanned by the time domain scanning signal, the high-speed sampling receiver can directly distinguish the tested piece from the reflected signal of the background on the time domain, the test can be realized without a microwave darkroom, the system construction cost is greatly reduced, the ultra-wide frequency domain response characteristic of the ultra-narrow pulse signal is obviously improved, and the test efficiency is obviously improved without maintenance.
Description
Technical Field
The invention belongs to the technical field of microwave materials, and particularly relates to a material microwave reflection characteristic measuring method based on a time domain ultra-narrow pulse signal.
Background
Currently, the closest prior art: for the microwave reflection characteristic test of materials, the prior art mostly adopts a frequency domain method and tests in a echo-free darkroom. The frequency domain test system needs a matched microwave darkroom, has high construction cost, needs a plurality of groups of feed sources, has low test efficiency, cannot continuously test in a large scale, has strict daily maintenance requirement of the darkroom, and needs maintenance cost throughout the year.
In summary, the problems of the prior art are as follows: the time domain test system in the prior art does not directly scan the tested piece through a time domain scanning signal, and needs a microwave darkroom to realize the test, so that the system construction cost is very high, the test efficiency is very low, and the practicability of the outfield test is poor.
The difficulty of solving the technical problems is as follows: according to the frequency domain test principle, the measurement must be carried out under the condition of no environmental reflection interference, so the measurement must be carried out in a darkroom;
the significance of solving the technical problems is as follows: a new scheme for measuring the microwave reflection characteristic of the material can be provided, the test cost is reduced, the test efficiency is improved, and the development and application of the wave absorbing material and the wave transmitting material are greatly promoted;
disclosure of Invention
Aiming at the problems in the prior art, the invention provides a material microwave reflection characteristic measuring method based on a time domain ultra-narrow pulse signal.
The invention is realized in this way, a material microwave reflection characteristic measurement method based on time domain ultra-narrow pulse signals, comprising the following steps:
the ultra-narrow pulse is used as a signal source, the ultra-narrow pulse irradiates a measured piece after being transmitted by an antenna, the distance between the measured piece and a background environment to a transmitting and receiving antenna is different, the signal transmission time is different, the measured piece and the background environment can be distinguished from each other in a time domain through a high-speed sampling receiver, a reflected signal of the background environment can be filtered out by adding time domain gate filtering, a main signal of the measured piece is reserved, and a measurement result is displayed in a frequency domain after fast Fourier inversion.
And finally presenting the measurement result after the analysis and the processing of software carried by a control computer.
As shown in fig. 4, the control computer generates a control command, the pulse signal source sends out a pulse signal, the pulse signal is transmitted to the transmitting antenna through the output port of the signal source, and the sampling receiver collects the pulse signal as a reference value; after the pulse signal is sent out by the transmitting antenna, the pulse signal irradiates a tested piece and a background environment to generate a reflected signal, and the reflected signal is received by the receiving antenna and transmitted to the sampling receiver; the control computer acquires the data back number of the receiver, expands the data back number in a time domain, distinguishes a background environment and a reflection signal of a detected piece by using a time window technology, filters the reflection signal of the background by adding a time domain gate, and only keeps the reflection signal of the detected piece; and comparing the signal with a reference value to obtain a time domain result of the reflection characteristic of the measured piece, and performing fast Fourier inverse transformation on the result to obtain a frequency domain result.
Further, the ultrashort pulse is a 30ps pulse source.
Further, the time window clutter filtering technique includes:
1) filtering of the synchronous reflected signal: the synchronous reflected signal is separated in time from the direct main signal in time;
2) filtering of external interference noise: external interference noise and a test signal are converted into white noise through SP, and the white noise is removed or averaged through frequency band calculation, so that noise interference is reduced.
Further, the method of acquiring a test main signal further includes:
based on the time window clutter filtering technology, the transmitted and received pulse signals are all pulse signals in the time domain, the time for the test main signal and the time for the reflection, diffraction or other interference signals to reach the tested target are different, the test main signal and the reflection, diffraction or other interference signals are mutually separated on the time axis, the reflection signals and the interference signals are blocked outside the time window by selecting the size of the time window and moving the position of the time window, and only the main signal in the time window is tested.
Another object of the present invention is to provide a material microwave reflection characteristic measurement system based on a time domain ultra-narrow pulse signal, which implements the material microwave reflection characteristic measurement method based on the time domain ultra-narrow pulse signal, and the material microwave reflection characteristic measurement system based on the time domain ultra-narrow pulse signal includes:
the sampling exchanger is connected with the azimuth control unit and is used for exchanging communication between test hardware of the target to be tested and the control computer;
the sampler interface is connected with the sampling exchanger and used for inputting an external signal into the sampler;
the signal generator host is connected with the sampling exchanger and used for generating pulse signals;
the signal generator port is connected with the signal generator host and used for outputting pulse signals;
the directional coupler is connected with the sampling exchanger and is used for unidirectionally transmitting the signal of the signal source to the transmitting antenna;
the transmitting antenna is connected with the directional coupler and used for transmitting signals;
the receiving antenna is connected with the sampler interface and used for receiving signals;
the azimuth platform is connected with the control computer and used for placing the target to be measured;
the azimuth control unit is connected with the control computer, controls the azimuth of the target and adjusts the test angle;
and the control computer is used for carrying out Fourier transform, distinguishing coupling signals among the measured piece, the background wall and the antenna in a frequency domain, and filtering signals except a reflected signal of the measured piece by the time domain gate to realize measurement.
And the amplifier is connected with the receiving antenna and used for amplifying the received signal.
The invention also aims to provide an information data processing terminal for realizing the method for measuring the microwave reflection characteristics of the material based on the time domain ultra-narrow pulse signal.
Another object of the present invention is to provide a computer-readable storage medium, which includes instructions that, when executed on a computer, cause the computer to execute the method for measuring microwave reflection characteristics of a material based on a time-domain ultra-narrow pulse signal.
In summary, the advantages and positive effects of the invention are:
the time domain test system provided by the invention adopts the ultra-narrow pulse signal generator and the high-speed sampling receiver, the tested piece is directly scanned by the time domain scanning signal, the high-speed sampling receiver can directly distinguish the tested piece from the reflected signal of the background on the time domain, the test can be realized without a microwave dark room, the system construction cost is greatly reduced, the ultra-wide frequency domain response characteristic of the ultra-narrow pulse signal is realized, the test efficiency is obviously improved, and the maintenance is basically not required; and the time domain test system has small volume of used equipment, can move along with the vehicle and is suitable for external field test.
The system test results were highly consistent with the standard RCS darkroom test values for the same sample, as shown in the graph of fig. 6.
Drawings
Fig. 1 is a flowchart of a method for measuring microwave reflection characteristics of a material based on a time-domain ultra-narrow pulse signal according to an embodiment of the present invention.
Fig. 2 is a diagram of 30ps pulses and their corresponding spectral components provided by an embodiment of the present invention.
In the figure: (a) 30ps of ultrashort pulses; (b) and a spectrum component diagram.
Fig. 3 is a schematic block diagram of time window filtering according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of measuring microwave reflection characteristics of a material based on a time-domain ultra-narrow pulse signal according to an embodiment of the present invention.
Fig. 5 is a schematic diagram of a measurement system for measuring a characteristic parameter of a material according to an embodiment of the present invention.
FIG. 6 is a graph showing the high degree of agreement between the system test results and the standard RCS darkroom test values for the same sample, according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The time domain test system in the prior art does not directly scan the tested piece through a time domain scanning signal, and needs a microwave darkroom to realize the test, so that the system construction cost is very high, the test efficiency is very low, and the practicability of the outfield test is poor.
Aiming at the problems in the prior art, the invention provides a material microwave reflection characteristic measurement system based on a time domain ultra-narrow pulse signal, and the invention is described in detail below with reference to the accompanying drawings.
As shown in fig. 1, a method for measuring microwave reflection characteristics of a material based on a time-domain ultra-narrow pulse signal according to an embodiment of the present invention includes:
s101, ultra-short pulse is used as a signal source, clutter filtering technology is carried out through a rapid synchronous signal sampling technology and a time window, analysis processing of repeated measurement and digital filtering is carried out, external signals, walls, ceilings and leakage signals are isolated, and a test main signal is obtained in a high-resolution mode within a large dynamic range.
And S102, analyzing and processing by a control computer, and finally presenting a measurement result.
In this embodiment of the present invention, the ultrashort pulse in step S101 is a 30ps pulse source. In the embodiment of the invention, the time window clutter filtering technology comprises the following steps:
1) filtering of the synchronous reflected signal: the synchronous reflected signal is separated in time from the direct main signal, in time.
2) Filtering of external interference noise: external interference noise and a test signal are converted into white noise through SP, and the white noise is removed or averaged through frequency band calculation, so that noise interference is reduced.
In an embodiment of the present invention, the method for acquiring a test main signal further includes:
based on the time window clutter filtering technology, the transmitted and received pulse signals are all pulse signals in the time domain, the time for the test main signal and the time for the reflection, diffraction or other interference signals to reach the tested target are different, the test main signal and the reflection, diffraction or other interference signals are mutually separated on the time axis, the reflection signals and the interference signals are blocked outside the time window by selecting the size of the time window and moving the position of the time window, and only the main signal in the time window is tested.
In the embodiment of the invention, the time domain measurement refers to a measurement method for acquiring time domain response data in a direct or indirect mode and then obtaining the frequency characteristics of an object to be measured through Fast Fourier Transform (FFT). Time domain measurements are further classified into direct time domain measurements and indirect time domain measurements. The direct time domain measurement adopts an impulse signal source, and uses an ultra-high speed real-time sampling receiver or an equivalent sampling receiver to complete the signal receiving and obtain time domain response data. Because the impulse signal has extremely short duration and rapid change of the front edge and the rear edge, the impulse signal has a wide frequency spectrum range (the narrower the impulse is, the richer the frequency spectrum component is); an extremely narrow range gate is arranged in the signal receiving process, so that the measurement error caused by factors such as multipath effect, reactive field coupling and the like is reduced to the minimum.
In step S102, the software is loaded on the control computer.
As a preferred embodiment, as shown in fig. 4, a method for measuring microwave reflection characteristics of a material based on a time-domain ultra-narrow pulse signal according to an embodiment of the present invention includes: the control computer generates a control instruction, the pulse signal source sends out a pulse signal which is transmitted to the transmitting antenna through an output port of the signal source, and the sampling receiver collects the pulse signal as a reference value; after the pulse signal is sent out by the transmitting antenna, the pulse signal irradiates a tested piece and a background environment to generate a reflected signal, and the reflected signal is received by the receiving antenna and transmitted to the sampling receiver; the control computer acquires the data back number of the receiver, expands the data back number in a time domain, distinguishes a background environment and a reflection signal of a detected piece by using a time window technology, filters the reflection signal of the background by adding a time domain gate, and only keeps the reflection signal of the detected piece; and comparing the signal with a reference value to obtain a time domain result of the reflection characteristic of the measured piece, and performing fast Fourier inverse transformation on the result to obtain a frequency domain result.
The invention is further described with reference to specific examples.
Example 1
The following is a typical 30ps ultrashort pulse signal and its corresponding spectrogram (fig. 2): from the figure, a narrow pulse signal with a pulse duration of 30ps can be seen, which contains spectral components starting at least from dc and with a maximum frequency range of even up to 30 GHz.
Therefore, theoretically, various time domain measurements in the frequency range to 30GHz can be realized by using a 30ps narrow pulse as a signal source.
Time window filtering principle of the time domain measurement system:
a typical TIME WINDOW (TIME WINDOW) filtering principle for a TIME domain measurement system is shown in fig. 3. The method comprises the following specific steps:
1) filtering of the synchronous reflected signal: since the path followed by the synchronous reflected signal is long, it lags behind the direct main signal in time and is distinguishable from the main signal in time.
2) Filtering of external interference noise: the external interference noise and the test signal are asynchronous, and they are only converted into white noise by SP, and are erased or can be averaged by frequency band calculation, so that the noise interference is reduced.
Based on the time window filtering principle, in the scheme of the time domain measuring system, the transmitted and received pulse signals are all pulse signals on the time domain, and because the time for the main test signal and the reflected, diffracted or other interference signals to reach the measured target is different, the main test signal and the reflected, diffracted or other interference signals are mutually separated on the time axis, so that the reflected signal and the interference signals can be blocked outside the time window by selecting the size of the time window and moving the position of the time window, and only the signals in the time window are tested, thereby ensuring the accuracy and precision of the test result.
Example 2
In the test system, ultrashort pulses are used as a signal source (such as a 30ps pulse source), clutter is filtered by a rapid synchronous signal sampling technology and a time window, and external signals, walls, ceilings and leakage signals are isolated by repeated measurement and analysis processing of digital filtering, so that a required real signal, namely a test main signal, is obtained in a large dynamic range at high resolution, and a measurement result is finally presented after the test main signal is analyzed and processed by software.
The working principle of each measuring system is shown in fig. 4 and 5, a signal generator generates pulse signals, the pulse signals are transmitted by a transmitting antenna after passing through a coupler, reflected signals are transmitted to a sampling receiver by a receiving antenna after irradiating a measured piece (a measured object), coupling signals among the measured piece, a background wall and the antenna are distinguished in a frequency domain after Fourier transform is carried out by software, and signals except the reflected signals of the measured piece are filtered by a time domain gate to realize measurement.
FIG. 4 is a reflection characteristic and two-dimensional imaging schematic diagram of a target model part, namely a material microwave reflection characteristic measurement based on a time domain ultra-narrow pulse signal; the method specifically comprises the following steps:
sampling converter, testing hardware and control computer exchange communication.
And the Sampling header sampler interface inputs an external signal into the interface of the sampler.
The Generator mainframe signal Generator main machine generates a pulse signal.
And a Generator head signal Generator port for outputting a pulse signal.
And the Directional coupler unidirectionally transmits the signal of the signal source to the transmitting antenna.
And a Transmitting antenna for Transmitting signals.
The Receiving antenna receives a signal.
And the Posoloner azimuth table is used for placing the object to be measured.
And the locator control unit controls the target azimuth and adjusts the test angle.
And the control computer is used for carrying out Fourier transform, distinguishing coupling signals among the measured piece, the background wall and the antenna in a frequency domain, and filtering signals except a reflected signal of the measured piece by the time domain gate to realize measurement.
In the embodiment of the invention, the composition of the measuring system for measuring the characteristic parameters of the material is shown in FIG. 5, the same system as FIG. 4 is in a state of different application occasions, and FIG. 5 shows the reflectivity of the material.
Fig. 5 provides a system based on fig. 4 with an amplifier, for amplifying the received signal.
The invention thus makes it possible to use a set of hardware devices to achieve both the time-domain measurement of material property parameters and the RCS & ISAR2D time-domain measurement.
The invention is further described below in connection with the experimental set-up.
The experimental results are as follows: the system test results were highly consistent with the standard RCS darkroom test values for the same sample, as shown in the graph of fig. 6.
In the above embodiments, the implementation may be wholly or partially realized by software, hardware, firmware, or any combination thereof. When used in whole or in part, can be implemented in a computer program product that includes one or more computer instructions. When loaded or executed on a computer, cause the flow or functions according to embodiments of the invention to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another, for example, the computer instructions may be transmitted from one website site, computer, server, or data center to another website site, computer, server, or data center via wire (e.g., coaxial cable, fiber optic, Digital Subscriber Line (DSL), or wireless (e.g., infrared, wireless, microwave, etc.)). The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device, such as a server, a data center, etc., that includes one or more of the available media. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., Solid State Disk (SSD)), among others.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A material microwave reflection characteristic measurement method based on a time domain ultra-narrow pulse signal is characterized by comprising the following steps:
the method comprises the steps of adopting ultrashort pulses as a signal source, isolating external signals, walls, ceilings and leakage signals through a rapid synchronous signal sampling technology, a time window clutter filtering technology and analysis processing of repeated measurement and digital filtering, obtaining a test main signal in a high-resolution mode within a large dynamic range, and finally presenting a measurement result after analysis processing.
2. The method for measuring microwave reflection characteristics of materials based on time domain ultra-narrow pulse signals according to claim 1, wherein the ultra-short pulse is a 30ps pulse source.
3. The method for measuring the microwave reflection characteristic of the material based on the time domain ultra-narrow pulse signal as claimed in claim 1, wherein the time window clutter filtering technique comprises:
1) filtering of the synchronous reflected signal: the synchronous reflected signal is separated in time from the direct main signal in time;
2) filtering of external interference noise: external interference noise and a test signal are converted into white noise through SP, and the white noise is removed or averaged through frequency band calculation, so that noise interference is reduced.
4. The method for measuring microwave reflection characteristics of a material based on a time domain ultra-narrow pulse signal according to claim 1, wherein the method for obtaining the test main signal further comprises:
based on the time window clutter filtering technology, the transmitted and received pulse signals are all pulse signals in the time domain, the time for the test main signal and the time for the reflection, diffraction or other interference signals to reach the tested target are different, the test main signal and the reflection, diffraction or other interference signals are mutually separated on the time axis, the reflection signals and the interference signals are blocked outside the time window by selecting the size of the time window and moving the position of the time window, and only the main signal in the time window is tested.
5. The method for measuring the microwave reflection characteristics of the material based on the time domain ultra-narrow pulse signal as claimed in claim 1, wherein the method for measuring the microwave reflection characteristics of the material based on the time domain ultra-narrow pulse signal specifically comprises:
step one, a control computer generates a control instruction, a pulse signal source sends out a pulse signal, the pulse signal is transmitted to a transmitting antenna through an output port of the signal source, and a sampling receiver collects the pulse signal as a reference value;
secondly, after the pulse signal is sent out by the transmitting antenna, the pulse signal irradiates a tested piece and a background environment to generate a reflected signal, and the reflected signal is received by the receiving antenna and transmitted to the sampling receiver;
step three, after the control computer acquires the receiver data, the acquired receiver data is spread in a time domain, a time window technology is utilized to distinguish a background environment from a reflection signal of a detected piece, a time domain gate is added to filter the reflection signal of the background, and only the reflection signal of the detected piece is reserved; and comparing the signal with a reference value to obtain a time domain result of the reflection characteristic of the measured piece, and performing fast Fourier inverse transformation on the result to obtain a frequency domain result.
6. The system for measuring the microwave reflection characteristics of the material based on the time domain ultra-narrow pulse signal, which implements the method for measuring the microwave reflection characteristics of the material based on the time domain ultra-narrow pulse signal according to claim 1, is characterized in that the system for measuring the microwave reflection characteristics of the material based on the time domain ultra-narrow pulse signal comprises:
the sampling exchanger is connected with the unit of the sampling receiver and the control computer, transmits the result of the receiver to the control computer and receives the instruction signal of the control computer;
the sampler port is used for sampling a unit of the receiver and is used for receiving an external signal by the receiver;
the signal generator host is connected with the sampling exchanger and used for receiving the control command to generate a pulse signal;
the signal generator output end is connected with the signal generator host and used for outputting a pulse signal to a next unit;
the directional coupler is connected with the output end of the signal source, transmits the signal of the signal source to the transmitting antenna in a single direction, and prevents the port from reflecting the signal back to the signal source;
the transmitting antenna is connected with the directional coupler and used for transmitting the pulse signal generated by the signal source;
the receiving antenna is connected with the sampler interface and used for receiving the reflected signal;
the azimuth platform is connected with the control computer and used for placing the target to be tested and adjusting the test angle of the target;
the azimuth control unit is connected with the control computer, controls the azimuth of the target and adjusts the test angle;
and the control computer is used for generating a control instruction, acquiring data, performing software processing on the test data and controlling a functional structure connected with the control computer.
7. The system for measuring the microwave reflection characteristics of materials based on the time domain ultra-narrow pulse signals as claimed in claim 6, wherein the control computer is used for controlling the signal source and the receiver to work, collecting data, performing software processing on the data to perform inverse Fourier transform, distinguishing coupling signals among the measured piece, a background wall and an antenna in a frequency domain, and filtering signals except the reflection signals of the measured piece by the time domain gate to realize measurement.
8. The time-domain ultra-narrow pulse signal-based material microwave reflection characteristic measurement system of claim 6, wherein the time-domain ultra-narrow pulse signal-based material microwave reflection characteristic measurement system further comprises:
and the amplifier is connected with the receiving antenna and used for amplifying the received signal.
9. An information data processing terminal for implementing the method for measuring the microwave reflection characteristic of the material based on the time domain ultra-narrow pulse signal according to any one of claims 1 to 5.
10. A computer-readable storage medium comprising instructions that, when executed on a computer, cause the computer to perform the method for measuring microwave reflection characteristics of a material based on a time-domain ultra-narrow pulse signal according to any one of claims 1 to 5.
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| CN103592317A (en) * | 2013-11-07 | 2014-02-19 | 中国电子科技集团公司第四十一研究所 | Calibrating ball based wave-absorbing material reflectivity testing method |
| CN105182329A (en) * | 2015-10-09 | 2015-12-23 | 上海无线电设备研究所 | Small bistation angle composite reflection characteristic time domain measurement method |
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