CN110968516A

CN110968516A - Application memory testing method and device and computer storage medium

Info

Publication number: CN110968516A
Application number: CN201911229524.7A
Authority: CN
Inventors: 田书婷
Original assignee: Beijing Xiaomi Mobile Software Co Ltd
Current assignee: Beijing Xiaomi Mobile Software Co Ltd
Priority date: 2019-12-04
Filing date: 2019-12-04
Publication date: 2020-04-07

Abstract

The disclosure relates to an application memory test method and device and a computer storage medium, belonging to the technical field of information; the application memory test method comprises the following steps: obtaining a test parameter; the test parameters at least comprise the name of an application installation package of the application to be tested; determining an application to be tested based on the test parameters; performing memory test on the application to be tested to obtain a memory test result; and outputting the memory test result.

Description

Application memory testing method and device and computer storage medium

Technical Field

The present disclosure relates to the field of information technology, and in particular, to a method and an apparatus for testing an application memory, and a computer storage medium.

Background

The memory test is one of the essential items for the Android performance test, and the importance of the memory test can be seen. Because if the Memory Of an Application (APP) is too high, the Out Of Memory (OOM) may be caused, and the program crashes, the Application card may be slow, which affects the user experience. Therefore, detecting whether the APP memory is abnormal is an urgent technical problem to be solved.

Disclosure of Invention

The disclosure provides an application memory test method, an application memory test device and a computer storage medium.

According to a first aspect of the embodiments of the present disclosure, there is provided an application memory testing method, applied to a client, including:

obtaining a test parameter; the test parameters at least comprise the name of an application installation package of the application to be tested;

determining an application to be tested based on the test parameters;

performing memory test on the application to be tested to obtain a memory test result;

and outputting the memory test result.

In the above scheme, the performing a memory test on the application to be tested includes:

performing a first test on a foreground, wherein the first test is a test for simulating a user to operate the application to be tested so as to run the application to be tested;

and carrying out memory test in the background.

In the foregoing solution, the performing the memory test at the background includes:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

In the foregoing solution, the executing the memory usage test on the application to be tested includes:

and calling a monitoring process tool, and executing a memory occupation test on the application to be tested to obtain a memory trend curve of the application to be tested.

In the foregoing solution, the executing the memory leak test on the application to be tested includes:

and calling a memory leakage monitoring tool, and executing a memory leakage test on the application to be tested to obtain a memory leakage result of the application to be tested.

According to a second aspect of the embodiments of the present disclosure, there is provided an application memory testing apparatus, including:

an acquisition module configured to acquire test parameters; the test parameters at least comprise the name of an application installation package of the application to be tested;

a determination module configured to determine an application to be tested based on the test parameters;

the test module is used for carrying out memory test on the application to be tested to obtain a memory test result;

and the output module is used for outputting the memory test result.

In the above solution, the test module is configured to:

and carrying out memory test in the background.

In the above solution, the test module is configured to:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

In the above solution, the test module is configured to:

According to a third aspect of the embodiments of the present disclosure, there is provided an application memory testing apparatus, including:

a processor;

a memory for storing executable instructions;

wherein the processor is arranged to: when the executable instructions are executed, the method for testing an application memory according to any one of the aspects of the first aspect of the embodiment of the present disclosure is implemented.

According to a fourth aspect of the embodiments of the present disclosure, there is provided a computer storage medium, in which executable instructions are stored, and when the executable instructions are executed by a processor, the processor is enabled to execute the application memory testing method according to any one of the aspects of the first aspect of the embodiments of the present disclosure.

The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects:

obtaining a test parameter; the test parameters at least comprise the name of an application installation package of the application to be tested; determining an application to be tested based on the test parameters; performing memory test on the application to be tested to obtain a memory test result; outputting the memory test result; therefore, the memory test of the application installed in the electronic equipment can be realized at the client, the memory test result is output, and the client user can conveniently know the memory occupation condition of the application in the running process, so that the client user can be helped to visually evaluate the application.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.

Fig. 1 is a schematic flow chart illustrating an application memory test method according to an exemplary embodiment;

FIG. 2 is a diagram illustrating a memory footprint trend curve according to an exemplary embodiment;

FIG. 3 is a schematic diagram illustrating a test flow for automatically detecting application memory at a client according to an illustrative embodiment;

FIG. 4 is a block diagram illustrating an application memory test device in accordance with an illustrative embodiment;

fig. 5 is a block diagram illustrating a smart device 800 for implementing application memory testing in accordance with an example embodiment.

Detailed Description

Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the examples of the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the embodiments of the application, as detailed in the appended claims.

The terminology used in the embodiments of the present disclosure is for the purpose of describing particular embodiments only and is not intended to be limiting of the embodiments of the present disclosure. As used in the disclosed embodiments and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items.

It is to be understood that although the terms first, second, third, etc. may be used herein to describe various information in the embodiments of the present disclosure, such information should not be limited by these terms. These terms are only used to distinguish one type of information from another. For example, first information may also be referred to as second information, and similarly, second information may also be referred to as first information, without departing from the scope of embodiments of the present disclosure. The words "if" and "if" as used herein may be interpreted as "at … …" or "at … …" or "in response to a determination", depending on the context.

Example one

Fig. 1 is a flowchart illustrating an application memory testing method according to an exemplary embodiment, and as shown in fig. 1, the application memory testing method may be applied to clients of various smart devices, including but not limited to fixed devices and mobile devices, for example, the fixed devices include but not limited to: personal Computers (PCs), televisions, and the like; the mobile devices include, but are not limited to: cell-phones, tablet computer, wearable equipment etc.. Various applications are installed on the intelligent device, and the applications can be applications carried by the electronic device when the electronic device leaves a factory or third-party applications. In some possible implementations, the application of the memory test method may be implemented by a processor calling computer readable instructions stored in a memory. As shown in fig. 1, the method for testing an application memory includes the following steps.

In step S11, test parameters are acquired; the test parameters at least comprise the name of an application installation package of the application to be tested;

in step S12, determining an application to be tested based on the test parameters;

in step S13, performing a memory test on the application to be tested to obtain a memory test result;

in step S14, the memory test result is output.

In the embodiment of the present disclosure, the test parameters may further include one or more of the following:

proceeding;

a process memory threshold;

and testing the number of rounds.

In practical application, the test parameters can be input by a user according to test requirements, and the user can be a high-level user such as a research and development or a tester, and can also be a common user.

Exemplarily, a memory test application for performing a memory test on an application is installed on the smart device, the test application presents a test parameter input interface after receiving an opening operation, and a user can input at least one test parameter on the test parameter input interface, that is, the name of an application installation package of the application to be tested, which may be referred to as a package name for short, and is represented by a package _ name; one or more of other test parameters can be input, such as a process, which is represented by a process; the process memory threshold is represented by max _ memory _ size; the number of test rounds is denoted by n. Therefore, the client side can conveniently test according to the user requirements such as the number of test rounds. And after receiving the test request operation, the test request is used for indicating to detect the application to be detected and starting to automatically detect whether the APP memory is abnormal.

In an embodiment of the present disclosure, the memory test result includes:

a memory footprint curve; and/or

Whether the tested application sends the memory leak or not, and the number of leaks, the size of the leak file, the position of the leak and the reason of the leak under the condition of the memory leak.

In some embodiments, performing a memory test on the application to be tested includes:

and carrying out memory test in the background.

Illustratively, the first test is a monkey test.

Therefore, the tested application is automatically operated at the client side by carrying out the first test at the foreground; and the memory test is carried out at the background, so that the automatic test of Android Package (APK) software can be realized.

In some embodiments, the performing memory testing in the background includes:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

Therefore, the background can conveniently run a plurality of tests related to the memory to the application to be tested at the same time, and the memory detection efficiency is improved.

In some embodiments, performing the memory usage test on the application to be tested includes:

For example, in some embodiments, the monitor process tool is an adb shell dumpsys meminfo, and the memory usage of the specified process package name is determined by the adb shell dumpsys meminfo. It should be noted that the present application is not limited to the monitoring process tool.

Therefore, by executing the memory occupation test on the application to be tested, the detection result of the variation trend of the use size of the application memory to be tested can be obtained.

Further, the memory change trend is drawn according to the memory occupation condition.

Fig. 2 is a schematic diagram of a memory usage trend curve according to an exemplary embodiment, as shown in fig. 2, memory data is captured at intervals of time, such as several seconds, during a test process, a memory trend curve is drawn according to the captured memory data at each time point, a memory trend, such as an ascending trend, a descending trend, or a smooth trend, can be visually seen through the memory trend curve, and then whether a memory overflow or a memory leak exists is determined through the memory trend.

In some embodiments, performing a memory leak test on the application under test includes:

For example, in some embodiments, the memory leak detection tool is a leak alarm, which is a memory leak detection tool for Android and Java that is sourced by Square, and detects activity memory leak through the leak alarm.

It should be noted that the memory leak monitoring tool is not specifically limited in this application.

Therefore, by executing the memory leak test on the application to be tested, the detection result of whether the behavior of the memory leak exists in the application to be tested can be obtained.

The technical solutions described in the embodiments of the present disclosure can be arbitrarily combined without conflict.

The application memory test scheme described in this embodiment is applicable to both published applications and unpublished applications.

The technical scheme of the embodiment of the disclosure provides an automatic method for detecting whether the APP memory is abnormal in the client. Specifically, in the process of automatically operating the application to be tested by the client, monitoring the change trend of the size of the application memory to be tested and whether a memory leakage behavior exists, and outputting a memory test report to evaluate whether the application memory to be tested is abnormal or not; when the client user is a high-level user such as a research and development or a tester of the application to be tested, the program code of the application to be tested can be modified according to the evaluation result so as to avoid abnormal conditions such as memory overflow, memory leakage and application crash caused by the issued application in the running process; when the client user is a common user, the memory occupation condition of the application can be known according to the evaluation result, so that whether the application is unloaded or not is determined according to the evaluation result, and the fact that the application is blocked during running due to the electronic equipment or due to the application is also determined according to the evaluation result.

Example two

Fig. 3 is a schematic diagram illustrating a testing process for automatically detecting an application memory at a client according to an exemplary embodiment, where as shown in fig. 3, the process includes:

step 301: a client on the electronic equipment receives a tested application input by a user;

the client is a memory detection service application, and the memory detection service application is used for performing memory detection on an application installed on the electronic equipment.

Step 302: the foreground carries out a strange test (monkey test) on the application to be tested;

step 303 a: the background executes a memory occupation test on the application to be tested;

step 303 b: the background executes a memory leak test on the application to be tested;

step 304: and generating a memory test result.

It should be noted that, in this embodiment, the execution steps of 303a and 303b are not limited, 303a may be performed before 303b, 303a may be performed after 303b, or both may be performed simultaneously.

The memory test result comprises a memory occupation curve, whether the tested application sends memory leakage, the leakage frequency, the size of a leakage file, the leakage position and the leakage reason under the condition of memory leakage.

Therefore, in the process of automatically operating the application to be tested by the client, the change trend of the size of the application memory to be tested and the behavior of memory leakage are monitored, and a memory test report is output to evaluate whether the application memory to be tested is abnormal or not; when the client user is a high-level user such as a research and development or a tester of the application to be tested, the program code of the application to be tested can be modified according to the evaluation result so as to avoid abnormal conditions such as memory overflow, memory leakage and application crash caused by the issued application in the running process; when the client user is a common user, the memory occupation condition of the application can be known according to the evaluation result, so that whether the application is unloaded or not is determined according to the evaluation result, and the fact that the application is blocked during running due to the electronic equipment or due to the application is also determined according to the evaluation result.

EXAMPLE III

Fig. 4 is a block diagram illustrating an apparatus for testing application memory according to an exemplary embodiment. The application memory testing device is applied to a client, and referring to fig. 4, the device includes an obtaining module 10, a determining module 20, a testing module 30 and an output module 40.

An acquisition module 10 arranged to acquire test parameters; the test parameters at least comprise the name of an application installation package of the application to be tested;

a determination module 20 arranged to determine an application to be tested based on the test parameters;

the test module 30 is configured to perform a memory test on the application to be tested to obtain a memory test result;

an output module 40 configured to output the memory test result.

In some embodiments, the test module 30 is configured to:

and carrying out memory test in the background.

In some embodiments, the test module 30 is configured to:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

In some embodiments, the test module 30 is configured to:

With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.

In practical applications, the specific structures of the obtaining module 10, the determining module 20, the testing module 30 and the output module 40 can be implemented by a Central Processing Unit (CPU), a Micro Controller Unit (MCU), a Digital Signal Processor (DSP), or a Programmable Logic Controller (PLC) in the application memory testing device or an intelligent device to which the application memory testing device belongs.

It should be understood by those skilled in the art that the functions of each processing module in the application memory test device according to the embodiment of the present disclosure may be realized by an analog circuit that implements the functions described in the embodiment of the present disclosure, or by running software that executes the functions described in the embodiment of the present disclosure on an electronic device, as will be understood by reference to the foregoing description of the application memory test method applied to the vehicle side.

The application memory testing device provided by the embodiment of the disclosure can realize memory testing of the application installed in the electronic equipment at the client, and output the memory testing result, so that the client user can know the memory occupation condition of the application in the operation process conveniently, and the client user can be helped to visually evaluate the application.

The embodiment of the present disclosure also describes an application memory testing apparatus, where the apparatus includes: the device comprises a memory, a processor and a computer program which is stored on the memory and can run on the processor, wherein when the processor executes the program, the application memory test method provided by any one of the technical schemes applied to the electronic equipment is realized.

As an embodiment, the processor, when executing the program, implements:

determining an application to be tested based on the test parameters;

and outputting the memory test result.

As an embodiment, the processor, when executing the program, implements:

and carrying out memory test in the background.

As an embodiment, the processor, when executing the program, implements:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

As an embodiment, the processor, when executing the program, implements:

The application memory testing device provided by the embodiment of the application memory testing method and the application memory testing device can realize memory testing of the application installed in the electronic equipment at the client side and output memory testing results, so that a client side user can know memory occupation conditions in the operation process conveniently, and the client side user can be helped to visually evaluate the application.

The embodiment of the present application further describes a computer storage medium, in which computer-executable instructions are stored, and the computer-executable instructions are used for executing the application memory testing method described in each of the foregoing embodiments. That is to say, after the computer executable instruction is executed by the processor, the application memory testing method provided by any one of the foregoing technical solutions can be implemented.

It should be understood by those skilled in the art that the functions of the programs in the computer storage medium of the present embodiment can be understood by referring to the related descriptions of the method for testing an application memory described in the foregoing embodiments.

FIG. 5 is a block diagram illustrating a smart device 800 for implementing application memory testing in accordance with an exemplary embodiment. For example, the smart device 800 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a gaming console, a tablet device, a medical device, a fitness device, a personal digital assistant, and the like.

Referring to fig. 5, smart device 800 may include one or more of the following components: a processing component 802, a memory 804, a power component 806, a multimedia component 808, an audio component 810, an Input/Output (I/O) interface 812, a sensor component 814, and a communication component 816.

The processing component 802 generally controls overall operations of the smart device 800, such as operations associated with display, telephone calls, data communications, camera operations, and recording operations. The processing components 802 may include one or more processors 820 to execute instructions to perform all or a portion of the steps of the methods described above. Further, the processing component 802 can include one or more modules that facilitate interaction between the processing component 802 and other components. For example, the processing component 802 can include a multimedia module to facilitate interaction between the multimedia component 808 and the processing component 802.

The memory 804 is configured to store various types of data to support operations at the smart device 800. Examples of such data include instructions for any application or method operating on the smart device 800, contact data, phonebook data, messages, pictures, videos, and so forth. The Memory 804 may be implemented by any type of volatile or non-volatile Memory device or combination thereof, such as Static Random-Access Memory (SRAM), Electrically-Erasable Programmable Read-Only Memory (EEPROM), Erasable Programmable Read-Only Memory (EPROM), Programmable Read-Only Memory (PROM), Read-Only Memory (ROM), magnetic Memory, flash Memory, magnetic disk or optical disk.

The power component 806 provides power to the various components of the smart device 800. The power components 806 may include a power management system, one or more power sources, and other components associated with generating, managing, and distributing power for the smart device 800.

The multimedia component 808 includes a screen that provides an output interface between the smart device 800 and a user. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive an input signal from a user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundary of a touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 808 includes a front facing camera and/or a rear facing camera. The front camera and/or the rear camera may receive external multimedia data when the smart device 800 is in an operation mode, such as a photographing mode or a video mode. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

The audio component 810 is configured to output and/or input audio signals. For example, the audio component 810 includes a Microphone (MIC) configured to receive external audio signals when the smart device 800 is in an operational mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signals may further be stored in the memory 804 or transmitted via the communication component 816. In some embodiments, audio component 810 also includes a speaker for outputting audio signals.

The I/O interface 812 provides an interface between the processing component 802 and peripheral interface modules, which may be keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to: a home button, a volume button, a start button, and a lock button.

The sensor component 814 includes one or more sensors for providing various aspects of state assessment for the smart device 800. For example, the sensor component 814 may detect an open/closed state of the smart device 800, the relative positioning of components, such as a display and keypad of the smart device 800, the sensor component 814 may also detect a change in the position of the smart device 800 or a component of the smart device 800, the presence or absence of user contact with the smart device 800, orientation or acceleration/deceleration of the smart device 800, and a change in temperature of the smart device 800. Sensor assembly 814 may include a proximity sensor configured to detect the presence of a nearby object without any physical contact. The sensor assembly 814 may also include a photosensor, such as a Complementary Metal Oxide Semiconductor (CMOS) or Charge-coupled Device (CCD) image sensor, for use in imaging applications. In some embodiments, the sensor assembly 814 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

The communication component 816 is configured to facilitate wired or wireless communication between the smart device 800 and other devices. The smart device 800 may access a wireless network based on a communication standard, such as Wi-Fi, 2G, or 3G, or a combination thereof. In an exemplary embodiment, the communication component 816 receives a broadcast signal or broadcast related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 816 further includes a Near Field Communication (NFC) module to facilitate short-range communications. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID) technology, Infrared Data Association (IrDA) technology, Ultra Wide Band (UWB) technology, Bluetooth (BT) technology, and other technologies.

In an exemplary embodiment, the smart Device 800 may be implemented by one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), controllers, microcontrollers, microprocessors or other electronic components for performing the above Application memory testing methods applied to the electronic Device side.

In an exemplary embodiment, a non-transitory computer storage medium including executable instructions, such as the memory 804 including executable instructions, that are executable by the processor 820 of the smart device 800 to perform the above-described method is also provided. For example, the non-transitory computer storage medium may be a ROM, a Random Access Memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.

Other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the invention being indicated by the following claims.

It will be understood that the invention is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.

Claims

1. An application memory test method is applied to a client, and comprises the following steps:

determining an application to be tested based on the test parameters;

and outputting the memory test result.

2. The method according to claim 1, wherein the performing the memory test on the application to be tested comprises:

and carrying out memory test in the background.

3. The method according to claim 2, wherein the performing memory testing in the background comprises:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

4. The method according to claim 3, wherein the performing the memory usage test on the application to be tested comprises:

5. The method according to claim 3, wherein the performing the memory leak test on the application to be tested comprises:

6. An apparatus for testing an application memory, comprising:

and the output module is used for outputting the memory test result.

7. The device for testing application memory of claim 6, wherein the testing module is configured to:

and carrying out memory test in the background.

8. The device for testing application memory of claim 7, wherein the testing module is configured to:

executing a memory occupation test on the application to be tested; and/or

And executing a memory leak test on the application to be tested.

9. The device for testing application memory of claim 8, wherein the testing module is configured to:

10. The device for testing application memory of claim 8, wherein the testing module is configured to:

11. An application memory test device, comprising:

a processor;

a memory for storing executable instructions;

wherein the processor is arranged to: executing the executable instructions to implement the application memory testing method of any one of claims 1 to 5.

12. A computer storage medium having stored therein executable instructions that, when executed by a processor, cause the processor to perform the application memory testing method of any of claims 1 to 5.