CN110966932B - 一种基于已知标记点的结构光三维扫描方法 - Google Patents
一种基于已知标记点的结构光三维扫描方法 Download PDFInfo
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- CN110966932B CN110966932B CN201911152004.0A CN201911152004A CN110966932B CN 110966932 B CN110966932 B CN 110966932B CN 201911152004 A CN201911152004 A CN 201911152004A CN 110966932 B CN110966932 B CN 110966932B
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- mark points
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- structured light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
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CN201911152004.0A CN110966932B (zh) | 2019-11-22 | 2019-11-22 | 一种基于已知标记点的结构光三维扫描方法 |
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CN201911152004.0A CN110966932B (zh) | 2019-11-22 | 2019-11-22 | 一种基于已知标记点的结构光三维扫描方法 |
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CN110966932A CN110966932A (zh) | 2020-04-07 |
CN110966932B true CN110966932B (zh) | 2021-07-06 |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113140042B (zh) * | 2021-04-19 | 2023-07-25 | 思看科技(杭州)股份有限公司 | 三维扫描拼接方法、装置、电子装置和计算机设备 |
CN113689351B (zh) * | 2021-08-24 | 2023-10-10 | 北京石油化工学院 | 基于深度相机的危化品仓储监控方法、装置及设备 |
CN114279326B (zh) * | 2021-12-22 | 2024-05-28 | 易思维(天津)科技有限公司 | 一种三维扫描设备的全局定位方法 |
CN114279362A (zh) * | 2021-12-28 | 2022-04-05 | 中国航天空气动力技术研究院 | 防热结构动态外形测量装置及方法 |
CN114638795A (zh) * | 2022-03-08 | 2022-06-17 | 新拓三维技术(深圳)有限公司 | 一种多结构光测量单元在线测量方法及系统 |
CN115439630B (zh) * | 2022-08-04 | 2024-04-19 | 思看科技(杭州)股份有限公司 | 标记点拼接方法、摄影测量方法、装置和电子装置 |
CN116206069B (zh) * | 2023-04-28 | 2023-10-13 | 思看科技(杭州)股份有限公司 | 三维扫描中的图像数据处理方法、装置和三维扫描仪 |
CN116912427B (zh) * | 2023-09-12 | 2023-11-24 | 武汉工程大学 | 基于标记点三角特征聚类的三维扫描重建方法及系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN104501740A (zh) * | 2014-12-18 | 2015-04-08 | 杭州鼎热科技有限公司 | 一种基于标记点轨迹跟踪的手持激光三维扫描方法及设备 |
CN106500627A (zh) * | 2016-10-19 | 2017-03-15 | 杭州思看科技有限公司 | 含有多个不同波长激光器的三维扫描方法及扫描仪 |
CN106767394A (zh) * | 2015-11-23 | 2017-05-31 | 深圳超多维光电子有限公司 | 一种对物体进行三维扫描的方法、装置及系统 |
KR101923373B1 (ko) * | 2017-10-14 | 2018-11-29 | 윤영노 | 보정체를 이용한 3d 스캐닝 객체 측정 서비스 제공 방법 |
CN108931205A (zh) * | 2018-07-25 | 2018-12-04 | 杭州非白三维科技有限公司 | 一种三维扫描系统及扫描方法 |
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- 2019-11-22 CN CN201911152004.0A patent/CN110966932B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104501740A (zh) * | 2014-12-18 | 2015-04-08 | 杭州鼎热科技有限公司 | 一种基于标记点轨迹跟踪的手持激光三维扫描方法及设备 |
CN106767394A (zh) * | 2015-11-23 | 2017-05-31 | 深圳超多维光电子有限公司 | 一种对物体进行三维扫描的方法、装置及系统 |
CN106500627A (zh) * | 2016-10-19 | 2017-03-15 | 杭州思看科技有限公司 | 含有多个不同波长激光器的三维扫描方法及扫描仪 |
KR101923373B1 (ko) * | 2017-10-14 | 2018-11-29 | 윤영노 | 보정체를 이용한 3d 스캐닝 객체 측정 서비스 제공 방법 |
CN108931205A (zh) * | 2018-07-25 | 2018-12-04 | 杭州非白三维科技有限公司 | 一种三维扫描系统及扫描方法 |
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Address after: Room 102, Unit 1, Building 12, No. 998, Wenyi West Road, Wuchang Street, Yuhang District, Hangzhou City, Zhejiang Province, 311121 Patentee after: Sikan Technology (Hangzhou) Co.,Ltd. Address before: Room 101, building 12, No. 998, Wenyi West Road, Wuchang Street, Yuhang District, Hangzhou City, Zhejiang Province Patentee before: HANGZHOU SCANTECH Co. |
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Application publication date: 20200407 Assignee: Hangzhou silidi Technology Co.,Ltd. Assignor: Sikan Technology (Hangzhou) Co.,Ltd. Contract record no.: X2022330000832 Denomination of invention: A 3d scanning method of structured light based on known marker points Granted publication date: 20210706 License type: Common License Record date: 20221223 |