CN110944168A - 8K test signal generation device and method, storage medium and equipment - Google Patents
8K test signal generation device and method, storage medium and equipment Download PDFInfo
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- CN110944168A CN110944168A CN201911191841.4A CN201911191841A CN110944168A CN 110944168 A CN110944168 A CN 110944168A CN 201911191841 A CN201911191841 A CN 201911191841A CN 110944168 A CN110944168 A CN 110944168A
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Abstract
The invention relates to an 8K test signal generating device, which comprises a signal storage module, a signal selection module and a signal generation module; the signal storage module is used for pre-storing a plurality of 8K test signal files; the signal selection module is used for selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameters and sending the 8K test signal file name to the signal generation module; and the signal generation module is used for acquiring an 8K test signal file corresponding to the 8K test signal file name from the signal storage module and outputting the signal file. The invention reduces the memory occupied in the 8K signal output process, thereby reducing the operation memory requirement of hardware. The invention also relates to an 8K test signal generation method, a storage medium and a device.
Description
Technical Field
The invention relates to the technical field of 8K televisions, in particular to an 8K test signal generation device, an 8K test signal generation method, a storage medium and 8K test signal generation equipment.
Background
The video is a main carrier for information presentation and transmission, and the ultra-high definition video is a new great technical innovation after digitization and high definition of the video. The ultra-high-definition video industry comprises various links such as ultra-high-definition video acquisition, manufacturing, transmission, presentation, application and the like, and belongs to a fusion and innovation type industrial form. The development of the ultra-high-definition video industry is beneficial to promoting the overall strength of the information industry and the cultural industry in China to be improved, the intelligent transformation and upgrade of the industry taking videos as the core are driven, the new economic kinetic energy is cultivated, the new growth point of middle-high-end consumption is cultivated, the beautiful life needs of people are better met, and the research and development of 8K key technical products are the key for the rapid development of the ultra-high-definition video industry in China. The development of each link of the 8K industrial chain cannot be separated from the 8K image quality evaluation, and the 8K signal generator is used as an important tool for display test and image evaluation and is very important. When the 8K signal is required to be outputted smoothly, the signal file is first read completely into the memory and then outputted directly from the memory. However, this method has the limitation that the device operation memory must be larger than the storage space occupied by the test signal file, which limits the length of the test signal on one hand, and increases the requirement for hardware on the other hand, and at the same time, the time required for the signal output process is longer, and the product test capability is reduced. Therefore, how to improve the testing capability of 8K key technology products is a technical problem which needs to be solved urgently at present.
Disclosure of Invention
The invention aims to solve the technical problem of the prior art and provides an 8K test signal generation device, an 8K test signal generation method, a storage medium and equipment.
The technical scheme for solving the technical problems is as follows:
an 8K test signal generating apparatus for generating a test signal,
the device comprises a signal storage module, a signal selection module and a signal generation module;
the signal storage module is used for pre-storing a plurality of 8K test signal files;
the signal selection module is used for selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameters and sending the 8K test signal file name to the signal generation module;
and the signal generation module is used for acquiring an 8K test signal file corresponding to the 8K test signal file name from the signal storage module and outputting the signal file.
The invention has the beneficial effects that: the 8K test signal generating device is characterized in that a plurality of 8K test signal files are stored in advance through a signal storage module, a signal generating module selects the 8K test signal files determined by the module according to signals, and in the signal output process, the required operation memory in the signal output process is reduced through block cyclic reading, so that the requirement of equipment on hardware operation memory is reduced.
On the basis of the technical scheme, the invention can be further improved as follows.
Further, the signal parameters include a signal type, a signal resolution, and a signal name;
the signal selection module comprises a signal type selection unit, a signal resolution selection unit and a signal name selection unit;
the signal type selection unit is used for selecting an 8K test signal file of a corresponding signal type from the 8K signal table according to the signal type in the signal parameters to obtain a first 8K test signal file name list;
the signal resolution selecting unit is used for selecting an 8K test signal file with corresponding signal resolution from the first 8K test signal file name list according to the signal resolution in the signal parameters to obtain a second 8K test signal file name list;
the signal name selection unit is used for selecting an 8K test signal file with a corresponding signal name from the second 8K test signal file name list according to the signal name in the signal parameter to obtain an 8K test signal file name, and sending the 8K test signal file name to the signal generation module.
The beneficial effect of adopting the further scheme is that: the signal type, the signal resolution and the signal name are determined through the signal type selection unit, and the 8K test signal file is accurately determined.
Further, the signal generation module comprises a parameter setting unit and a signal generation unit;
the parameter setting unit is used for setting the output mode of the 8K test signal to be an SQD mode or an SI mode;
the signal generating unit is used for reading the 8K test signal file from the signal storage module into a memory in a blocking and circulating mode according to the 8K test signal file name, then outputting the 8K test signal from the memory and outputting the 8K test signal according to the setting mode of the parameter setting unit;
the signal generating unit is also used for suspending or stopping the output of the 8K test signal.
The beneficial effect of adopting the further scheme is that: the signal generation module sets the parameters of the 8K test signals through the parameter setting unit, and the signal generation unit controls the output of the 8K test signals, so that the 8K test signals can be output according to test requirements.
Further, the 8K signal type includes a static signal type and a dynamic signal type.
Further, the 8K signal resolution includes 7680x4320p25, 7680x4320p30, 7680x4320p50, and 7680x4320p 60.
Another technical solution of the present invention for solving the above technical problems is as follows: an 8K test signal generation method, comprising the steps of:
pre-storing a plurality of 8K test signal files;
selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameters, and sending the 8K test signal file name to the signal generation module;
and obtaining the 8K test signal file corresponding to the 8K test signal file name from the 8K test signal files, and outputting the 8K test signal.
The invention has the beneficial effects that: according to the 8K test signal generation method, a plurality of 8K test signal files are stored in advance, data are read in a blocking and circulating mode from the prestored 8K test signal files according to the 8K test signal files determined by the signal selection module, the requirement for hardware operation memory in the signal output process is reduced, the 8K test signal generation efficiency is improved, and therefore the 8K product test efficiency is improved.
On the basis of the technical scheme, the invention can be further improved as follows.
Further, the selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameter, and sending the 8K test signal file name to the signal generation module specifically includes:
the signal parameters comprise signal type, signal resolution and signal name;
selecting an 8K test signal file of a corresponding signal type from the 8K signal table according to the signal type in the signal parameter to obtain a first 8K test signal file name list;
selecting an 8K test signal file with corresponding signal resolution from the first 8K test signal file name list according to the signal resolution in the signal parameters to obtain a second 8K test signal file name list;
and selecting an 8K test signal file with a corresponding signal name from the second 8K test signal file name list according to the signal name in the signal parameter to obtain the 8K test signal file name.
The beneficial effect of adopting the further scheme is that: the signal type, the signal resolution and the signal name are determined through the signal selection module, and the 8K test signal file is accurately determined.
Further, acquiring an 8K test signal file corresponding to the file name of the 8K test signal from the plurality of 8K test signal files, and outputting the 8K test signal, specifically including:
setting the output mode of the 8K test signal to be an SQD mode or an SI mode;
reading the 8K test signal file from the signal storage module into a memory in a blocking and circulating manner according to the 8K test signal file name, then outputting the 8K test signal from the memory, and outputting the 8K test signal according to the setting mode of the parameter setting unit;
the method further comprises the following steps:
pausing or stopping the output of the 8K test signal.
The beneficial effect of adopting the further scheme is that: the parameter setting unit in the signal generation module is used for setting the parameters of the 8K test signal, and the signal generation unit is used for controlling the output of the 8K test signal, so that the 8K test signal can be output according to the test requirement.
In addition, the present invention also provides a computer-readable storage medium, which includes instructions, and when the instructions are run on a computer, the instructions cause the computer to execute the 8K test signal generation method according to any one of the above technical solutions.
The invention further provides a computer device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor executes the program to realize the 8K test signal generation method according to any one of the above technical schemes.
Advantages of additional aspects of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments of the present invention or in the description of the prior art will be briefly described below, and it is obvious that the drawings described below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic block diagram of an 8K test signal generating apparatus according to an embodiment of the present invention;
fig. 2 is a schematic flowchart of a method for generating an 8K test signal according to another embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, shall fall within the scope of protection of the present invention.
As shown in fig. 1, an embodiment of the present invention provides an 8K test signal generating apparatus, which includes a signal storage module, a signal selection module, and a signal generation module;
the signal storage module stores a plurality of 8K test signal files in advance.
The signal selection module selects a corresponding 8K test signal file name from the 8K signal table according to the input signal parameters, and sends the 8K test signal file name to the signal generation module.
The signal generation module acquires an 8K test signal file corresponding to the 8K test signal file name from the signal storage module, generates an 8K test signal according to the 8K test signal file and outputs the 8K test signal.
It should be understood that the signal storage module stores a plurality of 8K test signal files, and when a single 8K test signal file occupies a space smaller than a device operating memory (RAM), the entire signal can be read into the RAM during the output process and then output, which is not limited in the present application.
The 8K signal table can be arranged in a database to facilitate retrieval, and can also be arranged in other tables, and the signal selection module is executed through the processor. The signal generation module comprises an interface connected with the display equipment and outputs an 8K test signal through the interface. The specific interface type can be set as required.
Based on the 8K test signal generation device provided by the embodiment, the signal storage module stores a plurality of 8K test signal files in advance, the signal generation module directly acquires the 8K test signal files from the signal storage module according to the 8K test signal files determined by the signal selection module, and the flow of reading and playing is adopted, so that the requirement on the operation memory of a hardware system is reduced, meanwhile, the signal reading method directly goes from a hard disk to the memory without caching, the reading speed is accelerated, the smooth output of 8K large files is realized, and the efficiency of generating the 8K test signals is also improved.
Further, the signal parameters include a signal type, a signal resolution, and a signal name.
The signal selection module comprises a signal type selection unit, a signal resolution selection unit and a signal name selection unit.
And the signal type selection unit is used for selecting an 8K test signal file of a corresponding signal type from the 8K signal table according to the signal type in the signal parameters to obtain a first 8K test signal file name list.
And the signal resolution selecting unit is used for selecting an 8K test signal file with corresponding signal resolution from the first 8K test signal file name list according to the signal resolution in the signal parameters to obtain a second 8K test signal file name list.
And the signal name selection unit is used for selecting an 8K test signal file with a corresponding signal name from the second 8K test signal file name list according to the signal name in the signal parameter to obtain an 8K test signal file name, and sending the 8K test signal file name to the signal generation module.
Based on the embodiment, the signal type, the signal resolution and the signal name are determined through the signal type selection unit, and the 8K test signal file is accurately determined.
Further, the signal generation module comprises a parameter setting unit and a signal generation unit.
The parameter setting unit sets the output mode of the 8K test signal to be an SQD mode or an SI mode.
The SQD mode is Square Division Quad Split, and the SI mode is Sample Interleave.
And the signal generating unit is used for circularly reading the 8K test signal file from the signal storage module into the memory in a blocking mode according to the 8K test signal file name, then outputting the file from the memory, and outputting the 8K test signal according to the setting mode of the parameter setting unit.
And the signal generating unit is also used for suspending or stopping the output of the 8K test signal.
Based on the above embodiment, the parameter setting unit in the signal generation module sets the parameter of the 8K test signal, and the signal generation unit controls the output of the 8K test signal, so that the 8K test signal can be output according to the test requirement.
Wherein the 8K signal type comprises a static signal type and a dynamic signal type; the 8K signal resolutions include 7680x4320p25, 7680x4320p30, 7680x4320p50, and 7680x4320p 60.
As shown in fig. 2, a flow chart of a method for generating an 8K test signal according to another embodiment of the present invention is that the method for generating an 8K test signal includes the following steps:
110. a plurality of 8K test signal files are stored in advance.
120. And selecting a corresponding 8K test signal file name from the 8K signal table according to the input signal parameters, and sending the 8K test signal file name to the signal generation module.
130. And obtaining an 8K test signal file corresponding to the 8K test signal file name from the 8K test signal files, and outputting the 8K test signal.
Based on the 8K test signal generation method provided by the above embodiment, the signal storage module stores a plurality of 8K test signal files in advance, and the signal generation module performs block-wise cyclic reading according to the 8K test signal files determined by the signal selection module in the signal output process, so that the memory required to be operated in the signal output process is reduced, and the requirement of the device on the hardware operating memory is reduced.
Further, step 120 includes:
the signal parameters include signal type, signal resolution, and signal name.
And selecting an 8K test signal file of a corresponding signal type from the 8K signal table according to the signal type in the signal parameters to obtain a first 8K test signal file name list.
And selecting an 8K test signal file with corresponding signal resolution from the first 8K test signal file name list according to the signal resolution in the signal parameters to obtain a second 8K test signal file name list.
And selecting an 8K test signal file with a corresponding signal name from the second 8K test signal file name list according to the signal name in the signal parameter to obtain the 8K test signal file name.
Further, step 130 includes:
the output mode of the 8K test signal is set to the SQD mode or the SI mode.
And circularly reading the 8K test signal file from the signal storage module into a memory in a blocking mode according to the 8K test signal file name, then outputting the file from the memory, and outputting the 8K test signal according to the setting mode of the parameter setting unit.
Furthermore, the present invention also provides a computer-readable storage medium, comprising instructions that, when executed on a computer, cause the computer to perform the 8K test signal generation method according to any one of the above embodiments.
The invention also provides a computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor executes the program to implement the 8K test signal generation method according to any one of the above embodiments.
While the invention has been described with reference to specific embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. An 8K test signal generation device is characterized by comprising a signal storage module, a signal selection module and a signal generation module;
the signal storage module is used for pre-storing a plurality of 8K test signal files;
the signal selection module is used for selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameters and sending the 8K test signal file name to the signal generation module;
and the signal generation module is used for acquiring an 8K test signal file corresponding to the 8K test signal file name from the signal storage module and outputting the signal file.
2. The 8K test signal generating apparatus of claim 1, wherein the signal parameters include a signal type, a signal resolution, and a signal name;
the signal selection module comprises a signal type selection unit, a signal resolution selection unit and a signal name selection unit;
the signal type selection unit is used for selecting an 8K test signal file of a corresponding signal type from the 8K signal table according to the signal type in the signal parameters to obtain a first 8K test signal file name list;
the signal resolution selecting unit is used for selecting an 8K test signal file with corresponding signal resolution from the first 8K test signal file name list according to the signal resolution in the signal parameters to obtain a second 8K test signal file name list;
the signal name selection unit is used for selecting an 8K test signal file with a corresponding signal name from the second 8K test signal file name list according to the signal name in the signal parameter to obtain an 8K test signal file name, and sending the 8K test signal file name to the signal generation module.
3. The 8K test signal generation device according to claim 1, wherein the signal generation module comprises a parameter setting unit and a signal generation unit;
the parameter setting unit is used for setting the output mode of the 8K test signal to be an SQD mode or an SI mode;
the signal generating unit is used for reading the 8K test signal file from the signal storage module into a memory in a blocking and circulating mode according to the 8K test signal file name, then outputting the 8K test signal from the memory and outputting the 8K test signal according to the setting mode of the parameter setting unit;
the signal generating unit is also used for suspending or stopping the output of the 8K test signal.
4. The 8K test signal generation apparatus of claim 2 or 3, wherein the signal types include a static signal type and a dynamic signal type.
5. The 8K test signal generation apparatus according to claim 2 or 3, wherein the signal resolution includes 7680x4320p25, 7680x4320p30, 7680x4320p50, and 7680x4320p 60.
6. An 8K test signal generation method, comprising the steps of:
pre-storing a plurality of 8K test signal files;
selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameters, and sending the 8K test signal file name to the signal generation module;
and obtaining the 8K test signal file corresponding to the 8K test signal file name from the 8K test signal files, and outputting the 8K test signal.
7. The method according to claim 6, wherein the selecting a corresponding 8K test signal file name from an 8K signal table according to the input signal parameter and sending the 8K test signal file name to the signal generation module specifically includes:
the signal parameters comprise signal type, signal resolution and signal name;
selecting an 8K test signal file of a corresponding signal type from the 8K signal table according to the signal type in the signal parameter to obtain a first 8K test signal file name list;
selecting an 8K test signal file with corresponding signal resolution from the first 8K test signal file name list according to the signal resolution in the signal parameters to obtain a second 8K test signal file name list;
and selecting an 8K test signal file with a corresponding signal name from the second 8K test signal file name list according to the signal name in the signal parameter to obtain the 8K test signal file name.
8. The method for generating an 8K test signal according to claim 6, wherein the step of obtaining an 8K test signal file corresponding to the file name of the 8K test signal from the plurality of 8K test signal files and outputting the 8K test signal includes:
setting the output mode of the 8K test signal to be an SQD mode or an SI mode;
reading the 8K test signal file from the signal storage module into a memory in a blocking and circulating manner according to the 8K test signal file name, then outputting the 8K test signal from the memory, and outputting the 8K test signal according to the setting mode of the parameter setting unit;
the method further comprises the following steps:
pausing or stopping the output of the 8K test signal.
9. A computer-readable storage medium comprising instructions that, when executed on a computer, cause the computer to perform the 8K test signal generation method of any one of claims 6-8.
10. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the 8K test signal generation method according to any one of claims 6-8 when executing the program.
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| CN102427551A (en) * | 2011-09-19 | 2012-04-25 | 工业和信息化部电子第五研究所 | Digital high definition source terminal port transmission quality test system |
| CN103618895A (en) * | 2013-12-06 | 2014-03-05 | 北京牡丹视源电子有限责任公司 | Digital television test flow generation device and method |
| US20140347498A1 (en) * | 2011-09-29 | 2014-11-27 | Aptina Imaging Corporation | Self test of image signal chain while running in streaming mode |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102427551A (en) * | 2011-09-19 | 2012-04-25 | 工业和信息化部电子第五研究所 | Digital high definition source terminal port transmission quality test system |
| US20140347498A1 (en) * | 2011-09-29 | 2014-11-27 | Aptina Imaging Corporation | Self test of image signal chain while running in streaming mode |
| CN103618895A (en) * | 2013-12-06 | 2014-03-05 | 北京牡丹视源电子有限责任公司 | Digital television test flow generation device and method |
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Application publication date: 20200331 |