CN110940496A - Speed-up method for spectrometer integration process in light source detection system - Google Patents

Speed-up method for spectrometer integration process in light source detection system Download PDF

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Publication number
CN110940496A
CN110940496A CN201911323535.1A CN201911323535A CN110940496A CN 110940496 A CN110940496 A CN 110940496A CN 201911323535 A CN201911323535 A CN 201911323535A CN 110940496 A CN110940496 A CN 110940496A
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light source
spectrometer
test
spectrum
power supply
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CN201911323535.1A
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CN110940496B (en
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陈苏翀
钱卫东
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Suzhou Zhuoyun Software Co Ltd
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Suzhou Zhuoyun Software Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum

Abstract

The invention relates to a method for accelerating the integration process of a spectrometer in a light source detection system, which comprises the following steps of S1, electrifying a light source by a spectrum acquisition power supply, and waiting for the light source to reach a stable state; step S2, splitting the optical project test and the electric project test of the spectrometer into different threads, wherein the optical project test and the electric project test can be performed in different threads; providing a spectrum acquisition power supply for the light source; after the spectrum integration is carried out, the optical project test and the electric project test can be simultaneously carried out. A speed-up method for an integrating process of a spectrometer in a light source detection system can realize parallel operation of a light item test and an electric item test and optimize time overhead of the integrating process of the spectrometer.

Description

Speed-up method for spectrometer integration process in light source detection system
Technical Field
The invention relates to the field of light source detection, in particular to the field of spectrometer integration detection, and specifically relates to a speed-up method for a spectrometer integration process in a light source detection system.
Background
With the rapid development of the country and the vigorous construction of cities, the demand of lighting and display light sources is increasing day by day. Under the huge demand, the problem of time cost of light source detection is obvious, and becomes a main contradiction of light source detection.
In the current light source testing system, spectrometer control during light source detection is shown in fig. 3 and 4: the power supply lights the detected light source to be stable, the spectrometer integrates the light source, the spectrometer returns the spectrum to the control system to calculate the optical parameters in the integrating process of the spectrometer, and then the power supply tests other electrical parameters of the detected light source.
The existing light source test system can test the optical parameters of the tested light source through a spectrometer, and the control method has simple functions.
Disclosure of Invention
The invention overcomes the defects of the prior art, provides the speed-up method for the spectrometer integration process in the light source detection system, can realize parallel operation of the optical item test and the electrical item test, and optimizes the time overhead of the spectrometer integration process.
In order to achieve the purpose, the invention adopts the technical scheme that: a method for speeding up the integration process of a spectrometer in a light source detection system comprises the following steps that S1, a power supply is used for electrifying a light source, and the light source is in a stable state; step S2, the optical item test and the electrical item test of the spectrometer are split into different threads, and the optical item test and the electrical item test can be performed separately.
In a preferred embodiment of the present invention, in step S2, after providing the spectrum collecting power source for the light source; after the spectrum integration is carried out, the optical project test and the electric project test can be carried out in parallel.
In a preferred embodiment of the present invention, step 2 includes the following steps, step S2-1, performing a light item test on the light source stabilized after being powered on by the spectrometer; step S2-2, the spectrometer performs spectrum integration on the light source; when the light source reaches a stable state, the light source can be synchronously tested for electrical items; step S2-3, reading the spectrum information acquired by the spectrometer through spectrum integration; the electric project test can be synchronously carried out; step S2-4, transmitting the spectrum information read by the spectrometer; the electrical project test can be performed synchronously.
In a preferred embodiment of the invention, the electrical item test comprises voltage or/and power or/and current.
In a preferred embodiment of the invention, in step 2, during the test, the power supply first provides a spectrum acquisition power supply for the light source to be tested, and when the light source is stable and the spectrum acquisition power supply continues to supply power, the spectrometer performs spectrum integration in the same time sub-thread; after the spectrum integration is completed, the power supply for spectrum collection of the light item test is powered up; and (4) operating the spectrum information reading, and then transmitting the spectrum information to finish the optical project test.
In a preferred embodiment of the present invention, after the spectrum integration, the spectrum acquisition power supply provided by the power supply can be adjusted or replaced by the electrical project testing power supply, and the spectrometer is used to read and transmit the spectrum information and test the electrical project, so that the reading and transmission of the non-conflicting spectrum information and the electrical project testing can be executed in parallel.
In a preferred embodiment of the present invention, the method further includes step S3, determining whether the optical item test and the electrical item test are complete; one of the tests is not completed completely, and the optical item test and the electrical item test are waited to be completed completely.
In a preferred embodiment of the present invention, the method further includes step S4, after completing the light item test and the electrical item test, detecting whether there is a next light source to be tested.
The invention solves the defects existing in the background technology, and has the beneficial effects that:
although the existing light source detection system is relatively simple in control method, the steps of spectrum integration, reading and transmission are involved in the process of waiting for the spectrometer integration, the three parts are processed in series, and other detection steps such as detection of electrical items are carried out after the spectrum integration, reading and transmission, so that the detection mode is high in time overhead.
The invention provides a method for accelerating the integration process of a spectrometer in a light source detection system. Because the power supply and the spectrometer are different devices and the control is not in conflict, the spectrometer can simultaneously read transmission and electric items after spectrum integration. And the non-conflict processes are executed in parallel, so that the time overhead of the processes is reduced. The asynchronous control mode is used, the serial processes of integration, reading and transmission of a general spectrometer are split, and the parallel processing is carried out on the serial processes and other detection steps involved in a light source detection system, so that the time overhead of the integration process of the spectrometer is optimized.
Drawings
The invention is further illustrated with reference to the following figures and examples.
FIG. 1 is a workflow diagram of a preferred embodiment of the present invention;
FIG. 2 is a timing diagram of a method for speeding up the integration process of a spectrometer using a light source detection system according to the flowchart of FIG. 1;
FIG. 3 is a time consumption table for detecting the LED single chip light source requirement by applying the acceleration method in the integration process of the spectrometer of the light source detection system;
FIG. 4 is a time consumption table for detecting the LED RGB three-chip light source requirement by applying the light source detection system spectrometer integration process acceleration method;
FIG. 5 is a prior art workflow diagram;
FIG. 6 is a prior art timing diagram of FIG. 3;
FIG. 7 is a timing chart for detecting the need of an LED single chip light source by applying the prior art;
FIG. 8 is a timing chart for testing the LED RGB three-chip light source using the prior art.
Detailed Description
The invention will now be described in further detail with reference to the accompanying drawings and examples, which are simplified schematic drawings and illustrate only the basic structure of the invention in a schematic manner, and thus show only the constituents relevant to the invention.
As shown in fig. 5-8, the integration process of the spectrometer of the light source detection system in the prior art is a serial thread operation. The light source detection system comprises a light item test and an electric item test. In the prior art, a spectrum acquisition power supply is firstly provided for a light source to supply power to the light source, when the light source operates stably, spectrum integration is carried out on the light source through a spectrometer, then spectrum information acquired by the spectrum integration is read through the spectrometer in sequence, and then the spectrum information read by the spectrometer is transmitted. And then, starting to perform the electrical project test, firstly replacing or adjusting the spectrum acquisition power supply of the light source into an electrical project test power supply, and then sequentially performing the electrical project test.
As shown in the timing chart of the acceleration method in the integration process of the spectrometer using the light source detection system in fig. 6, since the serial thread operation is performed, the time for completing the light item test and the electrical item test for one time on the light source is the time superposition of each step.
As shown in fig. 1 to 4, a method for speeding up the integration process of a spectrometer in a light source detection system is developed, which comprises the following steps,
and step S1, the spectrum acquisition power supply in the power supply supplies power to the light source until the light source reaches a stable state.
Step S2, the optical item test and the electrical item test of the spectrometer are split into different threads, and the optical item test and the electrical item test can be performed separately. Providing a spectrum acquisition power supply for the light source; after the spectrum integration is carried out, the optical item test and the electric item test can be carried out in parallel, wherein the electric item test comprises voltage or/and power or/and current.
And step S2-1, performing light item test on the light source which is stable after being electrified through a spectrometer.
Step S2-2, the spectrometer performs spectrum integration on the light source; the spectrum acquisition power supply provided by the power supply can be adjusted or replaced by an electric project test power supply, and when the light source reaches a stable state, the electric project test can be synchronously carried out on the light source.
Step S2-3, reading the spectrum information acquired by the spectrometer through spectrum integration; the electrical project test can be performed synchronously.
Step S2-4, transmitting the spectrum information read by the spectrometer; the electrical project test can be performed synchronously.
Step S3, judging whether the optical project test and the electric project test are complete; and not all the electric project tests are completed, and waiting for the completion of the electric project tests. In the specific light item test, the light source is subjected to spectrum integration, spectrum information is read, the spectrum information is transmitted, and then calculation is performed to complete the light item test. Electrical item testing includes testing of voltage and power and current. And detecting whether the optical project and the electrical project are completely finished, wherein one project is not finished, waiting for the completion of the optical project and the electrical project, and outputting test parameters when the optical project and the electrical project are completely finished.
And step S4, after the optical project test and the electrical project test are completed, whether the next light source to be tested exists is detected. If the next light source to be tested returns to the step S1 to continue the test; and (5) the next light source to be tested is not available, and the test is finished.
As shown in fig. 3 and 4, the time required for detecting the LED single chip light source and the LED RGB three-chip light source is respectively detected by applying the acceleration method in the integration process of the spectrometer of the light source detection system; compared with the method as shown in fig. 7 and fig. 8, the time consumption required for respectively detecting the LED single chip light source and the LED RGB three-chip light source in the prior art is less, and the light source detection efficiency is greatly improved by the spectrometer integration process speed-up method of the light source detection system.
The working principle is as follows:
during testing, a power supply firstly provides a spectrum acquisition power supply for a tested light source, the spectrum acquisition power supply continuously supplies power when the light source is stable, and a spectrometer performs spectrum integration in a same time sub-thread; after the spectrum integration is completed, the power supply for spectrum collection of the light item test is powered up; and (4) operating the spectrum information reading, and then transmitting the spectrum information to finish the optical project test. After the spectrum integration, the spectrometer is used for simultaneously reading and transmitting the spectrum information and testing the electric items, and the reading and transmitting of the non-conflicting spectrum information and the testing of the electric items are executed in parallel. And after the light item test and the electric item test of the light source are finished, carrying out the light item test and the electric item test of the next light source until the light source test is finished.
In light of the foregoing description of the preferred embodiment of the present invention, it is to be understood that various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.

Claims (8)

1. A method for speeding up the integration process of a spectrometer in a light source detection system is characterized in that: comprises the following steps of (a) carrying out,
step S1, the power supply is electrified for the light source, and the light source reaches a stable state;
step S2, the optical item test and the electrical item test of the spectrometer are split into different threads, and the optical item test and the electrical item test can be performed separately.
2. The method for speeding up the spectrometer integration process in a light source detection system according to claim 1, wherein:
in step S2, after providing a spectrum collection power supply to the light source; after the spectrum integration is carried out, the optical project test and the electric project test can be carried out in parallel.
3. The method for speeding up the spectrometer integration process in a light source detection system according to claim 1, wherein: the step 2 comprises the following steps of,
step S2-1, performing light project test on the electrified stable light source through a spectrometer;
step S2-2, the spectrometer performs spectrum integration on the light source; when the light source reaches a stable state, the light source can be synchronously tested for electrical items;
step S2-3, reading the spectrum information acquired by the spectrometer through spectrum integration; the electric project test can be synchronously carried out;
step S2-4, transmitting the spectrum information read by the spectrometer; the electrical project test can be performed synchronously.
4. The method for speeding up the spectrometer integration process in a light source detection system according to claim 1, wherein: the electrical item test comprises voltage or/and power or/and current.
5. The method for speeding up the spectrometer integration process in a light source detection system according to claim 1, wherein: in the step 2, during testing, a power supply firstly provides a spectrum acquisition power supply for a tested light source, the spectrum acquisition power supply continuously supplies power when the light source is stable, and the spectrometer performs spectrum integration in the same time sub-thread; after the spectrum integration is completed, the power supply for spectrum collection of the light item test is powered up; and (4) operating the spectrum information reading, and then transmitting the spectrum information to finish the optical project test.
6. The method for speeding up the spectrometer integration process in a light source detection system according to claim 5, wherein: after the spectrum integration, the spectrum acquisition power supply provided by the power supply can be adjusted or replaced by an electric item test power supply, meanwhile, the spectrum information is read and transmitted through the spectrometer, the electric item test is carried out, and the non-conflicting spectrum information reading and transmission and the electric item test are executed in parallel.
7. The method for speeding up the spectrometer integration process in a light source detection system according to claim 1, wherein: step S3, judging whether the light item test and the electric item test are complete; one of the tests is not completed completely, and the optical item test and the electrical item test are waited to be completed completely.
8. The method for speeding up the spectrometer integration process in a light source detection system according to claim 1, wherein: step S3 is further included, after the optical item test and the electrical item test are completed, whether there is a next light source to be tested is detected.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103592590A (en) * 2013-11-12 2014-02-19 上海大学 System and method for testing light-electricity-heat integration of LED device
CN205539354U (en) * 2016-04-15 2016-08-31 厦门新智科光电有限公司 A online photoelectricity parameter testing system for rapid survey electric light source
CN107015134A (en) * 2017-05-23 2017-08-04 山东大学 A kind of test system of LED light Electrothermal Properties and its application
CN107290642A (en) * 2017-07-28 2017-10-24 华南理工大学 LED light product-derived electrical characteristic parameter multistation multi-parameter comprehensive concurrent testing method and device
CN110553684A (en) * 2019-09-24 2019-12-10 中国船舶重工集团公司第七0七研究所 ASE light source test system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103592590A (en) * 2013-11-12 2014-02-19 上海大学 System and method for testing light-electricity-heat integration of LED device
CN205539354U (en) * 2016-04-15 2016-08-31 厦门新智科光电有限公司 A online photoelectricity parameter testing system for rapid survey electric light source
CN107015134A (en) * 2017-05-23 2017-08-04 山东大学 A kind of test system of LED light Electrothermal Properties and its application
CN107290642A (en) * 2017-07-28 2017-10-24 华南理工大学 LED light product-derived electrical characteristic parameter multistation multi-parameter comprehensive concurrent testing method and device
CN110553684A (en) * 2019-09-24 2019-12-10 中国船舶重工集团公司第七0七研究所 ASE light source test system

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