CN110927513A - Open-circuit fault online risk estimation method based on three-level power generator - Google Patents

Open-circuit fault online risk estimation method based on three-level power generator Download PDF

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CN110927513A
CN110927513A CN201911075115.6A CN201911075115A CN110927513A CN 110927513 A CN110927513 A CN 110927513A CN 201911075115 A CN201911075115 A CN 201911075115A CN 110927513 A CN110927513 A CN 110927513A
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open
risk
phase
circuit fault
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王东
朱永元
龚立锋
王珂
唐轶
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Nanjing Hedong Electric Power Technology Co ltd
Zhangjiagang Power Supply Branch Of State Grid Jiangsu Electric Power Co ltd
China University of Mining and Technology CUMT
Suzhou Power Supply Co of State Grid Jiangsu Electric Power Co Ltd
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Nanjing Hedong Electric Power Technology Co ltd
Zhangjiagang Power Supply Branch Of State Grid Jiangsu Electric Power Co ltd
China University of Mining and Technology CUMT
Suzhou Power Supply Co of State Grid Jiangsu Electric Power Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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    • Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
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Abstract

The invention relates to an open-circuit fault online risk estimation method based on a three-level power generator, which respectively executes the following steps for each circuit unit corresponding to three phases in the three-level power generator: and defining an open-circuit risk fault function, defining and simplifying the total open-circuit fault risk based on the open-circuit risk fault function, so as to calculate and obtain a new total open-circuit fault risk of the switching device in a switching period, further obtain the total open-circuit fault risk of the switching device in a period of time, further calculate the open-circuit fault risk coefficient of the switching device at any moment, and optimize an open-circuit fault positioning decision function by using the open-circuit fault positioning decision function to obtain an evaluation result. The invention provides an effective online open-circuit fault risk assessment mechanism by taking a three-level power generator as a research object, and the influence of the potential open-circuit fault of each switching device on a system is quantified by introducing an open-circuit fault risk coefficient, so that the open-circuit fault detection accuracy and robustness can be optimized.

Description

Open-circuit fault online risk estimation method based on three-level power generator
Technical Field
The invention belongs to the field of fault diagnosis and fault tolerance of a current transformer, and particularly relates to an open-circuit fault online risk estimation method based on a three-level power generator.
Background
IGBTs are now widely used in converter applications, and open-circuit fault detection and fault-tolerant strategies for IGBTs have also been the subject of intense research. However, the existing literature is directed to research after an open-circuit fault has occurred, that is, after the fault occurs, a positioning result for the open-circuit fault is obtained by analyzing and calculating a decision function by using an open-circuit fault positioning method. When an open-circuit fault does not occur, that is, when the system is operating normally, if an open-circuit fault occurs in a certain IGBT at a certain time, how much influence is exerted on the system by the IGBT? How to evaluate its influence on-line and quantify the risk curve of each IGBT open-circuit fault? These problems remain to be solved.
Disclosure of Invention
The invention aims to provide an open-circuit fault online risk estimation method based on a three-level power generator, which can accurately evaluate an open-circuit fault before the open-circuit fault occurs.
In order to achieve the purpose, the invention adopts the technical scheme that:
an online risk estimation method for an open-circuit fault based on a three-level power generator is used for estimating the open-circuit fault of the three-level power generator, the three-level power generator comprises three circuit units corresponding to three phases, each circuit unit comprises four switching devices which are connected in series and numbered in sequence, and the online risk estimation method for the open-circuit fault based on the three-level power generator comprises the following steps: performing the following steps for each of the circuit units, respectively:
step 1: defining an open-risk fault function Riks (X, j) of the switching device as:
Figure BDA0002262197090000011
wherein X belongs to A, B and C respectively correspond to three phases, j belongs to 1,2,3 and 4 are numbers of the switching devices, i belongs toXIs the output current of the X phase, SXIs the state of X corresponding to said circuit cell, S X1 means that a first one of said switching devices and a second one of said switching devices are on and a third one of said switching devices and a fourth one of said switching devices are off; sX0 means that a second one of said switching devices and a third one of said switching devices are on and a first one of said switching devices and a fourth one of said switching devices are off; sX-1 means that a third one of said switching devices and a fourth one of said switching devices are on and a first one of said switching devices and a second one of said switching devices are off;
step 2: defining a switching period TSTotal risk of open-circuit failure of jth of said switching devices of inner X-phase
Figure BDA0002262197090000021
Comprises the following steps:
Figure BDA0002262197090000022
wherein the content of the first and second substances,
Figure BDA0002262197090000023
is time of action T1An open risk fault function for the jth said switching device of the inner X phase,
Figure BDA0002262197090000024
is time of action T2An open risk fault function for the jth said switching device of the inner X phase,
Figure BDA0002262197090000025
is time of action T3An open risk fault function for the jth said switching device of the inner X phase,
Figure BDA0002262197090000026
is time of action T4An open risk fault function for the jth switching device of the inner X phase;
and step 3: let T1＝T2＝T3＝T4＝TS/4, one switching period TSTotal risk of open-circuit failure of jth of said switching devices of inner X-phase
Figure BDA0002262197090000027
For TSPer 4 to obtain a switching period TSTotal risk of new open-circuit failure of jth of said switching devices of inner X-phase
Figure BDA0002262197090000028
Comprises the following steps:
Figure BDA0002262197090000029
wherein the content of the first and second substances,
Figure BDA00022621970900000210
as an action vector v1An open risk fault function for the jth said switching device of the active X-phase,
Figure BDA00022621970900000211
as an action vector v2An open risk fault function for the jth said switching device of the active X-phase,
Figure BDA00022621970900000212
as an action vector v3An open risk fault function for the jth said switching device of the active X-phase,
Figure BDA00022621970900000213
as an action vector v4An open risk fault function for the jth switching device of the active X phase;
thereby calculating to obtain a switching period TSTotal risk of new open-circuit failure of jth of said switching devices of inner X-phase
Figure BDA00022621970900000214
And 4, step 4: based on a switching period TSTotal risk of new open-circuit failure of jth of said switching devices of inner X-phase
Figure BDA00022621970900000215
Calculating the total Risk Risk (X, j) of open-circuit fault of the jth switching device of the X phase in a period of time Delta TΔT；
And 5: total Risk of open failure Risk (X, j) for the jth switching device of the X phase over a period of time DeltaTΔTCalculating an open-circuit fault risk coefficient gamma (t) of the j-th switching device of the X phase at the time t as follows:
Figure BDA0002262197090000031
step 6: optimizing an open-circuit fault positioning decision function delta (t) by using the open-circuit fault risk coefficient gamma (t) of the jth switching device of the X phase at the time t to obtain a new open-circuit fault positioning decision function delta (t)*Thereby utilizing the new open circuit fault location decision function delta (t)*And estimating the open circuit fault and obtaining an evaluation result.
In the step 4, the total open-circuit fault Risk Risk (X, j) of the jth switching device of the X phase in a period of time Delta T is calculated in an integral modeΔT。
Open-circuit failure of jth of the switching devices of the X-phase for a period of time DeltaTTotal Risk Risk (X, j)ΔTThe calculation method comprises the following steps:
Figure BDA0002262197090000032
where T is the starting time of a period of time Δ T.
In the step 5, when the open-circuit fault Risk coefficient γ (T) of the jth switching device of the X phase at the time T is calculated, the total open-circuit fault Risk (X, j) of the jth switching device of the X phase within a time period Δ T obtained by the latest calculation from the time T is adoptedΔTThe value of (c).
In said step 6, a new open-circuit fault location decision function δ (t)*The calculation method comprises the following steps:
δ(t)*＝k*δ(t)*γ(t)
wherein k is a correction scale factor. The value range of k is 1-10.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages: the invention provides an effective online open-circuit fault risk assessment mechanism by taking a three-level power generator as a research object, and the influence of the potential open-circuit fault of each switching device on a system is quantified by introducing an open-circuit fault risk coefficient, so that the open-circuit fault detection accuracy and robustness can be optimized.
Drawings
Fig. 1 is a topology diagram of a three-level power generator.
FIG. 2 is a schematic representation of the start vectors involved in the method of the present invention.
FIG. 3 shows the total Risk Risk (X, j) for open circuit fault when calculating the Risk coefficient γ (t) of open circuit fault in the method of the present inventionΔTAnd (4) a value drawing.
FIG. 4 is a flow chart of the method of the present invention.
Detailed Description
The invention will be further described with reference to examples of embodiments shown in the drawings to which the invention is attached.
The first embodiment is as follows: as shown in FIG. 1, a three-level power generator includes corresponding three phasesEach circuit unit comprises four switching devices which are connected in series and are numbered in sequence, SXjThe j-th switching device of the X phase, the four switching devices of each phase are S respectivelyX1、SX2、SX3、SX4X belongs to A, B and C respectively correspond to three phases, and j belongs to 1,2,3 and 4 are numbers of the switching devices.
For the three-level power generator, an open-circuit fault online risk estimation method based on the three-level power generator is used for estimating open-circuit faults of the three-level power generator, and comprises the following steps:
as shown in fig. 4, the following steps are performed for each circuit unit, respectively:
step 1: definition of the switching device SXjThe open risk fault function Riks (X, j) of (a) is:
Figure BDA0002262197090000041
in the above formula, iXIs the output current of the X phase, SXIs the state of the corresponding circuit cell of X, S X1 means that the first switching device and the second switching device are on, and the third switching device and the fourth switching device are off; sX0 means that the second switching device and the third switching device are on, and the first switching device and the fourth switching device are off; sXWith-1 is meant that the third and fourth switching devices are on and the first and second switching devices are off.
Step 2: defining a switching period TSTotal risk of open-circuit failure of jth switching device of inner X-phase
Figure BDA0002262197090000042
Comprises the following steps:
Figure BDA0002262197090000043
in the above formula, the first and second carbon atoms are,
Figure BDA0002262197090000051
is time of action T1Open risk fault function of the jth switching device of the inner X phase,
Figure BDA0002262197090000052
is time of action T2Open risk fault function of the jth switching device of the inner X phase,
Figure BDA0002262197090000053
is time of action T3Open risk fault function of the jth switching device of the inner X phase,
Figure BDA0002262197090000054
is time of action T4Open risk fault function of jth switching device of inner X phase.
The above-mentioned operation time T1、T2、T3、T4Is obtained from four reference vectors according to the volt-second balance principle, and is used for each switching period TSAre all different.
And step 3: let T1＝T2＝T3＝T4＝TS/4, one switching period TSTotal risk of open-circuit failure of jth switching device of inner X-phase
Figure BDA0002262197090000055
For TSPer 4 to obtain a switching period TSTotal risk of new open-circuit failure of the jth switching device of the inner X-phase
Figure BDA0002262197090000056
Comprises the following steps:
Figure BDA0002262197090000057
in the above formula, the first and second carbon atoms are,
Figure BDA0002262197090000058
as an action vector v1Open risk fault function of applied j-th switching device of X phase，
Figure BDA0002262197090000059
As an action vector v2Open risk fault function for the jth switching device of the active X phase,
Figure BDA00022621970900000510
as an action vector v3Open risk fault function for the jth switching device of the active X phase,
Figure BDA00022621970900000511
as an action vector v4Open risk fault function of the jth switching device of the active X phase. V is1-ν4Respectively representing four action vectors in a two-level vector space.
Taking the open-circuit fault of the first switching device in the phase a as an example, table 1 gives a truth table of the total fault risk corresponding to the fault, and other conditions can be obtained according to the above formula.
TABLE 1 unit switch period open circuit
Figure BDA00022621970900000512
Truth table of risk value
Figure BDA00022621970900000513
Figure BDA0002262197090000061
Figure BDA0002262197090000071
The start vectors in table 1 can be referred to in fig. 2.
The pulse order in table 1 can be seen in table 2 below.
TABLE 2 switch order table
Figure BDA0002262197090000072
By this step, one switching period T in step 2 can be simplifiedSTotal risk of open-circuit failure of jth switching device of inner X-phase
Figure BDA0002262197090000073
The amount of calculation of (a).
So that a switching period T can be calculatedSTotal risk of new open-circuit failure of the jth switching device of the inner X-phase
Figure BDA0002262197090000074
And 4, step 4: based on a switching period TSTotal risk of new open-circuit failure of the jth switching device of the inner X-phase
Figure BDA0002262197090000081
Calculating the total open-circuit fault Risk Risk (X, j) of the j-th switching device of the X phase in a period of time delta T in an integral modeΔT. The total Risk of open failure Risk (X, j) of the jth switching device of the X phase for a period of time DeltaTΔTThe calculation method comprises the following steps:
Figure BDA0002262197090000082
in the above formula, T is the starting time of a period Δ T.
Thus, by the step 4, the total Risk Risk (X, j) of open failure of the jth switching device of the X phase in a plurality of consecutive Δ T phases can be calculatedΔT。
Resulting Total Risk (X, j)ΔTCan be regarded as SXjThe quantitative estimation value of the influence of the open-circuit fault on the converter is in direct proportion to the influence, and can be used for online evaluation of the influence and destructive power of the potential fault.
And 5: total Risk of open failure Risk (X, j) of the jth switching device of the X phase according to a period of time DeltaTΔTCalculating an open-circuit fault risk coefficient gamma (t) of the j-th switching device of the X phase at the time t as follows:
Figure BDA0002262197090000083
in this step, because γ (T) is a Risk integral of Δ T for a period of time, the value of γ (T) requires searching for the nearest Risk (X, j) to TΔTIs approximated by the total Risk of open-circuit failure Risk (X, j) of the j-th switching device of the X phase within a time delta T obtained by the last calculation from the time TΔTThe specific schematic of the values of (a) is shown in FIG. 3.
Step 6: optimizing an open-circuit fault positioning decision function delta (t) by using an open-circuit fault risk coefficient gamma (t) of the jth switching device of the X phase at the moment t to obtain a new open-circuit fault positioning decision function delta (t)*Thereby utilizing the new open circuit fault location decision function delta (t)*And estimating the open circuit fault and obtaining an evaluation result.
The risk coefficient gamma (t) is an approximate quantification result of the risk magnitude of the instantaneous open-circuit fault, and can also be used as an amplifier of a power device open-circuit fault positioning characteristic function. Supposing that the decision function of a certain open circuit fault positioning method is delta (t), further amplifying and optimizing the decision function delta (t) through a risk coefficient gamma (t) to obtain a new decision function delta (t) for open circuit fault positioning*. In this step, a new open-circuit fault location decision function δ (t)*The calculation method comprises the following steps:
δ(t)*＝k*δ(t)*γ(t)
and k is a correction proportion coefficient, and the value range of k is 1-10.
The traditional open-circuit fault positioning strategy is mainly based on voltage and current measurement, and the accuracy of the traditional open-circuit fault positioning strategy is limited by conditions such as load sudden change, no-load operation, given disturbance and the like. Optimized new decision function delta (t)*The weight of the decision function of the power device can be artificially amplified in an open-circuit risk area of the relevant power device, so that the accuracy and the disturbance resistance are improved. Of course, the introduction of the open-circuit risk factor amplifier will also amplify a part of the interference signal simultaneously, but since the effective fault signature signal is also amplified by equal times, it is ensured that no degradation will occurThe accuracy of the original decision function.
According to the scheme, a three-phase four-wire system NPC three-level power generator is taken as a research object, an effective online open-circuit fault risk assessment mechanism is provided, the influence of the potential open-circuit fault of each IGBT on a system is quantified by introducing an open-circuit fault risk coefficient, and then a method for optimizing the open-circuit fault detection accuracy and robustness by using the obtained risk assessment coefficient is provided.
The significance of the scheme is that the influence degree of specific potential open-circuit faults on the converter device can be quantitatively evaluated on line, and in addition, the quantitative result can be used for optimizing the open-circuit fault diagnosis method of the three-level power generator, so that the diagnosis precision is improved. The online quantitative evaluation is realized by introducing an open-circuit fault risk coefficient. The open circuit fault risk coefficient is formed by detecting, processing and calculating real-time pulses and finally forming a risk coefficient table; the optimized open-circuit fault diagnosis method is characterized in that the obtained open-circuit fault risk coefficient is multiplied by a fault characteristic objective function of the open-circuit fault diagnosis method, so that the amplification of the fault characteristic is realized, and the detection precision is improved.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.

Claims (6)

1. An open-circuit fault online risk estimation method based on a three-level power generator is used for estimating the open-circuit fault of the three-level power generator, the three-level power generator comprises three circuit units corresponding to three phases, each circuit unit comprises four serially-connected and sequentially-numbered switching devices, and the method is characterized in that: the open-circuit fault online risk estimation method based on the three-level power generator comprises the following steps: performing the following steps for each of the circuit units, respectively:
step 1: defining an open-risk fault function Riks (X, j) of the switching device as:
Figure FDA0002262197080000011
wherein X belongs to A, B and C respectively correspond to three phases, j belongs to 1,2,3 and 4 are numbers of the switching devices, i belongs toXIs the output current of the X phase, SXIs the state of X corresponding to said circuit cell, SX1 means that a first one of said switching devices and a second one of said switching devices are on and a third one of said switching devices and a fourth one of said switching devices are off; sX0 means that a second one of said switching devices and a third one of said switching devices are on and a first one of said switching devices and a fourth one of said switching devices are off; sX-1 means that a third one of said switching devices and a fourth one of said switching devices are on and a first one of said switching devices and a second one of said switching devices are off;
step 2: defining a switching period TSTotal risk of open-circuit failure of jth of said switching devices of inner X-phase
Figure FDA0002262197080000012
Comprises the following steps:
Figure FDA0002262197080000013
wherein the content of the first and second substances,
Figure FDA0002262197080000014
is time of action T1An open risk fault function for the jth said switching device of the inner X phase,
Figure FDA0002262197080000015
is time of action T2An open risk fault function for the jth said switching device of the inner X phase,
Figure FDA0002262197080000016
is time of action T3In the internal X phaseAn open risk fault function for j of said switching devices,
Figure FDA0002262197080000017
is time of action T4An open risk fault function for the jth switching device of the inner X phase;
and step 3: let T1＝T2＝T3＝T4＝TS/4, one switching period TSTotal risk of open-circuit failure of jth of said switching devices of inner X-phase
Figure FDA0002262197080000018
For TSPer 4 to obtain a switching period TSTotal risk of new open-circuit failure of jth of said switching devices of inner X-phase
Figure FDA0002262197080000021
Comprises the following steps:
Figure FDA0002262197080000022
wherein the content of the first and second substances,
Figure FDA0002262197080000023
as an action vector v1An open risk fault function for the jth said switching device of the active X-phase,
Figure FDA0002262197080000024
as an action vector v2An open risk fault function for the jth said switching device of the active X-phase,
Figure FDA0002262197080000025
as an action vector v3An open risk fault function for the jth said switching device of the active X-phase,
Figure FDA0002262197080000026
as an action vector v4An open risk fault function for the jth switching device of the active X phase;
thereby calculating to obtain a switching period TSTotal risk of new open-circuit failure of jth of said switching devices of inner X-phase
Figure FDA0002262197080000027
And 4, step 4: based on a switching period TSTotal risk of new open-circuit failure of jth of said switching devices of inner X-phase
Figure FDA0002262197080000028
Calculating the total Risk Risk (X, j) of open-circuit fault of the jth switching device of the X phase in a period of time Delta TΔT；
And 5: total Risk of open failure Risk (X, j) for the jth switching device of the X phase over a period of time DeltaTΔTCalculating an open-circuit fault risk coefficient gamma (t) of the j-th switching device of the X phase at the time t as follows:
Figure FDA0002262197080000029
step 6: optimizing an open-circuit fault positioning decision function delta (t) by using the open-circuit fault risk coefficient gamma (t) of the jth switching device of the X phase at the time t to obtain a new open-circuit fault positioning decision function delta (t)*Thereby utilizing the new open circuit fault location decision function delta (t)*And estimating the open circuit fault and obtaining an evaluation result.
2. The three-level power generator based open circuit fault online risk estimation method according to claim 1, characterized in that: in the step 4, the total open-circuit fault Risk Risk (X, j) of the jth switching device of the X phase in a period of time Delta T is calculated in an integral modeΔT。
3. Three-level power generator based on claim 2The open-circuit fault online risk estimation method is characterized by comprising the following steps: total Risk of open failure Risk (X, j) for jth of said switching devices of phase X over a period of time Δ TΔTThe calculation method comprises the following steps:
Figure FDA00022621970800000210
where T is the starting time of a period of time Δ T.
4. The three-level power generator based open circuit fault online risk estimation method according to claim 1, characterized in that: in the step 5, when the open-circuit fault Risk coefficient γ (T) of the jth switching device of the X phase at the time T is calculated, the total open-circuit fault Risk (X, j) of the jth switching device of the X phase within a time period Δ T obtained by the latest calculation from the time T is adoptedΔTThe value of (c).
5. The three-level power generator based open circuit fault online risk estimation method according to claim 1, characterized in that: in said step 6, a new open-circuit fault location decision function δ (t)*The calculation method comprises the following steps:
δ(t)*＝k*δ(t)*γ(t)
wherein k is a correction scale factor.
6. The three-level power generator based open circuit fault online risk estimation method according to claim 5, characterized in that: the value range of k is 1-10.
CN201911075115.6A 2019-11-06 2019-11-06 Open-circuit fault online risk estimation method based on three-level power generator Pending CN110927513A (en)

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Publication number Priority date Publication date Assignee Title
CN104391189A (en) * 2014-10-13 2015-03-04 合肥工业大学 Three-stage-diagnosis-based large-scale photovoltaic array fault diagnosis and positioning method
CN107703415A (en) * 2016-12-20 2018-02-16 中国矿业大学 A kind of two level three-phase four-line D STATCOM major loop switching device open fault localization methods

Patent Citations (2)

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Publication number Priority date Publication date Assignee Title
CN104391189A (en) * 2014-10-13 2015-03-04 合肥工业大学 Three-stage-diagnosis-based large-scale photovoltaic array fault diagnosis and positioning method
CN107703415A (en) * 2016-12-20 2018-02-16 中国矿业大学 A kind of two level three-phase four-line D STATCOM major loop switching device open fault localization methods

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Title
王珂: "配电网静止同步补偿器开关器件故障诊断和容错控制研究", 《中国博士学位论文全文数据库 工程科技Ⅱ辑》 *

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