CN110907377A - Performance research method of low-radiation composite film - Google Patents
Performance research method of low-radiation composite film Download PDFInfo
- Publication number
- CN110907377A CN110907377A CN201911258446.3A CN201911258446A CN110907377A CN 110907377 A CN110907377 A CN 110907377A CN 201911258446 A CN201911258446 A CN 201911258446A CN 110907377 A CN110907377 A CN 110907377A
- Authority
- CN
- China
- Prior art keywords
- film
- performance
- low
- test
- composite film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N19/00—Investigating materials by mechanical methods
- G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3148—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3155—Measuring in two spectral ranges, e.g. UV and visible
Abstract
The invention discloses a performance research method of a low-radiation composite film, which comprises the following steps: s1: testing optical performance, namely measuring the near-infrared transmittance of the film by using a Lambda950 type ultraviolet/visible/infrared spectrometer; s2: testing the optical performance of visible light; s3: testing the square resistance, namely detecting the square resistance of the silver film by using a double electric test four-probe tester; s4: micro-hardness test, in which a micro-hardness meter tests the hardness of the film; s5: performing film thickness test, namely performing ellipsometry spectrum measurement on the zirconium nitride film on the monocrystalline silicon substrate by adopting a multi-wavelength ellipsometer; s6: moisture resistance test of low-emissivity films; s7: and testing the physical and chemical properties of the coated sample. The invention mainly aims at a performance research method of a low-radiation composite film, is convenient for a user to compare and observe photos in the later period, and can be used for learning short boards of projects, so that the subsequent research and development of the film can be clarified by workers.
Description
Technical Field
The invention relates to the technical field of composite films, in particular to a performance research method of a low-radiation composite film.
Background
The low-radiation film is developed in the development process of large-area glass coating, and in the period of the second war of 1941 to 1945, in order to eliminate static electricity on a radar screen, which influences the search efficiency, the surface coated glass, namely 'NESA' glass, is developed by Pittsburgh plate glass company (PPG) in USA and the Meilong research institute in a combined manner; in 1950, Piercun company in England gained the patent of float glass production design and rapidly popularized 1960, and American PPG company adopted high temperature pyrolysis method to produce coated glass with light and heat reflection function, meanwhile, France Saint gobain company adopted vacuum evaporation intermittent deposition coated glass, LOF company adopted electron beam evaporation technology to establish the first semi-continuous coating production line in the world, and Si0 was used to evaporate metal aluminum, and in 1971 for protective film, American Airco company invented high efficiency magnetron sputtering plane target, and all these glass coating technology development created conditions for developing low radiation coated glass technology.
Since the energy crisis caused by forbidden petroleum in 1973, the western world develops an energy-saving sport which is still continuous until today, so that a large amount of energy-saving equipment and energy-saving methods are developed, low-emissivity glass is one kind, and the low-emissivity glass with a gold film layer is popular in the european market before and after 1975, but the price of gold is high, so that the popularization of the products is limited, and the first silver-based low-emissivity coating production line is launched by the german lebao company in 1980; in 1983, colorless silver-plated low-emissivity films began to be used for car windshields; in 1989, pilkinton, uk and LOF, usa announced that low emissivity glass with thermal insulation performance almost comparable to that of silver-plated film was produced by chemical vapor deposition, with emissivity decreasing from 0.4 to 0.1, with the film being strong, abrasion resistant and corrosion resistant, and soon american air company announced that twin cylindrical targets were introduced into the production line (i.e., C-MAG cathode) (1) and developed a new lower emissivity film system, and subsequently american south wall company used a roll coating process to coat low emissivity film with emissivity of only 0.10 on polyester film, and stretched film in the middle of a double window also achieved good energy saving results.
Compared with the preparation and performance research text of the ZrNxAgZrNx low-emissivity film, the internal description thereof is as follows: optical performance test, visible light optical performance test, microhardness test, film thickness test, low-radiation film moisture-proof test and film-coated sample physical and chemical performance test.
However, the damage condition of the film is not kept in the experimental process of the document, which is inconvenient for a user to research the performance of the film at a later stage, a subsequent research route cannot be well drawn up according to the experiment, and the defect exists in implementation
Disclosure of Invention
The invention aims to provide a method for researching the performance of a low-radiation composite film, so as to solve the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme: a method for researching the performance of a low-radiation composite film comprises the following steps:
s1: testing optical performance, namely measuring the near-infrared transmittance of the film by using a Lambda950 type ultraviolet/visible/infrared spectrometer to obtain visible/near-infrared transmission and reflection spectrum curves within the wavelength range of 380-2500 nm;
s2: testing the optical performance of visible light, namely detecting the visible transmittance of the film by using an ultraviolet-visible light spectrum gradiometer to obtain a visible transmission spectrum within the wavelength range of 380-800 nm;
s3: testing the square resistance, namely detecting the square resistance of the silver film by using a double-electric-test four-probe tester, observing the surface condition of the film by using a microscope, taking a picture for recording, and corresponding to the project step;
s4: performing microhardness test, namely performing hardness test on the film by a microhardness tester, wherein the applied load is 10g, the microscope magnification is 400 times, observing the surface condition of the film by adopting a microscope, and taking a picture record, and corresponding to the project steps;
s5: performing ellipsometry spectrum measurement on the zirconium nitride film on the monocrystalline silicon substrate by using a multi-wavelength ellipsometer, analyzing ultraviolet to visible regions with the wavelength range of 245-1000 mm, and analyzing the ultraviolet to visible regions with the incident angle of 70 degrees, the measurement error of 0.3A and the beam diameter of 2 mm;
s6: in the humidity resistance experiment of the low-radiation film, a sample is vertically placed in a closed container for 336 hours, the temperature in the container is kept at 50 +/-2 ℃, the relative humidity is 95% +/-4%, the corrosion condition of the surface of the film is observed by adopting a microscope, and a photo is taken for recording, and the project steps are corresponded;
s7: the physical and chemical performance test of the coating sample comprises the following steps:
a: adhering transparent adhesive tape on a sample, continuously and circularly tearing off and adhering the transparent adhesive tape on the film, qualitatively representing the adhesive force between the film and a substrate, taking a picture to record the surface condition of the film, and corresponding to the project step;
b: acid resistance test, namely preparing a proper amount of 0.001mol L HNO solution, soaking for 24 hours, taking out and cleaning, airing, observing the change of the appearance of the composite film, then measuring the visible light transmittance of the composite film, observing the surface condition of the film by using a microscope, taking a picture and recording, and corresponding to the project steps;
c: and (3) alkali resistance test, namely preparing a proper amount of 1mol L NaOH solution, soaking for 24 hours, taking out and washing, airing, observing the change of the film appearance during compounding, then measuring the visible light transmittance, observing the surface condition of the film by using a microscope, taking a picture and recording, and corresponding to the project steps.
Preferably, in S1, the multi-wavelength type ellipsometer performs ellipsometry measurement of the nitrided dislocation thin film on the single crystal host substrate, and calculates the refractive index and the extinction coefficient.
Preferably, in S4, the load is applied in such a manner that the load is linearly increased from a zero value to a maximum value in the first 10S, the maximum load is maintained in the middle 10S, and the load is released to a zero value in the last 10S, taking into account the creep effect.
Preferably, in S5, the thickness of the film is measured directly in air at normal temperature, and the thickness of the film is obtained by fitting the measured ellipsometric parameters.
Preferably, in S6, the appearance of the sample may be visually inspected before and after the test, that is, the surface peeling phenomenon, and the decrease in visible light transmittance may be inspected.
Preferably, in step a of S7, the films may be adhered to samples of different materials, the adhesion of the films may be variously observed, and a table indicating that the adhesion of the samples of different materials is different may be prepared.
Preferably, in steps d and c of S7, the film may be dried by a drying device, and the drying temperature does not exceed 30 ℃.
Preferably, in each of S3, S6 and S7, a photograph is taken and corresponds to the project, so as to compare the damage degree of the film in different projects in the later period, and further to set a short board project and a film development direction in the later period.
Compared with the prior art, the invention has the beneficial effects that: drying device through no more than 30 degrees dries the sample film, neither can be to the additional secondary injury in surface of film, also can make the research progress to the film performance accelerate, the person of facilitating the use's operation, the great promotion that has obtained of research efficiency, in-process that studies to the film need carry out the performance test to the film, thereby can lead to the fact not equidimension's damage to the film, later the user can carry out the shooting record of surface condition to the sample, and preserve the photo, and in the photo that will preserve corresponds experimental project, the person of facilitating the use later stage contrasts the photo and observes, can be to knowing the short slab of project, thereby can make the staff make clear and definite follow-up research and the development of film, the person of facilitating the use knows the film performance fast, this scheme is succinct, the planning nature is stronger, easily use widely.
Drawings
FIG. 1 is an overall flow diagram of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, the present invention provides a technical solution: a method for researching the performance of a low-radiation composite film comprises the following steps:
s1: testing optical performance, namely measuring the near-infrared transmittance of the film by using a Lambda950 type ultraviolet/visible/infrared spectrometer to obtain visible/near-infrared transmission and reflection spectrum curves within the wavelength range of 380-2500 nm;
s2: testing the optical performance of visible light, namely detecting the visible transmittance of the film by adopting an ultraviolet-visible light spectrum gradiometer to further obtain a visible transmission spectrum within the wavelength range of 380-800 nm;
s3: testing the square resistance, namely detecting the square resistance of the silver film by using a double-electric-test four-probe tester, observing the surface condition of the film by using a microscope, taking a picture for recording, and corresponding to the project step;
s4: the microhardness test is carried out, wherein a microhardness tester carries out the hardness test on the film, the applied load is 10g, the microscope magnification is 400 times, and the creep effect is considered, the loading mode is that the load is linearly increased to the maximum value from the zero value in the first 10s, the maximum load is kept unchanged in the middle 10s, the load is released to the zero value in the last 10s, the surface condition of the film is observed by adopting a microscope, a photo is taken for recording, and the steps correspond to the project steps;
s5: performing ellipsometry on the zirconium nitride film on the monocrystalline silicon substrate by adopting a multi-wavelength ellipsometer, analyzing ultraviolet with the wavelength range of 245-1000 mm to a visible region, measuring the incident angle of 70 degrees and the measurement error of 0.3A, wherein the diameter of a light beam is 2mm, directly measuring the thickness of the film in the air at normal temperature, and fitting the measured ellipsometry parameters to obtain the thickness of the film;
s6: a humidity resistance experiment of a low-radiation film refers to a humidity resistance experiment method in GB/T5137.3-2002 part 3 of an automobile safety glass experiment method, namely, a test method of radiation resistance, high temperature, humidity, combustion and simulated climate resistance, a sample is vertically placed in a closed container for 336h (two weeks), the temperature in the container is kept at 50 +/-2 ℃, and the relative humidity is 95 +/-4%, the appearance change of the sample before and after the test, namely a surface falling phenomenon, is visually checked, in addition, the reduction of visible light transmittance is checked, the experiment increases the requirement on the basis of the GB/T5137.3-2002 standard, the temperature is increased from 50 +/-2 ℃ to 80 +/-5 ℃, the corrosion condition of the surface of the film is observed by a microscope except the appearance change of the sample before and after the test is visually checked, a picture is taken and recorded, and the project steps are corresponded;
s7: the physical and chemical performance test of the coating sample comprises the following steps:
a: adhering transparent adhesive tape on a sample, continuously and circularly tearing off and adhering the transparent adhesive tape on the film, qualitatively representing the adhesion between the film and a substrate, respectively adhering the film on samples of different materials, variously observing the adhesion of the film, formulating tables with different adhesion of the samples of different materials, taking a picture, recording the surface condition of the film, and corresponding to the project step;
b: acid resistance test, namely preparing a proper amount of 0.001mol L HNO solution, soaking for 24 hours, taking out, cleaning, airing, drying the film by a drying device at a drying temperature of no more than 30 ℃, observing the change of the appearance of the composite film, measuring the visible light transmittance of the film, taking a picture and recording, and corresponding to the project step;
c: and (3) alkali resistance test, namely preparing a proper amount of 1mol L NaOH solution, soaking for 24 hours, taking out, washing, airing, drying the film by a drying device, observing the change of the film appearance during compounding at the drying temperature of not more than 30 ℃, observing the surface condition of the film by using a microscope, measuring the visible light transmittance of the film, taking a picture and recording, and corresponding to the project steps.
The invention mainly aims at a performance research method of a low-radiation composite film, a sample film is dried by a drying device with the temperature not more than 30 ℃, secondary damage is not caused to the surface of the film, the research process of the film performance can be accelerated, the operation of a user is facilitated, the research efficiency is greatly improved, the film needs to be subjected to a performance test in the film research process, so that the film is damaged in different degrees, then the user can shoot and record the surface condition of the sample and store the picture, the stored picture corresponds to a test project, the user can conveniently compare and observe the picture in the later period, a short board with the project can be known, so that the staff can clearly and clearly carry out the subsequent research and development of the film, and the user can conveniently and quickly know the film performance, the scheme is simple and clear, the planning is stronger, easily uses widely.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. A performance research method of a low-radiation composite film is characterized by comprising the following steps:
s1: testing optical performance, namely measuring the near-infrared transmittance of the film by using a Lambda950 type ultraviolet/visible/infrared spectrometer to obtain visible/near-infrared transmission and reflection spectrum curves within the wavelength range of 380-2500 nm;
s2: testing the optical performance of visible light, namely detecting the visible transmittance of the film by using an ultraviolet-visible light spectrum gradiometer to obtain a visible transmission spectrum within the wavelength range of 380-800 nm;
s3: testing the square resistance, namely detecting the square resistance of the silver film by using a double-electric-test four-probe tester, observing the surface condition of the film by using a microscope, taking a picture for recording, and corresponding to the project step;
s4: performing microhardness test, namely performing hardness test on the film by a microhardness tester, wherein the applied load is 10g, the microscope magnification is 400 times, observing the surface condition of the film by adopting a microscope, and taking a picture record, and corresponding to the project steps;
s5: performing ellipsometry spectrum measurement on the zirconium nitride film on the monocrystalline silicon substrate by using a multi-wavelength ellipsometer, analyzing ultraviolet to visible regions with the wavelength range of 245-1000 mm, and analyzing the ultraviolet to visible regions with the incident angle of 70 degrees, the measurement error of 0.3A and the beam diameter of 2 mm;
s6: in the humidity resistance experiment of the low-radiation film, a sample is vertically placed in a closed container for 336 hours, the temperature in the container is kept at 50 +/-2 ℃, the relative humidity is 95% +/-4%, the corrosion condition of the surface of the film is observed by adopting a microscope, and a photo is taken for recording, and the project steps are corresponded;
s7: the physical and chemical performance test of the coating sample comprises the following steps:
a: adhering transparent adhesive tape on a sample, continuously and circularly tearing off and adhering the transparent adhesive tape on the film, qualitatively representing the adhesive force between the film and a substrate, taking a picture to record the surface condition of the film, and corresponding to the project step;
b: acid resistance test, namely preparing a proper amount of 0.001mol L HNO solution, soaking for 24 hours, taking out and cleaning, airing, observing the change of the appearance of the composite film, then measuring the visible light transmittance of the composite film, observing the surface condition of the film by using a microscope, taking a picture and recording, and corresponding to the project steps;
c: and (3) alkali resistance test, namely preparing a proper amount of 1mol L NaOH solution, soaking for 24 hours, taking out and washing, airing, observing the change of the film appearance during compounding, then measuring the visible light transmittance, observing the surface condition of the film by using a microscope, taking a picture and recording, and corresponding to the project steps.
2. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: in S1, the multi-wavelength ellipsometer performs ellipsometry measurement of the misfit nitride film on the single crystal host substrate, and calculates the refractive index and the extinction coefficient.
3. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: in S4, the load is loaded in such a way that the load is linearly increased from zero to a maximum value in the first 10S, the maximum load is kept unchanged in the middle 10S, and the load is released to zero in the last 10S, taking the creep effect into consideration.
4. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: at S5, the thickness of the film is measured directly in air at normal temperature, and the thickness of the film is fitted with the measured ellipsometric parameters.
5. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: in S6, the appearance of the sample may be visually inspected before and after the test, that is, the surface peeling phenomenon, and the decrease in visible light transmittance may be inspected.
6. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: in step a of S7, the films may be adhered to samples of different materials, the adhesion of the films may be variously observed, and a table of different adhesion of samples of different materials may be prepared.
7. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: in steps d and c of S7, the film may be dried by a drying device at a temperature not exceeding 30 ℃.
8. The method for researching the performance of the low-radiation composite film according to claim 1, is characterized in that: the pictures are required to be taken in S3, S6 and S7 and correspond to the projects, the damage degrees of the films in different projects in the later period are compared, and then a short board project is formulated and the film development direction is formulated in the later period.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911258446.3A CN110907377A (en) | 2019-12-10 | 2019-12-10 | Performance research method of low-radiation composite film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911258446.3A CN110907377A (en) | 2019-12-10 | 2019-12-10 | Performance research method of low-radiation composite film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110907377A true CN110907377A (en) | 2020-03-24 |
Family
ID=69824235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911258446.3A Pending CN110907377A (en) | 2019-12-10 | 2019-12-10 | Performance research method of low-radiation composite film |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110907377A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103884657A (en) * | 2014-03-21 | 2014-06-25 | 浙江大学 | Method for measuring radiance of on-line low-radiance energy-saving coated glass |
-
2019
- 2019-12-10 CN CN201911258446.3A patent/CN110907377A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103884657A (en) * | 2014-03-21 | 2014-06-25 | 浙江大学 | Method for measuring radiance of on-line low-radiance energy-saving coated glass |
Non-Patent Citations (2)
| Title |
|---|
| 孙晓麟 等: "草酸阳极氧化法制备铝合金氧化膜及其防腐蚀性能", 《材料保护》 * |
| 王亚平: "ZrNx/Ag/ZrNx低辐射薄膜的制备及性能研究", 《中国优秀硕士学位论文全文数据库 工程科技I辑》 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Park et al. | The effect of film microstructures on cracking of transparent conductive oxide (TCO) coatings on polymer substrates | |
| Wang et al. | Spectrally selective solar absorber stable up to 900° C for 120 h under ambient conditions | |
| WO2012096304A1 (en) | Far infrared reflecting laminate | |
| US11105966B2 (en) | Functional building material for windows and doors | |
| Womack et al. | Performance and durability of broadband antireflection coatings for thin film CdTe solar cells | |
| CN110275228A (en) | A kind of stealthy film and preparation method thereof | |
| EP2632869A1 (en) | Tco coating and coated substrate for high temperature applications | |
| JP6288518B2 (en) | Gas barrier film and method for producing the same | |
| Cathro et al. | Durability of porous silica antireflection coatings for solar collector cover plates | |
| CN102219396A (en) | Temperable gold low-emissivity coated glass and manufacturing method thereof | |
| CN110907377A (en) | Performance research method of low-radiation composite film | |
| JP2010212085A (en) | Transparent conductive thin film | |
| CN109837517A (en) | A kind of external reflectance silverskin preparation method based on magnetron sputtering | |
| Xu et al. | SiNx thickness dependence of spectral properties and durability of protected-silver mirrors | |
| Almanza et al. | Further option for solar concentrators: aluminum first surface mirrors | |
| McGeoch et al. | Coatings for the protection of diamond in high-temperature environments | |
| CN103884657A (en) | Method for measuring radiance of on-line low-radiance energy-saving coated glass | |
| CN218728127U (en) | Infrared internal reflection metal film | |
| CN114249546B (en) | Carbon film-plated infrared chalcogenide glass lens and preparation method and application thereof | |
| Wu et al. | Enhancing indium tin oxide (ITO) thin film adhesiveness using the coupling agent silane | |
| CN114324249B (en) | Characterization method of electrical characteristics of transparent conductive film based on full spectrum method | |
| CN108026752B (en) | Functional building material for window | |
| Xu et al. | The study on the interface adhesion comparison of the MgF2, Al2O3, SiO2 and Ag thin films | |
| Kijima et al. | Effect of the pressure of sputtering atmosphere on the physical properties of amorphous aluminum oxide films | |
| Xu et al. | NiCrN x interlayer thickness dependence of spectral performance and environmental durability of protected-silver mirrors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200324 |