CN110887857A - Method for detecting polyacrylonitrile fiber generalized crystallinity by two-dimensional X-ray diffraction - Google Patents
Method for detecting polyacrylonitrile fiber generalized crystallinity by two-dimensional X-ray diffraction Download PDFInfo
- Publication number
- CN110887857A CN110887857A CN201811040944.6A CN201811040944A CN110887857A CN 110887857 A CN110887857 A CN 110887857A CN 201811040944 A CN201811040944 A CN 201811040944A CN 110887857 A CN110887857 A CN 110887857A
- Authority
- CN
- China
- Prior art keywords
- amorphous phase
- ratio
- diffraction
- theta
- dimensional
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention provides a method for detecting the generalized crystallinity of polyacrylonitrile fibers by applying two-dimensional X-ray diffraction, belonging to the analysis and test technology of material crystal structures. Aiming at the fact that polyacrylonitrile fibers have partial ordered and disordered structures besides three-dimensional ordered crystalline phases and disordered phases, a crystalline state X-ray characterization test method which comprehensively considers the types and values of physical phases in the PAN fibers is not established at home and abroad at present, and the ratio X of the crystalline phase is used for the inventioncOriented amorphous phase ratio XoRatio X to amorphous phaseaThe three structural parameters are used as the characterization parameters of the polyacrylonitrile fiber generalized crystallinity. Selecting characteristic diffraction angles based on a two-dimensional X-ray diffraction pattern, obtaining a diffraction intensity-azimuth angle distribution curve after integration, calculating the integral intensity, and further calculating to obtain a crystal phase ratio XcOriented amorphous phase ratio XoRatio X to amorphous phaseaThree structural parameters comprehensively consider the crystalline state of the species and the numerical values of the phases in the PAN fiber, and the characterization is more accurate.
Description
Technical Field
The present invention belongs to the field of material crystal structure analysis and test technology.
Background
Polyacrylonitrile (PAN) fiber is a precursor for producing high-quality carbon fiber, and the quality of the performance of the Polyacrylonitrile (PAN) fiber has an important influence on the quality of the carbon fiber. PAN fibers have a long molecular chain structure, and atoms in the molecular chain are strongly bonded by covalent bonds or the like, while inter-chains are weakly bonded by hydrogen bonds or van der waals forces or the like, so that the PAN fibers have partially ordered and disordered structures such as oriented amorphous structures in addition to three-dimensional ordered crystalline and disordered phases, and the types and the numbers of various ordered structures have an important influence on the performance of the PAN fibers. However, a crystallization state X-ray characterization test technology which fully considers the species and the numerical value of the physical phase in the PAN fiber is not established at home and abroad up to now. Therefore, the object and original intention of the present invention are to solve the technical problem.
Disclosure of Invention
Aiming at the problems, the invention provides a method for detecting the generalized crystallinity of polyacrylonitrile fiber by two-dimensional X-ray diffraction, which uses the crystalline phase ratio XcOriented amorphous phase ratio XoRatio X to amorphous phaseaThe three structural parameters are used as the characterization parameters of the polyacrylonitrile fiber generalized crystallinity.
The technical scheme adopted by the invention is as follows:
1) testing polyacrylonitrile fibers by using a two-dimensional X-ray diffractometer to obtain a two-dimensional diffraction pattern, and simultaneously obtaining an I (2 theta, kappa) curve, namely a diffraction intensity-diffraction angle-azimuth angle curve;
2) selecting a diffraction angle 2 theta of a (100) crystal plane for a crystal phasec16.9 deg. at diffraction angle 2 thetacSolving curve integral in the range of +/-delta 2 theta; the diffraction angle 2 theta is selected for the oriented amorphous phaseo25.2 deg. at diffraction angle 2 thetaoSolving curve integral in the range of +/-delta 2 theta; respectively obtaining I-kappa distribution curves, namely diffraction intensity-azimuth angle curves; delta 2 theta is 1-5 degrees;
3) respectively carrying out integration on the peaks of the I-kappa distribution curves to obtain the integrated intensity I of the crystalline phase in the range of azimuth angle-90 DEG for the two I-kappa distribution curvescAnd the integral intensity I of the oriented amorphous phase in the interval of azimuth angle-90 DEGoIntegral intensity I of amorphous phase in the interval of azimuth angle-90 DEGaObtaining by integrating the baseline of the diffraction arc I-kappa distribution curve of the oriented amorphous phase;
4) calculating the phase ratio X of the crystalloid according to a formulacOriented amorphous phase ratio XoRatio X to amorphous phaseaThe three structural parameters are set to be in a certain range,
the invention has the beneficial effects that:
solving the problem that a crystallization state X-ray characterization test technology which comprehensively considers the species and the numerical value of the object phase in the PAN fiber is not established at home and abroad up to now, providing a method for detecting the generalized crystallinity of the polyacrylonitrile fiber by applying two-dimensional X-ray diffraction, and taking the ratio of the crystallization phase to the XcOriented amorphous phase ratio XoRatio X to amorphous phaseaThe three structural parameters are used as the characterization parameters of the polyacrylonitrile fiber generalized crystallinity, and the structures of ordered crystalline phase, disordered phase and partial ordered and disordered phases (oriented amorphous phase) can be accurately described.
Drawings
FIG. 1 two-dimensional diffraction pattern of Polyacrylonitrile (PAN) fiber;
FIG. 2 diffraction intensity-azimuth (I-. kappa.) distribution curves.
Detailed Description
Example 1
1) Testing polyacrylonitrile fiber by using a two-dimensional X-ray diffractometer to obtain a two-dimensional diffraction pattern (shown as figure 1), and simultaneously obtaining an I (2 theta, kappa) curve, namely a diffraction intensity-diffraction angle-azimuth angle curve;
2) selecting a diffraction angle 2 theta of a (100) crystal plane for a crystal phasec16.9 deg. at diffraction angle 2 thetacSolving curve integral in the range of +/-delta 2 theta; the diffraction angle 2 theta is selected for the oriented amorphous phaseo25.2 deg. at diffraction angle 2 thetaoSolving curve integral in the range of +/-delta 2 theta; respectively obtaining I-kappa distribution curves (shown in figure 2), namely diffraction intensity-azimuth angle curves; delta 2 theta is 1-5 degrees;
3) respectively carrying out integration on the peaks of the I-kappa distribution curves to obtain the integrated intensity I of the crystalline phase in the range of azimuth angle-90 DEG for the two I-kappa distribution curvescAnd the integral intensity I of the oriented amorphous phase in the interval of azimuth angle-90 DEGoIntegral intensity I of amorphous phase in the interval of azimuth angle-90 DEGaObtained by integrating the baseline of the diffraction arc I-. kappa.distribution curve of the oriented amorphous phase:
Ic=164522,Io=6536,Ia=52787;
4) calculating the phase ratio X of the crystalloid according to a formulacOriented amorphous phase ratio XoRatio X to amorphous phaseaThe three structural parameters are set to be in a certain range,
Claims (1)
1. a method for detecting the generalized crystallinity of polyacrylonitrile fiber by two-dimensional X-ray diffraction is characterized in that the method uses the crystal phase ratio XcOriented amorphous phase ratio XoRatio X to amorphous phaseaThree structural parameters are taken as characterization parameters of the polyacrylonitrile fiber generalized crystallinity, and the detection method comprises the following specific steps:
1) testing polyacrylonitrile fibers by using a two-dimensional X-ray diffractometer to obtain a two-dimensional diffraction pattern, and simultaneously obtaining an I (2 theta, kappa) curve, namely a diffraction intensity-diffraction angle-azimuth angle curve;
2) to, forCrystal phase, selective (100) plane diffraction angle 2 thetac16.9 deg. at diffraction angle 2 thetacSolving curve integral in the range of +/-delta 2 theta; the diffraction angle 2 theta is selected for the oriented amorphous phaseo25.2 deg. at diffraction angle 2 thetaoSolving curve integral in the range of +/-delta 2 theta; respectively obtaining I-kappa distribution curves, namely diffraction intensity-azimuth angle curves; delta 2 theta is 1-5 degrees;
3) respectively carrying out integration on the peaks of the I-kappa distribution curves to obtain the integrated intensity I of the crystalline phase in the range of azimuth angle-90 DEG for the two I-kappa distribution curvescAnd the integral intensity I of the oriented amorphous phase in the interval of azimuth angle-90 DEGoIntegral intensity I of amorphous phase in the interval of azimuth angle-90 DEGaObtaining by integrating the baseline of the diffraction arc I-kappa distribution curve of the oriented amorphous phase;
4) calculating the phase ratio X of the crystalloid according to a formulacOriented amorphous phase ratio XoRatio X to amorphous phaseaThe three structural parameters are set to be in a certain range,
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811040944.6A CN110887857A (en) | 2018-09-07 | 2018-09-07 | Method for detecting polyacrylonitrile fiber generalized crystallinity by two-dimensional X-ray diffraction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811040944.6A CN110887857A (en) | 2018-09-07 | 2018-09-07 | Method for detecting polyacrylonitrile fiber generalized crystallinity by two-dimensional X-ray diffraction |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110887857A true CN110887857A (en) | 2020-03-17 |
Family
ID=69744402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201811040944.6A Pending CN110887857A (en) | 2018-09-07 | 2018-09-07 | Method for detecting polyacrylonitrile fiber generalized crystallinity by two-dimensional X-ray diffraction |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110887857A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104264264A (en) * | 2014-09-23 | 2015-01-07 | 中复神鹰碳纤维有限责任公司 | Preparation method of high-orientation-degree polyacrylonitrile fibers |
CN106426973A (en) * | 2016-08-31 | 2017-02-22 | 苏州西脉新诚生物科技有限公司 | Method for preparing orientated-state polylactic acid profile |
CN107192729A (en) * | 2017-05-18 | 2017-09-22 | 吉林大学 | The online fast analyser of polyacrylonitrile fibre structure X-ray diffraction and method |
-
2018
- 2018-09-07 CN CN201811040944.6A patent/CN110887857A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104264264A (en) * | 2014-09-23 | 2015-01-07 | 中复神鹰碳纤维有限责任公司 | Preparation method of high-orientation-degree polyacrylonitrile fibers |
CN106426973A (en) * | 2016-08-31 | 2017-02-22 | 苏州西脉新诚生物科技有限公司 | Method for preparing orientated-state polylactic acid profile |
CN107192729A (en) * | 2017-05-18 | 2017-09-22 | 吉林大学 | The online fast analyser of polyacrylonitrile fibre structure X-ray diffraction and method |
Non-Patent Citations (1)
Title |
---|
葛陈程等: "应用二维X射线衍射法测定涤纶工业丝结晶和取向行为", 《纺织学报》 * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Feng et al. | Epitaxy of single‐crystalline GaN film on CMOS‐compatible Si (100) substrate buffered by graphene | |
Emery et al. | Chemically resolved interface structure of epitaxial graphene on SiC (0001) | |
Du et al. | Iso-oriented monolayer α-MoO 3 (010) films epitaxially grown on SrTiO 3 (001) | |
Viterisi et al. | Unambiguous determination of molecular packing in crystalline donor domains of small molecule solution processed solar cell devices using routine X-ray diffraction techniques | |
CN104034744A (en) | Method for measuring residual stress of pyrolytic carbon coating by virtue of X ray diffraction | |
JP2020519868A (en) | X-ray diffraction in situ characterization method for thin film oriented crystal growth | |
Supplie et al. | In situ access to the dielectric anisotropy of buried III-V/Si (100) heterointerfaces | |
Zhai et al. | Growth of ideal amorphous carbon films at low temperature by e-beam evaporation | |
CN110887857A (en) | Method for detecting polyacrylonitrile fiber generalized crystallinity by two-dimensional X-ray diffraction | |
CN113215551B (en) | Method for preparing TaC | |
Zhao et al. | Effect of dual buffer layer structure on the epitaxial growth of AlN on sapphire | |
Frischmuth et al. | High temperature annealing effects on the chemical and mechanical properties of inductively-coupled plasma-enhanced chemical vapor deposited a-SiC: H thin films | |
Kukushkin et al. | X-ray reflectometry and simulation of the parameters of SiC epitaxial films on Si (111), grown by the atomic substitution method | |
Mao et al. | Fabrication and characterization of hierarchical multipod silver citrate complex microcrystals with excellent SERS properties | |
Hammann et al. | Structural study by solid-state 71 Ga NMR of thin film transistor precursors | |
Laatar et al. | Correlation between microstructural and optical properties of silicon thin films grown onto porous alumina by plasma–enhanced CVD method | |
CN110887854A (en) | Method for detecting polyacrylonitrile fiber generalized orientation degree by two-dimensional X-ray diffraction | |
CN110793982B (en) | High-energy X-ray characterization method for nano crystallization kinetic process | |
Diware | Shraddha Ganorkar | |
Yang et al. | Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry | |
TW201336861A (en) | Crystalline compounds of androstane-3 β ,5 α ,6 β -triol and preparation method therefor | |
CN207300461U (en) | A kind of membrane stress test substrate clamp | |
Kumar et al. | Anisotropic distribution of dislocations density in tensile strained GaP/GaAs epilayers | |
Ganorkar et al. | Wafer-Scale Growth and High-Throughput Characterization of Ultrathin 2D Transition Metal Dichalcogenides (TMDCs) for Energy Applications | |
CN107285302B (en) | Preparation method of graphene |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200317 |
|
WD01 | Invention patent application deemed withdrawn after publication |