CN110887848B - Method for testing reflectivity of wave-absorbing material plate with deformability - Google Patents
Method for testing reflectivity of wave-absorbing material plate with deformability Download PDFInfo
- Publication number
- CN110887848B CN110887848B CN201911163454.XA CN201911163454A CN110887848B CN 110887848 B CN110887848 B CN 110887848B CN 201911163454 A CN201911163454 A CN 201911163454A CN 110887848 B CN110887848 B CN 110887848B
- Authority
- CN
- China
- Prior art keywords
- wave
- absorbing material
- reflectivity
- material plate
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
The invention relates to the technical field of microwave testing, and particularly discloses a method for testing the reflectivity of a wave-absorbing material plate with deformability, which comprises the following steps: starting up a test system for preheating, and inputting measurement parameters; the calibration patch is completely attached to the surface of the wave-absorbing material plate to form a calibration plate, and the reflected power of the calibration plate is measured; removing the calibration patch, and measuring the reflection power of the wave-absorbing material plate; and calculating to obtain the reflectivity of the wave-absorbing material. The reflectivity testing method can accurately test the reflectivity of the wave-absorbing material plate with deformability, and provides basis and data support for wave-absorbing performance evaluation of the wave-absorbing material and research and application of the wave-absorbing material.
Description
Technical Field
The invention belongs to the technical field of microwave testing, and particularly relates to a method for testing the reflectivity of a wave-absorbing material plate with deformability.
Background
With the rapid development of radar technology, the role of radar wave absorbing materials in stealth defense systems of military equipment is becoming more and more important. The radar reflectivity is an important index parameter for measuring the wave absorption performance of the wave absorbing material, and the accurate measurement of the reflectivity of the wave absorbing material has important significance for the characteristic research of the wave absorbing material. The commonly used method for testing the reflectivity of the wave-absorbing material comprises the following steps: compact, arcuate, etc. In order to realize comprehensive and accurate evaluation of the wave absorbing performance of the wave absorbing material, the test method meets the following requirements: the incident angle of the electromagnetic wave is adjustable in a large range; the test on the wave absorption performance within a certain temperature range can be realized; the influence of the polarization mode of the incident wave on the performance of the wave absorption material can be inspected; the method can measure in a wide frequency band to obtain the change condition of the property of the wave-absorbing material along with the frequency. Compared with other two methods, the bow method is convenient to test, time-saving and labor-saving, is the most widely applied wave-absorbing material testing method internationally at present, and is also the most commonly used method for testing the reflectivity of the wave-absorbing material in a laboratory.
GJB2038A-2011 specifies the reflectivity of the flat-plate type wave-absorbing material suitable for the bow method, the measurement frequency range is 1-40 GHz, and the wave-absorbing material to be measured is required to be flat-plate type and the surface flatness is not more than 0.1 mm. In the actual research process of the wave-absorbing material, because the wave-absorbing material plate has certain deformability under the influence of preparation process conditions or after long-term thermal examination, the surface flatness of the wave-absorbing material plate is larger than 0.1mm and even reaches 3mm, the reflectivity of the wave-absorbing material plate with the deformability cannot be accurately tested by adopting the traditional bow method, at present, no method for testing the reflectivity of the wave-absorbing material plate with the deformability is disclosed in documents, the wave-absorbing performance of the wave-absorbing material cannot be effectively and accurately evaluated, and the research and the application of the wave-absorbing material are hindered.
Disclosure of Invention
The invention aims to overcome the defects of the prior art, and provides a method for testing the reflectivity of a wave-absorbing material plate with deformability on the basis of an arch method, so that the reflectivity of the wave-absorbing material plate with deformability is accurately tested, and the wave-absorbing performance of the wave-absorbing material is effectively evaluated.
In order to achieve the purpose, the invention provides a method for testing the reflectivity of a wave-absorbing material plate with deformability, which comprises the following steps:
(1) starting up a test system for preheating, and inputting measurement parameters into the test system; the test system comprises a vector network analyzer, a bow-shaped frame, a transmitting antenna, a receiving antenna and a sample support;
(2) measuring the reflection power of a calibration plate, wherein the calibration plate is formed by completely attaching a calibration patch on a wave-absorbing material plate, and the calibration surface of the calibration patch is a good conductor surface;
(3) removing the calibration patch, and measuring the reflection power of the wave-absorbing material plate;
(4) calculating the reflectivity of the wave-absorbing material by the following specific calculation formula:
wherein, gamma is the reflectivity of the wave-absorbing material plate, PaIs the reflection power of the wave-absorbing material plate, PmTo calibrate the reflected power of the board.
Preferably, in the reflectivity testing method, the calibration patch is composed of a metal foil layer and an adhesive layer, the thickness of the metal foil layer is 20-100 μm, the metal foil has flexibility and can be completely attached to the wave-absorbing material plate, the metal foil cannot be too thick, the flexibility of the metal foil is reduced when the metal foil is too thick, the wave-absorbing material plate cannot be completely attached, phenomena such as deformation, bubbling and wrinkles are easy to occur, and the testing precision is reduced.
Preferably, in the reflectivity testing method, the calibration patch is composed of a flexible conductive film layer and an adhesive layer.
Preferably, in the reflectivity test method, the flexible conductive film is composed of a metal layer and a plastic layer, the thickness of the metal layer is 5-25 μm, and the thickness of the plastic layer is 50-200 μm. The flexible conductive film has better flexibility and tear strength relative to the metal foil, is convenient to attach to the wave-absorbing material plate, does not deform, has no wrinkles and the like, and can be repeatedly used.
Preferably, in the reflectivity test method, the adhesive layer is a low-viscosity pressure-sensitive adhesive capable of being cleanly peeled, and the thickness of the adhesive layer is 15-50 μm.
Preferably, in the reflectivity test method, the adhesive layer is an acrylic system, an epoxy system or a silica gel system pressure-sensitive adhesive. The adhesive layer has the characteristics of low viscosity, easiness in pasting and taking off, no residual adhesive after taking off, no drying in a long time and the like, and the calibration patch can not damage the wave-absorbing material plate after pasting and taking off.
Compared with the prior art, the invention has the following beneficial effects:
the method for testing the reflectivity of the wave-absorbing material plate with the deformability can be used for testing the reflectivity of the wave-absorbing material plate with the deformability, the test result is accurate and credible, and a basis and data support are provided for wave-absorbing performance evaluation of the wave-absorbing material and research and application of the wave-absorbing material. The calibration patch is pasted on the wave-absorbing material plate and is completely pasted to form the calibration plate, the calibration plate is simple to manufacture, and the calibration patch is pasted and taken off without damage to the wave-absorbing material plate and can be used repeatedly.
Drawings
FIG. 1 is a schematic diagram of a test system according to the present invention.
Fig. 2 is a reflectivity test curve of wave-absorbing material plates with different flatness in embodiment 1 of the invention.
FIG. 3 is a reflectivity test curve of wave-absorbing material plates with different flatness in a comparative example of the invention.
Description of the main reference numerals:
the method comprises the following steps of 1-a vector network analyzer, 2-a bow-shaped frame, 3-a transmitting antenna, 4-a receiving antenna, 5-a sample plate support and 6-a background wave-absorbing material.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Example 1
A method for testing the reflectivity of a wave-absorbing material plate with deformability comprises the following steps:
(1) starting a test system for preheating, and inputting measurement parameters into the test system, wherein the test system comprises a vector network analyzer 1, an arched frame 2, a transmitting antenna 3, a receiving antenna 4, a sample support 5 and a background wave-absorbing material 6, as shown in figure 1;
(2) placing a calibration plate on a sample support, measuring the reflection power of the calibration plate, adhering a calibration patch on a wave-absorbing material plate, and completely adhering to form the calibration plate, wherein the calibration patch consists of an aluminum foil layer and an acrylic pressure-sensitive adhesive layer, the thickness of the metal foil layer is 50 micrometers, and the thickness of the adhesive layer is 20 micrometers;
(3) removing the calibration patch, placing the wave-absorbing material plate on the sample support, and measuring the reflection power of the wave-absorbing material plate;
(4) calculating the reflectivity of the wave-absorbing material by the following specific calculation formula:
wherein the gamma is the inverse of the wave-absorbing material plateRefractive index, PaIs the reflection power of the wave-absorbing material plate, PmTo calibrate the reflected power of the board.
The reflectivity of the wave-absorbing material plate with the surface flatness of 0.5mm, 1mm, 2mm and 3mm is respectively tested by adopting the reflectivity testing method in the embodiment, the wave-absorbing performance of the wave-absorbing material is known, the result is shown in figure 2, and the curve corresponding to 0 in the figure is the real reflectivity curve of the wave-absorbing material. According to the figure, the reflectivity test curve of the wave-absorbing material plate with different deformation amounts is superposed with the real reflectivity curve of the wave-absorbing material, the average reflectivity of the wave-absorbing material plate in the frequency range of 4-18GHz is listed in the table 1, the difference value between the tested average reflectivity and the real average reflectivity is not more than 0.08, and the test result is accurate and reliable.
Table 1 average reflectivity of the plate of example 1 with deformable wave-absorbing material
Example 2
A method for testing the reflectivity of a wave-absorbing material plate with deformability comprises the following steps:
(1) starting a test system for preheating, and inputting measurement parameters into the test system, wherein the test system comprises a vector network analyzer 1, an arched frame 2, a transmitting antenna 3, a receiving antenna 4, a sample support 5 and a background wave-absorbing material 6, as shown in figure 1;
(2) the calibration plate is placed on a sample support, the reflection power of the calibration plate is measured, the calibration patch is adhered to the wave-absorbing material plate and completely adhered to form the calibration plate, the calibration patch is composed of a copper-clad polyimide film and a rubber system pressure-sensitive adhesive layer, the thickness of the copper layer is 15 micrometers, the thickness of the polyimide film is 50 micrometers, and the thickness of the adhesive layer is 50 micrometers.
(3) Removing the calibration patch, placing the wave-absorbing material plate on the sample support, and measuring the reflection power of the wave-absorbing material plate;
(4) calculating the reflectivity of the wave-absorbing material by the following specific calculation formula:
wherein, gamma is the reflectivity of the wave-absorbing material plate, PaIs the reflection power of the wave-absorbing material plate, PmTo calibrate the reflected power of the board.
The reflectivity testing method in the embodiment is adopted to test the reflectivities of the wave-absorbing material plates with the surface flatness of 0.5mm, 1mm, 2mm and 3mm respectively, the wave-absorbing performance of the wave-absorbing material is known, the average reflectivity of the wave-absorbing material plates in the frequency range of 4-18GHz is listed in the table 2, the difference value between the tested average reflectivity and the real average reflectivity is not more than 0.05, and the testing result is accurate and reliable.
Table 2 average reflectivity of the plate of example 2 with deformable wave-absorbing material
Comparative example
The reflectivity of the wave-absorbing material plate with deformability is tested by adopting a traditional bow method, and the testing steps are as follows:
(1) starting a test system for preheating, and inputting measurement parameters into the test system, wherein the test system comprises a vector network analyzer, a bow rack, a transmitting antenna, a receiving antenna and a sample support;
(2) placing a calibration plate on a sample support, wherein the calibration plate is an aluminum plate meeting the requirements of the calibration plate in GJB2038A-2011, and measuring the reference reflected power of the calibration plate;
(3) measuring the reflection power of the wave-absorbing material plate, and automatically calculating by a vector network analyzer to obtain the reflectivity of the wave-absorbing material;
the reflectivity test results of the wave-absorbing material plates with the flatness of 0.5mm, 1mm, 2mm and 3mm are shown in figure 3, and the curve corresponding to 0 in the figure is the real reflectivity curve of the wave-absorbing material. It can be seen from the figure that the test result deviates from the real reflectivity curve of the wave-absorbing material, the average reflectivity of the wave-absorbing material plate in the frequency range of 4-18GHz is listed in table 3, the difference between the tested average reflectivity and the real average reflectivity can be seen from the table, the larger the flatness of the wave-absorbing material plate is, the larger the difference is, the unreliable test result is, and the reflectivity of the wave-absorbing material plate with deformability cannot be accurately tested by adopting the traditional bow method.
Table 3 average reflectivity of the plates with deformable wave-absorbing material in the comparative example
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (3)
1. A method for testing the reflectivity of a wave-absorbing material plate with deformability is characterized by comprising the following steps:
(1) starting up a test system for preheating, and inputting measurement parameters into the test system;
(2) measuring the reflection power of a calibration plate, wherein the calibration plate is formed by completely attaching a calibration patch on the surface of a wave-absorbing material plate, and the calibration surface of the calibration patch is a good conductor surface;
(3) removing the calibration patch, and measuring the reflection power of the wave-absorbing material plate;
(4) calculating the reflectivity of the wave-absorbing material by the following specific calculation formula:
wherein, gamma is the reflectivity of the wave-absorbing material plate, PaIs the reflection power of the wave-absorbing material plate, PmCalibrating the reflected power of the board;
the calibration patch consists of a metal foil layer or a flexible conductive film layer and an adhesive layer, wherein the thickness of the metal foil layer is 20-100 mu m; the adhesive layer is a low-viscosity pressure-sensitive adhesive capable of being cleanly peeled, and the thickness of the adhesive layer is 15-50 mu m.
2. The reflectivity test method of claim 1, wherein the flexible conductive film comprises a metal layer and a plastic layer, the metal layer has a thickness of 5-25 μm, and the plastic layer has a thickness of 50-200 μm.
3. The reflectivity test method of claim 1, wherein the adhesive layer is an acrylic system, a rubber system, or a silicone system pressure sensitive adhesive.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911163454.XA CN110887848B (en) | 2019-11-25 | 2019-11-25 | Method for testing reflectivity of wave-absorbing material plate with deformability |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911163454.XA CN110887848B (en) | 2019-11-25 | 2019-11-25 | Method for testing reflectivity of wave-absorbing material plate with deformability |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110887848A CN110887848A (en) | 2020-03-17 |
| CN110887848B true CN110887848B (en) | 2022-04-01 |
Family
ID=69748643
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911163454.XA Active CN110887848B (en) | 2019-11-25 | 2019-11-25 | Method for testing reflectivity of wave-absorbing material plate with deformability |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110887848B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111929331B (en) * | 2020-07-10 | 2024-05-28 | 重庆测威科技有限公司 | Curved surface wave-absorbing material reflectivity field test method |
| CN113125469B (en) * | 2021-03-30 | 2022-11-04 | 中国人民解放军国防科技大学 | Method for testing high-temperature reflectivity of stealth material flat plate |
| CN113189121B (en) * | 2021-05-11 | 2024-04-16 | 中北大学 | Dynamic test method for reflectivity of wave-absorbing material of self-adaptive time domain door |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101344495A (en) * | 2008-07-30 | 2009-01-14 | 电子科技大学 | Measuring apparatus for reflection index of wave suction material |
| CN101699564A (en) * | 2009-10-27 | 2010-04-28 | 泰州拓谷超细粉体材料有限公司 | Preparation method of fiber metal matrix composite broadband light and slim type radar wave camouflage coating |
| CN202256192U (en) * | 2011-08-15 | 2012-05-30 | 航天科工武汉磁电有限责任公司 | Instrument for measuring reflectivity of radar wave absorbing material on site |
| CN203101290U (en) * | 2013-02-04 | 2013-07-31 | 长沙三瑞传感技术有限公司 | Arch-method-based-based reflectivity testing system |
| CN104698011A (en) * | 2015-02-12 | 2015-06-10 | 上海卫星装备研究所 | Test device for high-frequency absorbing property of wave-absorbing material and test method |
| CN106770374A (en) * | 2016-11-30 | 2017-05-31 | 北京无线电计量测试研究所 | A kind of absorbing material reflecting measurement device and method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160285171A1 (en) * | 2015-03-27 | 2016-09-29 | John Bernard Moylan | Flexible Asymmetric Radio Frequency Data Shield |
-
2019
- 2019-11-25 CN CN201911163454.XA patent/CN110887848B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101344495A (en) * | 2008-07-30 | 2009-01-14 | 电子科技大学 | Measuring apparatus for reflection index of wave suction material |
| CN101699564A (en) * | 2009-10-27 | 2010-04-28 | 泰州拓谷超细粉体材料有限公司 | Preparation method of fiber metal matrix composite broadband light and slim type radar wave camouflage coating |
| CN202256192U (en) * | 2011-08-15 | 2012-05-30 | 航天科工武汉磁电有限责任公司 | Instrument for measuring reflectivity of radar wave absorbing material on site |
| CN203101290U (en) * | 2013-02-04 | 2013-07-31 | 长沙三瑞传感技术有限公司 | Arch-method-based-based reflectivity testing system |
| CN104698011A (en) * | 2015-02-12 | 2015-06-10 | 上海卫星装备研究所 | Test device for high-frequency absorbing property of wave-absorbing material and test method |
| CN106770374A (en) * | 2016-11-30 | 2017-05-31 | 北京无线电计量测试研究所 | A kind of absorbing material reflecting measurement device and method |
Non-Patent Citations (4)
| Title |
|---|
| Shell absorbing nanostructure for low radar observable missile;D. Micheli等;《2015 7th International Conference on Recent Advances in Space Technologies(RAST)》;20150820;第49-54页 * |
| 吸波材料反射率变温测试系统研制;郭高凤等;《仪器仪表学报》;20110531;第32卷(第5期);第1009-1014页 * |
| 射频吸波材料拱形法测试系统的研制;郭权国等;《中国优秀博硕士学位论文全文数据库（硕士）工程科技Ⅰ辑》;20071015(第4期);第19-22，45-46页 * |
| 材料微波反射率高温测量系统设计;周亮等;《计算机测量与控制》;20130630;第21卷(第6期);第1431-1433页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110887848A (en) | 2020-03-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110887848B (en) | Method for testing reflectivity of wave-absorbing material plate with deformability | |
| CN106556748B (en) | The measuring device and method of thin-film material complex dielectric permittivity based on transmission bounce technique | |
| Merilampi et al. | Characterization of UHF RFID tags fabricated directly on convex surfaces by pad printing | |
| CN108362763A (en) | A kind of grapheme material electromagnetic parameter test system, test method and test fixture | |
| Alwan et al. | Indium tin oxide film characterization at 0.1–20 GHz using coaxial probe method | |
| CN106018973A (en) | Microstrip nanometer film microwave electromagnetic parameter testing apparatus | |
| CN205786867U (en) | A kind of nano thin-film Micro-wave low-noise transistor test device | |
| Liu et al. | A microstrip resonator with slotted ground plane for complex permittivity measurements of liquids | |
| CN113125469B (en) | Method for testing high-temperature reflectivity of stealth material flat plate | |
| CN101149417B (en) | Screen performance test method for veneer with built-in electromagnetic layer | |
| CN109347450A (en) | A kind of processing method of Asia 20 watts of pulse power amplifiers of terahertz wave band | |
| US5426373A (en) | Two electrode device for determining electrical properties of a material on a metal substratum | |
| CN110954496A (en) | Sample signal amplification method using terahertz waveband graphene absorber | |
| CN111505547B (en) | Rapid detection method for magnetic permeability of wave-absorbing powder | |
| CN109580661B (en) | Method for testing complex reflection coefficient of free space material | |
| Insabella et al. | Dielectric antenna effects in integrating line piezoelectric sensors for optoacoustic imaging | |
| CN111929331B (en) | Curved surface wave-absorbing material reflectivity field test method | |
| CN116430124B (en) | Method, device, equipment and medium for testing complex dielectric constant of bumper material | |
| CN205910137U (en) | Testing arrangement of near field absorbing material reflectivity | |
| US20230036023A1 (en) | Microwave dielectric analyzer | |
| CN112034406A (en) | Phase calibration method for portable electrical thickness tester | |
| CN113721081B (en) | Method and system for measuring optimal thickness of radome | |
| CN212622224U (en) | Normal incidence formula transmitted light phase information representation light path system | |
| CN114252751B (en) | Strip line resonator test system for complex dielectric constant of high-frequency printed board substrate | |
| CN116626402A (en) | Single-end measuring method for electromagnetic shielding effectiveness of metal mesh optical window |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |