CN110823443B - Static test strain data processing method - Google Patents
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Abstract
The application belongs to the field of data processing methods, and particularly relates to a static test strain data processing method. The method comprises the following steps: the method comprises the following steps: acquiring first strain data of a static test strain gauge, and screening 0 strain gauge from the first strain data to obtain second strain data after 0 strain gauge is screened out; step two: setting a dispersion threshold, calculating the dispersion of the second strain data to the fitting data of the second strain data, and screening out third strain data larger than the dispersion threshold from the second strain data; step three: setting a strain threshold, and screening out a bottom noise strain gauge of which the absolute value of the strain is smaller than the strain threshold from the third strain data; step four: and screening out a multi-linear strain gauge from the third strain data by a piecewise fitting method. The application can find out 0 sheet, linear sheet, abnormal resistance sheet, structure buckling sheet and structure interference sheet very fast, greatly improves the working efficiency and reduces the workload.
Description
Technical Field
The application belongs to the field of data processing methods, and particularly relates to a static test strain data processing method.
Background
In the static test of some large airplanes, because of the need of monitoring many parts, some large airplanes even need to be equipped with tens of thousands of strain gauges, so millions of data or even more are generated, and in the face of such huge scale data, test data processing personnel can become huge pressure for designers, and the number of the data processing personnel is large, and even unpredictable human errors can occur. In the prior art, a manual single-line processing fitting method is adopted for data processing, only a single-linear strain gage can be screened out, the working efficiency is low, and the error is large.
Accordingly, a technical solution is desired to overcome or at least alleviate at least one of the above-mentioned drawbacks of the prior art.
Disclosure of Invention
The application aims to provide a static test strain data processing method to solve at least one problem in the prior art.
The technical scheme of the application is as follows:
a static test strain data processing method comprises the following steps:
the method comprises the following steps: acquiring first strain data of a static test strain gauge, and screening 0 strain gauge from the first strain data to obtain second strain data after 0 strain gauge is screened out;
step two: setting a dispersion threshold, calculating the dispersion of the second strain data to the fitting data of the second strain data, and screening out third strain data larger than the dispersion threshold from the second strain data;
step three: setting a strain threshold, and screening out a bottom noise strain gauge of which the absolute value of the strain is smaller than the strain threshold from the third strain data;
step four: and screening out a multi-linear strain gauge from the third strain data by a piecewise fitting method.
Optionally, in the first step, the screening 0 pieces of the first stress data specifically includes:
and integrating the strain value of each strain gauge in the first strain data, and screening out the strain gauges of which the integration result is 0.
Optionally, the second step is specifically:
s21, substituting the load value of the strain gauge in the second strain data into a linear regression equation to obtain a fitting point of the load;
s22, obtaining the dispersion of the strain gauge according to the original data points and the fitting points;
s23, setting a dispersion threshold value, and screening out the strain gauge with dispersion larger than the dispersion threshold value.
Optionally, the step four specifically includes:
s41, for n-time linear strain analysis, dividing the third strain data into n +1 groups of data groups;
s42, screening out the multi-linear strain gauge by the method of steps S21-S23.
Optionally, the method further comprises the step of: and indexing the first stress data processed in the first step to the fourth step.
Optionally, in the fifth step, the indexing the first dependency data processed in the first to fourth steps includes:
s51, rounding the strain gauge number in the first strain data processed in the first to fourth steps downwards;
and S52, fusing the strain data obtained by rounding the strain gauge number downwards through the logical relationship of the AND gate and the OR gate.
The invention has at least the following beneficial technical effects:
the static test strain data processing method can quickly find out 0 sheet, a linear sheet, a resistance abnormal sheet, a structure buckling sheet and a structure interference sheet in the face of large-scale strain sheet data, help test operators to quickly find out problems and solve the problems, and meanwhile help test analysts to more efficiently find out effective test strain sheets, so that the analysis efficiency of tests is improved.
Drawings
Fig. 1 is a flowchart of a static test strain data processing method according to an embodiment of the present application.
Detailed Description
In order to make the implementation objects, technical solutions and advantages of the present application clearer, the technical solutions in the embodiments of the present application will be described in more detail below with reference to the drawings in the embodiments of the present application. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are a subset of the embodiments in the present application and not all embodiments in the present application. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. Embodiments of the present application will be described in detail below with reference to the accompanying drawings.
In the description of the present application, it is to be understood that the terms "center", "longitudinal", "lateral", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are used merely for convenience in describing the present application and for simplifying the description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and therefore should not be construed as limiting the scope of the present application.
The present application is described in further detail below with reference to fig. 1.
The application provides a static test strain data processing method, which comprises the following steps:
the method comprises the following steps: acquiring first strain data of a static test strain gauge, and screening 0 strain gauge from the first strain data to obtain second strain data after 0 strain gauge is screened out;
step two: setting a dispersion threshold, calculating the dispersion of the second strain data relative to the fitting data of the second strain data, and screening out third strain data larger than the dispersion threshold from the second strain data;
step three: setting a strain threshold, and screening out a bottom noise strain gauge of which the absolute value of the strain is smaller than the strain threshold from the third strain data;
step four: and screening out the multi-linear strain gauge from the third strain data by a piecewise fitting method.
In the case of tens of thousands of strain data, the test acquisition equipment generally gives relatively regular test data, and generally, the process of gradually increasing the load corresponding to the gradually increasing strain, namely, the process of gradually loading is adopted.
In the static test strain data processing method, firstly, 0 sheet is screened out:
and integrating the strain value of each strain gauge in the strain data of the static test, and screening out the strain gauges of which the integration result is 0. For a single strain gauge XiIf the following results occur:
wherein strain εijLoad PjTo co-ordinateAnd (5) m grades.
Then the strain gauge is proved to be 0 gauge, and all the strain gauges are subjected to integral calculation according to the cycle, so that all the 0 gauges can be screened out.
Screening out strain gauges with poor linearity in the second strain data, specifically:
and (3) calculating a linear regression equation for the strain gauge:
for all the single strain gauges, the corresponding load is PjAnd m grades, the following linear regression equation is given for solving:
obtaining the linear equation after fitting, substituting the load value of each level of the strain gauge to obtain the fitting point corresponding to each level of load on the curve after fitting
Comparing and analyzing the fitting points and the original data points by using a similar standard deviation formula to obtain the dispersion S as follows;
and setting a dispersion threshold value, and screening out the strain gauge with dispersion S larger than the dispersion threshold value, wherein the strain gauge comprises a multi-linear strain gauge and a resistance abnormal gauge.
Giving out the dispersion condition of original data to the fitting data through above-mentioned mode, can be to the condition of difference, the size that the strain of different orders of magnitude given different dispersion condition S values screens, distinguish the foil gage that linearity is good and linearity is not good, analyze the foil gage under the different dispersion conditions simultaneously, judge the reason that linearity is not good, a large amount of work load that has reduced designer and experimental analyst like this, the work efficiency who improves.
And in the third step, the strain gauges with poor linearity obtained in the second step are further classified, and the bottom noise strain gauges are screened out.
Specifically, analysis is carried out according to the required condition, in part of test loading, some strain gauges are in a bottom noise fluctuation state, Brownian motion occurs in a very low strain range, however, the data have no use significance, and therefore strain gauges with strain which is not in accordance with requirements of test analysts are screened out by adding a strain threshold A.
Setting a strain threshold A for strain epsilonijScreening:
εimax>A
εimax<-A
or to give a more suitable result,
|εimax|>A
and screening the third strain data according to the relation to screen out the strain gages belonging to the background noise range, and screening out unnecessary small data strain gages.
In the fourth step, the multi-linear strain gauge is a structure buckling gauge or a structure interference gauge, and the multi-linear strain gauge is screened out from the third strain data by a piecewise fitting method.
For n-time linear strain analysis, dividing the data into n +1 groups, and screening out the multi-linear strain gauges by the method in the step two.
Taking a bilinear analysis method as an example, for 45 lines of data in the strain data, dividing 20 data into one group, and dividing into three groups specifically: 1-20, 15-35, 25-45. The 15-20 and 25-35 are overlapped, the linear relations of the 3 groups of data are respectively calculated according to the mode of the step two, if the condition that only two groups of data are good in linearity occurs, the curve can be basically considered to be a bilinear curve (the reason is that the force transmission path is changed due to interference between structures along with loading or the strain gauge is transient due to structure buckling), and the dispersion threshold value in the method is still adjustable and can be given according to actual engineering requirements.
Through the steps from the first step to the fourth step, 0 sheet, the bottom noise strain gauge and the multi-linear strain gauge (the structure buckling sheet and the structure interference sheet) can be sequentially screened out, the linear sheet can be screened out through screening out third strain data from the second strain data, and the resistance abnormal sheet can be screened out through screening out the strain data of the bottom noise strain gauge and the multi-linear strain gauge from the third strain data.
In one embodiment of the present application, the method further includes the following step: indexing the first stress data processed in the first to fourth steps, specifically:
rounding the strain gauge number in the first strain data processed in the first to fourth steps downwards;
and fusing the strain data obtained by rounding the strain gauge number downwards through the logical relationship of the AND gate and the OR gate.
In the embodiment, the data required by the test analyst is found from tens of thousands of hundreds of thousands or even millions of data at one time directly in an indexing manner, and the test analyst is helped to find some important strain gauges needing to be replaced or repaired from the tens of thousands of strain gauges.
According to the strain data processing method for the static test, unnecessary and repeated manual operation and manual judgment can be omitted, 0 sheet, a linear sheet, a resistance abnormal sheet, a structure buckling sheet and a structure interference sheet can be effectively screened out, the working efficiency is greatly improved, and the workload is reduced.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (3)
1. A static test strain data processing method is characterized by comprising the following steps:
the method comprises the following steps: acquiring first strain data of a static test strain gauge, and screening 0 strain gauge from the first strain data to obtain second strain data after 0 strain gauge is screened out;
screening out 0 pieces from the first stress data specifically as follows:
integrating the strain value of each strain gauge in the first strain data, and screening out the strain gauges of which the integration result is 0;
step two: setting a dispersion threshold, calculating the dispersion of the second strain data to the fitting data of the second strain data, and screening out third strain data larger than the dispersion threshold from the second strain data;
the method specifically comprises the following steps:
s21, substituting the strain value of each strain gauge in the second strain data into a linear regression equation to obtain a fitting point of the strain value;
s22, obtaining the dispersion of each strain gauge according to the strain value of each strain gauge and the strain value of the fitting point;
s23, setting a dispersion threshold value, and screening out strain gauges with dispersion larger than the dispersion threshold value;
step three: setting a strain threshold, and screening out a bottom noise strain gauge of which the absolute value of the strain is smaller than the strain threshold from the third strain data;
the method specifically comprises the following steps:
setting a strain threshold A for strain epsilonijScreening:
εimax>A
εimax<-A
or to give a more suitable result,
|εimax|>A
screening the third strain data according to the relation, and screening out strain gauges belonging to the range of the background noise;
step four: screening out a multi-linear strain gauge from the third strain data by a piecewise fitting method;
the method specifically comprises the following steps:
s41, for n-time linear strain analysis, dividing the third strain data into n +1 groups of data groups;
s42, screening out the multi-linear strain gauge by the method of steps S21-S23.
2. A static test strain data processing method according to claim 1, characterized by further comprising the step five: and indexing the first stress data processed in the first step to the fourth step.
3. A method according to claim 2, wherein in step five, the indexing the first strain data after the processing of steps one to four comprises:
s51, rounding the strain gauge number in the first strain data processed in the first to fourth steps downwards;
and S52, fusing the strain data obtained by rounding the strain gauge number downwards through the logical relationship of the AND gate and the OR gate.
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