CN110806264B - CCD photoelectric detector integration time control method capable of self-adapting to light intensity - Google Patents
CCD photoelectric detector integration time control method capable of self-adapting to light intensity Download PDFInfo
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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- G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
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- G05B13/042—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators in which a parameter or coefficient is automatically adjusted to optimise the performance
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Abstract
The invention belongs to the technical field of photoelectric testing, and relates to a control method for integration time of a CCD photoelectric detector. A CCD photoelectric detector integration time control method of self-adaptive light intensity comprises the following steps: setting the initial integration time to tiWherein, tmin＜ti＜tmax(ii) a (2): collecting spectral signals [ s ]1，s2…，sm]Calculating the mean value s of the spectral signalavg(ii) a (3): collecting and calculating spectral noise sigmadark(ii) a (4): judgment savgAnd delta. sigmadarkδ is the dark noise impact factor: if savg＜δ·σdarkSetting the integration time to tj，tmin＜tj＜tmaxAnd t isj≠tiAnd turning to the step (1); if savg≥δ·σdarkFirstly, denoising the spectrum signal, and then setting the integration time. The method of the invention adjusts the integration time in a self-adaptive way according to the illumination intensity, considers the influence of dark noise on the output signal, adjusts the integration time in a self-adaptive way, has high speed and high precision, has self-adaptability, and can be applied to the scenes of automatic testing, quick testing and the like.
Description
Technical Field
The invention belongs to the technical field of photoelectric testing, and relates to a control method for integration time of a CCD photoelectric detector.
Background
The CCD photodetector is used as a light receiving device in a spectrum analyzer, and can perform photoelectric conversion of signals, and the advantages of low power consumption, low operating voltage, stable performance, high sensitivity, large dynamic range, and the like have been the key points of research. With the development of miniaturization and intellectualization of spectrometers, higher requirements are put forward on the control of the integration time of a CCD photoelectric detector.
The electric signal output by the CCD photoelectric detector is in direct proportion to the illumination intensity and the integration time, and under the condition of certain integration time, when the illumination intensity is too strong, the signal overflows, so that the measured spectrum is distorted; when the illumination intensity is too weak, the signal-to-noise ratio of the acquired spectrum signal is too low, and the spectrum signal is easily submerged by dark noise, so that the real information of the spectrum cannot be correctly reflected. When the illumination intensity is constant, the integration time is too long, on one hand, the too long integration can cause double increase of signals and dark noise, the signal-to-noise ratio of the spectrum signals is reduced, and the test precision is reduced. On the other hand, too long integration time affects the testing speed, and is not suitable for application scenarios such as rapid measurement. Therefore, in order to improve the measurement accuracy of the spectrum analyzer, it is generally necessary to set the integration time.
In the prior art, the setting of the integration time of the spectrometer is usually manual setting, that is, the integration time is manually set according to the acquired signal and an empirical value, and the manual setting of the integration time has the disadvantages of slow speed and weak environmental adaptability. And the manual setting method can not eliminate the influence of dark noise on output signals, thereby influencing the precision and accuracy of spectral measurement.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a CCD photoelectric detector integration time control method with self-adaptive light intensity, which adaptively adjusts the integration time according to the light intensity and considers the influence of dark noise on an output signal to adaptively adjust the integration time so as to set reasonable integration time.
The technical scheme adopted for solving the technical problems is as follows: a CCD photoelectric detector integration time control method capable of self-adapting to light intensity comprises the following steps:
(1): setting the initial integration time to tiWherein, tmin＜ti＜tmax；
(2): collecting spectral signals [ s ]1，s2…，sm]Calculating the mean value s of the spectral signalavg；
(3): collecting and calculating spectral noise sigmadark；
(4): judgment savgAnd delta. sigmadarkδ is the dark noise impact factor:
if savg＜δ·σdarkSetting the integration time to tj，tmin＜tj＜tmaxAnd t isj≠tiTurning to the step (1); if savg≥δ·σdarkFirstly, denoising the spectrum signal, and then setting the integration time.
Further, in the step (4), if savg≥δ·σdarkThe setting method of the integration time comprises the following steps:
for spectral signal [ s ]1，s2…，sm]Denoising to obtain a spectral signal s'1，s′2，…，s′m]And finding a spectral peak signal s therefrommax；
From the spectral peak signal smaxWith a spectral threshold signal sTVThe integration time is set according to the size relation of the LED.
Further, according to the spectral peak signal smaxWith a spectral threshold signal sTVThe method for setting the integration time by the size relationship comprises the following steps:
if smax＞α·sTVSetting the integration time to (1-beta) ti；
If (1-. alpha.) sTV≤smax≤α·sTVSetting the integration time to ti；
If smax＜α·sTVSetting the integration time to (1+ beta). ti。
Wherein alpha is a spectrum correction coefficient, sTVAs a spectral threshold signal, betaIs a time correction factor.
Further, if (1-. beta.). ti＜tminIf yes, setting the integration time;
if (1-. beta.) ti≥tminGo to step (2).
Further, if (1+ β) · ti＞tmaxIf yes, setting the integration time;
if (1+ β). ti≤tmaxGo to step (2).
The invention relates to a CCD photoelectric detector integration time control method capable of self-adapting to light intensity, which self-adaptively adjusts the integration time according to the light intensity and considers the influence of dark noise on an output signal so as to set reasonable integration time. The method is high in speed, high in precision and adaptive, and can be applied to scenes such as automatic testing, quick testing and the like.
Drawings
Fig. 1 is a flowchart of a method for controlling integration time of a CCD photodetector with adaptive light intensity according to an embodiment of the present invention.
Detailed Description
In order to facilitate an understanding of the invention, the invention is described in more detail below with reference to the accompanying drawings and specific examples. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
The flow of the method for controlling the integration time of the CCD photodetector with adaptive light intensity provided by this embodiment is shown in fig. 1, and the specific steps are as follows:
step 1: and initializing parameters. Setting the initial integration time as t according to the maximum and minimum integration time provided by the CCD when leaving the factoryiWherein, tmin＜ti＜tmax；
Step 2: and collecting the spectral signals and calculating the mean value of the spectral signals. Collecting CCD photoelectric detector spectrum signal [ s ]1，s2…，sm]Wherein s isiCalculating the average value of the spectral signals for the spectral signals of the ith pixel
Step 3: and collecting and calculating spectral noise. Collecting signals of M non-exposure pixels at two ends of the CCD photoelectric detector to obtain noise of the linear array CCD detector
Wherein sigmadarkIs dark noise, siIs the ith signal value, and M is the number of non-exposure pixels.
Step 4: spectral signal mean and noise signal analysis:
if savg≥δ·σdarkAnd (5) turning to the step.
If savg＜δ·σdarkSetting the integration time to tj，tmin＜tj＜tmaxAnd t isj≠tiTurning to the step (1); wherein, δ is a dark noise influence factor, and δ is 1.5 in a simulation test.
Step 5: the spectrum signal [ s ] collected in the step (2) is processed1，s2…，sm]Removing noise in the step (3): s'm＝sm-σdarkObtaining a denoised spectral signal s'1，s′2，…，s′m]Searching spectral peak signal s from de-noised spectral signal by peak search methodmax；
Step 6: from the spectral peak signal smaxWith a spectral threshold signal sTVThe integration time is set according to the size relation of (1):
if smax＞α·sTVSetting the integration time to (1-beta) ti；
If (1-. alpha.) sTV≤smax≤α·sTVSetting the integration time to ti；
If smax＜α·sTVSetting the integration time to (1+ beta). ti。
Wherein alpha is a spectrum correction coefficient, sTVIs the spectral threshold signal and beta is the time correction factor. In simulation experiments, α is 0.9, β is 0.1, and sTV＝65536。
The set integration time is further compared with the maximum integration time tmaxMinimum integration time tminAnd (3) comparison: if (1-. beta.) ti＜tminGiving an error prompt of 'light signal is too strong', terminating the setting of the integration time, and turning to the step (8);
if (1-. beta.) ti≥tminGo to step (2).
If (1+ β). ti＞tmaxGiving an error prompt of 'the light signal is too weak', terminating the setting of the integration time, and turning to the step (8);
if (1+ β). ti≤tmaxGo to step (2).
Step 7: the integration time setting is completed.
Step 8: and the setting of the integration time is failed, and the setting of the integration time is quitted.
Claims (3)
1. A CCD photoelectric detector integration time control method of self-adaptive light intensity is characterized by comprising the following steps:
(1): setting the initial integration time to tiWherein, tmin＜ti＜tmax；
(2): collecting spectral signals [ s ]1，s2…，sm]Calculating the mean value s of the spectral signalavg；
(3): collecting and calculating spectral dark noise sigmadark；
(4): judgment savgAnd delta. sigmadarkδ is the dark noise impact factor:
if savg＜δ·σdarkSetting the integration time to tj，tmin＜tj＜tmaxAnd t isj≠tiAnd turning to the step (1);
if savg≥δ·σdarkFor spectral signals [ s ]1，s2…，sm]Denoising to obtain a spectral signal s'1，s′2，…，s′m]And finding a spectral peak signal s therefrommax；
From the spectral peak signal smaxWith a spectral threshold signal sTVThe integration time is set according to the size relation of (1):
if smax＞α·sTVSetting the integration time to (1-beta) ti；
If (1-. alpha.) sTV≤smax≤α·sTVSetting the integration time to ti；
If smax＜(1-α)·sTVSetting the integration time to (1+ beta). ti；
Wherein alpha is a spectrum correction coefficient, sTVIs the spectral threshold signal and beta is the time correction factor.
2. The adaptive light intensity CCD photodetector integration time control method according to claim 1, characterized in that:
if (1-. beta.) ti＜tminIf yes, setting the integration time;
if (1-. beta.) ti≥tminGo to step (2).
3. The adaptive light intensity CCD photodetector integration time control method according to claim 2, characterized in that:
if (1+ β). ti＞tmaxIf yes, setting the integration time;
if (1+ β). ti≤tmaxGo to step (2).
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| JP2012220361A (en) * | 2011-04-11 | 2012-11-12 | Yokogawa Electric Corp | Light amount measuring apparatus and light amount measuring method |
| CN103968944A (en) * | 2014-05-05 | 2014-08-06 | 中国科学院长春光学精密机械与物理研究所 | Method for subsection integral of silicon array detector |
| CN103983619A (en) * | 2014-05-16 | 2014-08-13 | 四川大学 | Spatial resolution laser-induced breakdown spectroscopy analysis system and spatial resolution laser-induced breakdown spectroscopy analysis method |
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