CN110779572B - Test system and method - Google Patents

Test system and method Download PDF

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Publication number
CN110779572B
CN110779572B CN201911006904.4A CN201911006904A CN110779572B CN 110779572 B CN110779572 B CN 110779572B CN 201911006904 A CN201911006904 A CN 201911006904A CN 110779572 B CN110779572 B CN 110779572B
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electronic product
condition
sensor
image recognition
tested
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CN110779572A (en
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信朝阳
苏东泽
乔道鹏
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Beijing Institute of Electronic System Engineering
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Beijing Institute of Electronic System Engineering
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00Measuring or testing not otherwise provided for
    • G01D21/02Measuring two or more variables by means not covered by a single other subclass
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection

Abstract

Compared with the existing test system, the bionic test system is improved, two types of contents are added to the existing test system, one type is a distance sensor, a displacement sensor, an angle sensor, a vibration sensor, a temperature sensor and a pressure sensor and is used for acquiring state information of an electronic product to be tested, and the other type is a connection state image recognition device, a detonation device dynamic image recognition device, a separation mechanism dynamic image recognition device, a pushing mechanism dynamic image recognition device and a guidance device dynamic image recognition device and is used for acquiring test process information. Therefore, the dependence on human beings is reduced, the accurate information acquisition mode is increased, the universality and the expansibility are good, and the design idea can be used for reference to popularization and use in batches.

Description

Test system and method
Technical Field
The invention relates to the field of electronic product detection, in particular to a test system and a test method.
Background
The test system is an inspection tool for the quality of electronic products, can provide regular maintenance for the products, ensures stable and reliable work, and is difficult to meet more rigorous test requirements by a traditional test mode which excessively depends on operators along with the improvement of test complexity. In order to overcome the problem, a bionic test system based on a sensor and image recognition is designed according to the working principle of human hearing, touch and vision.
The testing system widely adopted at present mainly comprises a main control computer, a signal acquisition device, a signal excitation device, a target simulation device, an energy supply device and the like, does not have the capability of acquiring state information such as temperature, vibration, displacement and the like of an electronic product to be tested in the testing process, does not have the capability of monitoring and identifying the connection state and the motion state of an active mechanism of the electronic product to be tested in the testing process, and can not complete the intelligent decision of the testing process according to the information, so the intelligence of the testing system is imperative.
Disclosure of Invention
To address at least one of the above deficiencies, an embodiment of an aspect of the present application provides a test system, including:
the testing component is used for testing the electronic product;
the first sensor group is used for acquiring the state information of the electronic product to be tested;
the second sensor group is used for acquiring the process information of the test; wherein the content of the first and second substances,
and the test component determines the next test action executed by the test system according to the state information and the process information, so as to realize the quality detection of the tested electronic product.
In some embodiments, the electronic product is a guidance launching system, and the guidance launching system specifically includes: the device comprises a guidance device, a posture device, a pushing-out mechanism, a separating mechanism and a detonation device;
the test assembly includes:
the system comprises a main control computer, a signal exchange device, a signal acquisition device, a signal excitation device, a target simulation device group and an energy supply device;
the main control computer is used for controlling other equipment except the main control computer in the testing assembly, the first sensor group and the second sensor group;
the signal switching equipment is used for relaying, forwarding and interacting all signals in the testing process;
the signal acquisition equipment is used for acquiring all analog quantity signals, digital quantity signals and communication signals of the tested electronic product in the test process;
the signal excitation equipment is used for providing an excitation signal required by operation for the tested electronic product;
the target simulation equipment set is used for providing simulation signals for the operation of the tested electronic product;
the energy supply equipment is used for providing electric energy for the operation of the electronic product to be tested.
In some embodiments, the target simulation apparatus comprises:
the system comprises attitude simulation equipment, infrared simulation equipment and radio frequency simulation equipment;
the attitude simulation equipment is used for simulating the running state of the tested electronic product;
the infrared simulation equipment is used for simulating a heat source target for the electronic product to be tested;
the radio frequency simulation equipment is used for simulating a target radiating radio frequency signals for the electronic product to be tested.
In some embodiments, the first sensor set comprises: at least one of a distance sensor, a displacement sensor, an angle sensor, a vibration sensor, a temperature sensor, and a pressure sensor;
the distance sensor is used for measuring the distance between preset parts of the tested electronic product, the displacement sensor is used for measuring the moving speed and the moving distance of the moving part of the tested electronic product, the angle sensor is used for measuring the rotating angle information of the part with deflection attribute of the tested electronic product, the vibration sensor is used for measuring the vibration condition of the part with vibration attribute of the tested electronic product in the test engineering, the temperature sensor is used for measuring the temperature rise condition of the part with heating attribute in the tested electronic product, and the pressure sensor is used for measuring the real-time pressure condition of the pressure sensitive element of the tested electronic product.
In some embodiments, the second sensor group comprises: at least one of a connection state image recognition device, a detonation device dynamic image recognition device, a separation mechanism dynamic image recognition device, a pushing mechanism dynamic image recognition device, a posture device dynamic image recognition device and a guidance device dynamic image recognition device;
the connection state image recognition device is used for detecting the connection condition of the part with the cable connection relation and automatically recognizing the loosening degree;
the dynamic image identification equipment of the detonation device is used for detecting whether abnormal detonation conditions exist in the testing process and feeding back the abnormal detonation conditions to the main control equipment in time;
the separating mechanism dynamic image recognition device is used for detecting the action condition of the separating mechanism;
the push-out mechanism dynamic image recognition equipment is used for detecting the push-out condition of the push-out mechanism, wherein the push-out condition comprises a push-out speed and a push-out in-place condition;
the gesture device dynamic image recognition equipment is used for recognizing the motion state of the gesture device;
the dynamic image recognition device of the guidance device is used for detecting the motion state of the guidance device.
Another embodiment of the present application provides a testing method, including:
acquiring state information and test process information of an electronic product to be tested;
and determining the next testing action executed by the testing system according to the state information and the process information, thereby realizing the quality detection of the tested electronic product.
In some embodiments, the electronic product is a guidance launching system, and the guidance launching system specifically includes: the device comprises a guidance device, a posture device, a pushing-out mechanism, a separating mechanism and a detonation device;
the state information includes:
the method comprises the steps of presetting the distance among components of the tested electronic product, the movement speed and the movement distance of a movable component of the tested electronic product, information of the rotation angle of a component with deflection attribute of the tested electronic product, the vibration condition of the component with vibration attribute of the tested electronic product in a test project, the temperature rise condition of the component with heating attribute in the tested electronic product and the real-time pressure condition of a pressure sensitive element of the tested electronic product.
In some embodiments, the process information includes: the connection condition and the looseness degree of the cable connection relation part, the abnormal detonation condition existing in the test process, the action condition of the separating mechanism, the pushing-out condition of the pushing-out mechanism, the motion attitude of the attitude device and the motion state of the guidance device are provided; the push-out conditions include a push-out speed and a push-out-in-place condition.
The beneficial effect of this application is as follows:
compared with the existing test system, the bionic test system is improved, two types of contents are added to the existing test system, one type is a distance sensor, a displacement sensor, an angle sensor, a vibration sensor, a temperature sensor and a pressure sensor and is used for acquiring state information of an electronic product to be tested, and the other type is a connection state image recognition device, a detonation device dynamic image recognition device, a separation mechanism dynamic image recognition device, a pushing mechanism dynamic image recognition device and a guidance device dynamic image recognition device and is used for acquiring test process information. Therefore, the dependence on human beings is reduced, the accurate information acquisition mode is increased, the universality and the expansibility are good, and the design idea can be used for reference to popularization and use in batches.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 shows a schematic block diagram of a test system in an embodiment of the present application.
Fig. 2 shows a specific structural diagram of a test system in an embodiment of the present application.
Fig. 3 shows a schematic flow chart of a testing method in the embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The test system that is extensively used at present does not possess the ability of acquireing state information such as the temperature of the electronic product under test to the test process, vibration, displacement, also does not possess monitoring and the recognition ability to the connection state of the electronic product under test, activity mechanism motion state, more can not accomplish the intelligent decision-making of test process according to above-mentioned information, therefore test system's intellectuality is imperative.
Fig. 1 shows a schematic structural diagram of a test system provided in an embodiment of the present application, including: a test assembly 100 for testing an electronic product; the first sensor group 200 is used for acquiring the state information of the electronic product to be tested; a second sensor group 300 for acquiring process information of the test; and the test component determines the next test action executed by the test system according to the state information and the process information, so as to realize the quality detection of the tested electronic product.
In this application, in some embodiments, the electronic product is a guidance launching system, and the guidance launching system specifically includes: the device comprises a guidance device, a posture device, a pushing-out mechanism, a separating mechanism and an explosion device.
The guided missile launching device is used for navigating missile launching, designing a missile launching route and the like, the attitude device is used for adjusting the attitude of the launched missile, the push-out mechanism is used for pushing the missile and the rocket out of the cabin body, and the prepared launching and separating mechanism is used for realizing multi-stage separation and detonation of the missile and the rocket and used for realizing ignition starting and launching of the launched missile.
It is to be understood that the above-mentioned guided missile launching system is a missile launching system which is known at present, and the part is taken as common knowledge, and the description of the part is not repeated too much.
The core concept of the method is that the next testing action is determined according to state information and process information generated by the electronic product, wherein the state information is the state of physicochemical property change, such as the current posture, the performance and the like, generated by the electronic product in the testing process, the process information comprises feedback information generated in the testing process, change information in the testing process and the like, and the part of information can reflect the details of the testing process all the time and feed back the testing effect in time. It can be understood that the status information and the process information of different electronic products may be quite different, but are not separated from the broad definition of the status information and the process information, that is, the status information is information showing the status of the tested electronic product, and the process information is all real-time information generated in the testing process.
In an embodiment where the electronic product is a guidance launching system, the test assembly comprises: the system comprises a main control computer, a signal exchange device, a signal acquisition device, a signal excitation device, a target simulation device group and an energy supply device; the main control computer is used for controlling other equipment except the main control computer in the testing assembly, the first sensor group and the second sensor group; the signal switching equipment is used for relaying, forwarding and interacting all signals in the testing process; the signal acquisition equipment is used for acquiring all analog quantity signals, digital quantity signals and communication signals of the tested electronic product in the test process; the signal excitation equipment is used for providing an excitation signal required by operation for the tested electronic product; the target simulation equipment set is used for providing simulation signals for the operation of the tested electronic product; the energy supply equipment is used for providing electric energy for the operation of the electronic product to be tested.
In some embodiments, the target simulation apparatus comprises: the system comprises attitude simulation equipment, infrared simulation equipment and radio frequency simulation equipment; the attitude simulation equipment is used for simulating the running state of the tested electronic product; the infrared simulation equipment is used for simulating a heat source target for the electronic product to be tested; the radio frequency simulation equipment is used for simulating a target radiating radio frequency signals for the electronic product to be tested.
In certain embodiments, the first sensor set comprises: at least one of a distance sensor, a displacement sensor, an angle sensor, a vibration sensor, a temperature sensor, and a pressure sensor.
In some embodiments, the second sensor group comprises: at least one of a connection state image recognition device, a detonation device dynamic image recognition device, a separation mechanism dynamic image recognition device, a pushing mechanism dynamic image recognition device, a posture device dynamic image recognition device and a guidance device dynamic image recognition device; the connection state image recognition device is used for detecting the connection condition of the part with the cable connection relation and automatically recognizing the loosening degree; the dynamic image identification equipment of the detonation device is used for detecting whether abnormal detonation conditions exist in the testing process and feeding back the abnormal detonation conditions to the main control equipment in time; the separating mechanism dynamic image recognition equipment is used for detecting the action condition of the separating mechanism; the push-out mechanism dynamic image recognition equipment is used for detecting the push-out condition of the push-out mechanism, and the push-out condition comprises a push-out speed and a push-out in-place condition; the attitude device dynamic image recognition device is used for recognizing the motion state of the attitude device, and the guidance device dynamic image recognition device is used for detecting the motion state of the guidance device.
In a specific embodiment, as shown in fig. 2, the test system specifically includes: the system comprises a main control device 1, an information exchange device 2, a signal acquisition device 3, a signal excitation device 4, a posture simulation device 5, an infrared simulation device 6, a radio frequency simulation device 7, an energy supply device 8, a distance sensor 9, a displacement sensor 10, an angle sensor 11, a vibration sensor 12, a temperature sensor 13, a pressure sensor 14, a connection state image recognition device 15, a detonating device dynamic image recognition device 16, a separation mechanism dynamic image recognition device 17, a push-out mechanism dynamic image recognition device 18, a posture device dynamic image recognition device 19 and a guidance device dynamic image recognition device 20. The main control device 1 is connected with the information exchange device 2, the information exchange device 2 is connected with the main control device 1, the signal acquisition device 3, the signal excitation device 4, the attitude simulation device 5, the infrared simulation device 6, the radio frequency simulation device 7, the energy supply device 8, the distance sensor 9, the displacement sensor 10, the angle sensor 11, the vibration sensor 12, the temperature sensor 13, the pressure sensor 14, the connection state image recognition device 15, the detonating device dynamic image recognition device 16, the separation mechanism dynamic image recognition device 17, the pushing mechanism dynamic image recognition device 18, the attitude device dynamic image recognition device 19 and the guidance device dynamic image recognition device 20, the electronic product to be tested is connected with the signal acquisition device 3, the signal excitation device 4, the attitude simulation device 5, the infrared simulation device 6, the radio frequency simulation device 7, the energy supply device 8, The distance sensor 9, the displacement sensor 10, the angle sensor 11, the vibration sensor 12, the temperature sensor 13, the pressure sensor 14, the connection state image recognition device 15, the explosion device moving image recognition device 16, the separation mechanism moving image recognition device 17, the push-out mechanism moving image recognition device 18, the attitude device moving image recognition device 19, and the guidance device moving image recognition device 20 are connected.
The bionic test system takes a sensor and image recognition equipment as cores and respectively realizes corresponding functions of human auditory sense, touch sense and visual sense. The temperature sensor 13 and the pressure sensor 14 replace human touch, the vibration sensor 12 replaces human hearing, and the angle sensor 11, the displacement sensor 10, the distance sensor 9 and various image recognition devices replace human vision. The core equipment has the qualitative measurement capability of human beings and the accurate quantitative measurement capability which is not possessed by the human beings. The test system works in such a way that a main control computer 1 controls an energy supply device 8, a radio frequency simulation device 7, an infrared simulation device 6, a posture simulation device 5 and a signal excitation device 4 to provide energy and excitation for a tested electronic product through an information exchange device 2, further obtains excitation response of the tested electronic product through a signal acquisition device 3, obtains test process information through a connection state image recognition device 15, an explosion device dynamic image recognition device 16, a separation mechanism dynamic image recognition device 17, a push mechanism dynamic image recognition device 18, a posture device dynamic image recognition device 19 and a guidance device dynamic image recognition device 20, obtains state information of the tested electronic product through a distance sensor 9, a displacement sensor 10, an angle sensor 11, a vibration sensor 12, a temperature sensor 13 and a pressure sensor 14, and the main control device 1 combines the excitation response, The process information and the state information determine the testing action of the next step.
The main control equipment has the functions of controlling all the test measuring equipment, the sensor equipment and the image recognition equipment in the test system, the information exchange equipment has the functions of relaying and forwarding all network information in the system, the signal acquisition equipment has the functions of acquiring all analog quantity signals, digital quantity signals and on-off signals of the tested electronic product, the signal excitation equipment has the function of providing excitation signals required for normal work of the tested electronic product, the posture simulation equipment has the function of simulating a moving device of the tested electronic product, the infrared simulation equipment has the function of simulating a heat source target of the tested electronic product, the radio frequency simulation equipment has the function of simulating a radiating radio frequency signal target with specific attributes for the tested electronic product, the energy supply equipment has the function of providing energy supply for the tested electronic product, and the distance sensor has the function of measuring the distance between specific parts of the tested electronic product, the displacement sensor is used for measuring the movement speed and the movement distance of a movable part of an electronic product to be tested, the angle sensor is used for measuring the rotation angle information of a part of the electronic product to be tested, the vibration sensor is used for measuring the vibration condition of the part of the electronic product to be tested, the temperature sensor is used for measuring the temperature rise condition of the part of the electronic product to be tested, the pressure sensor is used for measuring the real-time pressure condition of a pressure sensitive element of the electronic product to be tested, the connection state image recognition equipment is used for detecting the connection condition of a part with a cable connection relation and automatically recognizing the looseness degree, the point explosion device dynamic image recognition equipment is used for detecting whether abnormal point explosion condition exists in the test process and feeding back the main control equipment in time, and the separation mechanism dynamic image recognition equipment is used for detecting the action condition of the separation mechanism, the pushing mechanism dynamic image recognition device has the function of detecting the pushing condition of the pushing mechanism, including the pushing speed, the pushing in-place condition and the like, and the function of the guiding device dynamic image recognition device is used for detecting the motion state of the guiding device.
The test system comprises a distance sensor, a displacement sensor, an angle sensor, a vibration sensor, a temperature sensor and a pressure sensor, wherein the distance sensor, the displacement sensor, the angle sensor, the vibration sensor, the temperature sensor and the pressure sensor are used for acquiring state information of an electronic product to be tested, and the connection state image recognition device, the detonation device dynamic image recognition device, the separation mechanism dynamic image recognition device, the pushing mechanism dynamic image recognition device and the guidance device dynamic image recognition device are used for acquiring test process information. Therefore, the dependence on human beings is reduced, the accurate information acquisition mode is increased, the universality and the expansibility are good, and the design idea can be used for reference to popularization and use in batches.
Further, another aspect of the present application further provides a testing method, as shown in fig. 3, specifically including:
s1, acquiring the state information and the testing process information of the tested electronic product;
and S2, determining the next testing action executed by the testing system according to the state information and the process information, and further realizing the quality detection of the tested electronic product.
Based on the same inventive concept, the testing method provided by the application has the capability of acquiring state information of the tested electronic product in the testing process, such as temperature, vibration, displacement and the like, and also has the capability of monitoring and identifying the connection state and the movement state of the movable mechanism of the tested electronic product in the testing process, can complete intelligent decision of the testing process according to the information, reduces dependence on human beings, increases the accurate information acquisition mode, has good universality and expansibility, and can be popularized and used in batches by taking reference to design ideas.
The principle and the implementation mode of the invention are explained by applying specific embodiments in the invention, and the description of the embodiments is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.

Claims (5)

1. A test system, comprising:
the testing component is used for testing the electronic product;
the first sensor group is used for acquiring the state information of the electronic product to be tested;
the second sensor group is used for acquiring the process information of the test; wherein the content of the first and second substances,
the testing component determines the testing action executed by the testing system in the next step according to the state information and the process information so as to realize the quality detection of the tested electronic product,
wherein the test assembly comprises:
the system comprises a main control computer, a signal exchange device, a signal acquisition device, a signal excitation device, a target simulation device group and an energy supply device;
the main control computer is used for controlling other equipment except the main control computer in the testing assembly, the first sensor group and the second sensor group;
the signal switching equipment is used for relaying, forwarding and interacting all signals in the testing process;
the signal acquisition equipment is used for acquiring all analog quantity signals, digital quantity signals and communication signals of the tested electronic product in the test process;
the signal excitation equipment is used for providing an excitation signal required by operation for the tested electronic product;
the target simulation equipment set is used for providing simulation signals for the operation of the tested electronic product;
the energy supply equipment is used for providing electric energy for the operation of the electronic product to be tested;
wherein the electronic product is a guidance launching system,
the guidance launching system specifically comprises: the device comprises a guidance device, a posture device, a pushing-out mechanism, a separating mechanism and a detonation device;
the state information includes:
the distance between preset parts of the tested electronic product, the movement speed and the movement distance of a movable part of the tested electronic product, the rotation angle information of a part of the tested electronic product with deflection attribute, the vibration condition of the part of the tested electronic product with vibration attribute in the test engineering, the temperature rise condition of the part of the tested electronic product with heating attribute and the real-time pressure condition of a pressure sensitive element of the tested electronic product,
the process information includes:
the connection condition and the looseness degree of the cable connection relation part, the abnormal detonation condition existing in the test process, the action condition of the separating mechanism, the pushing-out condition of the pushing-out mechanism, the motion attitude of the attitude device and the motion state of the guidance device are provided; the push-out conditions include a push-out speed and a push-out-in-place condition.
2. The test system of claim 1, wherein the target simulation device comprises:
the system comprises attitude simulation equipment, infrared simulation equipment and radio frequency simulation equipment;
the attitude simulation equipment is used for simulating the running state of the tested electronic product;
the infrared simulation equipment is used for simulating a heat source target for the electronic product to be tested;
the radio frequency simulation equipment is used for simulating a target radiating radio frequency signals for the electronic product to be tested.
3. The test system of claim 1, wherein the first sensor set comprises: at least one of a distance sensor, a displacement sensor, an angle sensor, a vibration sensor, a temperature sensor, and a pressure sensor;
the distance sensor is used for measuring the distance between preset parts of the tested electronic product, the displacement sensor is used for measuring the moving speed and the moving distance of the moving part of the tested electronic product, the angle sensor is used for measuring the rotating angle information of the part with deflection attribute of the tested electronic product, the vibration sensor is used for measuring the vibration condition of the part with vibration attribute of the tested electronic product in the test engineering, the temperature sensor is used for measuring the temperature rise condition of the part with heating attribute in the tested electronic product, and the pressure sensor is used for measuring the real-time pressure condition of the pressure sensitive element of the tested electronic product.
4. The test system of claim 1, wherein the second sensor group comprises: at least one of a connection state image recognition device, a detonation device dynamic image recognition device, a separation mechanism dynamic image recognition device, a pushing mechanism dynamic image recognition device, a posture device dynamic image recognition device and a guidance device dynamic image recognition device;
the connection state image recognition device is used for detecting the connection condition of the part with the cable connection relation and automatically recognizing the loosening degree;
the dynamic image identification equipment of the detonation device is used for detecting whether abnormal detonation conditions exist in the testing process and feeding back the abnormal detonation conditions to the main control equipment in time;
the separating mechanism dynamic image recognition device is used for detecting the action condition of the separating mechanism;
the push-out mechanism dynamic image recognition equipment is used for detecting the push-out condition of the push-out mechanism, wherein the push-out condition comprises a push-out speed and a push-out in-place condition;
the gesture device dynamic image recognition equipment is used for recognizing the motion state of the gesture device;
the dynamic image recognition device of the guidance device is used for detecting the motion state of the guidance device.
5. The test system according to any one of claims 1 to 4, providing a test method comprising:
acquiring state information and test process information of an electronic product to be tested;
the electronic product is a guidance launching system, and the guidance launching system specifically comprises: the device comprises a guidance device, a posture device, a pushing-out mechanism, a separating mechanism and a detonation device;
determining the next testing action executed by the testing system according to the state information and the process information so as to realize the quality detection of the tested electronic product,
the state information includes:
the distance between preset parts of the tested electronic product, the movement speed and the movement distance of a movable part of the tested electronic product, the rotation angle information of a part of the tested electronic product with deflection attribute, the vibration condition of the part of the tested electronic product with vibration attribute in the test engineering, the temperature rise condition of the part of the tested electronic product with heating attribute and the real-time pressure condition of a pressure sensitive element of the tested electronic product,
the process information includes:
the connection condition and the looseness degree of the cable connection relation part, the abnormal detonation condition existing in the test process, the action condition of the separating mechanism, the pushing-out condition of the pushing-out mechanism, the motion attitude of the attitude device and the motion state of the guidance device are provided; the push-out conditions include a push-out speed and a push-out-in-place condition.
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空间操控技术验证系统的导航与控制;赵枭雄;《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》;20140315(第04期);全文 *

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