CN110764017A - A detection method for quickly determining a short circuit of an electronic device in a parallel circuit - Google Patents
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Abstract
Description
技术领域technical field
本发明属于电子技术领域,具体涉及电子器件短路的检测方法。The invention belongs to the technical field of electronics, and in particular relates to a method for detecting a short circuit of an electronic device.
背景技术Background technique
在各种电子线路中,都会有不同数量和不同种类的电子元器件并联在一起使用,特别对一些大规模使用并联器件的电路,如在电磁波或声波发射或接收中使用的大量换能器的并联,LED灯的并联等,有时会有成千上万只同一种或不同种类的器件并联使用。由于焊接安装不当或在使用过程中,不可避免的会造成一个或几个并联器件的损坏,导致电路短路,使整个设备或系统不能正常工作。In various electronic circuits, there will be different numbers and types of electronic components used in parallel, especially for circuits that use parallel devices on a large scale, such as a large number of transducers used in electromagnetic wave or sound wave transmission or reception. Parallel connection, parallel connection of LED lights, etc., sometimes thousands of devices of the same or different types are used in parallel. Due to improper welding and installation or during use, one or several parallel devices will inevitably be damaged, resulting in a short circuit, and the entire equipment or system cannot work normally.
在电阻并联电路中,如果有电阻短路,用万用表无法确定短路电阻的位置。对于由电感或电容并联或由电阻、电容、电感混合并联的电路,万用表就无法使用,因为用万用表测量电感就是短路的。其他测量方法则需要专用仪器且检测过程繁琐,确定短路器件位置耗时较长,对于大规模并联器件短路位置的确定效率较低。In a resistance parallel circuit, if there is a short circuit in the resistance, the position of the short circuit resistance cannot be determined with a multimeter. For circuits that are connected in parallel by inductors or capacitors or mixed in parallel by resistors, capacitors, and inductors, the multimeter cannot be used, because measuring the inductance with a multimeter is a short circuit. Other measurement methods require special instruments and the detection process is cumbersome. It takes a long time to determine the position of short-circuit devices, and the efficiency of determining the short-circuit position of large-scale parallel devices is low.
发明内容SUMMARY OF THE INVENTION
针对上述检测技术中存在的不足之处,本发明的目的在于提供一种快速确定并联电路电子器件短路的检测方法。Aiming at the shortcomings of the above detection technology, the purpose of the present invention is to provide a detection method for quickly determining the short circuit of an electronic device in a parallel circuit.
本发明提供的快速确定并联电路电子器件短路的检测方法,采用满足一定准确度和频率要求的LCR数字电桥的阻抗测量档对被测并联电子器件的短路器件进行检测确认,阻抗最小点即为短路器件在电路中所在的位置。本发明不但可以用于多个纯电阻、多个纯电容或者多个纯电感并联的电路,参见图2,3,4;而且可以用于电阻、电容、电感混合并联的电路,参见图1;也可以用于其它能通过阻抗大小判定器件短路与否的并联电路。本发明检测速度快,且不受并联和短路器件数量及类型的限制。In the detection method for quickly determining the short circuit of an electronic device in a parallel circuit provided by the present invention, the impedance measurement file of the LCR digital bridge that meets certain accuracy and frequency requirements is used to detect and confirm the short circuit device of the parallel electronic device under test, and the minimum impedance point is The location of the shorting device in the circuit. The present invention can not only be used for circuits in which multiple pure resistors, multiple pure capacitors or multiple pure inductances are connected in parallel, see Figures 2, 3, and 4; but also can be used in circuits where resistors, capacitors, and inductors are mixed in parallel, see Figure 1; It can also be used in other parallel circuits that can determine whether the device is short-circuited or not through the magnitude of the impedance. The invention has high detection speed and is not limited by the number and type of parallel and short-circuit devices.
本发明中,所用LCR数字电桥就是电子学领域使用的常规仪器,但该电桥要有阻抗Z测量档,LCR数字电桥和有短路器件的并联电路组成检测系统;阻抗Z测量范围应在0.0001Ω—99.99MΩ,准确度应达到0.1%,测量频率在1KHz内应连续或有固定的频点。对于一些在某个固定频率或频域内工作的并联器件的短路检测,所用LCR数字电桥的测量频率范围应满足。In the present invention, the LCR digital bridge used is a conventional instrument used in the field of electronics, but the bridge must have an impedance Z measurement file, and the LCR digital bridge and a parallel circuit with a short-circuit device form a detection system; the impedance Z measurement range should be within 0.0001Ω—99.99MΩ, the accuracy should reach 0.1%, and the measurement frequency should be continuous or have a fixed frequency point within 1KHz. For the short-circuit detection of some parallel devices working in a fixed frequency or frequency domain, the measurement frequency range of the LCR digital bridge used should be satisfied.
本发明中,由电阻、电容、电感混合并联的电路,参见图1,由多个纯电阻并联的电路,参见图2,由多个纯电容并联的电路,参见图3,由多个纯电感并联的电路,参见图4,用上述LCR数字电桥的测试端分别和图1、图2、图3、图4中的A、B端(两个测试点),和C、D端(两个测试点)连接,测试得两端的阻抗ZAB和ZCD,如果ZAB<ZCD,说明A、B端离短路器件近,则从A、B端开始快速或跨越式移动测点,按阻抗减小的趋势找到阻抗最小点,此时两测点间即为短路器件的位置。如果ZAB>ZCD,则从C、D端开始,用上述同样方法找到短路器件的位置。In the present invention, a circuit composed of resistors, capacitors and inductances in parallel, see FIG. 1, a circuit composed of a plurality of pure resistors in parallel, referring to FIG. 2, a circuit composed of a plurality of pure capacitors in parallel, referring to FIG. 3, a circuit composed of a plurality of pure inductances For the parallel circuit, see Figure 4, use the test terminals of the above-mentioned LCR digital bridge to connect with terminals A and B (two test points) in Figure 1, Figure 2, Figure 3, and Figure 4, and terminals C and D (two test points), respectively. test points), and test the impedances Z AB and Z CD at both ends. If Z AB < Z CD , it means that the A and B terminals are close to the short-circuit device, then start from the A and B terminals to move the measurement points quickly or in a leaping manner, and press The trend of impedance reduction is to find the minimum impedance point, at this time, the position of the short-circuit device is between the two measurement points. If Z AB > Z CD , starting from the C and D terminals, find the position of the short-circuit device by the same method as above.
本发明中,对于其他能通过阻抗大小判定器件短路与否的并联电路,用上述检测方法可以确定短路器件的位置。In the present invention, for other parallel circuits that can determine whether the device is short-circuited through the magnitude of the impedance, the position of the short-circuit device can be determined by the above detection method.
本发明中,对于一些在某个固定频率(如超声波换能器并联)或频域内工作的并联器件的短路检测,同样可以用上述方法确定短路器件的位置,所用LCR数字电桥的测量频率应和器件的工作频率相一致。In the present invention, for the short-circuit detection of some parallel devices operating at a fixed frequency (such as ultrasonic transducers in parallel) or in the frequency domain, the above method can also be used to determine the position of the short-circuit device, and the measurement frequency of the LCR digital bridge used should be consistent with the operating frequency of the device.
本发明快速确定并联电子器件短路的检测方法,不但适用于通过阻抗大小判定器件短路与否的所有并联电路,而且对所检测的并联短路中器件的形式和阻抗大小没有任何特定要求,且检测过程不会对原电路造成二次损坏。The detection method for quickly determining the short circuit of a parallel electronic device according to the present invention is not only suitable for all parallel circuits that determine whether the device is short-circuited or not by the magnitude of impedance, but also has no specific requirements for the form and impedance size of the detected parallel short-circuit device, and the detection process It will not cause secondary damage to the original circuit.
附图说明Description of drawings
图1为本发明中电阻、电容、电感混合并联电路图示。FIG. 1 is a schematic diagram of a mixed parallel circuit of resistance, capacitance and inductance in the present invention.
图2为本发明中纯电阻并联电路图示。FIG. 2 is a schematic diagram of a pure resistance parallel circuit in the present invention.
图3为本发明中纯电容并联电路图示。FIG. 3 is a schematic diagram of a pure capacitor parallel circuit in the present invention.
图4为本发明中纯电感并联电路图示。FIG. 4 is a schematic diagram of a purely inductive parallel circuit in the present invention.
具体实施方式Detailed ways
参见图1,对于电阻、电容、电感混合并联的电路,如果其中有一个或几个器件短路,具体检测和确定方法如下:Referring to Figure 1, for a circuit in which a resistor, capacitor, and inductor are mixed in parallel, if one or several devices are short-circuited, the specific detection and determination methods are as follows:
首先,选择一台LCR数字电桥,参数设置在阻抗Z测量档,频率选择1KHz。First, select an LCR digital bridge, the parameters are set in the impedance Z measurement file, and the frequency is 1KHz.
其次,用LCR数字电桥的两个测量表笔分别和图1的A、B端,和C、D端连接,测试两端的阻抗ZAB和ZCD的数值,具体数值可以从LCR数字电桥的显示屏上读得。如果ZAB<ZCD,说明A,B端离短路器件近,则从A,B端开始快速或跨越式移动测点,按阻抗减小的趋势找到阻抗最小点,此时两测点间即为短路器件的位置。如果ZAB>ZCD,则从C,D端开始,用上述同样方法找到短路器件的位置。如果有多个器件短路,用上述方法逐一排查即可。Secondly, use the two measurement probes of the LCR digital bridge to connect to the A, B terminals, and C and D terminals of Figure 1 respectively, and test the values of the impedance Z AB and Z CD at both ends. The specific values can be obtained from the LCR digital bridge. read on the display. If Z AB < Z CD , it means that the A and B terminals are close to the short-circuit device, then start from the A and B terminals to move the measuring points rapidly or in a leaping manner, and find the minimum impedance point according to the trend of impedance reduction. is the location of the short-circuit device. If Z AB > Z CD , starting from the C and D terminals, find the position of the short-circuit device with the same method as above. If there are multiple devices short-circuited, use the above method to check one by one.
对于本发明图2,图3,图4所示的纯电阻、电容、电感并联的电路,以及能通过阻抗大小判定器件短路与否的并联电路,用上述方法同样可以确定短路器件的位置。For the parallel circuits of pure resistance, capacitance and inductance shown in FIG. 2, FIG. 3, and FIG. 4 of the present invention, and the parallel circuit that can determine whether the device is short-circuited or not by the magnitude of the impedance, the position of the short-circuit device can also be determined by the above method.
对于有确定频率工作的器件,如由n个40KHz的超声波换能器并联组成的超声波发射阵列,如果其中有短路换能器,也可以用上述方法检测,但LCR数字电桥的频率要选择40KHz。For devices that work at a certain frequency, such as an ultrasonic transmitting array composed of n 40KHz ultrasonic transducers in parallel, if there are short-circuit transducers, the above method can also be used to detect, but the frequency of the LCR digital bridge should be 40KHz. .
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