CN110763977B - 一种定量测量评估噪声测试系统精度的系统及方法 - Google Patents
一种定量测量评估噪声测试系统精度的系统及方法 Download PDFInfo
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- CN110763977B CN110763977B CN201910605042.0A CN201910605042A CN110763977B CN 110763977 B CN110763977 B CN 110763977B CN 201910605042 A CN201910605042 A CN 201910605042A CN 110763977 B CN110763977 B CN 110763977B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
- G01R31/287—Procedures; Software aspects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
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CN201910605042.0A CN110763977B (zh) | 2019-07-05 | 2019-07-05 | 一种定量测量评估噪声测试系统精度的系统及方法 |
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CN201910605042.0A CN110763977B (zh) | 2019-07-05 | 2019-07-05 | 一种定量测量评估噪声测试系统精度的系统及方法 |
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CN110763977A CN110763977A (zh) | 2020-02-07 |
CN110763977B true CN110763977B (zh) | 2022-08-05 |
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CN201910605042.0A Active CN110763977B (zh) | 2019-07-05 | 2019-07-05 | 一种定量测量评估噪声测试系统精度的系统及方法 |
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Families Citing this family (2)
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CN111751627B (zh) * | 2020-06-05 | 2022-11-29 | 浙江铖昌科技股份有限公司 | 一种基于十项误差模型的矢量网络分析仪的自校准方法 |
CN111812399B (zh) * | 2020-07-01 | 2022-06-07 | 合肥芯谷微电子有限公司 | 一种微波功率放大模块精确测试方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5172064A (en) * | 1991-12-02 | 1992-12-15 | The United States Of America As Represented By The Secretary Of Commerce | Calibration system for determining the accuracy of phase modulation and amplitude modulation noise measurement apparatus |
CN104237829A (zh) * | 2014-09-24 | 2014-12-24 | 中国电子科技集团公司第十三研究所 | 高精度噪声系数测量系统整体校准方法 |
CN107294617A (zh) * | 2017-05-11 | 2017-10-24 | 中国空间技术研究院 | 一种基于y因子法的接收机噪声系数修正方法 |
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2019
- 2019-07-05 CN CN201910605042.0A patent/CN110763977B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5172064A (en) * | 1991-12-02 | 1992-12-15 | The United States Of America As Represented By The Secretary Of Commerce | Calibration system for determining the accuracy of phase modulation and amplitude modulation noise measurement apparatus |
CN104237829A (zh) * | 2014-09-24 | 2014-12-24 | 中国电子科技集团公司第十三研究所 | 高精度噪声系数测量系统整体校准方法 |
CN107294617A (zh) * | 2017-05-11 | 2017-10-24 | 中国空间技术研究院 | 一种基于y因子法的接收机噪声系数修正方法 |
Non-Patent Citations (3)
Title |
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Development of a Verification Technique for On-wafer Noise Figure Measurement Systems;Aihua Wu等;《2017 90th ARFTG Microwave Measurement Symposium (ARFTG)》;20181231;全文 * |
The impact of ENR and coaxial calibration in accurate on wafer noise parameter testing for ultra-low noise devices;Kevin Kellogg等;《2016 88th ARFTG Microwave Measurement Conference (ARFTG)》;20171231;全文 * |
高精度噪声系数测量系统整体校准方法研究;吴爱华等;《计算机与数字工程》;20151231;第43卷(第1期);第4-6、28页 * |
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Inventor after: Wang Liping Inventor after: Ding Xu Inventor after: Gu Yifan Inventor after: Wang Zhiyu Inventor after: Yan Shu Inventor after: Wang Jiale Inventor before: Yu Faxin Inventor before: Wang Liping Inventor before: Ding Xu Inventor before: Gu Yifan Inventor before: Wang Zhiyu Inventor before: Mo Jiongjiong Inventor before: Xuan Yinliang Inventor before: Yan Shu Inventor before: Wang Jiale |
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Address after: Room 601, Building No. 3, Xiyuan No. 3, Sandun Town, Xihu District, Hangzhou City, Zhejiang 310000 Applicant after: Zhejiang Chengchang Technology Co.,Ltd. Address before: 310012 Room 601, building 5, No. 3, Xiyuan Third Road, Sandun Town, Xihu District, Hangzhou City, Zhejiang Province Applicant before: ZHEJIANG CHENGCHANG TECHNOLOGY Co.,Ltd. |
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