CN110736905A - Insulation aging evaluation method for 110kV XLPE high-voltage cable - Google Patents
Insulation aging evaluation method for 110kV XLPE high-voltage cable Download PDFInfo
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- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
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- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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Abstract
The invention discloses an insulation aging evaluation method for 110kV XLPE high-voltage cables, which comprises the steps of testing polarization current and depolarization current of the high-voltage cables in a polarization process and a depolarization process through polarization-depolarization current (PDC), obtaining low-frequency dielectric loss factors under corresponding polarization voltage according to the obtained polarization current and depolarization current, and evaluating the insulation performance of the high-voltage cables by taking the variation of the low-frequency dielectric loss factors under different polarization voltages as characteristic quantities for representing the insulation aging of the cables.
Description
Technical Field
The invention belongs to the technical field of electricity, relates to a power cable insulation diagnosis technology, and particularly relates to an insulation aging evaluation method for 110kVXLPE high-voltage cables.
Background
Under the combined action of a plurality of factors such as mechanical stress, moisture, temperature and electric field, the XLPE power cable causes the gradual deterioration of the insulation performance of the insulation body and the accessories, which will cause the reduction of the insulation margin of the cable, and may cause the insulation breakdown of the cable under the action of impulse voltage, thus causing power accidents. Periodic insulation diagnostics of the cable are necessary in order to monitor the insulation state of the cable.
The high-voltage power cable has thicker insulation thickness and higher rated voltage grade, and has a structure different from that of a medium-voltage cable, so that the traditional medium-voltage cable insulation diagnosis technology (such as insulation resistance and absorption ratio measurement, power frequency dielectric loss factor measurement, leakage current measurement and the like) has poor effect when being applied to the high-voltage cable. Currently there is no well-established method for insulation diagnosis of high voltage cables. Many attempts have been made by scholars both at home and abroad. The isothermal relaxation current method is applied to insulation diagnosis of the high-voltage cable once, but the isothermal relaxation current curve needs to be subjected to fitting analysis, and the actual operation is complex and unreliable. In addition, researchers also prove that the low-frequency factor of the high-voltage cable has a positive correlation with the insulation aging state of the high-voltage cable, but the research of the high-voltage cable is to test the high-voltage cable by a broadband dielectric impedance spectroscopy tester, so that the testing time is long, and the diagnosis efficiency is problematic.
Disclosure of Invention
Aiming at the technical current situation that a high-efficiency diagnosis method for insulation aging of a high-voltage power cable is lacked at present, the invention aims to provide insulation aging evaluation methods for 110kV XLPE high-voltage cables, which can effectively diagnose the insulation aging condition of the power cable in a short off-line time without damaging the insulation property of the cable.
The invention idea is as follows: because the rated voltage level of the high-voltage cable is high and the capacitance is large, the AC dielectric loss detection of the high-voltage cable is very difficult to really detect. The low-frequency dielectric loss characteristic of the cable can also be obtained by using a polarization-depolarization current method under the direct-current voltage. Researches find that the dielectric loss of the power cable may not be in a positive correlation with the insulation aging degree, and the diagnosis effect is not ideal when the insulation aging condition of the cable is diagnosed simply according to the dielectric loss. However, the aged power cable has differences in dielectric loss factors calculated under different polarization voltages, and the variation and the aging time of the aged power cable have a positive correlation. Therefore, the insulation aging condition of the power cable can be judged according to the dielectric loss factor variable quantity obtained by PDC testing under different polarization voltages.
Based on the above invention thought, the method for evaluating the insulation aging of the 110kV XLPE high-voltage cable provided by the invention comprises the following steps:
s1, measuring the polarization current of the high-voltage cable to be measured in the polarization process and the depolarization current of the high-voltage cable to be measured in the polarization process under the th polarization voltage and the second polarization voltage respectively;
s2 calculating the dielectric loss factors of the low frequency signals corresponding to the th and second polarization voltages applied to the high voltage cable according to the following formula:
in the formula, σ0Conductivity, epsilon, for cable insulation0Is a vacuum dielectric constant of ∈∞Is a light frequency mediumAn electrical constant, ∈ '(ω) is the polarization intensity, ε "(ω) is the dielectric loss, χ' (ω) is the real part of the dielectric repolarization rate χ (ω), χ" (ω) is the imaginary part of the dielectric repolarization rate χ (ω);
s3, acquiring low-frequency dielectric loss factor variation delta tan delta corresponding to the th polarization voltage and the second polarization voltage, and taking the low-frequency dielectric loss factor variation delta tan delta as a characteristic quantity delta tan delta representing the insulation aging of the high-voltage cable, wherein the delta tan delta is equal to the tan delta2-tanδ1tanδ1、tanδ2The th polarized light beams are respectively polarized,
low frequency dielectric loss factors corresponding to the voltage and the second polarization voltage;
s4 evaluates the degree of insulation aging of the high-voltage cable based on the characteristic amount Δ tan δ.
In the insulation aging evaluation method for the 110kV XLPE high-voltage cable, the step S1 aims to measure the polarization current i in the polarization process of the polarization voltage applied to the high-voltage cable to be tested and the short-circuit grounding depolarization process after the polarization is finishedpolAnd depolarization current idepolIn order not to affect the insulation performance of the high-voltage cable, the th polarization voltage applied to the high-voltage cable is in a range of 1-4 kV, the second polarization voltage is in a range of 3-6 kV., and particularly when the difference between the second polarization voltage and the th polarization voltage is 2kV, the stability of the dielectric loss variation of the power cable under different high voltages is better.
In the insulation aging evaluation method for the 110kV XLPE high-voltage cable, the step S2 aims to obtain the low-frequency dielectric loss factor corresponding to the high-voltage cable applied with different high voltages.
Conductivity sigma due to high voltage cable insulation0：
In the formula of U0To go highPolarization voltage applied by cable0Is a vacuum dielectric constant, ipol(tfinal) Indicating the polarisation current i after a set time of applying a polarisation voltage to the high voltage cabledepol(tfinal) Representing the depolarised current of the high-voltage cable after a set time during the depolarisation process, C0Geometric capacitance of the cable, rsIs the inner radius of the cable shield, rcIs the cable core radius. The polarization and depolarization times are long enough to enable cable insulation diagnostics. Research shows that when the polarization time and the depolarization time are both about 100s, the insulation diagnosis of the cable can be effectively completed, and in order to improve the diagnosis efficiency, the polarization time and the depolarization time are both set to be 100 s.
Then, the dielectric response function f (t) can be calculated from the electrical conductivity of the high-voltage cable insulation:
in the formula ipolTo apply a polarization voltage to the high voltage cable the polarization current measured during polarization.
According to the invention, assuming that the analyzed high-voltage cable insulation medium is linear, uniform and isotropic, the repolarization rate χ of the medium can be obtained by performing Fourier transform on a medium response function f (t):
in the formula: omega is angular frequency; χ' is the real part of the repolarization rate of the insulating medium, which reflects the ability of the medium to confine charges; χ "is the imaginary component of the repolarization rate of the insulating medium, which reflects the loss of polarization.
The frequency domain expression of the polarization current is:
wherein ε is a relative dielectric constant, and U (ω) is a sine applied to an insulating medium in a frequency domainExcitation voltage, e ═ e '(ω) -j ∈ "(ω), and e' (ω) ═ e ∈ ″ (ω)∞+ χ' (ω) is the polarization,dielectric losses (including conduction losses and polarization losses), ε∞Is the optical frequency dielectric constant.
Thus, by definition
The low-frequency dielectric loss factor corresponding to the high-voltage cable applied with different polarization voltages can be calculated.
In the step S4, for an unused new cable, the low-frequency dielectric loss factor variation Δ tan δ (i.e., the characteristic quantity characterizing the insulation aging of the cable) corresponding to the th polarization voltage and the second polarization voltage is close to 0, and the characteristic quantity Δ tan δ linearly increases with the thermal aging of the cable, so that the characteristic quantity Δ tan δ is obtained by periodically performing the steps S1 to S3 on the cable to be tested, and the insulation aging degree of the high-voltage cable to be tested can be evaluated according to the obtained characteristic quantity.
Compared with the prior art, the method for evaluating the insulation aging of the 110kV XLPE high-voltage cable has the following beneficial effects:
1. the method comprises the steps of testing the polarization current and the depolarization current of the high-voltage cable in the polarization process and the depolarization process through the polarization-depolarization current (PDC), then obtaining the low-frequency dielectric loss factor under the corresponding polarization voltage according to the obtained polarization current and the depolarization current, and then evaluating the insulation performance of the high-voltage cable by taking the variation of the low-frequency dielectric loss factor under different polarization voltages as the characteristic quantity for representing the insulation aging of the cable.
2. The low-frequency dielectric loss factor variable quantity under different polarization voltages has better test stability, can more accurately reflect the insulation aging state of the high-voltage cable, and has higher sensitivity, so the method has extensive application prospect in the field of insulation aging diagnosis.
3. The invention has lower test voltage through polarization-depolarization current (PDC), and has smaller damage to the cable insulation compared with partial discharge test, voltage withstanding test and the like.
Drawings
FIG. 1 is a schematic diagram of the high voltage cable polarization-depolarization current test according to the present invention;
in the figure, 1-a high-voltage direct-current power supply, 2-a single-pole double-throw relay, 3-a current-limiting resistor, 4-a cable sample, 41-a shielding ring, 42-a cable copper layer, 5-a pico-meter and 6-an upper computer.
FIG. 2 is the low frequency dielectric loss factor tan delta versus polarization voltage for new XLPE cable and thermally aged XLPE cable samples.
FIG. 3 is the variation curve of the low frequency dielectric loss factor tan delta and the variation of the low frequency dielectric loss factor tan delta of the XLPE cable sample with the aging time.
Detailed Description
The present invention is described in detail below by way of examples, and it should be noted that this example is provided for steps only, but not for limiting the scope of the present invention, and that non-essential modifications and adaptations of the present invention will occur to those skilled in the art based on the foregoing description of the present invention.
Examples
In this example, 7 110kV XLPE 50cm short cable samples were selected to perform an accelerated thermal aging test, wherein 1 110kV XLPE 50cm short cable sample was used as a control, and the other cables were subjected to accelerated thermal aging for 10 days, 20 days, 30 days, 40 days, 50 days, and 60 days, respectively. In addition, 1 220kV XLPE high-voltage cable which runs for 12 years is selected for verification experiments.
The accelerated thermal aging experiment of the short cable sample is carried out by using a constant temperature and humidity aging box. The method comprises the following specific steps: and (3) putting the short cable sample into a constant-temperature constant-humidity aging box, setting the temperature and the humidity to be 130 ℃ and 0% respectively, and taking out the cable after continuously carrying out thermal aging for corresponding aging days.
And then carrying out polarization-depolarization current (PDC) test on 1 new cable, 6 cables after thermal aging and 1 retreating cable, wherein a test principle diagram is shown in figure 1, the test device comprises a high-voltage direct-current power supply 1, a single-pole double-throw relay 2, a current-limiting resistor 3, a pico-ampere meter 5 and an upper computer 6, the 1 end of the high-voltage direct-current power supply is connected with a contact a of the single-pole double-throw relay 2 through a lead, the end of the high-voltage direct-current power supply is connected with the 5 end of the pico-ampere meter through a lead, the end of the pico-ampere meter is connected with a cable copper layer 42 of a cable sample 4 through a lead, a switch of the single-pole double-throw relay 2 is connected with the current-limiting resistor 3 end through a lead, the end of the current-limiting resistor 3 is connected with a cable core of the cable sample 4, the contact b of the single-pole double-throw relay 2 and a shielding ring 41 of the cable sample 4 are grounded through leads, the high-voltage direct-current power supply 1, the single-pole double-throw relay 2 and the pico-ampere meter 5.
The process of testing the polarization-depolarization current of the cable sample by adopting the testing device comprises the steps of controlling the single-pole double-throw relay by the upper computer, applying polarization voltage (1kV, 2kV, 3kV, 4kV, 5kV and 6kV) to the cable sample by the high-voltage direct-current power supply to carry out the polarization process when the switch is connected to the contact a, and carrying out sections of polarization time t1(100s is taken in the embodiment), the single-pole double-throw relay is controlled to switch the switch blade to the contact b, the two ends of the insulating medium are grounded, the current limiting resistor discharges electricity to perform the depolarization process, and the depolarization duration time is t2(100s is taken in this example). The picoampere meter measures the polarization current and depolarization current during the polarization process and depolarization process, respectively.
According to the nyquist sampling theorem, the value range of ω is related to the current signal sampling rate. In this embodiment, the sampling rate is 1Hz, so ω is up to 0.5 Hz. Therefore, this embodiment calculates the dielectric loss tangent at 0.1 Hz. The electrical conductivity σ of the high-voltage cable insulation of the cable sample can be calculated using the equations (2) to (4) given above0The real part χ '(0.1Hz) and the imaginary part χ' (0.1Hz) of the repolarization rate of the insulating medium, and then the dielectric loss factor tan delta under the frequency of 0.1Hz is calculated according to the formula (1)0.1Hz。
Voltage of different polarizationTan delta of new cable and cable after 5 days of heat aging0.1HzThe variation is shown in figure 2. It is evident that the tan delta of the new cable0.1HzAnd does not change with the change of the polarization voltage. And the tan delta of the cable increases with the polarization voltage after thermal aging0.1HzAnd correspondingly increased. This is the theoretical basis for the present invention to use delta tan delta as a diagnostic criterion for aging.
Subsequently, the formula Δ tan δ ═ tan δ is used2-tanδ1And calculating the dielectric loss factor variation delta tan delta of the cable sample under different polarization voltages to evaluate the insulation aging state of the cable sample.
Table 1 shows the delta tan delta changes at different polarization voltage differences for cable samples that were heat aged for 5 days. As can be seen from Table 1, when the selected polarization voltage difference is 2kV, the variance of the delta tan delta value is significantly smaller than that when the polarization voltage difference is 1kV and 3kV, which indicates that the test result is stable. In addition, when the polarization voltage is too low, the polarization degree of the insulation medium of the high-voltage cable can be too low, so that the test result is influenced; when the polarization voltage is too high, a small amount of space charge injection may occur, and the test result is also affected. Therefore, the invention selects the tan delta obtained by testing under 4kV and 2kV polarization voltage0.1HzThe difference, tan delta, was further investigated as a function of insulation aging time.
TABLE 1 Low frequency (0.1Hz) dielectric loss factor variation at different polarization voltages for cable samples aged for 5 days
Dielectric loss factor tan delta of 0.1Hz of cable sample at 2kV polarization voltage0.1HzAnd a dielectric loss factor tan delta of 0.1Hz of the cable sample at 4kV and 2kV polarization voltages0.1HzThe difference Δ tan δ as a function of the cable insulation aging time is shown in fig. 3. The 0.1Hz dielectric loss factor tan delta and the variation delta tan delta of the new cable without aging treatment are close to 0. The 0.1Hz dielectric loss factor tan delta of the cable samples does not correlate positively with the degree of insulation aging with increasing heat aging time. And the 0.1Hz dielectric loss factor variation Delta of the cable sample with the increase of the thermal aging timetan δ exhibits a linear increase. Therefore, the dielectric loss factor variable delta tan delta of the high-voltage cable sample under the frequency of 0.1Hz can represent the characteristic quantity of cable insulation aging and is used for judging the aging state of the cable insulation aging, and the diagnosis accuracy and the diagnosis efficiency are greatly improved.
Taking 1 220kV XLPE high-voltage cable which runs for 12 years as an example, the insulation aging state of the 110kVXLPE high-voltage cable is diagnosed by combining the insulation aging evaluation method provided by the invention, and the method specifically comprises the following steps:
s1, measuring the polarization current of the high-voltage cable to be measured in the polarization process and the depolarization current of the high-voltage cable to be measured in the polarization process under 2kV and 4kV respectively; the polarization time and the depolarization time are respectively 100 s;
s2 calculating the dielectric loss factors of the low frequency signals corresponding to the th and second polarization voltages applied to the high voltage cable according to the following formula:
in the formula, σ0Conductivity, epsilon, for cable insulation0Is a vacuum dielectric constant of ∈∞In terms of optical frequency dielectric constant, ∈ '(ω) indicates polarization intensity, ∈ "(ω) indicates dielectric loss, χ' (ω) indicates the real part of the dielectric repolarization rate χ (ω), and χ" (ω) indicates the imaginary part of the dielectric repolarization rate χ (ω).
The electrical conductivity σ of the insulation of the high-voltage cable can be calculated using the equations (2) to (4) given above0The real part χ '(0.1Hz) and the imaginary part χ' (0.1Hz) of the repolarization rate of the insulating medium are calculated according to the formula (1) to obtain the 0.1Hz dielectric loss factor tan delta of the high-voltage cable0.1Hz。
Finally, tan delta is obtained by calculation1＝tanδ0.1Hz(2kV)＝3.9％，tanδ2＝tanδ0.1Hz(4kV)＝5.5％。
S3, acquiring low-frequency dielectric loss factor variation delta tan delta corresponding to 2kV polarization voltage and 4kV polarization voltage, and taking the low-frequency dielectric loss factor variation delta tan delta as a characteristic quantity delta tan delta for representing the insulation aging of the high-voltage cable.
Δtanδ＝tanδ2–tanδ1＝1.6％。
S4 evaluates the degree of insulation aging of the high-voltage cable based on the characteristic amount Δ tan δ.
From the foregoing analysis, it can be seen that the characteristic quantity Δ tan δ increases linearly with the thermal aging of the cable for high voltage power cables. Therefore, the variation trend of the characteristic quantity delta tan delta can be obtained for the cable to be tested at regular time according to the steps S1-S3, and then the insulation aging degree of the high-voltage cable to be tested can be evaluated according to the obtained characteristic quantity.
For the 220kV XLPE high-voltage cable which runs for 12 years, the calculated characteristic quantity delta tan delta is only 1.6 percent and is relatively small, which shows that the problem of insulation aging of the high-voltage cable is not great.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (5)
1, kinds of 110kV XLPE high-voltage cable insulation aging evaluation method, characterized by comprising the following steps:
s1, measuring the polarization current of the high-voltage cable to be measured in the polarization process and the depolarization current of the high-voltage cable to be measured in the polarization process under the th polarization voltage and the second polarization voltage respectively;
s2 calculating the dielectric loss factors of the low frequency signals corresponding to the th and second polarization voltages applied to the high voltage cable according to the following formula:
in the formula, σ0Conductivity, epsilon, for cable insulation0Is a vacuum dielectric constant of ∈∞The dielectric constant of optical frequency, [ epsilon ] ' (omega) is the polarization intensity, [ epsilon ] "(omega) is the dielectric loss, and chi ' (omega) is the real part of the complex polarization rate chi (omega) of the insulating medium, chi ' (omega)) Is the imaginary part of the repolarization rate x (omega) of the insulating medium;
s3, acquiring low-frequency dielectric loss factor variation delta tan delta corresponding to the th polarization voltage and the second polarization voltage, and taking the low-frequency dielectric loss factor variation delta tan delta as a characteristic quantity delta tan delta representing the insulation aging of the high-voltage cable, wherein the delta tan delta is equal to the tan delta2-tanδ1tanδ1、tanδ2The th polarized light beams are respectively polarized,
low frequency dielectric loss factors corresponding to the voltage and the second polarization voltage;
s4 evaluates the degree of insulation aging of the high-voltage cable based on the characteristic amount Δ tan δ.
2. The insulation aging evaluation method for the 110kV XLPE high-voltage cable according to claim 1, wherein the th polarization voltage ranges from 1kV to 4kV, and the second polarization voltage ranges from 3kV to 6 kV.
3. The insulation aging evaluation method for 110kV XLPE high-voltage cable according to claim 2, wherein the difference between the second polarization voltage and the th polarization voltage is 2 kV.
4. The insulation degradation assessment method for 110kV XLPE high-voltage cable according to any one of claims 1 to 3 and , wherein the conductivity of the insulation of the high-voltage cable is calculated by the following formula:
in the formula of U0For applying a polarizing voltage, epsilon, to high-voltage cables0Is a vacuum dielectric constant, ipol(tfinal) Representing a polarization current after applying a polarization voltage to the high voltage cable for a set time; i.e. idepol(tfinal) Indicating when the high voltage cable is set during depolarizationPost-intermittent depolarizing current, C0Geometric capacitance, r, for oil-paper insulationsIs the inner radius of the cable shield, rcIs the cable core radius.
5. The insulation aging evaluation method for 110kV XLPE high-voltage cable according to claim 4, wherein the repolarization rate χ (ω) of the insulation medium is calculated by the following formula:
wherein f (t) is a medium response function,
in the formula ipolTo apply a polarization voltage to the high voltage cable the polarization current measured during polarization.
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