CN110736493A - electrified aging test circuit based on temperature and humidity sensor - Google Patents

electrified aging test circuit based on temperature and humidity sensor Download PDF

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Publication number
CN110736493A
CN110736493A CN201911201817.4A CN201911201817A CN110736493A CN 110736493 A CN110736493 A CN 110736493A CN 201911201817 A CN201911201817 A CN 201911201817A CN 110736493 A CN110736493 A CN 110736493A
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China
Prior art keywords
temperature
test
humidity sensor
module
comparator
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CN201911201817.4A
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Chinese (zh)
Inventor
夏贤冲
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Foshan Chuandong Magnetoelectricity Co Ltd
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Foshan Chuandong Magnetoelectricity Co Ltd
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Priority to CN201911201817.4A priority Critical patent/CN110736493A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

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  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses an electrifying aging test circuit based on temperature and humidity sensors, which comprises a direct current voltage stabilization module and a test module, wherein the test module comprises a test interface, a signal detection unit and an LED drive unit, the test interface, the signal detection unit and the LED drive unit are all in power supply connection with the direct current voltage stabilization module, the test interface is used for being connected with the temperature and humidity sensors and inputting temperature signals and humidity signals, the signal detection unit is used for receiving the temperature signals and the humidity signals to detect and control the LED drive unit to work, the LED drive unit is used for displaying test results, and by means of the arrangement, testers can distinguish temperature and humidity sensors with abnormal work conveniently, and work efficiency is improved.

Description

electrified aging test circuit based on temperature and humidity sensor
Technical Field
The invention relates to the field of aging tests, in particular to electrified aging test circuits based on temperature and humidity sensors.
Background
The temperature and humidity sensor is a device or device capable of converting the temperature and humidity into electric signals which can be measured and processed easily, and the temperature and humidity sensor is widely applied to industries needing accurate temperature and humidity control, such as food, paper products, vegetable cultivation and the like.
At present, the common method indicates that a sensor is simply connected with a power supply for testing, whether temperature and humidity output signals are abnormal or not is not monitored, after the electrification and aging are completed, whether the temperature and humidity sensor can work normally or not cannot be judged, working procedures need to be tested again, and the problems of complexity and low efficiency in operation are caused.
It is seen that improvements and enhancements to the prior art are needed.
Disclosure of Invention
In view of the defects of the prior art, the invention aims to provide kinds of power-on aging test circuits based on temperature and humidity sensors, which aim to monitor output signals of the temperature and humidity sensors in real time, so as to distinguish whether the temperature and humidity sensors work normally and improve the working efficiency.
In order to achieve the purpose, the invention adopts the following technical scheme:
electrified aging test circuits based on temperature and humidity sensors comprise a direct current voltage stabilization module and a test module, wherein the test module comprises a test interface, a signal detection unit and an LED drive unit, the test interface, the signal detection unit and the LED drive unit are all in power supply connection with the direct current voltage stabilization module, the test interface is used for being connected with the temperature and humidity sensors and inputting temperature signals and humidity signals, the signal detection unit is used for receiving the temperature signals and the humidity signals to detect and control the LED drive unit to work, and the LED drive unit is used for displaying test results.
The power-on aging test circuit based on the temperature and humidity sensor comprises a signal detection unit and a power-on aging test unit, wherein the signal detection unit comprises an th comparator U2 and a second comparator U3, pins 3 of the th comparator U2 and the second comparator U3 are connected with a direct-current voltage stabilizing module through voltage dividing units, pins 5 of the th comparator U2 and the second comparator U3 are connected with the direct-current voltage stabilizing module, pins 2 of the th comparator U2 and the second comparator U3 are all grounded, pins 4 of the th comparator U2 are connected with a test interface and used for receiving temperature signals, and pin 1 of the th comparator U2 is used for outputting th control signals to an LED driving unit, and pin 4 of the th comparator U2 is connected with the test interface and used for receiving humidity signals.
The power-on aging test circuit based on the temperature and humidity sensor comprises an LED drive unit and a power-on aging test unit, wherein the LED drive unit comprises a triode Q1, a triode Q2, a light-emitting diode L1 and a light-emitting diode L2, the base of the triode Q1 is connected with a pin 1 of a comparator U2, the collector of the triode Q1 is connected with a direct-current voltage stabilizing module through a light-emitting diode L1, the emitter of the triode Q1 is grounded, the base of the triode Q2 is connected with a pin 1 of a second comparator U3, the collector of the triode Q2 is connected with the direct-current voltage stabilizing module through a light-emitting diode L2, the emitter of the triode Q is grounded, and the light.
The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the base electrode of the triode Q1 is connected with the pin 1 of the comparator U2 through a current-limiting resistor R4, and the base electrode of the triode Q2 is connected with the pin 1 of the comparator U3 through a current-limiting resistor R7.
The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the light emitting diode L1 is connected with the direct current voltage stabilizing module through a current limiting resistor R1; the light emitting diode L2 is connected with the DC voltage stabilizing module through a current limiting resistor R3.
The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the test modules are provided with a plurality of test modules, and the direct-current voltage stabilizing module is respectively in power supply connection with the plurality of test modules.
The power-on aging test circuit based on the temperature and humidity sensor comprises a direct-current voltage stabilizing module and a voltage stabilizing chip U1, wherein the Vin end of the voltage stabilizing chip U1 is connected with a filtering unit, the Vout end of the voltage stabilizing chip U1 is connected with a second filtering unit, and the GND end of the voltage stabilizing chip U1 is grounded.
The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the Vin end of the voltage stabilizing chip U1 is grounded through a diode D1, and the diode D1 is reversely connected.
PCB boards, printed with the above-mentioned temperature and humidity sensor-based power-on aging test circuit, the DC voltage stabilization module and the test module are connected by copper foil.
aging testing device comprises a circuit board, wherein the circuit board is provided with the power-on aging testing circuit based on the temperature and humidity sensor.
Has the advantages that:
compared with the prior art, the electrified aging test circuit based on the temperature and humidity sensor is provided, and by arranging the signal detection unit and the LED driving unit, the working of the LED driving unit is controlled and the working state of the temperature and humidity sensor is displayed by detecting whether the temperature signal and the humidity signal of the temperature and humidity sensor are abnormal, so that a tester can distinguish the temperature and humidity sensor which is abnormally worked conveniently, and the working efficiency is improved.
Drawings
Fig. 1 is a connection schematic diagram of kinds of power-on aging test circuits based on temperature and humidity sensors.
Fig. 2 is a schematic circuit diagram of the dc voltage stabilizing module according to the present invention.
FIG. 3 is a circuit diagram of the test interface according to the present invention.
Fig. 4 is a schematic circuit diagram of the signal detection unit and the LED driving unit according to the present invention.
The main element symbols show that 100-direct current voltage stabilizing module, 110- th filtering unit, 120-second filtering unit, 200-testing module, 210-testing interface, 220-signal detecting unit, 221-voltage dividing unit and 230-LED driving unit.
Detailed Description
In order to make the objects, technical solutions and effects of the present invention clearer and clearer, kinds of power-on aging test circuits based on temperature and humidity sensors are provided, and the present invention is described in detail below with reference to the accompanying drawings and by referring to embodiments .
In the description of the present invention, it should be noted that unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" shall be construed , and for example, they may be fixedly connected, detachably connected, or physically connected, mechanically connected, electrically connected or intercommunicated, directly connected, indirectly connected through an intermediate medium, connected between two elements, or in an interactive relationship between two elements.
Referring to fig. 1, the invention provides kinds of power-on aging test circuits based on temperature and humidity sensors, which include a dc voltage stabilization module 100 and a test module 200, where the test module 200 includes a test interface 210, a signal detection unit 220, and an LED driving unit 230, the test interface 210, the signal detection unit 220, and the LED driving unit 230 are all in power supply connection with the dc voltage stabilization module 100, the test interface 210 is used for being connected with the temperature and humidity sensors and inputting temperature signals and humidity signals, the signal detection unit 220 is used for receiving the temperature signals and the humidity signals to detect and control the LED driving unit 230 to operate, and the LED driving unit 230 is used for displaying test results.
Referring to fig. 1, the test interface 210 includes a terminal T1, a terminal RH1, a terminal VCC, and a terminal GND; when the temperature and humidity sensor is connected to the test interface 210, the T1 terminal outputs a temperature signal, the RH1 terminal outputs a humidity signal, the VCC terminal is connected to the voltage stabilization dc module, and is configured to provide a working voltage for the temperature and humidity sensor, and the GND terminal is grounded; and the VCC terminal thereof is connected to the GND terminal through the capacitor C5.
In practical application, the temperature and humidity sensor to be tested is inserted into the test interface 210, and is kept powered on to perform the aging test. Meanwhile, the signal detection unit 220 detects whether the temperature signal and the humidity signal of the temperature and humidity sensor are normal in real time, and when the temperature signal and the humidity signal are normal, the signal detection unit 220 controls the LED driving unit 230 to keep the LED in a lighting state; when the temperature signal and the humidity signal are abnormal, the LED driving unit 230 turns off the LEDs. Through the arrangement, the temperature and humidity sensor with abnormal work can be distinguished by a tester, and the working efficiency is improved.
Referring to fig. 4, in some embodiments, the signal detection unit 220 includes an th comparator U2 and a second comparator U3, wherein pins 3 of the th comparator U2 and the second comparator U3 are both connected to the dc regulator module 100 through a voltage divider 221, pins 5 of the th comparator U2 and the second comparator U3 are both connected to the dc regulator module 100, pins 2 of the 3583 th comparator U2 are both connected to the test interface 210 for receiving a temperature signal, pin 1 of the th comparator U2 is used for outputting a th control signal to the LED driving unit 230, pin 4 of the th comparator U2 is connected to the test interface 210 for receiving a humidity signal, and pin 1 of the th comparator U2 is used for outputting a second control signal to the LED driving unit 230.
It should be noted that, the pin 3 of the th comparator U2 inputs a voltage for comparison, and the pin 5 thereof is used for supplying power to the th comparator U2.
Specifically, referring to fig. 4, in the present embodiment, the voltage dividing unit 221 includes a voltage dividing resistor R2, a voltage dividing resistor R5, and a voltage dividing resistor R6, wherein a end of the voltage dividing resistor R2 is connected to the dc voltage stabilizing module 100, and another end is connected to the 3-pin of the -th comparator U2, and further connected to the 3-pin of the second comparator U3 through the voltage dividing resistor R6, and the voltage dividing resistor R5 is grounded.
Through the arrangement, a temperature signal is input into the th comparator U2, when the voltage of the temperature signal reaches a set voltage range, high-level control signals are generated, otherwise, low-level control signals are generated, the working principle of the second comparator U3 is the same as that of the first comparator U3, in production, the temperature and humidity sensor is usually tested in an aging chamber which maintains constant temperature and humidity, therefore, the voltage of an output signal of the temperature and humidity sensor in a normal working state is constant, and when the voltage of the output signal changes, the working abnormality of the temperature and humidity sensor can be judged, so that the LED driving unit 230 is controlled to work through the control signals, whether the working of the temperature and humidity sensor is normal or not is indicated, the distinguishing of testers is facilitated, and the working efficiency is.
The model of the comparator U2 and the model of the second comparator U3 can be selected from LMV721 as , and other voltage comparators can be selected without being limited to the models.
Referring to fig. 4, in , in some embodiments, the LED driving unit 230 includes a transistor Q1, a transistor Q2, a light emitting diode L1, and a light emitting diode L2, wherein a base of the transistor Q1 is connected to pin 1 of the comparator U2, a collector thereof is connected to the dc regulator module 100 through a light emitting diode L1, an emitter thereof is grounded, a base of the transistor Q2 is connected to pin 1 of the second comparator U3, a collector thereof is connected to the dc regulator module 100 through a light emitting diode L2, an emitter thereof is grounded, and the light emitting diode L1 and the light emitting diode L2 are both connected in a positive manner.
Through the arrangement, the th comparator U2 outputs a th control signal to the base of the triode Q1, if the th control signal is a high-level signal, the triode Q1 is conducted, the light-emitting diode L1 lights up, if the 38th control signal is a low-level signal, the triode Q1 is cut off, the light-emitting diode L1 is extinguished, whether the working state of the temperature and humidity sensor is abnormal or not is judged through the on-off of the light-emitting diode L1, and the working principle of the triode Q2 is the same as the above.
, the base of the transistor Q1 is connected with the pin 1 of the th comparator U2 through a current limiting resistor R4, the base of the transistor Q2 is connected with the pin 1 of the th comparator U3 through a current limiting resistor R7, and the transistor Q1 and the transistor Q2 are protected by the current limiting resistor, so that the transistor Q1 and the transistor Q2 are prevented from being burnt due to overlarge current.
Preferably, , the light emitting diode L1 is connected with the DC regulator module 100 through a current limiting resistor R1, the light emitting diode L2 is connected with the DC regulator module 100 through a current limiting resistor R3, and the current limiting resistor is arranged to protect the light emitting diode L1 and the light emitting diode L2 from being burnt due to excessive current.
In some embodiments, the test modules 200 are provided with a plurality of test modules 200, the dc regulator module 100 is respectively connected to the plurality of test modules 200 for power supply, and each test module 200 can test temperature and humidity sensors, thereby implementing a batch burn-in test.
Referring to fig. 2, in some embodiments, the dc regulator module 100 includes a regulator chip U1, a Vin terminal of the regulator chip U1 is connected to the th filtering unit 110, a Vout terminal thereof is connected to the second filtering unit 120, and a GND terminal thereof is grounded, and when the dc regulator module is in operation, a dc power is connected from the Vin terminal, and the th filtering unit 110 and the second filtering unit 120 are used for filtering ripples in a dc power.
Specifically, in this embodiment, the -th filtering unit 110 is configured as a filtering capacitor C1, the Vin terminal of the voltage-stabilizing chip U1 is grounded through the filtering capacitor C1, the second filtering unit 120 includes a filtering capacitor C2, a filtering capacitor C3 and a filtering capacitor C4 which are connected in parallel, and the Vout terminal of the voltage-stabilizing chip U1 is grounded through the filtering capacitor C2.
, in this embodiment, the Vin terminal of the regulator chip U1 is grounded through the diode D1, and the diode D1 is reversely connected, so that when the voltage input to the Vin terminal of the regulator chip U1 is too large, the diode D1 is broken down, and the resistance of the broken-down diode D1 approaches 0 resistance, so that the regulator chip U1 is short-circuited, thereby performing an overvoltage protection function.
preferable types of the voltage stabilizing chip U1 can be selected from AMS1117-5.0, and 5V direct current voltage is output in a voltage stabilizing mode, and the voltage stabilizing chip is not limited to the type and can also be selected from other types of 5V direct current voltage stabilizing chips.
The invention also provides PCBs, wherein the power-on aging test circuit based on the temperature and humidity sensor is printed on the PCBs, the direct-current voltage stabilizing module 100 and the test module 200 are in copper foil connection, and the power-on aging test circuit based on the temperature and humidity sensor is described in detail above and is not repeated herein.
The invention also provides aging test devices, which comprise a circuit board, wherein the circuit board is provided with the electrified aging test circuit based on the temperature and humidity sensor, and the electrified aging test circuit based on the temperature and humidity sensor is described in detail above and is not repeated herein.
It should be understood that equivalents and modifications of the technical solution and inventive concept thereof may occur to those skilled in the art, and all such modifications and alterations should fall within the protective scope of the present invention.

Claims (10)

  1. The power-on aging test circuit based on the temperature and humidity sensors is characterized by comprising a direct-current voltage stabilization module and a test module, wherein the test module comprises a test interface, a signal detection unit and an LED drive unit, the test interface, the signal detection unit and the LED drive unit are all in power supply connection with the direct-current voltage stabilization module, the test interface is used for being connected with the temperature and humidity sensors and inputting temperature signals and humidity signals, the signal detection unit is used for receiving the temperature signals and the humidity signals to detect and control the LED drive unit to work, and the LED drive unit is used for displaying test results.
  2. 2. The power-on aging test circuit based on the temperature and humidity sensor as claimed in claim 1, wherein the signal detection unit comprises th comparators U2 and U3, wherein 3 pins of the th comparators U2 and U3 are connected with the DC voltage stabilization module through voltage division units, 5 pins of the th comparators U2 and U3 are connected with the DC voltage stabilization module, 2 pins of the th comparators U2 are connected with the test interface for receiving temperature signals, 1 pin of the th comparator U2 is used for outputting th control signals to the LED driving unit, and 4 pins of the th comparator U2 are connected with the test interface for receiving humidity signals, and 1 pin of the th comparator U2 is used for outputting second control signals to the LED driving unit.
  3. 3. The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the LED driving unit comprises a triode Q1, a triode Q2, a light emitting diode L1 and a light emitting diode L2, the base of the triode Q1 is connected with pin 1 of a comparator U2 of a No. , the collector of the triode Q1 is connected with the direct current voltage stabilizing module through the light emitting diode L1, the emitter of the triode Q2 is grounded, the base of the triode Q2 is connected with pin 1 of a second comparator U3, the collector of the triode Q2 is connected with the direct current voltage stabilizing module through the light emitting diode L368632, the emitter of the triode Q2 is grounded, and the light emitting diode L1 and the light emitting diode L2 are both in positive connection.
  4. 4. The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the base of the triode Q1 is connected with pin 1 of a th comparator U2 through a current limiting resistor R4, and the base of the triode Q2 is connected with pin 1 of a th comparator U3 through a current limiting resistor R7.
  5. 5. The power-on aging test circuit based on the temperature and humidity sensor as claimed in claim 4, wherein the light emitting diode L1 is connected with the DC voltage stabilizing module through a current limiting resistor R1; the light emitting diode L2 is connected with the DC voltage stabilizing module through a current limiting resistor R3.
  6. 6. The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the test modules are provided with a plurality of modules, and the direct-current voltage stabilizing module is respectively in power supply connection with the plurality of test modules.
  7. 7. The power-on aging test circuit based on the temperature and humidity sensor is characterized in that the direct-current voltage stabilizing module comprises a voltage stabilizing chip U1, wherein the Vin end of the voltage stabilizing chip U1 is connected with the filtering unit, the Vout end of the voltage stabilizing chip U1 is connected with the second filtering unit, and the GND end of the voltage stabilizing chip U1 is grounded.
  8. 8. The power-on aging test circuit based on the temperature and humidity sensor, according to claim 7, wherein the Vin terminal of the voltage regulation chip U1 is further grounded through a diode D1, and the diode D1 is reversely connected.
  9. The PCB board of claim 9 or , wherein the PCB board is printed with the power-on aging test circuit based on the temperature and humidity sensor as claimed in any of claims 1 to 8, and the DC voltage stabilizing module and the test module are connected by copper foil.
  10. 10, kinds of aging testing device, characterized by comprising a circuit board, wherein the circuit board is provided with the power-on aging testing circuit based on temperature and humidity sensor as claimed in any of claims 1-8.
CN201911201817.4A 2019-11-29 2019-11-29 electrified aging test circuit based on temperature and humidity sensor Pending CN110736493A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911201817.4A CN110736493A (en) 2019-11-29 2019-11-29 electrified aging test circuit based on temperature and humidity sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911201817.4A CN110736493A (en) 2019-11-29 2019-11-29 electrified aging test circuit based on temperature and humidity sensor

Publications (1)

Publication Number Publication Date
CN110736493A true CN110736493A (en) 2020-01-31

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911201817.4A Pending CN110736493A (en) 2019-11-29 2019-11-29 electrified aging test circuit based on temperature and humidity sensor

Country Status (1)

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CN (1) CN110736493A (en)

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