CN110702256A - Automatic calibration method and system based on thermistor temperature sensor acquisition equipment - Google Patents

Automatic calibration method and system based on thermistor temperature sensor acquisition equipment Download PDF

Info

Publication number
CN110702256A
CN110702256A CN201910930897.0A CN201910930897A CN110702256A CN 110702256 A CN110702256 A CN 110702256A CN 201910930897 A CN201910930897 A CN 201910930897A CN 110702256 A CN110702256 A CN 110702256A
Authority
CN
China
Prior art keywords
temperature
resistance value
fitting
acquisition equipment
function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910930897.0A
Other languages
Chinese (zh)
Other versions
CN110702256B (en
Inventor
林宇翔
陈果
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangzhou Wenxinyun Technology Co Ltd
Original Assignee
Guangzhou Wenxinyun Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangzhou Wenxinyun Technology Co Ltd filed Critical Guangzhou Wenxinyun Technology Co Ltd
Priority to CN201910930897.0A priority Critical patent/CN110702256B/en
Publication of CN110702256A publication Critical patent/CN110702256A/en
Application granted granted Critical
Publication of CN110702256B publication Critical patent/CN110702256B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/005—Calibration

Abstract

The invention discloses an automatic calibration method based on thermistor temperature sensor acquisition equipment, which comprises the following steps: taking data of the n temperature sections to form a sensor resistance value temperature corresponding table; the relay module of the n relays is used for connecting the n fixed resistors; the calibration control equipment controls the relay module to open the mth relay to communicate with the corresponding mth resistor according to the instruction of the acquisition equipment; the collecting equipment collects the communicated mth resistance value and records the collected collecting resistance value of the mth resistance, the mth resistance value and the temperature; acquiring the temperature samplerT corresponding to the resistance value after acquiring the n resistors to form an acquisition equipment resistance value temperature corresponding table; and the acquisition equipment transmits the acquired samplerT to the calibration control equipment to calculate and store the fitting parameters, and the calibration is completed. The invention has low requirement on the environment temperature by using the resistor for calibration, saves time and has low cost.

Description

Automatic calibration method and system based on thermistor temperature sensor acquisition equipment
Technical Field
The invention relates to the field of calibration of acquisition equipment, in particular to an automatic calibration method and system based on acquisition equipment of a thermistor temperature sensor.
Background
When the thermistor temperature sensor acquisition equipment (hereinafter referred to as "acquisition equipment") is produced, the accuracy of each acquisition equipment may be insufficient due to the fact that the accuracy of purchased electronic components is insufficient. The current methods for calibrating the acquisition equipment include:
1. in order to save time and cost, the thermostat calibration method simulates the real environment of a temperature sensor placed in a thermostat by switching different fixed resistors through a relay, and is characterized in that the thermostat calibration method is realized by soaking the temperature sensors in a plurality of thermostats through a plurality of temperature sensors and respectively collecting different thermostat temperature sensors. When a large amount of acquisition equipment is produced, a large amount of time is needed by an incubator calibration method, the environmental temperature required to be calibrated is stable, a large amount of incubators are needed to be used for calibration, and the cost is high.
2. The traditional calibration mode is that after data are acquired by thermistor temperature sensor acquisition equipment, a tool is manually used for calculating fitting parameters, and then the parameters are set to the temperature sensor acquisition equipment. In order to realize automatic calibration, a fitting parameter algorithm is integrated into calibration control equipment, and the temperature sensor acquisition equipment mainly transmits acquired resistance values and temperature values to the calibration control equipment to obtain fitting parameters so as to achieve an automatic calibration process.
3. The number of traditional fitting parameters is fixed, and when the rule of data to be fitted is complex, good fitting cannot be achieved. In order to fit more accurately by using a method of an indefinite parameter, the number of parameters can be designated at will theoretically.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide an automatic calibration method based on thermistor temperature sensor acquisition equipment.
The invention also aims to provide an automatic calibration system based on the acquisition equipment of the thermistor temperature sensor.
The purpose of the invention is realized by the following technical scheme:
the automatic calibration method based on the thermistor temperature sensor acquisition equipment comprises the following steps:
the method comprises the following steps that firstly, data of a corresponding relation between a resistance value and temperature measured by a high-precision temperature sensor manufacturer are adopted, and data realRT of n temperature sections are taken to form a sensor resistance value temperature corresponding table;
secondly, connecting n fixed resistors by using relay modules of n relays, wherein the resistance values of the n resistors are n resistance values in a sensor resistance value temperature corresponding table; n is more than or equal to 1;
thirdly, the calibration control equipment controls the relay module to open the mth relay according to the instruction of the acquisition equipment to communicate with the corresponding mth resistor, wherein m is less than or equal to n;
fourthly, the collecting equipment collects the resistance value of the m resistor and records the temperature corresponding to the m resistor;
and step five, judging whether n resistors are acquired: if the collection is not finished, repeating the second step; acquiring the temperature samplerT corresponding to the resistance value after the acquisition is finished to form an acquisition equipment resistance value temperature corresponding table;
sixthly, the acquisition equipment transmits the acquired sampleRT to calibration control equipment to calculate a fitting parameter; the fitting parameter calculation method is as follows:
(1) processing the resistance value;
(2) normalizing the temperature;
(3) converting the normalized temperature to degrees centigrade;
(4) because the nonlinear relation between the collected resistance value and the temperature is approximate to a high-order polynomial, a fitting function is defined, and a partial derivative function is solved for each coefficient of the fitting function and simplified; writing the partial derivative function into a matrix multiplication form to form a linear equation set; solving a linear equation set by using a Gaussian elimination method to obtain fitting parameters; substituting the fitting parameters into a fitting function to obtain a normalized temperature value, and converting the normalized temperature into the centigrade degree;
and seventhly, storing the fitting parameters by the acquisition equipment, and completing calibration.
In the step (1), the processing of the resistance value is specifically performed by the following formula:
xi＝ln(sri/baseR)，
where ln is a natural logarithmic function, sriFor the ith resistance value collected, baseR is a constant value (constant value is 30), xiIs sriI is more than or equal to 1 and less than or equal to n after processing; processing all the acquisition resistance values in the acquisition equipment resistance value temperature corresponding table into a set x ═ x (x)1,x2,...,xn). The collected resistance value is processed to reduce the calculation amount of the following data for exponential operation.
In the step (2), the temperature normalization is specifically performed by the following formula:
yi＝1.0/(ti-az)，
wherein, tiAt the ith temperature value, az is absolute zero-273.15, yiIs tiThe normalized numerical value is that i is more than or equal to 1 and less than or equal to n; after temperature normalization, the set y is (y)1,y2,...,yn). The temperature normalization is to reduce the amount of operation of exponential operation on the following data.
In the step (3), the normalized temperature is converted to the centigrade degree by the following formula:
ti＝1.0/fyi+az,
wherein, tiAt the ith temperature value, az is absolute zero-273.15, fyiIs the normalized temperature after the ith fit.
The step (4) is specifically as follows:
A. since the nonlinear relation between the collected resistance value and the temperature is approximate to a polynomial of high degree, a fitting function is defined
Figure BDA0002220243190000031
Wherein, fyiK +1 is the number of fitting coefficients, k is more than or equal to 2, and the set a is (a)0,a1,...,ak) As a function of the fitting coefficient, error function
Figure BDA0002220243190000032
B. For the optimization of the fitting function, each coefficient (a) of the function is evaluated0,a1,a2...ak) Derivation of a partial derivative function, i.e.
Figure BDA0002220243190000041
Figure BDA0002220243190000042
Figure BDA0002220243190000043
...
C. Simplifying partial derivative functions
Figure BDA0002220243190000045
Figure BDA0002220243190000047
...
Figure BDA0002220243190000048
D. The partial derivative function is written in the form of matrix multiplication, and all the coefficients containing only X are written in the form of matrix X, i.e.
Figure BDA0002220243190000049
Writing the polynomial coefficients to be solved as a matrix A, i.e.
Figure BDA00022202431900000410
Writing coefficients containing Y as a matrix Y, i.e.
Figure BDA0002220243190000051
At this time, the above matrices X, A, Y are multiplied by the write matrix, i.e.
XA＝Y；
E. Solving a linear equation set by using a Gaussian elimination method, wherein X and Y are known numbers, A is an unknown number, and solving the linear equation set to obtain a matrix A, namely a fitting parameter;
F. solving A matrix (a) of the equation system0,a1,a2...ak) Substituting fitting function
Figure BDA0002220243190000052
The normalized temperature value can be obtained and then the function t is passedi＝1.0/fyiThe + az is calculated to obtain the actual temperature value.
The fitting parameter calculation method further includes a verification step of:
verifying the calculation result of the fitting parameters, and obtaining the collecting resistance value sr through experimentsiAn experimental resistance value temperature corresponding table corresponding to the temperature;
when k +1 is 3, the fitting function is f (x)i)＝a0+a1xi+a2xi 2,
a0＝0.0032223027669568386
a1＝0.00029245873274454104
a2＝-0.00023211054460076097
Substituting the collected resistance value column of the experimental resistance value temperature mapping table into a fitting function to obtain a temperature [ 34.0290308334.9203145836.0888996636.96170087 ];
when k +1 is 5, the fitting function is f (x)i)＝a0+a1xi+a2xi 2+a3xi 3+a4xi 4Solving the equation to obtain
a0＝0.00321888069978578
a1＝0.0007768905773277712
a2＝-0.015012867491954338
a3＝0.15700245412736596
a4＝-0.5424752185849551
Substituting the collected resistance value column of the experimental resistance value temperature mapping table into a fitting function to obtain a temperature [ 34353637 ];
from the above verification, it is found that the more the fitting parameters are, the closer the values calculated by the fitting function are to the true temperatures, and the more the fitting parameters are theoretically infinite by the above method.
The other purpose of the invention is realized by the following technical scheme:
the automatic calibration system based on the thermistor temperature sensor acquisition equipment comprises calibration control equipment and a relay module, wherein the calibration control equipment calibrates the resistance value of the acquisition equipment, and simultaneously controls the relay module to be opened and closed according to the instruction of the acquisition equipment.
Compared with the prior art, the invention has the following advantages and beneficial effects:
the invention uses high-precision resistor components with different resistance values to simulate the environment of the temperature sensor in different thermostats. The advantages are as follows: firstly, the resistance value of the resistor is fixed and the process of constant temperature of the constant temperature box is not needed, so that the time is saved; secondly, the requirement on the environment temperature for calibrating by using the resistor is not high; thirdly, the cost is low.
Drawings
Fig. 1 is a hardware frame diagram corresponding to an automatic calibration method for a thermistor temperature sensor-based acquisition device according to the present invention.
Fig. 2 is a schematic working diagram of an automatic calibration method based on a thermistor temperature sensor acquisition device according to the present invention.
Wherein the reference numerals have the following meanings:
1-first relay, 2-second relay, 3-third relay, 4-first resistor, 5-second resistor, 6-third resistor.
Detailed Description
The present invention will be described in further detail with reference to examples and drawings, but the present invention is not limited thereto.
As shown in fig. 1, the automatic calibration system based on the acquisition device of the thermistor temperature sensor comprises a calibration control device and a relay module, wherein the calibration control device calibrates the resistance value of the acquisition device (the acquisition device of the thermistor temperature sensor), and the calibration control device controls the relay module to be turned on and off according to the instruction of the acquisition device.
As shown in fig. 2, the automatic calibration method based on the thermistor temperature sensor acquisition device includes the following steps:
the method comprises the following steps that firstly, data of a corresponding relation between a resistance value and temperature measured by a high-precision temperature sensor manufacturer are adopted, and data realRT of n temperature sections are taken to form a sensor resistance value temperature corresponding table; the sensor resistance temperature correspondence table is shown in table 1:
TABLE 1
Serial number Resistance r (K omega) Temperature t (. degree. C.)
1 34.158 34
2 32.774 35
... ... ...
n 24.647 42
Secondly, connecting n fixed resistors by using relay modules of n relays, wherein the resistance values of the n resistors are n resistance values in a sensor resistance value temperature corresponding table; n is more than or equal to 1;
thirdly, the calibration control equipment controls the relay module to open the mth relay according to the instruction of the acquisition equipment to communicate with the corresponding mth resistor, wherein m is less than or equal to n;
fourthly, the collecting equipment collects the resistance value of the m resistor and records the temperature corresponding to the m resistor;
and step five, judging whether n resistors are acquired: if the collection is not finished, repeating the second step; acquiring the temperature samplerT corresponding to the resistance value after the acquisition is finished to form an acquisition equipment resistance value temperature corresponding table; the resistance value and temperature correspondence table of the acquisition equipment is shown in table 2:
TABLE 2
Serial number Collecting resistance sr (K omega) Temperature t (. degree. C.)
1 34.2 34
2 32.9 35
... ... ...
n 24.8 42
Sixthly, the acquisition equipment transmits the acquired sampleRT to calibration control equipment to calculate a fitting parameter; the fitting parameter calculation method is as follows:
(1) processing the resistance value;
(2) normalizing the temperature;
(3) converting the normalized temperature to degrees centigrade;
(4) because the nonlinear relation between the collected resistance value and the temperature is approximate to a high-order polynomial, a fitting function is defined, and a partial derivative function is solved for each coefficient of the fitting function and simplified; writing the partial derivative function into a matrix multiplication form to form a linear equation set; solving a linear equation set by using a Gaussian elimination method to obtain fitting parameters; substituting the fitting parameters into a fitting function to obtain a normalized temperature value, and converting the normalized temperature into the centigrade degree;
and seventhly, storing the fitting parameters by the acquisition equipment, and completing calibration.
In the step (1), the processing of the resistance value is specifically performed by the following formula:
xi＝ln(sri/baseR)，
where ln is a natural logarithmic function, sriIs the i-th resistance value collected, baseR is a constant value (constant value 30), xiIs sriI is more than or equal to 1 and less than or equal to n after processing; processing all the acquisition resistance values in the acquisition equipment resistance value temperature corresponding table into a set x ═ x (x)1,x2,...,xn). The collected resistance value is processed to reduce the calculation amount of the following data for exponential operation.
In the step (2), the temperature normalization is specifically performed by the following formula:
yi＝1.0/(ti-az)，
wherein, tiAt the ith temperature value, az is absolute zero-273.15, yiIs tiThe normalized numerical value is that i is more than or equal to 1 and less than or equal to n; after temperature normalization, the set y is (y)1,y2,...,yn). The temperature normalization is to reduce the amount of operation of exponential operation on the following data.
In the step (3), the normalized temperature is converted to the centigrade degree by the following formula:
ti＝1.0/fyi+az,
wherein, tiAt the ith temperature value, az is absolute zero-273.15, fyiIs the normalized temperature after the ith fit.
The step (4) is specifically as follows:
A. since the nonlinear relation between the collected resistance value and the temperature is approximate to a polynomial of high degree, a fitting function is defined
Figure BDA0002220243190000091
Wherein, fyiK +1 is the number of fitting coefficients, k is more than or equal to 2, and the set a is (a)0,a1,...,ak) As a function of the fitting coefficient, error function
Figure BDA0002220243190000092
B. For the optimization of the fitting function, each coefficient (a) of the function is evaluated0,a1,a2...ak) Derivation of a partial derivative function, i.e.
Figure BDA0002220243190000093
Figure BDA0002220243190000095
...
Figure BDA0002220243190000101
C. Simplifying partial derivative functions
Figure BDA0002220243190000102
Figure BDA0002220243190000103
Figure BDA0002220243190000104
...
D. The partial derivative function is written in the form of matrix multiplication, and all the coefficients containing only X are written in the form of matrix X, i.e.
Writing the polynomial coefficients to be solved as a matrix A, i.e.
Figure BDA0002220243190000107
Writing coefficients containing Y as a matrix Y, i.e.
Figure BDA0002220243190000108
At this time, the above matrices X, A, Y are multiplied by the write matrix, i.e.
XA＝Y；
E. Solving a linear equation set by using a Gaussian elimination method, wherein X and Y are known numbers, A is an unknown number, and solving the linear equation set to obtain a matrix A, namely a fitting parameter;
F. solving A matrix (a) of the equation system0,a1,a2...ak) Substituting fitting function
Figure BDA0002220243190000111
The normalized temperature value can be obtained and then the function t is passedi＝1.0/fyiThe + az is calculated to obtain the actual temperature value.
The fitting parameter calculation method further includes a verification step of:
verifying the calculation result of the fitting parameters, and obtaining the collecting resistance value sr through experimentsiAn experimental resistance value temperature corresponding table corresponding to the temperature; the temperature mapping table of the experimental resistance values is shown in table 3:
TABLE 3
Serial number Collecting resistance sr (K omega) Temperature t (. degree. C.)
1 34.2 34
2 32.9 35
3 31.4 36
4 30.4 37
When k +1 is 3, the fitting function is f (x)i)＝a0+a1xi+a2xi 2,
a0＝0.0032223027669568386
a1＝0.00029245873274454104
a2＝-0.00023211054460076097
Substituting the collected resistance value column of the experimental resistance value temperature mapping table into a fitting function to obtain a temperature [ 34.0290308334.9203145836.0888996636.96170087 ];
when k +1 is 5, the fitting function is f (x)i)＝a0+a1xi+a2xi 2+a3xi 3+a4xi 4Solving the equation to obtain
a0＝0.00321888069978578
a1＝0.0007768905773277712
a2＝-0.015012867491954338
a3＝0.15700245412736596
a4＝-0.5424752185849551
Substituting the collected resistance value column of the experimental resistance value temperature mapping table into a fitting function to obtain a temperature [ 34353637 ];
from the above verification, it is found that the more the fitting parameters are, the closer the values calculated by the fitting function are to the true temperatures, and the more the fitting parameters are theoretically infinite by the above method.
The above embodiments are preferred embodiments of the present invention, but the present invention is not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention should be construed as equivalents thereof, and all such changes, modifications, substitutions, combinations, and simplifications are intended to be included in the scope of the present invention.

Claims (7)

1. The automatic calibration method based on the thermistor temperature sensor acquisition equipment is characterized by comprising the following steps of:
the method comprises the following steps that firstly, data of a corresponding relation between a resistance value and temperature measured by a high-precision temperature sensor manufacturer are adopted, and data realRT of n temperature sections are taken to form a sensor resistance value temperature corresponding table;
secondly, connecting n fixed resistors by using relay modules of n relays, wherein the resistance values of the n resistors are n resistance values in a sensor resistance value temperature corresponding table; n is more than or equal to 1;
thirdly, the calibration control equipment controls the relay module to open the mth relay according to the instruction of the acquisition equipment to communicate with the corresponding mth resistor, wherein m is less than or equal to n;
fourthly, the collecting equipment collects the resistance value of the m resistor and records the temperature corresponding to the m resistor;
and step five, judging whether n resistors are acquired: if the collection is not finished, repeating the second step; acquiring the temperature samplerT corresponding to the resistance value after the acquisition is finished to form an acquisition equipment resistance value temperature corresponding table;
sixthly, the acquisition equipment transmits the acquired sampleRT to calibration control equipment to calculate a fitting parameter; the fitting parameter calculation method is as follows:
(1) processing the resistance value;
(2) normalizing the temperature;
(3) converting the normalized temperature to degrees centigrade;
(4) because the nonlinear relation between the collected resistance value and the temperature is approximate to a high-order polynomial, a fitting function is defined, and a partial derivative function is solved for each coefficient of the fitting function and simplified; writing the partial derivative function into a matrix multiplication form to form a linear equation set; solving a linear equation set by using a Gaussian elimination method to obtain fitting parameters; substituting the fitting parameters into a fitting function to obtain a normalized temperature value, and converting the normalized temperature into the centigrade degree;
and seventhly, storing the fitting parameters by the acquisition equipment, and completing calibration.
2. The automatic calibration method based on the thermistor temperature sensor acquisition equipment according to claim 1, characterized in that in step (1), the processing of the resistance value is specifically performed by the following formula:
xi＝ln(sri/baseR)，
where ln is a natural logarithmic function, sriFor the ith resistance value collected, baseR is a constant value, xiIs sriI is more than or equal to 1 and less than or equal to n after processing; processing all the acquisition resistance values in the acquisition equipment resistance value temperature corresponding table into a set x ═ x (x)1,x2,...,xn)。
3. The method for automatically calibrating the acquisition equipment based on the thermistor temperature sensor according to claim 1, wherein in the step (2), the temperature normalization is specifically performed by the following formula:
yi＝1.0/(ti-az)，
wherein, tiAt the ith temperature value, az is absolute zero-273.15, yiIs tiThe normalized numerical value is that i is more than or equal to 1 and less than or equal to n; after temperature normalization, the set y is (y)1,y2,...,yn)。
4. The method for automatically calibrating a thermistor temperature sensor-based acquisition device according to claim 1, characterized in that in step (3), the conversion of the normalized temperature into degrees celsius is specifically performed by the following formula:
ti＝1.0/fyi+az,
wherein, tiAt the ith temperature value, az is absolute zero-273.15, fyiIs the normalized temperature after the ith fit.
5. The automatic calibration method based on the thermistor temperature sensor acquisition equipment according to claim 1, characterized in that the step (4) is as follows:
A. since the nonlinear relation between the collected resistance value and the temperature is approximate to a polynomial of high degree, a fitting function is defined
Figure FDA0002220243180000021
Wherein, fyiK +1 is the number of fitting coefficients, k is more than or equal to 2, and the set a is (a)0,a1,...,ak) As a function of the fitting coefficient, error function
Figure FDA0002220243180000022
B. For the optimization of the fitting function, each coefficient (a) of the function is evaluated0,a1,a2...ak) Derivation of a partial derivative function, i.e.
Figure FDA0002220243180000023
Figure FDA0002220243180000024
Figure FDA0002220243180000025
...
C. Simplifying partial derivative functions
Figure FDA0002220243180000031
Figure FDA0002220243180000032
...
Figure FDA0002220243180000034
D. The partial derivative function is written in the form of matrix multiplication, and all the coefficients containing only X are written in the form of matrix X, i.e.
Figure FDA0002220243180000035
Writing the polynomial coefficients to be solved as a matrix A, i.e.
Figure FDA0002220243180000036
Writing coefficients containing Y as a matrix Y, i.e.
Figure FDA0002220243180000037
At this time, the above matrices X, A, Y are multiplied by the write matrix, i.e.
XA＝Y；
E. Solving a linear equation set by using a Gaussian elimination method, wherein X and Y are known numbers, A is an unknown number, and solving the linear equation set to obtain a matrix A, namely a fitting parameter;
F. solving A matrix (a) of the equation system0,a1,a2...ak) Substituting fitting function
Figure FDA0002220243180000038
The normalized temperature value can be obtained and then the function t is passedi＝1.0/fyiThe + az is calculated to obtain the actual temperature value.
6. The method for automatic calibration of thermistor temperature sensor-based acquisition devices according to claim 1, characterized in that the fitting parameter calculation method further comprises a verification step:
verifying the calculation result of the fitting parameters, and obtaining the collecting resistance value sr through experimentsiAn experimental resistance value temperature corresponding table corresponding to the temperature;
when k +1 is 3, the fitting function is f (x)i)＝a0+a1xi+a2xi 2,
a0＝0.0032223027669568386
a1＝0.00029245873274454104
a2＝-0.00023211054460076097
Substituting the collected resistance value column of the experimental resistance value temperature mapping table into a fitting function to obtain a temperature [ 34.0290308334.9203145836.0888996636.96170087 ];
when k +1 is 5, the fitting function is f (x)i)＝a0+a1xi+a2xi 2+a3xi 3+a4xi 4Solving the equation to obtain
a0＝0.00321888069978578
a1＝0.0007768905773277712
a2＝-0.015012867491954338
a3＝0.15700245412736596
a4＝-0.5424752185849551
Substituting the collected resistance value column of the experimental resistance value temperature mapping table into a fitting function to obtain a temperature [ 34353637 ];
from the above verification, it is found that the more the fitting parameters are, the closer the values calculated by the fitting function are to the true temperatures, and the more the fitting parameters are theoretically infinite by the above method.
7. The automatic calibration system based on the acquisition equipment of the thermistor temperature sensor for realizing the automatic calibration method based on the acquisition equipment of the thermistor temperature sensor as claimed in any one of claims 1 to 6 is characterized by comprising calibration control equipment and a relay module, wherein the calibration control equipment calibrates the resistance value of the acquisition equipment, and simultaneously controls the relay module to be turned on and off according to the instruction of the acquisition equipment.
CN201910930897.0A 2019-09-29 2019-09-29 Automatic calibration method and system based on thermistor temperature sensor acquisition equipment Active CN110702256B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910930897.0A CN110702256B (en) 2019-09-29 2019-09-29 Automatic calibration method and system based on thermistor temperature sensor acquisition equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910930897.0A CN110702256B (en) 2019-09-29 2019-09-29 Automatic calibration method and system based on thermistor temperature sensor acquisition equipment

Publications (2)

Publication Number Publication Date
CN110702256A true CN110702256A (en) 2020-01-17
CN110702256B CN110702256B (en) 2020-12-25

Family

ID=69197095

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910930897.0A Active CN110702256B (en) 2019-09-29 2019-09-29 Automatic calibration method and system based on thermistor temperature sensor acquisition equipment

Country Status (1)

Country Link
CN (1) CN110702256B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120226460A1 (en) * 2008-05-30 2012-09-06 Hugo Fiennes Calibration of temperature sensing circuitry in an electronic device
CN103323147A (en) * 2013-04-11 2013-09-25 青岛方石工业科技发展有限公司 Method for calibrating PT1000 temperature sensor
CN105371993A (en) * 2015-12-25 2016-03-02 鼎奇(天津)主轴科技有限公司 Temperature sensor calibration method based on twice application of polynomial fitting
CN105758558A (en) * 2016-03-24 2016-07-13 中国科学院寒区旱区环境与工程研究所 Thermistor temperature sensor calibrating apparatus
CN207742231U (en) * 2018-02-06 2018-08-17 山东凯帝斯工业系统有限公司 Sensor acquires marking apparatus
CN110231108A (en) * 2018-03-05 2019-09-13 联合汽车电子有限公司 The caliberating device and scaling method of temperature sensor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120226460A1 (en) * 2008-05-30 2012-09-06 Hugo Fiennes Calibration of temperature sensing circuitry in an electronic device
CN103323147A (en) * 2013-04-11 2013-09-25 青岛方石工业科技发展有限公司 Method for calibrating PT1000 temperature sensor
CN105371993A (en) * 2015-12-25 2016-03-02 鼎奇(天津)主轴科技有限公司 Temperature sensor calibration method based on twice application of polynomial fitting
CN105758558A (en) * 2016-03-24 2016-07-13 中国科学院寒区旱区环境与工程研究所 Thermistor temperature sensor calibrating apparatus
CN207742231U (en) * 2018-02-06 2018-08-17 山东凯帝斯工业系统有限公司 Sensor acquires marking apparatus
CN110231108A (en) * 2018-03-05 2019-09-13 联合汽车电子有限公司 The caliberating device and scaling method of temperature sensor

Also Published As

Publication number Publication date
CN110702256B (en) 2020-12-25

Similar Documents

Publication Publication Date Title
CN109631973B (en) Automatic calibration method and system for sensor
CN103868610A (en) Temperature correction method, device and equipment
CN115859882A (en) Temperature compensation design method and temperature compensation method based on cutting neural network
CN110220945B (en) Full-range temperature compensation method of semiconductor gas sensor
CN110736769B (en) Automatic calibration device and method for gas alarm
CN111721444B (en) Mass production method and system for calibrating temperature sensor chip
CN110702256B (en) Automatic calibration method and system based on thermistor temperature sensor acquisition equipment
CN115236135A (en) Base line calibration method for gas sensor, control device and gas sensor
CN109405884B (en) System and method for realizing humidity calibration function based on temperature and humidity sensor
CN113985337B (en) Calibration method, device and system of resistance type current sensor and calibration method
CN116202780A (en) Ground platform thrust coefficient calibration method based on thrust transmission
CN115688924A (en) Multi-sample combined multivariate self-adaptive regression spline model
Možek et al. Digital self-learning calibration system for smart sensors
CN116046049B (en) Self-calibration sensor and calibration method and system
Pavlin et al. Yield enhancement of piezoresistive pressure sensors for automotive applications
CN104980233A (en) Modem and power calibration method thereof
WO2006051057A1 (en) Device and method for compensating transducers
CN110991125A (en) Method and device for identifying circuit element parameters in second-order circuit
CN113916384B (en) Method for controlling temperature of blackbody radiation source based on multivariate statistical analysis modeling
CN115574980B (en) Temperature calibration method and electronic equipment
CN113252185B (en) Temperature measuring method and system of infrared thermometer and storage medium
CN113836619B (en) Method for fitting arbitrary creep coefficient curve
CN113945297B (en) Dynamic temperature measurement method for magnetic nanometer temperature measurement calibration
CN108844664B (en) Automatic calibration method and device for body temperature measurement circuit
CN115728698A (en) Magnetometer calibration method and device, storage medium and electronic equipment

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant