CN110702007A - Line structured light three-dimensional measurement method based on MEMS scanning galvanometer - Google Patents
Line structured light three-dimensional measurement method based on MEMS scanning galvanometer Download PDFInfo
- Publication number
- CN110702007A CN110702007A CN201911048657.4A CN201911048657A CN110702007A CN 110702007 A CN110702007 A CN 110702007A CN 201911048657 A CN201911048657 A CN 201911048657A CN 110702007 A CN110702007 A CN 110702007A
- Authority
- CN
- China
- Prior art keywords
- light
- point
- light spot
- scanning galvanometer
- mems scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention belongs to the technical field of robot vision three-dimensional measurement and discloses a line structured light three-dimensional measurement method based on an MEMS scanning galvanometer. The method comprises the following steps: (a) setting the scanning range of the MEMS scanning galvanometer and the interval angle between light spots; (b) calibrating a light equation formed by connecting a laser emission point A to each light spot by adopting a two-dimensional chessboard target; (c) scanning an object to be detected by the MEMS scanning galvanometer, and establishing a corresponding relation between points on an image and light spots; (d) and calculating the intersection point of a straight line PB formed by the connecting line of the arbitrary point P on the straight line image and the optical center B of the camera and the ray AO, wherein the coordinate of the intersection point is the coordinate of the required light spot O, and obtaining the coordinates of all light spots on the surface of the object to be measured in such a way, namely realizing the three-dimensional measurement of the object to be measured. By the method, the influence of inaccurate extraction of the light strip center caused by overexposure of the light strip when the line structured light is used for measuring the mixed reflection surface is eliminated, and the three-dimensional measurement precision is improved.
Description
Technical Field
The invention belongs to the technical field of robot vision three-dimensional measurement, and particularly relates to a line structured light three-dimensional measurement method based on an MEMS scanning galvanometer.
Background
The method mainly develops a point structured light technology, a line structured light technology and a surface structured light technology in the aspect of structured light, the structured light measurement is used for acquiring three-dimensional information of the surface of a measured object and is generally based on the principle of trigonometry, the line structured light measurement method is used for acquiring the measured target information and generally comprises the three steps of ① determining the position and posture relation between a line light plane and a camera coordinate system through calibration, ② extracting and determining the projection point of the line light on the surface of the object on a camera imaging surface through the center of a light bar, and ③ calculating three-dimensional point coordinates through the trigonometry.
The three-dimensional point coordinates of the diffuse reflection object surface under the camera coordinate system can be accurately obtained by utilizing the line structured light. However, when the surface of the object shows the characteristics of a mixed reflection (both diffuse reflection and specular reflection), the linear structured light has a large extraction error of the center of the light strip, so that the measurement error is reduced and even an effective measurement result cannot be obtained.
The reason why the extraction error of the centers of the light bars is large is that the light bars are overexposed due to the specular reflection and the mutual reflection when the line laser irradiates on the mixed reflection surface. At present, the non-coding property of the line laser is a main reason for the poor effect of the line structured light measurement method in measuring the mixed reflection surface.
Disclosure of Invention
Aiming at the defects or improvement requirements in the prior art, the invention provides a three-dimensional measurement method for linear structured light based on an MEMS scanning galvanometer, which is characterized in that different light spots are distinguished by setting the brightness of each light spot, and the light ray direction is determined by adopting a two-dimensional chessboard target to calibrate a laser emission point and a light ray equation of the light spots, so that the calculation complexity is reduced, the error of extracting the light strip center is eliminated, and the measurement accuracy is improved.
In order to achieve the above object, according to the present invention, there is provided a line structured light three-dimensional measurement method based on a MEMS scanning galvanometer, the method comprising the steps of:
(a) setting the scanning range of the MEMS scanning galvanometer and the interval angle between the light spots, equally dividing the scanning range according to the interval angle, and numbering the equally divided light spots so as to obtain the number of each light spot;
(b) placing a two-dimensional chessboard target in a scanning domain of an MEMS scanning galvanometer, and calibrating the MEMS scanning galvanometer by adopting a light knife plane calibration method so as to obtain a light ray equation formed by connecting a laser emission point A to each light spot on the MEMS scanning galvanometer;
(c) removing the two-dimensional chessboard, placing an object to be measured in a scanning domain of an MEMS scanning galvanometer, setting a relational expression between the brightness of each light spot and the light spot number, setting the brightness of each light spot according to the relational expression, scanning the surface of the object to be measured by the MEMS scanning galvanometer according to the set light spot brightness, scanning range and interval angle, forming a straight line with different brightness on the surface of the object to be measured, shooting the straight line by a camera to obtain a straight line image, and establishing a corresponding relation between the light spot and the point on the image by using the straight line image;
(d) and (c) for any point P on the linear image obtained in the step (c), obtaining a light point O corresponding to the surface of the object to be measured and the any point P according to the corresponding relation between the point on the linear image obtained in the step (c) and the light point, finding a ray equation AO where the point O is located in all the linear equations obtained in the step (B), calculating the intersection point of a straight line PB formed by the connection line of the point P and the optical center B of the camera and the ray AO, wherein the intersection point coordinate is the needed light point O coordinate, and obtaining the coordinates of all the light points on the surface of the object to be measured in such a way, namely realizing the three-dimensional measurement of the object to be measured.
Further preferably, in the step (b), the MEMS scanning galvanometer is calibrated by using an optical knife plane calibration method, preferably according to the following steps:
(b1) shooting a two-dimensional chessboard target by a camera, and obtaining a plane equation of a plane of the two-dimensional chessboard target in a camera coordinate system by utilizing a shot chessboard target image;
(b2) scanning the two-dimensional chessboard target surface by laser emitted by a laser emitting point A on the MEMS scanning galvanometer according to the scanning range and the light spot interval angle set in the step (a), and shooting an image of any light spot Q scanned on the two-dimensional chessboard target surface by a camera to obtain a pixel coordinate Q' of any light spot on the image in a camera coordinate system;
(b3) intersecting the plane equation with the pixel coordinate Q' obtained in step (b2) to obtain the image in the camera coordinate systemCoordinate Q of arbitrary light point Q in two-dimensional chessboard target1；
(b4) Changing the position of the two-dimensional chessboard, repeating the steps ((b2) and (b3) to obtain the coordinate Q of the arbitrary point Q in the two-dimensional chessboard target under the camera coordinate system2Straight line Q1Q2The bar is a light ray equation formed by connecting the laser emission point A and the light spot Q; in this way, the ray equation formed by the connection of the laser emission point to each light spot is obtained.
Further preferably, in step (b2), when the MEMS scanning galvanometer scans the two-dimensional chessboard target, the brightness of each light spot is set as the maximum brightness value, and the pixel coordinate Q' of any light spot on the image in the camera coordinate system is obtained by using the light bar center algorithm.
Further preferably, in step (c), the setting of the relation between the brightness of each light spot and the irradiation angle is performed according to the following relation:
where n is a phase shift, is an integer, TjIs the jth period, j is the number of periods, N is the total number of periods, a is the set luminance mean, B is the luminance amplitude, x is the number of spots,
is the luminance of the jth period at the phase shift n.
Further preferably, in step (c), the using the linear image to establish the correspondence between the points on the image and the light points preferably follows the following steps:
(c1) setting the values of phase shift n and period j, and calculating period TjCorresponding winding phase phij；
(c2) And solving an absolute phase phi reflecting the relationship between the point and the light spot on the linear image by utilizing the winding phases corresponding to all the periods respectively so as to obtain the corresponding relationship between the point and the light spot on the image.
Further preferably, in step (c1), when n is 0,1,2,3, j is 1,2,3,
the winding phase preferably proceeds according to the following expression:
the absolute phase proceeds as follows:
wherein the content of the first and second substances,
further preferably, after step (d), the coordinates of the optical point O are also verified, preferably by the following method,
(d1) fitting a light equation formed by connecting the laser emission point on the MEMS scanning galvanometer to all light spots obtained in the step (b) into a plane, namely a linear light plane;
(d2) and judging whether the coordinates of the light spot O are on the linear light plane, if so, determining that the coordinates of the light spot O are qualified, otherwise, determining that the coordinates of the light spot O are unqualified.
In general, the above technical solutions contemplated by the present invention can achieve the following advantageous effects compared to the prior art.
1. According to the invention, by designing the linear structured light three-dimensional measurement method based on the MEMS scanning galvanometer, the MEMS scanning galvanometer and the camera form a linear structured light measurement system for obtaining three-dimensional point cloud information of a measured target, the scanning direction is coded by adjusting the light spot brightness in each scanning direction of the MEMS scanning galvanometer, and the scanning direction correspondence can be determined by decoding light strip patterns obtained by the camera, so that the direction of each point on the light strip can be determined, therefore, the influence of inaccurate extraction of the light strip center caused by overexposure of the light strip can be eliminated, and the three-dimensional measurement precision is improved;
2. in the method, different light spots are distinguished by setting the brightness of each light spot, and the light ray direction is determined by adopting a light ray equation of a two-dimensional chessboard target calibration laser emission point and the light spot, so that the calculation complexity is reduced, the error of extracting the light strip center is eliminated, and the measurement accuracy is improved.
Drawings
FIG. 1 is a schematic diagram of a method for line structured light three-dimensional measurement based on MEMS scanning galvanometers constructed in accordance with a preferred embodiment of the present invention.
The same reference numbers will be used throughout the drawings to refer to the same or like elements or structures, wherein:
1-camera, 2-MEMS scanning galvanometer, 3-object to be measured, 4-linear light plane and 5-light direction.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
A three-dimensional measurement method of line structured light based on an MEMS scanning galvanometer comprises the following steps:
the method comprises the following steps: determining a light equation formed by a laser emission point and a light spot and a line light plane formed by all the light equations by a light knife plane calibration method, which specifically comprises the following steps:
step 1: placing the two-dimensional target in a view field of a camera 1, shooting an image of the two-dimensional target by the camera, solving a translation matrix and a rotation matrix between a camera coordinate of the two-dimensional target under a camera coordinate system and a coordinate system where a checkerboard is located by a PnP (simple notation-n-point) method, wherein a z-axis component of rotation is a normal vector of a plane equation, a three-dimensional point coordinate of the translation matrix is on a plane of the checkerboard in the camera coordinate system, and calculating a point normal to obtain the plane equation of the checkerboard plane of the two-dimensional target under the camera coordinate system;
step 2: keeping the pose of the two-dimensional target in Step1, projecting a brightness coding line through the MEMS scanning galvanometer image two-dimensional target, coding the brightness of all scanning points into a maximum brightness value, and shooting a two-dimensional target pattern with the brightness coding line on the surface by a camera;
step 3: extracting the coordinate of the central point of the brightness coding line of the two-dimensional target pattern in the camera in Step2 through a light bar central algorithm;
step 4: a straight line formed by a connecting line of the central point and the optical center of the camera is intersected with a plane equation of a checkerboard plane obtained in Step1 under a camera coordinate system, and the intersection point is the coordinate of a light spot on a two-dimensional target chessboard in the camera coordinate system;
step 5: changing the position and angle of the two-dimensional target, and repeating Step1, Step2, Step3
Step 6: performing plane fitting on the central coordinates of the brightness coding lines on the two-dimensional targets at different positions, and forming a light equation by connecting the laser emission point A and the light spots; in this way, a ray equation M formed by connecting the laser emission point to each light spot is obtained.
Step two: the MEMS scanning galvanometer is single-point scanning, can rapidly and continuously scan in the scanning direction, and codes the light spot brightness of each scanning position, and a brightness coding method adopts a 4-step phase shift coding method (formula 1) and can form a brightness coding line on the surface of an object. The brightness coding line projected by the MEMS scanning galvanometer 2 irradiates on the object to be measured, and the camera 1 shoots the brightness coding line on the surface 3 of the object to be measured.
Where n is a phase shift, is an integer, TjIs the jth period, j is the number of periods, a is the set luminance mean, B is the luminance amplitude, x is the number of spots,
is the brightness of the jth period under the phase shift n, in this embodiment, the brightness of the light spot is encoded by three different periods, the scanning range of the MEMS scanning galvanometer is 60 degrees, and if one light spot is scanned every 0.025 degrees, the value of x is takenIn the range of 1 to 2400; n is 4 and N is the phase shift.
Then, the camera shoots 12 brightness coding lines projected by the MEMS scanning galvanometer according to the formula (2), and the brightness coding lines are coded in each coding period TjThe four images are solved according to the formula (3) to obtain the winding phase.
Wherein phi isjIndicates the corresponding period TjThe winding phase of (1).
Finally, according to phi1，φ2，φ3And determining an absolute phase phi which reflects the corresponding relation between the pixel point and the light spot position.
Step three: determining the three-dimensional coordinates of the measured point by a trigonometry method according to the light spot position (light ray direction) determined by the absolute phase phi and the pixel correspondence of the camera;
step 1: a camera shoots 12 brightness encoding line images projected to the surface of a measured object by an MEMS scanning galvanometer, and the correspondence between the positions of pixels and light spots (light directions) is obtained by decoding through a multi-frequency heterodyne method;
step 2: the connecting line of the coordinates of the pixel point of the camera and the optical center is expressed as a straight line 1, the light direction of the position of the light spot is expressed as a straight line 2, the intersection point of the straight line 1 and the straight line 2 is calculated, and the common verticality point is calculated when the straight line 1 and the straight line 2 do not intersect.
Step four: and (3) false point elimination, because the light spot projected by the laser transmitted on the surface of the object to be detected is larger, a plurality of pixels correspond to one light spot, and the number of P points is more, so that a plurality of incorrect points are generated, and the closer the distance from the plane is, the more correct the distance is.
Step 1: calculating the three-dimensional point coordinate obtained in step3 and the distance of the plane side M obtained in step 2;
step 2: and setting a threshold value T, judging as an error point when the distance between the three-dimensional point coordinate and the plane M is greater than T, and judging as a correct point when the distance is less than or equal to T.
In summary, the invention provides a line structured light three-dimensional measurement method based on an MEMS scanning galvanometer, which uses a line structured light measurement system composed of a one-dimensional encoding MEMS scanning galvanometer and a camera to determine each point direction of a light bar by encoding a light bar pattern, thereby eliminating the influence of inaccurate extraction of the center of the light bar due to overexposure of the light bar and improving the three-dimensional measurement precision.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (7)
1. A three-dimensional measurement method of line structured light based on MEMS scanning galvanometers is characterized by comprising the following steps:
(a) setting the scanning range of the MEMS scanning galvanometer and the interval angle between the light spots, equally dividing the scanning range according to the interval angle, and numbering the equally divided light spots so as to obtain the number of each light spot;
(b) placing a two-dimensional chessboard target in a scanning domain of an MEMS scanning galvanometer, and calibrating the MEMS scanning galvanometer by adopting a light knife plane calibration method so as to obtain a light ray equation formed by connecting a laser emission point A to each light spot on the MEMS scanning galvanometer;
(c) removing the two-dimensional chessboard, placing an object to be measured in a scanning domain of an MEMS scanning galvanometer, setting a relational expression between the brightness of each light spot and the light spot number, setting the brightness of each light spot according to the relational expression, scanning the surface of the object to be measured by the MEMS scanning galvanometer according to the set light spot brightness, scanning range and interval angle, forming a straight line with different brightness on the surface of the object to be measured, shooting the straight line by a camera to obtain a straight line image, and establishing a corresponding relation between the light spot and the point on the image by using the straight line image;
(d) and (c) for any point P on the linear image obtained in the step (c), obtaining a light point O corresponding to the surface of the object to be measured and the any point P according to the corresponding relation between the point on the linear image obtained in the step (c) and the light point, finding a ray equation AO where the point O is located in all the linear equations obtained in the step (B), calculating the intersection point of a straight line PB formed by the connection line of the point P and the optical center B of the camera and the ray AO, wherein the intersection point coordinate is the needed light point O coordinate, and obtaining the coordinates of all the light points on the surface of the object to be measured in such a way, namely realizing the three-dimensional measurement of the object to be measured.
2. The line structured light three-dimensional measurement method based on the MEMS scanning galvanometer of claim 1, wherein in step (b), the MEMS scanning galvanometer is calibrated by the optical knife plane calibration method, preferably according to the following steps:
(b1) shooting a two-dimensional chessboard target by a camera, and obtaining a plane equation of a plane of the two-dimensional chessboard target in a camera coordinate system by utilizing a shot chessboard target image;
(b2) scanning the two-dimensional chessboard target surface by laser emitted by a laser emitting point A on the MEMS scanning galvanometer according to the scanning range and the light spot interval angle set in the step (a), and shooting an image of any light spot Q scanned on the two-dimensional chessboard target surface by a camera to obtain a pixel coordinate Q' of any light spot on the image in a camera coordinate system;
(b3) intersecting the pixel coordinate Q' obtained in the step (b2) with the plane equation to obtain the coordinate Q of the arbitrary light point Q in the two-dimensional chessboard target under the camera coordinate system1；
(b4) Changing the position of the two-dimensional chessboard, repeating the steps ((b2) and (b3) to obtain the coordinate Q of the arbitrary point Q in the two-dimensional chessboard target under the camera coordinate system2Straight line Q1Q2The bar is a light ray equation formed by connecting the laser emission point A and the light spot Q; in this way, the ray equation formed by the connection of the laser emission point to each light spot is obtained.
3. The method according to claim 2, wherein in step (b2), when the MEMS scanning galvanometer scans the two-dimensional chessboard target, the brightness of each light spot is set as the maximum brightness value, and the pixel coordinate Q' of any light spot on the image in the camera coordinate system is obtained by using the light bar center algorithm.
4. The method for three-dimensional measurement of linear structured light based on MEMS scanning galvanometer of claim 1, wherein in step (c), the relationship between the brightness of each spot and the illumination angle is set, preferably according to the following relationship:
where n is a phase shift, is an integer, TjIs the jth period, j is the number of periods, N is the total number of periods, a is the set luminance mean, B is the luminance amplitude, x is the number of spots,
is the luminance of the jth period at the phase shift n.
5. The method for linear-structured light three-dimensional measurement based on MEMS scanning galvanometer of claim 1, wherein in step (c), the using the linear image to establish the corresponding relationship between the point on the image and the light spot is preferably according to the following steps:
(c1) setting the values of phase shift n and period j, and calculating period TjCorresponding winding phase phij；
(c2) And solving an absolute phase phi reflecting the relationship between the point and the light spot on the linear image by utilizing the winding phases corresponding to all the periods respectively so as to obtain the corresponding relationship between the point and the light spot on the image.
6. The linear structured light three-dimensional measurement method based on the MEMS scanning galvanometer of claim 5, wherein in step (c1), when n is 0,1,2,3, j is 1,2,3,
the winding phase preferably proceeds according to the following expression:
the absolute phase proceeds as follows:
wherein the content of the first and second substances,
7. the method for three-dimensional measurement of line structured light based on MEMS scanning galvanometer of claim 1, wherein after step (d), the O coordinate of the light point is verified, preferably by the following method,
(d1) fitting a light equation formed by connecting the laser emission point on the MEMS scanning galvanometer to all light spots obtained in the step (b) into a plane, namely a linear light plane;
(d2) and judging whether the coordinates of the light spot O are on the linear light plane, if so, determining that the coordinates of the light spot O are qualified, otherwise, determining that the coordinates of the light spot O are unqualified.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911048657.4A CN110702007B (en) | 2019-10-31 | 2019-10-31 | Line structured light three-dimensional measurement method based on MEMS scanning galvanometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911048657.4A CN110702007B (en) | 2019-10-31 | 2019-10-31 | Line structured light three-dimensional measurement method based on MEMS scanning galvanometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110702007A true CN110702007A (en) | 2020-01-17 |
| CN110702007B CN110702007B (en) | 2020-11-24 |
Family
ID=69202895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911048657.4A Active CN110702007B (en) | 2019-10-31 | 2019-10-31 | Line structured light three-dimensional measurement method based on MEMS scanning galvanometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110702007B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111649669A (en) * | 2020-06-05 | 2020-09-11 | 苏州若柏视智能科技有限公司 | Non-calibration linear structured light vision sensor coordinate measuring method and system |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6753528B1 (en) * | 2002-04-18 | 2004-06-22 | Kla-Tencor Technologies Corporation | System for MEMS inspection and characterization |
| JP2006201350A (en) * | 2005-01-19 | 2006-08-03 | Denso Corp | Scanning apparatus |
| CN102884397B (en) * | 2010-05-07 | 2015-07-15 | 深圳泰山在线科技有限公司 | Structured-light measuring method and system |
| CN105674912A (en) * | 2016-01-26 | 2016-06-15 | 中国科学院上海光学精密机械研究所 | Dammann grating combined multi-light-knife colored 3D measuring device and method |
| CN105674911A (en) * | 2016-01-27 | 2016-06-15 | 淮安普瑞精仪科技有限公司 | Non-contact type micro-nano 3D measuring method and device |
| CN106556356A (en) * | 2016-12-07 | 2017-04-05 | 西安知象光电科技有限公司 | A kind of multi-angle measuring three-dimensional profile system and measuring method |
| CN106767527A (en) * | 2016-12-07 | 2017-05-31 | 西安知象光电科技有限公司 | A kind of optics mixing detection method of three-D profile |
| CN107167093A (en) * | 2017-05-25 | 2017-09-15 | 西安知象光电科技有限公司 | The combined type measuring system and measuring method of a kind of laser line scanning and shadow Moire |
| CN108248634A (en) * | 2018-01-24 | 2018-07-06 | 西南交通大学 | Track switch and track full-sized abrasion vision measurer and its measuring method |
| CN109186633A (en) * | 2018-08-30 | 2019-01-11 | 衡阳市衡山科学城科技创新研究院有限公司 | A kind of field calibration method and system of duplex measurement device |
| CN109724540A (en) * | 2018-12-29 | 2019-05-07 | 中国科学院长春光学精密机械与物理研究所 | Two-dimentional MEMS scanning reflection mirror corner calibration system and scaling method |
| CN110360929A (en) * | 2019-08-29 | 2019-10-22 | 江苏集萃华科智能装备科技有限公司 | High speed line scan sensor and its scaling method |
-
2019
- 2019-10-31 CN CN201911048657.4A patent/CN110702007B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6753528B1 (en) * | 2002-04-18 | 2004-06-22 | Kla-Tencor Technologies Corporation | System for MEMS inspection and characterization |
| JP2006201350A (en) * | 2005-01-19 | 2006-08-03 | Denso Corp | Scanning apparatus |
| CN102884397B (en) * | 2010-05-07 | 2015-07-15 | 深圳泰山在线科技有限公司 | Structured-light measuring method and system |
| CN105674912A (en) * | 2016-01-26 | 2016-06-15 | 中国科学院上海光学精密机械研究所 | Dammann grating combined multi-light-knife colored 3D measuring device and method |
| CN105674911A (en) * | 2016-01-27 | 2016-06-15 | 淮安普瑞精仪科技有限公司 | Non-contact type micro-nano 3D measuring method and device |
| CN106556356A (en) * | 2016-12-07 | 2017-04-05 | 西安知象光电科技有限公司 | A kind of multi-angle measuring three-dimensional profile system and measuring method |
| CN106767527A (en) * | 2016-12-07 | 2017-05-31 | 西安知象光电科技有限公司 | A kind of optics mixing detection method of three-D profile |
| CN107167093A (en) * | 2017-05-25 | 2017-09-15 | 西安知象光电科技有限公司 | The combined type measuring system and measuring method of a kind of laser line scanning and shadow Moire |
| CN108248634A (en) * | 2018-01-24 | 2018-07-06 | 西南交通大学 | Track switch and track full-sized abrasion vision measurer and its measuring method |
| CN109186633A (en) * | 2018-08-30 | 2019-01-11 | 衡阳市衡山科学城科技创新研究院有限公司 | A kind of field calibration method and system of duplex measurement device |
| CN109724540A (en) * | 2018-12-29 | 2019-05-07 | 中国科学院长春光学精密机械与物理研究所 | Two-dimentional MEMS scanning reflection mirror corner calibration system and scaling method |
| CN110360929A (en) * | 2019-08-29 | 2019-10-22 | 江苏集萃华科智能装备科技有限公司 | High speed line scan sensor and its scaling method |
Non-Patent Citations (2)
| Title |
|---|
| L. CHEN, H. ZHAO, F. CHEN AND H. DING: "High Efficiency Off-line Programming for Robotic Blisk Grinding with Constant Contact Force", 《2018 IEEE INTERNATIONAL CONFERENCE ON MECHATRONICS AND AUTOMATION》 * |
| 冯晨，陈文艺，杨辉: "基于MEMS 微振镜的高精度正弦光栅产生方法", 《计算机与数字工程》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111649669A (en) * | 2020-06-05 | 2020-09-11 | 苏州若柏视智能科技有限公司 | Non-calibration linear structured light vision sensor coordinate measuring method and system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110702007B (en) | 2020-11-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111750806B (en) | Multi-view three-dimensional measurement system and method | |
| KR102236297B1 (en) | Calibration device and method for calibrating a dental camera | |
| US8970853B2 (en) | Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium | |
| US7456842B2 (en) | Color edge based system and method for determination of 3D surface topology | |
| CN113205593B (en) | High-light-reflection surface structure light field three-dimensional reconstruction method based on point cloud self-adaptive restoration | |
| US6195455B1 (en) | Imaging device orientation information through analysis of test images | |
| Song et al. | Use of LCD panel for calibrating structured-light-based range sensing system | |
| CN106546230B (en) | Positioning point arrangement method and device, and method and equipment for measuring three-dimensional coordinates of positioning points | |
| Huang et al. | A single-shot-per-pose camera-projector calibration system for imperfect planar targets | |
| CN110827360B (en) | Photometric stereo measurement system and method for calibrating light source direction thereof | |
| CN110926373A (en) | Structured light plane calibration method and system under railway foreign matter detection scene | |
| CN107564051B (en) | Depth information acquisition method and system | |
| CN110360930A (en) | A kind of laser displacement normal sensor and its measurement method | |
| CN110702007B (en) | Line structured light three-dimensional measurement method based on MEMS scanning galvanometer | |
| Pistellato et al. | Adaptive albedo compensation for accurate phase-shift coding | |
| Knyaz | Multi-media projector–single camera photogrammetric system for fast 3D reconstruction | |
| Yu et al. | An improved projector calibration method for structured-light 3D measurement systems | |
| CN110686598B (en) | Double-linear-array structured light three-dimensional measurement system and measurement method thereof | |
| CN115082538A (en) | System and method for three-dimensional reconstruction of surface of multi-view vision balance ring part based on line structure light projection | |
| Nietiedt et al. | Accuracy investigations of image matching techniques by means of a textured dumbbell artefact | |
| Morimoto et al. | A portable 3D scanner based on structured light and stereo camera | |
| Jin et al. | Shadow-Based Lightsource Localization with Direct Camera-Lightsource Geometry | |
| Muhr et al. | A triangulation method for 3D-measurement of specular surfaces | |
| Bevilacqua et al. | Stereo calibration for a camera-projector pair | |
| US11948321B2 (en) | Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |