CN110687427A - Method and equipment for displaying chip test result and test system - Google Patents

Abstract

The invention provides a display method, equipment and a test system of a chip test result, wherein the method comprises the steps of obtaining original data obtained by testing a chip by using a plurality of test methods; analyzing the acquired original data to acquire test results corresponding to each test method; displaying each test method to be selected in a mode selection area of a graphical user interface; selecting at least one test method in the mode selection area according to the mode selection instruction; obtaining a test result corresponding to the selected test method; and displaying the test result corresponding to the selected test method in a result display area of the graphical user interface. According to the invention, the result data of the chip test is displayed in the graph more completely and visually by using the graphical user interface in the chip test result, so that the accuracy of analyzing the chip test result data is improved.

Description

Method and equipment for displaying chip test result and test system

Technical Field

The invention relates to the field of semiconductor integrated circuit testing, in particular to a method and equipment for displaying a chip test result and a test system.

Background

There are various differences between the finished chip and the chip on the entire wafer, and in order to adapt the testing procedure to such differences, some sensitive test items need to be tested to find the best setting for the chip.

The chip test can generate original data, and then various analyses and decisions are carried out on the chip according to the generated original data. However, the original data obtained by the chip test method in the prior art is poor in readability and editability, the chip test result graph is relatively simple, and generally, the existing chip test result graph can only show a single result and has the defects of function deficiency and incapability of editing, so that errors are generated when the chip test result graph is analyzed.

Disclosure of Invention

The present invention provides a method and apparatus for displaying chip test results and a test system, so as to at least solve one or more of the above technical problems in the prior art, or at least provide a useful choice.

In a first aspect of the present invention, the present invention provides a method for displaying a chip test result, including:

obtaining original data obtained by testing a chip by using a plurality of testing methods;

analyzing the acquired original data to acquire a test result corresponding to each test method;

displaying each test method to be selected in a mode selection area of a graphical user interface;

selecting at least one test method in the mode selection area according to a mode selection instruction;

obtaining a test result corresponding to the selected test method; and

and displaying the test result corresponding to the selected test method in a result display area of the Graphical User Interface (GUI).

In one embodiment, the method further comprises:

acquiring parameters corresponding to the selected test method; and

and displaying the acquired parameters in a parameter display area of the graphical user interface.

In one embodiment, selecting at least one test method in the mode selection area according to a mode selection instruction includes:

and selecting an icon corresponding to at least one test method from the icons corresponding to the plurality of test methods displayed in the mode selection area according to the mode selection instruction.

In an embodiment, the step of displaying the test result corresponding to the selected test method in the result display area of the graphical user interface includes:

and displaying a single test result graph corresponding to the selected test method in the result display area, wherein the single test result graph comprises a success mark and a failure mark of the single test.

In an embodiment, the step of displaying the test result corresponding to the selected test method in the result display area of the graphical user interface includes:

and displaying a plurality of test result graphs corresponding to the selected test methods in the result display area, wherein the plurality of test result graphs comprise the superposition effect of the success marks and the failure marks of the plurality of tests.

In an embodiment, the method further comprises:

the original data with a set format is obtained through an Application Programming Interface (API, which is some predefined functions).

In a second aspect of the present invention, the present invention provides a display device for a chip test result, comprising:

the data acquisition module is used for acquiring original data obtained by testing the chip by using a plurality of testing methods;

the data analysis module is connected with the test module and used for carrying out data analysis on the acquired original data so as to obtain test results corresponding to each test method;

the graphical user interface module is connected with the data analysis module and used for displaying each test method to be selected in a mode selection area of the graphical user interface; selecting at least one test method in the mode selection area according to a mode selection instruction; obtaining a test result corresponding to the selected test method; and displaying the test result corresponding to the selected test method in a result display area of the graphical user interface.

In one embodiment, the graphical user interface module comprises:

the parameter acquisition unit is used for acquiring parameters corresponding to the selected test method; and

and the parameter display unit is used for displaying the acquired parameters in a parameter display area of the graphical user interface.

In one embodiment, the graphical user interface module further comprises:

and the mode selection unit is used for selecting an icon corresponding to at least one test method from the icons corresponding to the plurality of test methods displayed in the mode selection area according to the mode selection instruction.

In one embodiment, the graphical user interface module further comprises:

and the first result display unit is used for displaying a single test result graph corresponding to the selected test method in the result display area, wherein the single test result graph comprises a success mark and a failure mark of the single test.

In one embodiment, the graphical user interface module further comprises:

and the second result display unit is used for displaying a plurality of test result graphs corresponding to the selected test methods in the result display area, wherein the plurality of test result graphs comprise the superposition effect of the success marks and the failure marks of the plurality of tests.

In a third aspect of the present invention, the present invention provides a test system comprising:

the test equipment is used for testing the chip by utilizing a plurality of test methods to obtain original data;

and the display equipment is connected with the test equipment and adopts the display equipment for the chip test result in any embodiment.

In one embodiment, the method further comprises:

and the test equipment generates the original data with a set format in the process of testing the chip through the application programming interface.

According to the invention, the result data of the chip test is displayed in the graph more completely and visually by using the graphical user interface in the chip test, so that the accuracy of analyzing the result data of the chip test is improved.

The foregoing summary is provided for the purpose of description only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features of the present invention will be readily apparent by reference to the drawings and following detailed description.

Drawings

In the drawings, like reference numerals refer to the same or similar parts or elements throughout the several views unless otherwise specified. The figures are not necessarily to scale. It is appreciated that these drawings depict only some embodiments in accordance with the disclosure and are therefore not to be considered limiting of its scope.

FIG. 1 is a flowchart illustrating a method for displaying a test result of a chip according to an embodiment of the present invention.

FIG. 2 is a graph of a single test result corresponding to one test method in an embodiment of the present invention.

FIG. 3 is a diagram of multiple test results corresponding to multiple test methods in an embodiment of the present invention.

FIG. 4 is a schematic connection diagram of a display device for testing a chip according to an embodiment of the present invention.

FIG. 5 is a diagram illustrating a resulting connection of a GUI module according to an embodiment of the present invention.

FIG. 6 is a schematic diagram illustrating a connection of a test system for testing a chip test result according to an embodiment of the present invention.

Reference numerals:

10a mode selection area;

10a test method icon one;

10b test method icon two;

10c test method icon three;

10d test method icon four;

10e test method icon five;

20a result display area;

20a successful marking;

20b a failure flag;

30 parameter display area;

100 a display device;

110 a data acquisition module;

120, a data analysis module;

130 a graphical user interface module;

131 mode selection units;

132 parameter selection unit;

133 parameter display unit;

134 a first result display unit;

135 a second result display unit;

200 testing equipment;

300 application programming interface.

Detailed Description

In the following, only certain exemplary embodiments are briefly described. As those skilled in the art will recognize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention. Accordingly, the drawings and description are to be regarded as illustrative in nature, and not as restrictive.

Example one

The embodiment provides a method for displaying a chip test result, as shown in fig. 1 and fig. 2, including:

step S10: the method comprises the steps of obtaining original data obtained by testing a chip by a plurality of testing methods. Chip testing typically employs the Shmoo test. (the Shmoo test is a commonly used technical means in the chip test, and the method is to select two indexes related to the chip performance, such as the maximum working frequency and the power voltage, to scan the two indexes in two dimensions respectively, and to display the scanning result in the X-Y two-dimensional coordinate system, thereby showing the interrelation between the two selected variables more intuitively)

Step S20: and analyzing the acquired original data to obtain test results corresponding to each test method. The test methods correspond to the test results one to one. The specific steps of data analysis comprise:

and preprocessing the acquired original data to respectively acquire the test method in the original data and the test result corresponding to the test method.

Step S30: each test method to be selected is displayed in a mode selection area 10 of the graphical user interface. The step of displaying each test method to be selected includes displaying a test method formation list obtained by data analysis in a mode selection area 10 of the graphical user interface.

Step S40: at least one test method is selected in the mode selection area 10 according to the mode selection command.

Step S50: and obtaining a test result corresponding to the selected test method. Wherein the selected test method and the corresponding test result form a data stream.

Step S60: and displaying the test result corresponding to the selected test method, namely the data stream formed in step S50, in the result display area 20 of the graphical user interface. And when a plurality of test methods are selected, the test results corresponding to the selected test methods are displayed in an overlapping mode.

According to the embodiment, the test result data of the chip obtained by different test methods is analyzed, the result data of the analysis result is displayed on the graphical user interface, the result data of the chip test result is displayed more conveniently and visually through the graphical user interface, and the accuracy of analyzing the result data of the chip test result is improved.

In one embodiment, as shown in fig. 1, the method further includes:

step S70: and acquiring parameters corresponding to the selected test method.

Step S80: the acquired parameters are displayed in a parameter display area 30 of the graphical user interface.

In general, under the same test environment, the parameters obtained by each test method are the same.

In an embodiment, referring to fig. 2 and 3, in step S40, selecting at least one test method in the mode selection area 10 according to the mode selection instruction includes:

according to the mode selection instruction, at least one icon corresponding to the test method is selected from the icons (10a,10b,10c,10d,10e) corresponding to the plurality of test methods displayed in the mode selection area 10.

Each test method forms different icons to form an icon list, and the mode selection instruction selects the icon in the icon list to select the corresponding test method. The icon list comprises a first test method icon 10a, a second test method icon 10b, a third test method icon 10c, a fourth test method icon 10b and a fifth test method icon 10 e.

In an embodiment, referring to fig. 2, the step of displaying the test result corresponding to the selected test method in the result display area 20 of the gui includes:

and displaying a single test result graph corresponding to the selected test method in the result display area 20, wherein the single test result graph comprises a success mark 20a and a failure mark 20b of the single test. In fig. 2, a portion formed by a diagonal broken solid line is a success mark 20a, and a portion formed by a horizontal broken line is a failure mark 20 b.

According to the embodiment, the result data obtained by the selected test method is displayed on the graphical user interface, so that the result data of the selected test method can be displayed more intuitively and conveniently, and the accuracy of analyzing the result data is improved.

In fig. 2, the icons of five test methods (Pattern1 to Pattern5, i.e., the first test method icon 10a to the fifth test method icon 10e), five Parameters (Parameters1 to Parameters5) in the parameter display area 30, and a single test result graph of the test result data generated in the result display area 20 by selecting the test method corresponding to the Pattern1 are included but not limited, and the "check mark" in fig. 2 is selected.

In an embodiment, referring to fig. 3, the step of displaying the test result corresponding to the selected test method in the result display area 20 of the graphical user interface includes:

and displaying a plurality of test result graphs corresponding to the selected plurality of test methods in the result display area 20, wherein the plurality of test result graphs comprise the superposition effect of the success marks 20a and the failure marks 20b of the plurality of tests. Each test method in fig. 3 is distinguished by using a different line mark, each icon has a line, and the portion enclosed by the line in the result display area 20 is the area where the test method represented by each line fails in the test. And the fail flag 20b of the multiple test results is shown as blank, and the success flag 20a of the multiple test results is shown as a portion composed of oblique dashed solid lines.

According to the embodiment, the result data obtained by the selected multiple testing methods are displayed on the graphical user interface in a superposed manner, so that the result data of the selected multiple testing methods can be displayed more visually and conveniently, and the accuracy of analyzing the result data is further improved.

In fig. 3, the icons (Pattern1 to Pattern5, i.e., the first test method icon 10a to the fifth test method icon 10e), the five Parameters (Parameters1 to Parameters5) in the parameter display area 30, and the overlay graphs of the test result data generated in the result display area 20 corresponding to the test methods by selecting the patterns 1 to 5 are included but not limited to five test methods, and the "opposite-hook" mark in fig. 3 is selected.

In an embodiment, the method further comprises:

and obtaining the original data of the chip test result with a set format through an application programming interface.

In the embodiment, a set of application program programming is provided, so that when all the test methods are used for testing, original data of chip test results in a format required by data analysis is generated, the data analysis is convenient, and the analyzed data is applied to a graphical user interface.

Example two

Referring to fig. 4, the apparatus includes a data obtaining module 110, a data parsing module 120, and a graphical user interface module 130.

The data obtaining module 110 is configured to obtain original data obtained by testing a chip by using a plurality of testing methods.

The data analysis module 120 is connected to the data acquisition module 110, and the data analysis module 120 is configured to perform data analysis on the acquired original data to obtain test results corresponding to each test method. The data parsing module 120 further includes a loading unit and a preprocessing unit. The data analysis module 120 analyzes and records the number of test methods in the original data and the test results corresponding to the test methods through the loading unit and the preprocessing unit, and enables each test method and the corresponding test result to form a data stream.

With reference to fig. 2 and 3, the gui module 130 is connected to the data parsing module 120, and the gui module 130 is configured to display each test method to be selected in the mode selection area 10 of the gui; selecting at least one test method in the mode selection area 10 according to the mode selection instruction; obtaining a test result corresponding to the selected test method through a data stream consisting of the test method and the test result; and displaying the test result corresponding to the selected test method in a result display area 20 of the graphical user interface.

According to the chip testing method and the chip testing system, the testing result data of the chip, which are obtained by different testing methods, are analyzed through the testing system, the result data of the analysis result are displayed on the graphical user interface, the result data of the chip testing are displayed more conveniently and visually through the graphical user interface, and the accuracy of analyzing the result data of the chip testing is improved.

In one embodiment, as shown in fig. 5, the gui module 130 further includes a mode selection unit 131.

With reference to fig. 2 and fig. 3, the mode selection unit 131 is configured to select at least one icon corresponding to a test method from the icons (10a,10b,10c,10d,10e) corresponding to a plurality of test methods displayed in the mode selection area according to the mode selection instruction. The test methods are displayed on the graphical user interface in an icon form, and a plurality of test methods form icon list strips on the graphical user interface for selection, so that the test methods are visual and editable.

Further, referring to fig. 5, the graphic user interface module 130 includes a parameter acquisition unit 132 and a parameter display unit 133.

The parameter obtaining unit 132 is configured to obtain a parameter corresponding to the selected testing method. The data analysis module 120 records parameters of the test method when analyzing the data, so as to output the parameters to the parameter obtaining unit, and forms a data stream with the test method and the corresponding test result to be fused to form a combined data stream.

With reference to fig. 2 and 3, the parameter display unit 133 is configured to display the acquired parameters in the parameter display area 30 of the graphical user interface. That is, the test method and the corresponding test result and parameters in the combined data stream are all displayed on the graphical user interface. Therefore, the chip test result can be accurately and completely displayed on the graphical user interface, and the analysis accuracy is improved.

In one embodiment, as shown in FIG. 5, the graphical user interface module 130 further includes a first result display unit 134.

With reference to fig. 2 and 3, the first result display unit 134 is configured to display a single test result graph corresponding to the selected one of the test methods in the result display area 20, where the single test result graph includes a success mark 20a and a failure mark 20b of the single test.

According to the embodiment, the result data of the chip test is displayed more conveniently and visually through the graphical user interface, and the accuracy of analyzing the result data of the chip test is improved.

In one embodiment, as shown in FIG. 5, the graphical user interface module 130 further includes a second results display unit 135.

With reference to fig. 2 and fig. 3, the second result displaying unit 135 is configured to display a plurality of test result graphs corresponding to the selected plurality of test methods in the result displaying area 20, where the plurality of test result graphs include an overlapping effect of the success mark 20a and the failure mark 20b of the plurality of tests.

According to the embodiment, the result data of the chip test for many times is displayed more conveniently and visually through the graphical user interface, and the accuracy of analyzing the result data of the chip test is improved.

EXAMPLE III

The present embodiment provides a test system, as shown in fig. 6, including a test apparatus 200 and a display apparatus 100.

The test apparatus 200 is used for testing a chip by using a plurality of test methods to obtain original data.

The display device 100 is connected to the test device 200, and the display device of the chip test result in the above embodiment is used.

In the embodiment, the graphical user interface of the display device 100 is used for displaying the result data of the chip test in a graph more completely and intuitively in the chip test, so that the accuracy of analyzing the result data of the chip test is improved.

In an embodiment, an application programming interface 300 is also included.

The api 300 is connected to the test device 200, and the test device 200 generates raw data having a predetermined format during a process of testing a chip through the api 300.

In the embodiment, a set of application programming is provided through the application programming interface, so that when all the testing methods are tested, original data of chip testing results in a set format is generated according to the requirement of data analysis, so that the data analysis is convenient, and the analyzed data is applied to a graphical user interface.

The above description is only for the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive various changes or substitutions within the technical scope of the present invention, and these should be covered by the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; the connection can be mechanical connection, electrical connection or communication; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly above and obliquely above the second feature, or simply meaning that the first feature is at a lesser level than the second feature.

The above disclosure provides many different embodiments, or examples, for implementing different features of the invention. The components and arrangements of the specific examples are described above to simplify the present disclosure. Of course, they are merely examples and are not intended to limit the present invention. Furthermore, the present invention may repeat reference numerals and/or letters in the various examples, such repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. In addition, the present invention provides examples of various specific processes and materials, but one of ordinary skill in the art may recognize applications of other processes and/or uses of other materials.

Claims (13)

1. A method for displaying a chip test result is characterized by comprising the following steps:

obtaining original data obtained by testing a chip by using a plurality of testing methods;

analyzing the acquired original data to acquire a test result corresponding to each test method;

displaying each test method to be selected in a mode selection area of a graphical user interface;

selecting at least one test method in the mode selection area according to a mode selection instruction;

obtaining a test result corresponding to the selected test method; and

and displaying the test result corresponding to the selected test method in a result display area of the graphical user interface.

2. The method of claim 1, further comprising:

acquiring parameters corresponding to the selected test method; and

and displaying the acquired parameters in a parameter display area of the graphical user interface.

3. The method as claimed in claim 1, wherein the step of selecting at least one test method in the mode selection area according to the mode selection command comprises:

and selecting an icon corresponding to at least one test method from the icons corresponding to the plurality of test methods displayed in the mode selection area according to the mode selection instruction.

4. The method of any of claims 1 to 3, wherein the step of displaying the test result corresponding to the selected test method in a result display area of the graphical user interface comprises:

and displaying a single test result graph corresponding to the selected test method in the result display area, wherein the single test result graph comprises a success mark and a failure mark of the single test.

5. The method of any of claims 1 to 3, wherein the step of displaying the test result corresponding to the selected test method in a result display area of the graphical user interface comprises:

and displaying a plurality of test result graphs corresponding to the selected test methods in the result display area, wherein the plurality of test result graphs comprise the superposition effect of the success marks and the failure marks of the plurality of tests.

6. The method of any of claims 1 to 3, further comprising:

and obtaining the original data with a set format through an application programming interface.

7. A device for displaying results of a chip test, comprising:

the data acquisition module is used for acquiring original data obtained by testing the chip by using a plurality of testing methods;

the data analysis module is connected with the test module and used for carrying out data analysis on the acquired original data so as to obtain test results corresponding to each test method;

the graphic user interface module is connected with the data analysis module and is used for displaying each test method to be selected analyzed by the data analysis module in a mode selection area of the graphic user interface; according to a mode selection instruction, the graphical user interface module selects at least one test method on the mode selection area; the graphical user interface module acquires a test result corresponding to the selected test method; and displaying the test result corresponding to the selected test method in a result display area of the graphical user interface module.

8. The device of claim 7, wherein the graphical user interface module further comprises:

and the mode selection unit is used for selecting an icon corresponding to at least one test method from the icons corresponding to the plurality of test methods displayed in the mode selection area according to the mode selection instruction.

9. The device of claim 8, wherein the graphical user interface module comprises:

the parameter acquisition unit is used for acquiring parameters corresponding to the selected test method; and

and the parameter display unit is used for displaying the acquired parameters in a parameter display area of the graphical user interface.

10. The device of any of claims 7 to 9, wherein the graphical user interface module further comprises:

and the first result display unit is used for displaying a single test result graph corresponding to the selected test method in the result display area, wherein the single test result graph comprises a success mark and a failure mark of the single test.

11. The device of claim 10, wherein the graphical user interface module further comprises:

and the second result display unit is used for displaying a plurality of test result graphs corresponding to the selected test methods in the result display area, wherein the plurality of test result graphs comprise the superposition effect of the success marks and the failure marks of the plurality of tests.

12. A test system, comprising:

the test equipment is used for testing the chip by utilizing a plurality of test methods to obtain original data;

a display device connected to the test device, for displaying the test result of the chip according to any one of claims 7 to 11.

13. The test system of claim 12, further comprising:

and the test equipment generates the original data with a set format in the process of testing the chip through the application programming interface.

Images