CN110675788A - Display panel test assembly and display panel - Google Patents
Display panel test assembly and display panel Download PDFInfo
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- CN110675788A CN110675788A CN201810720257.2A CN201810720257A CN110675788A CN 110675788 A CN110675788 A CN 110675788A CN 201810720257 A CN201810720257 A CN 201810720257A CN 110675788 A CN110675788 A CN 110675788A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The invention discloses a display panel testing assembly and a display panel, wherein the display panel testing assembly comprises a testing switch group and a testing signal input area; the test signal input area comprises a first test control signal line, a test data signal line, a test power supply voltage signal line and a MUX switch control part; the first test control signal line is used for controlling the working state of the test switch group; the test data signal line is used for inputting a data signal to a data signal line of the display panel; the test power supply voltage signal line is used for providing working voltage for the display panel; and the MUX switch control part is used for controlling the plurality of MUX switches in the MUX switch group to be in an off state in the panel test process. The MUX switch control component closes the MUX switch group in the display panel in the panel testing process, so that the influence of a signal line where the MUX switch is located on a testing result is avoided, and the testing reliability of the display panel is improved.
Description
Technical Field
The invention relates to the technical field of display panels, in particular to a display panel testing assembly and a display panel.
Background
The MUX switch (MUX) scheme is often used in the structural design of a small-sized display panel, and is characterized in that signal lines of a plurality of display panels share the same signal input port to receive signals output by an Integrated Circuit (IC), thereby saving the number of signal input ports and reducing the occupation of the space of the display panel. For any signal input port, each signal wire connected with the signal input port is connected with the signal input port through a MUX switch, and when signals are input to the signal wires, the opening and closing of the MUX switch are controlled through time sequence to achieve data input of each signal wire.
In the manufacturing process of the display panel, the display panel is often required to be tested to screen out the unqualified display panel. However, when a display panel including mux. switch is tested, the problem of different monochrome pictures often occurs, and the phenomenon cannot be compensated randomly, so that the reliability of the test of the display panel cannot be guaranteed.
Disclosure of Invention
The invention provides a display panel testing assembly and a display panel, which are used for improving the reliability of testing of the display panel.
The embodiment of the invention provides a display panel testing assembly which is applied to a display panel comprising a plurality of MUX switch groups, wherein the testing assembly comprises a testing switch group and a testing signal input area;
the test signal input area comprises a first test control signal line, a test data signal line, a test power supply voltage signal line and a MUX switch control part;
the test switch group comprises a plurality of test switches, the grid electrode of each test switch is electrically connected with the first test control signal wire, the first electrode of each test switch is electrically connected with the test data signal wire, and the second electrode of each test switch is electrically connected with the data signal wire of the display panel;
the first test control signal line is used for controlling the working state of the test switch group;
the test data signal line is used for inputting data signals to the data signal line of the display panel through the test switch group;
the test power supply voltage signal wire is used for providing working voltage for the display panel;
the MUX switch control component is electrically connected with the MUX switches in the MUX switch group and used for controlling the MUX switches in the MUX switch group to be in an off state in the panel testing process.
Optionally, the MUX switch control unit includes a plurality of disconnection control lines, each of which is electrically connected to a gate of one MUX switch in the MUX switch group; each opening control line is externally connected with a closing signal in the panel testing process so as to control the corresponding MUX switch to be in an open state.
Optionally, the plurality of MUX groups have the same number of MUX switches;
and aiming at any two MUX switch groups in the plurality of MUX switch groups, the grids of the two MUX switches with the same position in the group are electrically connected with the same disconnection control line.
Optionally, the MUX switch control unit includes a disconnection switch group;
the set of disconnect switches comprises a plurality of disconnect switches; the number of the disconnecting switches is not less than that of the MUX switches in any MUX switch group;
the grid electrode of each disconnecting switch is electrically connected with the second test control signal wire, the first electrode of each disconnecting switch is externally connected with a closing signal, and the closing signal closes the MUX switch when the disconnecting switch is switched on; the second electrode of each disconnecting switch is electrically connected with the grid electrode of one MUX switch in the MUX switch group;
the second test control signal line is used for controlling the working state of the disconnecting switch.
Optionally, the second test control signal line is electrically connected to the first test control signal line.
Optionally, the close signal is a positive power voltage signal in a positive power voltage signal line of the display panel, or a negative power voltage signal in a negative power voltage signal line.
Optionally, the plurality of MUX switch groups have the same number of MUX switches;
for any two MUX switch groups in the plurality of MUX switch groups, the grid electrodes of the two MUX switches with the same position in the group are electrically connected with the second electrode of the same disconnection switch.
The embodiment of the invention provides a display panel, which comprises a pixel array, a signal connecting area and a plurality of MUX (multiplexer) switch groups, wherein the MUX switch groups are positioned between the pixel array and the signal connecting area; the signal connecting area is used for inputting signals generated by a driving circuit into the pixel array; the MUX switch group comprises a plurality of MUX switches, and the signal connection region comprises data signal connection points respectively corresponding to the MUX switch groups; the signal connection area also comprises a first control signal connection point for controlling the working state of each MUX switch in the MUX switch group;
the display panel further comprises a display panel testing assembly as described in any of the above.
Optionally, when the panel testing component includes the disconnection switch group, the signal connection area further includes a second control signal connection point, and one end of the second control signal connection point is electrically connected to the first testing control signal line; the other end of the control signal connection point is electrically connected with the grid electrode of each disconnecting switch.
Optionally, a test power supply voltage signal line in the display panel test assembly is a power supply voltage signal line of the display panel;
the signal connection region further includes a power supply voltage signal connection point electrically connected to the power supply voltage signal line.
In summary, the embodiment of the present invention provides a display panel testing assembly and a display panel, wherein the display panel testing assembly is applied to a display panel including a plurality of MUX switch sets, and the testing assembly includes a testing switch set and a testing signal input area; the test signal input area comprises a first test control signal line, a test data signal line, a test power supply voltage signal line and a MUX switch control part; the test switch group comprises a plurality of test switches, the grid electrode of each test switch is electrically connected with the first test control signal wire, the first electrode of each test switch is electrically connected with the test data signal wire, and the second electrode of each test switch is electrically connected with the data signal wire of the display panel; the first test control signal line is used for controlling the working state of the test switch group; a test data signal line for inputting a data signal to the data signal line of the display panel through the test switch group; the test power supply voltage signal wire is used for providing working voltage for the display panel; and the MUX switch control part is electrically connected with the MUX switches in the MUX switch group and is used for controlling the MUX switches in the MUX switch group to be in an off state in the panel testing process. The MUX switch control component in the display panel testing component can close the MUX switch group in the display panel in the panel testing process, so that the influence of interference signals in a signal line where the MUX switch is located on a testing result is avoided, the display panel can display according to data signals in a testing data signal line in the testing process, and then the testing result of the display panel can be obtained according to the display condition of the display panel on the data signals, and therefore the display panel testing component and the display panel provided by the embodiment of the invention can improve the testing reliability of the display panel.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
FIG. 1 is a schematic diagram of a conventional display panel;
fig. 2 is a schematic structural diagram of a display panel according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a possible display panel structure according to an embodiment of the present invention;
fig. 4 is a second schematic view of a possible display panel structure according to the embodiment of the invention;
fig. 5 is a third schematic view of a possible display panel structure according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the manufacturing process of the display panel, before a Chip On Film (COF) binding process, the display panel is often tested first to screen out unqualified display panels and only to perform COF binding On qualified display panels. Fig. 1 is a schematic structural diagram of a conventional display panel, as shown in fig. 1, the display panel includes a COF binding point, a panel test point, a test switch set, a plurality of MUX switch sets, and a pixel array. The pixel array comprises m columns of pixels including P1, P2, … … and Pm, each column of pixels is respectively connected with one MUX switch, every certain number of MUX switches are divided into a MUX switch group, the MUX switches in the same MUX switch group are electrically connected with the same data signal connection point (S1, … … and Sn in the figure) which is positioned above a COF binding point, the gates of the MUX switches are electrically connected with control signal connection points on the COF binding point, and fig. 1 shows that when 6 MUX switches are arranged in one MUX switch group, the gates of the MUX switches in the MUX switch group are respectively electrically connected with the control signal connection points SW1, SW2, SW3, SW4, SW5 and SW 6. When testing, the control signal is input from the control signal line SW in the panel test point to control the test switch group to be turned on, the display signals are input from the data signal lines DR, DG and DB in the panel test point to the pixel array, and the working voltage is provided to the pixel array from the power supply voltage signal lines VDD and VEE in the panel test point (not shown in the specific routing diagram 1). Since the display panel is not COF bonded, each signal connection point above the COF bonding point is actually in a floating (floating) state, and if static electricity occurs or residual charges exist in the process, in-plane data is affected, thereby causing monochrome picture difference. For example, when residual charges exist in SW1 and SW2 to turn on MUXA and MUXB, a data signal inputted from the data signal line DR and a data signal inputted from the data signal line DG affect each other between MUXA and MUXB, thereby causing monochrome rendering. As can be seen from the above example, the monochrome picture difference in this case is not caused by the quality of the display panel itself, but interferes with the test result of the display panel, and therefore, the reliability of the existing display panel test needs to be improved.
In order to solve the above problems, embodiments of the present invention provide a display panel testing assembly and a display panel, so as to improve the reliability of the display panel testing. The display panel provided by the embodiment of the invention comprises a pixel array, a signal connecting area and a plurality of MUX switch groups positioned between the pixel array and the signal connecting area; the signal connecting area is used for inputting signals generated by the driving circuit into the pixel array; the MUX switch group comprises a plurality of MUX switches, and the signal connection region comprises data signal connection points respectively corresponding to the MUX switch groups; the signal connection region further comprises a first control signal connection point for controlling the working state of each MUX switch in the MUX switch group. Fig. 2 is a schematic structural diagram of a display panel according to an embodiment of the present invention, which includes a pixel array a, a signal connection area B, and a plurality of MUX switch sets C located between the pixel array a and the signal connection area B, specifically, MUX switch sets C1, … … and MUX switch set Cn in fig. 2; the signal connection region B is a region corresponding to a COF binding point of the display panel, and can be used for inputting a signal generated by the driving circuit into the pixel array A after the COF binding is finished; the MUX switch group C includes a plurality of MUX switches, the signal connection region B includes data signal connection points corresponding to the plurality of MUX switch groups C, respectively, n MUX switch groups C are shared in fig. 2, and therefore, n data signal connection points in the signal link region B are also n, i.e., S1, … …, Sn; the signal connection region B further includes a first control signal connection point for controlling the operation state of each MUX switch in the MUX switch group C. The number of first control signal connection points in signal connection region B depends on the number of MUX switches in MUX switch group C, and as shown in fig. 2, when six MUX switches are included in one MUX switch group C, six first control signal connection points including SW1, SW2, SW3, SW4, SW5 and SW6 are included in signal connection region B.
The display panel provided by the embodiment of the invention further comprises the panel testing assembly provided by the embodiment of the invention. The test component comprises a test switch group and a test signal input area; the test signal input area comprises a first test control signal line, a test data signal line, a test power supply voltage signal line and a MUX switch control part; the test switch group comprises a plurality of test switches, the grid electrode of each test switch is electrically connected with the first test control signal wire, the first electrode of each test switch is electrically connected with the test data signal wire, and the second electrode of each test switch is electrically connected with the data signal wire of the display panel; the first test control signal line is used for controlling the working state of the test switch group; a test data signal line for inputting a data signal to the data signal line of the display panel through the test switch group; the test power supply voltage signal wire is used for providing working voltage for the display panel; and the MUX switch control part is electrically connected with the MUX switches in the MUX switch group and is used for controlling the MUX switches in the MUX switch group to be in an off state in the panel testing process.
In the display panel shown in fig. 2, the testing assembly provided by the embodiment of the invention is also shown, and the testing assembly includes a testing switch group D1 and a testing signal input area D2. Among them, the test signal input section D2 includes a first test control signal line SWA, test Data signal lines DR, DG, and DB, hereinafter collectively referred to as test Data signal lines Data, test power supply voltage signal lines VDD and VEE, and a MUX switch control section SWD. The test switch group D1 includes a plurality of test switches, a gate of each test switch is electrically connected to the first test control signal line SWA, a first electrode of each test switch is electrically connected to the test Data signal line Data, and a second electrode of each test switch is electrically connected to the Data signal line LD of the display panel; a first test control signal line SW21 for controlling the operating state of the test switch group D1; a test Data signal line Data for inputting a Data signal to the Data signal line LD of the display panel through the test switch group D1; the test power supply voltage signal lines VDD and VEE are used for providing working voltage for the display panel; and the MUX switch control part SWD is electrically connected with the MUX switches in the MUX switch group C and is used for controlling the MUX switches in the MUX switch group C to be in an off state in the panel testing process.
The MUX switch control component SWD in the display panel testing assembly can close the MUX switch group C in the display panel in the panel testing process, so that the influence of interference signals in a signal line where the MUX switch is located on a testing result is avoided, the display panel can display according to Data signals in the testing Data signal line Data in the testing process, and then the testing result of the display panel can be obtained according to the display condition of the display panel on the Data signals, and therefore the display panel testing assembly and the display panel provided by the embodiment of the invention can improve the testing reliability of the display panel.
In the embodiment of the invention, the MUX switch group C is closed in the panel test process through the MUX switch control part SWD, so that the reliability of the display panel test is improved. Optionally, an embodiment of the present invention provides a feasible implementation manner of the MUX switch control unit SWD. The MUX switch control part comprises a plurality of disconnection control lines, and each disconnection control line is electrically connected with the gate of one MUX switch in the MUX switch group; each opening control line is externally connected with a closing signal in the panel testing process so as to control the corresponding MUX switch to be in an open state. Fig. 3 is a schematic diagram of a possible display panel structure provided by an embodiment of the invention, and as shown in fig. 3, the MUX switch control unit SWD includes a plurality of off control lines SL, i.e., SL1, SL2, SL3, SL4, SL5 and SL6 in fig. 3, each of the off control lines SL is electrically connected to a gate of one MUX switch in the MUX switch group C; each open control line SL is externally connected with a close signal in the panel test process, so as to control the corresponding MUX switch to be in an open state. In a specific implementation process, the close signal may be determined according to a specific implementation form of the MUX switch, for example, when the MUX switch is a P-Channel Metal Oxide Semiconductor (PMOS) transistor, the close signal is a high voltage signal, and when the MUX switch is an N-Channel Metal Oxide Semiconductor (NMOS) transistor, the close signal is a low voltage signal. When the display panel shown in fig. 3 is tested, the first test control signal line SWA controls the test switch group D1 to be turned on, and the test Data signal line Data inputs a Data signal to the pixel array a. Meanwhile, the opening control signal lines SL1, SL2, SL3, SL4, SL5 and SL6 input closing signals to the gates of the respective MUX switches to close the respective MUX switches, so that monochrome picture difference caused by static electricity or residual charges in the MUX switches is prevented, and the reliability of the display panel test is improved.
Optionally, the plurality of MUX switch groups in the display panel have the same number of MUX switches; for any two MUX switch groups in the plurality of MUX switch groups, the grids of the two MUX switches with the same position in the group are electrically connected with the same disconnection control line. As shown in fig. 3, the MUX switch group C1 includes six MUX switches, and the MUX switch group Cn also includes six MUX switches, so that the same control signal access points SW1, SW2, SW3, SW4, SW5 and SW6 can be used to simultaneously provide switch control signals for the MUX switch group 1 and the MUX switch group 2 when the display panel is in operation. When the plurality of MUX switch groups C of the display panel have the same number of MUX switches, for any two MUX switch groups in the plurality of MUX switch groups C, gates of two MUX switches having the same position in the group are electrically connected to the same disconnection control line SL. As shown in fig. 3, MUX switch T12 is the second MUX switch in MUX switch group C1, MUX switch Tn2 is also the second MUX switch in MUX switch group Cn, and the gates of MUX switch T12 and MUX switch Tn2 are both electrically connected to disconnection control line SL 2. For the MUX switch groups with the same number of MUX switches, the gates of two MUX switches with the same position in any two MUX switch groups are electrically connected to the same disconnection control line SL, so that the number of disconnection control lines SL in the MUX switch control unit SWD can be reduced, and the display panel can be miniaturized.
In the above-described embodiment, the off control of the MUX switch by the MUX switch control section SWD at the time of the panel test is realized by providing the off control line SL in the MUX switch control section SWD. In addition, the embodiment of the invention also provides another implementation mode of the MUX switch control component. Optionally, the MUX switch control unit further includes a disconnection switch group; the disconnecting switch group comprises a plurality of disconnecting switches; the number of the disconnecting switches is not less than that of the MUX switches in any MUX switch group; the grid electrode of each disconnecting switch is electrically connected with the second test control signal wire, the first electrode of each disconnecting switch is externally connected with a closing signal, and the closing signal closes the MUX switch when the disconnecting switch is switched on; the second electrode of each disconnecting switch is electrically connected with the grid electrode of one MUX switch in the MUX switch group; the second test control signal line is used for controlling the working state of the disconnection switch. Fig. 4 is a second schematic diagram of a possible display panel structure according to the embodiment of the invention, as shown in fig. 4, the MUX switch control unit SWD includes an off switch group SWC; the disconnecting switch group comprises a plurality of disconnecting switches, and the number of the disconnecting switches in fig. 4 is six, and the number of the disconnecting switches is not less than that of the MUX switches in any MUX switch group C; the grid electrode of each disconnecting switch is electrically connected with the second test control signal line SWB, the first electrode of each disconnecting switch is externally connected with a closing signal, and the closing signal closes the MUX switch when the disconnecting switch is switched on; the second electrode of each disconnecting switch is electrically connected with the grid electrode of one MUX switch in the MUX switch group C; the second test control signal line SWB is used to control the operating state of the disconnection switch. In the display panel shown in fig. 4, the MUX switch controlling part is no longer a plurality of disconnection signal lines, thereby omitting the number of signal input terminals in the test signal input area D2, which is advantageous to reduce the size of the display panel. When the display panel shown in fig. 4 is tested, the first test control signal line SWA controls the test switch group D1 to be turned on, and the test Data signal line Data inputs a Data signal to the pixel array a. Meanwhile, the second test control signal line SWB controls the opening of the switch-off group SWC, and the closing signals are input to the grid electrodes of the MUX switches through the switch-off of the switch-off groups, so that the MUX switches are closed, and therefore monochrome picture difference caused by static electricity or residual charges in the MUX switches is prevented, and the reliability of the test of the display panel is improved.
On the basis of the display panel structure shown in fig. 4, the structure of the MUX switch control section can be further simplified to accommodate a small-sized display panel. Fig. 5 is a third schematic diagram of a possible display panel structure according to the embodiment of the present invention, and optionally, the second test control signal line SWB is electrically connected to the first test control signal line SWA (indicated by SWA & B in fig. 5), and the two signal lines are used for inputting the same signal, so that an input end of a test control signal is saved, and it should be understood that in this case, the test switch in the test switch group D1 and the disconnecting switch in the disconnecting switch group SWC should be the same type of switch, such as both PMOS transistors or both NMOS transistors. When the display panel is tested, the same test control signal is input to the first test control signal line SWA and the second test control signal line SWB, and the second test control signal line SWB controls the turn-off switch group SWC to be turned on while the first test control signal line SWA controls the turn-on of the test switch group D1.
In the display panel shown in fig. 5, the close signal is optionally a positive supply voltage signal in the positive supply voltage signal line VDD of the display panel, or a negative supply voltage signal in the negative supply voltage signal line VEE. The use of the existing supply voltage signal lines VDD and VEE directly in the display panel may save the closed signal input terminals, thereby further simplifying the MUX switch control part. In particular embodiments, whether the closing switch is a positive supply voltage signal or a negative supply voltage signal may depend on the type of closing switch. For example, when the closed switch is a PMOS transistor, the closed switch is the positive supply voltage in the positive supply voltage signal line VDD, i.e., as shown in fig. 5; when the closing switch is an NMOS transistor, the closing switch is the negative supply voltage in the negative supply voltage signal line VEE.
Alternatively, based on the display panel shown in fig. 4 or 5, a plurality of MUX groups of the display panel have the same number of MUX switches; for any two MUX switch groups in the plurality of MUX switch groups, the grids of the two MUX switches with the same position in the group are electrically connected with the second electrode of the same disconnection switch. As shown in fig. 5, the MUX switch group C1 includes six MUX switches, and the MUX switch group Cn also includes six MUX switches, so that the same control signal access points SW1, SW2, SW3, SW4, SW5 and SW6 can be used to simultaneously provide switch control signals for the MUX switch group 1 and the MUX switch group 2 when the display panel is in operation. When the plurality of MUX switch groups C of the display panel have the same number of MUX switches, for any two MUX switch groups in the plurality of MUX switch groups C, gates of two MUX switches with the same position in the group are electrically connected to the second electrode of the same disconnection switch. As shown in fig. 4, MUX switch T12 is the second MUX switch in MUX switch group C1, MUX switch Tn2 is also the second MUX switch in MUX switch group Cn, and MUX switch T12 and MUX switch Tn2 are electrically connected to the second electrode of the same one of the disconnect switches in the disconnect switch group. For the MUX switch groups with the same MUX switch number, the grids of two MUX switches with the same position in any two MUX switch groups are electrically connected with the second electrode of the same disconnecting switch, so that the number of the disconnecting switches in the disconnecting switch group SWC can be reduced, and the miniaturization of the display panel is facilitated.
Optionally, as shown in fig. 5, when the panel test assembly includes the off switch group SWC, the signal connection region B further includes a second control signal connection point SW, and one end of the second control signal connection point SW is electrically connected to the first test control signal line SWA; the other end of the control signal connection point SW is electrically connected to the gate of each disconnect switch. After the COF bonding process is completed, the driver circuit inputs the SW signal from the second control signal access point SW, and the SW signal is input to the gate of each test switch in the test switch group D1 through the first test control signal line SWA, so as to control the test switch to be closed. Meanwhile, the SW signal is input into the grid of each disconnecting switch to control the closing of the disconnecting switch, so that the influence of the panel testing component on the display panel when the display panel works is avoided.
Optionally, as shown in fig. 5, the test power voltage signal lines VDD and VEE in the display panel test assembly are power voltage signal lines of the display panel; the signal connection region further includes power supply voltage signal connection points Vdd and Vee electrically connected to the power supply voltage signal lines Vdd and Vee, respectively. No matter when the display panel tests or works, the function of testing the power supply voltage signal line VDD and the VEE provides working voltage for the display panel, therefore, the test and the working are suitable for the same set of VDD and VEE wiring, the display panel space can be saved without repeated arrangement, and the display panel is favorable for miniaturization.
In summary, the embodiment of the present invention provides a display panel testing assembly and a display panel, wherein the display panel testing assembly is applied to a display panel including a plurality of MUX switch sets, and the testing assembly includes a testing switch set and a testing signal input area; the test signal input area comprises a first test control signal line, a test data signal line, a test power supply voltage signal line and a MUX switch control part; the test switch group comprises a plurality of test switches, the grid electrode of each test switch is electrically connected with the first test control signal wire, the first electrode of each test switch is electrically connected with the test data signal wire, and the second electrode of each test switch is electrically connected with the data signal wire of the display panel; the first test control signal line is used for controlling the working state of the test switch group; a test data signal line for inputting a data signal to the data signal line of the display panel through the test switch group; the test power supply voltage signal wire is used for providing working voltage for the display panel; and the MUX switch control part is electrically connected with the MUX switches in the MUX switch group and is used for controlling the MUX switches in the MUX switch group to be in an off state in the panel testing process. The MUX switch control component in the display panel testing component can close the MUX switch group in the display panel in the panel testing process, so that the influence of interference signals in a signal line where the MUX switch is located on a testing result is avoided, the display panel can display according to data signals in a testing data signal line in the testing process, and then the testing result of the display panel can be obtained according to the display condition of the display panel on the data signals, and therefore the display panel testing component and the display panel provided by the embodiment of the invention can improve the testing reliability of the display panel.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. The display panel testing assembly is applied to a display panel comprising a plurality of MUX switch groups, and comprises a testing switch group and a testing signal input area;
the test signal input area comprises a first test control signal line, a test data signal line, a test power supply voltage signal line and a MUX switch control part;
the test switch group comprises a plurality of test switches, the grid electrode of each test switch is electrically connected with the first test control signal wire, the first electrode of each test switch is electrically connected with the test data signal wire, and the second electrode of each test switch is electrically connected with the data signal wire of the display panel;
the first test control signal line is used for controlling the working state of the test switch group;
the test data signal line is used for inputting data signals to the data signal line of the display panel through the test switch group;
the test power supply voltage signal wire is used for providing working voltage for the display panel;
the MUX switch control component is electrically connected with the MUX switches in the MUX switch group and used for controlling the MUX switches in the MUX switch group to be in an off state in the panel testing process.
2. The test assembly of claim 1, wherein the MUX switch control component includes a plurality of disconnect control lines, each disconnect control line electrically connected to a gate of one MUX switch in the MUX switch bank; each opening control line is externally connected with a closing signal in the panel testing process so as to control the corresponding MUX switch to be in an open state.
3. The test assembly of claim 2, wherein the plurality of MUX switch groups have the same number of MUX switches;
and aiming at any two MUX switch groups in the plurality of MUX switch groups, the grids of the two MUX switches with the same position in the group are electrically connected with the same disconnection control line.
4. The test assembly of claim 1, wherein the MUX switch control component includes a set of disconnect switches;
the set of disconnect switches comprises a plurality of disconnect switches; the number of the disconnecting switches is not less than that of the MUX switches in any MUX switch group;
the grid electrode of each disconnecting switch is electrically connected with the second test control signal wire, the first electrode of each disconnecting switch is externally connected with a closing signal, and the closing signal closes the MUX switch when the disconnecting switch is switched on; the second electrode of each disconnecting switch is electrically connected with the grid electrode of one MUX switch in the MUX switch group;
the second test control signal line is used for controlling the working state of the disconnecting switch.
5. The test assembly of claim 4, wherein the second test control signal line is electrically connected to the first test control signal line.
6. The test assembly of claim 4, wherein the close signal is a positive supply voltage signal in a positive supply voltage signal line of the display panel or a negative supply voltage signal in a negative supply voltage signal line.
7. The test assembly of claim 4, wherein the plurality of MUX groups have the same number of MUX switches;
for any two MUX switch groups in the plurality of MUX switch groups, the grid electrodes of the two MUX switches with the same position in the group are electrically connected with the second electrode of the same disconnection switch.
8. A display panel is characterized by comprising a pixel array, a signal connection area and a plurality of MUX switch groups positioned between the pixel array and the signal connection area; the signal connecting area is used for inputting signals generated by a driving circuit into the pixel array; the MUX switch group comprises a plurality of MUX switches, and the signal connection region comprises data signal connection points respectively corresponding to the MUX switch groups; the signal connection area also comprises a first control signal connection point for controlling the working state of each MUX switch in the MUX switch group;
the display panel further comprising a display panel test assembly according to any one of claims 1 to 7.
9. The display panel of claim 8, wherein when the panel test assembly includes the set of disconnection switches, the signal connection section further includes a second control signal connection point, one end of the second control signal connection point being electrically connected to the first test control signal line; the other end of the control signal connection point is electrically connected with the grid electrode of each disconnecting switch.
10. The display panel of claim 8, wherein the test supply voltage signal line in the display panel test assembly is a supply voltage signal line of the display panel;
the signal connection region further includes a power supply voltage signal connection point electrically connected to the power supply voltage signal line.
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| CN201810720257.2A CN110675788A (en) | 2018-07-03 | 2018-07-03 | Display panel test assembly and display panel |
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| CN201810720257.2A CN110675788A (en) | 2018-07-03 | 2018-07-03 | Display panel test assembly and display panel |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102968946A (en) * | 2012-08-23 | 2013-03-13 | 友达光电股份有限公司 | Detection circuit of display panel |
| CN104217671A (en) * | 2013-06-03 | 2014-12-17 | 三星显示有限公司 | Organic light emitting display panel |
| CN206097859U (en) * | 2016-10-12 | 2017-04-12 | 上海天马微电子有限公司 | Display panel and display device |
| CN107452307A (en) * | 2017-05-16 | 2017-12-08 | 友达光电股份有限公司 | Display panel |
| US20180026117A1 (en) * | 2016-07-22 | 2018-01-25 | Everdisplay Optronics (Shanghai) Limited | Display device |
-
2018
- 2018-07-03 CN CN201810720257.2A patent/CN110675788A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102968946A (en) * | 2012-08-23 | 2013-03-13 | 友达光电股份有限公司 | Detection circuit of display panel |
| CN104217671A (en) * | 2013-06-03 | 2014-12-17 | 三星显示有限公司 | Organic light emitting display panel |
| US20180026117A1 (en) * | 2016-07-22 | 2018-01-25 | Everdisplay Optronics (Shanghai) Limited | Display device |
| CN206097859U (en) * | 2016-10-12 | 2017-04-12 | 上海天马微电子有限公司 | Display panel and display device |
| CN107452307A (en) * | 2017-05-16 | 2017-12-08 | 友达光电股份有限公司 | Display panel |
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