CN110672649A - Image identification processing method and control system based on dual-energy X-ray - Google Patents

Image identification processing method and control system based on dual-energy X-ray Download PDF

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Publication number
CN110672649A
CN110672649A CN201910955817.7A CN201910955817A CN110672649A CN 110672649 A CN110672649 A CN 110672649A CN 201910955817 A CN201910955817 A CN 201910955817A CN 110672649 A CN110672649 A CN 110672649A
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energy
ore
ray
dual
projection data
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徐道际
王斌
肖杰
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ANHUI HONGSHI OPTIC ELECTROMECHANICAL HI-TECH Co Ltd
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ANHUI HONGSHI OPTIC ELECTROMECHANICAL HI-TECH Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/084Investigating materials by wave or particle radiation secondary emission photo-electric effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/401Imaging image processing

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention relates to the field of ore dressing, and discloses an image identification processing method based on dual-energy X-ray, which comprises the following steps: conveying the ore to a dual-energy X-ray scanning radiation area through a conveying device to obtain a high-energy projection data graph and a low-energy projection data graph; performing dual-energy decomposition on the high-energy projection data graph and the low-energy projection data graph to obtain an ore decomposition coefficient, fitting the ore decomposition coefficient by using a least square method to obtain an extremely small value point, and obtaining an extremely small value by using the extremely small value point; calculating the equivalent atomic number and electron density of each pixel of the inspected object by taking the decomposition coefficient of the base material as an initial value; calculating a mass attenuation coefficient corresponding to the photoelectric effect according to the equivalent atomic number and the electron density of each pixel, and utilizing the mass attenuation coefficient corresponding to the photoelectric effect; the distribution diagram of the ore is obtained according to the mass attenuation coefficient calculation, the equivalent atomic number and the electron density, the ore separation can be effectively carried out, the ore separation effect is high, and the ore separation effect is good.

Description

Image identification processing method and control system based on dual-energy X-ray
Technical Field
The invention relates to the field of ore dressing, in particular to an image identification processing method and a control system based on dual-energy X-ray.
Background
The dual-energy X-ray technology provides a powerful approach for realizing accurate material identification, the dual-energy X-ray acquires projection data under two different X-ray energy spectrums, generally and respectively recorded as a high-energy projection data graph and a low-energy projection data graph, and then a distribution image of the atomic number Z and the electron density of a scanned object can be obtained through simultaneous reconstruction by a special material decomposition method, so that the material identification is realized by obtaining the atomic number. Since the attenuation coefficient of a substance varies with the energy of photons, X-rays have a very wide energy spectrum and are not monochromatic, the projection model of conventional CT should be nonlinear, and the direct reconstruction of projection data yields the equivalent attenuation coefficient. Ore refers to a collection of minerals from which useful components can be extracted or which themselves have some property that can be exploited. Can be divided into metal mineral and nonmetal mineral. The unit content of useful components (elements or minerals) in the ore is called ore grade, the precious metal ore such as gold and platinum is expressed in grams/ton, and other ores are expressed in percentage. But the existing ore dressing effect is poor and the ore dressing efficiency is low.
How to solve the technical problems becomes a difficult problem to be solved urgently.
Disclosure of Invention
The invention aims to provide an image identification processing method and a control system based on dual-energy X-ray, so as to solve the problems mentioned in the background technology.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
an image identification processing method based on dual-energy X-ray is characterized by comprising the following steps: s1, conveying the ore to a dual-energy X-ray scanning radiation area through a conveying device to obtain a high-energy projection data graph and a low-energy projection data graph; s2, performing dual-energy decomposition on the high-energy projection data graph and the low-energy projection data graph to obtain an ore decomposition coefficient, fitting the ore decomposition coefficient by using a least square method to obtain an extremely small value point, and obtaining an extremely small value by using the extremely small value point; s3, taking the decomposition coefficient of the base material as an initial value, and calculating the equivalent atomic number and the electron density of each pixel of the inspected object; s4, calculating a mass attenuation coefficient corresponding to the photoelectric effect according to the equivalent atomic number and the electron density of each pixel, and utilizing the mass attenuation coefficient corresponding to the photoelectric effect; and S5, obtaining a distribution map of the ore according to the mass attenuation coefficient, the equivalent atomic number and the electron density, and effectively carrying out ore dressing, wherein the ore dressing effect is high and good.
Further, the dual-energy X-ray is emitted by an integrated X-ray generator, the outlet of the X-ray generator is in a fan shape, and a collimator with a fan-shaped opening is installed at the outlet of the integrated X-ray generator.
Further, the fan-shaped maximum radiation fan-shaped angle range is 80-150 degrees.
Further, a high-energy projection data map and a low-energy projection data map are obtained through the X-ray receiving detection module.
The present invention also provides a control system for image recognition processing based on dual-energy X-ray, which is characterized by comprising: a controller; the high-energy projection module is used for emitting high-energy X rays and scanning an ore area; the low-energy projection module is used for emitting low-energy X rays and scanning an ore region; the receiving module is used for receiving the high-energy X-rays and the low-energy X-rays which penetrate through the ore; the processing module is used for calculating to obtain an equivalent atomic number and an electron density to obtain a distribution map of the ore; and the display module is used for displaying the data information obtained by calculation. The high-energy projection module, the low-energy projection module, the receiving module, the processing module and the display module are all connected with the controller.
Compared with the prior art, the invention has the advantages that:
this scheme can effectually carry out ore dressing, and the ore dressing effect is high, and the ore dressing effect is good.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a block diagram of the method of the present invention;
fig. 2 is a system block diagram of the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings so that the advantages and features of the present invention can be more easily understood by those skilled in the art, and the scope of the present invention will be more clearly and clearly defined.
Referring to fig. 1, an image recognition processing method based on dual-energy X-ray includes: s1, conveying the ore to a dual-energy X-ray scanning radiation area through a conveying device to obtain a high-energy projection data graph and a low-energy projection data graph; s2, performing dual-energy decomposition on the high-energy projection data graph and the low-energy projection data graph to obtain an ore decomposition coefficient, fitting the ore decomposition coefficient by using a least square method to obtain an extremely small value point, and obtaining an extremely small value by using the extremely small value point; s3, taking the decomposition coefficient of the base material as an initial value, and calculating the equivalent atomic number and the electron density of each pixel of the inspected object; s4, calculating a mass attenuation coefficient corresponding to the photoelectric effect according to the equivalent atomic number and the electron density of each pixel, and utilizing the mass attenuation coefficient corresponding to the photoelectric effect; and S5, obtaining a distribution map of the ore according to the mass attenuation coefficient, the equivalent atomic number and the electron density, and effectively carrying out ore dressing, wherein the ore dressing effect is high and good.
In this embodiment, the dual-energy X-ray is emitted by an integrated X-ray generator, an outlet of the X-ray generator is fan-shaped, and a collimator having a fan-shaped opening is installed at the outlet of the integrated X-ray generator.
In this embodiment, the maximum radiation fan angle range of the fan shape is 80-150 °.
In this embodiment, the high-energy projection data map and the low-energy projection data map are obtained by the X-ray receiving and detecting module.
This is the working principle of the image recognition processing method based on dual-energy X-ray, and the contents not described in detail in this specification are all the prior arts well known to those skilled in the art.
The present disclosure further provides a control system for dual-energy X-ray-based image recognition processing, as shown in fig. 2, including: a controller; the high-energy projection module is used for emitting high-energy X rays and scanning an ore area; the low-energy projection module is used for emitting low-energy X rays and scanning an ore region; the receiving module is used for receiving the high-energy X-rays and the low-energy X-rays which penetrate through the ore; the processing module is used for calculating to obtain an equivalent atomic number and an electron density to obtain a distribution map of the ore; and the display module is used for displaying the data information obtained by calculation. The high-energy projection module, the low-energy projection module, the receiving module, the processing module and the display module are all connected with the controller.
Although the embodiments of the present invention have been described with reference to the accompanying drawings, various changes or modifications may be made by the patentees within the scope of the appended claims, and within the scope of the invention, as long as they do not exceed the scope of the invention described in the claims.

Claims (5)

1. An image identification processing method based on dual-energy X-ray is characterized by comprising the following steps:
s1, conveying the ore to a dual-energy X-ray scanning radiation area through a conveying device to obtain a high-energy projection data graph and a low-energy projection data graph;
s2, performing dual-energy decomposition on the high-energy projection data graph and the low-energy projection data graph to obtain an ore decomposition coefficient, fitting the ore decomposition coefficient by using a least square method to obtain an extremely small value point, and obtaining an extremely small value by using the extremely small value point;
s3, taking the decomposition coefficient of the base material as an initial value, and calculating the equivalent atomic number and the electron density of each pixel of the inspected object;
s4, calculating a mass attenuation coefficient corresponding to the photoelectric effect according to the equivalent atomic number and the electron density of each pixel, and utilizing the mass attenuation coefficient corresponding to the photoelectric effect;
and S5, calculating according to the mass attenuation coefficient, and obtaining the distribution diagram of the ore through the equivalent atomic number and the electron density.
2. The image recognition processing method based on dual-energy X-ray as claimed in claim 1, wherein the dual-energy X-ray is emitted by an integrated X-ray generator, the outlet of the X-ray generator is shaped like a fan, and a collimator with a fan-shaped opening is installed at the outlet of the integrated X-ray generator.
3. The dual-energy X-ray-based image recognition processing method according to claim 2, wherein the maximum radiation fan angle of the fan is in a range of 80 to 150 °.
4. The dual-energy X-ray-based image recognition processing method of claim 1, wherein the high-energy projection data map and the low-energy projection data map are obtained by an X-ray receiving detection module.
5. A control system for the dual-energy X-ray based image recognition processing as claimed in any one of claims 1 to 4, comprising:
a controller;
the high-energy projection module is used for emitting high-energy X rays and scanning an ore area;
the low-energy projection module is used for emitting low-energy X rays and scanning an ore region;
the receiving module is used for receiving the high-energy X-rays and the low-energy X-rays which penetrate through the ore;
the processing module is used for calculating to obtain an equivalent atomic number and an electron density to obtain a distribution map of the ore;
and the display module is used for displaying the data information obtained by calculation.
The high-energy projection module, the low-energy projection module, the receiving module, the processing module and the display module are all connected with the controller.
CN201910955817.7A 2019-10-09 2019-10-09 Image identification processing method and control system based on dual-energy X-ray Pending CN110672649A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114113169A (en) * 2021-11-19 2022-03-01 数岩科技股份有限公司 Method and device for determining mineral distribution, electronic equipment and computer storage medium
CN114113169B (en) * 2021-11-19 2024-05-31 数岩科技股份有限公司 Method and device for determining mineral distribution, electronic equipment and computer storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114113169A (en) * 2021-11-19 2022-03-01 数岩科技股份有限公司 Method and device for determining mineral distribution, electronic equipment and computer storage medium
CN114113169B (en) * 2021-11-19 2024-05-31 数岩科技股份有限公司 Method and device for determining mineral distribution, electronic equipment and computer storage medium

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