CN110660035A - Image distortion correction method for microscope system - Google Patents
Image distortion correction method for microscope system Download PDFInfo
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- CN110660035A CN110660035A CN201911057398.1A CN201911057398A CN110660035A CN 110660035 A CN110660035 A CN 110660035A CN 201911057398 A CN201911057398 A CN 201911057398A CN 110660035 A CN110660035 A CN 110660035A
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- G—PHYSICS
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
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- G06T5/80—Geometric correction
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
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Abstract
The invention discloses a method for correcting image distortion of a microscope system, which comprises an FPGA, a light source driving circuit, a laser head, an image sensor and an image display, and is characterized in that: the method comprises the following steps: step 1: self-checking a power-on system; step 2: starting a stroboscopic illumination light source; and step 3: collecting M bright field images; and 4, step 4: collecting N dark field images; and 5: preprocessing an image; step 6: synthesizing images under a bright and dark field; and 7: establishing an image distortion model; and 8: performing image distortion correction; and step 9: and the distortion correction is finished. The method can be widely applied to various microscope systems, and realizes high-precision correction of image distortion of the microscope systems.
Description
Technical Field
The invention belongs to the technical field of image processing, and particularly relates to a method for correcting image distortion of a microscope system.
Background
With the wide application of CCD and CMOS cameras in the microscopic field and the rapid development of display technology, the functions of the microscope are also improved, the microscope becomes simpler and more convenient and easier to operate, and the microscope with the camera and capable of providing digital image output is more and more developed in various scientific research fields such as biology, medicine, chemical industry and the like.
The image distortion is image distortion of different degrees caused by geometric characteristics of an optical system and assembly and processing errors of the optical system in a production process, and common image distortion comprises pincushion distortion and barrel distortion. Although the image distortion does not affect the imaging definition, the image distortion and deformation can be caused, and the quality is seriously affected.
At present, bright field and dark field detection technologies are generally adopted in the field of detection instruments and machine vision, both technologies utilize reflected light to construct images, the reflected light in a bright field system is approximately specular reflection, a dark field system utilizes diffuse reflection of the light to construct images, and the bright field and the dark field both have respective specific image feature capture types.
The laser light source has the characteristics of good monochromaticity, high brightness and good directivity, can provide high-intensity illumination, and can increase the capturing capacity of image signals by adopting the laser light source as matched illumination equipment.
The microscope can amplify tiny objects to a scale which can be observed by naked eyes of people, and in the field of biology, scientific researchers can observe various microorganisms and biological tissues by using the microscope; in the chemical field, various chemical experiments and preparation of samples are not carried out with a microscope; in the medical field, medical workers often use a microscope to observe various examination materials such as pathological sections and the like to assist in further diagnosis of the state of an illness of a patient. However, if the output image is distorted during the use of the microscope, the distortion affects the result of scientific research to some extent, and even affects the judgment of medical staff on the condition of the patient.
The Chinese patent with the application publication number of CN 103353388A and the invention name of "binocular body type microscopic imaging system calibration method and device with the camera shooting function" discloses a calibration method and device of a binocular body type microscopic imaging system with the camera shooting function, which comprises the steps of design and preparation of a calibration plate, acquisition of an image of the calibration plate, detection of the image of the calibration plate, calculation of three-dimensional coordinate values of feature points on the calibration plate, determination of the corresponding relation between the feature points and the image points, construction of a microscopic imaging system distortion model, estimation of initial values of parameters of the microscopic imaging system, and self-calibration optimization operation. The application scene of the method has great limitation, and the method is only suitable for the image distortion correction of a binocular vision-based microscope system and is not suitable for a general monocular microscope.
The Chinese patent with the application publication number of CN 106204421A and the invention name of 'a rapid distortion correction method for super-wide-angle images' discloses a rapid distortion correction method for super-wide-angle images, and the images are corrected through a longitude model. Firstly, determining a spherical center and an initial radius by using image distortion characteristics, then optimizing the radius according to the position of each pixel, performing space coordinate conversion of an original image and a corrected image through coordinate conversion, and finally acquiring color information by using bilinear interpolation. One of the imaging characteristics of the microscopic image is that the imaging visual field range is small, and the distortion correction method aiming at the ultra-wide angle image is obviously not suitable for the image distortion correction of the microscopic system.
Chinese patent with application publication No. CN 104809696 a and entitled "image distortion correction method and system" discloses an image distortion correction method and system. The image distortion correction method comprises the following steps: step S1: the method comprises the steps of distorting an original picture of a reference picture to obtain a distorted picture of the reference picture, wherein N discrete points are marked in the reference picture, N is larger than or equal to 1, and N is a natural number; step S2: obtaining the position of each discrete point in the original picture and the position of each discrete point in the distorted picture; step S3: subtracting the position of the discrete point in the original picture from the position of the discrete point in the distorted picture to obtain a shift vector of the discrete point; step S4: calculating a shift vector field of the whole image of the reference picture by adopting an interpolation method; step S5: and carrying out image distortion correction on the image to be corrected according to the shift vector field. Since the imaging system of the microscope is greatly different from the conventional lens in the optical-mechanical structure, and the system model of the imaging system is inconsistent, the correction method is not suitable for the image distortion correction of the microscope system.
In a microscopic system image distortion correction method, the main problems existing at present are that: the traditional image distortion correction method is not applicable to a microscope system, the existing image distortion correction method for the microscope system has limitations in practical use, the correction precision is to be improved, and a high-precision image distortion correction method which can be generally applicable to the microscope system is lacked.
Disclosure of Invention
In order to solve the problems in the prior art, the invention discloses a method for correcting image distortion of a microscope system.
In order to achieve the purpose, the invention adopts the following technical scheme: a microscope system image distortion correction method comprises an FPGA, a light source driving circuit, a laser head, an image sensor and an image display, and is characterized in that: the method comprises the following steps:
step 1: self-checking a power-on system;
step 2: starting a stroboscopic illumination light source;
and step 3: collecting M bright field images;
and 4, step 4: collecting N dark field images;
and 5: preprocessing an image;
step 6: synthesizing images under a bright and dark field;
and 7: establishing an image distortion model;
and 8: performing image distortion correction;
and step 9: and the distortion correction is finished.
The stroboscopic illumination light source comprises a fixing ring, a fastening screw hole, a light source driving circuit, a laser head and a fixing support.
The M bright field images are captured under the condition that the laser head is in an open state and the reflected light is approximately specular reflection in a bright field system, and the acquired image is a standard resolution plate image, wherein M is more than or equal to 1 and is a natural number.
N dark field images are acquired by using an image constructed by diffuse reflection light when a laser head is in a closed state in a dark field system, wherein N is more than or equal to 1 and is a natural number.
Image pre-processing includes image filtering and histogram specification processing.
The method is realized by integrating images under a bright and dark field, registering M bright field images, adding and averaging the M bright field images, registering N dark field images, adding and averaging the N dark field images, and subtracting the two obtained images.
The image distortion model is established by comparing the characteristics of the image collected by the image sensor with the characteristics of the standard image.
The image distortion correction is implemented by performing inverse operation on the image acquired by the image sensor according to the image distortion model.
The laser head is a blue laser diode with the wavelength of 450 nm.
Features of the image include isolated points, lines, and edges of the geometry in the image.
The invention has the beneficial effects that: the image distortion correction method can be generally applicable to a microscope system, and realizes high-precision correction of image distortion of the microscope system through a bright and dark field illumination technology.
Drawings
The invention is further illustrated with reference to the following figures and examples. The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification.
Fig. 1 is a flowchart of a method for correcting image distortion of a microscope system according to an embodiment of the invention.
Fig. 2 is a structural diagram of an image distortion correction system of a microscope system according to an embodiment of the invention.
Fig. 3 is a schematic structural diagram of a stroboscopic illumination light source device according to an embodiment of the present invention.
In fig. 1, a starting system self-check, 2, a stroboscopic illumination light source is turned on, 3, M bright field images are collected, 4, N dark field images are collected, 5, image preprocessing is performed, 6, images under a bright and dark field are synthesized, 7, an image distortion model is established, 8, image distortion correction is performed, and 9, distortion correction is completed.
In fig. 2, 10, FPGA, 11, light source driving circuit, 12, laser head, 13, image sensor, 14, image display.
In fig. 3, 15. fixed ring, 16. fastening screw hole, 17. laser head, 18. fixed support.
Detailed Description
In fig. 1, a flowchart of a method for correcting image distortion of a microscope system includes the following steps:
step 1: self-checking a power-on system;
step 2: starting a stroboscopic illumination light source;
and step 3: collecting M bright field images;
and 4, step 4: collecting N dark field images;
and 5: preprocessing an image;
step 6: synthesizing images under a bright and dark field;
and 7: establishing an image distortion model;
and 8: performing image distortion correction;
and step 9: and the distortion correction is finished.
In fig. 2, 10.FPGA is electrically connected to 11. light source driving circuit, 11. light source driving circuit is electrically connected to 12. laser head, 10.FPGA is electrically connected to 13. image sensor, 10.FPGA is electrically connected to 14. image display.
The method comprises the following steps that 10, an FPGA outputs a control signal to control 11, a light source driving circuit drives 12, a laser head stroboscopic device 13, an image sensor transmits collected bright and dark field images to 10, the FPGA processes and corrects the images, 10, the FPGA outputs the images collected by the image sensor 13 to 14, and an image display device is arranged.
The present embodiment prefers a 450nm blue laser diode as the 12. laser head, based on the absorption, texture, relief, shape and translucency of the resolution plate under the microscope.
Preferably, the standard resolution plate used in the present embodiment is a large galvano-GCG-020101 resolution plate.
Preferably, the 13-image sensor used in the present embodiment is an on-mei MT9V034 CMOS image sensor.
Preferably, in the embodiment, 11, the light source driving circuit drives 12, and the laser head strobes at the frequency of 30Hz, which can enable the MT9V034 CMOS image sensor with the acquisition frame rate of 60fps to acquire bright-field and dark-field images without influencing the normal observation of human eyes.
In fig. 3, 15 fixing rings and 16 fastening screw holes fix the stroboscopic illumination light source device on the microscope, 17 laser heads are fixed 18 on the fixing bracket, laser beams are emitted at an angle of 70 °, and by adjusting the incident angle of the laser beams, noise signals can be suppressed, and image detection capability can be enhanced.
The imaging quality of the camera can be affected by laser speckles generated by high coherence of laser, but in the embodiment, six lasers with the same type are used, the speckle generated by each laser in each pulse changes along with time, and the continuously changing speckles are accumulated in the integration time to achieve the effect of light uniformization.
The above embodiments are merely illustrative of the principles and effects of the present invention, and it will be apparent to those skilled in the art that various changes and modifications can be made without departing from the inventive concept of the present invention, and these changes and modifications are within the scope of the present invention.
Claims (10)
1. A microscope system image distortion correction method comprises an FPGA, a light source driving circuit, a laser head, an image sensor and an image display, and is characterized by comprising the following steps:
step 1: self-checking a power-on system;
step 2: starting a stroboscopic illumination light source;
and step 3: collecting M bright field images;
and 4, step 4: collecting N dark field images;
and 5: preprocessing an image;
step 6: synthesizing images under a bright and dark field;
and 7: establishing an image distortion model;
and 8: performing image distortion correction;
and step 9: and the distortion correction is finished.
2. The stroboscopic illumination light source of claim 1, wherein: including solid fixed ring, fastening screw hole, light source drive circuit, laser head and fixed bolster.
3. The M bright field images of claim 1, wherein: in a bright field system, a laser head is in an open state, reflected light is an image captured under the condition of approximate specular reflection, and a standard resolution plate image is acquired, wherein M is more than or equal to 1 and is a natural number.
4. The N dark-field images of claim 1, wherein: in a dark field system, a laser head is in a closed state, and an image constructed by diffuse reflection light is acquired as a standard resolution plate image, wherein N is more than or equal to 1 and is a natural number.
5. Image pre-processing according to claim 1, characterized in that: including image filtering and histogram specification processing.
6. The image under an integrated bright and dark field of view of claim 1, characterized in that: the method is realized by performing registration and addition averaging on M bright field images, performing registration and addition averaging on N dark field images, and subtracting the two obtained images.
7. An image distortion model as defined in claim 1, wherein: the characteristics of the image collected by the image sensor are compared with the characteristics of the standard image.
8. Performing image distortion correction according to claim 1, wherein: the image distortion model is used for carrying out inverse operation on the image acquired by the image sensor.
9. The laser head of claim 2, wherein: is a blue laser diode with the wavelength of 450 nm.
10. The image of claim 7, characterized in that: including isolated points, lines and edges of the geometry in the image.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911057398.1A CN110660035A (en) | 2019-11-01 | 2019-11-01 | Image distortion correction method for microscope system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911057398.1A CN110660035A (en) | 2019-11-01 | 2019-11-01 | Image distortion correction method for microscope system |
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| CN110660035A true CN110660035A (en) | 2020-01-07 |
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| CN201911057398.1A Pending CN110660035A (en) | 2019-11-01 | 2019-11-01 | Image distortion correction method for microscope system |
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