CN110651166B - 用于收集三维数据的光电装置 - Google Patents
用于收集三维数据的光电装置 Download PDFInfo
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- CN110651166B CN110651166B CN201880030747.8A CN201880030747A CN110651166B CN 110651166 B CN110651166 B CN 110651166B CN 201880030747 A CN201880030747 A CN 201880030747A CN 110651166 B CN110651166 B CN 110651166B
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- 230000005693 optoelectronics Effects 0.000 title claims abstract description 104
- 238000005286 illumination Methods 0.000 claims abstract description 119
- 230000001419 dependent effect Effects 0.000 claims abstract description 33
- 230000003287 optical effect Effects 0.000 claims description 109
- 238000000034 method Methods 0.000 abstract description 21
- 238000012549 training Methods 0.000 description 117
- 238000012360 testing method Methods 0.000 description 75
- 230000000875 corresponding effect Effects 0.000 description 15
- 238000013519 translation Methods 0.000 description 14
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- 230000003044 adaptive effect Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
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- 229910044991 metal oxide Inorganic materials 0.000 description 2
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- 239000004065 semiconductor Substances 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000513 principal component analysis Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/10—Processing, recording or transmission of stereoscopic or multi-view image signals
- H04N13/106—Processing image signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
- H04N13/207—Image signal generators using stereoscopic image cameras using a single 2D image sensor
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
- H04N13/246—Calibration of cameras
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
- H04N13/254—Image signal generators using stereoscopic image cameras in combination with electromagnetic radiation sources for illuminating objects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762470447P | 2017-03-13 | 2017-03-13 | |
US62/470,447 | 2017-03-13 | ||
US201762487286P | 2017-04-19 | 2017-04-19 | |
US62/487,286 | 2017-04-19 | ||
US15/625,176 US9992472B1 (en) | 2017-03-13 | 2017-06-16 | Optoelectronic devices for collecting three-dimensional data |
US15/625,176 | 2017-06-16 | ||
PCT/SG2018/050111 WO2018169488A1 (en) | 2017-03-13 | 2018-03-12 | Optoelectronic devices for collecting three-dimensional data |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110651166A CN110651166A (zh) | 2020-01-03 |
CN110651166B true CN110651166B (zh) | 2021-09-24 |
Family
ID=62235454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201880030747.8A Active CN110651166B (zh) | 2017-03-13 | 2018-03-12 | 用于收集三维数据的光电装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9992472B1 (zh) |
EP (1) | EP3596425B1 (zh) |
CN (1) | CN110651166B (zh) |
TW (1) | TWI753129B (zh) |
WO (1) | WO2018169488A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11692813B2 (en) * | 2017-12-27 | 2023-07-04 | Ams Sensors Singapore Pte. Ltd. | Optoelectronic modules and methods for operating the same |
WO2020108997A1 (en) * | 2018-11-28 | 2020-06-04 | Lumileds Holding B.V. | Method of obtaining a digital image |
DE102020126407A1 (de) * | 2020-10-08 | 2022-04-14 | Leica Camera Aktiengesellschaft | Bildaufnahmegerät |
TWI760237B (zh) * | 2021-05-26 | 2022-04-01 | 醫電鼎眾股份有限公司 | 使用於內視鏡之單攝影機三維掃描投影裝置及其操作方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1228526A (zh) * | 1998-12-30 | 1999-09-15 | 西安交通大学 | 一种快速投影结构光的三维轮廓相位测量方法及装置 |
CN101042296A (zh) * | 2006-03-23 | 2007-09-26 | 株式会社高永科技 | 三维形状测量装置 |
CN101182996A (zh) * | 2006-11-13 | 2008-05-21 | 株式会社高永科技 | 利用阴影莫尔法的三维形状测量装置 |
WO2014011182A1 (en) * | 2012-07-12 | 2014-01-16 | Calfornia Institute Of Technology | Convergence/divergence based depth determination techniques and uses with defocusing imaging |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
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EP1093562A1 (en) * | 1998-07-08 | 2001-04-25 | PPT Vision, Inc. | Machine vision and semiconductor handling |
US6122062A (en) * | 1999-05-03 | 2000-09-19 | Fanuc Robotics North America, Inc. | 3-D camera |
US7324214B2 (en) * | 2003-03-06 | 2008-01-29 | Zygo Corporation | Interferometer and method for measuring characteristics of optically unresolved surface features |
TW200606391A (en) * | 2004-05-10 | 2006-02-16 | Koninkl Philips Electronics Nv | Device and method for optical precision measurement |
WO2010006081A1 (en) * | 2008-07-08 | 2010-01-14 | Chiaro Technologies, Inc. | Multiple channel locating |
TWI402478B (zh) * | 2009-10-29 | 2013-07-21 | Univ Nat Sun Yat Sen | 使用相位光罩之顯微量測系統及方法 |
US9947813B2 (en) * | 2012-07-27 | 2018-04-17 | Zfx Gmbh | System and method for illuminating a sample and collecting light reflected from the sample |
JP5780659B2 (ja) * | 2013-06-13 | 2015-09-16 | ヤマハ発動機株式会社 | 3次元形状測定装置 |
JP6270361B2 (ja) * | 2013-07-16 | 2018-01-31 | 株式会社キーエンス | 三次元画像処理装置、三次元画像処理方法及び三次元画像処理プログラム並びにコンピュータで読み取り可能な記録媒体及び記録した機器 |
US10271039B2 (en) * | 2014-02-05 | 2019-04-23 | Creaform Inc. | Structured light matching of a set of curves from two cameras |
WO2016010481A1 (en) | 2014-07-14 | 2016-01-21 | Heptagon Micro Optics Pte. Ltd. | Optoelectronic modules operable to distinguish between signals indicative of reflections from an object of interest and signals indicative of a spurious reflection |
WO2016080908A1 (en) | 2014-11-21 | 2016-05-26 | Heptagon Micro Optics Pte. Ltd. | Optical pattern projection |
US9273846B1 (en) * | 2015-01-29 | 2016-03-01 | Heptagon Micro Optics Pte. Ltd. | Apparatus for producing patterned illumination including at least one array of light sources and at least one array of microlenses |
US10001583B2 (en) | 2015-04-06 | 2018-06-19 | Heptagon Micro Optics Pte. Ltd. | Structured light projection using a compound patterned mask |
WO2017014691A1 (en) | 2015-07-17 | 2017-01-26 | Heptagon Micro Optics Pte. Ltd. | Generating a distance map based on captured images of a scene |
WO2017014693A1 (en) | 2015-07-21 | 2017-01-26 | Heptagon Micro Optics Pte. Ltd. | Generating a disparity map based on stereo images of a scene |
WO2017014692A1 (en) | 2015-07-21 | 2017-01-26 | Heptagon Micro Optics Pte. Ltd. | Generating a disparity map based on stereo images of a scene |
TWI744245B (zh) | 2015-08-19 | 2021-11-01 | 新加坡商海特根微光學公司 | 產生具有減少過度平滑之視差圖 |
CN105180837A (zh) * | 2015-08-28 | 2015-12-23 | 河北工业大学 | 一种横向非均匀条纹分区生成方法 |
US10401496B2 (en) | 2015-09-30 | 2019-09-03 | Ams Sensors Singapore Pte. Ltd. | Optoelectronic modules operable to collect distance data via time-of-flight and triangulation |
WO2017069954A1 (en) * | 2015-10-21 | 2017-04-27 | Princeton Optronics, Inc. | Coded pattern projector |
-
2017
- 2017-06-16 US US15/625,176 patent/US9992472B1/en active Active
-
2018
- 2018-03-12 WO PCT/SG2018/050111 patent/WO2018169488A1/en unknown
- 2018-03-12 EP EP18767151.6A patent/EP3596425B1/en active Active
- 2018-03-12 CN CN201880030747.8A patent/CN110651166B/zh active Active
- 2018-03-12 TW TW107108333A patent/TWI753129B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1228526A (zh) * | 1998-12-30 | 1999-09-15 | 西安交通大学 | 一种快速投影结构光的三维轮廓相位测量方法及装置 |
CN101042296A (zh) * | 2006-03-23 | 2007-09-26 | 株式会社高永科技 | 三维形状测量装置 |
CN101182996A (zh) * | 2006-11-13 | 2008-05-21 | 株式会社高永科技 | 利用阴影莫尔法的三维形状测量装置 |
WO2014011182A1 (en) * | 2012-07-12 | 2014-01-16 | Calfornia Institute Of Technology | Convergence/divergence based depth determination techniques and uses with defocusing imaging |
Also Published As
Publication number | Publication date |
---|---|
TWI753129B (zh) | 2022-01-21 |
TW201903350A (zh) | 2019-01-16 |
WO2018169488A1 (en) | 2018-09-20 |
EP3596425A1 (en) | 2020-01-22 |
US9992472B1 (en) | 2018-06-05 |
EP3596425B1 (en) | 2023-12-20 |
CN110651166A (zh) | 2020-01-03 |
EP3596425A4 (en) | 2020-12-16 |
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Address after: Shinka ha Patentee after: Ames Osram Asia Pacific Pte. Ltd. Country or region after: Singapore Address before: Shinka ha Patentee before: Sensors Singapore Private Ltd. Country or region before: Singapore Address after: Shinka ha Patentee after: Sensors Singapore Private Ltd. Country or region after: Singapore Address before: Singapore Forest Environment Patentee before: HEPTAGON MICRO OPTICS Pte. Ltd. Country or region before: Singapore |
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