CN110650331B

CN110650331B - Array camera module testing method and target device thereof

Info

Publication number: CN110650331B
Application number: CN201810670807.4A
Authority: CN
Inventors: 褚水佳; 诸海江; 陈哲
Original assignee: Ningbo Sunny Opotech Co Ltd
Current assignee: Ningbo Sunny Opotech Co Ltd
Priority date: 2018-06-26
Filing date: 2018-06-26
Publication date: 2021-08-06
Anticipated expiration: 2038-06-26
Also published as: CN110650331A

Abstract

The test method of the array camera module and the target device thereof, wherein the test method comprises the following steps: providing a target image of a target device acquired by the array camera module, wherein the target device is provided with a first calibration pattern and a second calibration pattern, and the first calibration pattern and the second calibration pattern are integrated in the target device according to a preset mode; identifying the first calibration pattern and the second calibration pattern in the reticle image; and respectively obtaining the test results of the first camera shooting module and the second camera shooting module of the array camera shooting module based on the first calibration pattern and the second calibration pattern in the target plate image. Therefore, the camera modules of the array camera module can be tested simultaneously, the testing efficiency is improved, and the testing operation is simplified.

Description

Array camera module testing method and target device thereof

Technical Field

The invention relates to the field of camera modules, in particular to a method for testing an array camera module and a target device used in the testing process of the array camera module.

Background

With the development of science and technology, people have higher and higher requirements for the camera function of portable electronic equipment. Under the background, the array camera module is generated. As the name implies, the array camera module includes two or more camera modules, and a plurality of characteristic functions are realized through cooperation between the two or more camera modules, for example, special imaging effects such as optical zooming are realized through cooperation between two camera modules with different equivalent focal lengths.

Before the array camera module is put into use, each camera module of the array camera module needs to be tested respectively so as to perform subsequent operation according to corresponding test results. For example, each camera module of the array camera module needs to be tested, and Calibration (Calibration) is performed on the array camera module according to the test result, so as to obtain the internal parameters and the external parameters of the array camera module. Compared with a single camera module, the test process of the array camera module is relatively more complex and difficult.

More specifically, the conventional testing concept of the array camera module is to sequentially and respectively test each camera module of the array camera module. Take the array camera module that the array camera module is the array camera module that has "optics zoom" function of constituteing by wide angle camera module (first camera module) and long burnt camera module (second camera module) as an example, the test procedure to this array camera module is: firstly, testing the wide-angle camera module by using a first target; and after the test data of the wide-angle camera module are obtained, testing the long-focus camera module by using a second target. Such an approach has a number of drawbacks.

Firstly, test each module of making a video recording of the module of making a video recording of array in proper order, inefficiency.

Secondly, because each camera module tests separately in sequence, the test is difficult to avoid causing the error such as non-uniformity. Here, the test unification means that the sizes of the target pattern images obtained by the first camera module and the second camera module in the test process are consistent. In particular, when the difference between the equivalent focal lengths of the camera modules of the array camera module is large, the error will be more obvious.

Thirdly, because each camera module is sequentially and individually tested, calibration or adjustment of each camera module is also generally sequentially and individually performed. However, the array camera module includes two or more camera modules, and it is difficult to ensure the relative position relationship between the camera modules by adjusting or calibrating the camera modules in sequence.

Taking the adjustment of the optical axis of the array camera module as an example (the optical axes of the camera modules in the array camera module need to be kept parallel), when the optical axis of the second camera module is adjusted, the optical axis of the first camera module needs to be used as a reference. In other words, since the test and the optical axis adjustment of each camera module of the array camera module are performed in batches, the position of the first camera module is already determined when the optical axis adjustment of the second camera module is performed. Therefore, when the relative position relationship between the camera modules of the array camera module needs to be adjusted, only the second camera module can be adjusted. And, in carrying out the optical axis adjustment in-process to the second module of making a video recording, if when finding the mounted position of the first module of making a video recording and needing readjustment, at that time, the test and the adjustment to the module of making a video recording of array need the head of repetition again, and inefficiency and troublesome.

Fourth, the arrangement of the camera modules in the array camera module is generally different, that is, the equivalent focal lengths of the camera modules are different, and the angles of view are different. However, in the testing process, it is necessary to ensure that the sizes of the images of the target to be tested collected by the camera modules are consistent, and therefore, the first target for testing the first camera module and the second target for testing the second camera module have different characteristic patterns. That is, in the testing process of the conventional array camera module, a plurality of targets having different configurations need to be prepared. Thus, not only is material wasted, but the testing process is complicated to operate.

Therefore, there is a strong demand for a method of more effectively testing an array camera module.

Disclosure of Invention

The invention mainly aims to provide a testing method of an array camera shooting module and a target device thereof, wherein each camera shooting module of the array camera shooting module can be tested at the same time so as to improve the testing efficiency of the array camera shooting module.

Another object of the present invention is to provide a method for testing an array camera module and a target device thereof, wherein the camera modules of the array camera module are tested simultaneously, which is beneficial to actively adjusting or calibrating the array camera module.

Another objective of the present invention is to provide a method for testing an array camera module and a target device thereof, wherein in an embodiment of the present invention, a target device is used to simultaneously test each camera module of the array camera module to obtain a test result of each camera module of the array camera module, and the target device is configured with at least two feature patterns according to a preset pattern.

Another object of the present invention is to provide a method for testing an array camera module and a target device thereof, wherein in an embodiment of the present invention, the target device is implemented as a single planar target, and the first feature pattern and the second feature pattern are integrated on the same side of the target device according to a predetermined pattern, so as to simplify the testing operation of the array camera module.

Another objective of the present invention is to provide an array camera module testing method and a target device thereof, wherein the first feature pattern includes a series of first reference marks, and the second feature pattern includes a series of second reference marks, wherein the second reference marks are smaller than the first reference marks, so that the second reference marks can be distributed in at least part of the first reference marks in a manner of being contained in the first reference marks, and in such a manner, the first feature pattern and the second feature pattern are integrated on the same side of the target device.

Another object of the present invention is to provide a method for testing an array camera module and a target device thereof, wherein in an embodiment of the present invention, the target device includes a first target having the first feature pattern and a second target having the second feature pattern, and during the testing process, the second target is stacked on the first target such that the second feature pattern is stacked on the first feature pattern, in such a way, it is equivalent to integrally configure the first feature pattern and the second feature pattern, so that the first camera module and the second camera module of the array camera module can be tested simultaneously.

Another objective of the present invention is to provide a method for testing an array camera module and a target device thereof, wherein in an embodiment of the present invention, a relative position relationship between the first target and the second target can be adjusted according to a relative position relationship between the first camera module and the second camera module of the array camera module, so as to facilitate simultaneous testing of the array camera modules.

Other advantages and features of the invention will become apparent from the following description and may be realized by means of the instrumentalities and combinations particularly pointed out in the appended claims.

To achieve at least one of the above objects and advantages, the present invention provides an array camera module testing method, wherein the array camera module comprises a first camera module and a second camera module, the first camera module has a first field of view FOV1, the second camera module has a second field of view FOV2, wherein the second field of view FOV2 is located in the first field of view FOV1, comprising:

providing a target image of a target device acquired by the array camera module, wherein the target device is provided with a first characteristic pattern and a second characteristic pattern, and the first characteristic pattern and the second characteristic pattern are integrated in the target device according to a preset mode;

identifying the first and second feature patterns in the reticle image;

obtaining a test result of a first camera module of the array camera module based on the first characteristic pattern in the target image; and

and obtaining a test result of a second camera module of the array camera module based on the second characteristic pattern in the target image.

In an embodiment of the invention, the step of obtaining the test result of the first camera module based on the first feature pattern in the target image and the step of obtaining the test result of the second camera module based on the second feature pattern in the target image are performed simultaneously.

In an embodiment of the invention, in the step of providing the target image, the target device is implemented as a planar target, wherein the first feature pattern and the second feature pattern are integrated on the same side of the target device according to a predetermined pattern.

In an embodiment of the present invention, the first fiducial marks are arranged in an edge-to-edge array to form the first feature pattern, and the second fiducial marks are arranged in an edge-to-edge array to form the second feature pattern, wherein a size of the first fiducial mark is larger than a size of the second fiducial mark, so that the second fiducial mark can be accommodated in the first fiducial mark and distributed in at least a part of the first fiducial mark, and in this way, the first feature pattern and the second feature pattern are integrated on a same side of the planar target. .

In an embodiment of the invention, each of the first fiducial marks is arranged in an array in a spaced manner to form the first feature pattern, and each of the second fiducial marks is arranged in an array in a spaced manner to form the second feature pattern, wherein a size of the first fiducial mark is larger than a size of the second fiducial mark, so that the second fiducial mark can be distributed in at least part of the first fiducial mark in a manner of being accommodated in the first fiducial mark, and in this manner, the first feature pattern and the second feature pattern are integrated on a same side of the flat target.

In an embodiment of the invention, the first fiducial marks are arranged in an array at intervals to form the first feature pattern, and the second fiducial marks are arranged in an array at intervals to form the second feature pattern, wherein the first fiducial marks have a size larger than that of the second fiducial marks, and the second fiducial marks are respectively disposed in a spacing area between the first fiducial marks, in such a way that the second feature pattern and the first fiducial pattern are integrated on the same side of the flat target.

In an embodiment of the invention, a ratio between a side length of the first reference mark and a side length of the second reference mark is equal to a ratio between an equivalent focal length of a second camera module of the array camera module and an equivalent focal length of the first camera module.

In an embodiment of the invention, the number of the second reference marks accommodated by each of the first reference marks is not more than a square of a ratio between equivalent focal lengths of the second camera module and the first camera module of the array camera module.

In an embodiment of the present invention, the step of providing the target image includes the steps of:

placing the target device at a specific position in a field of view of the array camera module, wherein at the specific position, the first camera module of the array camera module corresponds to a central area of the target device; and

and respectively obtaining the target images by the first camera module and the second camera module of the array camera module.

In an embodiment of the invention, the second reference mark is not set in the central area of the target device.

In an embodiment of the invention, in the step of providing the target image, the target device comprises a first target and a second target, wherein the first feature pattern is provided on the first target and the second feature pattern is provided on the second target, wherein during the calibration process the second target is superimposed on the first target such that the second feature pattern is superimposed on the first feature pattern, in such a way that the first feature pattern and the second feature pattern are integrated in the target device.

placing the first target at a specific position in the field of view of the array camera module so that the first camera module corresponds to the first target;

overlaying the second target on the first target such that the second feature pattern on the second target overlays the first feature pattern on the first target;

moving the second target so that the second camera module corresponds to the second target based on a relative positional relationship between the first camera module and the second camera module of the array camera module; and

In an embodiment of the invention, the target device further has a third feature pattern, and the third feature pattern is integrated in the target device in the preset mode of integrating the first feature pattern and the second feature pattern, so that a test result of a third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

In an embodiment of the present invention, the step of providing the target image includes:

the array camera module with set up a range extender between the mark board device to do not change the mark board device with under the prerequisite of the physical distance between the array camera module, increase the array camera module with the shooting distance between the mark board device.

According to another aspect of the present invention, there is also provided a target apparatus for testing an array camera module, wherein the camera module includes a first camera module and a second camera module, the first camera module has a first viewing angle FOV1 and the second camera module has a second viewing field FOV2, the second viewing field FOV2 is located within the first viewing field FOV1, including:

a first feature pattern; and

a second pattern of features, wherein the first pattern of features and the second pattern of features are integrated on the same side of the reticle device.

In an embodiment of the invention, the target device is implemented as a planar target, and the first feature pattern and the second feature pattern are integrated on the same side of the planar target.

In an embodiment of the present invention, the first fiducial marks are arranged in an edge-to-edge array to form the first feature pattern, and the second fiducial marks are arranged in an edge-to-edge array to form the second feature pattern, wherein a size of the first fiducial mark is larger than a size of the second fiducial mark, so that the second fiducial mark can be accommodated in the first fiducial mark and distributed in at least a part of the first fiducial mark, and in this way, the first feature pattern and the second feature pattern are integrated on a same side of the planar target.

In an embodiment of the present invention, the number of the plane targets is one.

In an embodiment of the invention, the target device further has a third feature pattern, and the third feature pattern is integrated on the same side of the target device according to a manner in which the first feature pattern and the second feature pattern are integrated on the target device.

According to another aspect of the present invention, the present invention further provides a method for calibrating an array camera module, including:

obtaining the test results of the first camera module and the second camera module of the array camera module by the array camera module test method; and

and calibrating the first camera module and the second camera module of the array camera module based on the test result.

According to another aspect of the present invention, the present invention further provides an adjustment method for an array camera module, which includes:

and adjusting the relative position relation between the first camera module and the second camera module of the array camera module based on the test result.

According to another aspect of the present invention, the present invention further provides an array camera module testing system, which includes:

an array camera module;

the target device as described above, the target device having a first feature pattern and a second feature pattern, wherein the first feature pattern and the second feature pattern are integrated on the same side of the target device in a predetermined pattern; and

a processor, wherein, in the test process, the target device is set up in the visual field that the array camera module corresponds, the array camera module gathers the target image that the target device corresponds, and, the processor is based on in the target image first characteristic pattern with the second characteristic pattern obtains respectively the first module of making a video recording and the second of the array camera module make a video recording the test result of module.

Further objects and advantages of the invention will be fully apparent from the ensuing description and drawings.

These and other objects, features and advantages of the present invention will become more fully apparent from the following detailed description, the accompanying drawings and the claims.

Drawings

Fig. 1 is a schematic perspective view of an array camera module in a method for testing the array camera module according to a first preferred embodiment of the invention.

Fig. 2 illustrates a schematic diagram of the testing process of the array camera module.

Fig. 3 is a flowchart of the method for testing the array camera module according to the above preferred embodiment of the invention.

Fig. 4 is a schematic diagram of the target device in the method for testing the array camera module according to the above preferred embodiment.

Fig. 5 is a second schematic diagram of the target device in the method for testing the array camera module according to the above preferred embodiment.

Fig. 6 is a third schematic view of the target device in the method for testing an array camera module according to the above preferred embodiment.

Fig. 7 is a schematic diagram illustrating the target device in the method for testing the array camera module according to another preferred embodiment of the invention.

Fig. 8 is a second schematic view of the target device in the method for testing an array camera module according to another preferred embodiment of the invention.

Fig. 9 is a schematic diagram illustrating a relative positional relationship between the target device and the array camera module.

Fig. 10 illustrates a schematic view of a distance increasing device disposed between the target device and the array camera module.

Fig. 11 illustrates a schematic view of the target device when the array camera module is a three-camera module.

Fig. 12 is a schematic diagram of the target device in the method for testing an array camera module according to another preferred embodiment of the invention.

Fig. 13 and 14 are schematic diagrams illustrating the effect of correspondence between the first target and the second target of the target device and the relative position relationship between the first camera module and the second camera module of the array camera module.

Fig. 15 is a schematic diagram of an array camera module testing system according to the present invention.

Detailed Description

The following description is presented to disclose the invention so as to enable any person skilled in the art to practice the invention. The preferred embodiments in the following description are given by way of example only, and other obvious variations will occur to those skilled in the art. The basic principles of the invention, as defined in the following description, may be applied to other embodiments, variations, modifications, equivalents, and other technical solutions without departing from the spirit and scope of the invention.

It will be understood by those skilled in the art that in the present disclosure, the terms "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship indicated in the drawings for ease of description and simplicity of description, and do not indicate or imply that the referenced devices or components must be constructed and operated in a particular orientation and thus are not to be considered limiting.

It is understood that the terms "a" and "an" should be interpreted as meaning that a number of one element or element is one in one embodiment, while a number of other elements is one in another embodiment, and the terms "a" and "an" should not be interpreted as limiting the number.

Summary of the application

As described above, before the array camera module is put into service, each camera module of the array camera module needs to be tested, and the array camera module needs to be adjusted or calibrated according to the test result. The array camera module comprises two or more camera modules, and the test process is relatively more complex and difficult.

The existing testing method applied to the array camera module is to sequentially and respectively test each camera module of the array camera module. However, such a test method has a number of drawbacks. Firstly, testing each camera module of the array camera module in sequence consumes time and is low in efficiency. Secondly, need to ensure in the test process that the test of each module of making a video recording of array module is unified, promptly, the mark board image size that each module of making a video recording gathered keeps unanimous. However, since the arrangement of the respective image pickup modules of the array image pickup module is generally different, it is difficult to ensure test uniformity, and test errors are likely to occur. Thirdly, in response to the second defect, there is a compromise in which a plurality of targets having different configurations are prepared corresponding to different configurations of each camera module of the array camera module, however, such a way causes the test process to be more complicated; fourthly, because each module of making a video recording tests alone in proper order, consequently, also go on alone to the adjustment or the demarcation of each module of making a video recording. However, the parameters of the array camera module are affected by the common effects of the camera modules, and the calibration of the array camera module is more difficult to be performed by testing the camera modules in sequence.

In view of the above technical problems, the basic concept of the present invention is to integrate a plurality of calibration patterns by specially configuring a target device for testing an array camera module, so that each camera module of the array camera module can be tested simultaneously by the target device, thereby improving the testing efficiency and facilitating the subsequent correction or calibration. Here, "simultaneously" means that two or more events occur with time periods overlapping each other, and the occurrence time periods of the two or more events may completely or partially coincide with each other depending on a specific application scenario. In other words, the time periods for simultaneous testing between the camera modules of the array camera module may partially or completely coincide.

Based on the above, the invention provides a method for testing an array camera module and a target device thereof, which comprises the steps of firstly providing a target image of the target device acquired by the array camera module, wherein the target device is provided with a first calibration pattern and a second calibration pattern, then identifying the first characteristic pattern and the second characteristic pattern in the target image, and then respectively obtaining the test results of the first camera module and the second camera module based on the first characteristic pattern and the second characteristic pattern in the target image. Therefore, the testing process of the array camera module is simplified, and meanwhile, the subsequent calibration efficiency and the correction efficiency of the array camera module are improved.

Having described the general principles of the present invention, various non-limiting embodiments of the present invention will now be described in detail with reference to the accompanying drawings.

Exemplary method

Referring to fig. 1 to 3, a testing method according to a preferred embodiment of the present invention is illustrated, wherein the testing method is suitable for testing an array camera module to improve the testing efficiency. As described above, in the testing process of the array camera module, it is necessary to ensure that the testing of each camera module of the array camera module is uniform, that is, the size of the target image collected by each camera module is consistent.

In particular, for convenience of describing the method for testing the array camera module provided by the present invention, the array camera module 10 includes two camera modules with different configurations as an example. More specifically, in the preferred embodiment of the present invention, the array camera module 10 includes a first camera module 11 and a second camera module 12, the first camera module 11 has a first equivalent focal length f1 and a first Field of View FOV1(Field of View), the second camera module 12 has a second equivalent focal length f2 and a second Field of View FOV2(Field of View), wherein the first equivalent focal length f1 of the first camera module 11 is smaller than the second equivalent focal length f2 of the second camera module 12, and the first Field of View FOV1 of the first camera module 11 is larger than the Field of View FOV2 of the second camera module 12. During shooting, the first camera module 11 has a relatively large field of view FOV1, i.e., the first camera module 11 has a large viewing range but its shooting distance is short, and the second camera module 12 has a relatively large equivalent focal length, i.e., the second camera module 12 has a relatively small viewing range but its shooting distance is long. In terms of image effect, the second camera module 12 has a larger magnification than the first camera module 11 for shooting the same object. In other words, when the array camera module 10 is tested by using a test target, the first camera module 11 and the second camera module 12 have different magnifications of the calibration patterns on the test target.

Further, referring to fig. 3, the testing method provided by the present invention comprises the steps of: s100, providing a target image of a target device 20 acquired by the array camera module 10, wherein the target device 20 has a first characteristic pattern 200 and a second characteristic pattern 210; s110, identifying the first characteristic pattern 200 and the second characteristic pattern 210 in the target image; s120, obtaining a test result of the first camera module 11 of the array camera module 10 based on the first feature pattern 200 in the target image; and S130, obtaining a test result of the second camera module 12 of the array camera module 10 based on the second characteristic pattern 210 in the target image.

In step S100, a target image of the target device 20 acquired by the array camera module 10 is provided, wherein the target device 20 has a first feature pattern 200 and a second feature pattern 210. As described above, the first camera module 11 and the second camera module 12 of the array camera module 10 have different configurations (different equivalent focal lengths f1 and f2), so that, when the array camera module 10 is tested by the target device 20, there is a difference in magnification of the target device 20 by the first camera module 11 and the second camera module 12 of the array camera module 10. In this case, in order to unify the tests among the camera modules of the array camera module 10, calibration patterns with different sizes need to be respectively configured for the first camera module 11 and the second camera module 12, that is, the first feature pattern 200 and the second feature pattern 210 have different size configurations. From a mathematical point of view, assuming that the magnification of the target device 20 by the first camera module 11 is M1, and the magnification of the target device 20 by the second camera module 12 is M2, the first calibration pattern 200 and the second calibration pattern 210 must have a size of L1 and a size of L2, respectively, such that M1 × L1 is M2 × L2. Here, when M1 × L1 — M2 × L2 indicates that the size of the image captured by the first camera module 11 in the reticle device 20 of the first feature pattern 200 matches the size of the image captured by the second camera module 12 in the reticle device 20 of the second feature pattern 210, that is, test uniformity is ensured.

Further, as shown in fig. 4, in the preferred embodiment of the present invention, the target device 20 is implemented as a planar target, wherein the first characteristic pattern 200 and the second characteristic pattern 210 are integrated on the same side of the planar target according to a predetermined pattern. It should be appreciated that during the execution of step S100, i.e., during the acquisition of the target image by the array camera module 10, the side corresponds to the array camera module 10. Here, the first feature pattern 200 and the second feature pattern 210 are integrated on the same side of the target device 20 for simultaneously testing the first camera module 11 and the second camera module 12 of the array camera module 10. It should be noted that in the preferred embodiment of the present invention, the target device 20 is implemented as a single planar target, so that compared with the testing process of the conventional array camera module, the testing process can be greatly simplified by the target device 20 provided in the present invention, and the testing uniformity can be ensured, and the error can be reduced.

In a specific embodiment, the types of the first feature pattern 200 and the second feature pattern 210 are consistent. Those skilled in the art will appreciate that the feature pattern is comprised of a series of fiducial marks. That is, the first feature pattern 200 includes a series of first fiducial marks 201, the series of first fiducial marks 201 being arranged in an array to form the first feature pattern 200, and the second feature pattern 210 includes a series of second fiducial marks 211, the series of second fiducial marks 211 being arranged in an array to form the second feature pattern 210.

In particular, as shown in fig. 4, in the preferred embodiment of the present invention, the first feature pattern 200 and the second feature pattern 210 are checkerboard patterns as an example, and the manner in which the first feature pattern 200 and the second feature pattern 210 are integrated with the flat target is described. As shown in fig. 4, the first reference mark 201 is a black or white square, wherein the black/white square is arranged in an edge-to-edge array to form a checkerboard pattern (the first feature pattern 200); in correspondence, the second fiducial marks 211 are black/white squares, wherein the black/white squares are arranged in an edge-to-edge array to form a checkerboard pattern (the second feature pattern 210). Of course, it should be understood by those skilled in the art that the first feature pattern 200 and the second feature pattern 210 may be implemented in other types in other embodiments of the present invention, and the present application is not limited thereto.

As described above, in order to ensure the uniformity of the test of the array camera module 10, the first feature pattern 200 and the second feature pattern 210 need to be configured with different sizes, and more specifically, the first reference mark 201 and the second reference mark 211 have different size configurations. According to the formula M1 × L1 — M2 × L2, it can be known that M1/M2 — L2/L1. In the preferred embodiment of the present invention, the ratio of the magnification of the target device 20 by the first camera module 11 and the second camera module 12 is equal to the ratio of the equivalent focal lengths of the first camera module 11 and the second camera module 12, and can be expressed as: M1/M2 ═ f1/f 2. The ratio of the sizes between the first feature pattern 200 and the second feature pattern 210 is equal to the ratio of the side length of the first reference mark 201 to the side length of the second reference mark 211, and is expressed by the formula: L1/L2 is L1/L2. Based on the above inference, it can be found that f1/f2 is l2/l1, where l1 represents the side length of the first reference mark 201, i.e., the side length of the black or white square in the first feature pattern 200, and l2 represents the side length of the second reference mark 211, i.e., the side length of the black or white square in the second feature pattern 210.

Further, in the preferred embodiment of the present invention, knowing that the first equivalent focal length f1 of the first camera module 11 is smaller than the second equivalent focal length f2 of the second camera module 12, it can be obtained: f1/f2 ═ l2/l1 < 1. In other words, in the preferred embodiment of the present invention, the side length of the first fiducial mark 201 is greater than the side length of the second fiducial mark 211, so that the second fiducial mark 211 can be distributed in the first fiducial mark 201 in a manner of being contained in the first fiducial mark 201, and in this way, the second feature pattern 210 is integrated into the first feature pattern 200. Here, when the second reference mark 211 is received in the first reference mark 201, the array camera module 10 may simultaneously capture images of the first reference mark 201 and the second reference mark 211 for testing of the array camera module 10, that is, the array camera module 10 may simultaneously capture images of the first feature pattern 200 and the second feature pattern 210 for testing of the array camera module 10.

Fig. 4 illustrates an example of a predetermined pattern in which the second feature pattern 210 is integrated with the first feature pattern 200. As shown in fig. 4, the second feature patterns 210 are distributed in an embedded manner in at least a portion of the first feature patterns 200. In particular, in this example, each of the first fiducial marks 201 includes one second fiducial mark 211 in an overlapping region of the first feature pattern 200 and the second feature pattern 210, wherein a side length of the second fiducial mark 211 and a side length of the first fiducial mark 201 satisfy a relationship: l2/l1 ═ f1/f 2. In addition, in the overlapping region of the first characteristic pattern 200 and the second characteristic pattern 210, the first reference mark 201 and the second reference mark 211 have relative hues, that is, when the first reference mark 201 is a black lattice, the second reference mark 211 accommodated in the first reference mark 201 is a white lattice; correspondingly, when the first reference mark 201 is a white lattice, the second reference mark 211 contained in the first reference mark 201 is a black lattice.

It should be noted that, in a variation of the preferred embodiment of the present invention, the predetermined pattern of the second feature pattern 210 integrated into the first feature pattern 200 may be adjusted, for example, the number of the second fiducial marks 211 included in each of the first fiducial marks 201 in the overlapping region of the first feature pattern 200 and the second feature pattern 210 may be changed. Fig. 5 illustrates another example of the preset pattern in which the second characteristic pattern 210 is integrated into the first characteristic pattern 200, wherein in this example, the number of more than one second fiducial mark 211, for example, 2, is included in each first fiducial mark 201 in the overlapping area of the first characteristic pattern 200 and the second characteristic pattern 210. And are not intended to limit the scope of the present invention.

It should be noted that in the preferred embodiment of the present invention, the upper limit of the number of the second fiducial marks 211 included in each of the first fiducial marks 201 depends on the first equivalent focal length f1 of the first camera module 11 being smaller than the square of the second equivalent focal length f2 of the second camera module 12. For example, when the equivalent focal length ratio between the first camera module 11 and the second camera module 12 is 2 (i.e., f2/f1 is 2), the upper limit of the number of the second reference markers 211 included in each of the first reference markers 201 is 4, i.e., the number of the second reference markers 211 included in each of the first reference markers 201 is less than 4. The reason why the upper limit of the number exists is that in the subsequent testing process of the array camera module 10, calibration features (for example, black and white line pairs or corner regions) in the first feature pattern 200 and the second feature pattern 210 need to be extracted for testing the array camera module 10. Therefore, during the design process of integrating the second feature pattern 210 into the preset pattern of the first feature pattern 200, it is required to ensure that the calibration features in the first feature pattern 200 and the second feature pattern 210 are not hidden.

It may be compromised that when the number of the second fiducial markers 211 included in each of the first fiducial markers 201 reaches an upper limit, the size of the second fiducial markers 211l2 may be slightly reduced such that f1/f2 is slightly larger than l2/l1, thereby still ensuring that the calibration features in the first and

second feature patterns

200 and 210 are not hidden. However, when this trade-off is taken, test uniformity is somewhat impaired. Therefore, the size of the second reference mark 211 needs to be reduced as small as possible, so as to ensure that the calibration features of the second reference mark 211 and the first reference mark 201 are not covered, and on the other hand, the test consistency of the array camera module 10 still has a high level.

As described above, the first feature pattern 200 and the second feature pattern 210 may be implemented in other types, not limited to the checkerboard pattern, on the premise that the first feature pattern 200 and the second feature pattern 210 are identical in type. Specifically, in another preferred embodiment of the present invention illustrated in fig. 7, the first feature pattern 200 and the second feature pattern 210 are still array patterns formed by the array arrangement of the first fiducial marks 201 and the second fiducial marks 211. The difference is that, in the preferred embodiment of the present invention, the first fiducial marks 201 are arranged in an array in a spaced-apart manner to form the first characteristic pattern 200, and the second fiducial marks 211 are arranged in an array in a spaced-apart manner to form the second characteristic pattern 210. In other words, in the preferred embodiment of the present invention, in the first feature pattern 200, there is a spacing region between the first fiducial marks 201, so that the second fiducial marks 211 can be respectively disposed in the spacing region between the first fiducial marks 201, compared to the preferred embodiment, in such a way that the second feature pattern 210 and the first fiducial pattern 200 are integrated on the same side of the flat target.

Of course, it should be understood by those skilled in the art that, since the size of the second fiducial mark 211 is smaller than that of the first fiducial mark 201, the second fiducial mark 211 can still be accommodated in the first fiducial mark 201 and distributed in at least a part of the first fiducial mark 201, in such a way that the second feature pattern 210 and the first feature pattern 200 are integrated on the same side of the flat target, as shown in fig. 8.

It should be noted that, although the reference marks (the first reference mark 201 and the second reference mark 211) are illustrated as squares in fig. 7 and 8, those skilled in the art should understand that the reference marks (the first reference mark 201 and the second reference mark 211) may also be implemented in other shapes, such as triangles, polygons, and even line segments, and it is only necessary to be able to extract features that can be used for testing from the reference marks.

Further, as described above, the first field of view FOV1 of the first camera module 11 of the array camera module 10 is larger than the field of view FOV2 of the second camera module 12. Accordingly, when the target image of the target device 20 is captured by the array camera module 10, the first field of view FOV1 of the first camera module 11 covers a larger partial area of the target device 20, and the second field of view FOV2 of the second camera module 12 is located within the first field of view FOC 1. Accordingly, in the process of performing step S100 to obtain the target image of the target device 20, the placing manner of the target device 20 needs to be adjusted so that the first feature pattern 200 located on the target device 20 corresponds to the field of view FOV1 of the first camera module 11 of the array camera module 10, and the second feature pattern 210 located on the target device 20 corresponds to the field of view FOV2 of the second camera module 12 of the array camera module 10.

For convenience of operation, rules of placement of the array camera module 10 may be established. For example, in a specific embodiment of the present invention, the placement rule of the array camera module 10 may be set as: the center area of the target device 20 is made to correspond to the first camera module 11 of the array camera module 10. Here, the position of the second feature pattern 210 in the overlapping area of the first feature pattern 200 may be designed based on the relative positional relationship between the first camera module 11 and the second camera module 12. It should be noted that, in order to facilitate the center test of the first camera module 11, in some embodiments of the present invention, as shown in fig. 6, the second reference mark 211 may not be set in the first reference mark 201 in the central area of the target device 20, so as to avoid that the second reference mark 211 has an adverse effect on the center test of the first camera module 11 in the subsequent test process.

Accordingly, under the guidance of this placement rule, the step S100 of providing the target image captured by the array camera module 10, wherein the target device 20 has the first feature pattern 200 and the second feature pattern 210, includes the steps of:

s200 placing the target device 20 at a specific position in the field of view of the array camera module 10, wherein at the specific position, the first camera module 11 of the array camera module 10 corresponds to a central region of the target device 20; and

s210 obtains the target image by the first camera module 11 and the second camera module 12 of the array camera module 10, respectively. Preferably, in some embodiments of the present invention, the second fiducial mark 211 is not located within the first fiducial mark 201 located in the central region of the target device 20.

It should be noted that due to manufacturing errors or other uncontrollable factors, the optical axes between the first camera module 11 and the second camera module 12 of the array camera module 10 are not completely parallel. In other words, as shown in fig. 9, the optical axis Op1 of the first camera module 11 and the optical axis Op2 of the second camera module 12 coincide at a certain position (a position) at a certain distance (set to D1) from the array camera module 10. Here, in order to ensure that the center test of the first camera module 11 and the second camera module 12 does not refer to the fiducial marks (the first fiducial mark 201 and the second fiducial mark 211) in the same area, it is preferable to set the placement position of the target device 20 to: the distance between the target device 20 and the array camera module 10 is smaller than the distance D1, that is, the placement position of the target device 20 is located below the a position. That is, in some embodiments of the present invention, the rule of the placement of the array camera module 10 further includes: the distance between the target device 20 and the array camera module 10 is smaller than the distance D1.

It is also worth mentioning that in the actual shooting scene, the array camera module 10 may be used to shoot the object at a longer distance. Therefore, in the actual test process, the distance between the array camera module 10 and the target device 20 needs to be relatively large. At this time, if the requirement of the shooting test distance is satisfied only by the physical space distance between the array camera module 10 and the target device 20, the test field needs to have a wide space, which certainly does not satisfy the actual situation. In view of the above technical problem, as shown in fig. 10, in some embodiments of the present invention, a distance-increasing device (e.g., a distance-increasing mirror 30) may be optionally disposed between the target device 20 and the array camera module 10, so as to satisfy the shooting test distance requirement by the distance-increasing device without changing the actual physical distance between the array camera module 10 and the target device 20.

More specifically, it should be understood by those skilled in the art that when the range finder 30 is disposed between the target device 20 and the array camera module 10, the actual shooting object of the array camera module is the virtual image of the target device 20 on the range finder 30, and in this way, the shooting distance between the array camera module 10 and the target device 20 is increased without changing the actual physical distance between the array camera module 10 and the target device 20.

Further, after the target image of the target device 20 is captured by the array camera module 10, step S110 is further executed to identify the first feature pattern 200 and the second feature pattern 210 in the target image. Here, the target image captured by the first camera module 11 includes the first feature pattern 200 and the second feature pattern 210, and the target image captured by the second camera module 12 includes the first feature pattern 200 and the second feature pattern 210. However, for the first camera module 11, the image to be referred to for the test is only the image of the first characteristic pattern 200. Accordingly, the image to be referred to for the second camera module 12 is only the image of the second feature pattern 210. Therefore, in the preferred embodiment of the present invention, the step S110 further includes the steps of: s310, identifying the first characteristic pattern 200 in the target image for the first camera module 11 to test; and

s320 identifies the second feature pattern 210 in the target image for testing by the second camera module 12.

Finally, executing step S120 and step S130, obtaining a test result of the first camera module 11 of the array camera module 10 based on the first feature pattern 200 in the target image; and obtaining a test result of the second camera module 12 of the array camera module 10 based on the second feature pattern 210 in the target image. In particular, the test results of the first camera module 11 and the second camera module 12 of the array camera module 10 can be solved based on the features (e.g., black and white line pairs or corner regions) in the first feature pattern 200 and the second feature pattern 210. Here, the test result is resolution data of the first camera module 11 and the second camera module 12 of the array camera module 10, and may be represented by MTF, SFT curves, and the like.

It is worth mentioning that, in order to facilitate the extraction of the features in the first feature pattern 200 and the second feature pattern 210, the first fiducial mark 201 and the second fiducial mark 211 may have a certain offset angle. Taking the first reference mark 201 and the second reference mark 211 as black/white squares as an example, the offset angle refers to an included angle α (shown in fig. 4) formed between an edge of the square and a vertical edge of the target device 20, wherein the included angle α may be set to 7 ° ± 5 ° for feature detection. It should be noted that the specific value of the offset angle depends on the feature recognition algorithm, and is not repeated herein since it is not the focus of the present invention.

Here, although the above description has been made taking as an example the application of the test method to an array camera module having an "optical zoom" function. However, it should be understood by those skilled in the art that the testing method according to the embodiment of the present invention can be applied to other array camera modules.

For example, in another embodiment of the present invention, the array camera module may include a larger number of camera modules, for example, the array camera module 10 may be implemented as three camera modules including the first camera module 11, the second camera module 12, and the third camera module. Accordingly, in this case, as shown in fig. 11, the target device 20 further integrates a third feature pattern 230, wherein the third feature pattern 230 is integrated with the second feature pattern 210 in the manner of integrating the first feature pattern 200 and the second feature pattern 210. Since the way of integrating the third feature patterns 230 into the second feature patterns 210 is the same as the way of integrating the second feature patterns 210 into the first feature patterns 200, the description thereof is omitted.

In summary, the technical principle and the technical effect of the target device 20 to simultaneously test the cameras of the array camera 10 by the target device 20 are illustrated by the special configuration of the target device 20 (integrating a plurality of calibration patterns into the target device 20 according to a predetermined pattern). Here, since the test between the camera modules of the array camera module 10 is performed simultaneously, the adjustment or calibration between the camera modules of the array camera module 10 can be performed synchronously based on the test result, in other words, such a test mode is also advantageous for the calibration and calibration of the array camera module 10.

Exemplary method 2

Referring to fig. 12 to 14, a testing method according to a second preferred embodiment of the present invention is illustrated, wherein the testing method of the second preferred embodiment is substantially identical to the testing method of the first preferred embodiment, including step S100 of providing a target image of a target device 20A acquired by the array camera module 10, wherein the target device 20A has a first feature pattern 200A and a second feature pattern 210A; s110, identifying the first characteristic pattern 200A and the second characteristic pattern 210A in the target image; s120, obtaining a test result of the first camera module 11 of the array camera module 10 based on the first feature pattern 200A in the target image; and S130, obtaining a test result of the second camera module 12 of the array camera module 10 based on the second characteristic pattern 210A in the target image. The difference is the configuration of the target device 20A and the manner in which the various calibration patterns are integrated.

More specifically, as shown in fig. 12, in the preferred embodiment of the present invention, the target device 20A includes a first target 21A and a second target 22A, wherein the first characteristic pattern 200 is disposed on the first target 21A and the second characteristic pattern 210A is disposed on the second target 22A. In the test process, the second target 22A is superimposed on the first target 21A so that the second feature pattern 210A is superimposed on the first feature pattern 200A, and by such a configuration, it is equivalent to integrally configuring the first feature pattern 200A and the second feature pattern 210A, so that the first camera module 11 and the second camera module 12 of the array camera module 10 can be simultaneously tested based on the target device 20A. In other words, in the preferred embodiment of the present invention, the target device 20A is implemented as two planar targets.

Here, when the target device 20A is implemented as a combination of the first target 21A and the second target 22A, the relative positional relationship between the first target 21A and the second target 22A may be adjusted with respect to the relative positional relationship between the first camera module 11 and the second camera module 12 of the array camera module 10, so as to improve the test accuracy of the array camera module 10. Different array camera modules have different configurations, including but not limited to, the equivalent focal length and the field of view of the first camera module 11 and the second camera module 12, and the relative positional relationship between the first camera module 11 and the second camera module 12. It should be appreciated that, unlike the aforementioned manner in which the first feature pattern 200A and the second feature pattern 210A are integrated into the same plane target, the first calibration pattern 200A and the second feature pattern 210A are respectively disposed on the first target 21A and the second target 22A, so that the relative position relationship between the first feature pattern 200A and the second feature pattern 210A can be adjusted in real time according to the relative position relationship between the first camera module 11 and the second camera module 12, as shown in fig. 13 and 14. In other words, the target device 20A has relatively good universality.

In other words, in the preferred embodiment of the present invention, the step S100 of providing the target image includes:

S210A placing the first target 21A at a specific position in the field of view of the first camera module 11 and the second camera module 12 of the array camera module 10, so that the first camera module 11 corresponds to the first target 21A;

S220A superimposing the second target 22A on the first target 21A such that the second feature pattern 210 on the second target 22A is superimposed on the first feature pattern 200 on the first target 21A;

S230A moving the second target 22A so that the second camera module 12 corresponds to the second target 22A based on the relative positional relationship between the first camera module 11 and the second camera module 12 of the array camera module 10; and

S240A obtaining the target image by the first camera module 11 and the second camera module 12 of the array camera module 10

After the target image of the target device 20 is captured by the array camera module 10, step S110 is further executed to identify the first characteristic pattern 200A and the second characteristic pattern 210A in the target image. Here, the target image captured by the first camera module 11 includes the first feature pattern 200A and the second feature pattern 210A, and the target image captured by the second camera module 12 includes the first feature pattern 200A and the second feature pattern 210A. However, as for the first camera module 11, the image to which the test is required to be referred is only the image of the first characteristic pattern 200A. Accordingly, the image to be referred to for the test of the second camera module 12 is only the image of the second feature pattern 210A. Accordingly, in agreement, the step S110 further includes the steps of: s310, identifying the first characteristic pattern 200A in the target image for the first camera module 11 to test; and

s320 identifies the second feature pattern 210A in the target image for testing by the second camera module 12.

Obtaining a test result of the first camera module 11 of the array camera module 10 based on the first feature pattern 200A in the target image; and obtaining a test result of the second camera module 12 of the array camera module 10 based on the second feature pattern 210A in the target image. In particular, the test results of the first camera module 11 and the second camera module 12 of the array camera module 10 can be solved based on the calibration features (e.g., black and white line pairs or corner regions) in the first feature pattern 200A and the second feature pattern 210A. Here, the test result is resolution data of the first camera module 11 and the second camera module 12 of the array camera module 10, and may be represented by MTF, SFT curves, and the like.

In summary, the technical principle and the technical effect of simultaneously testing the camera modules of the array camera module 10 by the target device 20A through the special configuration of the target device 20A (a plurality of calibration patterns are respectively disposed on a plurality of targets, and a plurality of templates are arranged in a stacked manner) are described. Here, since the test between the camera modules of the array camera module 10 is performed simultaneously, the adjustment or calibration between the camera modules of the array camera module 10 can be performed synchronously based on the test result.

In other words, according to another aspect of the present invention, the present invention further provides a calibration method for an array camera module 10, which includes:

obtaining the test results of the first camera module 11 and the second camera module 12 of the array camera module 10 based on the array camera module test method; and

and calibrating the first camera module 11 and the second camera module 12 of the array camera module based on the test result.

Correspondingly, an array camera module adjusting method is also provided, which comprises the following steps:

and adjusting the relative position relationship between the first camera module 11 and the second camera module 12 of the array camera module 10 based on the test result.

Here, although the above description has been made taking as an example the application of the test method to an array camera module having an "optical zoom" function. However, it should be understood by those skilled in the art that the testing method according to the embodiment of the present invention can be applied to other array camera modules. For example, in another embodiment of the present invention, the array camera module may include a larger number of camera modules, for example, the array camera module 10 may be implemented as three camera modules including the first camera module 11, the second camera module 12, and the third camera module. Accordingly, in this case, the target device 20 further integrates a third target having a third characteristic pattern, wherein, during the test process, the first target 21A, the second target 22A and the third target are arranged in an overlapping manner to simultaneously test the first camera module 11, the second camera module 12 and the third camera module of the array camera module 10.

Target device 20

As shown in fig. 4, according to another aspect of the present invention, the present invention further provides a target device 20, which integrally configures the first feature pattern 200 and the second feature pattern 210 for a testing process of the array camera module. In particular, the target device 20 is implemented as a planar target, and the first feature pattern 200 and the second feature pattern 210 are integrated on the same side of the planar target according to a predetermined pattern, wherein the first feature pattern 200 and the second feature pattern 210 have different parameter characteristics and different integration modes corresponding to different configurations of the cameras of the array camera 10.

In order to ensure the test uniformity of the imaging modules of the array imaging module 10, the first feature pattern 200 and the second feature pattern 210 need to be configured with different sizes, and more specifically, the first reference mark 201 and the second reference mark 211 have different size configurations. In the preferred embodiment of the present invention, a side length ratio between the first reference mark 201 and the second reference mark 211 satisfies a relationship: where l2/l1 is f1/f2, where l1 denotes a side length of the first reference mark 201, that is, a side length of a black or white square in the first feature pattern 200, l2 denotes a side length of the second reference mark 211, that is, a side length of a black or white square in the second feature pattern 210, f1 denotes an equivalent focal length of the first camera module 11 of the array camera module 10, and f2 denotes an equivalent focal length of the second camera module 12 of the array camera module 10.

Further, setting the first equivalent focal length f1 of the first camera module 11 to be smaller than the second equivalent focal length f2 of the second camera module 12 can obtain: f1/f2 ═ l2/l1 < 1. In other words, the size of the first fiducial mark 201 is larger than the size of the second fiducial mark 211, so that the second fiducial mark 211 can be distributed in the first fiducial mark 201 in a manner of being accommodated in the first fiducial mark 201, and in this way, the second feature pattern 210 is integrated into the first feature pattern 200. Here, when the second reference mark 211 is received in the first reference mark 201, the array camera module 10 may simultaneously capture images of the first reference mark 201 and the second reference mark 211 for testing of the array camera module 10, that is, the array camera module 10 may simultaneously capture images of the first feature pattern 200 and the second feature pattern 210 for testing of the array camera module 10.

Fig. 4 illustrates an example of a predetermined pattern in which the second feature pattern 210 is integrated with the first feature pattern 200. As shown in fig. 4, the second feature patterns 210 are distributed in an embedded manner in a portion of the first feature patterns 200. In particular, in this example, each of the first fiducial marks 201 includes one second fiducial mark 211 in an overlapping region of the first feature pattern 200 and the second feature pattern 210, wherein a side length of the second fiducial mark 211 and a side length of the first fiducial mark 201 satisfy a relationship: l2/l1 ═ f1/f 2. In addition, in the overlapping region of the first characteristic pattern 200 and the second characteristic pattern 210, the first reference mark 201 and the second reference mark 211 have relative hues, that is, when the first reference mark 201 is a black lattice, the second reference mark 211 accommodated in the first reference mark 201 is a white lattice; correspondingly, when the first reference mark 201 is a white lattice, the second reference mark 211 contained in the first reference mark 201 is a black lattice.

It should be noted that, in another embodiment of the present invention, the preset mode of integrating the second feature pattern 210 into the first feature pattern 200 may be adjusted, for example, the number of the second fiducial marks 211 included in each of the first fiducial marks 201 in the overlapping region of the first feature pattern 200 and the second feature pattern 210 may be changed. Fig. 5 illustrates another example of the preset pattern in which the second characteristic pattern 210 is integrated into the first characteristic pattern 200, wherein in this example, the number of more than one second fiducial mark 211, for example, 2, is included in each first fiducial mark 201 in the overlapping area of the first characteristic pattern 200 and the second characteristic pattern 210. And are not intended to limit the scope of the present invention.

second feature patterns

It should be noted that, as shown in fig. 6, in some embodiments of the present invention, in order to facilitate the center test of the first camera module 11, in some embodiments of the present invention, the second reference mark 211 may not be set in the first reference mark 201 in the central area of the target device 20, so as to avoid that the second reference mark 211 adversely affects the center test of the first camera module 11 in the subsequent test process.

Here, although the above description has been made taking as an example a test in which the target device 20 is applied to an array camera module. However, it should be understood by those skilled in the art that the target device 20 according to the embodiment of the present invention can be applied to the fields of active calibration of an array camera module, and focusing of a lens of an array camera module. And are not intended to limit the scope of the present invention.

Exemplary test System

As shown in fig. 15, according to another aspect of the present invention, an array camera module testing system is provided, which includes an array camera module 10, a target device 20 and a processor 30. In particular, the

reticle device

20, 20A integrally configures a first calibration pattern 200,200A and a second calibration pattern 210,210A for testing each camera module of the array camera module 10.

In the testing process, the

target device

20, 20A is set in the field of view corresponding to the array camera module 10, and the array camera module 10 acquires the target image corresponding to the

target device

20, 20A, wherein the processor is preloaded with a preset testing program to obtain the testing result of the first camera module 11 of the array camera module 10 based on the first characteristic pattern 200,200A in the target image and obtain the testing result of the second camera module 12 of the array camera module 10 based on the second characteristic pattern 210,210A in the target image.

In some embodiments of the present invention, the test system further comprises a memory 40, wherein the memory 40 stores computer program instructions that are invoked when the processor 30 runs, so that the processor 30 can execute the computer program instructions stored in the memory 40.

It will be appreciated by persons skilled in the art that the embodiments of the invention described above and shown in the drawings are given by way of example only and are not limiting of the invention. The objects of the invention have been fully and effectively accomplished. The functional and structural principles of the present invention have been shown and described in the examples, and any variations or modifications of the embodiments of the present invention may be made without departing from the principles.

Claims

1. A target device for testing an array camera module, wherein the array camera module includes a first camera module and a second camera module, the first camera module has a first field of view FOV1 and the second camera module has a second field of view FOV2, the second field of view FOV2 is within the first field of view FOV1, comprising:

the first characteristic pattern is used for testing the first camera module and comprises a series of first reference marks; and

the second characteristic pattern is used for testing the second camera module and comprises a series of second reference marks, wherein the first characteristic pattern and the second characteristic pattern are integrated on the same side face of the target device;

and the ratio of the side length of the first reference mark to the side length of the second reference mark is equal to the ratio of the equivalent focal length of a second camera module of the array camera module to the equivalent focal length of the first camera module.

2. The target device of claim 1, wherein the target device is implemented as a planar target, the first and second feature patterns being integrated on a same side of the planar target.

3. The target device of claim 2, wherein the first fiducial marks are arranged in an edge-to-edge array to form the first pattern of features, wherein the second fiducial marks are arranged in an edge-to-edge array to form the second pattern of features, wherein the second fiducial marks are received within at least a portion of the first fiducial marks in such a way that the first pattern of features and the second pattern of features are integrated on the same side of the planar target.

4. The target device of claim 2, wherein the first fiducial marks are arranged in a spaced-apart array to form the first pattern of features, wherein the second fiducial marks are arranged in a spaced-apart array to form the second pattern of features, wherein the second fiducial marks are received within at least a portion of the first fiducial marks in such a way that the first pattern of features and the second pattern of features are integrated on the same side of the planar target.

5. The target device of claim 2, wherein the first fiducial marks are arranged in a spaced-apart array to form the first pattern of features, wherein the second fiducial marks are arranged in a spaced-apart array to form the second pattern of features, wherein the second fiducial marks are respectively disposed at spaced-apart regions between the first fiducial marks, in such a way that the second pattern of features and the first pattern of features are integrated on the same side of the planar target.

6. The target device of claim 1, wherein the number of the second fiducial marks received by each of the first fiducial marks does not exceed a square of a ratio between equivalent focal lengths of the second camera module and the first camera module of the array camera module.

7. The target device of any of claims 3 to 5, wherein the second fiducial mark is not provided in a central region of the target device.

8. The target device of claim 2, wherein the planar targets are one in number.

9. The target device of claim 1, wherein the array camera further comprises a third camera, the target device further having a third feature pattern for testing the third camera, wherein the third feature pattern is integrated on the same side of the target device according to a manner in which the first and second feature patterns are integrated on the target device.

10. An array camera module testing method, wherein the camera modules comprise a first camera module and a second camera module, the first camera module has a first field of view FOV1 and the second camera module has a second field of view FOV2, the second field of view FOV2 is within the first field of view FOV1, the method comprising the steps of:

providing a target image of a target device acquired by the array camera module, wherein the target device is provided with a first characteristic pattern and a second characteristic pattern, the first characteristic pattern and the second characteristic pattern are integrated in the target device according to a preset mode, the first characteristic pattern comprises a series of first reference marks, the second characteristic pattern comprises a series of second reference marks, and the ratio of the side length of the first reference mark to the side length of the second reference mark is equal to the ratio of the equivalent focal length of the second camera module to the equivalent focal length of the first camera module of the array camera module;

identifying the first and second feature patterns in the reticle image;

11. The array camera module testing method of claim 10, wherein the step of obtaining the test result of the first camera module based on the first feature pattern in the target image is performed simultaneously with the step of obtaining the test result of the second camera module based on the second feature pattern in the target image.

12. The array camera module testing method of claim 10, wherein in the step of providing the target image, the target device is implemented as a planar target, wherein the first feature pattern and the second feature pattern are integrated on the same side of the target device according to a predetermined pattern.

13. The array camera module testing method of claim 11, wherein in the step of providing the target image, the target device is implemented as a planar target, wherein the first feature pattern and the second feature pattern are integrated on the same side of the target device according to a predetermined pattern.

14. The method for testing the array camera module of claim 12, wherein the first fiducial marks are arranged in an edge-to-edge array to form the first feature pattern, wherein the second fiducial marks are arranged in an edge-to-edge array to form the second feature pattern, wherein the second fiducial marks are received in at least a portion of the first fiducial marks, in such a way that the first feature pattern and the second feature pattern are integrated on the same side of the flat target.

15. The method for testing the array camera module of claim 13, wherein the first fiducial marks are arranged in an edge-to-edge array to form the first feature pattern, wherein the second fiducial marks are arranged in an edge-to-edge array to form the second feature pattern, wherein the second fiducial marks are received in at least a portion of the first fiducial marks, in such a way that the first feature pattern and the second feature pattern are integrated on the same side of the flat target.

16. The method for testing the array camera module of claim 12, wherein the first fiducial marks are arranged in an array in a spaced manner to form the first characteristic pattern, wherein the second fiducial marks are arranged in an array in a spaced manner to form the second characteristic pattern, wherein the second fiducial marks are received in at least a portion of the first fiducial marks, in such a way that the first characteristic pattern and the second characteristic pattern are integrated on the same side of the planar target.

17. The method for testing the array camera module of claim 13, wherein the first fiducial marks are arranged in an array in a spaced manner to form the first characteristic pattern, wherein the second fiducial marks are arranged in an array in a spaced manner to form the second characteristic pattern, wherein the second fiducial marks are received in at least a portion of the first fiducial marks, in such a way that the first characteristic pattern and the second characteristic pattern are integrated on the same side of the planar target.

18. The method for testing the array camera module of claim 12, wherein the first fiducial marks are arranged in an array in a spaced manner to form the first characteristic pattern, wherein the second fiducial marks are arranged in an array in a spaced manner to form the second characteristic pattern, wherein the second fiducial marks are respectively disposed in spaced areas between the first fiducial marks, in such a way that the second characteristic pattern and the first characteristic pattern are integrated on the same side of the planar target.

19. The method for testing the array camera module of claim 13, wherein the first fiducial marks are arranged in an array in a spaced manner to form the first characteristic pattern, wherein the second fiducial marks are arranged in an array in a spaced manner to form the second characteristic pattern, wherein the second fiducial marks are respectively disposed in spaced areas between the first fiducial marks, in such a way that the second characteristic pattern and the first characteristic pattern are integrated on the same side of the planar target.

20. The method for testing an array camera module of claim 10, wherein the number of the second reference marks received by each of the first reference marks is not more than the square of the ratio between the equivalent focal lengths of the first camera module and the second camera module of the array camera module.

21. The array camera module testing method of any of claims 14 to 20, wherein the step of providing the target image comprises the steps of:

22. The array camera module testing method of claim 21, wherein the second fiducial mark is not provided in a central region of the target device.

23. The array camera module testing method of claim 10, wherein in the step of providing the target image, the target device comprises a first target and a second target, wherein the first feature pattern is provided on the first target and the second feature pattern is provided on the second target, wherein during the calibration process, the second target is superimposed on the first target such that the second feature pattern is superimposed on the first feature pattern, in such a way that the first feature pattern and the second feature pattern are integrated into the target device.

24. The array camera module testing method of claim 11, wherein in the step of providing the target image, the target device comprises a first target and a second target, wherein the first feature pattern is disposed on the first target and the second feature pattern is disposed on the second target, wherein during the calibration process, the second target is superimposed on the first target such that the second feature pattern is superimposed on the first feature pattern, in such a way that the first feature pattern and the second feature pattern are integrated into the target device.

25. The method for testing an array camera module of claim 10, wherein the step of providing the reticle image comprises the steps of:

placing a first target at a specific position in the field of view of the array camera module so that the first camera module corresponds to the first target;

overlaying a second target on the first target such that the second feature pattern on the second target overlays the first feature pattern on the first target;

26. The method for testing an array camera module of any of claims 10-20, wherein the target device further comprises a third feature pattern integrated on the same side of the target device according to the way the first and second feature patterns are integrated on the target device, so that a test result of a third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

27. The method for testing the array camera module of claim 21, wherein the target device further comprises a third feature pattern, and the third feature pattern is integrated on the same side of the target device according to the way that the first feature pattern and the second feature pattern are integrated on the target device, so that a test result of a third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

28. The method for testing the array camera module of claim 22, wherein the target device further comprises a third feature pattern, and the third feature pattern is integrated on the same side of the target device according to the way that the first feature pattern and the second feature pattern are integrated on the target device, so that the test result of the third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

29. The method for testing the array camera module of claim 23, wherein the target device further comprises a third feature pattern, and the third feature pattern is integrated on the same side of the target device according to the way that the first feature pattern and the second feature pattern are integrated on the target device, so that a test result of a third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

30. The method for testing the array camera module of claim 24, wherein the target device further comprises a third feature pattern, and the third feature pattern is integrated on the same side of the target device according to the way that the first feature pattern and the second feature pattern are integrated on the target device, so that a test result of a third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

31. The method for testing the array camera module of claim 25, wherein the target device further comprises a third feature pattern, and the third feature pattern is integrated on the same side of the target device according to the way that the first feature pattern and the second feature pattern are integrated on the target device, so that the test result of the third camera module of the array camera module can be obtained based on the third feature pattern in the target image.

32. An array camera module calibration method is characterized by comprising the following steps:

the method for testing the array camera module according to any one of claims 10 to 31, obtaining the test results of the first camera module and the second camera module of the array camera module; and

33. An array camera module adjusting method is characterized by comprising the following steps:

34. An array camera module test system, it includes:

an array camera module;

the target device of any of claims 1-9, wherein the first and second feature patterns are integrated on the same side of the target device in a predetermined pattern; and