CN110646828B - Method for quantitatively selecting thicknesses of optical filter and scintillator - Google Patents

Method for quantitatively selecting thicknesses of optical filter and scintillator Download PDF

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CN110646828B
CN110646828B CN201910774455.1A CN201910774455A CN110646828B CN 110646828 B CN110646828 B CN 110646828B CN 201910774455 A CN201910774455 A CN 201910774455A CN 110646828 B CN110646828 B CN 110646828B
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王*召
王召
苏晓芳
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Shanghai Yirui Optoelectronics Technology Co ltd
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Abstract

The invention provides a method for quantitatively selecting a light filter and a scintillator thickness, which is characterized in that a mathematical model is established before an X-ray detector is prepared to simulate the whole process from emission to detection of X-rays, a thickness database of a high-energy scintillator, a low-energy scintillator and a filter is established under the condition of specifying a ray source and a high-low energy transmissivity threshold, then discrete data of the separation degree is obtained by changing the thicknesses of the high-energy scintillator, the low-energy scintillator and the filter based on the database, and finally the thicknesses of the high-energy scintillator, the low-energy scintillator and the filter corresponding to the maximum separation degree are searched and are the optimal thicknesses of the high-energy scintillator, the low-energy scintillator and the filter in the X-ray detector structure. By adopting the method, the thickness of the high-low energy scintillator and the filter can be pre-judged and selected before the detector is designed, so that the reliability of later-stage detector design and development is improved, and the experimental cost and the development period are saved.

Description

Method for quantitatively selecting thicknesses of optical filter and scintillator
Technical Field
The invention relates to an X-ray detector in a single-source dual-energy imaging system, in particular to a method for quantitatively selecting the thicknesses of an optical filter and a scintillator.
Background
X-ray imaging systems can be divided into single energy and dual energy systems based on the source energy of the data acquisition. The single energy system is also called as standard X-ray scanning system, which is a ray source, a set of X-ray detectors and a data acquisition and transmission system, wherein X-rays transmit through the object to be detected in a fan shape, a row of detectors collect ray intensity signals of the X-rays after the X-rays pass through the object to be scanned and are processed to form an image, and the formed image only has gray information. The image formation depends on the density of the object to be inspected and the directions of the object to be inspected and the X-ray. Because the equipment lacks a high-level computer mode recognition technology and can only be basically distinguished according to the shape of an article in an image, the requirement on operators is high, and all the operators need to be specially trained. Because of the limited image information available with the single energy approach, research is currently focused mainly on dual energy systems. Dual energy systems can be further divided into single source and dual source modes depending on the number of X-ray sources. The imaging system is called a single-source dual-energy imaging system by using an X-ray source, two sets of detectors with different responses, one set of high-energy frequency spectrum responding to X-rays and one set of low-energy frequency spectrum responding to X-rays.
Two sets of detectors with different responses in a single-source dual-energy imaging system at present mainly comprise a low-energy scintillator, a filter, a high-energy scintillator and a light emitting diode (PD) module, wherein the low-energy scintillator mainly absorbs low-energy X-rays in bremsstrahlung (Bremsstrahlung) and converts the low-energy X-rays into electronic signals through the corresponding PD module, and then after the low-energy X-rays are filtered by the filter, the high-energy X-rays are absorbed by the high-energy scintillator and converted into the electronic signals through the corresponding PD module. The thickness selection of the filter, the low-energy scintillator and the high-energy scintillator of the X-ray detector in the existing single-source dual-energy imaging system is not a quantitative method, the X-ray detector is generally prepared according to practical experience values, and after the detector is prepared, the performance of the X-ray detector can be evaluated through testing, so that the financial resources and the labor are wasted, and the period is long.
Therefore, it is necessary to provide a method for quantitatively selecting the thickness of the optical filter and the scintillator, so as to make a pre-judgment selection on the thicknesses of the high-energy and low-energy scintillators and the optical filter before designing the X-ray detector, so as to improve the reliability of later X-ray detector design and development and save the experiment cost.
Disclosure of Invention
In view of the above disadvantages of the prior art, an object of the present invention is to provide a method for selecting the thickness of an optical filter and a scintillator in a quantitative manner, so as to solve the problems that the selection of the thickness of the optical filter, the low-energy scintillator and the high-energy scintillator of an X-ray detector in the prior art is generally prepared according to practical experience values because no quantitative method is available, and after the preparation of the detector is completed, the performance of the detector can be evaluated through testing, which wastes money and labor, and has a long period.
To achieve the above and other related objects, the present invention provides a method for quantifying filter selection and scintillator thickness, which is used in an X-ray detector in a single-source dual-energy imaging system, and is characterized in that the method at least comprises:
1) setting effective atomic number Z of material of detected objecttAnd the thickness h of the detected objecttSatisfies the condition { Zt，ht；Zmin<＝Zt<＝Zmax，hmin<＝ht<＝hmaxIn which Z isminIs the minimum value, Z, of the effective atomic number of the material of the inspected objectmaxIs the maximum value of the effective atomic number of the material of the detected object, hminIs the minimum value of the thickness of the detected object, hmaxThe maximum value of the thickness of the detected object;
2) selecting two detected objects Z within the range set in the step 1)t1And Zt2Wherein Z ist1And Zt2The effective atomic numbers of the materials of the two detected objects are respectively;
3) setting the maximum energy E0 of the ray source;
4) setting the minimum value T of the transmissivity of a detector receiving a low-energy signal after the detector is placed in an object to be detectedLminAnd maximum value TLmaxAnd setting the minimum value T of the transmittance of the detector receiving the high-energy signal after the detector is placed in the detected objectHminAnd maximum value THmax；
5) Respectively setting the thickness h of the low-energy scintillator according to the conditions selected in the step 2), the step 3) and the step 4)det1Value range of, and thickness h of filterfValue range of (a) and thickness h of high-energy scintillatordet2So that it satisfies the condition { h }det1，hf，hdet2；TLmin<＝TL(E0，Zmax，hmax，hdet1)，TL(E0，Zmin，hmin，hdet1)<＝TLmax，THmin<＝TH(E0，Zmax，hmax，hdet1，hf，hdet2)，TH(E0，Zmin，hmin，hdet1，hf，hdet2)<＝THmaxIn which T isL(E0，Zt，ht，hdet1) Transmissivity, T, of detectors for receiving low-energy signals after insertion in the body to be inspectedH(E0，Zt，ht，hdet1，hf，hdet2) The transmissivity of a detector for receiving the high-energy signal after the detector is placed into the detected object;
6) taking the discrete data in the step 5) in the value range in the step 4) and respectively calculating T of the two detected objects set in the step 2)L(E0，Zt，ht，hdet1)、TH(E0，Zt，ht，hdet1，hf，hdet2) And R (E)0,Zt,ht,hdet1,hf,hdet2) And according to the R (E) of two detected objects0,Zt,ht,hdet1,hf,hdet2) Value-calculating the separation degree D of the two detected objects, wherein,
Figure BDA0002174595530000021
7) retrieving the maximum value of the separation degree in the step 6), and selecting the thickness of the low-energy scintillator, the thickness of the filter plate and the thickness of the high-energy scintillator corresponding to the maximum value.
Optionally, two detected objects Z in the step 2)t1And Zt2The thickness relation of (a) is satisfied, under the condition of the same radiation source, the absorption amount of the ray energy emitted by the radiation source by the two detected objects is the same.
Further, two kinds of the detected objects Zt1And Zt2Iron and titanium.
Further, the maximum energy E0 of the ray source in the step 3) is between 140KeV and 160 KeV.
Optionally, two kinds of the detected objects Zt1And Zt2Titanium and aluminum or carbon and glass.
Optionally, the filter sheet comprises a sheet of copper or aluminum.
Optionally, in step 5), the transmittance T of the detector receiving the low-energy signal after the detector is placed in the detected objectL(E0，Zt，ht，hdet1) Obtained from the following equation:
Figure BDA0002174595530000031
transmissivity T of detector for receiving high-energy signal after being put into detected objectH(E0，Zt，ht，hdet1，hf，hdet2) Obtained from the following equation:
Figure BDA0002174595530000032
wherein, ILFor low-energy signals received by the detector after the object to be inspected has been introduced, IL0For low-energy signals received by the detector after the object to be inspected has not been inserted, IHFor high-energy signals received by the detector after the object to be inspected has been placed, IH0F (E, E0) is the X-ray energy spectrum from the source, mu (E, Z)x) As a function of the X-ray attenuation coefficient of the material Zx,
Figure BDA0002174595530000033
is the average absorbed X-ray energy function of a low-energy scintillator1(E,hdet1) As a function of the effective detectivity of the low-energy scintillator,
Figure BDA0002174595530000034
is the average absorbed X-ray energy function of the high-energy scintillator2(E,hdet2) Effective detectivity function for high energy scintillators, ZfEffective atomic number of material for filter
Further, in step 6), the separation degree D of the two detected objects is obtained by the following formula:
Figure BDA0002174595530000035
wherein h ist1And ht2The thicknesses of the two detected objects are respectively.
Optionally, in step 6), the separation degree D of the two detected objects is obtained by the following formula:
Figure BDA0002174595530000041
wherein h ist1And ht2The thicknesses of the two detected objects are respectively.
The invention also provides a manufacturing method of the X-ray detector, the X-ray detector comprises a low-energy scintillator, a filter, a high-energy scintillator and a light-emitting diode module, and the thicknesses of the low-energy scintillator, the filter and the high-energy scintillator are selected quantitatively based on any one of the methods for quantitatively selecting the thicknesses of the optical filter and the scintillator.
As mentioned above, the method for quantitatively selecting the thickness of the optical filter and the scintillator of the invention simulates the whole process from emission to detection of X-rays by establishing a mathematical model before the preparation of the X-ray detector, establishes a database of the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the optical filter under the condition of specifying a radiation source and a high-low energy transmittance threshold, then obtains discrete data of the separation degree D by changing the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the optical filter by taking the database as a basis, and finally obtains the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the optical filter corresponding to the obtained separation degree D when the separation degree D reaches the maximum value, namely the optimal thicknesses of the high-energy scintillator, the low-energy scintillator and the optical filter in the X-ray detector structure. By adopting the method for quantitatively selecting the optical filter and the thickness of the scintillator, the high-low energy scintillator and the thickness of the optical filter can be pre-judged and selected before the detector is designed, so that the reliability of the later-stage detector design and development is improved, and the experimental cost and the development period are saved.
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FIG. 1 is a flow chart illustrating the steps of the method for quantitatively selecting the thickness of the filter and the scintillator according to the present invention.
Description of the element reference numerals
S1-S7
Detailed Description
The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification. The invention is capable of other and different embodiments and of being practiced or of being carried out in various ways, and its several details are capable of modification in various respects, all without departing from the spirit and scope of the present invention.
Please refer to fig. 1. It should be noted that the drawings provided in the present embodiment are only for illustrating the basic idea of the present invention, and the components related to the present invention are only shown in the drawings rather than drawn according to the number, shape and size of the components in actual implementation, and the type, quantity and proportion of the components in actual implementation may be changed freely, and the layout of the components may be more complicated.
As shown in fig. 1, the present invention provides a method for quantifying the thickness of a selected filter and a scintillator, which is used in an X-ray detector in a single-source dual-energy imaging system, and the method at least comprises:
s1, setting the effective atomic number Z of the material of the detected objecttAnd the thickness h of the detected objecttSatisfies the condition { Zt，ht；Zmin<＝Zt<＝Zmax，hmin<＝ht<＝hmaxIn which Z isminIs the minimum value, Z, of the effective atomic number of the material of the inspected objectmaxIs the maximum value of the effective atomic number of the material of the detected object, hminIs the minimum value of the thickness of the detected object, hmaxThe maximum value of the thickness of the detected object;
s2, selecting two kinds of objects to be detected within the range set in the step S1Object Zt1And Zt2Wherein Z ist1And Zt2The effective atomic numbers of the materials of the two detected objects are respectively;
s3, setting the maximum energy E0 of the ray source;
s4, setting the minimum value T of the transmissivity of the detector receiving the low-energy signal after the detector is placed in the detected objectLminAnd maximum value TLmaxAnd setting the minimum value T of the transmittance of the detector receiving the high-energy signal after the detector is placed in the detected objectHminAnd maximum value THmax；
S5, setting the thickness h of the low-energy scintillator according to the selected conditions in the steps S2, S3 and S4det1Value range of, and thickness h of filterfValue range of (a) and thickness h of high-energy scintillatordet2So that it satisfies the condition { h }det1，hf，hdet2；TLmin<＝TL(E0，Zmax，hmax，hdet1)，TL(E0，Zmin，hmin，hdet1)<＝TLmax，THmin<＝TH(E0，Zmax，hmax，hdet1，hf，hdet2)，TH(E0，Zmin，hmin，hdet1，hf，hdet2)<＝THmaxIn which T isL(E0，Zt，ht，hdet1) Transmissivity, T, of detectors for receiving low-energy signals after insertion in the body to be inspectedH(E0，Zt，ht，hdet1，hf，hdet2) The transmissivity of a detector for receiving the high-energy signal after the detector is placed into the detected object;
s6, taking the discrete data in the step S5 in the value range in the step S4 and respectively calculating the T of the two detected objects set in the step S2L(E0，Zt，ht，hdet1)、TH(E0，Zt，ht，hdet1，hf，hdet2) And R (E)0,Zt,ht,hdet1,hf,hdet2) And according to the R (E) of two detected objects0,Zt,ht,hdet1,hf,hdet2) Value-calculating the separation degree D of the two detected objects, wherein,
Figure BDA0002174595530000051
and S7, searching the maximum value of the separation degree in the step S6, and selecting the thickness of the low-energy scintillator, the thickness of the filter and the thickness of the high-energy scintillator corresponding to the maximum value.
The method includes the steps that a mathematical model is established before an X-ray detector is manufactured to simulate the whole process from emission to detection of X-rays, when a ray source and a high-low energy transmittance threshold value are specified, a database of the thickness of a high-energy scintillator, the thickness of a low-energy scintillator and the thickness of a filter plate is established, then discrete data of a separation degree D are obtained by changing the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the filter plate according to the database, and finally the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the filter plate corresponding to the separation degree D when the separation degree D is found out to be the maximum value are compared and are the optimal thicknesses of the high-energy scintillator, the low-energy scintillator and the filter plate in the X-ray detector structure. The R value is a ratio of high-low energy transmissivity after logarithm, an R characteristic curve of a specific material under the condition of specifying parameters of a ray source and a detector can be obtained by changing the thickness of the material of the detected object, theoretically, the separation degree of the R characteristic curves of two different detected objects under the same condition is larger, the recognition effect of the detector on the two detected objects is the best, namely the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the filter plate are the optimal thicknesses, therefore, the method for quantitatively selecting the thickness of the filter plate and the scintillator can be used for pre-judging and selecting the thicknesses of the high-low energy scintillator and the filter plate before the detector is designed, the reliability of later-stage detector design and development is improved, and the experimental cost and the development period are saved.
As an example, two kinds of the detected objects Z in step S2t1And Zt2The thickness relation of (a) is satisfied, under the condition of the same radiation source, the absorption amount of the ray energy emitted by the radiation source by the two detected objects is the same.
Preferably, two kinds of the detected objects Zt1And Zt2Iron and titanium are chosen and the maximum energy E0 of the source is chosen to be between 140KeV and 160 KeV. Iron and titanium are selected as the detected object, and the designed detector is suitable for being used in the security inspection occasion.
As an example, two kinds of the detected objects Zt1And Zt2Selected from titanium and aluminum or carbon and glass.
By way of example, the filter segment comprises a sheet of copper or aluminum. Preferably, the filter plate is a copper sheet.
As an example, in step S5, the transmittance T of the detector receiving the low-energy signal after the detector is placed in the detected objectL(E0，Zt，ht，hdet1) Obtained from the following equation:
Figure BDA0002174595530000061
transmissivity T of detector for receiving high-energy signal after being put into detected objectH(E0，Zt，ht，hdet1，hf，hdet2) Obtained from the following equation:
Figure BDA0002174595530000071
wherein, ILFor low-energy signals received by the detector after the object to be inspected has been introduced, IL0For low-energy signals received by the detector after the object to be inspected has not been inserted, IHFor placing the object to be detected in the detectorReceived high energy signal, IH0F (E, E0) is the X-ray energy spectrum from the source, mu (E, Z)x) As a function of the X-ray attenuation coefficient of the material Zx,
Figure BDA0002174595530000072
is the average absorbed X-ray energy function of a low-energy scintillator1(E,hdet1) As a function of the effective detectivity of the low-energy scintillator,
Figure BDA0002174595530000073
is the average absorbed X-ray energy function of the high-energy scintillator2(E,hdet2) Effective detectivity function for high energy scintillators, ZfIs the effective atomic number of the material of the filter.
As an example, in step S6, the separation degree D of the two detected objects can be obtained by the following formula:
Figure BDA0002174595530000074
or
Figure BDA0002174595530000075
Wherein h ist1And ht2The thicknesses of the two detected objects are respectively.
Based on the method for quantitatively selecting the thicknesses of the optical filter and the scintillator, the invention also provides a manufacturing method of the X-ray detector, wherein the X-ray detector at least comprises the low-energy scintillator, the filter, the high-energy scintillator and the light-emitting diode module, and the thicknesses of the low-energy scintillator, the filter and the high-energy scintillator can be quantitatively selected by adopting the method for quantitatively selecting the thicknesses of the optical filter and the scintillator.
In summary, the present invention simulates the whole process from emission to detection of X-rays by establishing a mathematical model before the preparation of the X-ray detector, when the radiation source and the threshold of high and low energy transmittance are specified, a database of the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the filter is established, then the discrete data of the separation degree D is obtained by changing the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the filter based on the database, and finally the thickness of the high-energy scintillator, the thickness of the low-energy scintillator and the thickness of the filter corresponding to the separation degree D when the separation degree D reaches the maximum value are obtained by comparison and search, namely, the optimal thicknesses of the high-energy scintillator, the low-energy scintillator and the filter in the X-ray detector structure are obtained. By adopting the method for quantitatively selecting the optical filter and the thickness of the scintillator, the high-low energy scintillator and the thickness of the optical filter can be pre-judged and selected before the detector is designed, so that the reliability of the later-stage detector design and development is improved, and the experimental cost and the development period are saved. Therefore, the invention effectively overcomes various defects in the prior art and has high industrial utilization value.
The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.

Claims (7)

1. A method for quantifying the thickness of a selected filter and a scintillator, which is used in an X-ray detector in a single-source dual-energy imaging system, is characterized in that the method at least comprises the following steps:
1) setting effective atomic number Z of material of detected objecttAnd the thickness h of the detected objecttSatisfies the condition { Zt，ht；Zmin<＝Zt<＝Zmax，hmin<＝ht<＝hmaxIn which Z isminIs the minimum value, Z, of the effective atomic number of the material of the inspected objectmaxIs the maximum of the effective atomic number of the material of the detected objectLarge value of hminIs the minimum value of the thickness of the detected object, hmaxThe maximum value of the thickness of the detected object;
2) selecting two detected objects t1 and t2 within the range set in the step 1), wherein Z ist1And Zt2The effective atomic numbers of the materials of the two detected objects are respectively;
3) setting the maximum energy E0 of the ray source;
4) setting the minimum value T of the transmissivity of a detector receiving a low-energy signal after the detector is placed in an object to be detectedLminAnd maximum value TLmaxAnd setting the minimum value T of the transmittance of the detector receiving the high-energy signal after the detector is placed in the detected objectHminAnd maximum value THmax；
5) Respectively setting the thickness h of the low-energy scintillator according to the conditions selected in the step 2), the step 3) and the step 4)det1Value range of, and thickness h of filterfValue range of (a) and thickness h of high-energy scintillatordet2So that it satisfies the condition { h }det1，hf，hdet2；TLmin<＝TL(E0，Zmax，hmax，hdet1)，TL(E0，Zmin，hmin，hdet1)<＝TLmax，THmin<＝TH(E0，Zmax，hmax，hdet1，hf，hdet2)，TH(E0，Zmin，hmin，hdet1，hf，hdet2)<＝THmaxIn which T isL(E0，Zt，ht，hdet1) Transmissivity, T, of detectors for receiving low-energy signals after insertion in the body to be inspectedH(E0，Zt，ht，hdet1，hf，hdet2) The transmissivity of the detector receiving the high-energy signal after being put into the detected object is determined, wherein the transmissivity T of the detector receiving the low-energy signal after being put into the detected objectL(E0，Zt，ht，hdet1) Obtained from the following equation:
Figure FDA0002835919500000011
transmissivity T of detector for receiving high-energy signal after being put into detected objectH(E0，Zt，ht，hdet1，hf，hdet2) Obtained from the following equation:
Figure FDA0002835919500000012
wherein, ILFor low-energy signals received by the detector after the object to be inspected has been introduced, IL0For low-energy signals received by the detector after the object to be inspected has not been inserted, IHFor high-energy signals received by the detector after the object to be inspected has been placed, IH0F (E, E0) is the X-ray energy spectrum from the source, mu (E, Z)x) As a function of the X-ray attenuation coefficient of the material Zx,
Figure FDA0002835919500000021
is the average absorbed X-ray energy function of a low-energy scintillator1(E,hdet1) As a function of the effective detectivity of the low-energy scintillator,
Figure FDA0002835919500000022
is the average absorbed X-ray energy function of the high-energy scintillator2(E,hdet2) Effective detectivity function for high energy scintillators, ZfIs the effective atomic number of the material of the filter;
6) taking the discrete data in the step 5) in the value range in the step 4) and respectively calculating T of the two detected objects set in the step 2)L(E0，Zt，ht，hdet1)、TH(E0，Zt，ht，hdet1，hf，hdet2) And R (E)0,Zt,ht,hdet1,hf,hdet2) Wherein R (E)0,Zt,ht,hdet1,hf,hdet2) Transmissivity T of detector for receiving high-energy signal after being put into detected objectH(E0，Zt，ht，hdet1，hf，hdet2) Transmittance T of detector for receiving low-energy signal after being put into detected objectL(E0，Zt，ht，hdet1) Taking the ratio after logarithm and according to the R (E) of two detected objects0,Zt,ht,hdet1,hf,hdet2) Value-calculating the separation degree D of the two detected objects, wherein,
Figure FDA0002835919500000023
the separation degree D of the two detected objects is obtained by the following formula:
Figure FDA0002835919500000024
or
Figure FDA0002835919500000025
Wherein h ist1And ht2The thicknesses of the two detected objects are respectively set;
7) retrieving the maximum value of the separation degree in the step 6), and selecting the thickness of the low-energy scintillator, the thickness of the filter plate and the thickness of the high-energy scintillator corresponding to the maximum value.
2. The method of claim 1, wherein the method further comprises: the thickness relation of the two detected objects t1 and t2 in the step 2) meets the condition that the two detected objects have the same absorption amount of ray energy emitted by the ray source under the condition of the same ray source.
3. The method of claim 2, wherein the method further comprises: the two detected objects t1 and t2 are iron and titanium.
4. The method of claim 3, wherein the method further comprises: the maximum energy E0 of the ray source in the step 3) is between 140KeV and 160 KeV.
5. The method of claim 2, wherein the method further comprises: two detected objects t1 and t2 are titanium and aluminum, or carbon and glass.
6. The method of claim 1, wherein the method further comprises: the filter plate comprises a copper sheet or an aluminum sheet.
7. The manufacturing method of the X-ray detector comprises a low-energy scintillator, a filter, a high-energy scintillator and a light-emitting diode module, and is characterized in that the thicknesses of the low-energy scintillator, the filter and the high-energy scintillator are selected quantitatively according to the method of any one of claims 1 to 6.
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