CN110632037B - System loss parameter detection device of exciton polarization excimer carrier - Google Patents
System loss parameter detection device of exciton polarization excimer carrier Download PDFInfo
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Abstract
The invention relates to a system loss parameter detection device for an exciton polarization excimer carrier. The device mainly comprises two parts, namely vortex and pump light preparation, carrier spontaneous radiation signal acquisition and an image analysis terminal, wherein the vortex and pump light preparation mainly comprises a laser, a spatial light modulator and an adjustable attenuator, and the image analysis terminal mainly comprises an acquisition light path and an image analysis terminal. Firstly, a laser generates a Gaussian beam, vortex rotation with orbital angular momentum of +/-l is prepared by a spatial light modulator, and pumping light with light intensity controlled by an adjustable attenuator is prepared at the same time; then, simultaneously irradiating vortex rotation and pumping light to the surface of the carrier; then, acquiring a carrier stimulated spontaneous emission interference pattern optical signal by using a charge coupled sensor camera; and finally, distinguishing a stable interval of the interference pattern by using the image signal processing terminal, and calculating the system loss parameter of the carrier according to the pump light intensity corresponding to the interval. The device has simple structure and convenient operation, and develops a new method for measuring the system loss experiment of the exciton polarization excimer carrier.
Description
Technical Field
The invention mainly relates to the fields of condensed state, photoelectricity and signal processing, in particular to technical methods for forming a wave particle vortex superposed state, modulating the phase of a light beam, detecting a spontaneous radiation image and the like.
Technical Field
Bose-Einstein condensate (BEC) was the gaseous condensate proposed by Bose and Einstein in the last 20 th century, and cornell and wilman and their assistants succeeded in achieving a true BEC in 1995 at the institute of astronomical physics laboratories. In recent years, people find that an exciton polarization system in a semiconductor microcavity can realize BEC at normal temperature, the research enthusiasm of people on the exciton polarization of the semiconductor microcavity is greatly stimulated, and the normal-temperature superflow characteristic of the semiconductor microcavity shows great scientific research and application values. The current worldwide research on exciton polaritons in semiconductor microcavities mainly focuses on three aspects of photon-exciton coupling, exciton polariton spontaneous radiation and exciton polariton evolution characteristics. Because an exciton polariton system in the semiconductor microcavity material is a non-Hermite dissipation system, the loss coefficient of the semiconductor material must be determined through theoretical and experimental researches in the three aspects. However, a direct and simple loss factor measurement method and measurement device are still lacking.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: aiming at the problem that the loss characteristic parameters of the prior exciton polarization excimer carrier material with a semiconductor microcavity structure are difficult to directly and simply measure, the invention aims to realize the transfer of vortex rotation Sagnac interference effect to the semiconductor microcavity exciton polarization excimer carrier material by utilizing the spontaneous radiation characteristic of the semiconductor microcavity exciton polarization excimer, extract key parameters by utilizing image information generated by the spontaneous radiation of the carrier material and realize the measurement of the system loss characteristic gamma of the exciton polarization excimer carrier material with the semiconductor microcavity structure by simple calculation.
The technical solution of the invention is as follows: the invention relates to a device for detecting loss characteristics of an exciton polariton carrier system based on wave particle vortex, which comprises the following main components as shown in figure 1: the device comprises a laser 1(1), a horizontal polaroid (2), a beam expanding lens group (3), a spectroscope 1(4), a spatial light modulator SLM1(5), a spatial light modulator SLM2(6), a plane mirror 1(7), a plane mirror 2(8), a spectroscope 2(9), a spectroscope 3(10), a laser 2(11), a controllable attenuator (12), a plane mirror 3(13), a collimating lens group 1(14), a spectroscope 4(15), an objective lens (16), a sample bin (17), a collimating lens group 2(18), a focusing spatial filter (19), a CCD (20) and an image processing terminal (21). First, a laser (1) generates a laser beam, the laser beam is changed into horizontal polarized light after passing through a polaroid (2), the horizontal polarized light is changed into a Gaussian beam with a required diameter through a beam expanding lens (3), the Gaussian beam is divided into two beams through a spectroscope (4), the two beams are respectively irradiated on a spatial light modulator 1(5) and a spatial light modulator 2(6) to respectively modulate two vortex beams with orbital angular momentum of opposite numbers, one of the two vortex beams passes through a plane mirror 1(7) and a plane mirror 2(8), and then is optically merged with the other vortex beam at a spectroscope (9). Meanwhile, a laser 2(11) generates a pumping laser beam, and the pumping laser beam passes through a controllable attenuator (12) and a plane mirror (13) and then is merged with the other two vortex light beams at a spectroscope 3 (10). Then, the light beam passes through the collimating lens group 1(14), the beam splitter 4(15) and the objective lens (16) and irradiates the surface of the exciton polarization excimer sample fixed on the sample chamber (17). At this time, the sample surface generates an interference pattern of spontaneous emission. The interference pattern passes through an objective lens (16) and a spectroscope (4) (15), then pump light is filtered out sequentially through a collimating lens group (2) (18) and a focusing space filter (19), exciton polarized excimer spontaneous radiation facula image signals are collected by a charge coupled sensor camera (20), and finally real-time processing and result calculation are carried out by an image information processing terminal (21). By adjusting the controllable attenuator (12), when the attenuation value of the controllable attenuator is larger than a certain value, the light spot cannot be formed, and when the attenuation value of the controllable attenuator is smaller than a certain value, the light spot presents a divergence characteristic. And searching the moment corresponding to the starting of the formation and the starting of the divergence of the light spots by using the image information processing terminal, thereby successfully calculating the system loss parameter gamma by using the corresponding controllable attenuation value.
The principle of the invention is as follows:
(1) Gross-Pitaevski equation based on Schrodinger equation
The Gross-Pitaevski (GP equation for short) equation reflects the energy coupling relationship between exciton polaritons and photons and the space-time evolution relationship of field distribution in Bose-Einstein condensation (BEC) in a non-Hermite system. The expression of the GP equation is as follows:
wherein the content of the first and second substances,
is the normalized Planck constant,. phi. (r) is the exciton polarizationThe distribution wave function of the excimer field, m is the effective mass of the exciton polariton, Vext(r) is the barrier distribution in the exciton field; g is a nonlinear correlation coefficient reflecting the degree of coupling between the exciton field and the photon field; p (r) is the pump optical field distribution; η is the system saturation factor; γ is the system loss parameter. In experimental research, loss parameters are the most important system parameters of semiconductor microcavity materials, and reflect the spontaneous emission performance and the stability of the materials in evolution over time. The solution of this equation, i.e., ψ (r, t), reflects the spatio-temporal distribution of the exciton polariton spontaneous emission field, and the system loss γ and the pump p (r) have the greatest influence on this solution, the pump term is in reality a term that is controllable and measurable outside the system, so the GP equation links the externally measurable term with the system loss parameter by the exciton polariton field distribution.
As shown in fig. 5, the numerical calculation result of the relationship can be obtained by the longge stoke method and the real-time evolution method, and the numerical calculation result is statistically processed and then brought into the analysis relationship to be established. Thus, the relationship between system loss and pump intensity can be given by the following relationship:
wherein, P0maxThe maximum pump light intensity P is the maximum pump light intensity P which keeps the exciton polarization spontaneous radiation to form pattern without diffusion0minIs the minimum pump light intensity that enables exciton polariton spontaneous emission to form. γ is a dimensionless number, which can be reduced to scale for different usage scenarios. The invention is based on this relationship to measure the system loss parameter of semiconductor-based exciton polariton carrier materials.
(2) Phase imprinting principle based on exciton polarization excimer vortex superposition state
The semiconductor microcavity structure is a flat microcavity structure, as shown in fig. 2(a), where the flat microcavity structure is composed of distributed Bragg reflectors (dbgs), and the dbgs are dielectric periodic structures formed by alternately arranging two dielectric films. The quantum microstructure material is typically embedded in the microcavity where the optical cavity mode has the greatest intensity, as shown in fig. 2 (b). The embedded semiconductor quantum wells provide exciton modes that can couple with optical modes in the slab microcavity, thereby forming their coupled modes-exciton polaritons, as shown in fig. 2 (c). These exciton polaritons are distributed in the semiconductor microcavity and spontaneously emit photons.
If the semiconductor microcavity is irradiated with a specially designed Gauss beam with orbital angular momentum, a vortex state of exciton polarization excimer is excited. In this system, the initial state system energy needs to be non-zero, using the form:
the pump light in the system enables the exciton polariton in the system to be in an excited state all the time. Wherein P is0Is the pump intensity, e is the natural constant, r is the radial coordinate, r0Is the pump spot radius. However, at this time, the exciton polariton of the excited spontaneous emission moves from inside to outside on the X-Y plane in the cavity, and the light spot formed by the spontaneous emission is annular, which is not beneficial to observation and characteristic signal extraction. If a beam shape is used at this time as:
P′(r)＝P′0eilθeiωt (3)
a vortex beam with orbital angular momentum l, where P'0For vortex intensity, l is the orbital angular momentum, i is the unit complex number, θ is the angular coordinate, ω is the angular frequency, and t is time. At this time, orbital angular momentum of the vortex light beam is transferred between the light beam and the exciton polariton, so that the movement direction of the exciton polariton is changed, and a vortex state is generated. When two vortex beams with orbital angular momentum of +/-l are simultaneously excited, exciton polaritons generate vortex superposed states. As shown in fig. 3, the interference pattern appears macroscopically, and this process is called phase imprinting, i.e., coherent vortex light imprints coherent phases onto the surface of the semiconductor microcavity material. Dry matterInterference pattern number is l, exciton polarization excimer field distribution | psi (r, t)' at coherence position follows circular symmetry2Gaming machine capable of generating light at maximum and cancellation | ψ (r, t)2Approaching to zero, thus creating good conditions for subsequent discrimination and detection.
The invention has the main advantages that:
(1) the structure is simple, the positions of all components are fixed, the variable is only the attenuation amplitude of the controllable attenuator, and the control is easy.
(2) The device has wide application range. According to the design principle, the dimensionless calculation method is adopted, so that the discrimination method used by the device is suitable for measuring system loss parameters of various semiconductor exciton polariton carriers under the non-Hermite condition.
(3) The device has high measurement sensitivity and large dynamic range. By adopting an image processing mode which takes the maximum and minimum light spot brightness times of the interference fringes as the characteristic value, the characteristic value can be easily extracted, the relative error possibly generated in the characteristic value extraction and analysis processes is small, and the dynamic range of measurement is large.
Drawings
FIG. 1 is a schematic view of a detection apparatus;
FIG. 2 is a diagram of a semiconductor microcavity architecture;
FIG. 3 is a schematic diagram of quantum well and intra-cavity field distributions;
FIG. 4 is a schematic view of a vortex stack configuration;
FIG. 5 is a graph showing pump intensity versus system loss;
detailed description of the preferred embodiments
The invention takes a spontaneous radiation interference pattern formed by coupling vortex rotation and exciton polarization in a semiconductor microcavity as a measurement carrier, and the specific implementation steps are as follows:
firstly, a laser (1) generates a laser beam, the laser beam is changed into horizontal polarized light after passing through a polaroid (2), because the spatial light modulator only has a good modulation effect on the horizontal polarized light, and the light beam emitted by the laser is adjusted through a collimation and beam expansion lens (3) group. Then, the light beam is split into two paths by the beam splitter and irradiated on two spatial light modulators (5) and (6) loaded with holograms as shown in fig. 2(a) and 2(b), respectively, so that vortex light beams as shown in fig. 2(c) and 2(d) can be reflected from the two spatial light modulators, and orbital angular momentum of the two vortex optical rotations are opposite to each other. Then, the two beams are optically rotated to be overlapped by using plane mirrors (7) and (8) and a beam splitter (9).
At the same time, a laser beam is generated by a laser (11), which acts as pump light. The light beam passes through the adjustable attenuator, and the real-time regulation and control of the pump light intensity by the control terminal computer are realized. The regulated and controlled pumping light beam is converged to the spectroscope (10) through the plane reflector (13). The beam splitter (10) is used for realizing the superposition of the two beams of vortex light and the one beam of pump light.
The three superposed laser beams are converged to a spectroscope (15) through a collimating lens group (14), one of the laser beams is collimated and incident to an objective lens, and then a sample bin irradiates the surface of a semiconductor microcavity exciton polariton carrier fixed on the sample bin. At this time, under the energy excitation of the pump light, exciton polarization excimer is generated in the semiconductor microcavity, and then the exciton polarization excimer is coupled with two vortex lights with opposite orbital angular momentum, so that spontaneous radiation occurs. Since the two vortex light beams respectively impress phases to exciton polarization, Sagnac interference occurs in spontaneous radiation, and petaloid interference fringes are formed.
Then the interference fringe enters a focusing space filter (19) through an objective lens (16), a spectroscope (15) and a collimating lens group (18), after reflected pump light interference items are filtered out, the interference fringe is collected by a charge coupled sensor camera (20), and finally a real-time image is transmitted to an image information processing terminal (21) for processing.
The image information real-time processing terminal mainly uses the maximum light intensity value A of interference fringe by image phase processing softwaremaxAnd a minimum intensity value AminThe quotient was taken 20lg for processing. As the controllable attenuator continuously increases the attenuation value of the pump light intensity, the exciton polariton system changes from a divergent state to a stable state and then to a dissipative state. At this time, 20lgAmax/AminWill be gradually increased and then gradually decreased, at which time 20lgA is recorded by the image information real-time processing terminalmax/AminTwice at 2dBThe pump light intensity, which is the upper/lower limit of the exciton polarization interference pattern caused by the pump light in the stable state, is recorded as pumpmaxAnd pumpminAt this time, according to γ ═ p (pump)max+pumpmin) The loss parameter gamma of the system can be obtained from 2 to 0.3.
Those skilled in the art will appreciate that the details of the present invention not described in detail herein are well within the skill of those in the art.
Claims (2)
1. A system loss parameter detection device for exciton polariton carrier, comprising: the laser comprises a laser 1(1), a horizontal polaroid (2), a beam expanding lens group (3), a spectroscope 1(4), a spatial light modulator SLM1(5), a spatial light modulator SLM2(6), a plane mirror 1(7), a plane mirror 2(8), a spectroscope 2(9), a spectroscope 3(10), a laser 2(11), a controllable attenuator (12), a plane mirror 3(13), a collimating lens group 1(14), a spectroscope 4(15), an objective lens (16), a sample bin (17), a collimating lens group 2(18), a focusing spatial filter (19), a charge coupled sensor camera (20) and an image processing terminal (21), wherein firstly, the laser 1 generates a laser beam, the laser beam passes through the polaroid (2) and then becomes horizontal polarized light, the laser beam passes through the beam expanding lens (3) and becomes a Gaussian beam with required diameter, and the Gaussian beam passes through the spectroscope (4) and is divided into two beams, respectively irradiating the light beams on a spatial light modulator 1(5) and a spatial light modulator 2(6) to respectively modulate two vortex light beams with orbital angular momentum of opposite numbers, wherein one vortex light beam passes through a plane mirror 1(7) and a plane mirror 2(8) and then is optically converged with the other vortex light beam at a spectroscope (9); meanwhile, a laser 2(11) generates a pumping laser beam, and the pumping laser beam passes through a controllable attenuator (12) and a plane mirror (13) and then is merged with the other two beams of vortex light at a spectroscope 3 (10); then, the light beam irradiates to the surface of an exciton polarization excimer sample fixed on a sample bin (17) after passing through a collimating lens group 1(14), a beam splitter 4(15) and an objective lens (16), the sample surface can generate a spontaneous radiation interference pattern, the interference pattern passes through the objective lens (16) and the beam splitter 4(15), then the pump light is filtered out through a collimating lens group 2(18) and a focusing space filter (19), an exciton polarization spontaneous radiation facula image signal is collected by a charge coupled sensor camera (20), and finally real-time processing and result calculation are carried out by an image information processing terminal (21).
2. The device for detecting the system loss parameters of the exciton polariton carrier according to claim 1, wherein a spatial light modulator is utilized to generate two beams of vortex light with topology charge numbers opposite to each other, the vortex light is used as signal light, and the signal light and the pump light with the light intensity adjusted by a controllable attenuator are irradiated to the surface of the semiconductor-based exciton polariton carrier material after passing through a specific light path, so that the carrier is excited to radiate spontaneously to generate a vortex superposition state interference pattern; scanning and adjusting the controllable attenuator to change the pump light intensity within a certain range, collecting interference pattern signals through a specific light path consisting of a spectroscope, a collimating lens group and a focusing spatial filter and a charge coupled sensor camera, processing the spot pattern of the interference pattern signals in real time by using an image signal processing terminal, and obtaining the maximum pump light intensity pump which keeps exciton polarization spontaneous radiation to form pattern patterns without divergence through criteriamaxAnd a minimum pump light intensity pump enabling exciton polariton spontaneous emission to formmin(ii) a And the system loss parameter gamma may be expressed as
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