CN110609189A - Test circuit of electronic component - Google Patents
Test circuit of electronic component Download PDFInfo
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- CN110609189A CN110609189A CN201910915900.1A CN201910915900A CN110609189A CN 110609189 A CN110609189 A CN 110609189A CN 201910915900 A CN201910915900 A CN 201910915900A CN 110609189 A CN110609189 A CN 110609189A
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- circuit
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- emitting diode
- light emitting
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention provides a test circuit of an electronic component, which comprises an input circuit: the input end of the input circuit is connected with an external power supply and converts input voltage into stable direct-current voltage for output; a time-base circuit: the input end of the time base circuit is connected with the output end of the input circuit and outputs periodically-changed high and low levels; component detection circuit: the input end of the component detection circuit is connected with the output end of the time base circuit and comprises at least one component detection module, and each component detection module is used for detecting different electronic components. The test circuit of the electronic component can conveniently and quickly judge the quality of the common electronic component which can not be directly measured by the universal meter, provides a quick detection method for the maintenance of electronic equipment or the on-machine operation of a new component, and ensures the stable operation of electrical equipment.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a test circuit of an electronic component.
Background
Along with the improvement of the degree of the electrical automation logic control, electronic components such as a solid-state relay, an electromagnetic relay, a photoelectric coupler, a silicon controlled rectifier and the like are used in a large number of logic control circuits, and the quality of the components cannot be directly and accurately judged by a universal meter. Once such a component has a problem, the component can only be soldered down from the circuit board and repaired one by using a replacement method, and then the fault position can be found. This is both time consuming and potentially can burn other components in a chain.
Disclosure of Invention
The invention aims to overcome the defects in the prior art, provides a test circuit of electronic components, can conveniently and quickly judge the quality of the common electronic components, and provides a quick detection method for the maintenance of electronic equipment or the on-machine operation of new components.
The purpose of the invention is realized by the following technical scheme: a test circuit for electronic components is characterized by comprising
An input circuit: the input end of the input circuit is connected with an external power supply and converts input voltage into stable direct-current voltage for output;
a time-base circuit: the input end of the time base circuit is connected with the output end of the input circuit and outputs periodically-changed high and low levels;
component detection circuit: the input end of the component detection circuit is connected with the output end of the time base circuit and comprises at least one component detection module, and each component detection module is used for detecting different electronic components.
Further, components and parts detection circuitry includes opto-coupler detection module, relay detection module and silicon controlled rectifier detection module, is used for detecting the quality of opto-coupler, the quality of relay and the quality of silicon controlled rectifier respectively.
Further, the optical coupling detection module comprises a six-pin optical coupling detection module and an eight-pin optical coupling detection module.
Further, the relay detection module comprises an electromagnetic relay detection module and a solid-state relay detection module.
Furthermore, each component detection module is provided with an independent display device for displaying the conduction state of the electronic component to be detected.
Further, the display device is embodied as a high brightness light emitting diode.
Furthermore, the relay detection module and the silicon controlled rectifier detection module can detect through alternating current or direct current.
Further, the input circuit comprises a transformer, a rectifier bridge and a voltage stabilizing block;
the transformer is used for converting external voltage into voltage required by the test circuit; the input end of the rectifier bridge is connected with the secondary side of the transformer, and when the input voltage is alternating current, the input voltage is rectified into direct current to be output; and the input end of the voltage stabilizing block is connected with the output end of the rectifier bridge and outputs stable direct current.
Further, the time base circuit comprises an NE555 chip and a light emitting diode, the NE555 chip forms a multivibrator, the light emitting diode is connected with the NE555 chip, and the light emitting diode emits light or does not emit light according to the high level or the low level of the output of the NE55 chip.
Further, when the NE555 chip outputs a low level, the light emitting diode emits light, and when the NE555 chip outputs a high level, the light emitting diode does not emit light.
The invention has the beneficial effects that: the invention provides a test circuit of electronic components, which can conveniently and quickly judge whether the common electronic components which cannot be directly measured by a universal meter are good or bad, provides a quick detection method for the maintenance of electronic equipment or the on-machine operation of new components, and ensures the stable operation of electrical equipment.
Drawings
The invention is further illustrated by means of the attached drawings, but the embodiments in the drawings do not constitute any limitation to the invention, and for a person skilled in the art, other drawings can be derived on the basis of the following drawings without inventive effort.
Fig. 1 is a schematic circuit diagram of a test circuit for an electronic component according to an embodiment of the present invention.
Wherein the reference numbers are as follows: 10. the system comprises an input circuit, 20 time base circuits, 30 optical coupling detection modules, 40 electromagnetic relay detection modules, 50 silicon controlled rectifier detection modules and solid state relay detection modules.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the test circuit for an electronic component in this embodiment includes an input circuit, a time-base circuit, an optical coupler detection module, an electromagnetic relay detection module, a thyristor detection module, and a solid-state relay detection module;
the input end of the input circuit is connected with an external power supply, converts input voltage into stable direct-current voltage for output, and provides stable working voltage for the work of the test circuit; the input end of the time base circuit is connected with the output end of the input circuit and outputs periodically-changed high and low levels; the optical coupling detection module, the electromagnetic relay detection module, the silicon controlled rectifier detection module and the solid state relay detection module are connected in parallel, and the input end of the optical coupling detection module, the electromagnetic relay detection module, the silicon controlled rectifier detection module and the solid state relay detection module are connected to the output end of the time base circuit.
The input circuit comprises a switch S, a transformer J, a rectifier bridge formed by diodes D1-D4, an electrolytic capacitor C1, a three-terminal voltage-stabilizing block U1, a capacitor C2, a resistor R2 and a light-emitting diode V1, wherein the specific model of the three-terminal voltage-stabilizing block U1 is 7812.
The external power supply can be direct current or alternating current, the embodiment takes commercial power as an example for explanation, the switch S is used for controlling the on-off of the commercial power, the 220V alternating current outputs 15V alternating voltage through the transformer J, then the voltage is rectified through the D1-D4 rectifier bridge, the electrolytic capacitor C1 filters, and then the +12V direct current voltage is output through 7812 voltage stabilization to serve as the working power supply of the test circuit.
The time base circuit comprises an NE555 chip, a resistor R1, an adjustable resistor RW1, a capacitor C3, a capacitor C4, a resistor R3, a light emitting diode V2, the NE555 chip, a resistor R1, an adjustable resistor RW1, a capacitor C3 and a capacitor C4 to form a multivibrator, the resistor R3 is used for limiting current, the light emitting diode V2 displays high level or low level output by the NE555 chip, when the NE555 chip outputs low level, the light emitting diode V2 emits light, when the NE555 chip outputs high level, the light emitting diode V2 does not emit light, and the NE555 chip outputs high level or low level to control the on and off of a tested device.
When a +12V power supply is supplied to the NE555, the voltage on the capacitor C3 cannot be suddenly changed, namely pins II and III of the NE555 are low, and the pins III output high level; the +12V power supply charges a capacitor C3 through R1 and RW, when the potentials of pins II and II of the NE555 reach two thirds of the power supply voltage, the output level of the pin III of the NE555 changes from high to low, and the work indicator lamp V2 is turned on to emit light; meanwhile, the discharge tube inside the pin (C) of NE555 is turned on, C3 starts to discharge, when the voltage at two ends of C3 drops to one third of the power voltage, the pin (C) output of NE555 becomes high level again, and the NE555 chip outputs the periodically changing high and low level.
The optical coupling detection module comprises a six-pin optical coupling detection module and an eight-pin optical coupling detection module, wherein the six-pin optical coupling detection module comprises a six-pin optical coupling 4N25, a resistor R4, a resistor R5 and a light emitting diode V3, and the eight-pin optical coupling detection module comprises an eight-pin optical coupling 2GO3D, a resistor R6, a resistor R7, a resistor R8, a resistor R9, a light emitting diode V4 and a light emitting diode V5.
A test method of a six-pin optical coupler 4N25 comprises the following steps: the optical coupler 4N25 has 6 pins, wherein the pins are input ends (connected with positive and grounded), the pins are output ends (grounded, and connected with high potential), the optical coupler 4N25 is inserted into the corresponding pin during measurement, a power switch S is switched on, and a power indication light emitting diode V1 emits light; and entering a working state. Under normal conditions, when the NE555 chip outputs a low level, the light emitting diode V2 emits light, the input circuit of the optocoupler 4N25 is conducted, and the light emitting diode V3 emits light; when the NE555 chip outputs a high level, the input circuit of the optocoupler 4N25 is cut off, the light emitting diode V3 does not emit light, and when the NE555 chip outputs a periodically changed high level and a periodically changed low level, the light emitting diode V3 and the light emitting diode V2 flicker at the same frequency. If the light emitting diode V3 is normally on or normally off, the light emitting diode indicates that the optocoupler 4N25 is damaged. Other six-pin optical couplers 4N35, 4N36, TIL117 and the like can be checked through a six-pin optical coupler detection module.
Test method of eight-pin optical coupler 2GO 3D: the optocoupler 2GO3D has 8 pins which are two optocouplers and devices, wherein the pins II and III are two groups of input ends respectively, and the pins III and III are two groups of output ends respectively (grounding ends, positive voltage ends). After the optocoupler 2GO3D is plugged, under a normal condition, the NE555 chip outputs low level, the light emitting diode V2 emits light, the input circuit of the optocoupler 2GO3D is conducted, and the light emitting diode V4 and the light emitting diode V5 both emit light; the NE555 chip outputs high level, an input circuit of the optocoupler 2GO3D is cut off, the light emitting diode V4 and the light emitting diode V5 do not emit light, if the light emitting conditions of the light emitting diode V4, the light emitting diode V5 and the light emitting diode V2 are consistent, the optocoupler 2GO3D is normal, and if the light emitting conditions of the light emitting diode V4, the light emitting diode V5 and the light emitting diode V2 are inconsistent, the optocoupler 2GO3D is damaged or partially damaged. Other eight-pin optical couplers can be detected by the eight-pin optical coupler detection module.
The electromagnetic relay detection module comprises a resistor R11, a resistor R12, a resistor R13, a resistor R14, a light emitting diode V6, a light emitting diode V7, a light emitting diode V8, a light emitting diode V9, a voltage stabilizing diode V14 and an electromagnetic relay JRC-19F, wherein the resistor R11, the resistor R12, the resistor R13 and the resistor R14 are all current-limiting resistors, and the voltage stabilizing diode V14 is used for stabilizing voltage of the electromagnetic relay JRC-19F/012M.
The test method of the electromagnetic relay detection module comprises the following steps: the electromagnetic relay JRC-19F is provided with two groups of normally open contacts and two groups of normally closed contacts, and when the electromagnetic relay JRC-19F is measured, the JRC-19F is inserted firstly. Under normal conditions, when the NE555 chip outputs low level, the V2 light emitting diode emits light, and after the NE555 chip enters a working state, if the light emitting diode V8 and the light emitting diode V9 are both bright, the relay is normally attracted, and if the light emitting diode V8 or the light emitting diode V9 are not bright, the corresponding contacts are not attracted; if the light emitting diodes V8 and V9 of the two indicator lamps are not lighted, and the light emitting diodes V6 and V7 are lighted, the two groups of contacts are proved to be not well attracted or the solenoid is proved to be damaged. When the NE555 chip outputs a high level, the light emitting diode V6 and the light emitting diode V7 are both on, which indicates that the relay is well released, and if neither the light emitting diode V6 nor the light emitting diode V7 emits light or only one of the light emitting diodes emits light, which indicates that the relay is not released or partially released.
The solid-state relay detection module comprises a resistor R16, a light-emitting diode V12, a light-emitting diode V13, a double-pole double-throw switch S1 and a solid-state relay JGX-2F, wherein the resistor R16 is a current-limiting resistor, and the double-pole double-throw switch S1 is used for switching between alternating current and direct current.
The test method of the solid-state relay detection module comprises the following steps: the solid-state relay detection module may detect an ac solid-state relay and a dc solid-state relay, and this embodiment takes the dc solid-state relay as an example for description. During measurement, the solid-state relay JGX-2F is inserted into a corresponding pin, a power switch S is switched on, and a power indication light-emitting diode V1 emits light; and entering a working state. Under normal conditions, when the NE555 chip outputs a low level, the light emitting diode V2 emits light, the solid state relay JGX-2F input circuit is conducted, and the light emitting diode V12 and the light emitting diode V13 emit light; when the NE555 chip outputs a high level, the solid state relay JGX-2 input circuit is cut off, the light emitting diode V12 and the light emitting diode V13 do not emit light, and the light emitting diode V12, the light emitting diode V13 and the light emitting diode V2 flicker at the same frequency. When the light emitting diode V12 and the light emitting diode V13 are both normally on or off or one of the normally on or off, the solid-state relay JGX-2F is indicated to be damaged.
The silicon controlled rectifier detection module comprises a resistor R15, a resistor R17, an adjustable resistor RW2, a light emitting diode V10, a light emitting diode V11, a double-pole double-throw switch S1 and a silicon controlled rectifier BT136, wherein the resistor R15 and the resistor R17 are current-limiting resistors, and the double-pole double-throw switch S1 is used for switching between alternating current and direct current.
The testing method of the silicon controlled rectifier detection module comprises the following steps: the silicon controlled rectifier detection module can detect alternating current silicon controlled rectifiers and direct current silicon controlled rectifiers, in the embodiment, the direct current silicon controlled rectifiers BT136 are taken as an example for explanation, the silicon controlled rectifiers BT136 are inserted into corresponding pins during measurement, the time base circuit NE555 outputs low level V2 to emit light, after the operation state is entered, an input circuit of the silicon controlled rectifiers BT136 is conducted, and the light emitting diodes V10 and V11 emit light; when the time-base circuit NE555 outputs a high level, the thyristor BT136 input circuit is cut off, and the light-emitting diode V10 and the light-emitting diode V11 are not lighted. The light emitting diode V10, the light emitting diode V11 and the light emitting diode V2 flicker at the same frequency, which indicates that the thyristor BT136 works normally. When the frequency flicker of any one of the light emitting diode V10 and the light emitting diode V11 is different from that of the light emitting diode V2, the thyristor BT136 is damaged.
The invention provides a test circuit of electronic components, which can conveniently and quickly judge whether the common electronic components which cannot be directly measured by a universal meter are good or bad, provides a quick detection method for the maintenance of electronic equipment or the on-machine operation of new components, and ensures the stable operation of electrical equipment.
Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the protection scope of the present invention, although the present invention is described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications or equivalent substitutions can be made on the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention.
Claims (10)
1. A test circuit for electronic components is characterized by comprising
An input circuit: the input end of the input circuit is connected with an external power supply and converts input voltage into stable direct-current voltage for output;
a time-base circuit: the input end of the time base circuit is connected with the output end of the input circuit and outputs periodically-changed high and low levels;
component detection circuit: the input end of the component detection circuit is connected with the output end of the time base circuit and comprises at least one component detection module, and each component detection module is used for detecting different electronic components.
2. The test circuit of the electronic component as claimed in claim 1, wherein the component detection circuit comprises an optical coupler detection module, a relay detection module and a thyristor detection module, and is used for detecting the quality of an optical coupler, the quality of a relay and the quality of a thyristor respectively.
3. The test circuit of the electronic component as claimed in claim 2, wherein the optical coupling detection module comprises a six-pin optical coupling detection module and an eight-pin optical coupling detection module.
4. The circuit for testing electronic components as claimed in claim 2, wherein the relay test module comprises an electromagnetic relay test module and a solid state relay test module.
5. The electronic component testing circuit according to claim 1, wherein each component detection module is provided with an independent display device for displaying the conduction state of the tested electronic component.
6. A test circuit for electronic components as claimed in claim 5, characterized in that the display device is embodied as a high-brightness light-emitting diode.
7. The test circuit for the electronic component as claimed in claim 2, wherein the relay detection module and the thyristor detection module are capable of detecting through alternating current or direct current.
8. The test circuit for the electronic component according to claim 1, wherein the input circuit comprises a transformer, a rectifier bridge and a voltage stabilizing block;
the transformer is used for converting external voltage into voltage required by the test circuit; the input end of the rectifier bridge is connected with the secondary side of the transformer, and when the input voltage is alternating current, the input voltage is rectified into direct current to be output; and the input end of the voltage stabilizing block is connected with the output end of the rectifier bridge and outputs stable direct current.
9. A test circuit for electronic components as claimed in claim 1, wherein said time base circuit comprises an NE555 chip and a light emitting diode, said NE555 chip constituting a multivibrator, said light emitting diode being connected to said NE555 chip, said light emitting diode emitting light or not according to a high level or a low level of an output of said NE55 chip.
10. A test circuit for electronic components as claimed in claim 9, wherein said light emitting diode emits light when said NE555 chip outputs a low level, and does not emit light when said NE555 chip outputs a high level.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910915900.1A CN110609189A (en) | 2019-09-26 | 2019-09-26 | Test circuit of electronic component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910915900.1A CN110609189A (en) | 2019-09-26 | 2019-09-26 | Test circuit of electronic component |
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| Publication Number | Publication Date |
|---|---|
| CN110609189A true CN110609189A (en) | 2019-12-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910915900.1A Pending CN110609189A (en) | 2019-09-26 | 2019-09-26 | Test circuit of electronic component |
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| CN202351354U (en) * | 2011-12-14 | 2012-07-25 | 武汉钢铁(集团)公司 | Controlled silicon detecting device |
| CN103399242A (en) * | 2013-08-15 | 2013-11-20 | 黄勇 | Photoelectric coupler detector |
| CN207051447U (en) * | 2017-06-30 | 2018-02-27 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of relay device for fast detecting |
| CN207992348U (en) * | 2018-03-22 | 2018-10-19 | 漳州万利达科技有限公司 | A kind of electronic product auto switching electric test device |
| CN108983070A (en) * | 2018-06-11 | 2018-12-11 | 合肥恒烁半导体有限公司 | A kind of detection system of circuit board |
| US20190120913A1 (en) * | 2014-10-30 | 2019-04-25 | The Boeing Company | Programmable alternating current (ac) load having regenerative and dissipative modes |
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2019
- 2019-09-26 CN CN201910915900.1A patent/CN110609189A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101089638A (en) * | 2006-06-13 | 2007-12-19 | 上海亿盟电气自动化技术有限公司 | Detection circuit for air circuit breaker |
| CN101210950A (en) * | 2006-12-27 | 2008-07-02 | 鸿富锦精密工业（深圳）有限公司 | Electronic components voltage-resisting test apparatus and method |
| CN202351354U (en) * | 2011-12-14 | 2012-07-25 | 武汉钢铁(集团)公司 | Controlled silicon detecting device |
| CN103399242A (en) * | 2013-08-15 | 2013-11-20 | 黄勇 | Photoelectric coupler detector |
| US20190120913A1 (en) * | 2014-10-30 | 2019-04-25 | The Boeing Company | Programmable alternating current (ac) load having regenerative and dissipative modes |
| CN207051447U (en) * | 2017-06-30 | 2018-02-27 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of relay device for fast detecting |
| CN207992348U (en) * | 2018-03-22 | 2018-10-19 | 漳州万利达科技有限公司 | A kind of electronic product auto switching electric test device |
| CN108983070A (en) * | 2018-06-11 | 2018-12-11 | 合肥恒烁半导体有限公司 | A kind of detection system of circuit board |
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Application publication date: 20191224 |