CN110609179A - 77GHz millimeter wave antenna testing arrangement - Google Patents
77GHz millimeter wave antenna testing arrangement Download PDFInfo
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- CN110609179A CN110609179A CN201910991707.6A CN201910991707A CN110609179A CN 110609179 A CN110609179 A CN 110609179A CN 201910991707 A CN201910991707 A CN 201910991707A CN 110609179 A CN110609179 A CN 110609179A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- G—PHYSICS
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- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
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Abstract
The invention discloses a 77GHz millimeter wave antenna testing device, which at least comprises: the device comprises a parameter calibration part, an antenna test part and a transmission line test part. Through the structural design of the device, the characteristic that the probe is required to carry out the antenna performance index test in the traditional test method is avoided, so that the consumption of the consumable probe is avoided, and the test cost is reduced. Meanwhile, the testing device has the advantages of low cost, simple and small structure, convenient connection and high stability, and is greatly convenient for users to test the performance indexes of various antennas.
Description
Technical Field
The invention belongs to the technical field of antennas, and particularly relates to a 77GHz millimeter wave antenna testing device.
Background
The millimeter wave radar has the characteristics of high resolution, wide frequency band, strong anti-jamming capability and the like, the radar system transmits electromagnetic waves to generate reflection after meeting obstacles, and the radar system can determine the distance, the speed and the angle of an object by capturing the reflected signals. The vehicle-mounted millimeter wave radar is regarded by various automobile manufacturers as an effective means for preventing traffic accidents.
Millimeter wave radars are radars that operate in the millimeter wave band (millimeter wave) for detection. Usually, the millimeter wave is in the frequency domain of 30 to 300GHz (with a wavelength of 1 to 10 mm). Millimeter-wave radar has some of the advantages of both microwave and photoelectric radar because the wavelength of millimeter-wave waves is intermediate between microwave and centimeter waves.
Compared with the centimeter wave seeker, the millimeter wave seeker has the characteristics of small volume, light weight and high spatial resolution. Compared with optical probes such as infrared, laser and television, the millimeter wave probe has strong capability of penetrating fog, smoke and dust and has the characteristics of all weather (except heavy rainy days) all day long. In addition, the anti-interference and anti-stealth capabilities of the millimeter wave seeker are also superior to those of other microwave seekers. The millimeter wave radar can distinguish and identify very small targets and can identify a plurality of targets simultaneously; the imaging device has the advantages of imaging capability, small volume, good maneuverability and good concealment.
The light wave is seriously transmitted and attenuated in the atmosphere, and the requirement on the processing precision of the device is high. Compared with light waves, millimeter waves have small attenuation when being transmitted by utilizing an atmospheric window (certain frequencies with extremely small attenuation values caused by resonance absorption of gas molecules when millimeter waves and submillimeter waves are transmitted in the atmosphere), and are less influenced by natural light and a thermal radiation source. For this reason, they are of great significance in communication, radar, guidance, remote sensing technology, radio astronomy and spectroscopy. The millimeter wave frequency of the atmospheric window can realize large-capacity satellite-ground communication or ground relay communication. The low elevation angle precision tracking radar and the imaging radar can be realized by utilizing the narrow wave beam and low sidelobe performance of the millimeter wave antenna. The millimeter wave radiometer with high resolution is suitable for remote sensing of meteorological parameters. The components of the interplanetary substances can be deduced by detecting the radiation spectrum of the cosmonautic space with the radio astronomical telescopes of millimeter wave and submillimeter wave. The advantages are mainly the following:
(1) small antenna aperture, narrow beam: high tracking and guiding precision; the low elevation angle tracking is easy to carry out, and the ground multipath and clutter interference are resisted; the method has high transverse resolution on near-empty targets; high angular resolution is provided for region imaging and target monitoring; high anti-interference performance of narrow beams; high antenna gain; small objects, including power lines, poles, etc., are easily detected.
(2) Large bandwidth: the method has high information rate, and is easy to adopt narrow pulse or broadband frequency modulation signals to obtain the detailed structural characteristics of the target; the device has wide spectrum spreading capability, reduces multipath and clutter and enhances the anti-interference capability; the radar or millimeter wave recognizer of adjacent frequency works, so that mutual interference is easy to overcome; high distance resolution and easy obtaining of accurate target tracking and identification capability.
(3) High doppler frequency: good detection and identification capabilities of slow targets and vibrating targets; the target characteristic identification is easy to be carried out by utilizing the target Doppler frequency characteristic; penetration characteristics to dry atmospheric pollution provide good detection capability under dust, smoke and dry snow conditions.
(4) Good stealth resistance: the wave-absorbing materials coated on the stealth aircraft are all directed to centimeter waves. According to the foreign research, the stealth target irradiated by the millimeter wave radar can form multi-part strong electromagnetic scattering, so that the stealth performance of the stealth target is greatly reduced, and therefore, the millimeter wave radar also has the potential of anti-stealth.
Millimeter-wave radars are currently widely used in the field of traffic detection, and among them, 77GHz millimeter-wave radars have obvious advantages in terms of volume, detection accuracy, distance and the like. The 77GHz vehicle millimeter wave radar antenna is taken as a key element of the vehicle radar, and the performance of the antenna obviously influences the detection distance and angle of the radar.
In order to accurately detect the performance of the radar antenna, the designed and processed antenna needs to be subjected to corresponding index test. And in the 77GHz millimeter wave frequency band, the traditional coaxial connector does not support the high frequency band, so that the test method of the coaxial connector is not applicable any more.
The general test method is a waveguide probe or coaxial probe test method, and a GSG waveguide probe or coaxial probe is directly lapped on a feed port of a microstrip antenna for excitation. However, the probe is an easily-consumed product and has high test cost, and in addition, signal leakage, probe device interference and other influences may exist in the antenna test, so that the test error is large.
Because factors such as millimeter wave frequency band, especially 77GHz high-frequency band processing technology, have a great influence on the dielectric constant of a PCB board, and inaccurate dielectric constant can cause deterioration of antenna indexes in the design process, an effective method for testing the dielectric constant of the processed board is needed. Therefore, the antenna testing device which is low in cost, high in efficiency and capable of effectively testing the dielectric constant of the processed plate is especially important in millimeter wave radar testing.
Disclosure of Invention
The invention aims to provide a testing device which is based on a 77GHz millimeter wave frequency band and can test various antenna indexes with low cost, miniaturization and high stability, aiming at the defects and shortcomings of the existing testing method, and the testing device is used for realizing efficient and rapid testing of a 77GHz millimeter wave radar antenna.
The purpose of the invention is realized by the following technical scheme:
a 77GHz millimeter wave antenna testing device, the antenna testing device comprising at least: the device comprises a parameter calibration part and a test instrument, wherein the parameter calibration part comprises a first metal plate and a second metal plate which are mutually overlapped and leaned against each other, the first metal plate and the second metal plate have the same structure and are symmetrically arranged relative to a contact surface between the two metal plates, and waveguide flanges connected with the test instrument are arranged on the first metal plate and the second metal plate; the antenna testing part comprises a first metal plate and a first dielectric substrate arranged on the first metal plate, wherein a metal micro-strip antenna is arranged on the dielectric substrate, and the metal micro-strip antenna is connected with testing equipment through a first micro-strip rotating waveguide interface on the first dielectric substrate and a waveguide flange arranged on the back surface of the first metal plate; the transmission line testing part comprises a first metal plate and a second dielectric substrate arranged on the first metal plate, a microstrip line is arranged on the second dielectric substrate, and the microstrip line is connected with the testing equipment through a second microstrip-to-waveguide interface arranged on the second dielectric substrate and a waveguide flange on the back of the first metal plate.
According to a preferred embodiment, in the parameter calibration section, the first metal plate front face and the second metal plate front face are fixedly abutted via screw locking.
According to a preferred embodiment, the front surface of the first metal plate and the front surface of the second metal plate are flat.
According to a preferred embodiment, the back of the first metal plate and the back of the second metal plate are provided with waveguide flanges comprising circular bosses and square through holes provided on the circular bosses.
According to a preferred embodiment, the first metal plate and the second metal plate are provided with a plurality of through holes, and the through holes of the two metal plates are mutually corresponding and are symmetrically arranged about the contact surface.
According to a preferred embodiment, the first metal plate is further provided with a screw locking hole, a limiting pin hole, a mounting positioning hole and a fastening hole.
According to a preferred embodiment, in the antenna test section, a first dielectric substrate is fixed to the first metal plate through a first mounting hole provided in the first dielectric substrate by a mounting screw.
According to a preferred embodiment, the first dielectric substrate is in intimate contact with the front surface of the first metal plate.
According to a preferred embodiment, in the transmission line testing section, a second dielectric substrate is fixed on the first metal plate through a second mounting hole provided in the second dielectric substrate by a mounting screw.
According to a preferred embodiment, the second dielectric substrate is in close contact with the front side of the first metal plate.
The main scheme and the further selection schemes can be freely combined to form a plurality of schemes which are all adopted and claimed by the invention; in the invention, the selection (each non-conflict selection) and other selections can be freely combined. The skilled person in the art can understand that there are many combinations, which are all the technical solutions to be protected by the present invention, according to the prior art and the common general knowledge after understanding the scheme of the present invention, and the technical solutions are not exhaustive herein.
The invention has the beneficial effects that: therefore, through the structural design of the device, the characteristic that the traditional test method needs the probe to carry out the index of the antenna performance is avoided, the consumption of the probe which is an easily-consumed product is avoided, and the test cost is reduced. Meanwhile, the testing device has the advantages of low cost, simple and small structure, convenient connection and high stability, and is greatly convenient for users to test the performance indexes of various antennas.
Drawings
FIG. 1 is a schematic perspective view of a parameter calibration unit of the testing device of the present invention;
FIG. 2 is a schematic perspective view of an antenna testing part of the testing device of the present invention;
FIG. 3 is a schematic top view of the antenna testing part of the testing device of the present invention;
FIG. 4 is a schematic perspective view of a transmission line testing part of the testing device of the present invention;
FIG. 5 is a schematic top view of a transmission line testing part of the testing device of the present invention;
the antenna comprises a first metal plate 1, a first metal plate 1a, a first metal plate front face 1b, a first metal plate back face 1c, a waveguide flange 11, a circular boss 11, a square through hole 12, a screw locking hole 13, a limiting pin hole 14, a mounting positioning hole 15, a fastening hole 16, a second metal plate 2a, a second metal plate front face 3, a screw 4, a first dielectric substrate 41, a metal microstrip antenna 42, a first microstrip-to-waveguide interface 41a, a first mounting hole 43, a mounting screw 5, a second dielectric substrate 6, a microstrip line 61, a microstrip line 62, a microstrip line 61 a-second microstrip-to-waveguide interface 63 and a second mounting hole.
Detailed Description
The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification. The invention is capable of other and different embodiments and of being practiced or of being carried out in various ways, and its several details are capable of modification in various respects, all without departing from the spirit and scope of the present invention. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict.
It should be noted that, in order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some embodiments of the present invention, but not all embodiments. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or the orientations or positional relationships that the products of the present invention are conventionally placed in use, and are only used for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "horizontal", "vertical", "overhang" and the like do not imply that the components are required to be absolutely horizontal or overhang, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In addition, it should be noted that, in the present invention, if the specific structures, connection relationships, position relationships, power source relationships, and the like are not written in particular, the structures, connection relationships, position relationships, power source relationships, and the like related to the present invention can be known by those skilled in the art without creative work on the basis of the prior art.
Example 1:
referring to fig. 1, the invention discloses an antenna testing device capable of testing various antenna indexes based on a 77GHz millimeter wave frequency band.
Preferably, the antenna test apparatus includes at least: a parameter calibration part consisting of a first metal plate 1, a second metal plate 2 and a screw 3; an antenna test part consisting of a metal plate 1, a first dielectric substrate 4 mounted on the metal plate and a mounting screw 5; a transmission line testing part composed of a metal plate 1, a second dielectric substrate 6 mounted thereon and a mounting screw 5. The first dielectric substrate 4 and the second dielectric substrate 6 are provided with a conductive ground plate (not shown) on the back surface.
In this embodiment, the dielectric substrate can be processed by Rogers3003, and the actual application can select the board and design the substrate routing according to the requirement. In actual test, the waveguide flange interface in the back of the first metal plate 1 and/or the second metal plate 2 is connected with the waveguide flange interface of the test instrument, so that stable and effective test is realized.
Preferably, as shown in fig. 1, a perspective view of the parameter calibration unit is shown. In the figure, the parameter calibration part comprises a first metal plate 1 and a second metal plate 2 which are overlapped with each other. The first metal plate 1 and the second metal plate 2 have the same structure and are symmetrically arranged relative to a contact surface between the two metal plates.
Further, the first metal plate front face 1a and the second metal plate front face 2a are locked and fixed in abutment by screws 3. The first metal plate front surface 1a and the second metal plate front surface 2a are arranged flatly.
Preferably, the first metal plate 1 and the second metal plate 2 are provided with waveguide flanges 1c connected to a test instrument. Further, the first metal plate back surface 1b and the second metal plate back surface are provided with waveguide flanges 1 c. The waveguide flange 1c includes a circular boss 11 and a square through hole 12 provided on the circular boss 11.
The waveguide flange 1c on the back of the first metal plate 1b and the back of the second metal plate is connected with a waveguide flange interface in a testing instrument, so that the parameter calibration of the parameter calibration part is realized, and the waveguide transmission loss, the phase difference value, the standing-wave ratio and the like of a single metal plate can be measured through calibration. Preferably, the test waveguide port of the waveguide flange 1c is a standard waveguide port of the WR-12 type.
Preferably, the first metal plate 1 and the second metal plate 2 are provided with a plurality of through holes, and the through holes on the two metal plates are mutually corresponding and are symmetrically arranged relative to the contact surface.
Preferably, the first metal plate 1 is further provided with a screw locking hole 13, a limit pin hole 14, a mounting positioning hole 15 and a fastening hole 16.
Preferably, as shown in fig. 2 and 3, the antenna test part includes a first metal plate 1 and a first dielectric substrate 4 disposed on the first metal plate 1. The dielectric substrate is provided with a metal microstrip antenna 41/42, and the metal microstrip antenna 41/42 is connected with a test device through a first microstrip-to-waveguide interface 41a on the first dielectric substrate 4 and a waveguide flange 1c arranged on the back of the first metal plate 1. Thereby enabling testing of various parameters of the microstrip antenna 41/42.
In the antenna test section, the first dielectric substrate 4 is fixed to the first metal plate 1 through a first mounting hole 43 provided in the first dielectric substrate 4 by a mounting screw 5. The first dielectric substrate 4 is in close contact with the front surface of the first metal plate 1.
Preferably, as shown in fig. 4 and 5, the transmission line testing part includes a first metal plate 1 and a second dielectric substrate 6 disposed on the first metal plate 1. The second dielectric substrate 6 is provided with a microstrip line 61/62, and the microstrip line 61/62 is connected to the test equipment through a second microstrip-to-waveguide interface 61a provided on the second dielectric substrate 6 and a waveguide flange 1c provided on the back surface of the first metal plate 1. Thereby realizing the parameter tests of the microstrip line 61/62, such as transmission loss, standing-wave ratio, phase and the like.
Further, in the transmission line test section, a second dielectric substrate 6 is fixed to the first metal plate 1 through a second mounting hole provided in the second dielectric substrate 6 by a mounting screw 53. The second dielectric substrate 6 is in close contact with the front surface of the first metal plate 1.
Furthermore, the dielectric constant of the PCB board can be calculated by measuring the phase difference between the two microstrip lines and comparing the actual length difference between the microstrip line 61 and the microstrip line 62, i.e. the dielectric constant test is completed by the microstrip line length difference method.
Therefore, through the structural design of the device, the characteristic that the traditional test method needs the probe to carry out the index of the antenna performance is avoided, the consumption of the probe which is an easily-consumed product is avoided, and the test cost is reduced. Meanwhile, the testing device has the advantages of low cost, simple and small structure, convenient connection and high stability, and is greatly convenient for users to test the performance indexes of various antennas.
The foregoing basic embodiments of the invention and their various further alternatives can be freely combined to form multiple embodiments, all of which are contemplated and claimed herein. In the scheme of the invention, each selection example can be combined with any other basic example and selection example at will. Numerous combinations will be known to those skilled in the art.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A 77GHz millimeter wave antenna testing device, characterized in that the antenna testing device comprises at least:
the device comprises a parameter calibration part, a test instrument and a test device, wherein the parameter calibration part comprises a first metal plate (1) and a second metal plate (2) which are mutually overlapped and leaned, the first metal plate (1) and the second metal plate (2) have the same structure and are symmetrically arranged relative to a contact surface between the two metal plates, and waveguide flanges (1c) connected with the test instrument are arranged on the first metal plate (1) and the second metal plate (2);
the antenna testing part comprises a first metal plate (1) and a first dielectric substrate (4) arranged on the first metal plate (1), wherein metal microstrip antennas (41,42) are arranged on the dielectric substrate (4), and the metal microstrip antennas (41,42) are connected with testing equipment through a first microstrip-to-waveguide interface (41a) on the first dielectric substrate (4) and a waveguide flange (1c) arranged on the back surface (1b) of the first metal plate;
the transmission line testing part comprises a first metal plate (1) and a second dielectric substrate (6) arranged on the first metal plate (1), microstrip lines (61,62) are arranged on the second dielectric substrate (6), and the microstrip lines (61,62) are connected with testing equipment through waveguide flanges (1c) arranged on a second microstrip-to-waveguide interface (61a) of the second dielectric substrate (6) and a back surface (1b) of the first metal plate.
2. The 77GHz millimeter wave antenna testing device according to claim 1, wherein in the parameter calibration portion, the first metal plate front surface (1a) and the second metal plate front surface (2a) are locked and abutted by a screw (3).
3. The 77GHz millimeter wave antenna testing device according to claim 2, wherein the front surface (1a) of the first metal plate and the front surface (2a) of the second metal plate are flat.
4. The 77GHz millimeter wave antenna testing device according to claim 2, wherein the first metal plate back surface (1b) and the second metal plate back surface are provided with waveguide flanges (1c), and the waveguide flanges (1c) comprise circular bosses (11) and square through holes (12) arranged on the circular bosses (11).
5. The 77GHz millimeter wave antenna testing device according to claim 2, wherein the first metal plate (1) and the second metal plate (2) are provided with a plurality of through holes, and the through holes on the two metal plates are mutually corresponding and are symmetrically arranged about the contact surface.
6. The 77GHz millimeter wave antenna testing device according to claim 5, wherein the first metal plate (1) is further provided with a screw locking hole (13), a limiting pin hole (14), a mounting positioning hole (15) and a fastening hole (16).
7. The 77GHz millimeter wave antenna testing device according to claim 1, wherein in the antenna testing part, a first dielectric substrate (4) is fixed on the first metal plate (1) through a first mounting hole (43) arranged on the first dielectric substrate (4) by a mounting screw (5).
8. The 77GHz millimeter wave antenna testing device according to claim 7, wherein the first dielectric substrate (4) is in close contact with the front surface (1a) of the first metal plate.
9. The 77GHz millimeter wave antenna testing device according to claim 1, wherein in the transmission line testing part, a second dielectric substrate (6) is fixed on the first metal plate (1) through a second mounting hole (63) arranged on the second dielectric substrate (6) by a mounting screw (5).
10. The 77GHz millimeter wave antenna testing device according to claim 9, wherein the second dielectric substrate (6) is in close contact with the front surface (1a) of the first metal plate.
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| CN201910991707.6A CN110609179B (en) | 2019-10-18 | 2019-10-18 | 77GHz millimeter wave antenna testing device |
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| CN201910991707.6A CN110609179B (en) | 2019-10-18 | 2019-10-18 | 77GHz millimeter wave antenna testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112114293A (en) * | 2019-12-29 | 2020-12-22 | 的卢技术有限公司 | Device and method for testing performance of millimeter wave radar under multipath condition |
| CN114705925A (en) * | 2021-03-18 | 2022-07-05 | 昆山德普福电子科技有限公司 | Millimeter wave array antenna test module |
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