CN110596744A - Data acquisition and processing system for elliptical curved crystal spectrometer - Google Patents
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Abstract
The invention discloses a data acquisition and processing system of an elliptic curved crystal spectrometer, which comprises a CCD photoelectric conversion module, an AD application module at the analog front end, an FPGA driving and control module, a USB interface transmission module and a system power supply module; acquiring a spectral image of laser plasma X-rays through the system, realizing data communication with a PC (personal computer) through a USB (universal serial bus) interface transmission module, and displaying the transmitted data on the PC; the system can acquire image data with different frame frequencies and different resolutions in real time and at high speed, and transmit and display the acquired data in real time, and the system obtains higher signal-to-noise ratio and good visual effect of the spectral image by using wavelet transformation and median filtering algorithm; and obtaining a spectral diagram of the X-ray by using the denoised spectral image, converting the relation between the pixel and the light intensity into the relation between the wavelength and the intensity by calibrating the wavelength, further obtaining the spatial resolution of the elliptic curved crystal spectrometer, and obtaining the temperature and the rotating speed of the plasma.
Description
Technical Field
The invention relates to the field of acquisition and processing of image data, in particular to a data acquisition and processing system of an elliptic curved crystal spectrometer.
Background
In high-temperature plasma, various complex magnetic fluid processes are generated due to abnormal high temperature and complex electromagnetic fields thereof, various forms of radiation are generated, and very complex particle and energy transport processes and various interaction processes are experienced among components in the plasma. To really know the internal state and the change process of the high-temperature plasma, the state parameters of electron temperature, density, ionization distribution, current and electromagnetic field space-time distribution, transport, fluctuation, instability and the like in the plasma must be experimentally measured through a certain experimental means, namely plasma diagnosis. For plasma diagnostics, an elliptical curved crystal spectrometer is used to detect X-rays of plasma radiation. An X-ray CCD camera is generally adopted as a recording medium of an elliptical crystal spectrometer to obtain rich information and characteristics of plasma. Along with the continuous development of scientific technology, data acquisition systems are more and more extensive, and people in all application fields put forward higher requirements on all indexes of the data acquisition and transmission system, including the aspects of sampling speed, resolution, detection precision, resistance to test environment interference and the like. However, conventional data acquisition and processing systems fall far short of this requirement. Therefore, in order to enable the data acquisition system to better meet the requirements of actual industry and scientific research, it is necessary to design a system which has a high transmission rate and can process data in real time.
Disclosure of Invention
The invention provides a data acquisition and processing system of an elliptic curved crystal spectrometer, which solves the technical problem that the existing data acquisition and transmission system is insufficient in sampling speed, resolution, detection precision and resistance to test environment interference, and achieves the technical effect of improving the capabilities of the system in the aspects of sampling speed, resolution, detection precision and resistance to test environment interference.
In order to achieve the above object, the present application provides a data collecting and processing system for an elliptic curved crystal spectrometer, the system comprising:
the system comprises a CCD photoelectric conversion module, an AD application module at the analog front end, an FPGA driving and controlling module, a USB interface transmission module and a system power supply module; the system power supply module is used for supplying power to the system, after the system is powered on, the upper computer sends a control command to the FPGA driving and control module through the USB interface transmission module, and the USB interface transmission module completes initialization setting on data acquisition parameters of the FPGA driving and control module based on the control command; the FPGA driving and controlling module generates a CCD driving time sequence corresponding to the initial acquisition parameters according to the initial acquisition parameters, so that the CCD photoelectric conversion module works under the control of the driving time sequence; the CCD photoelectric conversion module converts the acquired optical signal into an electric signal to be output, and the analog front-end processing and A/D data conversion are completed through an AD application module of the analog front-end; the system uses wavelet transform algorithms to deal with noise generated during the operation of the hardware part.
The system in the application comprises two parts, namely hardware and software. The hardware part comprises a CCD photoelectric conversion module, an AD application module at the analog front end, an FPGA driving and controlling module, a USB interface transmission module and a system power supply module. The software part includes the design of firmware programs, USB drivers and application programs. The system obtains the spectral image of the laser plasma X-ray, realizes data communication with the PC through the USB3.0 interface circuit, and displays the transmitted data on the PC. In the process of acquiring and transmitting data, due to defects of a CCD (charge coupled device), such as dark current and non-uniform photosensitive units, and the occurrence of white Gaussian noise caused by a large amount of heat generated in the working process of the device, the definition of a spectral image is further influenced, so that in the design process of an application program, the denoising processing of the spectral image is included, and the system uses a wavelet transform algorithm to process the noise generated in the working process of a hardware part. And then, obtaining a spectral diagram of the X-ray by using the denoised spectral image, converting the relation between the pixel and the light intensity into the relation between the wavelength and the intensity by calibrating the wavelength, further obtaining the spatial resolution of the elliptic curved crystal spectrometer, and finally obtaining the temperature and the rotating speed of the plasma by using a corresponding formula.
Preferably, the system is configured with an FPGA drive and control module, an FIFO storage space is used for realizing data caching and clock domain conversion, and then the data is read out to an upper computer through a USB interface transmission module for later data analysis and processing.
Preferably, the system acquires a spectral image of the laser plasma X-ray, realizes data communication with the PC through the USB interface transmission module, and displays the transmitted data on the PC.
Preferably, the system acquires a spectral diagram of the X-ray by using the denoised spectral image, converts the relationship between the pixel and the light intensity into the relationship between the wavelength and the intensity by calibrating the wavelength, further obtains the spatial resolution of the elliptic curved crystal spectrometer, and calculates the temperature and the rotation speed of the plasma.
Preferably, the system uses a wavelet transform algorithm to process noise generated during the operation of the hardware part, and specifically includes:
step 1: carrying out double-density dual-tree complex wavelet transform on the noisy image, and carrying out four-level decomposition on the noisy image to obtain sub-band coefficients of each layer;
step 2: respectively comparing and calculating the correlation coefficient theta of the neighborhood windows 3 x3, 5 x 5 and 7 x 7i(i-1, 2,3), selecting a neighborhood window with the correlation coefficient meeting the requirement as a window of the current wavelet coefficient to be estimated, and calculating the variance sigma of each wavelet coefficient2For noise varianceThe wavelet coefficient w is calculated by utilizing a variable coefficient bivariate model through robust median estimation1；
And step 3: and carrying out inverse dual-density dual-tree complex wavelet transformation on the denoised high-frequency sub-band wavelet coefficient and low-frequency sub-band wavelet coefficient to further obtain a denoised image.
Preferably, the DD-DTCTWT is adopted to decompose the image, the correlation coefficient of a neighborhood window of the two-dimensional image is calculated according to the characteristics of the wavelet coefficient, and the neighborhood window which meets the requirement is selected as the window of the current wavelet coefficient to be estimated; dividing each sub-band of the image into small sub-blocks according to the intra-layer correlation of wavelet coefficients of the image, and respectively calculating the variance of each sub-blockNamely:
n (k) is the adjacent local rectangular window area centered on the kth wavelet coefficient, yiFor the observed value of the wavelet coefficient in the ith sub-band (the observed value represents the value containing noise), M is the size of the rectangular window area; variance σ corresponding to each wavelet coefficient2Comprises the following steps:
wherein k is the kth wavelet coefficient; for noise variance, a robust mean noise estimation method is adopted to estimate the noise variance
Wherein, the mean is a median function, and the wavelet coefficient yiIs estimated from subband H1H1；
Preferably, a probability density function graph of the parent-child wavelet coefficients is obtained by using a bivariate model probability density function of the variable coefficients; the expression is as follows:
w in the formula (5)2Is w1The wavelet parent coefficient of (a); m is a variable parameter consisting of w1And w2Joint distribution histogram decision of (1); σ is w1The edge standard deviation of the sub-band;
deducing wavelet coefficient w according to bivariate model1The process of (2) obtains the wavelet coefficient w of the variable coefficient bivariate model1The maximum a posteriori probability estimate, i.e. the bivariate joint shrinkage function, of (1) is:
wherein ()+Is defined as:g is a parameter in the parent-child wavelet coefficients;y1 y2respectively asking wavelet coefficient observed values in the first and second sub-bands;
preferably, the wavelet coefficient is inversely transformed in the step 3 to obtain a denoised image, and then the denoised spectral image is used for obtaining a spectral diagram of the X-ray; the relationship between the pixel and the light intensity is converted into the relationship between the wavelength and the intensity through wavelength calibration, and according to the rayleigh criterion, the wavelength difference of two resolved spectral lines is δ λ, namely the resolution limit, and then the theoretical resolution R is:in the formula (I), the compound is shown in the specification,the average wavelength of two adjacent spectral lines is shown; the theoretical resolution of the elliptic curved crystal spectrometer is as follows:Δ θ is the full width at half maximum of the angular distribution of the diffraction peak intensity, also known as angular spread; obtaining the spatial resolution of the spectral image by using the formula;
wherein c ≈ 3 × 108m/s；e≈2.7；
Then calculating the temperature T (eV) of the ions according to a theoretical formula (7); wherein λFWHMIs the wavelength full width at half maximum, λ, of the fitted CVI line0Is the central wavelength of the CVI line, D is the degree of dispersion, σsIs the pixel width of the converted CVI fitting spectral line, and mu is the vacuum magnetic permeability;
calculating the circumferential rotation speed of the ions based on a formula (8); vrotIs the plasma toroidal rotation speed, c is the speed of light, Δ λrotIs the Doppler shift, λ, of the fitted CVI line0Is the center wavelength of the CVI line.
Preferably, when m is sqrt (3+ (J-1) × 3) through MATLAB simulation, the combined distribution effect of the parent-child wavelet coefficients simulated by using the variable coefficient bivariate model is better.
Preferably, the CD photoelectric conversion module adopts a black and white area array CCD image sensor ICX285AL manufactured by Sony corporation. ICX285AL is a CCD image sensor of science grade of line-to-line transfer, square pixel and megapixels, has the characteristics of high resolution, high sensitivity, high signal-to-noise ratio, low dark current, excellent anti-halation property and the like, can use a line-by-line scanning and merging reading mode, has the highest speed of 28.64MHz, and is converted into the highest frame rate of 15 frames/second. An imaging system with the sensor can meet scientific research work in most cases.
Preferably, the AD application module of the analog front end adopts a 12-bit CCD signal processor AD9949 of ADI company. AD9949 is a highly integrated CCD signal processor supporting a row of CCDs of over 4096 pixels, suitable for digital camera applications. The device consists of a complete analog front end AFE with an analog-digital conversion function and a programmable time sequence core, the rated pixel rate can reach 36MHz at most, and the pixel output frequency, namely the horizontal transfer frequency of ICX285AL is 28.64MHz, so that the requirement of pixel output can be met. The analog front end includes black level clamping, a Correlated Double Sampler (CDS), OdB to 18dB adjustable pixel gain amplifier (PxGA), a 6dB to 42dB 10-bit resolution Variable Gain Amplifier (VGA), and a 36MSPS, 12-bit ADC. The Precision Timing kernel allows the high speed clock to be adjusted at resolutions below 600 ps. The time sequence core provides a CCD signal sampling signal for the interior of the chip, and also provides a horizontal direction driving time sequence signal and a reset clock signal with programmable driving current for the CCD. Therefore, the CCD can be directly driven without an external H-Driver, the system integration level is improved, and the system cost is reduced. While AD9949 also outputs CLPOB, PBLK and HBLK signals, where CLPOB and PBLK multiplex one pin. The CLPOB signal is an indication signal when the pixel signal being acquired by the AD9949 is a black pixel, the PBLK signal is an indication signal whether the AD9949 is acquiring a pixel, and the HBLK signal indicates a flag signal when the AD9949 is in a line transfer period. Further, the AD9949 may be programmed through a three-wire serial interface.
Preferably, the FPGA driving and controlling module adopts a Cyclone III series FPGA EP3C40F484C8N chip of Altera company, and its main performance parameters are as follows: (1) number of logic cells: 39600; (2) 484 pins, 332 general IO interface; (3) RAM capacity: 1134 Kbits; (4) number of inline multipliers: 126; (5) number of phase-locked loops: 4. in addition, in order to prevent the FPGA from losing data in the process of acquiring image data, DDR2 SDRAM is adopted for caching. The traditional SRAM has the defects of small capacity, low speed, high cost and the like, so that the system requirement is not met. Therefore, a DDR2 SDRAM memory with higher performance and larger storage capacity is selected to provide guarantee for large-capacity data caching. The invention selects a memory chip with the model of MT47H64M16 of Micron company, the capacity of a single chip is 8M, the bit width of data is 16bit, the total number of the chips is 8 BANKs, and the total capacity is 8 Mx 16 x 8BANK which is 1Gbit, namely 128 MB. The invention mainly considers high-speed parallel data transmission between the FPGA and the FX3 chip CYUSB3014, high-speed data exchange between the FPGA and the DDR2 data cache region and a reserved general high-speed data 10 interface, and as can be seen from the FPGA resource analysis, EP3C40F484C8N can well meet the design of the system.
Preferably, the USB interface transmission module adopts EZ-USB FX3 series chip CYUSB3014 of Cypress company. The chip has the flexible characteristic of high integration, conforms to the latest USB3.0 standard and is downward compatible with the USB2.0 protocol. USB3.0 supports full duplex communication, provides faster transmission rate, which can reach 5.0 Gbits/s. And a 32-bit ARM926EJ processor core is integrated inside the chip, the core operating frequency is 200MHz, and compared with the original FX2-CY7C68013 chip, the chip has stronger data processing functions. In addition, the parallel general purpose programmable interface GPIF II has high performance, high flexibility and complete configuration, can be configured into any one of 8-bit, 16-bit and 32-bit data transmission, and can be seamlessly connected with an FPGA, an ASIC, a DSP or any processor.
Preferably, regarding the design of the firmware program, since the system uses USB3.0 to complete the data collection, the FX3 development kit (SDK) provided by Cypress corporation for users is used, which includes development tools and development examples for developing USB3.0 firmware, and so on, and this facilitates the development of USB functional devices. By using the firmware framework in the FX3 development kit, the development cycle of the USB device firmware program can be shortened.
Preferably, the USB driver is designed, and the USB driver is a bridge for connecting the USB host application program and the USB firmware program. The universal device driver CYUSB3.SYS provided by a USB chip manufacturer for the USB chip is selected, and the universal device driver CYUSB3.SYS not only can drive USB2.0 and USB3.0 devices, but also can process USB commands sent by an upper computer. The invention adopts the WDF frame-based cypress general drivers cyusb3.sys and cyusb3.inf, and can develop the own USB device driver by modifying the relevant information, so that the development efficiency of the USB device driver can be greatly improved.
Preferably, the application program can control the hardware part to complete the acquisition work and can also process the acquired spectral image. The part improves the signal-to-noise ratio of the spectral image by using an improved wavelet transform algorithm, and lays a foundation for obtaining a spectral diagram of X rays and further obtaining the spatial resolution of the elliptic curved crystal spectrometer.
One or more technical solutions provided by the present application have at least the following technical effects or advantages:
in order to improve the sampling speed and the resolution, the black-and-white area array CCD image sensor ICX285AL of Sony company is selected as a main module for data acquisition, and the module has the characteristics of high resolution, high sensitivity, high signal-to-noise ratio, low dark current and excellent anti-corona-staining property and has great advantages compared with other similar devices; an AD application module at the front end is simulated, a 12-bit CCD signal processor AD9949 of ADI company is adopted, the system integration level is high, and the cost can be effectively reduced;
in order to improve the detection precision and the anti-interference capability, the invention uses the wavelet transformation algorithm to process the noise generated by the hardware work, and can greatly improve the accuracy of the acquired data.
In order to improve the detection precision and the anti-interference capability, the invention adopts a wavelet transformation method to process the noise brought by the hardware system in the working process. The method for denoising through the combination of the dual-density dual-tree complex wavelet transform and the variable coefficient bivariate model self-selection neighborhood window algorithm is good in denoising performance and self-adaptability and is discussed in detail. The method fully utilizes the advantages of translation invariance, anti-aliasing, good directivity and the like of DD-DTDCWT, simultaneously considers the correlation between layers and layers, and well solves the contradiction between image detail information retention and smoothing effect. Through simulation, the method not only has higher peak signal-to-noise ratio, but also improves the visual effect to a certain extent.
In addition, the invention can also realize the functions of processing data in real time and caching large-capacity data. The USB interface transmission module selects a universal device driver CYUSB3.SYS provided by a USB chip manufacturer for the USB chip, can drive USB2.0 and USB3.0 devices, and can process USB commands sent by an upper computer to realize real-time processing of data; the FPGA driving and controlling module adopts a Cyclone III series FPGA EP3C40F484C8N chip of Altera corporation, a DDR2 SDRAM memory with higher performance and larger storage capacity is selected, a guarantee is provided for large-capacity data caching, and the FPGA driving and controlling module has great advantages compared with a traditional SRAM.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention;
FIG. 1 is a schematic block diagram of an image acquisition and transmission apparatus;
FIG. 2 shows the signal chain relationship between AD9949 and other chips;
FIG. 3 is a schematic diagram of a CCD driving circuit of an image acquisition and transmission device;
FIG. 4 is a schematic diagram of an AD sampling circuit of an image acquisition and transmission apparatus;
FIG. 5 is a block diagram of the interconnection between FPGA and EZ-USB FX 3;
FIG. 6 is a connection block diagram of DDR2 SDRAM and FPGA;
FIG. 7 is a schematic diagram of a USB3.0 interface circuit;
FIG. 8 is a functional block diagram of the system software design in general;
FIG. 9 is a flowchart of a USB firmware framework program;
FIG. 10 is a flow chart of a single frame acquisition;
fig. 11 is a flowchart of wavelet denoising.
Detailed Description
In order that the above objects, features and advantages of the present invention can be more clearly understood, a more particular description of the invention will be rendered by reference to the appended drawings. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflicting with each other.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, however, the present invention may be practiced in other ways than those specifically described and thus the scope of the present invention is not limited by the specific embodiments disclosed below.
The invention relates to a data acquisition and processing system of an elliptic curved crystal spectrometer, and the hardware part of the data acquisition and processing system is explained as follows by referring to the attached drawings.
As shown in fig. 1: the system comprises a CCD photoelectric conversion module, an AD application module at the analog front end, an FPGA driving and controlling module and a USB interface transmission module.
As shown in fig. 2: AD9949 is the core of the whole image signal processing and sampling circuit, and AD9949 completes 2 parts of functions through a configuration register, namely horizontal shift time sequence (H)φ1，Hφ2) And the drive of a reset clock (phi RG), and the related double sampling of the analog signal, and finally the conversion into a digital signal output after the operations of clamping, gain and the like. The AD9949 has built in horizontal drivers for H1 to H4 and RG, so these clocks can be connected directly to the CCD. The CCD output signal is converted into digital pixel information and sent to a digital signal processor chip for post-processing. To operate the CCD, the digital signal processor needs to write the CCD timing parameters to the AD9949 through the three-wire serial interface. The AD9949 generates CCD horizontal, vertical and internal AFE clocks from the system master clock CLI. The CLI may be provided by a digital image processor or an external crystal. A sync pulse from the digital image processor provides an external sync signal, resets internal registers, and resynchronizes the VD and HD outputs.
As shown in fig. 3: for ICX285AL to work normally, it is necessary to provide 5 vertical driving signals (V)φ1，Vφ2A，Vφ2B，Vφ3，Vφ4) 2 way horizontal driving signal (H)φ1，Hφ2) And a total of 9 timing signals, 1 substrate signal (φ SUB) and 1 reset gate clock signal (φ RG). Since the driving voltage of the timing control signal of the ICX285AL is not at the standard TTL level, it is necessary to convert the V originally at the TTL level by using a matched timing driving voltage conversion chipφ1，Vφ2A，Vφ2B，Vφ3，Vφ4And the phi SUB signal is converted into a level signal having three levels of-7V/0V/+ 15V.
The vertical direction timing driver employs CXD3400N from SONY corporation. The chip comprises seven driving channels, namely four three-level driving channels and three two-level driving channels.And a high frame frequency reading mode is supported, and the CCD driving circuit is suitable for driving a high-pixel CCD. Therefore, the FPGA needs to convert TTL signals into 3 voltage levels through the external level conversion chip CXD3400N to complete driving of the CCD, and therefore the driving timing provided by the FPGA is the input signals of CXD3400N, which include: XSGT, XV3, XV1, XSG1B, XSG1A, XV4, XV 2. Horizontal shift timing (H)φ1，Hφ2) And the reset clock (phirg) is provided by AD 9949.
As shown in fig. 4: the CCD output signal is connected to a CCDIN analog signal input pin of the AD9949 through a coupling capacitor of 0.1 muF. D0-D11 are 12-bit quantized outputs, a sampling data bus is connected with an I/O port of the FPGA, and gray scale digital signals of pixels are sent to the FPGA. And a serial communication interface consisting of the SCK, the SDI and the SL is connected with the FPGA, and the FPGA is used for completing the setting of the AD9949 special function register. The ADC reference voltage is provided by an internal power supply, and the pins REFT and REFB need to be connected with a bypass capacitor. The time sequence core provides driving time sequences for the inside and the outside of the chip, and a reference clock of the time sequence core is a system clock and is input through a CLI pin. HD. The VD is a synchronous clock provided by the FPGA. H1, H2, and RG directly drive the CCD.
As shown in fig. 5: the design difficulty of the module is in the aspect of software implementation, and only a GPIF II interface needs to be configured with a Slave FIFO working mode on hardware, and a data bus line, a control bus and an address bus are connected with an external main controller FPGA. EZ-USB FX3 works in a slave mode, and a master clock PCLK is provided by the FPGA; SLCS, SLWR, SLRD and SLOE are chip select signals, read-write permission signals and enable signals respectively; FLAGA, FLAGB is EZ-USB FX3 port buffer empty/full flag bit; a [1.. 0] is a channel selection signal, and a channel 0 is selected in the design; DATA [31.. 0] is a 32-bit DATA stream to be transmitted, which is written to EZ-USB FX3 or read into the FPGA on the rising edge of PCLK when the other signals are active.
As shown in fig. 6: DDR2 SDRAM is used as external large capacity buffer, and its data bus, address bus and control bus are connected directly to FPGA.
As shown in fig. 7: the system adopts a USB3.0 standard micro B interface, the USB interface is the most convenient and common interface, the plugging and unplugging are difficult to avoid for manual operation and are contacted with a human body, the instantaneous ESD of 8KV or even 15KV can be generated when the USB interface is contacted with the human body, but the limit value of overvoltage bearing of a chip is 2KV, and the high ESD voltage far exceeds the range, so that some physical damage, transient interference and the like can be caused to devices. In order to avoid the influence of the external factors on data transmission, a special ESD protective device is designed in the interface circuit of the system to carry out isolation protection on the USB interface. The system selects an RCLAMP0524J chip of Semtech corporation as an external ESD protection device of a USB3.0 interface. The differential pairs USB30_ SSTXM, USB30_ SSTXP, USB30_ SSRXM, and USB30_ SSRXP are connected to the anti-static chip RCLAMP0524J for high-speed transmit and receive signals.
The invention relates to a data acquisition and processing system of an elliptic curved crystal spectrometer, and a software part specific implementation way thereof is explained as follows with reference to the attached drawings.
As shown in fig. 8: in the aspect of programming, the system software part adopts Microsoft Visual C + + as a programming tool to generate an MFC module, comprises the design of a firmware program, a driver and an application program, and mainly completes the functions of image acquisition and image processing.
In order to meet the requirements of single-frame acquisition, multi-frame acquisition and transmission rate of images, the invention selects USB3.0 as an interface for image acquisition. Fig. 9 is a flow chart of firmware framework programming, which first initializes some necessary hardware before entering main () function, in order to create a good environment for the running and further initialization of the real-time operating system (RTOS). Firmware program entry function CyU3pfirmware entry () cannot be called by the user, and its main functions include initializing the stack of MMU, caches, SYS, FIQ, IRQ, and SVC modes, and after initialization, jumping to CyU3PToolChainInit () (toolchain initialization function). The tool chain initialization function mainly realizes that a function pointer points to a main function and a BSS area is refreshed. When the main () function is entered, the main function calls two functions of CyUSPDevicelnit () and CyU3PKernelEntry (). The device initialization function is used for establishing a system clock and VIC, the USB3.0 kernel entry function mainly realizes the initialization of an embedded real-time operating system and the establishment of an operating system timer, then, the embedded real-time operating system jumps to an application program definition function, a thread creation function is called in the function and is used for creating and starting a specific thread, and the thread creation function creates a user application thread named as a thread entry function. After the thread is successfully created, the program jumps to a thread entry function, firstly, a serial port initialization function is called, serial port initialization and configuration are carried out in the serial port initialization function, and debugging information is printed, so that development and debugging of a firmware program are facilitated; secondly, calling an application program initialization function, configuring a GPIF II port in the function, starting a USB device mode driver, registering USBsetup and USBevent callback functions, setting a USB enumeration descriptor and the like; finally, the function CyU3PConnectState () is called to complete the connection between the USB device and the USB host.
Aiming at the design of a USB driver, the following three tasks are mainly completed by modifying a cyusb3.inf file:
(1) the USB3.0 device ID information is modified. The Windows operating system determines whether to load the driver by comparing the VID and PID in the firmware configuration descriptor to the relevant contents in the driver INF file.
When the firmware program is written, we default to a VID of 04B4 and a PID of 00F3, so opening the cyusb3.inf file replaces all the fields "VID _ XXXXXX" and "PID _ XXXXXX" with "VID _04B 4" and "PID _00F 3".
(2) The driver string is modified. Section [ Strings ] in the INF file defines string related information such as the name, manufacturer, device descriptor, etc. of the USB3.0 device of the present system. If this information is not modified, the device will default to the Cypress flag when successfully recognized.
(3) The drive GUID information needs to be modified. For the Windows operating system, the globally Unique identifier of guid (global Unique identifier) is an interface acquired by the host program. In the present system, the new GUID is created by guidgen. exe software in the VC + +6.0 programming environment.
And finally, copying the driver file 'cyusb 3. sys' to a System disk \ System32\ drivers directory, copying 'cyusb 3. inf' to a Windows directory, and finally copying the 'WdfCoInstalll 01009. dll' file to a System32 file.
When the USB equipment is accessed into the computer, the computer immediately calls a guide for adding new equipment after discovering the new equipment, the guide scans all INF files loaded into the system according to the unique identification VID and PID of the USB equipment, and loads a driving program for the USB equipment; if the computer does not have the INF file corresponding to the USB equipment, prompting a user to manually select the INF file matched with the equipment driver, installing the driver for the equipment according to the INF file, distributing various resources for the USB equipment by the computer after the driver is installed, and enabling the user to normally operate the USB equipment after the USB equipment is started.
Since a multi-frame acquisition can be viewed as a number of repetitions of a single-frame acquisition, the process of a single-frame acquisition is described herein with respect to fig. 10. After the user selects the collection mode, the software returns to the standby mode and waits for the user to send a collection command. When the user presses the acquisition button, the program sends a series of commands to the lower computer according to the information set by the user, and the camera is controlled to perform a series of actions. After the command is sent, the software acquires the image data through the USB interface and stores the image data in sequence so as to form an image. After the series of processes is completed, the camera returns to a standby state to wait for the next acquisition command issued by the user.
After finishing a collection command, the software can process the collected image, and the invention mainly uses wavelet transformation and median filtering algorithm to finish the de-noising processing of the image. The denoising process of the present invention is described below by taking a wavelet transform as an example.
Referring to fig. 11, the collected image is processed by using a method of combining dual-density dual-tree complex wavelet transform and a variable coefficient bivariate model self-selection neighborhood window algorithm. The method comprises the following concrete steps:
(1) carrying out double-density dual-tree complex wavelet transform on the noisy image, and carrying out four-level decomposition on the noisy image to obtain sub-band coefficients of each layer;
(2) respectively comparing and calculating the correlation coefficient theta of the neighborhood windows 3 x3, 5 x 5 and 7 x 7i(i is 1,2,3), selecting a neighborhood window with larger correlation coefficient as a window of the current wavelet coefficient to be estimated, and calculating the variance sigma of each wavelet coefficient2For noise varianceThe wavelet coefficient w can be calculated by using a robust median estimator and then using a variable coefficient bivariate model1；
(3) And carrying out inverse dual-density dual-tree complex wavelet transformation on the denoised high-frequency sub-band wavelet coefficient and low-frequency sub-band wavelet coefficient to further obtain a denoised image.
In the step (2), because the wavelet coefficient has locality and neighborhood correlation, in order to consider the characteristic of the wavelet and realize self-adaptive denoising according to the image characteristic and keep the detail information of the image as much as possible, the invention adopts DD-DTCTWT to decompose the image, calculates the correlation coefficient of the neighborhood window of the two-dimensional image according to the characteristic of the wavelet coefficient, and selects the larger neighborhood window as the window of the current wavelet coefficient to be estimated. Dividing each sub-band of the image into small sub-blocks according to the intra-layer correlation of wavelet coefficients of the image, and respectively calculating the variance of each sub-blockNamely:
n (k) is the current coefficient, yi(k) Is a central square window, and M is the number of coefficients in the window. Then the variance σ for each wavelet coefficient2Comprises the following steps:
where k is the kth wavelet coefficient. For the noise variance, a robust mean noise estimation method is adopted to estimate as:
found by experiments to utilize
Obtaining a probability density function graph of the parent-child wavelet coefficients, wherein the probability density distribution of the parent-child wavelet coefficients of different sub-bands of the same image is different; the probability density distribution of parent-child wavelet coefficients of the same sub-band of different images is also different, so that the distribution is not accurately described by using the same bivariate model. The expression is as follows:
the formula m is a parameter which changes with the parent-child coefficient, and the meaning of the rest parameters is the same as the formula (4). Matlab simulation shows that the joint distribution of the wavelet coefficients of the parent and the child can be better simulated by using a variable coefficient bivariate model when m is sqrt (3+ (J-1) × 3). Deducing wavelet coefficient w according to bivariate model1The process of (2) can obtain the wavelet coefficient w of the variable coefficient bivariate model1Maximum a posteriori probability estimation of (c):
and (4) performing inverse transformation on the wavelet coefficient in the step (3) to obtain a denoised image, and then obtaining a spectral diagram of the X-ray by using the denoised spectral image. The relationship between the pixel and the light intensity is converted into the relationship between the wavelength and the intensity through wavelength calibration, and according to the rayleigh criterion, the wavelength difference of two spectral lines which can be resolved is δ λ, namely the resolution limit, and then the theoretical resolution R is:in the formula (I), the compound is shown in the specification,average wave of two adjacent spectral linesLong. The theoretical resolution of the elliptic curved crystal spectrometer mainly depends on the resolution of the spectroscopic crystal, and the theoretical resolution of the elliptic curved crystal spectrometer is as follows:Δ θ is the full width at half maximum of the angular distribution of the diffraction peak intensity, also known as the angular spread. The spatial resolution of the spectral image can be derived using this formula.
Then according to the theoretical formula:
the temperature T (eV) of the resulting ion is calculated. Wherein λFWHMIs the wavelength full width at half maximum, λ, of the fitted CVI line0Is the central wavelength of the CVI line, D is the degree of dispersion, σsIs the pixel width of the converted CVI fitting spectral line, and μ is the vacuum permeability.
Also by theoretical formula:
the circumferential rotation speed of the ions can be calculated. VrotIs the plasma toroidal rotation speed, c is the speed of light, Δ λrotIs the Doppler shift, λ, of the fitted CVI line0Is the center wavelength of the CVI line.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. An elliptic curved crystal spectrometer data acquisition and processing system, characterized in that the system comprises:
the system comprises a CCD photoelectric conversion module, an AD application module at the analog front end, an FPGA driving and controlling module, a USB interface transmission module and a system power supply module; the system power supply module is used for supplying power to the system, after the system is powered on, the upper computer sends a control command to the FPGA driving and control module through the USB interface transmission module, and the USB interface transmission module completes initialization setting on data acquisition parameters of the FPGA driving and control module based on the control command; the FPGA driving and controlling module generates a CCD driving time sequence corresponding to the initial acquisition parameters according to the initial acquisition parameters, so that the CCD photoelectric conversion module works under the control of the driving time sequence; the CCD photoelectric conversion module converts the acquired optical signal into an electric signal to be output, and the analog front-end processing and A/D data conversion are completed through an AD application module of the analog front-end; the system uses wavelet transform algorithms to deal with noise generated during the operation of the hardware part.
2. The data acquisition and processing system of the elliptic bend crystal spectrometer as claimed in claim 1, wherein the system is configured with a FIFO storage space on the FPGA drive and control module to implement data caching and clock domain conversion, and then reads out the data to an upper computer through a USB interface transmission module for later data analysis and processing.
3. The data acquisition and processing system of the elliptic curved crystal spectrometer according to claim 1, characterized in that the system acquires a spectral image of laser plasma X-rays, realizes data communication with a PC through a USB interface transmission module, and displays the transmitted data on the PC.
4. The data acquisition and processing system of the elliptic curved crystal spectrometer as claimed in claim 1, wherein the system acquires a spectral diagram of X-rays by using the denoised spectral image, and the relationship between pixels and light intensity is converted into the relationship between wavelength and intensity by calibrating the wavelength, so as to obtain the spatial resolution of the elliptic curved crystal spectrometer, and calculate the temperature and the rotation speed of the plasma.
5. The elliptic bend crystal spectrometer data acquisition and processing system according to claim 1, wherein the system uses wavelet transform algorithm to process noise generated during hardware part of the work process, specifically comprising:
step 1: carrying out double-density dual-tree complex wavelet transform on the noisy image, and carrying out four-level decomposition on the noisy image to obtain sub-band coefficients of each layer;
step 2: respectively comparing and calculating the correlation coefficient theta of the neighborhood windows 3 x3, 5 x 5 and 7 x 7i(i-1, 2,3), selecting a neighborhood window with the correlation coefficient meeting the requirement as a window of the current wavelet coefficient to be estimated, and calculating the variance sigma of each wavelet coefficient2For noise varianceThe wavelet coefficient w is calculated by utilizing a variable coefficient bivariate model through robust median estimation1；
And step 3: and carrying out inverse dual-density dual-tree complex wavelet transformation on the denoised high-frequency sub-band wavelet coefficient and low-frequency sub-band wavelet coefficient to further obtain a denoised image.
6. The elliptic curved crystal spectrometer data acquisition and processing system according to claim 5, characterized in that in step 2, DD-DTCTWT is adopted to decompose the image, the correlation coefficient of the neighborhood window of the two-dimensional image is calculated according to the characteristics of the wavelet coefficient, and the neighborhood window meeting the requirements is selected as the window of the wavelet coefficient to be estimated currently; dividing each sub-band of the image into small sub-blocks according to the intra-layer correlation of wavelet coefficients of the image, and respectively calculating the variance of each sub-blockNamely:
where N (k) is the adjacent local rectangular window area centered on the kth wavelet coefficient, yiFor the observed value of the wavelet coefficient in the ith sub-band (the observed value represents the value containing noise), M is the size of the rectangular window area; variance σ corresponding to each wavelet coefficient2Comprises the following steps:
wherein k is the kth wavelet coefficient; for noise variance, a robust mean noise estimation method is adopted to estimate the noise varianceComprises the following steps:
wherein, the mean is a median function, and the wavelet coefficient yiIs estimated from subband H1H1。
7. The elliptic bend crystal spectrometer data acquisition and processing system according to claim 6, characterized in that the bivariate model probability density function P using variable coefficientsw(w) obtaining a probability density function graph of the parent-child wavelet coefficients; pw(w) the expression is:
w in the formula (5)2Is w1The wavelet parent coefficient of (a); m is a variable parameter consisting of w1And w2Joint distribution histogram decision of (1); σ is w1The edge standard deviation of the sub-band;
derivation of wavelet coefficients w according to a bivariate model1The process of (2) obtains the wavelet coefficient w of the variable coefficient bivariate model1The maximum a posteriori probability estimate, i.e. the bivariate joint shrinkage function, of (1) is:
wherein ()+Is defined as:g is a parameter in the parent-child wavelet coefficients;y1 y2wavelet coefficient observations in the first and second subbands are asked separately.
8. The data acquisition and processing system of the elliptic curved crystal spectrometer according to claim 7, wherein the wavelet coefficients are inversely transformed in step 3 to obtain a denoised image, and then a spectral diagram of X-rays is obtained by using the denoised spectral image; the relationship between the pixel and the light intensity is converted into the relationship between the wavelength and the intensity through wavelength calibration, and according to the rayleigh criterion, the wavelength difference of two resolved spectral lines is δ λ, namely the resolution limit, and then the theoretical resolution R is:in the formula (I), the compound is shown in the specification,the average wavelength of two adjacent spectral lines is shown; the theoretical resolution of the elliptic curved crystal spectrometer is as follows:Δ θ is the full width at half maximum of the angular distribution of the diffraction peak intensity, also known as angular spread; obtaining the spatial resolution of the spectral image by using the formula;
wherein c ≈ 3 × 108m/s；e≈2.7；
Then calculating the temperature T (eV) of the ions according to a theoretical formula (7); wherein λFWHMIs the wavelength full width at half maximum, λ, of the fitted CVI line0Is the central wavelength of the CVI line, D is the degree of dispersion, σsIs the pixel width of the converted CVI fitting spectral line, and mu is the vacuum magnetic permeability;
calculating the circumferential rotation speed of the ions based on a formula (8); vrotIs the plasma toroidal rotation speed, c is the speed of light, Δ λrotIs the Doppler shift, λ, of the fitted CVI line0Is the center wavelength of the CVI line.
9. The elliptic bend crystal spectrometer data acquisition and processing system according to claim 1, characterized in that the CCD photoelectric conversion module employs a black and white area array CCD image sensor ICX285 AL; an AD application module at the analog front end adopts a 12-bit CCD signal processor AD 9949; the FPGA driving and controlling module adopts an FPGA EP3C40F484C8N chip, adopts DDR2 SDRAM buffer memory, and the USB interface transmission module adopts an EZ-USB FX3 series chip CYUSB 3014.
10. The system for data acquisition and processing of an ellipsometer according to claim 8, wherein the simulation of the joint distribution of the parent and child wavelet coefficients using the bivariate model with variable coefficients is better when m ═ sqrt (3+ (J-1) × 3) by MATLAB simulation.
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