CN110567487B - Laser gyro reliability test system and method - Google Patents
Laser gyro reliability test system and method Download PDFInfo
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Abstract
The invention belongs to the inertial measurement technology, and particularly relates to a laser gyro reliability test system and method. The laser gyro reliability test system comprises a temperature stress applying device (2), an electric stress applying device (3), a control circuit (4) and at least one laser gyro (1), wherein the laser gyro (1) is arranged inside the temperature stress applying device (2), the electric stress applying device (3) is electrically connected with the laser gyro (1), and the control circuit (4) is electrically connected with the laser gyro (1) and the electric stress applying device (3) respectively. The invention provides a system and a method for testing the reliability of a laser gyro, which are low in cost and short in time consumption, so that the performance of a product is objectively evaluated.
Description
Technical Field
The invention belongs to the inertial measurement technology, and particularly relates to a laser gyro reliability test system and a test method.
Background
The laser gyro based on the Sagnac effect is used as an angle measuring device and is widely applied to various inertial navigation systems such as aviation, aerospace, navigation and the like. Because of the characteristics of high reliability (MTBF is as high as 80000 h) and long service life of the laser gyro, the reliability index verification is carried out by using the traditional reliability evaluation mode, and high test cost and time cost are required. Through failure mechanism analysis, the key functional performance parameter of the laser gyro, namely 'output light intensity', gradually decreases along with the extension of the working time, the 'mode voltage' gradually increases along with the extension of the working time, and the degradation trend is irreversible. Therefore, the degradation process of the product performance can be analyzed by utilizing the performance degradation data before the failure of the laser gyro, and the MTBF of the product can be evaluated by utilizing the relation between the failure of the product and the degradation of the product performance. The laser gyro is extremely slow to degrade under normal stress conditions. Therefore, the method adopts an Accelerated Degradation Test (ADT) mode, accelerates the performance degradation of the product by improving the stress level on the premise of not changing the degradation mechanism of the product, collects the performance degradation data of the product under the high stress level, and utilizes the data to estimate the MTBF of the product and predict the MTBF of the product under normal stress.
Disclosure of Invention
The purpose of the invention is that: the system and the method for testing the reliability of the laser gyro have the advantages of low cost and short time consumption, so that the performance of a product is objectively evaluated.
In one aspect, a laser gyro reliability test system is provided, which comprises a temperature stress applying device 2, an electric stress applying device 3, a control circuit 4 and at least one laser gyro 1, wherein the laser gyro 1 is arranged inside the temperature stress applying device 2, the electric stress applying device 3 is electrically connected with the laser gyro 1, and the control circuit 4 is electrically connected with the laser gyro 1 and the electric stress applying device 3 respectively.
Further, the electric stress applying device 3 is a laser gyro discharge controller, and controls the discharge current of the laser gyro 1.
Further, the electric stress applying device 3 and the control circuit 4 are of an integral structure;
the electric stress applying device 3 applies electric stress to the laser gyro 1;
the control circuit 4 obtains output parameters of the laser gyro.
Further, the control circuit 4 is provided inside or outside the temperature stress applying device 2; the temperature stress applying device 2 applies temperature stress to the laser gyro 1.
In another aspect, a method for testing reliability of a laser gyro is provided, the method comprising the steps of,
applying different grades of degradation test temperature stress to the laser gyro 1 through the temperature stress applying device 2; applying different levels of degradation test electric stress to the laser gyro 1 through the electric stress applying device 3;
adjusting the degradation test temperature stress and the degradation test electric stress of different grades to obtain the laser gyro output parameters under the degradation test temperature stress and the degradation test electric stress conditions of different grades;
fitting the corresponding laser gyro output parameters under the conditions of the degradation test temperature stress and the degradation test electric stress of different grades and the degradation test temperature stress and the degradation test electric stress of different grades to obtain a laser gyro degradation model, a service life model and an acceleration model;
and selecting different temperature stress and electric stress according to the service life model and the acceleration model to obtain the reliability of the laser gyro under the corresponding conditions.
Further, the degradation test temperature stress and the degradation test electric stress of the laser gyro comprise temperature stress and electric stress which exceed the normal application range of the laser gyro.
Further, the life model of the laser gyro is as follows
F(t)＝1-exp(-(t/η) m )
Where t is time, η is product characteristic lifetime, and m is a shape parameter.
Further, the laser gyro degradation model is a linear model
y i ＝α i ·t+β i
Wherein yi represents a performance degradation parameter of the gyroscope; i represents the number of samples to be tested under the action of a certain temperature stress and an electric stress; t is the test time; αi, βi are model parameters.
Further, the acceleration model is a temperature and electric stress mixed model,
wherein η represents a characteristic lifetime of the weibull distribution; a represents an inherent property of the product; e (E) a Is the activation energy in electron volts; k is the Boltzmann constant 8.617 ×10-5eV/K; t is the reaction temperature, with K as a unit, v is the electrical stress, c is the current characteristic parameter, and I is the current.
Further, evaluation model of reliability parameter MTBF of laser gyro
Wherein the parameter eta lowelimit A section estimate representing a characteristic lifetime of the product; m is m lowelimit An interval estimation value representing a product shape parameter; MTBF (methyl tert-butyl function)Average time between failures.
Further, the laser gyro output parameters include light intensity, beat frequency and mode voltage.
The invention has the beneficial effects that: the method is used for determining the reliability of the laser gyro, can effectively reduce the reliability test time and the cost, and is suitable for reliability evaluation in the development process of laser gyro products.
Drawings
FIG. 1 is a schematic diagram of a laser gyro reliability test system;
FIG. 2 is a flow chart of an embodiment;
1-laser gyro, 2-temperature stress applying device, 3-electric stress applying device, 4-control circuit.
Detailed Description
The invention is further described below with reference to the accompanying drawings:
referring to fig. 1, fig. 1 is a schematic diagram of a laser gyro reliability test system.
As shown in fig. 1, the laser gyro reliability test system comprises a temperature stress applying device 2, an electric stress applying device 3, a control circuit 4 and at least one laser gyro 1, wherein the laser gyro 1 is arranged inside the temperature stress applying device 2, the electric stress applying device 3 is electrically connected with the laser gyro 1, and the control circuit 4 is respectively electrically connected with the laser gyro 1 and the electric stress applying device 3.
The temperature stress applying device 2 applies high-temperature stress to the laser gyro 1, the electric stress applying device 3 applies direct-current discharge electric stress to the laser gyro 1, the control circuit 4 drives the laser gyro 1 to work normally, and meanwhile, the light intensity signal output by the laser gyro 1 is read, the mode voltage of the laser gyro 1 is measured, the beat frequency signal output by the laser gyro 1 is recorded, and the zero bias stability of the laser gyro 1 is calculated.
The electric stress applying device 3 and the control circuit 4 are integrated, and the electric stress applying device 3 applies electric stress to the laser gyro 1. The control circuit 4 acquires the output parameters of the laser gyro.
The control circuit 4 is provided inside or outside the temperature stress applying device 2. The temperature stress applying device 2 applies a temperature stress to the laser gyro 1.
Example 1:
the embodiment provides a laser gyro reliability test method, which comprises the following specific processes:
step 1: starting a plurality of groups of laser gyroscopes, and respectively applying electric stress and temperature stress;
step 2: reading the light intensity and the mode voltage of the laser gyroscopes in real time, and calculating the zero bias stability until any one of the light intensity and the mode voltage reaches a degradation threshold value, so as to obtain degradation data of each group of laser gyroscopes;
step 3: performing degradation fitting on the light intensity code value parameters and the mode voltage parameters of the laser gyroscope by adopting five degradation track models, substituting the time of each test point of the laser gyroscope with different sensitive stresses and the corresponding light intensity code value and the corresponding mode voltage of the gyroscope into the five degradation track models respectively, performing linearization treatment on the degradation models, including logarithmization and parameter substitution methods, substituting the five linearized data into a linear regression equation, and determining that the optimal performance degradation model is the linear degradation model according to the principle of least square sum of residual errors;
extrapolation is carried out by using a linear degradation model, a light intensity code value parameter threshold value and a mode voltage parameter threshold value to obtain pseudo life values of each test sample piece aiming at the light intensity code value and the mode voltage;
according to the competition failure principle, based on failure/tail cutting/pseudo life data of the light intensity code value parameter and the mode voltage parameter, the minimum failure data in all failure data of each test sample piece is selected, then the parameters in the acceleration model and the life distribution are determined by adopting a maximum likelihood estimation method according to the acceleration model and the life distribution evaluation model, and the product reliability parameter MTBF under the set stress condition is evaluated.
Embodiment 2, a method for testing reliability of a laser gyro
Fig. 2 is a flow chart of an embodiment. In the laser gyro degradation test, the temperature stress acting on the laser gyro can be increased by increasing the temperature, and the electrical stress acting on the laser gyro can be increased by increasing the laser discharge current. A plurality of laser gyroscopes 1 can be installed in each temperature stress applying device 2, at least 2 temperature stress applying devices 2 are set to different temperature stresses for testing, and at least 2 electric stress applying devices 3 apply different electric stresses.
And reading the light intensity, the mode voltage and the beat frequency of the laser gyroscopes under different degradation test temperature stresses and different degradation test electric stresses in real time until any one of the light intensity, the mode voltage and the beat frequency reaches a degradation threshold value, so as to obtain degradation data of each group of laser gyroscopes.
According to the method, five degradation track models are adopted to carry out degradation fitting on the light intensity code value parameters and the mode voltage parameters of the laser gyroscope, the time of each test point of the laser gyroscope under different sensitive stresses and the corresponding light intensity code value and the mode voltage of the gyroscope are respectively substituted into the five degradation track models, linearization processing is carried out on the degradation models, then the five linearized data are substituted into a linear regression equation, and the optimal performance degradation model is determined to be the linear degradation model according to the residual error square sum minimum principle. And extrapolation is carried out by using a linear degradation model, a light intensity code value parameter threshold value and a mode voltage parameter threshold value to obtain pseudo life values of each test sample piece aiming at the light intensity code value and the mode voltage. According to the competition failure principle, based on failure/tail cutting/pseudo life data of light intensity code value parameters and mode voltage parameters, selecting minimum failure data from all failure data for each product, then determining parameters in an acceleration model and life distribution by adopting a maximum likelihood estimation method according to the acceleration model and life distribution evaluation model, and evaluating the product reliability parameter MTBF under the set stress condition.
The following specifically provides methods for a degradation model, a life model and an acceleration model:
the invention adopts five degradation track models to carry out degradation fitting on the light intensity code value parameter and the mode voltage parameter of the laser gyroscope, and the five adopted models for carrying out degradation fitting are as follows:
linear model: y is i ＝α i ·t+β i
An exponential model:
power law model:
logarithmic model: y is i ＝α i ·ln(t)+β i
Lloyd-Lipow model:
substituting the time of each test point and the corresponding gyro light intensity code value and the mode voltage of the laser gyro under different sensitive stresses and different stress levels into the five degradation track models respectively. Linearizing the degradation model, including logarithm and parameter substitution, substituting the five linearized data into linear regression equation,
the factor t has a linear influence on the index y, i.e
y'＝β′ 0 +β′ 1 t'+ε
To estimate beta' 0 And beta' 1 By experimental observation time t 1 ,...,t n And n independent observations y of y 1 ,...,y n Estimated by least square method
Level t of test observation 1 ,...,t n Substituted into five regression equationsThe degradation model with the smallest error can be considered the most suitable one compared to the observed value.
And determining the optimal performance degradation model of the laser gyroscope as a linear degradation model according to the principle of minimum residual square sum. The calculated values of the parameters of the linear degradation model are shown in table 1.
Table 1 linear model parameter estimation table
And extrapolation is carried out by using a linear degradation model, a light intensity code value parameter threshold value and a mode voltage parameter threshold value to obtain pseudo life values of each test sample piece aiming at the light intensity code value and the mode voltage.
According to the competition failure principle, based on failure/tail cutting/pseudo life data of the light intensity code value parameter and the mode voltage parameter, selecting the smallest failure data in all failure data of each test sample piece, and then determining parameters in an acceleration model and life distribution by adopting a maximum likelihood estimation method according to a laser gyro life distribution model and an acceleration model.
The life distribution model and the acceleration model adopted by the laser gyro parameters are as follows:
the service life distribution model of the laser gyro is that,
F(t)＝1-exp(-(t/η) m )
the acceleration model of the laser gyro is that,
the probability density function of the weibull-TNT model is written first as a function of time T, temperature stress T and current I:
substituting the pseudo failure time of each test sample and the corresponding temperature stress value into the above formula to obtain a maximum likelihood function:
wherein T is 1 ＝353K,T 2 ＝363K,I 1 ＝0.48mA,I 2 ＝0.4mA
The results of the data solutions are shown in Table 2.
Table 2 parameter evaluation values
| Activation energy (ev) | Parameter c | Parameter A | m shape parameter |
| 1.11 | 4.54 | 1.2E-13 | 3.40 |
With the activation energy, c, a, and shape parameter m known, the lower MTBF estimate for each temperature segment laser gyro can be calculated according to the following formula.
。
Claims (3)
1. The laser gyro reliability test method for the laser gyro reliability test system is characterized by comprising a temperature stress application device (2), an electric stress application device (3), a control circuit (4) and at least one laser gyro (1), wherein the laser gyro (1) is arranged inside the temperature stress application device (2), the electric stress application device (3) is electrically connected with the laser gyro (1), the control circuit (4) is electrically connected with the laser gyro (1) and the electric stress application device (3) respectively, and the electric stress application device (3) is a laser gyro discharge controller for controlling the discharge current of the laser gyro (1); the control circuit (4) is arranged inside or outside the temperature stress applying device (2), and the temperature stress applying device (2) applies temperature stress to the laser gyroscope (1); the electric stress applying device (3) and the control circuit (4) are of an integrated structure; the electric stress applying device (3) applies electric stress to the laser gyro (1); the control circuit (4) acquires output parameters of the laser gyro, and the method comprises the following steps:
applying different grades of degradation test temperature stress to the laser gyroscope (1) through a temperature stress applying device (2); applying different levels of degradation test electric stress to the laser gyroscope (1) through an electric stress applying device (3);
adjusting the degradation test temperature stress and the degradation test electric stress of different grades to obtain the laser gyro output parameters under the degradation test temperature stress and the degradation test electric stress conditions of different grades;
fitting the corresponding laser gyro output parameters under the conditions of the degradation test temperature stress and the degradation test electric stress of different grades and the degradation test temperature stress and the degradation test electric stress of different grades to obtain a laser gyro degradation model, a service life model and an acceleration model;
according to the service life model and the acceleration model, different temperature stress and electric stress are selected, and the reliability of the laser gyro under the corresponding conditions is obtained;
the method specifically comprises the following steps:
step 1: starting a plurality of groups of laser gyroscopes, and respectively applying electric stress and temperature stress;
step 2: reading the light intensity and the mode voltage of the laser gyroscopes in real time, and calculating the zero bias stability until any one of the light intensity and the mode voltage reaches a degradation threshold value, so as to obtain degradation data of each group of laser gyroscopes;
step 3: performing degradation fitting on the light intensity code value parameters and the mode voltage parameters of the laser gyroscope by adopting five degradation track models, substituting the time of each test point of the laser gyroscope with different sensitive stresses and the corresponding light intensity code value and the corresponding mode voltage of the gyroscope into the five degradation track models respectively, performing linearization treatment on the degradation models, including logarithmization and parameter substitution methods, substituting the five linearized data into a linear regression equation, and determining that the optimal performance degradation model is the linear degradation model according to the principle of least square sum of residual errors;
extrapolation is carried out by using a linear degradation model, a light intensity code value parameter threshold value and a mode voltage parameter threshold value to obtain pseudo life values of each test sample piece aiming at the light intensity code value and the mode voltage;
according to the competition failure principle, based on failure/tail cutting/pseudo life data of light intensity code value parameters and mode voltage parameters, selecting minimum failure data in all failure data of each test sample piece, then determining parameters in an acceleration model and life distribution by adopting a maximum likelihood estimation method according to the acceleration model and the life distribution evaluation model, and evaluating a product reliability parameter MTBF under a set stress condition;
the five models used for the degradation fitting are as follows:
linear model: y is i ＝α i ·t+β i
An exponential model:
power law model:
logarithmic model: y is i ＝α i ·ln(t)+β i
Lloyd-Lipow model:yi represents a performance degradation parameter of the gyroscope; i represents the number of samples to be tested under the action of a certain temperature stress and an electric stress; t is the test time; αi, βi are model parameters;
the estimation tables of the parameters of the linear degradation model are as follows:
the life model of the laser gyro is that
F(t)＝1-exp(-(t/η) m ) T is time, eta is the characteristic life of the product, and m is a shape parameter;
the acceleration model is a temperature and electric stress mixed model,
η represents the characteristic lifetime of the weibull distribution; a represents an inherent property of the product; ea is the activation energy in electron volts; k is the Boltzmann constant 8.617 ×10-5eV/K; t is the reaction temperature, in units of K, u is the electrical stress, c is the current characteristic parameter, and I is the current.
2. The method of claim 1, wherein the degradation test temperature stress and the degradation test electrical stress of the laser gyro comprise temperature stress and electrical stress exceeding a normal application range of the laser gyro.
3. The method for testing the reliability of the laser gyroscope according to claim 1, wherein the reliability parameter MTBF of the laser gyroscope is evaluated by an evaluation model
Wherein the parameter eta lowelimit A section estimate representing a characteristic lifetime of the product; m is m lowelimit An interval estimation value representing a product shape parameter; MTBF average time between failures.
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