CN110567485B - On-orbit autonomous fault diagnosis and repair method for multi-probe star sensor - Google Patents
On-orbit autonomous fault diagnosis and repair method for multi-probe star sensor Download PDFInfo
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Abstract
The invention relates to an in-orbit autonomous fault diagnosis and repair method for a multi-probe star sensor, and belongs to the technical field of satellite attitude control. The multi-probe star sensor performs information fusion processing based on star point information in a plurality of probe fields of view to further improve the product precision, the realization index of the multi-probe star sensor is superior to 0.6 '(3 sigma) after the fusion of the plurality of probes, and the realization index of a single probe is superior to 1' (3 sigma), and the multi-probe star sensor has the technical characteristics of very high precision, high dynamic and high dynamic performance and is mainly applied to remote sensing satellites and high-resolution earth observation satellites; the method designs a software-based autonomous fault diagnosis and repair method aiming at different fault modes of a single probe and a plurality of probes of a product on orbit; meanwhile, for the single point problem of power supply and distribution in the product hardware design, the single machine and system fault tolerance capability is improved; meanwhile, a plurality of different faults of the product on the track can be diagnosed and processed in real time, and the reliability of the star sensor product is effectively improved.
Description
Technical Field
The invention relates to an in-orbit autonomous fault diagnosis and repair method for a multi-probe star sensor, and belongs to the technical field of satellite attitude control.
Background
The star sensor is an attitude measurement sensor with highest measurement accuracy in the current aerospace application, and the attitude of an aircraft is determined by detecting fixed stars at different positions on an celestial sphere by taking the fixed stars accurately positioned in the celestial sphere as an absolute reference system, so that the three-axis attitude of the aircraft relative to an inertial coordinate system is provided. The method has the advantages of high precision, no drift, high reliability and the like, and is a key component for satellite attitude measurement.
The star sensor is a complex system formed by a plurality of parts integrating light, light and electricity, has special working environment and has high reliability and safety for long-time operation. The star sensor system is inevitable to have faults in continuous uninterrupted operation for several years, and fault diagnosis is important work for ensuring the reliable operation of the star sensor in the orbit and improving the space viability.
At present, aiming at on-orbit fault diagnosis of star sensor products, the on-orbit fault diagnosis is mainly realized by two modes: one is that the star sensor is subjected to fault diagnosis on the satellite control subsystem level through the redundant backup of the star sensor and the combination of the information of other sensors on the star; and the other method is that the star sensor product self-design implementation layer fully analyzes the star sensor fault reason and fault expression characteristics in the star sensor design implementation process, when the product has a fault, the fault reason and fault position can be rapidly determined, and effective measures and means are adopted to enable the working state of the product to be recovered to be normal. The two implementation modes of the on-track fault diagnosis method are described below.
An on-orbit diagnosis method for a star sensor on the satellite control subsystem level mainly carries out fault diagnosis through related redundant information of the star sensor, and the method is the most accurate and effective way for identifying the faults of the star sensor. The redundant information includes direct redundancy and analytical redundancy. The direct redundancy mainly comprises the steps of utilizing a plurality of star sensors configured on a star, comparing and analyzing attitude data output by the star sensors, and identifying a fault star sensor. The analysis redundancy is mainly based on the satellite attitude kinematic relationship, and the fault diagnosis problem of the star sensor is researched by utilizing the gyro measurement information and the vector observation information of the star sensor and considering the influence of system noise. For example, according to the angular velocity value measured by the gyroscope and the star sensor measurement value, and the analytic redundancy relation between the two values, a residual error generator is designed to obtain a residual error only containing the fault information of the star sensor, and then the residual error evaluation value is compared with a set threshold value to determine whether the star sensor has faults or not.
The on-orbit fault diagnosis method for star sensor product design implementation layer mainly carries out on-line real-time automatic detection on the information according to various measurement data output by the product, such as externally output parameters and states, direct measurement values of hardware output parameters, or states or parameters obtained after the measurement values are subjected to certain processing, and carries out real-time analysis and judgment on the input and output data, the states and the parameter reliability of the system, thereby achieving the purpose of timely detection and minimizing the influence generated by fault products. The star sensor on-orbit fault diagnosis generally comprises the following three main steps:
(1) firstly, real-time data measurement and processing are carried out, and various characteristic parameters and states representing the system state are detected;
(2) analyzing and processing the detected characteristic signals, identifying the abnormal state of the system, and judging and positioning the fault;
(3) and according to the previous fault detection and positioning results, if abnormity is found, alarm information is given in time.
The existing on-orbit fault diagnosis method for the star sensor product comprises the following aspects:
first, communication failure diagnosis
And in the communication process of the star sensor and an external computer, the communication data of the star sensor is transmitted according to a specified protocol sequence. The star sensor and the satellite system are connected through a communication cable, which is the only channel for data exchange between the star sensor and the satellite system, so that errors in data communication must be strictly controlled. Communication faults which can be generated by the star sensor due to hardware faults or electromagnetic interference on a communication line comprise: no data is received, or incomplete missing codes are received, or error codes and error codes are received.
Before the star sensor is powered on and started to enter a normal working mode, the star sensor can carry out starting self-detection on the communication function of the product according to the communication content and the communication working state of the star sensor, and whether the received data are consistent and complete with an agreed protocol or not and whether the communication function has sustainability or not is tested. The detection program is based on the results of N times of continuous detection, if the N times of sending and receiving of the selected test data are normal, the communication function is considered, otherwise, the communication state of the product is recorded as a fault state. And in the normal working process of the product, the communication function of the product can be regularly detected in a similar mode.
Second, imaging detector failure
The star sensor takes star light of a fixed star as a non-electric quantity measuring object, an imaging detector of the star sensor is a core sensitive element of a product, and if related functions of the device break down, the whole attitude measuring function of the star sensor is completely lost, and the star sensor is expressed as a complete fault state. The imaging detector is an electronic component which can not work independently and needs a peripheral auxiliary supporting circuit to work cooperatively. The auxiliary circuit comprises a driving circuit, an operation time sequence signal generating circuit, a signal detection circuit, a video signal shaping circuit, a data transfer circuit and a storage circuit. Problems arise in any part of the process, which may cause the imaging function of the product to be abnormal.
Imaging detector faults are mainly manifested as: faults of the auxiliary driving or the sequential circuit cause errors or no function of a control signal of the detector, so that the output signal of the detector is wrong or the signal noise is increased, and the star sensor cannot work normally or the measurement precision of the product attitude is reduced; meanwhile, the imaging detector completely fails in imaging function due to environmental interference or damage and the like. For the former, some important signals of the control circuit can be detected to check whether the working points of the signals are normal or not; for the latter situation, under the condition that the auxiliary circuit is eliminated to work normally, a function test method for testing the functional characteristics of the tested device is adopted, namely, the star map is shot on the orbit through a downloaded product, the validity and the continuity of long-time attitude measurement output data of the star sensor are inspected, and whether the imaging detector is normal or not is analyzed.
Third, memory failure
The failure of the memory is that on one hand, due to the dense cell array in the memory, disturbance among data may exist among the cells, including data interaction among rows, columns and cells; on the other hand, in the satellite flight process, the interior of the star sensor signal processing circuit, such as a static random access memory, is sensitive to space radiation, and is easy to generate a single event phenomenon, so that bit flipping of an instruction register, bit flipping of a stack pointer register, bit flipping of an interrupt vector table and a connection pointer and the like are caused, and running disorder of product software is caused. Because the operation codes and operation data of the computer program are stored in the memory, two results may occur in the operation of the product program according to the position of the fault occurrence: firstly, the operation code is changed to cause the program to run away or execute error operation; secondly, the operation number is changed, and an error operation result is generated.
For the first case, when the running program enters a non-program area, a software trap can be set and quickly led to a specified position, and a program with an error operation is set at the specified position, so that the program operation can be recovered to be normal; meanwhile, the execution flow path check can be carried out at the inlet and the outlet of each software functional module, so that the program is prevented from flying or the operation error is prevented from influencing other software modules. For the second case, to prevent data corruption in memory, a redundant voting method is used, i.e., two out of three voting of data, the important system parameters and variables are placed in three physically separated zones, two out of three methods are used to prevent transient corruption, and the corruption information is corrected.
In the star sensor fault diagnosis method, fault diagnosis based on the satellite control subsystem layer can only diagnose whether the star sensor has faults to a certain extent, and effective measures cannot be taken to repair products; the fault diagnosis method based on the star sensor product can be used for deeply and comprehensively diagnosing various faults of the product, positioning the faults based on the working state of software and hardware of the product and adopting appropriate repair measures to enable the working state of the product to be recovered to be normal.
The star sensor product is a complex system consisting of a plurality of parts such as light, machine and electricity, and the difficulty in realizing on-orbit fault diagnosis and repair is relatively high. For the multi-probe star sensor, the hardware architecture design, the software implementation flow and the implementation function are more complex compared with those of a single-head star sensor, the overall fault analysis, design and implementation difficulty of a product is higher, different faults of a single probe and a plurality of probes of the product in an orbit need to be analyzed, corresponding solutions are provided, and the reliability of the product in the orbit is improved.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the method is used for solving the defects of the prior art, providing a multi-probe star sensor on-orbit autonomous fault diagnosis and repair method, providing a fault diagnosis and repair method aiming at the possible faults of a plurality of probes of a multi-probe star sensor product on-orbit, and providing a corresponding fault diagnosis and repair method aiming at the single-point problem of the power supply and distribution design of the multi-probe star sensor in the project.
The technical solution of the invention is as follows:
a multi-probe star sensor on-orbit autonomous failure diagnosis and repair method, the multi-probe star sensor carries on the information fusion processing based on the star point information in the field of view of multiple probes, in order to further promote the product precision, its multiple probes are fused and realized the index and is superior to 0.6 "(3 sigma), the single probe realizes the index and is superior to 1" (3 sigma), its technical feature is very high precision, high dynamic and high dynamic performance, mainly apply to the remote sensing satellite and high-resolution earth observation satellite; the method designs a software-based autonomous fault diagnosis and repair method aiming at different fault modes of a single probe and a plurality of probes of a product on orbit; meanwhile, for the problem of single point of power supply and distribution in product hardware design, a method for repairing the fault after the on-track product is short-circuited is provided, so that the on-track reliability of the product is effectively improved; the product is the multi-probe star sensor;
the method is used for diagnosing the output image state of the probe and the power supply short circuit state of the probe, and the step of diagnosing the output image state of the probe in the method comprises the following steps:
(1) diagnosing the output image state of each probe according to the probe image ready mark and the probe image available mark in the product output telemetering data;
(2) when a single probe or two probes cannot output image data in real time, powering off and powering on a fault probe (the working states of other probes of a product are not influenced in the process) to repair the fault state of the probe, reconfiguring a detector and an ASIC/FPGA related register of the fault probe after powering on, diagnosing the working state of the probe again after initializing corresponding probe hardware, and if the probe cannot output the image data in real time after continuously powering off for 3 times, setting the working state of the probe as abnormal and then powering off the probe; if the working state of the probe returns to normal after the probe is powered up again, the working state of the probe is set to be a normal state;
when all the probes are diagnosed to be incapable of outputting image data in real time, namely, the product cannot output effective attitude data and is in a fault state, resetting the product, namely, performing power-on operation on all the probes after power failure again to recover the working state of the product, performing real-time diagnosis on the working state of all the probes again after all the probes are powered on again, and if all the probes of the product still cannot output image data in real time after 3 times of continuous resetting operation, switching the working mode of the product into a safe mode.
The method for diagnosing the power supply short circuit state of the probe refers to that according to the design of power supply and distribution of product hardware, if the grounding capacitor used by a DC-DC module in a certain probe power supply part of a product on the rail is short-circuited, the power supply of all probes of the product is short-circuited, aiming at the problem, a software fault repairing method is provided under the condition that the design state of the product hardware is not changed, and the main implementation process comprises the following steps:
(1) diagnosing the working states of all the probes, setting the working state of the whole product machine to be an abnormal state when the power supply voltage of all the probes is abnormal, entering the next step, and setting the working state of the whole product machine to be a normal state when at least one probe is normal, and ending the diagnosis;
(2) performing power-off operation on all the probes;
(3) electrifying the probe 1 again, if the voltage state of the probe 1 is still abnormal, powering off the probe 1 after the working state of the probe 1 is abnormal, and executing the next step; if the working state of the probe 1 is normal, the power is not cut off, and the next step is executed;
(4) powering up the probe 2 again, if the voltage state of the probe 2 is still abnormal, powering off the probe 2 after the working state of the probe 2 is abnormal, and executing the next step; if the working state of the probe 2 is normal, the power is not cut off, and the next step is executed;
(5) electrifying the probe 3 again, if the voltage state of the probe 3 is still abnormal, powering off the probe 3 after the working state of the probe 3 is abnormal, and executing the next step; if the working state of the probe 3 is normal, the power is not cut off, and the next step is executed;
(6) if the power supply state of more than or equal to 1 probe of the product is recovered to be normal, the product operates normally, otherwise, the steps 2) -6) are repeatedly executed, and if the product still cannot recover to be normal after being repeatedly executed for 3 times, the product operating mode is switched to the safe mode.
Advantageous effects
The on-orbit automatic fault diagnosis and repair method of the product can diagnose and repair the on-orbit fault of the product in time, and is different from the prior method that the fault processing is carried out after the long-time diagnosis is carried out on the state information of a single machine through a satellite control system, so that the fault tolerance of the single machine and the system is improved; meanwhile, a plurality of different faults of the product on the track can be diagnosed and processed in real time, and the reliability of the star sensor product is effectively improved.
Drawings
FIG. 1 is a schematic flow chart of an implementation process of the on-orbit autonomous fault diagnosis and repair method of the star sensor.
Detailed Description
As shown in fig. 1, the on-orbit autonomous fault diagnosis and repair method provided by the present invention has the following specific implementation processes:
(1) powering on a product to finish initialization of software and hardware;
(2) performing power-off operation on all probes of the product;
(3) powering on the probe 1, if the voltage state of the probe 1 is still abnormal, powering off the probe 1 after the working state of the probe 1 is abnormal, and executing the next step; if the working state of the probe 1 is normal, the power is not cut off, and the next step is executed;
(4) powering on the probe 2, if the voltage state of the probe 2 is still abnormal, powering off the probe 2 after the working state of the probe 2 is abnormal, and executing the next step; if the working state of the probe 2 is normal, the power is not cut off, and the next step is executed;
(5) powering on the probe 3, if the voltage state of the probe 3 is still abnormal, powering off the probe 3 after the working state of the probe 3 is abnormal, and executing the next step; if the working state of the probe 3 is normal, the power is not cut off, and the next step is executed;
(6) if the power supply state of more than or equal to 1 probe of the product is recovered to be normal, the product normally runs, the next step is executed, otherwise, the steps 2) to 6) are repeatedly executed, and if the product still cannot recover to be normal after 3 times of repeated execution, the product working mode is switched to a safe mode.
(7) Monitoring the output image states of all probes in each period in the normal operation process of the product, and executing the next operation when diagnosing that a certain probe (a single probe or two probes) cannot output image data for 5 seconds continuously; if all the probes cannot output image data for 5 seconds continuously, executing the step (12), otherwise, repeatedly executing the step (7);
(8) performing power-off operation on the fault probe;
(9) after waiting for 2 seconds, the fault probe is electrified again, and the detector and the ASIC/FPGA related register of the probe are reconfigured;
(10) initializing the FPGA/ASIC corresponding to the probe;
(11) diagnosing the output image state of the probe again, if the probe still can not output image data, repeating the steps (8) to (11), if the probe still can not output image data after repeating the steps for 3 times, setting the working state of the probe as abnormal, and powering off the probe;
(12) resetting the product;
(13) after the product runs normally, repeating the steps (7) to (12), and if all probes of the product still cannot output image data in real time after 3 times of continuous reset operation, switching the product working mode to a safe mode;
(14) monitoring the power supply states of all probes in each period in the normal operation process of the product, and executing the next operation when the power supply voltage of a certain probe (a single probe or two probes) is diagnosed to be continuously abnormal for 5 seconds; if all the probes have abnormal power supply voltage for 5 seconds continuously, executing the step (19), otherwise, repeatedly executing the step (14);
(15) performing power-off operation on the probe;
(16) the probe is powered up again, and the power supply state of the probe after power up is diagnosed;
(17) if the voltage state of the probe is still abnormal, the probe is powered off after the working state of the probe is set to be abnormal, and the probe is not powered on any more in the subsequent software autonomous power on and off operation process; if the working state of the probe is normal, sequentially executing the next step;
(18) reconfiguring the probe and the related register of the ASIC/FPGA, and executing the step (7) after carrying out initialization operation on the FPGA/ASIC corresponding to the probe;
(19) and (5) executing the steps (2) to (6) and repairing all the power supply abnormalities of the probes.
Example 1 (abnormal power supply state of product probe in power-on process)
An on-orbit autonomous fault diagnosis and repair method for a multi-probe star sensor is used for diagnosing the output image state of a probe and the power supply short-circuit state of the probe, and the method for diagnosing the power supply state of the probe comprises the following steps:
(1) powering on a product to finish initialization of software and hardware;
(2) performing power-off operation on all probes of the product;
(3) powering up the probe 1, ensuring that the voltage state of the probe 1 is normal, ensuring that the working state of the probe 1 is normal, namely, the probe is not powered off, and executing the next step;
(4) powering up the probe 2, ensuring that the voltage state of the probe 2 is normal, ensuring that the working state of the probe 2 is normal, namely, the probe is not powered off, and executing the next step;
(5) powering on the probe 3, if the voltage state of the probe 3 is abnormal, powering off the probe 3 after the working state of the probe 3 is abnormal, and executing the next step;
(6) and if the power supply state of the product probe 1 and the probe 2 is recovered to be normal, the product operates normally.
Embodiment 2 (abnormal power supply state of probe in working process of product)
An on-orbit autonomous fault diagnosis and repair method for a multi-probe star sensor is used for diagnosing the output image state of a probe and the power supply short-circuit state of the probe, and the method for diagnosing the power supply state of the probe comprises the following steps:
(1) diagnosing the working states of all the probes, setting the working state of the whole product machine as an abnormal state and executing the next step when the power supply voltage of all the probes is abnormal;
(2) performing power-off operation on all the probes;
(3) electrifying the probe 1 again, ensuring the voltage state of the probe 1 to be normal, ensuring the working state of the probe 1 to be normal, namely not powering off, and executing the next step;
(4) powering up the probe 2 again, if the voltage state of the probe 2 is abnormal, powering off the probe 2 after the working state of the probe 2 is abnormal, and executing the next step;
(5) electrifying the probe 3 again, ensuring the voltage state of the probe 3 to be normal, ensuring the working state of the probe 3 to be normal, namely, not powering off, and executing the next step;
(6) and if the power supply state of the probes 1 and 3 of the product is recovered to be normal, the product operates normally.
Example 3 (abnormal output image of a single probe during the operation of the product)
(1) Monitoring the output image states of all the probes in each period in the normal operation process of the product, diagnosing that the probes 2 cannot output image data for 5 seconds continuously, and executing the next operation;
(2) the probe 2 is powered off;
(3) after waiting for 2 seconds, the probe 2 is electrified again, and the detector and the ASIC/FPGA related register of the probe are reconfigured;
(4) initializing the FPGA/ASIC corresponding to the probe 2 again;
(5) and (3) diagnosing the output image state of the probe 2 again, and if the probe 2 still cannot output image data, repeating the steps (1) to (5), wherein the probe 2 still cannot output image data after repeating the steps for 3 times, and powering off the probe 2 after the working state of the probe 2 is abnormal.
Embodiment 4 (abnormal output image of all probes during the product operation)
(1) Monitoring the image output states of all the probes in each period in the normal operation process of the product, and executing the next step when the condition that all the probes cannot output image data continuously for 5 seconds is diagnosed;
(2) resetting the product;
(3) and (4) after the product operates normally, repeating the steps (1) to (3), and after the product is reset for 1 time, outputting the image state of all the probes to be normal.
Claims (8)
1. An on-orbit autonomous fault diagnosis and repair method for a multi-probe star sensor is characterized by comprising the following steps: the method is used for diagnosing the output image state of the probe and the power supply short circuit state of the probe, and the step of diagnosing the output image state of the probe in the method comprises the following steps:
(1) diagnosing the output image state of each probe according to the probe image ready mark and the probe image available mark in the product output telemetering data;
(2) when a single probe or two probes cannot output image data in real time in a diagnosis manner, powering off and then powering on the fault probe to repair the fault state of the probe, reconfiguring a detector and an ASIC/FPGA related register of the fault probe after powering on, carrying out hardware initialization on the corresponding probe, then diagnosing the working state of the probe again, and if the probe cannot output the image data in real time after being powered off for 3 times continuously, setting the working state of the probe as abnormal and then carrying out power-off operation on the probe; if the working state of the probe returns to normal after the probe is powered up again, the working state of the probe is set to be a normal state;
when all the probes are diagnosed to be incapable of outputting image data in real time, namely, the product cannot output effective attitude data and is in a fault state, resetting the product, namely, performing power-on operation on all the probes after power failure again to recover the working state of the product, performing real-time diagnosis on the working state of all the probes again after all the probes are powered on again, and if all the probes of the product still cannot output image data in real time after 3 times of continuous resetting operation, switching the working mode of the product into a safe mode;
the method for diagnosing the power supply short circuit state of the probe refers to that according to the design of power supply and distribution of product hardware, if the grounding capacitor used by a DC-DC module in a certain probe power supply part of a product on the rail is short-circuited, the power supply of all probes of the product is short-circuited;
under the condition of not changing the design state of product hardware, the fault repairing method for all probes of the product with short circuit comprises the following steps:
1) diagnosing the working states of all the probes, setting the working state of the whole product machine to be an abnormal state when the power supply voltage of all the probes is abnormal, entering the next step, and setting the working state of the whole product machine to be a normal state when at least one probe is normal, and ending the diagnosis;
2) performing power-off operation on all the probes;
3) electrifying the probe 1 again, if the voltage state of the probe 1 is still abnormal, powering off the probe 1 after the working state of the probe 1 is abnormal, and executing the next step; if the working state of the probe 1 is normal, the power is not cut off, and the next step is executed;
4) powering up the probe 2 again, if the voltage state of the probe 2 is still abnormal, powering off the probe 2 after the working state of the probe 2 is abnormal, and executing the next step; if the working state of the probe 2 is normal, the power is not cut off, and the next step is executed;
5) electrifying the probe 3 again, if the voltage state of the probe 3 is still abnormal, powering off the probe 3 after the working state of the probe 3 is abnormal, and executing the next step; if the working state of the probe 3 is normal, the power is not cut off, and the next step is executed;
6) if the power supply state of more than or equal to 1 probe of the product is recovered to be normal, the product operates normally, otherwise, the steps 2) -6) are repeatedly executed, and if the product still cannot recover to be normal after being repeatedly executed for 3 times, the product operating mode is switched to the safety mode.
2. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the multi-probe star sensor performs information fusion processing based on star point information in a plurality of probe fields of view.
3. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the index of the multi-probe star sensor is better than 0.6' after a plurality of probes are fused.
4. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the single probe realization index of the multi-probe star sensor is superior to 1'.
5. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the multi-probe star sensor is applied to remote sensing satellites and high-resolution earth observation satellites.
6. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the method designs the autonomous fault diagnosis and repair method based on software for different fault modes of a single probe and a plurality of probes of a product on orbit.
7. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the method provides a fault repairing method after short circuit of on-orbit products for the single point problem of power supply and distribution in product hardware design.
8. The on-orbit automatic fault diagnosis and repair method for the multi-probe star sensor according to claim 1, characterized in that: the product is the multi-probe star sensor.
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| CN114018283B (en) * | 2021-09-28 | 2023-11-10 | 北京控制工程研究所 | System fault diagnosis and repair method for multi-probe star sensor |
| CN114858183B (en) * | 2022-03-31 | 2024-07-09 | 北京航天控制仪器研究所 | Star sensor fault self-detection method |
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