CN110553989A - method for removing spectrum baseline - Google Patents

method for removing spectrum baseline Download PDF

Info

Publication number
CN110553989A
CN110553989A CN201910828020.0A CN201910828020A CN110553989A CN 110553989 A CN110553989 A CN 110553989A CN 201910828020 A CN201910828020 A CN 201910828020A CN 110553989 A CN110553989 A CN 110553989A
Authority
CN
China
Prior art keywords
baseline
spectral
light intensity
spectrum
intensity value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910828020.0A
Other languages
Chinese (zh)
Inventor
蔡正杰
袁海军
马建州
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WUXI CREATORS ANALYTICAL INSTRUMENTS Co Ltd
Original Assignee
WUXI CREATORS ANALYTICAL INSTRUMENTS Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WUXI CREATORS ANALYTICAL INSTRUMENTS Co Ltd filed Critical WUXI CREATORS ANALYTICAL INSTRUMENTS Co Ltd
Priority to CN201910828020.0A priority Critical patent/CN110553989A/en
Publication of CN110553989A publication Critical patent/CN110553989A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

the invention discloses a method for removing a spectrum baseline, and belongs to the technical field of spectrum analysis. Firstly, reading original data; then finding out inflection points of the trend of the spectrum baseline; then fitting the spectral baselines within each region; and finally, subtracting the fitted spectrum base line of each region from the original data to realize spectrum base line correction. The spectrum baseline is divided into a plurality of areas, and polynomial fitting is carried out on the spectrum baseline in each area, so that the algorithm for deducting the spectrum baseline is realized. No parameters need to be set in advance and the spectral baselines are applicable for all different baseline trends.

Description

Method for removing spectrum baseline
Technical Field
The invention relates to the technical field of spectral analysis, in particular to a method for removing a spectral baseline.
background
there are many academic papers and patents that have published the results of algorithmic research on removing the spectral baseline, among which the following are more common: polynomial iterative fitting method, wavelet transform method, first derivative method, etc. However, in practice, these methods have respective limitations.
The polynomial iterative fitting method needs to set the polynomial order in advance to determine the baseline trend. For multi-channel systems with different wavelength ranges, baseline trends generated by noise and stray light interference are different, and a polynomial of a certain order cannot be uniformly and perfectly fitted;
The wavelet transform rule requires setting of wavelet base type, wavelet decomposition level number and high frequency filtering threshold. However, which kind of wavelet base or how many decomposition layers is suitable for a specific spectral line in practice has no literature guidance, and needs to be adjusted and tried manually continuously, which brings trouble to the pretreatment work of the spectral line. Although the literature compares the influence of different wavelet bases and different decomposition layer numbers on a certain spectral line, the result shows that the baseline removing effect is the best under a certain parameter; however, the conclusion is not popularized to other spectral lines, so that the method has no any guiding significance in practice;
For the first derivative method, the invention patent with application number 201410006439.5 discloses a spectral baseline correction method based on first derivative peak finding and spline fitting, and in the description, the original spectrum is really too simple, and the used spectral line can be regarded as a baseline expressed by a quadratic polynomial plus several standard Gaussian peaks. However, in the actually generated spectral line, besides the gaussian peak shape, there may be shoulders and overlapping peaks, which cannot be identified by the first derivative method, resulting in distortion of the spectral line.
Disclosure of Invention
the invention aims to provide a method for removing a spectrum baseline, which aims to solve the problems that the existing method for removing the spectrum baseline can only correct the baseline trend of a certain type, or needs to manually set parameters and has low processing efficiency.
In order to solve the above technical problem, the present invention provides a method for removing a spectral baseline, comprising:
Reading original data;
step two, finding out an inflection point of the baseline trend;
Step three, fitting a base line in each area;
and step four, subtracting the fitted base line of each area from the original data to realize base line correction.
Optionally, the raw data includes a plurality of CCD collected data.
Optionally, in the second step, the formula I (I) < I (I-1) < I (I-2) and I (I) < I (I +1) < I (I +2) are determined according to the spectrum intensity, and an inflection point of the baseline trend is found; wherein I (i) is the light intensity value of the ith sampling point in the spectral line; i (I-1) is the light intensity value of the I-1 th sampling point; i (I-2) is the light intensity value of the I-2 sampling point; i (I +1) is the light intensity value of the (I +1) th sampling point; i (I +2) is the light intensity value of the (I +2) th sampling point.
optionally, before the second step, the method for removing the spectral baseline further includes:
through the comparison of the intensity values between adjacent acquisition points, the acquisition points where all the minimum light intensity values on the spectral line are located are found;
and removing the acquisition points where the minimum light intensity values on the shoulder peaks and the overlapped peaks are located through a threshold judgment formula.
alternatively, the minimum value on the spectral line is found according to the spectral intensity judgment formulas I (I) < I (I-1) < I (I-2) and I (I) < I (I +1) < I (I + 2).
Optionally, the minimum values on the shoulder peak and the overlapping peak are removed by the following threshold judgment formula:
IAcromion, overlapping peak>3/2*Imin
wherein, IAcromion, overlapping peakshoulder, spectral intensity over overlapping peaks; i isminthe minimum light intensity value in the spectrum composed of all the sampling points.
Optionally, fitting the spectral baseline in each region comprises:
dividing the spectral line into n-1 areas according to the n inflection points found in the step two;
Within each individual zone, the baseline trend is a primary or secondary curve.
The invention provides a method for removing a spectrum baseline, which comprises the steps of firstly reading original data; then finding out inflection points of the trend of the spectrum baseline; then fitting the spectral baselines within each region; and finally, subtracting the fitted spectrum base line of each region from the original data to realize spectrum base line correction. The spectrum baseline is divided into a plurality of areas, and polynomial fitting is carried out on the spectrum baseline in each area, so that the algorithm for deducting the spectrum baseline is realized. No parameters need to be set in advance and the spectral baselines are applicable for all different baseline trends.
The invention has the following beneficial effects:
(1) the parameters do not need to be manually set, the presetting is reduced, and the processing efficiency is improved;
(2) The method can uniformly process any type of baseline trend;
(3) But also to complex spectral lines containing shoulder peaks and overlapping peaks.
drawings
FIG. 1 is a schematic flow diagram of a method for removing a spectral baseline according to the present invention;
FIG. 2 is a schematic diagram of importing raw data;
FIG. 3 is a schematic diagram of a quad interpolation;
FIG. 4 is a schematic diagram of the acquisition of all minima points on the spectrum;
FIG. 5 is a schematic diagram of removing a shoulder peak and a minimum point on an overlapping peak;
FIG. 6 is a schematic diagram of obtaining a baseline inflection point;
FIG. 7 is a schematic of a fit for each region;
FIG. 8 is a schematic of a baseline correction of the raw spectrum.
Detailed Description
The following describes a method for removing a spectral baseline according to the present invention in further detail with reference to the accompanying drawings and specific examples. Advantages and features of the present invention will become apparent from the following description and from the claims. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
Example one
The invention provides a method for removing a spectrum baseline, the flow of which is shown in figure 1, and the method comprises the following steps:
Step S11, reading original data;
Step S13, finding out the inflection point of the baseline trend;
step S14, fitting a baseline within each region;
In step S15, the fitted baseline for each region is subtracted from the raw data to achieve baseline correction.
firstly, reading original data, wherein the original data comprises a plurality of CCD (charge coupled device) collected data, and the size and the number of CDDs (compact disc detectors) of each CCD collected data need to be known so as to process the collected data of each CDD one by one;
Then, according to the spectral intensity judgment formulas I (I) < I (I-1) < I (I-2) and I (I) < I (I +1) < I (I +2), finding the minimum value on the baseline; wherein I (i) is the light intensity value of the ith sampling point of the spectral line; i (I-1) is the light intensity value of the I-1 th sampling point; i (I-2) is the light intensity value of the I-2 sampling point; i (I +1) is the light intensity value of the (I +1) th sampling point; i (I +2) is the light intensity value of the (I +2) th sampling point;
Removing minimum values on the shoulder peaks and the overlapped peaks, wherein the minimum values can influence the judgment of the trend of the spectrum baseline, and the removing method is according to a threshold judgment formula: i isacromion, overlapping peak>3/2*Imin(ii) a Wherein, IAcromion, overlapping peakthe light intensity values on the shoulder peaks are overlapped; i isminthe minimum light intensity value in the spectrum formed by all the sampling points;
then judging the formula I (I) < I (I-1) < I (I-2) and I (I) < I (I +1) < I (I +2) according to the same spectrum intensity, and finding out the inflection point of the baseline trend; similarly, I (i) is the light intensity value of the ith sampling point of the spectral line; i (I-1) is the light intensity value of the I-1 th sampling point; i (I-2) is the light intensity value of the I-2 sampling point; i (I +1) is the light intensity value of the (I +1) th sampling point; i (I +2) is the light intensity value of the (I +2) th sampling point;
fitting a spectral baseline within each region; specifically, according to the acquisition points where the minimum values of all the non-shoulder peaks or the overlapping peaks found in the second step are located, n baseline trend inflection points are found by using the spectral intensity judgment formula again, and the spectral line is divided into n-1 areas; within each individual zone, the baseline trend is a primary or secondary curve;
and finally, subtracting the fitted spectrum base line of each region from the original data to realize spectrum base line correction.
the detailed steps are as follows:
The first step is as follows: importing raw data, as shown in FIG. 2;
the second step is that: performing a quadruple interpolation, as shown in fig. 3;
The third step: obtaining all minimum value points on the spectrum through a spectrum intensity judgment formula, as shown in fig. 4;
The fourth step: removing minimum value points on the shoulder peak and the overlapped peak through a threshold judgment formula, as shown in fig. 5;
The fifth step: obtaining a baseline inflection point, as shown in FIG. 6;
and a sixth step: fitting each region as shown in fig. 7; wherein the fitting baseline is a bold dashed line at the bottom, the original signal is a thin solid line, and the fitting baseline is below the original signal;
The seventh step: the raw spectral baseline was corrected as shown in fig. 8.
the above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any variations and modifications made by those skilled in the art based on the above disclosure are within the scope of the appended claims.

Claims (7)

1. A method of removing a spectral baseline, comprising:
reading original data;
Step two, finding out an inflection point of the baseline trend;
Step three, fitting a base line in each area;
And step four, subtracting the fitted base line of each area from the original data to realize base line correction.
2. The method for removing a spectral baseline of claim 1, wherein said raw data comprises a plurality of CCD collected data.
3. The method for removing spectral baseline according to claim 1, wherein in the second step, the inflection points of the baseline trend are found according to the spectral intensity judgment formulas I (I) < I (I-1) < I (I-2) and I (I) < I (I +1) < I (I + 2); wherein I (i) is the light intensity value of the ith sampling point in the spectral line; i (I-1) is the light intensity value of the I-1 th sampling point; i (I-2) is the light intensity value of the I-2 sampling point; i (I +1) is the light intensity value of the (I +1) th sampling point; i (I +2) is the light intensity value of the (I +2) th sampling point.
4. The method for removing a spectral baseline of claim 1, wherein prior to step two, the method for removing a spectral baseline further comprises:
through the comparison of the intensity values between adjacent acquisition points, the acquisition points where all the minimum light intensity values on the spectral line are located are found;
and removing the acquisition points where the minimum light intensity values on the shoulder peaks and the overlapped peaks are located through a threshold judgment formula.
5. the method for removing spectral baselines according to claim 4, wherein the minima on the spectral lines are found according to the spectral intensity judgment formulas I (I) < I (I-1) < I (I-2) and I (I) < I (I +1) < I (I + 2).
6. a method of removing a spectral baseline according to claim 4, wherein the minima on the shoulder and overlapping peaks are removed by the following threshold decision formula:
IAcromion, overlapping peak>3/2*Imin
Wherein, Iacromion, overlapping peakThe light intensity values on the shoulder peaks are overlapped; i isminthe minimum light intensity value in the spectrum composed of all the sampling points.
7. The method of removing a spectral baseline of claim 4, wherein fitting a spectral baseline in each region comprises:
Dividing the spectral line into n-1 areas according to the n inflection points found in the step two;
within each individual zone, the baseline trend is a primary or secondary curve.
CN201910828020.0A 2019-09-03 2019-09-03 method for removing spectrum baseline Pending CN110553989A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910828020.0A CN110553989A (en) 2019-09-03 2019-09-03 method for removing spectrum baseline

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910828020.0A CN110553989A (en) 2019-09-03 2019-09-03 method for removing spectrum baseline

Publications (1)

Publication Number Publication Date
CN110553989A true CN110553989A (en) 2019-12-10

Family

ID=68738835

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910828020.0A Pending CN110553989A (en) 2019-09-03 2019-09-03 method for removing spectrum baseline

Country Status (1)

Country Link
CN (1) CN110553989A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111982949A (en) * 2020-08-19 2020-11-24 东华理工大学 Method for separating EDXRF spectrum overlapping peak by combining fourth derivative with three-spline wavelet transform
CN114878552A (en) * 2022-07-11 2022-08-09 合肥金星智控科技股份有限公司 Spectrum correction method, spectrum correction device, storage medium and electronic equipment
CN117633423A (en) * 2024-01-26 2024-03-01 苏州简测科技有限公司 Self-adaptive spectrum baseline removing algorithm

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101037711A (en) * 2005-12-19 2007-09-19 霍夫曼-拉罗奇有限公司 Analytical method and instrument
CN106053430A (en) * 2016-06-16 2016-10-26 重庆大学 Envelope line iteration method for trace gas Raman spectral detection baseline correction

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101037711A (en) * 2005-12-19 2007-09-19 霍夫曼-拉罗奇有限公司 Analytical method and instrument
CN106053430A (en) * 2016-06-16 2016-10-26 重庆大学 Envelope line iteration method for trace gas Raman spectral detection baseline correction

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
KUO SUN ET AL.: "Baseline Correction for Raman Spectra Based on Piecewise Linear Fitting", 《SPECTROSCOPY,HTTPS://WWW.SPECTROSCOPYONLINE.COM/VIEW/BASELINE-CORRECTION-RAMAN-SPECTRA-BASED-PIECEWISE-LINEAR-FITTING》 *
覃赵军等: "分段式线性拟合校正拉曼光谱基线漂移 ", 《光谱学与光谱分析》 *
钟彩娇等: "核磁共振谱自动基线校正新方法", 《波谱学杂志》 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111982949A (en) * 2020-08-19 2020-11-24 东华理工大学 Method for separating EDXRF spectrum overlapping peak by combining fourth derivative with three-spline wavelet transform
CN111982949B (en) * 2020-08-19 2022-06-07 东华理工大学 Method for separating EDXRF spectrum overlapping peak by combining fourth derivative with three-spline wavelet transform
CN114878552A (en) * 2022-07-11 2022-08-09 合肥金星智控科技股份有限公司 Spectrum correction method, spectrum correction device, storage medium and electronic equipment
CN114878552B (en) * 2022-07-11 2022-10-04 合肥金星智控科技股份有限公司 Spectrum correction method, spectrum correction device, storage medium and electronic equipment
CN117633423A (en) * 2024-01-26 2024-03-01 苏州简测科技有限公司 Self-adaptive spectrum baseline removing algorithm
CN117633423B (en) * 2024-01-26 2024-04-05 苏州简测科技有限公司 Self-adaptive spectrum baseline removing method

Similar Documents

Publication Publication Date Title
CN110553989A (en) method for removing spectrum baseline
CN105203839B (en) A kind of interference signal extracting method based on broader frequency spectrum
CN102998296A (en) Raman spectra pretreatment method for removing effects of background noises
CN102636778B (en) Information extracting method suitable for high-spectrum image
CN108918499B (en) The method of Raman baseline drift is removed in Raman map
US10825670B2 (en) Signal processing method and system based on time-of-flight mass spectrometry and electronic apparatus
CN104870955A (en) Spectroscopic apparatus and methods
CN108509558B (en) Anti-speed-variation-interference sampling counting audio retrieval method
JP2014514581A (en) Background radiation estimation of spectral data by polynomial fitting.
CN116388733B (en) Spectrum pretreatment method and device suitable for near infrared fruit nondestructive detection
CN106644075A (en) Efficient de-noising method for Fourier spectrograph
CN108444954B (en) Spectral signal peak detection method, device and system
CN108267657B (en) Power quality disturbance detection method and system based on S transformation
CN106770192B (en) Laser induced breakdown spectroscopy continuous background bearing calibration based on interpolation method
CN111089856B (en) Post-processing method for extracting Raman spectrum weak signal
CN113008874A (en) Method for improving qualitative detection capability of laser-induced breakdown spectroscopy technology based on baseline correction and spectral peak recognition
CN115935144A (en) Denoising and reconstructing method for operation and maintenance data
CN117368141B (en) Perchlorate wastewater concentration intelligent detection method based on artificial intelligence
EP3681042B1 (en) Detection and tracking of interferers in a rf spectrum with multi-lane processing
CN107610055A (en) The noise measuring of Fourier transform spectrometer, interference pattern and suppressing method
CN116955900A (en) Phase unwrapping method
CN105509888A (en) Frequency-domain analysis-based Fourier spectroscopic data linear filtering and processing method
JP2023522479A (en) System, apparatus and method for spectral filtering
CN112134545B (en) Trapezoidal forming method, system, terminal and medium based on optimal filter
CN117633423B (en) Self-adaptive spectrum baseline removing method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20191210

RJ01 Rejection of invention patent application after publication